IEEE Std 775-1993
URL: https://knowledge.ivjn.us/de/works/ieee-std-775-1993.html

IEEE Std 775-1993 是电气电子工程师学会的技术标准，题为“IEEE Guide for Designing Multistress Aging Tests of Electrical Insulation in a Radiation Environment”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1993 年。

**IEEE Std 775-1993**（IEEE Guide for Designing Multistress Aging Tests of Electrical Insulation in a Radiation Environment）是[电气电子工程师学会](https://knowledge.ivjn.us/de/organizations/ieee.html)的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1993 年，主题领域包括 Power, Energy and Industry Applications、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[IEEE 标准](https://knowledge.ivjn.us/de/concepts/ieee-standards.html)。

Updated: 2026-11-01

Tags:
- IEEE standard https://knowledge.ivjn.us/de/tags/ieee-standard.html

Relations:
- Published by: 电气电子工程师学会 https://knowledge.ivjn.us/de/organizations/ieee.html
- About: IEEE 标准 https://knowledge.ivjn.us/de/concepts/ieee-standards.html

Sources:
- IEEE Std 775-1993 — IEEE Xplore 题录 https://ieeexplore.ieee.org/servlet/opac?punumber=2803 standard_number=775-1993; status=Inactive; modifier=Withdrawn
- IEEE Xplore All Standards（KBART） https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt