<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>IEEE 标准 · Beziehungen</title>
  <description>IEEE 标准是电气电子工程师学会发布的技术标准文献集合，涵盖通信、电力、计算与电磁兼容等领域；公开目录以 KBART 列表提供编号、题名、状态与 IEEE Xplore 题录链接。</description>
  <url>/de/concepts/ieee-standards/relation-134.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>concept_ieee_standards</id>
    <type>concept</type>
    <title>IEEE 标准</title>
    <slug>ieee-standards</slug>
    <aliases>
      <alias>IEEE Standards</alias>
      <alias>IEEE Std</alias>
      <alias>电气电子工程师学会标准</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>IEEE 标准是电气电子工程师学会发布的技术标准文献集合，涵盖通信、电力、计算与电磁兼容等领域；公开目录以 KBART 列表提供编号、题名、状态与 IEEE Xplore 题录链接。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        <locator>2026-11-01 下载</locator>
      </source>
      <source>
        <id>s2</id>
        <title>KBART Title Lists</title>
        <author>IEEE Xplore Help</author>
        <url>https://ieeexplore.ieee.org/Xplorehelp/discovery-services/kbart-title-lists</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Standards Association / standards.ieee.org</title>
        <author>IEEE</author>
        <url>https://standards.ieee.org/</url>
      </source>
      <source>
        <id>s4</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:58+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:58+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**IEEE 标准**是[[organization_ieee|电气电子工程师学会]]（IEEE）通过其标准化活动发布的技术标准文献[^s3][^s4]。&#xA;&#xA;## 定义与范围&#xA;&#xA;公开机读目录「IEEE Xplore All Standards」以 KBART 格式列出标准编号、题名、出版年份、状态（如 Active、Superseded、Inactive）及 IEEE Xplore 题录链接等元数据，不提供付费全文[^s1][^s2]。本知识库按该目录逐条建立标准词条（work，workKind=standard），每条保留官方目录出处。&#xA;&#xA;## 沿革&#xA;&#xA;IEEE 由 AIEE 与 IRE 于1963年合并成立后继续并扩展标准制定；现行与历史版本均出现在 Xplore 标准集合中[^s4][^s1]。&#xA;&#xA;## 相关概念&#xA;&#xA;词条之间以发布机构、主题关系连接；同一标准号的多年版本各自成条或在正文互相链接，以便维护。</body>
    <url>/concepts/ieee-standards.html</url>
    <lang>de</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <conceptKind>theme</conceptKind>
    <scopeNote>本条为总览；各标准号以独立 work 词条著录，勿仅在本条列表省略。</scopeNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_e9e7d8c257ff22ffc1d1bd5d</id>
      <fromId>work_ieee_750_5_1960</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_750_5_1960</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_750_5_1960</targetId>
      <targetTitle>IEEE Std 750.5-1960</targetTitle>
      <targetUrl>/de/works/ieee-std-750-5-1960.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_27cadc72d92e143643cdef83</id>
      <fromId>work_ieee_751_1990</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_751_1990</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_751_1990</targetId>
      <targetTitle>IEEE Std 751-1990</targetTitle>
      <targetUrl>/de/works/ieee-std-751-1990.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_88b66ad9760bf0b923533140</id>
      <fromId>work_ieee_751_1991</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_751_1991</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_751_1991</targetId>
      <targetTitle>IEEE Std 751-1991</targetTitle>
      <targetUrl>/de/works/ieee-std-751-1991.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d1980071f4200c355ab4bc0f</id>
      <fromId>work_ieee_752_1986</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_752_1986</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_752_1986</targetId>
      <targetTitle>IEEE Std 752-1986</targetTitle>
      <targetUrl>/de/works/ieee-std-752-1986.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2fc735470e2ff394e8e4b4d0</id>
      <fromId>work_ieee_753_1983</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_753_1983</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_753_1983</targetId>
      <targetTitle>IEEE Std 753-1983</targetTitle>
      <targetUrl>/de/works/ieee-std-753-1983.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0dfc15ef9bd5b7863b913c00</id>
      <fromId>work_ieee_754_1985</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_754_1985</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_754_1985</targetId>
      <targetTitle>IEEE Std 754-1985</targetTitle>
      <targetUrl>/de/works/ieee-std-754-1985.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b73461f95f328845e9a63702</id>
      <fromId>work_ieee_754_2008_4610933</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_754_2008_4610933</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_754_2008_4610933</targetId>
      <targetTitle>IEEE Std 754-2008</targetTitle>
      <targetUrl>/de/works/ieee-std-754-2008-4610933.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_17eee21fd41c2c1daca2324c</id>
      <fromId>work_ieee_754_2008_5976966_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_754_2008_5976966_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_754_2008_5976966_redline</targetId>
      <targetTitle>IEEE Std 754-2008</targetTitle>
      <targetUrl>/de/works/ieee-std-754-2008-5976966-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_57c74ba4431a4c682d5a7c1c</id>
      <fromId>work_ieee_754_2019_8866808_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_754_2019_8866808_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_754_2019_8866808_redline</targetId>
      <targetTitle>IEEE Std 754-2019</targetTitle>
      <targetUrl>/de/works/ieee-std-754-2019-8866808-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8757011e7163669eebac7823</id>
      <fromId>work_ieee_755_1985</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_755_1985</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_755_1985</targetId>
      <targetTitle>IEEE Std 755-1985</targetTitle>
      <targetUrl>/de/works/ieee-std-755-1985.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_da372ae32fa393e45c8735d2</id>
      <fromId>work_ieee_756_1984</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_756_1984</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_756_1984</targetId>
      <targetTitle>IEEE Std 756-1984</targetTitle>
      <targetUrl>/de/works/ieee-std-756-1984.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_77e650d710b856a5c321fc3c</id>
      <fromId>work_ieee_758_1979</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_758_1979</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_758_1979</targetId>
      <targetTitle>IEEE Std 758-1979</targetTitle>
      <targetUrl>/de/works/ieee-std-758-1979.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6d2462e254215b726bf5fa2c</id>
      <fromId>work_ieee_759_1984</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_759_1984</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_759_1984</targetId>
      <targetTitle>IEEE Std 759-1984</targetTitle>
      <targetUrl>/de/works/ieee-std-759-1984.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3375d692d8cd5e13592719df</id>
      <fromId>work_ieee_76_1958</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_76_1958</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_76_1958</targetId>
      <targetTitle>IEEE Std 76-1958</targetTitle>
      <targetUrl>/de/works/ieee-std-76-1958.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_71f67ed239d2397290a3c6a2</id>
      <fromId>work_ieee_76_1974</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_76_1974</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_76_1974</targetId>
      <targetTitle>IEEE Std 76-1974</targetTitle>
      <targetUrl>/de/works/ieee-std-76-1974.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_5d84b2006c9bfb754e70b45f</id>
      <fromId>work_ieee_762_1980</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_762_1980</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_762_1980</targetId>
      <targetTitle>IEEE Std 762-1980</targetTitle>
      <targetUrl>/de/works/ieee-std-762-1980.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_258e25e4b874050c06c22ec5</id>
      <fromId>work_ieee_762_1987</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_762_1987</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_762_1987</targetId>
      <targetTitle>IEEE Std 762-1987</targetTitle>
      <targetUrl>/de/works/ieee-std-762-1987.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bc431fd4213c72f2a0e0db0b</id>
      <fromId>work_ieee_762_2006</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_762_2006</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_762_2006</targetId>
      <targetTitle>IEEE Std 762-2006</targetTitle>
      <targetUrl>/de/works/ieee-std-762-2006.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_56dc35cb971bfc82f98bb240</id>
      <fromId>work_ieee_762_2023_10669322_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_762_2023_10669322_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_762_2023_10669322_redline</targetId>
      <targetTitle>IEEE Std 762-2023</targetTitle>
      <targetUrl>/de/works/ieee-std-762-2023-10669322-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9487a775a03bbe9e7887e465</id>
      <fromId>work_ieee_765_1983</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_765_1983</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_765_1983</targetId>
      <targetTitle>IEEE Std 765-1983</targetTitle>
      <targetUrl>/de/works/ieee-std-765-1983.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ec95ec0bccb5d89c05bb8fe9</id>
      <fromId>work_ieee_765_1995</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_765_1995</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_765_1995</targetId>
      <targetTitle>IEEE Std 765-1995</targetTitle>
      <targetUrl>/de/works/ieee-std-765-1995.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_64dec3f1e000ecc6a8c2ec61</id>
      <fromId>work_ieee_765_2002</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_765_2002</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_765_2002</targetId>
      <targetTitle>IEEE Std 765-2002</targetTitle>
      <targetUrl>/de/works/ieee-std-765-2002.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_cc8221f1515711cd26f19783</id>
      <fromId>work_ieee_765_2006</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_765_2006</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_765_2006</targetId>
      <targetTitle>IEEE Std 765-2006</targetTitle>
      <targetUrl>/de/works/ieee-std-765-2006.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4043119e0a86b4d693634673</id>
      <fromId>work_ieee_p2700_d3_apr_2017</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2700_d3_apr_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2700_d3_apr_2017</targetId>
      <targetTitle>IEEE Std P2700/D3, Apr 2017</targetTitle>
      <targetUrl>/de/works/ieee-std-p2700-d3-apr-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0008140dd204a62ff3836de0</id>
      <fromId>work_ieee_p2715_d1_apr_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2715_d1_apr_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2715_d1_apr_2022</targetId>
      <targetTitle>IEEE Std P2715/D1, Apr 2022</targetTitle>
      <targetUrl>/de/works/ieee-std-p2715-d1-apr-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0873d4c1975b91bd3fd729aa</id>
      <fromId>work_ieee_p2715_d2_apr_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2715_d2_apr_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2715_d2_apr_2022</targetId>
      <targetTitle>IEEE Std P2715/D2, Apr 2022</targetTitle>
      <targetUrl>/de/works/ieee-std-p2715-d2-apr-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ccb8160121a9707db6b89a4a</id>
      <fromId>work_ieee_p2715_d3_oct_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2715_d3_oct_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2715_d3_oct_2022</targetId>
      <targetTitle>IEEE Std P2715/D3, Oct 2022</targetTitle>
      <targetUrl>/de/works/ieee-std-p2715-d3-oct-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_34202cd55e27ec7461e12dec</id>
      <fromId>work_ieee_p2715_d4_nov_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2715_d4_nov_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2715_d4_nov_2022</targetId>
      <targetTitle>IEEE Std P2715/D4, Nov 2022</targetTitle>
      <targetUrl>/de/works/ieee-std-p2715-d4-nov-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7f18fe4d919161b9b22cc3d7</id>
      <fromId>work_ieee_p2716_d1_apr_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2716_d1_apr_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2716_d1_apr_2022</targetId>
      <targetTitle>IEEE Std P2716/D1, Apr 2022</targetTitle>
      <targetUrl>/de/works/ieee-std-p2716-d1-apr-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f84c49c75eeffdf9e0b657d1</id>
      <fromId>work_ieee_p2717_d4_1_jun_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2717_d4_1_jun_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2717_d4_1_jun_2023</targetId>
      <targetTitle>IEEE Std P2717/D4.1, Jun 2023</targetTitle>
      <targetUrl>/de/works/ieee-std-p2717-d4-1-jun-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7792ae3e078f8a9de74e6a8c</id>
      <fromId>work_ieee_p2717_d4_2_jan_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2717_d4_2_jan_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2717_d4_2_jan_2024</targetId>
      <targetTitle>IEEE Std P2717/D4.2, Jan 2024</targetTitle>
      <targetUrl>/de/works/ieee-std-p2717-d4-2-jan-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3ddd8723b92124aa5d1da693</id>
      <fromId>work_ieee_p2717_d4_3_apr_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2717_d4_3_apr_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2717_d4_3_apr_2024</targetId>
      <targetTitle>IEEE Std P2717/D4.3, Apr 2024</targetTitle>
      <targetUrl>/de/works/ieee-std-p2717-d4-3-apr-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c1cf4a2a70950ed4b67afc6e</id>
      <fromId>work_ieee_p2718_d10_aug2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2718_d10_aug2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2718_d10_aug2023</targetId>
      <targetTitle>IEEE Std P2718/D10, Aug2023</targetTitle>
      <targetUrl>/de/works/ieee-std-p2718-d10-aug2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_acdb052ea1d712e00f950217</id>
      <fromId>work_ieee_p2718_d8_mar_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2718_d8_mar_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2718_d8_mar_2023</targetId>
      <targetTitle>IEEE Std P2718/D8, Mar 2023</targetTitle>
      <targetUrl>/de/works/ieee-std-p2718-d8-mar-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2beee9791f47be7507e91372</id>
      <fromId>work_ieee_p2718_d9_jul_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2718_d9_jul_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2718_d9_jul_2023</targetId>
      <targetTitle>IEEE Std P2718/D9, Jul 2023</targetTitle>
      <targetUrl>/de/works/ieee-std-p2718-d9-jul-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ea1b337b0465077c126334d7</id>
      <fromId>work_ieee_p2720_d10_oct_2020</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2720_d10_oct_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2720_d10_oct_2020</targetId>
      <targetTitle>IEEE Std P2720/D10, Oct 2020</targetTitle>
      <targetUrl>/de/works/ieee-std-p2720-d10-oct-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_834bfc0f1fd0e446129eef46</id>
      <fromId>work_ieee_p2720_d11_mar_2021</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2720_d11_mar_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2720_d11_mar_2021</targetId>
      <targetTitle>IEEE Std P2720/D11, Mar 2021</targetTitle>
      <targetUrl>/de/works/ieee-std-p2720-d11-mar-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f797d0f38da017672983e5ad</id>
      <fromId>work_ieee_p2725_1_d3_jun_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2725_1_d3_jun_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2725_1_d3_jun_2024</targetId>
      <targetTitle>IEEE Std P2725.1/D3, Jun 2024</targetTitle>
      <targetUrl>/de/works/ieee-std-p2725-1-d3-jun-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9374fbad8ae6bec9d108a546</id>
      <fromId>work_ieee_p2725_1_d4_aug_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2725_1_d4_aug_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2725_1_d4_aug_2024</targetId>
      <targetTitle>IEEE Std P2725.1/D4, Aug 2024</targetTitle>
      <targetUrl>/de/works/ieee-std-p2725-1-d4-aug-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_654c4cc90a660603edf5d64a</id>
      <fromId>work_ieee_p2730_d1_2_jul_2019</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2730_d1_2_jul_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2730_d1_2_jul_2019</targetId>
      <targetTitle>IEEE Std P2730/D1.2, Jul 2019</targetTitle>
      <targetUrl>/de/works/ieee-std-p2730-d1-2-jul-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_16629970e70ae06a2cbe7976</id>
      <fromId>work_ieee_p2730_d1_3_may_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2730_d1_3_may_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2730_d1_3_may_2022</targetId>
      <targetTitle>IEEE Std P2730/D1.3, May 2022</targetTitle>
      <targetUrl>/de/works/ieee-std-p2730-d1-3-may-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8bcf355d3f98c0668ed6afad</id>
      <fromId>work_ieee_p2735_1_d4_0_july_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2735_1_d4_0_july_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2735_1_d4_0_july_2022</targetId>
      <targetTitle>IEEE Std P2735.1/D4.0, July 2022</targetTitle>
      <targetUrl>/de/works/ieee-std-p2735-1-d4-0-july-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_727c5ec857d29e8210a854ff</id>
      <fromId>work_ieee_p2735_1_d4_1_aug_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2735_1_d4_1_aug_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2735_1_d4_1_aug_2022</targetId>
      <targetTitle>IEEE Std P2735.1/D4.1, Aug 2022</targetTitle>
      <targetUrl>/de/works/ieee-std-p2735-1-d4-1-aug-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_da3a1180704bc807d73d719b</id>
      <fromId>work_ieee_p2735_1_d4_2_aug_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2735_1_d4_2_aug_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2735_1_d4_2_aug_2022</targetId>
      <targetTitle>IEEE Std P2735.1/D4.2, Aug 2022</targetTitle>
      <targetUrl>/de/works/ieee-std-p2735-1-d4-2-aug-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2c3e9d3aab1529e0a23c2ea5</id>
      <fromId>work_ieee_p2735_d4_1_jul_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2735_d4_1_jul_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2735_d4_1_jul_2022</targetId>
      <targetTitle>IEEE Std P2735/D4.1, Jul 2022</targetTitle>
      <targetUrl>/de/works/ieee-std-p2735-d4-1-jul-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_33b95b44272afe0ffbbae292</id>
      <fromId>work_ieee_p2735_d4_2_august_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2735_d4_2_august_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2735_d4_2_august_2022</targetId>
      <targetTitle>IEEE Std P2735/D4.2, August 2022</targetTitle>
      <targetUrl>/de/works/ieee-std-p2735-d4-2-august-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_110699e8ea1db7bdc981cbf6</id>
      <fromId>work_ieee_p2740_d5_2_jun_2019</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2740_d5_2_jun_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2740_d5_2_jun_2019</targetId>
      <targetTitle>IEEE Std P2740/D5.2, Jun 2019</targetTitle>
      <targetUrl>/de/works/ieee-std-p2740-d5-2-jun-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6f17b29d2acbbd6e6a80b783</id>
      <fromId>work_ieee_p2740_d6_5_aug_2020</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2740_d6_5_aug_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p2740_d6_5_aug_2020</targetId>
      <targetTitle>IEEE Std P2740/D6.5, Aug 2020</targetTitle>
      <targetUrl>/de/works/ieee-std-p2740-d6-5-aug-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ff6fe42c74656edf1854a576</id>
      <fromId>work_ieee_765_2012_6420846</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_765_2012_6420846</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_765_2012_6420846</targetId>
      <targetTitle>IEEE Std 765-2012</targetTitle>
      <targetUrl>/de/works/ieee-std-765-2012-6420846.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6c570f46c807df35099fce2f</id>
      <fromId>work_ieee_765_2012_6523048_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_765_2012_6523048_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_765_2012_6523048_redline</targetId>
      <targetTitle>IEEE Std 765-2012</targetTitle>
      <targetUrl>/de/works/ieee-std-765-2012-6523048-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/de/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/de/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/de/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/de/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/de/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/de/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/de/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/de/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/de/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_1_1988</fromId>
      <fromTitle>IEEE Std 1003.1-1988</fromTitle>
      <fromUrl>/de/works/ieee-std-1003-1-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>de</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>concept_kind</key>
      <label>Concept kind</label>
      <value>Thema</value>
    </field>
    <field>
      <key>aliases</key>
      <label>Aliases</label>
      <value>IEEE Standards, IEEE Std, 电气电子工程师学会标准</value>
    </field>
    <field>
      <key>scope_note</key>
      <label>Scope note</label>
      <value>本条为总览；各标准号以独立 work 词条著录，勿仅在本条列表省略。</value>
    </field>
  </infoFields>
  <pagination>
    <page>134</page>
    <pageSize>50</pageSize>
    <total>8263</total>
    <pageCount>166</pageCount>
    <prevUrl>/de/concepts/ieee-standards/relation-133.xml</prevUrl>
    <nextUrl>/de/concepts/ieee-standards/relation-135.xml</nextUrl>
  </pagination>
  <relationsTotal>8263</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8278</mentionsTotal>
  <mentionsUrl>/de/concepts/ieee-standards/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>