<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>电气电子工程师学会 · العلاقات</title>
  <description>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</description>
  <url>/ar/organizations/ieee/relation-129.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>organization_ieee</id>
    <type>organization</type>
    <title>电气电子工程师学会</title>
    <slug>ieee</slug>
    <aliases>
      <alias>IEEE</alias>
      <alias>Institute of Electrical and Electronics Engineers</alias>
      <alias>电气和电子工程师协会</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
      <tag>tag-publishing</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
        <locator>2026-11-01 访问</locator>
      </source>
      <source>
        <id>s2</id>
        <title>IEEE 官方网站</title>
        <author>IEEE</author>
        <url>https://www.ieee.org/</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:52+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:52+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**电气电子工程师学会**（Institute of Electrical and Electronics Engineers，简称 IEEE）是1963年1月1日由美国电气工程师学会（AIEE）与无线电工程师学会（IRE）合并成立的专业技术协会，面向电气工程、电子工程及相关学科[^s1]。&#xA;&#xA;## 沿革&#xA;&#xA;该会可追溯至1884年成立的 AIEE；1912年另成立 IRE。两会于1963年合并为 IEEE[^s1]。总会设在纽约，1975年起主要业务在新泽西州皮斯卡特维的运营中心开展[^s1]。&#xA;&#xA;## 职能与业务&#xA;&#xA;IEEE 发布同行评议期刊与会议录，并通过标准化委员会制定技术标准；相关内容可在 IEEE Xplore 平台检索[^s1][^s3]。标准公开目录（KBART）列出标准编号、题名、状态与题录链接等元数据[^s3]。&#xA;&#xA;## 现状&#xA;&#xA;据公开介绍，该会为美国 501(c)(3) 公益性专业协会，全球会员逾48.6万[^s1]。官网为 https://www.ieee.org/ [^s2]。</body>
    <url>/organizations/ieee.html</url>
    <lang>ar</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <orgKind>专业协会</orgKind>
    <founded>
      <year>1963</year>
      <month>1</month>
      <day>1</day>
      <precision>day</precision>
      <display>1963年1月1日</display>
    </founded>
    <orgStatus>active</orgStatus>
    <headquartersNote>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</headquartersNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_718d82b397f9fbb1443059f1</id>
      <fromId>work_ieee_640_1985</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_640_1985</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_640_1985</targetId>
      <targetTitle>IEEE Std 640-1985</targetTitle>
      <targetUrl>/ar/works/ieee-std-640-1985.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_eb59045d36b6c9b52e3480e2</id>
      <fromId>work_ieee_641_1987</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_641_1987</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_641_1987</targetId>
      <targetTitle>IEEE Std 641-1987</targetTitle>
      <targetUrl>/ar/works/ieee-std-641-1987.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_940bf25cb38793044028ad97</id>
      <fromId>work_ieee_643_1980</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_643_1980</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_643_1980</targetId>
      <targetTitle>IEEE Std 643-1980</targetTitle>
      <targetUrl>/ar/works/ieee-std-643-1980.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_67827db3eaddeb003e34eb75</id>
      <fromId>work_ieee_643_2004</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_643_2004</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_643_2004</targetId>
      <targetTitle>IEEE Std 643-2004</targetTitle>
      <targetUrl>/ar/works/ieee-std-643-2004.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ac373308b811a97696bf4b88</id>
      <fromId>work_ieee_643_2004_cor_1_2013</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_643_2004_cor_1_2013</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_643_2004_cor_1_2013</targetId>
      <targetTitle>IEEE Std 643-2004/Cor 1-2013</targetTitle>
      <targetUrl>/ar/works/ieee-std-643-2004-cor-1-2013.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_afb4446ec51593f5e721cfe7</id>
      <fromId>work_ieee_644_1979</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_644_1979</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_644_1979</targetId>
      <targetTitle>IEEE Std 644-1979</targetTitle>
      <targetUrl>/ar/works/ieee-std-644-1979.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a8f46ad83fbf8cfed85ee91a</id>
      <fromId>work_ieee_644_1987</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_644_1987</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_644_1987</targetId>
      <targetTitle>IEEE Std 644-1987</targetTitle>
      <targetUrl>/ar/works/ieee-std-644-1987.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f5c4cc3d30885669e5882789</id>
      <fromId>work_ieee_644_1994</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_644_1994</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_644_1994</targetId>
      <targetTitle>IEEE Std 644-1994</targetTitle>
      <targetUrl>/ar/works/ieee-std-644-1994.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_31f60e4dbfdbfff580e3648c</id>
      <fromId>work_ieee_644_2019_9079696_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_644_2019_9079696_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_644_2019_9079696_redline</targetId>
      <targetTitle>IEEE Std 644-2019</targetTitle>
      <targetUrl>/ar/works/ieee-std-644-2019-9079696-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1b05210bd8bcefc7cfe24a34</id>
      <fromId>work_ieee_647_1981</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_647_1981</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_647_1981</targetId>
      <targetTitle>IEEE Std 647-1981</targetTitle>
      <targetUrl>/ar/works/ieee-std-647-1981.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d1d2be18c4136da35f96a415</id>
      <fromId>work_ieee_647_1995</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_647_1995</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_647_1995</targetId>
      <targetTitle>IEEE Std 647-1995</targetTitle>
      <targetUrl>/ar/works/ieee-std-647-1995.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_393f4c9a69c57c62ce13aae2</id>
      <fromId>work_ieee_647_2006</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_647_2006</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_647_2006</targetId>
      <targetTitle>IEEE Std 647-2006</targetTitle>
      <targetUrl>/ar/works/ieee-std-647-2006.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ec14c08de1fe6a7a67f697f6</id>
      <fromId>work_ieee_649_1980</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_649_1980</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_649_1980</targetId>
      <targetTitle>IEEE Std 649-1980</targetTitle>
      <targetUrl>/ar/works/ieee-std-649-1980.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_cc080f04e705ffb9309c06a0</id>
      <fromId>work_ieee_649_1991</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_649_1991</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_649_1991</targetId>
      <targetTitle>IEEE Std 649-1991</targetTitle>
      <targetUrl>/ar/works/ieee-std-649-1991.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_15f3f0e972a19c7b682c8e23</id>
      <fromId>work_ieee_65_1956</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_65_1956</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_65_1956</targetId>
      <targetTitle>IEEE Std 65-1956</targetTitle>
      <targetUrl>/ar/works/ieee-std-65-1956.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_afda5571f962c5c024d0d3d1</id>
      <fromId>work_ieee_650_1979</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_650_1979</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_650_1979</targetId>
      <targetTitle>IEEE Std 650-1979</targetTitle>
      <targetUrl>/ar/works/ieee-std-650-1979.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_67bad13e1eed874561d50007</id>
      <fromId>work_ieee_650_1990</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_650_1990</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_650_1990</targetId>
      <targetTitle>IEEE Std 650-1990</targetTitle>
      <targetUrl>/ar/works/ieee-std-650-1990.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_5319fcf79c97b51f567a9416</id>
      <fromId>work_ieee_650_2006</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_650_2006</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_650_2006</targetId>
      <targetTitle>IEEE Std 650-2006</targetTitle>
      <targetUrl>/ar/works/ieee-std-650-2006.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9564f33ea97978f622120a68</id>
      <fromId>work_ieee_656_1985</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_656_1985</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_656_1985</targetId>
      <targetTitle>IEEE Std 656-1985</targetTitle>
      <targetUrl>/ar/works/ieee-std-656-1985.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_45ebf73deada13581f241077</id>
      <fromId>work_ieee_656_1992</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_656_1992</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_656_1992</targetId>
      <targetTitle>IEEE Std 656-1992</targetTitle>
      <targetUrl>/ar/works/ieee-std-656-1992.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e96a383ab0f8317183041bc5</id>
      <fromId>work_ieee_656_2018_8686409_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_656_2018_8686409_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_656_2018_8686409_redline</targetId>
      <targetTitle>IEEE Std 656-2018</targetTitle>
      <targetUrl>/ar/works/ieee-std-656-2018-8686409-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2c349eab679eccde2b2216c4</id>
      <fromId>work_ieee_65700_19_03_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_65700_19_03_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_65700_19_03_2014</targetId>
      <targetTitle>IEEE Std 65700-19-03-2014</targetTitle>
      <targetUrl>/ar/works/ieee-std-65700-19-03-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a88da12dc8f846bc1986fb1e</id>
      <fromId>work_ieee_66_1957</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_66_1957</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_66_1957</targetId>
      <targetTitle>IEEE Std 66-1957</targetTitle>
      <targetUrl>/ar/works/ieee-std-66-1957.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_34611c4227c6bdd4168f1452</id>
      <fromId>work_ieee_660_1986</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_660_1986</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_660_1986</targetId>
      <targetTitle>IEEE Std 660-1986</targetTitle>
      <targetUrl>/ar/works/ieee-std-660-1986.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f70ed5a5328db0ab382a96f7</id>
      <fromId>work_ieee_661_1979</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_661_1979</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_661_1979</targetId>
      <targetTitle>IEEE Std 661-1979</targetTitle>
      <targetUrl>/ar/works/ieee-std-661-1979.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_af82e8586c94181d6b8eaaab</id>
      <fromId>work_ieee_662_1980</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_662_1980</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_662_1980</targetId>
      <targetTitle>IEEE Std 662-1980</targetTitle>
      <targetUrl>/ar/works/ieee-std-662-1980.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_df12de2b3f4a214c79810727</id>
      <fromId>work_ieee_662_1992</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_662_1992</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_662_1992</targetId>
      <targetTitle>IEEE Std 662-1992</targetTitle>
      <targetUrl>/ar/works/ieee-std-662-1992.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_694e0f1a7371c6f6c6c32803</id>
      <fromId>work_ieee_664_1980</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_664_1980</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_664_1980</targetId>
      <targetTitle>IEEE Std 664-1980</targetTitle>
      <targetUrl>/ar/works/ieee-std-664-1980.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_990020d23400951b220975e8</id>
      <fromId>work_ieee_664_1993</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_664_1993</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_664_1993</targetId>
      <targetTitle>IEEE Std 664-1993</targetTitle>
      <targetUrl>/ar/works/ieee-std-664-1993.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b05e5434c26b689df2d5bcd2</id>
      <fromId>work_ieee_p24748_4_fdis_dec2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_4_fdis_dec2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_4_fdis_dec2015</targetId>
      <targetTitle>IEEE Std P24748-4/FDIS-Dec2015</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24748-4-fdis-dec2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1edef2336379719c24fe1deb</id>
      <fromId>work_ieee_p24748_5_cd3_july_2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_5_cd3_july_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_5_cd3_july_2015</targetId>
      <targetTitle>IEEE Std P24748-5-CD3-July 2015</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24748-5-cd3-july-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c1ef305b9225c55c6b3ae6d6</id>
      <fromId>work_ieee_p24748_5_fdis_dec_2016</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_5_fdis_dec_2016</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_5_fdis_dec_2016</targetId>
      <targetTitle>IEEE Std P24748-5-FDIS-DEC 2016</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24748-5-fdis-dec-2016.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a1173b6271602ce9644b6492</id>
      <fromId>work_ieee_p24748_6_mar_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_6_mar_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_6_mar_2021</targetId>
      <targetTitle>IEEE Std P24748-6, Mar 2021</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24748-6-mar-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e5f9074a562a9821051794a6</id>
      <fromId>work_ieee_p24748_6_cd2_sept_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_6_cd2_sept_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_6_cd2_sept_2021</targetId>
      <targetTitle>IEEE Std P24748-6/CD2, Sept 2021</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24748-6-cd2-sept-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ccab0a678ecbf1383e3bb98f</id>
      <fromId>work_ieee_p24748_6_dis_may_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_6_dis_may_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_6_dis_may_2022</targetId>
      <targetTitle>IEEE Std P24748-6/DIS, May 2022</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24748-6-dis-may-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1d7cd52b9ac3a89f7c0c7873</id>
      <fromId>work_ieee_p24748_6_fdis_mar_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_6_fdis_mar_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_6_fdis_mar_2023</targetId>
      <targetTitle>IEEE Std P24748-6/FDIS, Mar 2023</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24748-6-fdis-mar-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_94310d010a623dbfff95a4e3</id>
      <fromId>work_ieee_p24748_7_cd1_jul_2024</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_7_cd1_jul_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_7_cd1_jul_2024</targetId>
      <targetTitle>IEEE Std P24748-7/CD1, Jul 2024</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24748-7-cd1-jul-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6d6efd1280dbfd990d1da4fc</id>
      <fromId>work_ieee_p24748_7_d2_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_7_d2_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_7_d2_2025</targetId>
      <targetTitle>IEEE Std P24748-7/D2, 2025</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24748-7-d2-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e4baef7740a370d9265aaed8</id>
      <fromId>work_ieee_p24748_7_d3_sept_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_7_d3_sept_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_7_d3_sept_2025</targetId>
      <targetTitle>IEEE Std P24748-7/D3, Sept 2025</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24748-7-d3-sept-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8a9768d9f3f93ca816ddd2f2</id>
      <fromId>work_ieee_p24748_9_cd_aug_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_9_cd_aug_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_9_cd_aug_2021</targetId>
      <targetTitle>IEEE Std P24748-9/CD, Aug 2021</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24748-9-cd-aug-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a918f383d80d1b5787b76aa5</id>
      <fromId>work_ieee_p24748_9_dis_may_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_9_dis_may_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_9_dis_may_2022</targetId>
      <targetTitle>IEEE Std P24748-9/DIS, May 2022</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24748-9-dis-may-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_79b539aa7e0cf851fafa6a24</id>
      <fromId>work_ieee_p24748_9_fdis_dec_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_9_fdis_dec_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_9_fdis_dec_2022</targetId>
      <targetTitle>IEEE Std P24748-9/FDIS, Dec 2022</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24748-9-fdis-dec-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6e49ae3e95f3de57ec8474a3</id>
      <fromId>work_ieee_p24748_9_wd_2_jan_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_9_wd_2_jan_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_9_wd_2_jan_2021</targetId>
      <targetTitle>IEEE Std P24748-9/WD.2, Jan 2021</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24748-9-wd-2-jan-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_74d6932bf725e0d1da63d2f5</id>
      <fromId>work_ieee_p24748_dtr_nov_2008</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_dtr_nov_2008</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_dtr_nov_2008</targetId>
      <targetTitle>IEEE Std P24748/DTR, Nov 2008</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24748-dtr-nov-2008.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3f6b598b922f62437ffeb7d0</id>
      <fromId>work_ieee_p24748_pdtr3_feb_2008</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_pdtr3_feb_2008</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_pdtr3_feb_2008</targetId>
      <targetTitle>IEEE Std P24748_PDTR3, Feb 2008</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24748-pdtr3-feb-2008.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bb49510fc15fcbcd965e4721</id>
      <fromId>work_ieee_p24765_fdis_oct_2016</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24765_fdis_oct_2016</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24765_fdis_oct_2016</targetId>
      <targetTitle>IEEE Std P24765 FDIS, Oct 2016</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24765-fdis-oct-2016.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e6736ec1501daba39025366d</id>
      <fromId>work_ieee_p24765_oct_2009</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24765_oct_2009</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24765_oct_2009</targetId>
      <targetTitle>IEEE Std P24765, Oct 2009</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24765-oct-2009.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2c7ed2dc9f621eb641e45ccb</id>
      <fromId>work_ieee_p24765_2009_sept_2009</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24765_2009_sept_2009</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24765_2009_sept_2009</targetId>
      <targetTitle>IEEE Std P24765-2009, Sept 2009</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24765-2009-sept-2009.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b6a820b8052270e1219ba756</id>
      <fromId>work_ieee_p24765_d3_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24765_d3_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24765_d3_2017</targetId>
      <targetTitle>IEEE Std P24765/D3:2017</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24765-d3-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ed61aef07914e3ac1279d24c</id>
      <fromId>work_ieee_p24765_2016_e_jan_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24765_2016_e_jan_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24765_2016_e_jan_2017</targetId>
      <targetTitle>IEEE Std P24765:2016(E), Jan 2017</targetTitle>
      <targetUrl>/ar/works/ieee-std-p24765-2016-e-jan-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>concept_ieee_standards</fromId>
      <fromTitle>IEEE 标准</fromTitle>
      <fromUrl>/ar/concepts/ieee-standards.html</fromUrl>
      <fromType>concept</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/ar/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/ar/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/ar/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/ar/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/ar/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/ar/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/ar/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/ar/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/ar/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>ar</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>org_kind</key>
      <label>Organization kind</label>
      <value>专业协会</value>
    </field>
    <field>
      <key>founded</key>
      <label>Founded</label>
      <value>1963年1月1日</value>
    </field>
    <field>
      <key>org_status</key>
      <label>Status</label>
      <value>قائمة</value>
    </field>
    <field>
      <key>headquarters_note</key>
      <label>Headquarters</label>
      <value>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</value>
    </field>
  </infoFields>
  <pagination>
    <page>129</page>
    <pageSize>50</pageSize>
    <total>8265</total>
    <pageCount>166</pageCount>
    <prevUrl>/ar/organizations/ieee/relation-128.xml</prevUrl>
    <nextUrl>/ar/organizations/ieee/relation-130.xml</nextUrl>
  </pagination>
  <relationsTotal>8265</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8279</mentionsTotal>
  <mentionsUrl>/ar/organizations/ieee/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>