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      <title>IEEE Std 62525-2007</title>
      <slug>ieee-std-62525-2007</slug>
      <aliases>
        <alias>62525-2007</alias>
        <alias>62525-2007 - (IEEE Std 1450-1999) International Standard Test Interface Language (STIL) for Digital Test Vector Data</alias>
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      <summary>IEEE Std 62525-2007 是电气电子工程师学会的技术标准，题为“(IEEE Std 1450-1999) International Standard Test Interface Language (STIL) for Digital Test Vector Data”；公开目录标为现行（Active），已批准（Approved），著录年份为 2007 年。</summary>
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        <category>category-science-technology</category>
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        <tag>tag-ieee-standard</tag>
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          <id>s1</id>
          <title>IEEE Std 62525-2007 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4432409</url>
          <locator>standard_number=62525-2007; status=Active; modifier=Approved</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T21:19:08+08:00</updatedAt>
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      <revision>1</revision>
      <body>**IEEE Std 62525-2007**（(IEEE Std 1450-1999) International Standard Test Interface Language (STIL) for Digital Test Vector Data）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2007 年，主题领域包括 Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <published>
        <year>2007</year>
        <precision>year</precision>
        <display>2007年</display>
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      <type>work</type>
      <title>IEEE Std 62526-2007</title>
      <slug>ieee-std-62526-2007</slug>
      <aliases>
        <alias>62526-2007</alias>
        <alias>62526-2007 - IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62526-2007 是电气电子工程师学会的技术标准，题为“IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments”；公开目录标为现行（Active），已批准（Approved），著录年份为 2007 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
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      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62526-2007 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8671479</url>
          <locator>standard_number=62526-2007; status=Active; modifier=Approved</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T21:19:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62526-2007**（IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2007 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <fallback>true</fallback>
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      <workKind>standard</workKind>
      <published>
        <year>2007</year>
        <precision>year</precision>
        <display>2007年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_62529_2012_6228487</id>
      <type>work</type>
      <title>IEEE Std 62529-2012</title>
      <slug>ieee-std-62529-2012-6228487</slug>
      <aliases>
        <alias>62529-2012</alias>
        <alias>62529-2012 - IEC 62529:2012(E) Standard for Signal and Test Definition</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62529-2012 是电气电子工程师学会的技术标准，题为“IEC 62529:2012(E) Standard for Signal and Test Definition”；公开目录标为现行（Active），已批准（Approved），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62529-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6228487</url>
          <locator>standard_number=62529-2012; status=Active; modifier=Approved</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62529-2012**（IEC 62529:2012(E) Standard for Signal and Test Definition）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2012 年，主题领域包括 Power, Energy and Industry Applications、Fields, Waves and Electromagnetics、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62529-2012-6228487.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
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        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_62529_2024</id>
      <type>work</type>
      <title>IEEE Std 62529-2024</title>
      <slug>ieee-std-62529-2024</slug>
      <aliases>
        <alias>62529-2024</alias>
        <alias>62529-2024 - IEEE/IEC International Standard for Signal and Test Definition</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62529-2024 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard for Signal and Test Definition”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62529-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10577611</url>
          <locator>standard_number=62529-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T21:19:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62529-2024**（IEEE/IEC International Standard for Signal and Test Definition）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Communication, Networking and Broadcast Technologies、Signal Processing and Analysis[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62529-2024.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_61869_21_2025</id>
      <type>work</type>
      <title>IEEE Std 61869-21-2025</title>
      <slug>ieee-std-61869-21-2025</slug>
      <aliases>
        <alias>61869-21-2025</alias>
        <alias>61869-21-2025 - IEEE/IEC International Standard Instrument transformers--Part 21: Uncertainty evaluation in the accuracy test of instrument transformers</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61869-21-2025 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard Instrument transformers--Part 21: Uncertainty evaluation in the accuracy test of instrument transformers”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61869-21-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11299495</url>
          <locator>standard_number=61869-21-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T21:19:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61869-21-2025**（IEEE/IEC International Standard Instrument transformers--Part 21: Uncertainty evaluation in the accuracy test of instrument transformers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 General Topics for Engineers、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61869-21-2025.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_61886_1_2021</id>
      <type>work</type>
      <title>IEEE Std 61886-1-2021</title>
      <slug>ieee-std-61886-1-2021</slug>
      <aliases>
        <alias>61886-1-2021</alias>
        <alias>61886-1-2021 - IEEE/IEC International Standard for Subsea equipment--Part 1: Power connectors, penetrators and jumper assemblies with rated voltage from 3 kV (Umax = 3,6 kV) to 30 kV (Umax = 36 kV)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61886-1-2021 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard for Subsea equipment--Part 1: Power connectors, penetrators and jumper assemblies with rated voltage from 3 kV (Umax = 3,6 kV) to 30 kV (Umax = 36 kV)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61886-1-2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9415477</url>
          <locator>standard_number=61886-1-2021; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T21:19:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61886-1-2021**（IEEE/IEC International Standard for Subsea equipment--Part 1: Power connectors, penetrators and jumper assemblies with rated voltage from 3 kV (Umax = 3,6 kV) to 30 kV (Umax = 36 kV)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2021 年，主题领域包括 Components, Circuits, Devices and Systems、Geoscience、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61886-1-2021.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_61886_2_2023</id>
      <type>work</type>
      <title>IEEE Std 61886.2-2023</title>
      <slug>ieee-std-61886-2-2023</slug>
      <aliases>
        <alias>61886.2-2023</alias>
        <alias>61886.2-2023 - IEEE/IEC International Standard - Subsea equipment - Part 2: Power transformers</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61886.2-2023 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard - Subsea equipment - Part 2: Power transformers”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61886.2-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11141660</url>
          <locator>standard_number=61886.2-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61886.2-2023**（IEEE/IEC International Standard - Subsea equipment - Part 2: Power transformers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61886-2-2023.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_62014_5_2015</id>
      <type>work</type>
      <title>IEEE Std 62014-5-2015</title>
      <slug>ieee-std-62014-5-2015</slug>
      <aliases>
        <alias>62014-5-2015</alias>
        <alias>62014-5-2015 - IEEE/IEC International Standard - Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62014-5-2015 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard - Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs”；公开目录标为现行（Active），已批准（Approved），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62014-5-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7067344</url>
          <locator>standard_number=62014-5-2015; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62014-5-2015**（IEEE/IEC International Standard - Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62014-5-2015.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_62032_2012_6238287</id>
      <type>work</type>
      <title>IEEE Std 62032-2012</title>
      <slug>ieee-std-62032-2012-6238287</slug>
      <aliases>
        <alias>62032-2012</alias>
        <alias>62032-2012 - IEC 62032:2012(E)(IEEE Std C57.135-2011) Guide for the Application, Specification, and Testing of Phase-Shifting Transformers</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62032-2012 是电气电子工程师学会的技术标准，题为“IEC 62032:2012(E)(IEEE Std C57.135-2011) Guide for the Application, Specification, and Testing of Phase-Shifting Transformers”；公开目录标为现行（Active），已批准（Approved），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62032-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6238287</url>
          <locator>standard_number=62032-2012; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62032-2012**（IEC 62032:2012(E)(IEEE Std C57.135-2011) Guide for the Application, Specification, and Testing of Phase-Shifting Transformers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2012 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62032-2012-6238287.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_620_2022_9787353</id>
      <type>work</type>
      <title>IEEE Std 620-2022</title>
      <slug>ieee-std-620-2022-9787353</slug>
      <aliases>
        <alias>620-2022</alias>
        <alias>620-2022 - IEEE Guide for the Presentation of Thermal Limit Curves for Squirrel Cage Induction Machines</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 620-2022 是电气电子工程师学会的技术标准，题为“IEEE Guide for the Presentation of Thermal Limit Curves for Squirrel Cage Induction Machines”；公开目录标为现行（Active），已批准（Approved），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 620-2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9787353</url>
          <locator>standard_number=620-2022; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 620-2022**（IEEE Guide for the Presentation of Thermal Limit Curves for Squirrel Cage Induction Machines）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2022 年，主题领域包括 Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-620-2022-9787353.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62209_1528_2020_9231296</id>
      <type>work</type>
      <title>IEEE Std 62209-1528-2020</title>
      <slug>ieee-std-62209-1528-2020-9231296</slug>
      <aliases>
        <alias>62209-1528-2020</alias>
        <alias>62209-1528-2020 - IEC/IEEE International Standard - Measurement procedure for the assessment of specific absorption rate of human exposure to radio frequency fields from hand-held and body-mounted wir</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62209-1528-2020 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Measurement procedure for the assessment of specific absorption rate of human exposure to radio frequency fields from hand-held and body-mounted wir”；公开目录标为现行（Active），已批准（Approved），著录年份为 2020 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62209-1528-2020 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9231296</url>
          <locator>standard_number=62209-1528-2020; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62209-1528-2020**（IEC/IEEE International Standard - Measurement procedure for the assessment of specific absorption rate of human exposure to radio frequency fields from hand-held and body-mounted wir）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2020 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62209-1528-2020-9231296.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2020</year>
        <precision>year</precision>
        <display>2020年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62_2_2026</id>
      <type>work</type>
      <title>IEEE Std 62.2-2026</title>
      <slug>ieee-std-62-2-2026</slug>
      <aliases>
        <alias>62.2-2026</alias>
        <alias>62.2-2026 - IEEE Guide for Diagnostic Field Testing of Electric Power Apparatus--Electrical Machinery</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62.2-2026 是电气电子工程师学会的技术标准，题为“IEEE Guide for Diagnostic Field Testing of Electric Power Apparatus--Electrical Machinery”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62.2-2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11718979</url>
          <locator>standard_number=62.2-2026; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62.2-2026**（IEEE Guide for Diagnostic Field Testing of Electric Power Apparatus--Electrical Machinery）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62-2-2026.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_61691_6_2021</id>
      <type>work</type>
      <title>IEEE Std 61691-6-2021</title>
      <slug>ieee-std-61691-6-2021</slug>
      <aliases>
        <alias>61691-6-2021</alias>
        <alias>61691-6-2021 - IEC/IEEE International Standard-Behavioural languages–Part 6: VHDL Analog and Mixed-Signal Extensions</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61691-6-2021 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard-Behavioural languages–Part 6: VHDL Analog and Mixed-Signal Extensions”；公开目录标为现行（Active），已批准（Approved），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61691-6-2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9456766</url>
          <locator>standard_number=61691-6-2021; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:06+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:06+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61691-6-2021**（IEC/IEEE International Standard-Behavioural languages–Part 6: VHDL Analog and Mixed-Signal Extensions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2021 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61691-6-2021.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <id>work_ieee_61691_7_2009</id>
      <type>work</type>
      <title>IEEE Std 61691-7-2009</title>
      <slug>ieee-std-61691-7-2009</slug>
      <aliases>
        <alias>61691-7-2009</alias>
        <alias>61691-7-2009 - Behavioural languages - Part 7: SystemC Language Reference Manual</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61691-7-2009 是电气电子工程师学会的技术标准，题为“Behavioural languages - Part 7: SystemC Language Reference Manual”；公开目录标为现行（Active），已批准（Approved），著录年份为 2009 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61691-7-2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5473170</url>
          <locator>standard_number=61691-7-2009; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:06+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:06+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61691-7-2009**（Behavioural languages - Part 7: SystemC Language Reference Manual）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2009 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61691-7-2009.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2009</year>
        <precision>year</precision>
        <display>2009年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_61850_9_3_2016</id>
      <type>work</type>
      <title>IEEE Std 61850-9-3-2016</title>
      <slug>ieee-std-61850-9-3-2016</slug>
      <aliases>
        <alias>61850-9-3-2016</alias>
        <alias>61850-9-3-2016 - IEC/IEEE International Standard - Communication networks and systems for power utility automation – Part 9-3: Precision time protocol profile for power utility automation</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61850-9-3-2016 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Communication networks and systems for power utility automation – Part 9-3: Precision time protocol profile for power utility automation”；公开目录标为现行（Active），已批准（Approved），著录年份为 2016 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61850-9-3-2016 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7479436</url>
          <locator>standard_number=61850-9-3-2016; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:06+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:06+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61850-9-3-2016**（IEC/IEEE International Standard - Communication networks and systems for power utility automation – Part 9-3: Precision time protocol profile for power utility automation）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2016 年，主题领域包括 Power, Energy and Industry Applications、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61850-9-3-2016.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2016</year>
        <precision>year</precision>
        <display>2016年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61671_5_2016</id>
      <type>work</type>
      <title>IEEE Std 61671-5-2016</title>
      <slug>ieee-std-61671-5-2016</slug>
      <aliases>
        <alias>61671-5-2016</alias>
        <alias>61671-5-2016 - IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61671-5-2016 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description”；公开目录标为现行（Active），已批准（Approved），著录年份为 2016 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61671-5-2016 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7454656</url>
          <locator>standard_number=61671-5-2016; status=Active; modifier=Approved</locator>
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          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T21:19:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61671-5-2016**（IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2016 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <title>IEEE Std 61671-6-2016</title>
      <slug>ieee-std-61671-6-2016</slug>
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        <alias>61671-6-2016</alias>
        <alias>61671-6-2016 - IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61671-6-2016 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description”；公开目录标为现行（Active），已批准（Approved），著录年份为 2016 年。</summary>
      <status>published</status>
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        <category>category-science-technology</category>
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        <tag>tag-ieee-standard</tag>
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          <id>s1</id>
          <title>IEEE Std 61671-6-2016 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7454653</url>
          <locator>standard_number=61671-6-2016; status=Active; modifier=Approved</locator>
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          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T21:19:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61671-6-2016**（IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2016 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <title>IEEE Std 61691-1-1-2023</title>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61691-1-1-2023 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard--Behavioural languages--Part 1-1: VHDL Language Reference Manual”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
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          <title>IEEE Std 61691-1-1-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10287896</url>
          <locator>standard_number=61691-1-1-2023; status=Active; modifier=Approved</locator>
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          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T21:19:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61691-1-1-2023**（IEEE/IEC International Standard--Behavioural languages--Part 1-1: VHDL Language Reference Manual）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
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      <language>英语</language>
      <creators></creators>
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      <title>IEEE Std 61691-6-2009</title>
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        <alias>61691-6-2009</alias>
        <alias>61691-6-2009 - Behavioural languages - Part 6: VHDL Analog and Mixed-Signal Extensions</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61691-6-2009 是电气电子工程师学会的技术标准，题为“Behavioural languages - Part 6: VHDL Analog and Mixed-Signal Extensions”；公开目录标为现行（Active），已批准（Approved），著录年份为 2009 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
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        <tag>tag-ieee-standard</tag>
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          <id>s1</id>
          <title>IEEE Std 61691-6-2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5464490</url>
          <locator>standard_number=61691-6-2009; status=Active; modifier=Approved</locator>
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          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T21:19:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61691-6-2009**（Behavioural languages - Part 6: VHDL Analog and Mixed-Signal Extensions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2009 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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        <display>2009年</display>
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      <language>英语</language>
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      <id>work_ieee_61671_4_2016</id>
      <type>work</type>
      <title>IEEE Std 61671-4-2016</title>
      <slug>ieee-std-61671-4-2016</slug>
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        <alias>61671-4-2016</alias>
        <alias>61671-4-2016 - IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61671-4-2016 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration”；公开目录标为现行（Active），已批准（Approved），著录年份为 2016 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
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        <tag>tag-ieee-standard</tag>
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          <id>s1</id>
          <title>IEEE Std 61671-4-2016 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7452513</url>
          <locator>standard_number=61671-4-2016; status=Active; modifier=Approved</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T21:19:04+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:04+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61671-4-2016**（IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2016 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <published>
        <year>2016</year>
        <precision>year</precision>
        <display>2016年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_61671_2012</id>
      <type>work</type>
      <title>IEEE Std 61671-2012</title>
      <slug>ieee-std-61671-2012</slug>
      <aliases>
        <alias>61671-2012</alias>
        <alias>61671-2012 - IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61671-2012 是电气电子工程师学会的技术标准，题为“IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML”；公开目录标为现行（Active），已批准（Approved），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
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        <source>
          <id>s1</id>
          <title>IEEE Std 61671-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6238290</url>
          <locator>standard_number=61671-2012; status=Active; modifier=Approved</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T21:19:03+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:03+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61671-2012**（IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2012 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61671-2012.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
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      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_61636_1_2021</id>
      <type>work</type>
      <title>IEEE Std 61636-1-2021</title>
      <slug>ieee-std-61636-1-2021</slug>
      <aliases>
        <alias>61636-1-2021</alias>
        <alias>61636-1-2021 - International Standard-Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Languag</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61636-1-2021 是电气电子工程师学会的技术标准，题为“International Standard-Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Languag”；公开目录标为现行（Active），已批准（Approved），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
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      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61636-1-2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9451896</url>
          <locator>standard_number=61636-1-2021; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:01+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:01+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61636-1-2021**（International Standard-Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Languag）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2021 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61636-1-2021.html</url>
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      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_61636_2021</id>
      <type>work</type>
      <title>IEEE Std 61636-2021</title>
      <slug>ieee-std-61636-2021</slug>
      <aliases>
        <alias>61636-2021</alias>
        <alias>61636-2021 - International Standard-Software Interface for Maintenance Information Collection and Analysis (SIMICA)</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61636-2021 是电气电子工程师学会的技术标准，题为“International Standard-Software Interface for Maintenance Information Collection and Analysis (SIMICA)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
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      <tags>
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          <title>IEEE Std 61636-2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9451887</url>
          <locator>standard_number=61636-2021; status=Active; modifier=Approved</locator>
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          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T21:19:01+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:01+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61636-2021**（International Standard-Software Interface for Maintenance Information Collection and Analysis (SIMICA)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2021 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61636-2021.html</url>
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      <fallback>true</fallback>
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        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <type>work</type>
      <title>IEEE Std 61671-2-2016</title>
      <slug>ieee-std-61671-2-2016</slug>
      <aliases>
        <alias>61671-2-2016</alias>
        <alias>61671-2-2016 - IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61671-2-2016 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description”；公开目录标为现行（Active），已批准（Approved），著录年份为 2016 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61671-2-2016 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7451139</url>
          <locator>standard_number=61671-2-2016; status=Active; modifier=Approved</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:01+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:01+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61671-2-2016**（IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2016 年，主题领域包括 Computing and Processing、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61671-2-2016.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2016</year>
        <precision>year</precision>
        <display>2016年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_61523_1_2023</id>
      <type>work</type>
      <title>IEEE Std 61523-1-2023</title>
      <slug>ieee-std-61523-1-2023</slug>
      <aliases>
        <alias>61523-1-2023</alias>
        <alias>61523-1-2023 - IEEE/IEC International Standard--Delay and power calculation standards--Part 1: Integrated Circuit (IC) Open Library Architecture (OLA)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61523-1-2023 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard--Delay and power calculation standards--Part 1: Integrated Circuit (IC) Open Library Architecture (OLA)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61523-1-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10287887</url>
          <locator>standard_number=61523-1-2023; status=Active; modifier=Approved</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T21:19:00+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61523-1-2023**（IEEE/IEC International Standard--Delay and power calculation standards--Part 1: Integrated Circuit (IC) Open Library Architecture (OLA)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <fallback>true</fallback>
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      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_61523_4_2015</id>
      <type>work</type>
      <title>IEEE Std 61523-4-2015</title>
      <slug>ieee-std-61523-4-2015</slug>
      <aliases>
        <alias>61523-4-2015</alias>
        <alias>61523-4-2015 - IEEE/IEC International Standard - Design and Verification of Low-Power Integrated Circuits</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61523-4-2015 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard - Design and Verification of Low-Power Integrated Circuits”；公开目录标为现行（Active），已批准（Approved），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61523-4-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7076552</url>
          <locator>standard_number=61523-4-2015; status=Active; modifier=Approved</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <updatedAt>2026-11-01T21:19:00+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61523-4-2015**（IEEE/IEC International Standard - Design and Verification of Low-Power Integrated Circuits）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2015 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61523-4-2015.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_61523_4_2023</id>
      <type>work</type>
      <title>IEEE Std 61523-4-2023</title>
      <slug>ieee-std-61523-4-2023</slug>
      <aliases>
        <alias>61523-4-2023</alias>
        <alias>61523-4-2023 - IEEE/IEC International Standard--Delay and power calculation standards--Part 4: Design and Verification of Low-Power, Energy-Aware Electronic Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61523-4-2023 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard--Delay and power calculation standards--Part 4: Design and Verification of Low-Power, Energy-Aware Electronic Systems”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61523-4-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10287902</url>
          <locator>standard_number=61523-4-2023; status=Active; modifier=Approved</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T21:19:00+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61523-4-2023**（IEEE/IEC International Standard--Delay and power calculation standards--Part 4: Design and Verification of Low-Power, Energy-Aware Electronic Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Computing and Processing、Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61523-4-2023.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
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        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_61588_2021</id>
      <type>work</type>
      <title>IEEE Std 61588-2021</title>
      <slug>ieee-std-61588-2021</slug>
      <aliases>
        <alias>61588-2021</alias>
        <alias>61588-2021 - IEC/IEEE International Standard - Precision Clock Synchronization Protocol for Networked Measurement and Control Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61588-2021 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Precision Clock Synchronization Protocol for Networked Measurement and Control Systems”；公开目录标为现行（Active），已批准（Approved），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61588-2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9456760</url>
          <locator>standard_number=61588-2021; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T21:19:00+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:00+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61588-2021**（IEC/IEEE International Standard - Precision Clock Synchronization Protocol for Networked Measurement and Control Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2021 年，主题领域包括 Communication, Networking and Broadcast Technologies、Power, Energy and Industry Applications、Robotics and Control Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61588-2021.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_60980_344_2020</id>
      <type>work</type>
      <title>IEEE Std 60980-344-2020</title>
      <slug>ieee-std-60980-344-2020</slug>
      <aliases>
        <alias>60980-344-2020</alias>
        <alias>60980-344-2020 - IEEE/IEC International Standard - Nuclear facilities - Equipment important to safety - Seismic qualification</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60980-344-2020 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard - Nuclear facilities - Equipment important to safety - Seismic qualification”；公开目录标为现行（Active），已批准（Approved），著录年份为 2020 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60980-344-2020 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9231293</url>
          <locator>standard_number=60980-344-2020; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T21:18:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60980-344-2020**（IEEE/IEC International Standard - Nuclear facilities - Equipment important to safety - Seismic qualification）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2020 年，主题领域包括 Components, Circuits, Devices and Systems、Geoscience、Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60980-344-2020.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2020</year>
        <precision>year</precision>
        <display>2020年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_61007_389_2026</id>
      <type>work</type>
      <title>IEEE Std 61007-389-2026</title>
      <slug>ieee-std-61007-389-2026</slug>
      <aliases>
        <alias>61007-389-2026</alias>
        <alias>61007-389-2026 - IEEE/IEC International Standard for Transformers and Inductors for use in Electronic and Telecommunication Equipment - Part 389: Measuring methods and test procedures</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61007-389-2026 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard for Transformers and Inductors for use in Electronic and Telecommunication Equipment - Part 389: Measuring methods and test procedures”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61007-389-2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11643526</url>
          <locator>standard_number=61007-389-2026; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61007-389-2026**（IEEE/IEC International Standard for Transformers and Inductors for use in Electronic and Telecommunication Equipment - Part 389: Measuring methods and test procedures）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Communication, Networking and Broadcast Technologies、Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61007-389-2026.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_61158_2017</id>
      <type>work</type>
      <title>IEEE Std 61158-2017</title>
      <slug>ieee-std-61158-2017</slug>
      <aliases>
        <alias>61158-2017</alias>
        <alias>61158-2017 - IEEE Standard for Industrial Hard Real-Time Communication</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61158-2017 是电气电子工程师学会的技术标准，题为“IEEE Standard for Industrial Hard Real-Time Communication”；公开目录标为现行（Active），已批准（Approved），著录年份为 2017 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61158-2017 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8024202</url>
          <locator>standard_number=61158-2017; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61158-2017**（IEEE Standard for Industrial Hard Real-Time Communication）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2017 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61158-2017.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2017</year>
        <precision>year</precision>
        <display>2017年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_60780_323_2016_10205995</id>
      <type>work</type>
      <title>IEEE Std 60780-323-2016</title>
      <slug>ieee-std-60780-323-2016-10205995</slug>
      <aliases>
        <alias>60780-323-2016</alias>
        <alias>60780-323-2016 - IEEE Standard for Nuclear facilities--Electrical Equipment important to safety--Qualification</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60780-323-2016 是电气电子工程师学会的技术标准，题为“IEEE Standard for Nuclear facilities--Electrical Equipment important to safety--Qualification”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
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      </tags>
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        <source>
          <id>s1</id>
          <title>IEEE Std 60780-323-2016 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10205995</url>
          <locator>standard_number=60780-323-2016; status=Active; modifier=Approved</locator>
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          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T21:18:56+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60780-323-2016**（IEEE Standard for Nuclear facilities--Electrical Equipment important to safety--Qualification）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60780-323-2016-10205995.html</url>
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      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
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      <language>英语</language>
      <creators></creators>
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      <id>work_ieee_60802_2026</id>
      <type>work</type>
      <title>IEEE Std 60802-2026</title>
      <slug>ieee-std-60802-2026</slug>
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        <alias>60802-2026</alias>
        <alias>60802-2026 - IEC/IEEE International Standard Time-Sensitive Networking Profile for Industrial Automation</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60802-2026 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard Time-Sensitive Networking Profile for Industrial Automation”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60802-2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11584933</url>
          <locator>standard_number=60802-2026; status=Active; modifier=Approved</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T21:18:56+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:56+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60802-2026**（IEC/IEEE International Standard Time-Sensitive Networking Profile for Industrial Automation）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60802-2026.html</url>
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      <fallback>true</fallback>
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      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_60079_30_1_2025_11303381</id>
      <type>work</type>
      <title>IEEE Std 60079-30-1-2025</title>
      <slug>ieee-std-60079-30-1-2025-11303381</slug>
      <aliases>
        <alias>60079-30-1-2025</alias>
        <alias>60079-30-1-2025 - IEC/IEEE International Standard Explosive atmospheres - Part 30-1: Electrical resistance trace heating - General and testing requirements</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60079-30-1-2025 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard Explosive atmospheres - Part 30-1: Electrical resistance trace heating - General and testing requirements”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60079-30-1-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11303381</url>
          <locator>standard_number=60079-30-1-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60079-30-1-2025**（IEC/IEEE International Standard Explosive atmospheres - Part 30-1: Electrical resistance trace heating - General and testing requirements）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 General Topics for Engineers、Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60079-30-1-2025-11303381.html</url>
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      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_60079_30_2_2015</id>
      <type>work</type>
      <title>IEEE Std 60079-30-2-2015</title>
      <slug>ieee-std-60079-30-2-2015</slug>
      <aliases>
        <alias>60079-30-2-2015</alias>
        <alias>60079-30-2-2015 - IEEE/IEC International Standard for Explosive atmospheres -- Part 30-2: Electrical resistance trace heating -- Application guide for design, installation and maintenance</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60079-30-2-2015 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard for Explosive atmospheres -- Part 30-2: Electrical resistance trace heating -- Application guide for design, installation and maintenance”；公开目录标为现行（Active），已批准（Approved），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60079-30-2-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7279039</url>
          <locator>standard_number=60079-30-2-2015; status=Active; modifier=Approved</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60079-30-2-2015**（IEEE/IEC International Standard for Explosive atmospheres -- Part 30-2: Electrical resistance trace heating -- Application guide for design, installation and maintenance）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2015 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60079-30-2-2015.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
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        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_60079_30_2_2025_11303387</id>
      <type>work</type>
      <title>IEEE Std 60079-30-2-2025</title>
      <slug>ieee-std-60079-30-2-2025-11303387</slug>
      <aliases>
        <alias>60079-30-2-2025</alias>
        <alias>60079-30-2-2025 - IEC/IEEE International Standard for Explosive atmospheres - Part 30-2: Electrical resistance trace heating - Guidance on application for design, installation and maintenance</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60079-30-2-2025 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard for Explosive atmospheres - Part 30-2: Electrical resistance trace heating - Guidance on application for design, installation and maintenance”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60079-30-2-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11303387</url>
          <locator>standard_number=60079-30-2-2025; status=Active; modifier=Approved</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60079-30-2-2025**（IEC/IEEE International Standard for Explosive atmospheres - Part 30-2: Electrical resistance trace heating - Guidance on application for design, installation and maintenance）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications、Robotics and Control Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60079-30-2-2025-11303387.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
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        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_60214_2_2019</id>
      <type>work</type>
      <title>IEEE Std 60214-2-2019</title>
      <slug>ieee-std-60214-2-2019</slug>
      <aliases>
        <alias>60214-2-2019</alias>
        <alias>60214-2-2019 - IEEE/IEC International Standard for TAP-changers --Part 2: Application guidelines</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60214-2-2019 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard for TAP-changers --Part 2: Application guidelines”；公开目录标为现行（Active），已批准（Approved），著录年份为 2019 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60214-2-2019 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8736531</url>
          <locator>standard_number=60214-2-2019; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T21:18:55+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60214-2-2019**（IEEE/IEC International Standard for TAP-changers --Part 2: Application guidelines）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2019 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60214-2-2019.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2019</year>
        <precision>year</precision>
        <display>2019年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_60255_118_1_2018</id>
      <type>work</type>
      <title>IEEE Std 60255-118-1-2018</title>
      <slug>ieee-std-60255-118-1-2018</slug>
      <aliases>
        <alias>60255-118-1-2018</alias>
        <alias>60255-118-1-2018 - IEEE/IEC International Standard - Measuring relays and protection equipment - Part 118-1: Synchrophasor for power systems - Measurements</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60255-118-1-2018 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard - Measuring relays and protection equipment - Part 118-1: Synchrophasor for power systems - Measurements”；公开目录标为现行（Active），已批准（Approved），著录年份为 2018 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60255-118-1-2018 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8577043</url>
          <locator>standard_number=60255-118-1-2018; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:55+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60255-118-1-2018**（IEEE/IEC International Standard - Measuring relays and protection equipment - Part 118-1: Synchrophasor for power systems - Measurements）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2018 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60255-118-1-2018.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2018</year>
        <precision>year</precision>
        <display>2018年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_603_2018</id>
      <type>work</type>
      <title>IEEE Std 603-2018</title>
      <slug>ieee-std-603-2018</slug>
      <aliases>
        <alias>603-2018</alias>
        <alias>603-2018 - IEEE Standard Criteria for Safety Systems for Nuclear Power Generating Stations</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 603-2018 是电气电子工程师学会的技术标准，题为“IEEE Standard Criteria for Safety Systems for Nuclear Power Generating Stations”；公开目录标为现行（Active），已批准（Approved），著录年份为 2018 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 603-2018 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8573233</url>
          <locator>standard_number=603-2018; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:55+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 603-2018**（IEEE Standard Criteria for Safety Systems for Nuclear Power Generating Stations）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2018 年，主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-603-2018.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2018</year>
        <precision>year</precision>
        <display>2018年</display>
      </published>
      <language>英语</language>
      <creators></creators>
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      <id>work_ieee_60488_1_2004</id>
      <type>work</type>
      <title>IEEE Std 60488-1-2004</title>
      <slug>ieee-std-60488-1-2004</slug>
      <aliases>
        <alias>60488-1-2004</alias>
        <alias>60488-1-2004 - IEC/IEEE International Standard - Higher Performance Protocol for the Standard Digital Interface for Programmable Instrumentation - Part 1: General</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60488-1-2004 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Higher Performance Protocol for the Standard Digital Interface for Programmable Instrumentation - Part 1: General”；公开目录标为现行（Active），已批准（Approved），著录年份为 2004 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60488-1-2004 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9646</url>
          <locator>standard_number=60488-1-2004; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60488-1-2004**（IEC/IEEE International Standard - Higher Performance Protocol for the Standard Digital Interface for Programmable Instrumentation - Part 1: General）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2004 年，主题领域包括 Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60488-1-2004.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2004</year>
        <precision>year</precision>
        <display>2004年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_60488_2_2004</id>
      <type>work</type>
      <title>IEEE Std 60488-2-2004</title>
      <slug>ieee-std-60488-2-2004</slug>
      <aliases>
        <alias>60488-2-2004</alias>
        <alias>60488-2-2004 - IEC/IEEE International - Standard Digital Interface for Programmable Instrumentation - Part 2: Codes, formats, protocols and common commands</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60488-2-2004 是电气电子工程师学会的技术标准，题为“IEC/IEEE International - Standard Digital Interface for Programmable Instrumentation - Part 2: Codes, formats, protocols and common commands”；公开目录标为现行（Active），已批准（Approved），著录年份为 2004 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60488-2-2004 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9359</url>
          <locator>standard_number=60488-2-2004; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T21:18:55+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60488-2-2004**（IEC/IEEE International - Standard Digital Interface for Programmable Instrumentation - Part 2: Codes, formats, protocols and common commands）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2004 年，主题领域包括 Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60488-2-2004.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2004</year>
        <precision>year</precision>
        <display>2004年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_60559_2020</id>
      <type>work</type>
      <title>IEEE Std 60559-2020</title>
      <slug>ieee-std-60559-2020</slug>
      <aliases>
        <alias>60559-2020</alias>
        <alias>60559-2020 - ISO/IEC/IEEE International Standard - Floating-point arithmetic</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60559-2020 是电气电子工程师学会的技术标准，题为“ISO/IEC/IEEE International Standard - Floating-point arithmetic”；公开目录标为现行（Active），已批准（Approved），著录年份为 2020 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60559-2020 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9091346</url>
          <locator>standard_number=60559-2020; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:55+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60559-2020**（ISO/IEC/IEEE International Standard - Floating-point arithmetic）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2020 年，主题领域包括 Computing and Processing、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60559-2020.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2020</year>
        <precision>year</precision>
        <display>2020年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
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      <id>work_ieee_605_2008_5466956</id>
      <type>work</type>
      <title>IEEE Std 605-2008</title>
      <slug>ieee-std-605-2008-5466956</slug>
      <aliases>
        <alias>605-2008</alias>
        <alias>605-2008 - IEEE Std 605-2008 (Revision of IEEE Std 605-1998/Incorporates IEEE Std 605a-2010)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 605-2008 是电气电子工程师学会的技术标准，题为“IEEE Std 605-2008 (Revision of IEEE Std 605-1998/Incorporates IEEE Std 605a-2010)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 605-2008 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5466956</url>
          <locator>standard_number=605-2008; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:55+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 605-2008**（IEEE Std 605-2008 (Revision of IEEE Std 605-1998/Incorporates IEEE Std 605a-2010)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2010 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-605-2008-5466956.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_605_2023_10608041</id>
      <type>work</type>
      <title>IEEE Std 605-2023</title>
      <slug>ieee-std-605-2023-10608041</slug>
      <aliases>
        <alias>605-2023</alias>
        <alias>605-2023 - IEEE Guide for Bus Design in Air Insulated Substations</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 605-2023 是电气电子工程师学会的技术标准，题为“IEEE Guide for Bus Design in Air Insulated Substations”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 605-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10608041</url>
          <locator>standard_number=605-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:55+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 605-2023**（IEEE Guide for Bus Design in Air Insulated Substations）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Power, Energy and Industry Applications、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-605-2023-10608041.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_60780_323_2016_7425111</id>
      <type>work</type>
      <title>IEEE Std 60780-323-2016</title>
      <slug>ieee-std-60780-323-2016-7425111</slug>
      <aliases>
        <alias>60780-323-2016</alias>
        <alias>60780-323-2016 - IEC/IEEE International Standard - Nuclear facilities -- Electrical equipment important to safety -- Qualification</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60780-323-2016 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Nuclear facilities -- Electrical equipment important to safety -- Qualification”；公开目录标为现行（Active），已批准（Approved），著录年份为 2016 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60780-323-2016 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7425111</url>
          <locator>standard_number=60780-323-2016; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:55+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60780-323-2016**（IEC/IEEE International Standard - Nuclear facilities -- Electrical equipment important to safety -- Qualification）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2016 年，主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60780-323-2016-7425111.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2016</year>
        <precision>year</precision>
        <display>2016年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
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      <id>work_ieee_60076_16_2018</id>
      <type>work</type>
      <title>IEEE Std 60076-16-2018</title>
      <slug>ieee-std-60076-16-2018</slug>
      <aliases>
        <alias>60076-16-2018</alias>
        <alias>60076-16-2018 - IEC/IEEE International Standard - Power transformers - Part 16: Transformers for wind turbine applications</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60076-16-2018 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Power transformers - Part 16: Transformers for wind turbine applications”；公开目录标为现行（Active），已批准（Approved），著录年份为 2018 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60076-16-2018 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8476638</url>
          <locator>standard_number=60076-16-2018; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:54+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:54+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60076-16-2018**（IEC/IEEE International Standard - Power transformers - Part 16: Transformers for wind turbine applications）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2018 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60076-16-2018.html</url>
      <lang>ar</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2018</year>
        <precision>year</precision>
        <display>2018年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_60076_57_1202_2016</id>
      <type>work</type>
      <title>IEEE Std 60076-57-1202-2016</title>
      <slug>ieee-std-60076-57-1202-2016</slug>
      <aliases>
        <alias>60076-57-1202-2016</alias>
        <alias>60076-57-1202-2016 - IEC/IEEE International Standard Power transformers --Part 57-1202: Liquid immersed phase-shifting transformers</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60076-57-1202-2016 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard Power transformers --Part 57-1202: Liquid immersed phase-shifting transformers”；公开目录标为现行（Active），已批准（Approved），著录年份为 2017 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60076-57-1202-2016 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7932245</url>
          <locator>standard_number=60076-57-1202-2016; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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