<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>IEEE 标准 · العلاقات</title>
  <description>IEEE 标准是电气电子工程师学会发布的技术标准文献集合，涵盖通信、电力、计算与电磁兼容等领域；公开目录以 KBART 列表提供编号、题名、状态与 IEEE Xplore 题录链接。</description>
  <url>/ar/concepts/ieee-standards/relation-85.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>concept_ieee_standards</id>
    <type>concept</type>
    <title>IEEE 标准</title>
    <slug>ieee-standards</slug>
    <aliases>
      <alias>IEEE Standards</alias>
      <alias>IEEE Std</alias>
      <alias>电气电子工程师学会标准</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>IEEE 标准是电气电子工程师学会发布的技术标准文献集合，涵盖通信、电力、计算与电磁兼容等领域；公开目录以 KBART 列表提供编号、题名、状态与 IEEE Xplore 题录链接。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        <locator>2026-11-01 下载</locator>
      </source>
      <source>
        <id>s2</id>
        <title>KBART Title Lists</title>
        <author>IEEE Xplore Help</author>
        <url>https://ieeexplore.ieee.org/Xplorehelp/discovery-services/kbart-title-lists</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Standards Association / standards.ieee.org</title>
        <author>IEEE</author>
        <url>https://standards.ieee.org/</url>
      </source>
      <source>
        <id>s4</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:58+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:58+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**IEEE 标准**是[[organization_ieee|电气电子工程师学会]]（IEEE）通过其标准化活动发布的技术标准文献[^s3][^s4]。&#xA;&#xA;## 定义与范围&#xA;&#xA;公开机读目录「IEEE Xplore All Standards」以 KBART 格式列出标准编号、题名、出版年份、状态（如 Active、Superseded、Inactive）及 IEEE Xplore 题录链接等元数据，不提供付费全文[^s1][^s2]。本知识库按该目录逐条建立标准词条（work，workKind=standard），每条保留官方目录出处。&#xA;&#xA;## 沿革&#xA;&#xA;IEEE 由 AIEE 与 IRE 于1963年合并成立后继续并扩展标准制定；现行与历史版本均出现在 Xplore 标准集合中[^s4][^s1]。&#xA;&#xA;## 相关概念&#xA;&#xA;词条之间以发布机构、主题关系连接；同一标准号的多年版本各自成条或在正文互相链接，以便维护。</body>
    <url>/concepts/ieee-standards.html</url>
    <lang>ar</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <conceptKind>theme</conceptKind>
    <scopeNote>本条为总览；各标准号以独立 work 词条著录，勿仅在本条列表省略。</scopeNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_10bdc8059906ed6cc3f2a850</id>
      <fromId>work_ieee_p1708_d04_jun_2014</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1708_d04_jun_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1708_d04_jun_2014</targetId>
      <targetTitle>IEEE Std P1708/D04, Jun 2014</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1708-d04-jun-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_df0b64b3aa1aeb86c5950056</id>
      <fromId>work_ieee_p1708_d3_may_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1708_d3_may_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1708_d3_may_2025</targetId>
      <targetTitle>IEEE Std P1708/D3, May 2025</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1708-d3-may-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_47eed97a2e684a93c9ad5ee1</id>
      <fromId>work_ieee_p1708_d4_july_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1708_d4_july_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1708_d4_july_2025</targetId>
      <targetTitle>IEEE Std P1708/D4, July 2025</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1708-d4-july-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_917a849d45f3ac5778508c46</id>
      <fromId>work_ieee_p1708a_d2_feb_2019</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1708a_d2_feb_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1708a_d2_feb_2019</targetId>
      <targetTitle>IEEE Std P1708a/D2, Feb 2019</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1708a-d2-feb-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2480e9935459a298d2536f65</id>
      <fromId>work_ieee_p1708a_d3_apr_2019</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1708a_d3_apr_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1708a_d3_apr_2019</targetId>
      <targetTitle>IEEE Std P1708a/D3, Apr 2019</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1708a-d3-apr-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a4a86a751257c6d9e351f4d0</id>
      <fromId>work_ieee_p1709_d1_1_feb_2010</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1709_d1_1_feb_2010</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1709_d1_1_feb_2010</targetId>
      <targetTitle>IEEE Std P1709/D1.1, Feb 2010</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1709-d1-1-feb-2010.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_99b3df92ffbb758f58c6cb36</id>
      <fromId>work_ieee_p1709_d5_jan_2018</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1709_d5_jan_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1709_d5_jan_2018</targetId>
      <targetTitle>IEEE Std P1709/D5 Jan 2018</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1709-d5-jan-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e34d2a5c4cb52322be4a4f24</id>
      <fromId>work_ieee_p1709_d5_may_2018</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1709_d5_may_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1709_d5_may_2018</targetId>
      <targetTitle>IEEE Std P1709/D5, May 2018</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1709-d5-may-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_5632a3c138c7204996844f56</id>
      <fromId>work_ieee_p1711_1_d09_may_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1711_1_d09_may_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1711_1_d09_may_2023</targetId>
      <targetTitle>IEEE Std P1711.1/D09, May 2023</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1711-1-d09-may-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b77ce39841885f14b17e6983</id>
      <fromId>work_ieee_p1711_1_d10_dec_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1711_1_d10_dec_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1711_1_d10_dec_2023</targetId>
      <targetTitle>IEEE Std P1711.1/D10, Dec 2023</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1711-1-d10-dec-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1c6d0eb6ab63bee70f840c19</id>
      <fromId>work_ieee_p1711_1_d11_dec_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1711_1_d11_dec_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1711_1_d11_dec_2024</targetId>
      <targetTitle>IEEE Std P1711.1/D11, Dec 2024</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1711-1-d11-dec-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3153b2c140f706622d417a9c</id>
      <fromId>work_ieee_p1711_1_d12_sept_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1711_1_d12_sept_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1711_1_d12_sept_2025</targetId>
      <targetTitle>IEEE Std P1711.1/D12, Sept 2025</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1711-1-d12-sept-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_57fc3bafe901a0dec7bfd700</id>
      <fromId>work_ieee_p1711_2_d3_aug_2019</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1711_2_d3_aug_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1711_2_d3_aug_2019</targetId>
      <targetTitle>IEEE Std P1711.2/D3 Aug 2019</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1711-2-d3-aug-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_62aa748cd0069490fa1c843d</id>
      <fromId>work_ieee_p1711_2_d43_aug_2019</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1711_2_d43_aug_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1711_2_d43_aug_2019</targetId>
      <targetTitle>IEEE Std P1711.2/D43 Aug 2019</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1711-2-d43-aug-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_59e941cf72b7d94c9100bba1</id>
      <fromId>work_ieee_p1712</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1712</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1712</targetId>
      <targetTitle>IEEE Std P1712</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1712.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e8f5ab5cf1645e422aee3033</id>
      <fromId>work_ieee_p1716_d1_january_2013</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1716_d1_january_2013</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1716_d1_january_2013</targetId>
      <targetTitle>IEEE Std P1716/D1, January 2013</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1716-d1-january-2013.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_79ac27ff9323b7d3458d8d24</id>
      <fromId>work_ieee_p1716_d12_feb_2014</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1716_d12_feb_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1716_d12_feb_2014</targetId>
      <targetTitle>IEEE Std P1716/D12, Feb 2014</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1716-d12-feb-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8f9b2467885cbc57e124fefd</id>
      <fromId>work_ieee_p1717_d1_5_aug_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1717_d1_5_aug_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1717_d1_5_aug_2023</targetId>
      <targetTitle>IEEE Std P1717/D1.5, Aug 2023</targetTitle>
      <targetUrl>/ar/works/ieee-std-p1717-d1-5-aug-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_15589e6ad56e1c6a8f12a343</id>
      <fromId>work_ieee_1515_2000</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1515_2000</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1515_2000</targetId>
      <targetTitle>IEEE Std 1515-2000</targetTitle>
      <targetUrl>/ar/works/ieee-std-1515-2000.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b75de6fa2eb6c9cf983173d3</id>
      <fromId>work_ieee_1516_2000</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1516_2000</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1516_2000</targetId>
      <targetTitle>IEEE Std 1516-2000</targetTitle>
      <targetUrl>/ar/works/ieee-std-1516-2000.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_5aa3c5dcc44ca7d942040844</id>
      <fromId>work_ieee_1516_2010_5553438</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1516_2010_5553438</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1516_2010_5553438</targetId>
      <targetTitle>IEEE Std 1516-2010</targetTitle>
      <targetUrl>/ar/works/ieee-std-1516-2010-5553438.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_434eee1f814e3cfca2b7dcff</id>
      <fromId>work_ieee_1516_2010_5953409_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1516_2010_5953409_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1516_2010_5953409_redline</targetId>
      <targetTitle>IEEE Std 1516-2010</targetTitle>
      <targetUrl>/ar/works/ieee-std-1516-2010-5953409-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b634258c67066df496ffef91</id>
      <fromId>work_ieee_1516_1_2000</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1516_1_2000</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1516_1_2000</targetId>
      <targetTitle>IEEE Std 1516.1-2000</targetTitle>
      <targetUrl>/ar/works/ieee-std-1516-1-2000.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c695be2ef67d65a75c828541</id>
      <fromId>work_ieee_1516_1_2010_5557726</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1516_1_2010_5557726</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1516_1_2010_5557726</targetId>
      <targetTitle>IEEE Std 1516.1-2010</targetTitle>
      <targetUrl>/ar/works/ieee-std-1516-1-2010-5557726.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_05e68cb56ba9c32b223991a0</id>
      <fromId>work_ieee_1516_1_2010_5954118_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1516_1_2010_5954118_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1516_1_2010_5954118_redline</targetId>
      <targetTitle>IEEE Std 1516.1-2010</targetTitle>
      <targetUrl>/ar/works/ieee-std-1516-1-2010-5954118-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b43413e84ee0b92cf1142aff</id>
      <fromId>work_ieee_1516_2_2000</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1516_2_2000</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1516_2_2000</targetId>
      <targetTitle>IEEE Std 1516.2-2000</targetTitle>
      <targetUrl>/ar/works/ieee-std-1516-2-2000.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4df63efaf31a9b52caff2711</id>
      <fromId>work_ieee_1516_2_2010_5557729</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1516_2_2010_5557729</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1516_2_2010_5557729</targetId>
      <targetTitle>IEEE Std 1516.2-2010</targetTitle>
      <targetUrl>/ar/works/ieee-std-1516-2-2010-5557729.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_904b18a077d8a506d0c62040</id>
      <fromId>work_ieee_1516_2_2010_5953406_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1516_2_2010_5953406_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1516_2_2010_5953406_redline</targetId>
      <targetTitle>IEEE Std 1516.2-2010</targetTitle>
      <targetUrl>/ar/works/ieee-std-1516-2-2010-5953406-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6b51780fd83f47dc3462a437</id>
      <fromId>work_ieee_1516_3_2003</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1516_3_2003</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1516_3_2003</targetId>
      <targetTitle>IEEE Std 1516.3-2003</targetTitle>
      <targetUrl>/ar/works/ieee-std-1516-3-2003.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8b809720a2e627cdd9a125fc</id>
      <fromId>work_ieee_1517_1999</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1517_1999</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1517_1999</targetId>
      <targetTitle>IEEE Std 1517-1999</targetTitle>
      <targetUrl>/ar/works/ieee-std-1517-1999.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_96b39bb64cd0ab4c6947a2b1</id>
      <fromId>work_ieee_1517_2010</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1517_2010</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1517_2010</targetId>
      <targetTitle>IEEE Std 1517-2010</targetTitle>
      <targetUrl>/ar/works/ieee-std-1517-2010.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_494679206d87689ba007d943</id>
      <fromId>work_ieee_152_1953</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_152_1953</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_152_1953</targetId>
      <targetTitle>IEEE Std 152-1953</targetTitle>
      <targetUrl>/ar/works/ieee-std-152-1953.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a933e633453f632bbd8000da</id>
      <fromId>work_ieee_152_1991</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_152_1991</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_152_1991</targetId>
      <targetTitle>IEEE Std 152-1991</targetTitle>
      <targetUrl>/ar/works/ieee-std-152-1991.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_972b238a76b82b6dd6d1e1f9</id>
      <fromId>work_ieee_15205_2000</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_15205_2000</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_15205_2000</targetId>
      <targetTitle>IEEE Std 15205-2000</targetTitle>
      <targetUrl>/ar/works/ieee-std-15205-2000.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_984abf8002c62d6fc7dceb8d</id>
      <fromId>work_ieee_1521_2003_5250246</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1521_2003_5250246</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1521_2003_5250246</targetId>
      <targetTitle>IEEE Std 1521-2003</targetTitle>
      <targetUrl>/ar/works/ieee-std-1521-2003-5250246.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_cdb53cab9b7aadef61c52f2b</id>
      <fromId>work_ieee_1522_2004</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1522_2004</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1522_2004</targetId>
      <targetTitle>IEEE Std 1522-2004</targetTitle>
      <targetUrl>/ar/works/ieee-std-1522-2004.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_57c1dbd887e99275bcb764dd</id>
      <fromId>work_ieee_1523_2002</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1523_2002</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1523_2002</targetId>
      <targetTitle>IEEE Std 1523-2002</targetTitle>
      <targetUrl>/ar/works/ieee-std-1523-2002.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2f9adad595470adeed0b6d80</id>
      <fromId>work_ieee_1526_2003</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1526_2003</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1526_2003</targetId>
      <targetTitle>IEEE Std 1526-2003</targetTitle>
      <targetUrl>/ar/works/ieee-std-1526-2003.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_990e3d1840f7409d81638a13</id>
      <fromId>work_ieee_1527_2006</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1527_2006</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1527_2006</targetId>
      <targetTitle>IEEE Std 1527-2006</targetTitle>
      <targetUrl>/ar/works/ieee-std-1527-2006.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_43bf82d5894fdbc63c6a322c</id>
      <fromId>work_ieee_1527_2018_8704496_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1527_2018_8704496_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1527_2018_8704496_redline</targetId>
      <targetTitle>IEEE Std 1527-2018</targetTitle>
      <targetUrl>/ar/works/ieee-std-1527-2018-8704496-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0a91fe48c0ce80c718b4b77e</id>
      <fromId>work_ieee_1528_2003</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1528_2003</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1528_2003</targetId>
      <targetTitle>IEEE Std 1528-2003</targetTitle>
      <targetUrl>/ar/works/ieee-std-1528-2003.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_df0ffede7022eb74951534ef</id>
      <fromId>work_ieee_1528_2013_6589091</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1528_2013_6589091</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1528_2013_6589091</targetId>
      <targetTitle>IEEE Std 1528-2013</targetTitle>
      <targetUrl>/ar/works/ieee-std-1528-2013-6589091.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0acfeceb2fb8aa9f6a90da2c</id>
      <fromId>work_ieee_1528_2013_6719583_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1528_2013_6719583_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1528_2013_6719583_redline</targetId>
      <targetTitle>IEEE Std 1528-2013</targetTitle>
      <targetUrl>/ar/works/ieee-std-1528-2013-6719583-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6303f24f5037f1205ff0f89e</id>
      <fromId>work_ieee_15288</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_15288</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_15288</targetId>
      <targetTitle>IEEE Std 15288</targetTitle>
      <targetUrl>/ar/works/ieee-std-15288.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9545b46e8ef79efd98d910ba</id>
      <fromId>work_ieee_15288_2002</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_15288_2002</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_15288_2002</targetId>
      <targetTitle>IEEE Std 15288-2002</targetTitle>
      <targetUrl>/ar/works/ieee-std-15288-2002.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_206a0638d1ceb426f6cdc03b</id>
      <fromId>work_ieee_15288_2008_4475823</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_15288_2008_4475823</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_15288_2008_4475823</targetId>
      <targetTitle>IEEE Std 15288-2008</targetTitle>
      <targetUrl>/ar/works/ieee-std-15288-2008-4475823.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2b58800992a11a9f64649464</id>
      <fromId>work_ieee_15288_2008_6093921</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_15288_2008_6093921</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_15288_2008_6093921</targetId>
      <targetTitle>IEEE Std 15288-2008</targetTitle>
      <targetUrl>/ar/works/ieee-std-15288-2008-6093921.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_25886be1887751e43d91e2f6</id>
      <fromId>work_ieee_15288_2008_6581808_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_15288_2008_6581808_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_15288_2008_6581808_redline</targetId>
      <targetTitle>IEEE Std 15288-2008</targetTitle>
      <targetUrl>/ar/works/ieee-std-15288-2008-6581808-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_29299c3000bf91fa03a6aa0c</id>
      <fromId>work_ieee_15288_2015_7073539</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_15288_2015_7073539</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_15288_2015_7073539</targetId>
      <targetTitle>IEEE Std 15288-2015</targetTitle>
      <targetUrl>/ar/works/ieee-std-15288-2015-7073539.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_cca83409ae114470c574bf52</id>
      <fromId>work_ieee_15288_2015_7106433</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_15288_2015_7106433</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_15288_2015_7106433</targetId>
      <targetTitle>IEEE Std 15288-2015</targetTitle>
      <targetUrl>/ar/works/ieee-std-15288-2015-7106433.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/ar/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/ar/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/ar/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/ar/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/ar/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/ar/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/ar/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/ar/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/ar/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_1_1988</fromId>
      <fromTitle>IEEE Std 1003.1-1988</fromTitle>
      <fromUrl>/ar/works/ieee-std-1003-1-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>ar</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>concept_kind</key>
      <label>Concept kind</label>
      <value>موضوع</value>
    </field>
    <field>
      <key>aliases</key>
      <label>Aliases</label>
      <value>IEEE Standards, IEEE Std, 电气电子工程师学会标准</value>
    </field>
    <field>
      <key>scope_note</key>
      <label>Scope note</label>
      <value>本条为总览；各标准号以独立 work 词条著录，勿仅在本条列表省略。</value>
    </field>
  </infoFields>
  <pagination>
    <page>85</page>
    <pageSize>50</pageSize>
    <total>8263</total>
    <pageCount>166</pageCount>
    <prevUrl>/ar/concepts/ieee-standards/relation-84.xml</prevUrl>
    <nextUrl>/ar/concepts/ieee-standards/relation-86.xml</nextUrl>
  </pagination>
  <relationsTotal>8263</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8278</mentionsTotal>
  <mentionsUrl>/ar/concepts/ieee-standards/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>