---
{
  "aliases": [
    "IEEE",
    "Institute of Electrical and Electronics Engineers",
    "电气和电子工程师协会"
  ],
  "availableLangs": [
    "zh"
  ],
  "categories": [
    "category-science-technology"
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  "createdAt": "2026-11-01T21:05:52+08:00",
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  "founded": {
    "day": 1,
    "display": "1963年1月1日",
    "month": 1,
    "precision": "day",
    "year": 1963
  },
  "headquartersNote": "美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。",
  "id": "organization_ieee",
  "lang": "ar",
  "orgKind": "专业协会",
  "orgStatus": "active",
  "revision": 1,
  "slug": "ieee",
  "sources": [
    {
      "author": "Wikipedia",
      "id": "s1",
      "locator": "2026-11-01 访问",
      "title": "Institute of Electrical and Electronics Engineers",
      "url": "https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers"
    },
    {
      "author": "IEEE",
      "id": "s2",
      "title": "IEEE 官方网站",
      "url": "https://www.ieee.org/"
    },
    {
      "author": "IEEE",
      "id": "s3",
      "title": "IEEE Xplore All Standards（KBART）",
      "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt"
    }
  ],
  "status": "published",
  "summary": "电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。",
  "tags": [
    "tag-ieee-standard",
    "tag-publishing"
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  "title": "电气电子工程师学会",
  "type": "organization",
  "updatedAt": "2026-11-01T21:05:52+08:00",
  "updatedBy": "user:admin"
}
---

# 电气电子工程师学会

电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。

**电气电子工程师学会**（Institute of Electrical and Electronics Engineers，简称 IEEE）是1963年1月1日由美国电气工程师学会（AIEE）与无线电工程师学会（IRE）合并成立的专业技术协会，面向电气工程、电子工程及相关学科[^s1]。

## 沿革

该会可追溯至1884年成立的 AIEE；1912年另成立 IRE。两会于1963年合并为 IEEE[^s1]。总会设在纽约，1975年起主要业务在新泽西州皮斯卡特维的运营中心开展[^s1]。

## 职能与业务

IEEE 发布同行评议期刊与会议录，并通过标准化委员会制定技术标准；相关内容可在 IEEE Xplore 平台检索[^s1][^s3]。标准公开目录（KBART）列出标准编号、题名、状态与题录链接等元数据[^s3]。

## 现状

据公开介绍，该会为美国 501(c)(3) 公益性专业协会，全球会员逾48.6万[^s1]。官网为 https://www.ieee.org/ [^s2]。

更新时间：2026-11-01

## 标签


## 关系

- Published works：[IEEE Std 1682-2023](/ar/works/ieee-std-1682-2023-10897779-redline.html) 
- Published works：[IEEE Std 1683-2014](/ar/works/ieee-std-1683-2014-6781527.html) 
- Published works：[IEEE Std 1683-2014](/ar/works/ieee-std-1683-2014-6866101.html) 
- Published works：[IEEE Std 1685-2009](/ar/works/ieee-std-1685-2009.html) 
- Published works：[IEEE Std 1685-2014](/ar/works/ieee-std-1685-2014.html) 
- Published works：[IEEE Std 1685-2022](/ar/works/ieee-std-1685-2022-10186338-redline.html) 
- Published works：[IEEE Std 1686-2007](/ar/works/ieee-std-1686-2007.html) 
- Published works：[IEEE Std 1686-2013](/ar/works/ieee-std-1686-2013-6704700.html) 
- Published works：[IEEE Std 1686-2013](/ar/works/ieee-std-1686-2013-6747944-redline.html) 
- Published works：[IEEE Std 1687-2014](/ar/works/ieee-std-1687-2014-6781532.html) 
- Published works：[IEEE Std 1687-2014](/ar/works/ieee-std-1687-2014-6974959.html) 
- Published works：[IEEE Std 1688-2015](/ar/works/ieee-std-1688-2015.html) 
- Published works：[IEEE Std 169-1955](/ar/works/ieee-std-169-1955.html) 
- Published works：[IEEE Std 1692-2011](/ar/works/ieee-std-1692-2011.html) 
- Published works：[IEEE Std 1692-2023](/ar/works/ieee-std-1692-2023-11003462-redline.html) 
- Published works：[IEEE Std 1696-2013](/ar/works/ieee-std-1696-2013.html) 
- Published works：[IEEE Std 1698-2009](/ar/works/ieee-std-1698-2009.html) 
- Published works：[IEEE Std 170-1964](/ar/works/ieee-std-170-1964.html) 
- Published works：[IEEE Std 1701-2011](/ar/works/ieee-std-1701-2011.html) 
- Published works：[IEEE Std 1702-2011](/ar/works/ieee-std-1702-2011.html) 
- Published works：[IEEE Std 1703-2012](/ar/works/ieee-std-1703-2012.html) 
- Published works：[IEEE Std 1707-2015](/ar/works/ieee-std-1707-2015.html) 
- Published works：[IEEE Std 1708-2014](/ar/works/ieee-std-1708-2014.html) 
- Published works：[IEEE Std 1708a-2019](/ar/works/ieee-std-1708a-2019.html) 
- Published works：[IEEE Std 1711](/ar/works/ieee-std-1711.html) 
- Published works：[IEEE Std 1711-2010](/ar/works/ieee-std-1711-2010.html) 
- Published works：[IEEE Std 1711.2-2019](/ar/works/ieee-std-1711-2-2019-8533635.html) 
- Published works：[IEEE Std 1716-2014](/ar/works/ieee-std-1716-2014.html) 
- Published works：[IEEE Std 1717-2012](/ar/works/ieee-std-1717-2012.html) 
- Published works：[IEEE Std P1788/D9.5, Oct 2014](/ar/works/ieee-std-p1788-d9-5-oct-2014.html) 
- Published works：[IEEE Std P1788/D9.6, Mar 2014](/ar/works/ieee-std-p1788-d9-6-mar-2014.html) 
- Published works：[IEEE Std P1789/D2, Sept 2014](/ar/works/ieee-std-p1789-d2-sept-2014.html) 
- Published works：[IEEE Std P1789/D32, Sept 2014](/ar/works/ieee-std-p1789-d32-sept-2014.html) 
- Published works：[IEEE Std P1791/D10.0, Feb 2017](/ar/works/ieee-std-p1791-d10-0-feb-2017.html) 
- Published works：[IEEE Std P1791/D10.1, Jul 2019](/ar/works/ieee-std-p1791-d10-1-jul-2019.html) 
- Published works：[IEEE Std P1791/D9.0, Oct 2011](/ar/works/ieee-std-p1791-d9-0-oct-2011.html) 
- Published works：[IEEE Std P1792/D1, Jan 2016](/ar/works/ieee-std-p1792-d1-jan-2016.html) 
- Published works：[IEEE Std P1792/D1, Jun 2025](/ar/works/ieee-std-p1792-d1-jun-2025.html) 
- Published works：[IEEE Std P1792/D2, Feb 2026](/ar/works/ieee-std-p1792-d2-feb-2026.html) 
- Published works：[IEEE Std P1792/D2, Jan 2017](/ar/works/ieee-std-p1792-d2-jan-2017.html) 
- Published works：[IEEE Std P1793/D4, Sept 2011](/ar/works/ieee-std-p1793-d4-sept-2011.html) 
- Published works：[IEEE Std P1799/D11, Apr 2012](/ar/works/ieee-std-p1799-d11-apr-2012.html) 
- Published works：[IEEE Std P1799/D13, Jun 2012](/ar/works/ieee-std-p1799-d13-jun-2012.html) 
- Published works：[IEEE Std P1799/D19, Oct 2021](/ar/works/ieee-std-p1799-d19-oct-2021.html) 
- Published works：[IEEE Std P1799/D20, Apr 2022](/ar/works/ieee-std-p1799-d20-apr-2022.html) 
- Published works：[IEEE Std P18/D1, Dec 2011](/ar/works/ieee-std-p18-d1-dec-2011.html) 
- Published works：[IEEE Std P18/D2, Jun 2012](/ar/works/ieee-std-p18-d2-jun-2012.html) 
- Published works：[IEEE Std P18/D3, Oct 2012](/ar/works/ieee-std-p18-d3-oct-2012.html) 
- Published works：[IEEE Std P18/D6, Apr 2022](/ar/works/ieee-std-p18-d6-apr-2022.html) 
- Published works：[IEEE Std P18/D7, Jan 2025](/ar/works/ieee-std-p18-d7-jan-2025.html) 

第 94 / 166 页，共 8265 条。 [上一页](/ar/organizations/ieee/relation-93.md) [下一页](/ar/organizations/ieee/relation-95.md)

## 正文反向链接

- [IEEE 标准](/ar/concepts/ieee-standards.html)
- [IEEE Std 1000-1987](/ar/works/ieee-std-1000-1987-2607.html)
- [IEEE Std 1000-1987](/ar/works/ieee-std-1000-1987-9506.html)
- [IEEE Std 1001-1988](/ar/works/ieee-std-1001-1988.html)
- [IEEE Std 1002-1987](/ar/works/ieee-std-1002-1987.html)
- [IEEE Std 10038-1993](/ar/works/ieee-std-10038-1993.html)
- [IEEE Std 1003.0-1995](/ar/works/ieee-std-1003-0-1995.html)
- [IEEE Std 1003.10-1995](/ar/works/ieee-std-1003-10-1995.html)
- [IEEE Std 1003.13-1998](/ar/works/ieee-std-1003-13-1998.html)
- [IEEE Std 1003.13-2003](/ar/works/ieee-std-1003-13-2003.html)

## 来源

- Institute of Electrical and Electronics Engineers：https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers 2026-11-01 访问
- IEEE 官方网站：https://www.ieee.org/ 
- IEEE Xplore All Standards（KBART）：https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt