<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>IEEE 标准 · العلاقات</title>
  <description>IEEE 标准是电气电子工程师学会发布的技术标准文献集合，涵盖通信、电力、计算与电磁兼容等领域；公开目录以 KBART 列表提供编号、题名、状态与 IEEE Xplore 题录链接。</description>
  <url>/ar/concepts/ieee-standards/relation-161.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>concept_ieee_standards</id>
    <type>concept</type>
    <title>IEEE 标准</title>
    <slug>ieee-standards</slug>
    <aliases>
      <alias>IEEE Standards</alias>
      <alias>IEEE Std</alias>
      <alias>电气电子工程师学会标准</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>IEEE 标准是电气电子工程师学会发布的技术标准文献集合，涵盖通信、电力、计算与电磁兼容等领域；公开目录以 KBART 列表提供编号、题名、状态与 IEEE Xplore 题录链接。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        <locator>2026-11-01 下载</locator>
      </source>
      <source>
        <id>s2</id>
        <title>KBART Title Lists</title>
        <author>IEEE Xplore Help</author>
        <url>https://ieeexplore.ieee.org/Xplorehelp/discovery-services/kbart-title-lists</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Standards Association / standards.ieee.org</title>
        <author>IEEE</author>
        <url>https://standards.ieee.org/</url>
      </source>
      <source>
        <id>s4</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:58+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:58+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**IEEE 标准**是[[organization_ieee|电气电子工程师学会]]（IEEE）通过其标准化活动发布的技术标准文献[^s3][^s4]。&#xA;&#xA;## 定义与范围&#xA;&#xA;公开机读目录「IEEE Xplore All Standards」以 KBART 格式列出标准编号、题名、出版年份、状态（如 Active、Superseded、Inactive）及 IEEE Xplore 题录链接等元数据，不提供付费全文[^s1][^s2]。本知识库按该目录逐条建立标准词条（work，workKind=standard），每条保留官方目录出处。&#xA;&#xA;## 沿革&#xA;&#xA;IEEE 由 AIEE 与 IRE 于1963年合并成立后继续并扩展标准制定；现行与历史版本均出现在 Xplore 标准集合中[^s4][^s1]。&#xA;&#xA;## 相关概念&#xA;&#xA;词条之间以发布机构、主题关系连接；同一标准号的多年版本各自成条或在正文互相链接，以便维护。</body>
    <url>/concepts/ieee-standards.html</url>
    <lang>ar</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <conceptKind>theme</conceptKind>
    <scopeNote>本条为总览；各标准号以独立 work 词条著录，勿仅在本条列表省略。</scopeNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_ef19557e0ff4ab9aef76b465</id>
      <fromId>work_ieee_p3161_9_d2_jun_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3161_9_d2_jun_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3161_9_d2_jun_2023</targetId>
      <targetTitle>IEEE Std P3161.9/D2, Jun 2023</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3161-9-d2-jun-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_765a0b815649a4b5987f2b6a</id>
      <fromId>work_ieee_p3161_9_d3_aug_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3161_9_d3_aug_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3161_9_d3_aug_2023</targetId>
      <targetTitle>IEEE Std P3161.9/D3, Aug 2023</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3161-9-d3-aug-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_52580f148e9e1c8cd104fb81</id>
      <fromId>work_ieee_p3161_d2_aug_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3161_d2_aug_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3161_d2_aug_2022</targetId>
      <targetTitle>IEEE Std P3161/D2, Aug 2022</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3161-d2-aug-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bbec0eb71eff30cd4924c34f</id>
      <fromId>work_ieee_p3161_d3_sept_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3161_d3_sept_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3161_d3_sept_2022</targetId>
      <targetTitle>IEEE Std P3161/D3, Sept 2022</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3161-d3-sept-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f5b3adc38181dba417f04a0a</id>
      <fromId>work_ieee_p3168_d3_aug_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3168_d3_aug_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3168_d3_aug_2023</targetId>
      <targetTitle>IEEE Std P3168/D3, Aug 2023</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3168-d3-aug-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b5f1f469e9181c1d37dbbd6e</id>
      <fromId>work_ieee_p3169_d2_mar_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3169_d2_mar_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3169_d2_mar_2025</targetId>
      <targetTitle>IEEE Std P3169/D2, Mar 2025</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3169-d2-mar-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_07c244f2191657c66722669d</id>
      <fromId>work_ieee_p317_d0_jul_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p317_d0_jul_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p317_d0_jul_2024</targetId>
      <targetTitle>IEEE Std P317/D0, Jul 2024</targetTitle>
      <targetUrl>/ar/works/ieee-std-p317-d0-jul-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4ccca5e037b56cd8a6af9edb</id>
      <fromId>work_ieee_p317_d002_mar_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p317_d002_mar_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p317_d002_mar_2025</targetId>
      <targetTitle>IEEE Std P317/D002, Mar 2025</targetTitle>
      <targetUrl>/ar/works/ieee-std-p317-d002-mar-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e07fbcf4e2797f93ad72dd57</id>
      <fromId>work_ieee_p317_d4_october_2012</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p317_d4_october_2012</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p317_d4_october_2012</targetId>
      <targetTitle>IEEE Std P317/D4, October 2012</targetTitle>
      <targetUrl>/ar/works/ieee-std-p317-d4-october-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8ac6afc8c8d424cd9d4f9455</id>
      <fromId>work_ieee_p317_d5_january_2013</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p317_d5_january_2013</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p317_d5_january_2013</targetId>
      <targetTitle>IEEE Std P317/D5, January 2013</targetTitle>
      <targetUrl>/ar/works/ieee-std-p317-d5-january-2013.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_286c6d8cd5bc47818218df98</id>
      <fromId>work_ieee_p3173_d3_mar_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3173_d3_mar_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3173_d3_mar_2025</targetId>
      <targetTitle>IEEE Std P3173/D3, Mar 2025</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3173-d3-mar-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4b48f841eeac9b95b49e2beb</id>
      <fromId>work_ieee_p3173_d4_sept_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3173_d4_sept_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3173_d4_sept_2025</targetId>
      <targetTitle>IEEE Std P3173/D4, Sept 2025</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3173-d4-sept-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9fb50bd2007e121c5e39e26c</id>
      <fromId>work_ieee_p3175_d1_feb_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3175_d1_feb_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3175_d1_feb_2025</targetId>
      <targetTitle>IEEE Std P3175/D1, Feb 2025</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3175-d1-feb-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c438f605eb9b1d232edbca46</id>
      <fromId>work_ieee_p62271_111_ieee_pc37_60_d5_feb_2018</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62271_111_ieee_pc37_60_d5_feb_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62271_111_ieee_pc37_60_d5_feb_2018</targetId>
      <targetTitle>IEEE Std P62271-111/IEEE PC37.60_D5, Feb 2018</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62271-111-ieee-pc37-60-d5-feb-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_605ce9f7ef906b9e8f4b140d</id>
      <fromId>work_ieee_p62271_111_pc37_60_d5_may_2015</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62271_111_pc37_60_d5_may_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62271_111_pc37_60_d5_may_2015</targetId>
      <targetTitle>IEEE Std P62271-111/PC37.60_D5, May 2015</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62271-111-pc37-60-d5-may-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_5afe3e9ead662018ad0f12ca</id>
      <fromId>work_ieee_p62271_111_pc37_60_d9</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62271_111_pc37_60_d9</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62271_111_pc37_60_d9</targetId>
      <targetTitle>IEEE Std P62271-111/PC37.60_D9</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62271-111-pc37-60-d9.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a816c0ea6eb663d9d65343bd</id>
      <fromId>work_ieee_p62271_37_013_2015_cor_1_d2_feb_2017</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62271_37_013_2015_cor_1_d2_feb_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62271_37_013_2015_cor_1_d2_feb_2017</targetId>
      <targetTitle>IEEE Std P62271-37-013-2015/Cor 1/D2, Feb 2017</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62271-37-013-2015-cor-1-d2-feb-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d22e86a2ca75187251d0be0e</id>
      <fromId>work_ieee_p62271_37_013_2021_cor_1_d1_nov_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62271_37_013_2021_cor_1_d1_nov_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62271_37_013_2021_cor_1_d1_nov_2023</targetId>
      <targetTitle>IEEE Std P62271-37-013-2021/Cor 1/D1, Nov 2023</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62271-37-013-2021-cor-1-d1-nov-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_35dbbf421794627c3b040adc</id>
      <fromId>work_ieee_p62271_37_013_d1_jul_2018</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62271_37_013_d1_jul_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62271_37_013_d1_jul_2018</targetId>
      <targetTitle>IEEE Std P62271-37-013/D1, Jul 2018</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62271-37-013-d1-jul-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8e85ef0bd6b822724fa04653</id>
      <fromId>work_ieee_p62271_37_013_fdis_jun_2021</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62271_37_013_fdis_jun_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62271_37_013_fdis_jun_2021</targetId>
      <targetTitle>IEEE Std P62271-37-013/FDIS, Jun 2021</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62271-37-013-fdis-jun-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d0cd2aeaaa9279fe6996a43c</id>
      <fromId>work_ieee_p62271_37_013_2015_d13_4</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62271_37_013_2015_d13_4</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62271_37_013_2015_d13_4</targetId>
      <targetTitle>IEEE Std P62271-37-013:2015 D13.4</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62271-37-013-2015-d13-4.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_de6bc4889cc74d135c53ca6c</id>
      <fromId>work_ieee_p62271_37_082_nov_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62271_37_082_nov_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62271_37_082_nov_2023</targetId>
      <targetTitle>IEEE Std P62271-37-082, Nov 2023</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62271-37-082-nov-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c7f654685d5e7062ad4d3511</id>
      <fromId>work_ieee_p62395_1_cd_apr_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62395_1_cd_apr_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62395_1_cd_apr_2022</targetId>
      <targetTitle>IEEE Std P62395-1/CD, Apr 2022</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62395-1-cd-apr-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a000c48a34dafb90457edbe6</id>
      <fromId>work_ieee_p62395_1_cd_dec_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62395_1_cd_dec_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62395_1_cd_dec_2022</targetId>
      <targetTitle>IEEE Std P62395-1/CD, Dec 2022</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62395-1-cd-dec-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_5f7aaa2be160c9c80093ef39</id>
      <fromId>work_ieee_p62395_2_cd_dec_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62395_2_cd_dec_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62395_2_cd_dec_2022</targetId>
      <targetTitle>IEEE Std P62395-2/CD, Dec 2022</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62395-2-cd-dec-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0692a1bee04d8167dfa9ffdb</id>
      <fromId>work_ieee_p62395_2_cd_july_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62395_2_cd_july_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62395_2_cd_july_2022</targetId>
      <targetTitle>IEEE Std P62395-2/CD, July 2022</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62395-2-cd-july-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_48ecae0407b6472c70021072</id>
      <fromId>work_ieee_p62582_cd2_proposal_may_2017</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62582_cd2_proposal_may_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62582_cd2_proposal_may_2017</targetId>
      <targetTitle>IEEE Std P62582 CD2 proposal, May 2017</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62582-cd2-proposal-may-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1ea1915586b8076d45002b4d</id>
      <fromId>work_ieee_p62582_1_cd1_may_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62582_1_cd1_may_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62582_1_cd1_may_2023</targetId>
      <targetTitle>IEEE Std P62582-1/CD1, May 2023</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62582-1-cd1-may-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_66cad28eeb3ff3499ca5e96d</id>
      <fromId>work_ieee_p62582_1_d4</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62582_1_d4</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62582_1_d4</targetId>
      <targetTitle>IEEE Std P62582-1_D4</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62582-1-d4.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e0050685c497760a7c2797b4</id>
      <fromId>work_ieee_p62582_2_am1_aug_2015</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62582_2_am1_aug_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62582_2_am1_aug_2015</targetId>
      <targetTitle>IEEE Std P62582-2-am1, Aug 2015</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62582-2-am1-aug-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_53acb6801ae65eedf3a62439</id>
      <fromId>work_ieee_p62582_2_am1_july_2015</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62582_2_am1_july_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62582_2_am1_july_2015</targetId>
      <targetTitle>IEEE Std P62582-2-am1, July 2015</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62582-2-am1-july-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7744c1c956b98627365625a1</id>
      <fromId>work_ieee_p62582_2_cdv_mar_2021</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62582_2_cdv_mar_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62582_2_cdv_mar_2021</targetId>
      <targetTitle>IEEE Std P62582-2/CDV, Mar 2021</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62582-2-cdv-mar-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_95abc86c1f6ac687839a5c4b</id>
      <fromId>work_ieee_p62582_2_fdis_june_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62582_2_fdis_june_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62582_2_fdis_june_2022</targetId>
      <targetTitle>IEEE Std P62582-2/FDIS, June 2022</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62582-2-fdis-june-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_75942f9fc66a5b84aae26eab</id>
      <fromId>work_ieee_p62582_2_d4</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62582_2_d4</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62582_2_d4</targetId>
      <targetTitle>IEEE Std P62582-2_D4</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62582-2-d4.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_388e3343462e371e06722c2f</id>
      <fromId>work_ieee_p62582_3_oct_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62582_3_oct_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62582_3_oct_2022</targetId>
      <targetTitle>IEEE Std P62582-3, Oct 2022</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62582-3-oct-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d8c79e26e81328d12c8c7151</id>
      <fromId>work_ieee_p62582_3_fdis_feb_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62582_3_fdis_feb_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62582_3_fdis_feb_2024</targetId>
      <targetTitle>IEEE Std P62582-3/FDIS, Feb 2024</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62582-3-fdis-feb-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_32bdeace48079acdce09beb8</id>
      <fromId>work_ieee_p62582_3_fdis_sep_2012</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62582_3_fdis_sep_2012</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62582_3_fdis_sep_2012</targetId>
      <targetTitle>IEEE Std P62582-3/FDIS, Sep 2012</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62582-3-fdis-sep-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_424e61f14337fbbd35e31b69</id>
      <fromId>work_ieee_p62582_3_d1_apr_2011</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62582_3_d1_apr_2011</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62582_3_d1_apr_2011</targetId>
      <targetTitle>IEEE Std P62582-3_D1, Apr 2011</targetTitle>
      <targetUrl>/ar/works/ieee-std-p62582-3-d1-apr-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_10707b1c84837260d3cd5fea</id>
      <fromId>work_ieee_p3177_d3_1_feb_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3177_d3_1_feb_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3177_d3_1_feb_2024</targetId>
      <targetTitle>IEEE Std P3177/D3.1, Feb 2024</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3177-d3-1-feb-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0667afcc270e919f430dcfb5</id>
      <fromId>work_ieee_p3177_d3_2_sept_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3177_d3_2_sept_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3177_d3_2_sept_2024</targetId>
      <targetTitle>IEEE Std P3177/D3.2, Sept 2024</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3177-d3-2-sept-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e9d7392c3a02a3a09223df3e</id>
      <fromId>work_ieee_p3178_d1_0_feb_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3178_d1_0_feb_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3178_d1_0_feb_2024</targetId>
      <targetTitle>IEEE Std P3178/D1.0, Feb 2024</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3178-d1-0-feb-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_03b69f8c55c700c7584dbf74</id>
      <fromId>work_ieee_p3178_d1_1_aug_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3178_d1_1_aug_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3178_d1_1_aug_2024</targetId>
      <targetTitle>IEEE Std P3178/D1.1, Aug 2024</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3178-d1-1-aug-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_efe9956a569b2b4a1d8a10ed</id>
      <fromId>work_ieee_p3179_d1_1_aug_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3179_d1_1_aug_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3179_d1_1_aug_2025</targetId>
      <targetTitle>IEEE Std P3179/D1.1, Aug 2025</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3179-d1-1-aug-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8d508da772b81969b4fe5e3a</id>
      <fromId>work_ieee_p3179_d1_2_sept_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3179_d1_2_sept_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3179_d1_2_sept_2025</targetId>
      <targetTitle>IEEE Std P3179/D1.2, Sept 2025</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3179-d1-2-sept-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c75f6af1e88199f33b8e3fe9</id>
      <fromId>work_ieee_p3179_d1_3_nov_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3179_d1_3_nov_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3179_d1_3_nov_2025</targetId>
      <targetTitle>IEEE Std P3179/D1.3, Nov 2025</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3179-d1-3-nov-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_eb8ee77cf111ba132aeb3c27</id>
      <fromId>work_ieee_p3182_d1_2_may_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3182_d1_2_may_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3182_d1_2_may_2024</targetId>
      <targetTitle>IEEE Std P3182/D1.2, May 2024</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3182-d1-2-may-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b72febd9f3bfdcb0f7f078e0</id>
      <fromId>work_ieee_p3184_1_d3_aug_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3184_1_d3_aug_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3184_1_d3_aug_2024</targetId>
      <targetTitle>IEEE Std P3184.1/D3, Aug 2024</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3184-1-d3-aug-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e72e15ef211e45b2e30e9473</id>
      <fromId>work_ieee_p3184_1_d4_oct_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3184_1_d4_oct_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3184_1_d4_oct_2024</targetId>
      <targetTitle>IEEE Std P3184.1/D4, Oct 2024</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3184-1-d4-oct-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_69dc494a1392346ea40f5aca</id>
      <fromId>work_ieee_p3184_2_d2_nov_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3184_2_d2_nov_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3184_2_d2_nov_2024</targetId>
      <targetTitle>IEEE Std P3184.2/D2, Nov 2024</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3184-2-d2-nov-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4f148830134677c157ed9dd0</id>
      <fromId>work_ieee_p3184_2_d3_jan_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3184_2_d3_jan_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3184_2_d3_jan_2025</targetId>
      <targetTitle>IEEE Std P3184.2/D3, Jan 2025</targetTitle>
      <targetUrl>/ar/works/ieee-std-p3184-2-d3-jan-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/ar/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/ar/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/ar/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/ar/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/ar/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/ar/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/ar/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/ar/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/ar/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_1_1988</fromId>
      <fromTitle>IEEE Std 1003.1-1988</fromTitle>
      <fromUrl>/ar/works/ieee-std-1003-1-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>ar</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>concept_kind</key>
      <label>Concept kind</label>
      <value>موضوع</value>
    </field>
    <field>
      <key>aliases</key>
      <label>Aliases</label>
      <value>IEEE Standards, IEEE Std, 电气电子工程师学会标准</value>
    </field>
    <field>
      <key>scope_note</key>
      <label>Scope note</label>
      <value>本条为总览；各标准号以独立 work 词条著录，勿仅在本条列表省略。</value>
    </field>
  </infoFields>
  <pagination>
    <page>161</page>
    <pageSize>50</pageSize>
    <total>8263</total>
    <pageCount>166</pageCount>
    <prevUrl>/ar/concepts/ieee-standards/relation-160.xml</prevUrl>
    <nextUrl>/ar/concepts/ieee-standards/relation-162.xml</nextUrl>
  </pagination>
  <relationsTotal>8263</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8278</mentionsTotal>
  <mentionsUrl>/ar/concepts/ieee-standards/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>