<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>电气电子工程师学会 · Relations</title>
  <description>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</description>
  <url>/en/organizations/ieee/relation-150.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>organization_ieee</id>
    <type>organization</type>
    <title>电气电子工程师学会</title>
    <slug>ieee</slug>
    <aliases>
      <alias>IEEE</alias>
      <alias>Institute of Electrical and Electronics Engineers</alias>
      <alias>电气和电子工程师协会</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
      <tag>tag-publishing</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
        <locator>2026-11-01 访问</locator>
      </source>
      <source>
        <id>s2</id>
        <title>IEEE 官方网站</title>
        <author>IEEE</author>
        <url>https://www.ieee.org/</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:52+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:52+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**电气电子工程师学会**（Institute of Electrical and Electronics Engineers，简称 IEEE）是1963年1月1日由美国电气工程师学会（AIEE）与无线电工程师学会（IRE）合并成立的专业技术协会，面向电气工程、电子工程及相关学科[^s1]。&#xA;&#xA;## 沿革&#xA;&#xA;该会可追溯至1884年成立的 AIEE；1912年另成立 IRE。两会于1963年合并为 IEEE[^s1]。总会设在纽约，1975年起主要业务在新泽西州皮斯卡特维的运营中心开展[^s1]。&#xA;&#xA;## 职能与业务&#xA;&#xA;IEEE 发布同行评议期刊与会议录，并通过标准化委员会制定技术标准；相关内容可在 IEEE Xplore 平台检索[^s1][^s3]。标准公开目录（KBART）列出标准编号、题名、状态与题录链接等元数据[^s3]。&#xA;&#xA;## 现状&#xA;&#xA;据公开介绍，该会为美国 501(c)(3) 公益性专业协会，全球会员逾48.6万[^s1]。官网为 https://www.ieee.org/ [^s2]。</body>
    <url>/organizations/ieee.html</url>
    <lang>en</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <orgKind>专业协会</orgKind>
    <founded>
      <year>1963</year>
      <month>1</month>
      <day>1</day>
      <precision>day</precision>
      <display>1963年1月1日</display>
    </founded>
    <orgStatus>active</orgStatus>
    <headquartersNote>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</headquartersNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_0e31dcc0e4733299e991bad5</id>
      <fromId>work_ieee_p2969_d7_5_aug_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2969_d7_5_aug_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2969_d7_5_aug_2025</targetId>
      <targetTitle>IEEE Std P2969/D7.5, Aug 2025</targetTitle>
      <targetUrl>/en/works/ieee-std-p2969-d7-5-aug-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7087128be97df85e9c0f05fb</id>
      <fromId>work_ieee_p2970_d7_0_apr_2024</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2970_d7_0_apr_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2970_d7_0_apr_2024</targetId>
      <targetTitle>IEEE Std P2970/D7.0, Apr 2024</targetTitle>
      <targetUrl>/en/works/ieee-std-p2970-d7-0-apr-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b91b825fff6921070e4e0d06</id>
      <fromId>work_ieee_p2974_d6_june_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2974_d6_june_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2974_d6_june_2025</targetId>
      <targetTitle>IEEE Std P2974/D6, June 2025</targetTitle>
      <targetUrl>/en/works/ieee-std-p2974-d6-june-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c8c05c4f943a244df5d6527e</id>
      <fromId>work_ieee_p2974_d7_aug_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2974_d7_aug_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2974_d7_aug_2025</targetId>
      <targetTitle>IEEE Std P2974/D7, Aug 2025</targetTitle>
      <targetUrl>/en/works/ieee-std-p2974-d7-aug-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0de1fc4c4ad9e280c5570893</id>
      <fromId>work_ieee_p2977_d1_apr_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2977_d1_apr_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2977_d1_apr_2021</targetId>
      <targetTitle>IEEE Std P2977/D1, Apr 2021</targetTitle>
      <targetUrl>/en/works/ieee-std-p2977-d1-apr-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f193cb32e6791eb287549597</id>
      <fromId>work_ieee_p2984_d4_1_jun_2024</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2984_d4_1_jun_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2984_d4_1_jun_2024</targetId>
      <targetTitle>IEEE Std P2984/D4.1, Jun 2024</targetTitle>
      <targetUrl>/en/works/ieee-std-p2984-d4-1-jun-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bd0dc98065d3ec0a10cdbb95</id>
      <fromId>work_ieee_p2984_d5_1_dec_2024</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2984_d5_1_dec_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2984_d5_1_dec_2024</targetId>
      <targetTitle>IEEE Std P2984/D5.1, Dec 2024</targetTitle>
      <targetUrl>/en/works/ieee-std-p2984-d5-1-dec-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2c5b24703d00e977402c0daf</id>
      <fromId>work_ieee_p2984_d5_2_mar_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2984_d5_2_mar_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2984_d5_2_mar_2025</targetId>
      <targetTitle>IEEE Std P2984/D5.2, Mar 2025</targetTitle>
      <targetUrl>/en/works/ieee-std-p2984-d5-2-mar-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8ad5e15241aead0a7be00e81</id>
      <fromId>work_ieee_p2984_d5_3_april_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2984_d5_3_april_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2984_d5_3_april_2025</targetId>
      <targetTitle>IEEE Std P2984/D5.3, April 2025</targetTitle>
      <targetUrl>/en/works/ieee-std-p2984-d5-3-april-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0719afdb96a228ce9601939f</id>
      <fromId>work_ieee_p2985_d11_feb_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2985_d11_feb_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2985_d11_feb_2025</targetId>
      <targetTitle>IEEE Std P2985/D11, Feb 2025</targetTitle>
      <targetUrl>/en/works/ieee-std-p2985-d11-feb-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b4582c96a0cb7249b1876e69</id>
      <fromId>work_ieee_p2986_d1_aug_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2986_d1_aug_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2986_d1_aug_2023</targetId>
      <targetTitle>IEEE Std P2986/D1, Aug 2023</targetTitle>
      <targetUrl>/en/works/ieee-std-p2986-d1-aug-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4fbae3ce11e629e83782dcd2</id>
      <fromId>work_ieee_p2986_d1_1_sept_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2986_d1_1_sept_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2986_d1_1_sept_2023</targetId>
      <targetTitle>IEEE Std P2986/D1.1, Sept 2023</targetTitle>
      <targetUrl>/en/works/ieee-std-p2986-d1-1-sept-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1478f0c676e66cd744ad3b36</id>
      <fromId>work_ieee_p2988_d6_0_jul_2024</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2988_d6_0_jul_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2988_d6_0_jul_2024</targetId>
      <targetTitle>IEEE Std P2988/D6.0, Jul 2024</targetTitle>
      <targetUrl>/en/works/ieee-std-p2988-d6-0-jul-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a8525a42603474b5454d6957</id>
      <fromId>work_ieee_p2988_d7_0_sept_2024</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2988_d7_0_sept_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2988_d7_0_sept_2024</targetId>
      <targetTitle>IEEE Std P2988/D7.0, Sept 2024</targetTitle>
      <targetUrl>/en/works/ieee-std-p2988-d7-0-sept-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_87e2b8e464b242d02d3206b3</id>
      <fromId>work_ieee_829_2008_4578271</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_829_2008_4578271</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_829_2008_4578271</targetId>
      <targetTitle>IEEE Std 829-2008</targetTitle>
      <targetUrl>/en/works/ieee-std-829-2008-4578271.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1695fb10acbe08c68e80b40c</id>
      <fromId>work_ieee_829_2008_5983351_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_829_2008_5983351_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_829_2008_5983351_redline</targetId>
      <targetTitle>IEEE Std 829-2008</targetTitle>
      <targetUrl>/en/works/ieee-std-829-2008-5983351-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ac0e2a27ca1884f350959fcb</id>
      <fromId>work_ieee_83_1963</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_83_1963</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_83_1963</targetId>
      <targetTitle>IEEE Std 83-1963</targetTitle>
      <targetUrl>/en/works/ieee-std-83-1963.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_23246ac0203b4b04abc1289d</id>
      <fromId>work_ieee_830_1984</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_830_1984</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_830_1984</targetId>
      <targetTitle>IEEE Std 830-1984</targetTitle>
      <targetUrl>/en/works/ieee-std-830-1984.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e06f937a0645a85c31479438</id>
      <fromId>work_ieee_830_1993</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_830_1993</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_830_1993</targetId>
      <targetTitle>IEEE Std 830-1993</targetTitle>
      <targetUrl>/en/works/ieee-std-830-1993.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_677ecb70ad4456ff9b939f5b</id>
      <fromId>work_ieee_830_1998</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_830_1998</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_830_1998</targetId>
      <targetTitle>IEEE Std 830-1998</targetTitle>
      <targetUrl>/en/works/ieee-std-830-1998.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_aeda3201c2f1402f13628921</id>
      <fromId>work_ieee_833_1988</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_833_1988</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_833_1988</targetId>
      <targetTitle>IEEE Std 833-1988</targetTitle>
      <targetUrl>/en/works/ieee-std-833-1988.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bbf7727df2128c73746b5294</id>
      <fromId>work_ieee_833_2005</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_833_2005</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_833_2005</targetId>
      <targetTitle>IEEE Std 833-2005</targetTitle>
      <targetUrl>/en/works/ieee-std-833-2005.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2df04a54f4c66da4c470b096</id>
      <fromId>work_ieee_835_1994</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_835_1994</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_835_1994</targetId>
      <targetTitle>IEEE Std 835-1994</targetTitle>
      <targetUrl>/en/works/ieee-std-835-1994.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_5aca4c68c70501bf1971da22</id>
      <fromId>work_ieee_835a_2012</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_835a_2012</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_835a_2012</targetId>
      <targetTitle>IEEE Std 835a-2012</targetTitle>
      <targetUrl>/en/works/ieee-std-835a-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b8342d18c3b435e6850bd41d</id>
      <fromId>work_ieee_836_1991</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_836_1991</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_836_1991</targetId>
      <targetTitle>IEEE Std 836-1991</targetTitle>
      <targetUrl>/en/works/ieee-std-836-1991.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8a5038c22df6b41dc43b29ff</id>
      <fromId>work_ieee_836_2001</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_836_2001</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_836_2001</targetId>
      <targetTitle>IEEE Std 836-2001</targetTitle>
      <targetUrl>/en/works/ieee-std-836-2001.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4de8aed9e21f76dc2a2d23ae</id>
      <fromId>work_ieee_836_2009_5252520</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_836_2009_5252520</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_836_2009_5252520</targetId>
      <targetTitle>IEEE Std 836-2009</targetTitle>
      <targetUrl>/en/works/ieee-std-836-2009-5252520.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a2ffea254fe1ab4280773243</id>
      <fromId>work_ieee_836_2009_5981343</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_836_2009_5981343</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_836_2009_5981343</targetId>
      <targetTitle>IEEE Std 836-2009</targetTitle>
      <targetUrl>/en/works/ieee-std-836-2009-5981343.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b9284dfce78f3fb9eaab6657</id>
      <fromId>work_ieee_837_1984</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_837_1984</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_837_1984</targetId>
      <targetTitle>IEEE Std 837-1984</targetTitle>
      <targetUrl>/en/works/ieee-std-837-1984.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bacba316ae8b554d1b8cdc73</id>
      <fromId>work_ieee_837_1989</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_837_1989</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_837_1989</targetId>
      <targetTitle>IEEE Std 837-1989</targetTitle>
      <targetUrl>/en/works/ieee-std-837-1989.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_fd2c44300d8811d55a551e53</id>
      <fromId>work_ieee_837_2002</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_837_2002</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_837_2002</targetId>
      <targetTitle>IEEE Std 837-2002</targetTitle>
      <targetUrl>/en/works/ieee-std-837-2002.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a8eb3aa91a44bf2ce291e9cd</id>
      <fromId>work_ieee_837_2014_6922154</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_837_2014_6922154</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_837_2014_6922154</targetId>
      <targetTitle>IEEE Std 837-2014</targetTitle>
      <targetUrl>/en/works/ieee-std-837-2014-6922154.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_dc8a9797b060760c599fc32e</id>
      <fromId>work_ieee_837_2014_7049371_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_837_2014_7049371_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_837_2014_7049371_redline</targetId>
      <targetTitle>IEEE Std 837-2014</targetTitle>
      <targetUrl>/en/works/ieee-std-837-2014-7049371-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8d2736b555f9b7b1b1ae33b4</id>
      <fromId>work_ieee_837_2024_11096118_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_837_2024_11096118_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_837_2024_11096118_redline</targetId>
      <targetTitle>IEEE Std 837-2024</targetTitle>
      <targetUrl>/en/works/ieee-std-837-2024-11096118-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f3484ca026206599779b65b1</id>
      <fromId>work_ieee_839_1986</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_839_1986</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_839_1986</targetId>
      <targetTitle>IEEE Std 839-1986</targetTitle>
      <targetUrl>/en/works/ieee-std-839-1986.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4433e5165230fdb999b20693</id>
      <fromId>work_ieee_84_1963</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_84_1963</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_84_1963</targetId>
      <targetTitle>IEEE Std 84-1963</targetTitle>
      <targetUrl>/en/works/ieee-std-84-1963.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_451c3aef99267edd9a436db0</id>
      <fromId>work_ieee_841_1986</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_841_1986</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_841_1986</targetId>
      <targetTitle>IEEE Std 841-1986</targetTitle>
      <targetUrl>/en/works/ieee-std-841-1986.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_26f2071573d813f37617f138</id>
      <fromId>work_ieee_841_1994</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_841_1994</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_841_1994</targetId>
      <targetTitle>IEEE Std 841-1994</targetTitle>
      <targetUrl>/en/works/ieee-std-841-1994.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_00ed93df375e4b432c80b385</id>
      <fromId>work_ieee_841_2001</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_841_2001</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_841_2001</targetId>
      <targetTitle>IEEE Std 841-2001</targetTitle>
      <targetUrl>/en/works/ieee-std-841-2001.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bb921b0a7ef8629801c6c791</id>
      <fromId>work_ieee_841_2009_5210063</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_841_2009_5210063</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_841_2009_5210063</targetId>
      <targetTitle>IEEE Std 841-2009</targetTitle>
      <targetUrl>/en/works/ieee-std-841-2009-5210063.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bdcd4f1aa2d10d1f97885c0c</id>
      <fromId>work_ieee_841_2009_5953436_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_841_2009_5953436_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_841_2009_5953436_redline</targetId>
      <targetTitle>IEEE Std 841-2009</targetTitle>
      <targetUrl>/en/works/ieee-std-841-2009-5953436-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8cae089f51118775e0724a5c</id>
      <fromId>work_ieee_844_1991</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_844_1991</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_844_1991</targetId>
      <targetTitle>IEEE Std 844-1991</targetTitle>
      <targetUrl>/en/works/ieee-std-844-1991.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b12c57672b7f4f103c9a0832</id>
      <fromId>work_ieee_844_2000</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_844_2000</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_844_2000</targetId>
      <targetTitle>IEEE Std 844-2000</targetTitle>
      <targetUrl>/en/works/ieee-std-844-2000.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e86e731acee60238413236c1</id>
      <fromId>work_ieee_845_1988</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_845_1988</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_845_1988</targetId>
      <targetTitle>IEEE Std 845-1988</targetTitle>
      <targetUrl>/en/works/ieee-std-845-1988.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6e5251cd02ba46f2dbb720cf</id>
      <fromId>work_ieee_845_1999</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_845_1999</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_845_1999</targetId>
      <targetTitle>IEEE Std 845-1999</targetTitle>
      <targetUrl>/en/works/ieee-std-845-1999.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_615686026ade1d3a8faa2d94</id>
      <fromId>work_ieee_845_2023_10669334_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_845_2023_10669334_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_845_2023_10669334_redline</targetId>
      <targetTitle>IEEE Std 845-2023</targetTitle>
      <targetUrl>/en/works/ieee-std-845-2023-10669334-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ae27ab0625256bb59e41266a</id>
      <fromId>work_ieee_848_1996</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_848_1996</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_848_1996</targetId>
      <targetTitle>IEEE Std 848-1996</targetTitle>
      <targetUrl>/en/works/ieee-std-848-1996.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2392b03d708c71d7540a3a81</id>
      <fromId>work_ieee_848_2015_7111193</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_848_2015_7111193</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_848_2015_7111193</targetId>
      <targetTitle>IEEE Std 848-2015</targetTitle>
      <targetUrl>/en/works/ieee-std-848-2015-7111193.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6b66da14546d1f3df1b264b4</id>
      <fromId>work_ieee_848_2015_7270953_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_848_2015_7270953_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_848_2015_7270953_redline</targetId>
      <targetTitle>IEEE Std 848-2015</targetTitle>
      <targetUrl>/en/works/ieee-std-848-2015-7270953-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ab8ba90bc16f690bbf0aa97b</id>
      <fromId>work_ieee_85_1973_2705</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_85_1973_2705</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_85_1973_2705</targetId>
      <targetTitle>IEEE Std 85-1973</targetTitle>
      <targetUrl>/en/works/ieee-std-85-1973-2705.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>concept_ieee_standards</fromId>
      <fromTitle>IEEE 标准</fromTitle>
      <fromUrl>/en/concepts/ieee-standards.html</fromUrl>
      <fromType>concept</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/en/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/en/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/en/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/en/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/en/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/en/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/en/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/en/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/en/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>en</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>org_kind</key>
      <label>Organization kind</label>
      <value>专业协会</value>
    </field>
    <field>
      <key>founded</key>
      <label>Founded</label>
      <value>1963年1月1日</value>
    </field>
    <field>
      <key>org_status</key>
      <label>Status</label>
      <value>Active</value>
    </field>
    <field>
      <key>headquarters_note</key>
      <label>Headquarters</label>
      <value>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</value>
    </field>
  </infoFields>
  <pagination>
    <page>150</page>
    <pageSize>50</pageSize>
    <total>8265</total>
    <pageCount>166</pageCount>
    <prevUrl>/en/organizations/ieee/relation-149.xml</prevUrl>
    <nextUrl>/en/organizations/ieee/relation-151.xml</nextUrl>
  </pagination>
  <relationsTotal>8265</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8279</mentionsTotal>
  <mentionsUrl>/en/organizations/ieee/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>