{ "contentStorage": "postgres", "title": "أعمال", "url": "/ar/works-93.html", "entities": [ { "id": "work_ieee_1667_2018_8575226_redline", "type": "work", "title": "IEEE Std 1667-2018", "slug": "ieee-std-1667-2018-8575226-redline", "aliases": [ "1667-2018", "1667-2018 - IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline" ], "summary": "IEEE Std 1667-2018 是电气电子工程师学会的技术标准，题为“IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2018 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1667-2018 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8575226", "locator": "standard_number=1667-2018; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1667-2018**（IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2018 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1667-2018-8575226-redline.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2018, "precision": "year", "display": "2018年" }, "language": "英语" }, { "id": "work_ieee_1668_2014", "type": "work", "title": "IEEE Std 1668-2014", "slug": "ieee-std-1668-2014", "aliases": [ "1668-2014", "1668-2014 - IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V" ], "summary": "IEEE Std 1668-2014 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V”；公开目录标为已被替代（Superseded），著录年份为 2014 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1668-2014 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6895234", "locator": "standard_number=1668-2014; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1668-2014**（IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2014 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1668-2014.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2014, "precision": "year", "display": "2014年" }, "language": "英语" }, { "id": "work_ieee_1668_2017_8365161_redline", "type": "work", "title": "IEEE Std 1668-2017", "slug": "ieee-std-1668-2017-8365161-redline", "aliases": [ "1668-2017", "1668-2017 - IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V - Redline" ], "summary": "IEEE Std 1668-2017 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2017 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1668-2017 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8365161", "locator": "standard_number=1668-2017; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1668-2017**（IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2017 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1668-2017-8365161-redline.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2017, "precision": "year", "display": "2017年" }, "language": "英语" }, { "id": "work_ieee_1671_1_2009_5353115", "type": "work", "title": "IEEE Std 1671.1-2009", "slug": "ieee-std-1671-1-2009-5353115", "aliases": [ "1671.1-2009", "1671.1-2009 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions" ], "summary": "IEEE Std 1671.1-2009 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions”；公开目录标为已被替代（Superseded），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.1-2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5353115", "locator": "standard_number=1671.1-2009; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.1-2009**（IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2009 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-1-2009-5353115.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_1671_1_2009_6781519", "type": "work", "title": "IEEE Std 1671.1-2009", "slug": "ieee-std-1671-1-2009-6781519", "aliases": [ "1671.1-2009", "1671.1-2009 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions" ], "summary": "IEEE Std 1671.1-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions”；公开目录标为已被替代（Superseded），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.1-2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6781519", "locator": "standard_number=1671.1-2009; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.1-2009**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2009 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-1-2009-6781519.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_1671_2006_4035723", "type": "work", "title": "IEEE Std 1671-2006", "slug": "ieee-std-1671-2006-4035723", "aliases": [ "1671-2006", "1671-2006 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information Via XML" ], "summary": "IEEE Std 1671-2006 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information Via XML”；公开目录标为已被替代（Superseded），著录年份为 2006 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671-2006 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4035723", "locator": "standard_number=1671-2006; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671-2006**（IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information Via XML）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2006 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2006-4035723.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2006, "precision": "year", "display": "2006年" }, "language": "英语" }, { "id": "work_ieee_1671_2006_5250285", "type": "work", "title": "IEEE Std 1671-2006", "slug": "ieee-std-1671-2006-5250285", "aliases": [ "1671-2006", "1671-2006 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" ], "summary": "IEEE Std 1671-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML”；公开目录标为已被替代（Superseded），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671-2006 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5250285", "locator": "standard_number=1671-2006; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671-2006**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2009 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2006-5250285.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_1671_2010", "type": "work", "title": "IEEE Std 1671-2010", "slug": "ieee-std-1671-2010", "aliases": [ "1671-2010", "1671-2010 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" ], "summary": "IEEE Std 1671-2010 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671-2010 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5706288", "locator": "standard_number=1671-2010; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671-2010**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2010.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2011, "precision": "year", "display": "2011年" }, "language": "英语" }, { "id": "work_ieee_1671_2_2008", "type": "work", "title": "IEEE Std 1671.2-2008", "slug": "ieee-std-1671-2-2008", "aliases": [ "1671.2-2008", "1671.2-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions" ], "summary": "IEEE Std 1671.2-2008 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions”；公开目录标为已被替代（Superseded），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.2-2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4723949", "locator": "standard_number=1671.2-2008; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.2-2008**（IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2-2008.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_1671_2_2012_6461895", "type": "work", "title": "IEEE Std 1671.2-2012", "slug": "ieee-std-1671-2-2012-6461895", "aliases": [ "1671.2-2012", "1671.2-2012 - IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description" ], "summary": "IEEE Std 1671.2-2012 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2013 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.2-2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6461895", "locator": "standard_number=1671.2-2012; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.2-2012**（IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2013 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2-2012-6461895.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2013, "precision": "year", "display": "2013年" }, "language": "英语" }, { "id": "work_ieee_1671_2_2012_6522436_redline", "type": "work", "title": "IEEE Std 1671.2-2012", "slug": "ieee-std-1671-2-2012-6522436-redline", "aliases": [ "1671.2-2012", "1671.2-2012 - IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline" ], "summary": "IEEE Std 1671.2-2012 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2013 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.2-2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6522436", "locator": "standard_number=1671.2-2012; status=Inactive; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.2-2012**（IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2013 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2-2012-6522436-redline.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2013, "precision": "year", "display": "2013年" }, "language": "英语" }, { "id": "work_ieee_1671_2_d15_sep_2012", "type": "work", "title": "IEEE Std 1671.2/D15, Sep 2012", "slug": "ieee-std-1671-2-d15-sep-2012", "aliases": [ "1671.2/D15, Sep 2012", "1671.2/D15, Sep 2012 - IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Instrument Description" ], "summary": "IEEE Std 1671.2/D15, Sep 2012 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Instrument Description”；公开目录标为非现行（Inactive），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.2/D15, Sep 2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6376069", "locator": "standard_number=1671.2/D15, Sep 2012; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.2/D15, Sep 2012**（IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Instrument Description）是[[organization_ieee|电气电子工程师学会]]于 2012 年 9 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2-d15-sep-2012.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_1671_3_2007", "type": "work", "title": "IEEE Std 1671.3-2007", "slug": "ieee-std-1671-3-2007", "aliases": [ "1671.3-2007", "1671.3-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Infor" ], "summary": "IEEE Std 1671.3-2007 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Infor”；公开目录标为已被替代（Superseded），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.3-2007 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4479536", "locator": "standard_number=1671.3-2007; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.3-2007**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Infor）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-3-2007.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_1671_4_2007", "type": "work", "title": "IEEE Std 1671.4-2007", "slug": "ieee-std-1671-4-2007", "aliases": [ "1671.4-2007", "1671.4-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information" ], "summary": "IEEE Std 1671.4-2007 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information”；公开目录标为已被替代（Superseded），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.4-2007 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4509492", "locator": "standard_number=1671.4-2007; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.4-2007**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-4-2007.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_1671_4_2014", "type": "work", "title": "IEEE Std 1671.4-2014", "slug": "ieee-std-1671-4-2014", "aliases": [ "1671.4-2014", "1671.4-2014 - IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration" ], "summary": "IEEE Std 1671.4-2014 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2014 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.4-2014 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6808400", "locator": "standard_number=1671.4-2014; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.4-2014**（IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2014 年，主题领域包括 Computing and Processing、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-4-2014.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2014, "precision": "year", "display": "2014年" }, "language": "英语" }, { "id": "work_ieee_1671_5_2008_4733021", "type": "work", "title": "IEEE Std 1671.5-2008", "slug": "ieee-std-1671-5-2008-4733021", "aliases": [ "1671.5-2008", "1671.5-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information" ], "summary": "IEEE Std 1671.5-2008 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information”；公开目录标为已被替代（Superseded），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.5-2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4733021", "locator": "standard_number=1671.5-2008; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.5-2008**（IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2012 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-5-2008-4733021.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_1671_5_2008_6781501", "type": "work", "title": "IEEE Std 1671.5-2008", "slug": "ieee-std-1671-5-2008-6781501", "aliases": [ "1671.5-2008", "1671.5-2008 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information" ], "summary": "IEEE Std 1671.5-2008 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information”；公开目录标为已被替代（Superseded），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.5-2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6781501", "locator": "standard_number=1671.5-2008; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.5-2008**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2012 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-5-2008-6781501.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_1671_5_2015_7102656", "type": "work", "title": "IEEE Std 1671.5-2015", "slug": "ieee-std-1671-5-2015-7102656", "aliases": [ "1671.5-2015", "1671.5-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description" ], "summary": "IEEE Std 1671.5-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2015 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.5-2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7102656", "locator": "standard_number=1671.5-2015; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.5-2015**（IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-5-2015-7102656.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2015, "precision": "year", "display": "2015年" }, "language": "英语" }, { "id": "work_ieee_1671_5_2015_7166296_redline", "type": "work", "title": "IEEE Std 1671.5-2015", "slug": "ieee-std-1671-5-2015-7166296-redline", "aliases": [ "1671.5-2015", "1671.5-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description - Redline" ], "summary": "IEEE Std 1671.5-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2015 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.5-2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7166296", "locator": "standard_number=1671.5-2015; status=Inactive; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.5-2015**（IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-5-2015-7166296-redline.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2015, "precision": "year", "display": "2015年" }, "language": "英语" }, { "id": "work_ieee_167_1966", "type": "work", "title": "IEEE Std 167-1966", "slug": "ieee-std-167-1966", "aliases": [ "167-1966", "167-1966 - IEEE Test Procedure for Facsimile" ], "summary": "IEEE Std 167-1966 是电气电子工程师学会的技术标准，题为“IEEE Test Procedure for Facsimile”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1966 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 167-1966 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7368070", "locator": "standard_number=167-1966; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 167-1966**（IEEE Test Procedure for Facsimile）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1966 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-167-1966.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1966, "precision": "year", "display": "1966年" }, "language": "英语" }, { "id": "work_ieee_p1780_d29_oct_2020", "type": "work", "title": "IEEE Std P1780/D29, Oct 2020", "slug": "ieee-std-p1780-d29-oct-2020", "aliases": [ "P1780/D29, Oct 2020", "P1780/D29, Oct 2020 - IEEE Draft Standard for the Specification of Inertial Measurement Units (IMU)" ], "summary": "IEEE Std P1780/D29, Oct 2020 是电气电子工程师学会的草案，题为“IEEE Draft Standard for the Specification of Inertial Measurement Units (IMU)”；公开目录标为非现行（Inactive），著录年份为 2021 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1780/D29, Oct 2020 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9369228", "locator": "standard_number=P1780/D29, Oct 2020; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1780/D29, Oct 2020**（IEEE Draft Standard for the Specification of Inertial Measurement Units (IMU)）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2021 年，主题领域包括 Aerospace、Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1780-d29-oct-2020.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2021, "precision": "year", "display": "2021年" }, "language": "英语" }, { "id": "work_ieee_p1776_d08_dec_2007", "type": "work", "title": "IEEE Std P1776_D08, Dec 2007", "slug": "ieee-std-p1776-d08-dec-2007", "aliases": [ "P1776_D08, Dec 2007", "P1776_D08, Dec 2007 - IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach" ], "summary": "IEEE Std P1776_D08, Dec 2007 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach”；公开目录标为非现行（Inactive），著录年份为 2007 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1776_D08, Dec 2007 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4447422", "locator": "standard_number=P1776_D08, Dec 2007; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:44+08:00", "updatedAt": "2026-11-01T21:59:44+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1776_D08, Dec 2007**（IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach）是[[organization_ieee|电气电子工程师学会]]于 2007 年 12 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1776-d08-dec-2007.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2007, "precision": "year", "display": "2007年" }, "language": "英语" }, { "id": "work_ieee_p1776_d12_jun_2008", "type": "work", "title": "IEEE Std P1776/D12, Jun 2008", "slug": "ieee-std-p1776-d12-jun-2008", "aliases": [ "P1776/D12, Jun 2008", "P1776/D12, Jun 2008 - IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach" ], "summary": "IEEE Std P1776/D12, Jun 2008 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach”；公开目录标为非现行（Inactive），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1776/D12, Jun 2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4588269", "locator": "standard_number=P1776/D12, Jun 2008; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:43+08:00", "updatedAt": "2026-11-01T21:59:43+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1776/D12, Jun 2008**（IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach）是[[organization_ieee|电气电子工程师学会]]于 2008 年 6 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1776-d12-jun-2008.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_p1776_d9b_feb_2008", "type": "work", "title": "IEEE Std P1776/D9b, Feb. 2008", "slug": "ieee-std-p1776-d9b-feb-2008", "aliases": [ "P1776/D9b, Feb. 2008", "P1776/D9b, Feb. 2008 - IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for AC Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mac" ], "summary": "IEEE Std P1776/D9b, Feb. 2008 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for AC Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mac”；公开目录标为非现行（Inactive），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1776/D9b, Feb. 2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4489719", "locator": "standard_number=P1776/D9b, Feb. 2008; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:43+08:00", "updatedAt": "2026-11-01T21:59:43+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1776/D9b, Feb. 2008**（IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for AC Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mac）是[[organization_ieee|电气电子工程师学会]]于 2008 年 2 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1776-d9b-feb-2008.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_p1775_d1_9_8_dec_2009", "type": "work", "title": "IEEE Std P1775/D1.9.8, Dec 2009", "slug": "ieee-std-p1775-d1-9-8-dec-2009", "aliases": [ "P1775/D1.9.8, Dec 2009", "P1775/D1.9.8, Dec 2009 - IEEE Draft Standard for Powerline Communication Equipment -- Electromagnetic Compatibility (EMC) Requirements -- Testing and Measurements Methods" ], "summary": "IEEE Std P1775/D1.9.8, Dec 2009 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Powerline Communication Equipment -- Electromagnetic Compatibility (EMC) Requirements -- Testing and Measurements Methods”；公开目录标为非现行（Inactive），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1775/D1.9.8, Dec 2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5385202", "locator": "standard_number=P1775/D1.9.8, Dec 2009; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:42+08:00", "updatedAt": "2026-11-01T21:59:42+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1775/D1.9.8, Dec 2009**（IEEE Draft Standard for Powerline Communication Equipment -- Electromagnetic Compatibility (EMC) Requirements -- Testing and Measurements Methods）是[[organization_ieee|电气电子工程师学会]]于 2009 年 12 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1775-d1-9-8-dec-2009.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_p1775_1_9_7_mar_2009", "type": "work", "title": "IEEE Std P1775/1.9.7, Mar 2009", "slug": "ieee-std-p1775-1-9-7-mar-2009", "aliases": [ "P1775/1.9.7, Mar 2009", "P1775/1.9.7, Mar 2009 - IEEE Draft Standard for Powerline Communication Equipment - Electromagnetic Compatibility (EMC) Requirements - Testing and Measurements Methods" ], "summary": "IEEE Std P1775/1.9.7, Mar 2009 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Powerline Communication Equipment - Electromagnetic Compatibility (EMC) Requirements - Testing and Measurements Methods”；公开目录标为非现行（Inactive），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1775/1.9.7, Mar 2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4810943", "locator": "standard_number=P1775/1.9.7, Mar 2009; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:41+08:00", "updatedAt": "2026-11-01T21:59:41+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1775/1.9.7, Mar 2009**（IEEE Draft Standard for Powerline Communication Equipment - Electromagnetic Compatibility (EMC) Requirements - Testing and Measurements Methods）是[[organization_ieee|电气电子工程师学会]]于 2009 年 3 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1775-1-9-7-mar-2009.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_1667_2006", "type": "work", "title": "IEEE Std 1667-2006", "slug": "ieee-std-1667-2006", "aliases": [ "1667-2006", "1667-2006 - IEEE Standard Protocol for Authentication in Host Attachments of Transient Storage Devices" ], "summary": "IEEE Std 1667-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard Protocol for Authentication in Host Attachments of Transient Storage Devices”；公开目录标为已被替代（Superseded），著录年份为 2007 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1667-2006 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4233253", "locator": "standard_number=1667-2006; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:33+08:00", "updatedAt": "2026-11-01T21:59:33+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1667-2006**（IEEE Standard Protocol for Authentication in Host Attachments of Transient Storage Devices）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2007 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1667-2006.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2007, "precision": "year", "display": "2007年" }, "language": "英语" }, { "id": "work_ieee_1667_2009_5438721", "type": "work", "title": "IEEE Std 1667-2009", "slug": "ieee-std-1667-2009-5438721", "aliases": [ "1667-2009", "1667-2009 - IEEE Standard for Authentication in Host Attachments of Transient Storage Devices" ], "summary": "IEEE Std 1667-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard for Authentication in Host Attachments of Transient Storage Devices”；公开目录标为已被替代（Superseded），著录年份为 2010 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1667-2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5438721", "locator": "standard_number=1667-2009; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:33+08:00", "updatedAt": "2026-11-01T21:59:33+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1667-2009**（IEEE Standard for Authentication in Host Attachments of Transient Storage Devices）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2010 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1667-2009-5438721.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2010, "precision": "year", "display": "2010年" }, "language": "英语" }, { "id": "work_ieee_1667_2009_5953415_redline", "type": "work", "title": "IEEE Std 1667-2009", "slug": "ieee-std-1667-2009-5953415-redline", "aliases": [ "1667-2009", "1667-2009 - IEEE Standard for Authentication in Host Attachments of Transient Storage Devices - Redline" ], "summary": "IEEE Std 1667-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard for Authentication in Host Attachments of Transient Storage Devices - Redline”；公开目录标为已被替代（Superseded），红线对照（Redline），著录年份为 2010 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1667-2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5953415", "locator": "standard_number=1667-2009; status=Superseded; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:33+08:00", "updatedAt": "2026-11-01T21:59:33+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1667-2009**（IEEE Standard for Authentication in Host Attachments of Transient Storage Devices - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），红线对照（Redline），著录年份为 2010 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1667-2009-5953415-redline.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2010, "precision": "year", "display": "2010年" }, "language": "英语" }, { "id": "work_ieee_1667_2015_7389947", "type": "work", "title": "IEEE Std 1667-2015", "slug": "ieee-std-1667-2015-7389947", "aliases": [ "1667-2015", "1667-2015 - IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices" ], "summary": "IEEE Std 1667-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices”；公开目录标为已被替代（Superseded），著录年份为 2016 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1667-2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7389947", "locator": "standard_number=1667-2015; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:33+08:00", "updatedAt": "2026-11-01T21:59:33+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1667-2015**（IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2016 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1667-2015-7389947.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2016, "precision": "year", "display": "2016年" }, "language": "英语" }, { "id": "work_ieee_1667_2015_7544434_redline", "type": "work", "title": "IEEE Std 1667-2015", "slug": "ieee-std-1667-2015-7544434-redline", "aliases": [ "1667-2015", "1667-2015 - IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline" ], "summary": "IEEE Std 1667-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline”；公开目录标为已被替代（Superseded），红线对照（Redline），著录年份为 2016 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1667-2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7544434", "locator": "standard_number=1667-2015; status=Superseded; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:33+08:00", "updatedAt": "2026-11-01T21:59:33+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1667-2015**（IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），红线对照（Redline），著录年份为 2016 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1667-2015-7544434-redline.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2016, "precision": "year", "display": "2016年" }, "language": "英语" }, { "id": "work_ieee_1657_2009", "type": "work", "title": "IEEE Std 1657-2009", "slug": "ieee-std-1657-2009", "aliases": [ "1657-2009", "1657-2009 - IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries" ], "summary": "IEEE Std 1657-2009 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries”；公开目录标为已被替代（Superseded），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1657-2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5357368", "locator": "standard_number=1657-2009; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1657-2009**（IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2009 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1657-2009.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_1657_2018_8697214_redline", "type": "work", "title": "IEEE Std 1657-2018", "slug": "ieee-std-1657-2018-8697214-redline", "aliases": [ "1657-2018", "1657-2018 - IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries - Redline" ], "summary": "IEEE Std 1657-2018 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2018 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1657-2018 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8697214", "locator": "standard_number=1657-2018; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1657-2018**（IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2018 年，主题领域包括 Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1657-2018-8697214-redline.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2018, "precision": "year", "display": "2018年" }, "language": "英语" }, { "id": "work_ieee_1657a_2015", "type": "work", "title": "IEEE Std 1657a-2015", "slug": "ieee-std-1657a-2015", "aliases": [ "1657a-2015", "1657a-2015 - IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries - Amendment 1: Updated Safety Sections" ], "summary": "IEEE Std 1657a-2015 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries - Amendment 1: Updated Safety Sections”；公开目录标为已被替代（Superseded），著录年份为 2015 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1657a-2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7286924", "locator": "standard_number=1657a-2015; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1657a-2015**（IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries - Amendment 1: Updated Safety Sections）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2015 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1657a-2015.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2015, "precision": "year", "display": "2015年" }, "language": "英语" }, { "id": "work_ieee_1658_2011", "type": "work", "title": "IEEE Std 1658-2011", "slug": "ieee-std-1658-2011", "aliases": [ "1658-2011", "1658-2011 - IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices" ], "summary": "IEEE Std 1658-2011 是电气电子工程师学会的技术标准，题为“IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1658-2011 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6152111", "locator": "standard_number=1658-2011; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1658-2011**（IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2012 年，主题领域包括 Power, Energy and Industry Applications、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1658-2011.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_1660_2008", "type": "work", "title": "IEEE Std 1660-2008", "slug": "ieee-std-1660-2008", "aliases": [ "1660-2008", "1660-2008 - IEEE Guide for Application and Management of Stationary Batteries Used in Cycling Service" ], "summary": "IEEE Std 1660-2008 是电气电子工程师学会的技术标准，题为“IEEE Guide for Application and Management of Stationary Batteries Used in Cycling Service”；公开目录标为已被替代（Superseded），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1660-2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4690896", "locator": "standard_number=1660-2008; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1660-2008**（IEEE Guide for Application and Management of Stationary Batteries Used in Cycling Service）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1660-2008.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_1661_2007", "type": "work", "title": "IEEE Std 1661-2007", "slug": "ieee-std-1661-2007", "aliases": [ "1661-2007", "1661-2007 - IEEE Guide for Test and Evaluation of Lead-Acid Batteries Used in Photovoltaic (PV) Hybrid Power Systems" ], "summary": "IEEE Std 1661-2007 是电气电子工程师学会的技术标准，题为“IEEE Guide for Test and Evaluation of Lead-Acid Batteries Used in Photovoltaic (PV) Hybrid Power Systems”；公开目录标为已被替代（Superseded），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1661-2007 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4449090", "locator": "standard_number=1661-2007; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1661-2007**（IEEE Guide for Test and Evaluation of Lead-Acid Batteries Used in Photovoltaic (PV) Hybrid Power Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1661-2007.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_1661_2019_8866829_redline", "type": "work", "title": "IEEE Std 1661-2019", "slug": "ieee-std-1661-2019-8866829-redline", "aliases": [ "1661-2019", "1661-2019 - IEEE Guide for Test and Evaluation of Lead-Acid Batteries Used in Photovoltaic (PV) Hybrid Power Systems - Redline" ], "summary": "IEEE Std 1661-2019 是电气电子工程师学会的技术标准，题为“IEEE Guide for Test and Evaluation of Lead-Acid Batteries Used in Photovoltaic (PV) Hybrid Power Systems - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2019 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1661-2019 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8866829", "locator": "standard_number=1661-2019; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1661-2019**（IEEE Guide for Test and Evaluation of Lead-Acid Batteries Used in Photovoltaic (PV) Hybrid Power Systems - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2019 年，主题领域包括 Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas、Photonics and Electrooptics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1661-2019-8866829-redline.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2019, "precision": "year", "display": "2019年" }, "language": "英语" }, { "id": "work_ieee_1662_2008", "type": "work", "title": "IEEE Std 1662-2008", "slug": "ieee-std-1662-2008", "aliases": [ "1662-2008", "1662-2008 - IEEE Guide for the Design and Application of Power Electronics in Electrical Power Systems on Ships" ], "summary": "IEEE Std 1662-2008 是电气电子工程师学会的技术标准，题为“IEEE Guide for the Design and Application of Power Electronics in Electrical Power Systems on Ships”；公开目录标为已被替代（Superseded），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1662-2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4804132", "locator": "standard_number=1662-2008; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1662-2008**（IEEE Guide for the Design and Application of Power Electronics in Electrical Power Systems on Ships）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2009 年，主题领域包括 Power, Energy and Industry Applications、Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1662-2008.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_1662_2016_7874056", "type": "work", "title": "IEEE Std 1662-2016", "slug": "ieee-std-1662-2016-7874056", "aliases": [ "1662-2016", "1662-2016 - IEEE Recommended Practice for the Design and Application of Power Electronics in Electrical Power Systems" ], "summary": "IEEE Std 1662-2016 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for the Design and Application of Power Electronics in Electrical Power Systems”；公开目录标为已被替代（Superseded），著录年份为 2017 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1662-2016 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7874056", "locator": "standard_number=1662-2016; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1662-2016**（IEEE Recommended Practice for the Design and Application of Power Electronics in Electrical Power Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2017 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1662-2016-7874056.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2017, "precision": "year", "display": "2017年" }, "language": "英语" }, { "id": "work_ieee_1662_2016_8085448_redline", "type": "work", "title": "IEEE Std 1662-2016", "slug": "ieee-std-1662-2016-8085448-redline", "aliases": [ "1662-2016", "1662-2016 - IEEE Recommended Practice for the Design and Application of Power Electronics in Electrical Power Systems - Redline" ], "summary": "IEEE Std 1662-2016 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for the Design and Application of Power Electronics in Electrical Power Systems - Redline”；公开目录标为已被替代（Superseded），红线对照（Redline），著录年份为 2017 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1662-2016 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8085448", "locator": "standard_number=1662-2016; status=Superseded; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1662-2016**（IEEE Recommended Practice for the Design and Application of Power Electronics in Electrical Power Systems - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），红线对照（Redline），著录年份为 2017 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1662-2016-8085448-redline.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2017, "precision": "year", "display": "2017年" }, "language": "英语" }, { "id": "work_ieee_1662_2023_10964814_redline", "type": "work", "title": "IEEE Std 1662-2023", "slug": "ieee-std-1662-2023-10964814-redline", "aliases": [ "1662-2023", "1662-2023 - IEEE Recommended Practice for the Design and Application of Power Electronics in Electrical Power Systems - Redline" ], "summary": "IEEE Std 1662-2023 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for the Design and Application of Power Electronics in Electrical Power Systems - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2024 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1662-2023 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=10964814", "locator": "standard_number=1662-2023; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1662-2023**（IEEE Recommended Practice for the Design and Application of Power Electronics in Electrical Power Systems - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2024 年，主题领域包括 Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1662-2023-10964814-redline.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2024, "precision": "year", "display": "2024年" }, "language": "英语" }, { "id": "work_ieee_1665_2009", "type": "work", "title": "IEEE Std 1665-2009", "slug": "ieee-std-1665-2009", "aliases": [ "1665-2009", "1665-2009 - IEEE Guide for the Rewind of Synchronous Generators, 50 Hz and 60 Hz, Rated 1 MVA and Above" ], "summary": "IEEE Std 1665-2009 是电气电子工程师学会的技术标准，题为“IEEE Guide for the Rewind of Synchronous Generators, 50 Hz and 60 Hz, Rated 1 MVA and Above”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2010 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1665-2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5415855", "locator": "standard_number=1665-2009; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1665-2009**（IEEE Guide for the Rewind of Synchronous Generators, 50 Hz and 60 Hz, Rated 1 MVA and Above）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2010 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1665-2009.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2010, "precision": "year", "display": "2010年" }, "language": "英语" }, { "id": "work_ieee_1666_2011_6134617", "type": "work", "title": "IEEE Std 1666-2011", "slug": "ieee-std-1666-2011-6134617", "aliases": [ "1666-2011", "1666-2011 - IEEE Standard for Standard SystemC Language Reference Manual" ], "summary": "IEEE Std 1666-2011 是电气电子工程师学会的技术标准，题为“IEEE Standard for Standard SystemC Language Reference Manual”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1666-2011 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6134617", "locator": "standard_number=1666-2011; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1666-2011**（IEEE Standard for Standard SystemC Language Reference Manual）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2012 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1666-2011-6134617.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_1666_2011_6581814_redline", "type": "work", "title": "IEEE Std 1666-2011", "slug": "ieee-std-1666-2011-6581814-redline", "aliases": [ "1666-2011", "1666-2011 - IEEE Standard for Standard SystemC Language Reference Manual - Redline" ], "summary": "IEEE Std 1666-2011 是电气电子工程师学会的技术标准，题为“IEEE Standard for Standard SystemC Language Reference Manual - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1666-2011 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6581814", "locator": "standard_number=1666-2011; status=Inactive; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1666-2011**（IEEE Standard for Standard SystemC Language Reference Manual - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2012 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1666-2011-6581814-redline.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_166_1977", "type": "work", "title": "IEEE Std 166-1977", "slug": "ieee-std-166-1977", "aliases": [ "166-1977", "166-1977 - IEEE Standard Definitions of Terms for Hybrid Computer Linkage Components" ], "summary": "IEEE Std 166-1977 是电气电子工程师学会的技术标准，题为“IEEE Standard Definitions of Terms for Hybrid Computer Linkage Components”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1977 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 166-1977 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=2672", "locator": "standard_number=166-1977; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 166-1977**（IEEE Standard Definitions of Terms for Hybrid Computer Linkage Components）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1977 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-166-1977.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1977, "precision": "year", "display": "1977年" }, "language": "英语" }, { "id": "work_ieee_1656_2010", "type": "work", "title": "IEEE Std 1656-2010", "slug": "ieee-std-1656-2010", "aliases": [ "1656-2010", "1656-2010 - IEEE Guide for Testing the Electrical, Mechanical, and Durability Performance of Wildlife Protective Devices on Overhead Power Distribution Systems Rated up to 38 kV" ], "summary": "IEEE Std 1656-2010 是电气电子工程师学会的技术标准，题为“IEEE Guide for Testing the Electrical, Mechanical, and Durability Performance of Wildlife Protective Devices on Overhead Power Distribution Systems Rated up to 38 kV”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1656-2010 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5722088", "locator": "standard_number=1656-2010; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:21+08:00", "updatedAt": "2026-11-01T21:59:21+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1656-2010**（IEEE Guide for Testing the Electrical, Mechanical, and Durability Performance of Wildlife Protective Devices on Overhead Power Distribution Systems Rated up to 38 kV）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1656-2010.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2011, "precision": "year", "display": "2011年" }, "language": "英语" }, { "id": "work_ieee_p1775", "type": "work", "title": "IEEE Std P1775", "slug": "ieee-std-p1775", "aliases": [ "P1775", "P1775 - IEEE Draft Standard for Powerline Communication Equipment - Electromagnetic Compatibility (EMC) Requirements - Testing and Measurement Methods" ], "summary": "IEEE Std P1775 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Powerline Communication Equipment - Electromagnetic Compatibility (EMC) Requirements - Testing and Measurement Methods”；公开目录标为非现行（Inactive），著录年份为 2010 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1775 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5551088", "locator": "standard_number=P1775; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:20+08:00", "updatedAt": "2026-11-01T21:59:20+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1775**（IEEE Draft Standard for Powerline Communication Equipment - Electromagnetic Compatibility (EMC) Requirements - Testing and Measurement Methods）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2010 年，主题领域包括 Power, Energy and Industry Applications、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1775.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2010, "precision": "year", "display": "2010年" }, "language": "英语" }, { "id": "work_ieee_p1770_d2_jan_2021", "type": "work", "title": "IEEE Std P1770/D2, Jan 2021", "slug": "ieee-std-p1770-d2-jan-2021", "aliases": [ "P1770/D2, Jan 2021", "P1770/D2, Jan 2021 - IEEE Draft Recommended Practice for The Usage of Terms Commonly Employed In the Field of Large-Signal Vector Network Analysis" ], "summary": "IEEE Std P1770/D2, Jan 2021 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for The Usage of Terms Commonly Employed In the Field of Large-Signal Vector Network Analysis”；公开目录标为非现行（Inactive），著录年份为 2021 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1770/D2, Jan 2021 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9416315", "locator": "standard_number=P1770/D2, Jan 2021; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:19+08:00", "updatedAt": "2026-11-01T21:59:19+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1770/D2, Jan 2021**（IEEE Draft Recommended Practice for The Usage of Terms Commonly Employed In the Field of Large-Signal Vector Network Analysis）是[[organization_ieee|电气电子工程师学会]]于 2021 年 1 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1770-d2-jan-2021.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2021, "precision": "year", "display": "2021年" }, "language": "英语" }, { "id": "work_ieee_1653_1_2016", "type": "work", "title": "IEEE Std 1653.1-2016", "slug": "ieee-std-1653-1-2016", "aliases": [ "1653.1-2016", "1653.1-2016 - IEEE Standard for Traction Power Rectifier Transformers for Substation Applications up to 1500 V DC Nominal Output" ], "summary": "IEEE Std 1653.1-2016 是电气电子工程师学会的技术标准，题为“IEEE Standard for Traction Power Rectifier Transformers for Substation Applications up to 1500 V DC Nominal Output”；公开目录标为已被替代（Superseded），著录年份为 2017 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1653.1-2016 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7839877", "locator": "standard_number=1653.1-2016; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:18+08:00", "updatedAt": "2026-11-01T21:59:18+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1653.1-2016**（IEEE Standard for Traction Power Rectifier Transformers for Substation Applications up to 1500 V DC Nominal Output）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2017 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1653-1-2016.html", "lang": "ar", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2017, "precision": "year", "display": "2017年" }, "language": "英语" } ], "lang": "ar", "pagination": { "page": 93, "pageSize": 50, "total": 11882, "pageCount": 238, "prevUrl": "/ar/works-92.json?type=work", "nextUrl": "/ar/works-94.json?type=work" } }