{
  "contentStorage": "postgres",
  "title": "电气电子工程师学会 · Relations",
  "description": "电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。",
  "url": "/en/organizations/ieee/relation-63.html",
  "entity": {
    "id": "organization_ieee",
    "type": "organization",
    "title": "电气电子工程师学会",
    "slug": "ieee",
    "aliases": [
      "IEEE",
      "Institute of Electrical and Electronics Engineers",
      "电气和电子工程师协会"
    ],
    "summary": "电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。",
    "status": "published",
    "categories": [
      "category-science-technology"
    ],
    "tags": [
      "tag-ieee-standard",
      "tag-publishing"
    ],
    "sources": [
      {
        "id": "s1",
        "title": "Institute of Electrical and Electronics Engineers",
        "author": "Wikipedia",
        "url": "https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers",
        "locator": "2026-11-01 访问"
      },
      {
        "id": "s2",
        "title": "IEEE 官方网站",
        "author": "IEEE",
        "url": "https://www.ieee.org/"
      },
      {
        "id": "s3",
        "title": "IEEE Xplore All Standards（KBART）",
        "author": "IEEE",
        "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt"
      }
    ],
    "createdAt": "2026-11-01T21:05:52+08:00",
    "updatedAt": "2026-11-01T21:05:52+08:00",
    "updatedBy": "user:admin",
    "revision": 1,
    "body": "**电气电子工程师学会**（Institute of Electrical and Electronics Engineers，简称 IEEE）是1963年1月1日由美国电气工程师学会（AIEE）与无线电工程师学会（IRE）合并成立的专业技术协会，面向电气工程、电子工程及相关学科[^s1]。\n\n## 沿革\n\n该会可追溯至1884年成立的 AIEE；1912年另成立 IRE。两会于1963年合并为 IEEE[^s1]。总会设在纽约，1975年起主要业务在新泽西州皮斯卡特维的运营中心开展[^s1]。\n\n## 职能与业务\n\nIEEE 发布同行评议期刊与会议录，并通过标准化委员会制定技术标准；相关内容可在 IEEE Xplore 平台检索[^s1][^s3]。标准公开目录（KBART）列出标准编号、题名、状态与题录链接等元数据[^s3]。\n\n## 现状\n\n据公开介绍，该会为美国 501(c)(3) 公益性专业协会，全球会员逾48.6万[^s1]。官网为 https://www.ieee.org/ [^s2]。",
    "url": "/organizations/ieee.html",
    "lang": "en",
    "fallback": true,
    "availableLangs": [
      "zh"
    ],
    "orgKind": "专业协会",
    "founded": {
      "year": 1963,
      "month": 1,
      "day": 1,
      "precision": "day",
      "display": "1963年1月1日"
    },
    "orgStatus": "active",
    "headquartersNote": "美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。"
  },
  "entities": null,
  "relations": [
    {
      "id": "relation_api_c72d069fa0d716d891b12932",
      "fromId": "work_ieee_st_430_4_2008_am1_2011",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_430_4_2008_am1_2011",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_430_4_2008_am1_2011",
      "targetTitle": "IEEE Std ST 430-4:2008 Am1:2011",
      "targetUrl": "/en/works/ieee-std-st-430-4-2008-am1-2011.html",
      "incoming": true
    },
    {
      "id": "relation_api_5c602dcb871cc60e3f35a5a3",
      "fromId": "work_ieee_st_430_5_2023",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_430_5_2023",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_430_5_2023",
      "targetTitle": "IEEE Std ST 430-5:2023",
      "targetUrl": "/en/works/ieee-std-st-430-5-2023.html",
      "incoming": true
    },
    {
      "id": "relation_api_dae7789496d9ae2c253b81a1",
      "fromId": "work_ieee_st_430_6_2010",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_430_6_2010",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_430_6_2010",
      "targetTitle": "IEEE Std ST 430-6:2010",
      "targetUrl": "/en/works/ieee-std-st-430-6-2010.html",
      "incoming": true
    },
    {
      "id": "relation_api_742f0304f9c1edf3a2e67166",
      "fromId": "work_ieee_st_430_9_2008",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_430_9_2008",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_430_9_2008",
      "targetTitle": "IEEE Std ST 430-9:2008",
      "targetUrl": "/en/works/ieee-std-st-430-9-2008.html",
      "incoming": true
    },
    {
      "id": "relation_api_79ae696a24fb00e1089e5839",
      "fromId": "work_ieee_st_430_9_2008_am1_2011",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_430_9_2008_am1_2011",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_430_9_2008_am1_2011",
      "targetTitle": "IEEE Std ST 430-9:2008 Am1:2011",
      "targetUrl": "/en/works/ieee-std-st-430-9-2008-am1-2011.html",
      "incoming": true
    },
    {
      "id": "relation_api_53f03dd0a21be5b40449a96c",
      "fromId": "work_ieee_st_431_1_2006",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_431_1_2006",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_431_1_2006",
      "targetTitle": "IEEE Std ST 431-1:2006",
      "targetUrl": "/en/works/ieee-std-st-431-1-2006.html",
      "incoming": true
    },
    {
      "id": "relation_api_8ee79e0968590444f6a7a072",
      "fromId": "work_ieee_st_433_2008",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_433_2008",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_433_2008",
      "targetTitle": "IEEE Std ST 433:2008",
      "targetUrl": "/en/works/ieee-std-st-433-2008.html",
      "incoming": true
    },
    {
      "id": "relation_api_59586495a7f6d9dfe1caba61",
      "fromId": "work_ieee_st_433_2008_am1_2011",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_433_2008_am1_2011",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_433_2008_am1_2011",
      "targetTitle": "IEEE Std ST 433:2008 Am1:2011",
      "targetUrl": "/en/works/ieee-std-st-433-2008-am1-2011.html",
      "incoming": true
    },
    {
      "id": "relation_api_3f2966609ab5eb7cfc18e861",
      "fromId": "work_ieee_st_434_2014",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_434_2014",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_434_2014",
      "targetTitle": "IEEE Std ST 434:2014",
      "targetUrl": "/en/works/ieee-std-st-434-2014.html",
      "incoming": true
    },
    {
      "id": "relation_api_f50d5900cfbcd989672042a5",
      "fromId": "work_ieee_st_435_1_2012",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_435_1_2012",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_435_1_2012",
      "targetTitle": "IEEE Std ST 435-1:2012",
      "targetUrl": "/en/works/ieee-std-st-435-1-2012.html",
      "incoming": true
    },
    {
      "id": "relation_api_d20b078a245aa92b3df0ceed",
      "fromId": "work_ieee_st_435_2_2012",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_435_2_2012",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_435_2_2012",
      "targetTitle": "IEEE Std ST 435-2:2012",
      "targetUrl": "/en/works/ieee-std-st-435-2-2012.html",
      "incoming": true
    },
    {
      "id": "relation_api_9b55e694e53bb1417909d5a2",
      "fromId": "work_ieee_st_435_3_2012",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_435_3_2012",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_435_3_2012",
      "targetTitle": "IEEE Std ST 435-3:2012",
      "targetUrl": "/en/works/ieee-std-st-435-3-2012.html",
      "incoming": true
    },
    {
      "id": "relation_api_8cade8d95a22f85006b9234e",
      "fromId": "work_ieee_st_436_1_2013",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_436_1_2013",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_436_1_2013",
      "targetTitle": "IEEE Std ST 436-1:2013",
      "targetUrl": "/en/works/ieee-std-st-436-1-2013.html",
      "incoming": true
    },
    {
      "id": "relation_api_f6507ed7818cff89317686da",
      "fromId": "work_ieee_st_48_1995",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_48_1995",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_48_1995",
      "targetTitle": "IEEE Std ST 48:1995",
      "targetUrl": "/en/works/ieee-std-st-48-1995.html",
      "incoming": true
    },
    {
      "id": "relation_api_95cbf416d25a41256e4808af",
      "fromId": "work_ieee_st_4_1995",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_4_1995",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_4_1995",
      "targetTitle": "IEEE Std ST 4:1995",
      "targetUrl": "/en/works/ieee-std-st-4-1995.html",
      "incoming": true
    },
    {
      "id": "relation_api_971ae5d79408dec5a5a4ed96",
      "fromId": "work_ieee_st_55_2011",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_55_2011",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_55_2011",
      "targetTitle": "IEEE Std ST 55:2011",
      "targetUrl": "/en/works/ieee-std-st-55-2011.html",
      "incoming": true
    },
    {
      "id": "relation_api_ee66fbe485088f549fb4e937",
      "fromId": "work_ieee_st_56_2005",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_56_2005",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_56_2005",
      "targetTitle": "IEEE Std ST 56:2005",
      "targetUrl": "/en/works/ieee-std-st-56-2005.html",
      "incoming": true
    },
    {
      "id": "relation_api_d688584cdb1d7950601907f6",
      "fromId": "work_ieee_st_59_1998",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_59_1998",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_59_1998",
      "targetTitle": "IEEE Std ST 59:1998",
      "targetUrl": "/en/works/ieee-std-st-59-1998.html",
      "incoming": true
    },
    {
      "id": "relation_api_b756799be54307fb18180524",
      "fromId": "work_ieee_st_5_1995",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_5_1995",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_5_1995",
      "targetTitle": "IEEE Std ST 5:1995",
      "targetUrl": "/en/works/ieee-std-st-5-1995.html",
      "incoming": true
    },
    {
      "id": "relation_api_bc8eb80db759aaf1a7990482",
      "fromId": "work_ieee_st_6_1998",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_6_1998",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_6_1998",
      "targetTitle": "IEEE Std ST 6:1998",
      "targetUrl": "/en/works/ieee-std-st-6-1998.html",
      "incoming": true
    },
    {
      "id": "relation_api_e2a6d70ed338dabf93dda83a",
      "fromId": "work_ieee_st_73_2003",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_73_2003",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_73_2003",
      "targetTitle": "IEEE Std ST 73:2003",
      "targetUrl": "/en/works/ieee-std-st-73-2003.html",
      "incoming": true
    },
    {
      "id": "relation_api_287aae734fb30b591114b4d4",
      "fromId": "work_ieee_st_74_1993",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_74_1993",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_74_1993",
      "targetTitle": "IEEE Std ST 74:1993",
      "targetUrl": "/en/works/ieee-std-st-74-1993.html",
      "incoming": true
    },
    {
      "id": "relation_api_8831e24ce5293a16158485ff",
      "fromId": "work_ieee_st_75_1994",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_75_1994",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_75_1994",
      "targetTitle": "IEEE Std ST 75:1994",
      "targetUrl": "/en/works/ieee-std-st-75-1994.html",
      "incoming": true
    },
    {
      "id": "relation_api_8ad2c2964bae1d115db0542b",
      "fromId": "work_ieee_st_76_1996",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_76_1996",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_76_1996",
      "targetTitle": "IEEE Std ST 76:1996",
      "targetUrl": "/en/works/ieee-std-st-76-1996.html",
      "incoming": true
    },
    {
      "id": "relation_api_6130b1b80f4e648d517a0257",
      "fromId": "work_ieee_st_7_2004",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_7_2004",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_7_2004",
      "targetTitle": "IEEE Std ST 7:2004",
      "targetUrl": "/en/works/ieee-std-st-7-2004.html",
      "incoming": true
    },
    {
      "id": "relation_api_7d03c1e593f13680f47ef5c4",
      "fromId": "work_ieee_st_83_1996",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_83_1996",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_83_1996",
      "targetTitle": "IEEE Std ST 83:1996",
      "targetUrl": "/en/works/ieee-std-st-83-1996.html",
      "incoming": true
    },
    {
      "id": "relation_api_1298bb2c4db2a5a52a7df0ef",
      "fromId": "work_ieee_st_86_2005",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_86_2005",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_86_2005",
      "targetTitle": "IEEE Std ST 86:2005",
      "targetUrl": "/en/works/ieee-std-st-86-2005.html",
      "incoming": true
    },
    {
      "id": "relation_api_50aab81fc63d8a6a4d6eebb6",
      "fromId": "work_ieee_st_87_1996",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_87_1996",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_87_1996",
      "targetTitle": "IEEE Std ST 87:1996",
      "targetUrl": "/en/works/ieee-std-st-87-1996.html",
      "incoming": true
    },
    {
      "id": "relation_api_410dc11d7dc9e8ea71168f94",
      "fromId": "work_ieee_st_8_1995",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_8_1995",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_8_1995",
      "targetTitle": "IEEE Std ST 8:1995",
      "targetUrl": "/en/works/ieee-std-st-8-1995.html",
      "incoming": true
    },
    {
      "id": "relation_api_fdee0e13a72ba6fc6ad37847",
      "fromId": "work_ieee_st_93_2005",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_93_2005",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_93_2005",
      "targetTitle": "IEEE Std ST 93:2005",
      "targetUrl": "/en/works/ieee-std-st-93-2005.html",
      "incoming": true
    },
    {
      "id": "relation_api_66b341acab54005af8a1aa55",
      "fromId": "work_ieee_st_96_2004",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_96_2004",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_96_2004",
      "targetTitle": "IEEE Std ST 96:2004",
      "targetUrl": "/en/works/ieee-std-st-96-2004.html",
      "incoming": true
    },
    {
      "id": "relation_api_6d51fa8571ee044a1a606f7c",
      "fromId": "work_ieee_st_97_2004",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st_97_2004",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st_97_2004",
      "targetTitle": "IEEE Std ST 97:2004",
      "targetUrl": "/en/works/ieee-std-st-97-2004.html",
      "incoming": true
    },
    {
      "id": "relation_api_446b6368815b966a4fa4ae2d",
      "fromId": "work_ieee_st2036_3_2012_am1_2015",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st2036_3_2012_am1_2015",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st2036_3_2012_am1_2015",
      "targetTitle": "IEEE Std ST2036-3:2012 Am1:2015",
      "targetUrl": "/en/works/ieee-std-st2036-3-2012-am1-2015.html",
      "incoming": true
    },
    {
      "id": "relation_api_da45245fc2cb95923e0bc780",
      "fromId": "work_ieee_st2112_10_2020",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_st2112_10_2020",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_st2112_10_2020",
      "targetTitle": "IEEE Std st2112-10-2020",
      "targetUrl": "/en/works/ieee-std-st2112-10-2020.html",
      "incoming": true
    },
    {
      "id": "relation_api_e645e55fb1ce41ee3cc8aa2d",
      "fromId": "work_ieee_test_suite_specification",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_test_suite_specification",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_test_suite_specification",
      "targetTitle": "IEEE Std Test Suite Specification",
      "targetUrl": "/en/works/ieee-std-test-suite-specification.html",
      "incoming": true
    },
    {
      "id": "relation_api_a949a0b2df8fba965ba7a085",
      "fromId": "work_ieee_test_suite_specification_electric_vehicles",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_test_suite_specification_electric_vehicles",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_test_suite_specification_electric_vehicles",
      "targetTitle": "IEEE Std Test Suite Specification: Electric Vehicles",
      "targetUrl": "/en/works/ieee-std-test-suite-specification-electric-vehicles.html",
      "incoming": true
    },
    {
      "id": "relation_api_11f438ff1bbff479d7adc4fa",
      "fromId": "work_ieee_test_suite_specification_synchrophasor_8765654",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_test_suite_specification_synchrophasor_8765654",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_test_suite_specification_synchrophasor_8765654",
      "targetTitle": "IEEE Std Test Suite Specification: Synchrophasor",
      "targetUrl": "/en/works/ieee-std-test-suite-specification-synchrophasor-8765654.html",
      "incoming": true
    },
    {
      "id": "relation_api_f5e2832ace2e2274299d8ea3",
      "fromId": "work_ieee_white_paper_10028719",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_white_paper_10028719",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_white_paper_10028719",
      "targetTitle": "IEEE Std White Paper",
      "targetUrl": "/en/works/ieee-std-white-paper-10028719.html",
      "incoming": true
    },
    {
      "id": "relation_api_78257b572277610544c4e9b7",
      "fromId": "work_ieee_white_paper_9398620",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_white_paper_9398620",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_white_paper_9398620",
      "targetTitle": "IEEE Std White Paper",
      "targetUrl": "/en/works/ieee-std-white-paper-9398620.html",
      "incoming": true
    },
    {
      "id": "relation_api_9e28a02aa00ce4b4900d324d",
      "fromId": "work_ieee_white_paper_10707137",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_white_paper_10707137",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_white_paper_10707137",
      "targetTitle": "IEEE Std White paper",
      "targetUrl": "/en/works/ieee-std-white-paper-10707137.html",
      "incoming": true
    },
    {
      "id": "relation_api_400b80ace588b846d463acc0",
      "fromId": "work_ieee_white_paper_9468430",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_white_paper_9468430",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_white_paper_9468430",
      "targetTitle": "IEEE Std White Paper",
      "targetUrl": "/en/works/ieee-std-white-paper-9468430.html",
      "incoming": true
    },
    {
      "id": "relation_api_6f9561ea0f838eb29c3a9ef5",
      "fromId": "work_ieee_white_paper_10251108",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_white_paper_10251108",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_white_paper_10251108",
      "targetTitle": "IEEE Std White Paper",
      "targetUrl": "/en/works/ieee-std-white-paper-10251108.html",
      "incoming": true
    },
    {
      "id": "relation_api_b7607ec02819414b1582ec6e",
      "fromId": "work_ieee_white_paper_10630695",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_white_paper_10630695",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_white_paper_10630695",
      "targetTitle": "IEEE Std White Paper",
      "targetUrl": "/en/works/ieee-std-white-paper-10630695.html",
      "incoming": true
    },
    {
      "id": "relation_api_4840e2fc6afdf7ae69daa50f",
      "fromId": "work_ieee_white_paper_10298052",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_white_paper_10298052",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_white_paper_10298052",
      "targetTitle": "IEEE Std White Paper",
      "targetUrl": "/en/works/ieee-std-white-paper-10298052.html",
      "incoming": true
    },
    {
      "id": "relation_api_9891ba802c823d6f811e38e6",
      "fromId": "work_ieee_white_paper_11179921",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_white_paper_11179921",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_white_paper_11179921",
      "targetTitle": "IEEE Std White Paper",
      "targetUrl": "/en/works/ieee-std-white-paper-11179921.html",
      "incoming": true
    },
    {
      "id": "relation_api_95254a57fee826e68ba2e1b3",
      "fromId": "work_ieee_white_paper_10319430",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_white_paper_10319430",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_white_paper_10319430",
      "targetTitle": "IEEE Std White Paper",
      "targetUrl": "/en/works/ieee-std-white-paper-10319430.html",
      "incoming": true
    },
    {
      "id": "relation_api_da522e1240607c42308e5f1a",
      "fromId": "work_ieee_white_paper_11204739",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_white_paper_11204739",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_white_paper_11204739",
      "targetTitle": "IEEE Std White Paper",
      "targetUrl": "/en/works/ieee-std-white-paper-11204739.html",
      "incoming": true
    },
    {
      "id": "relation_api_8ca76e77c83607c8c4c54e0d",
      "fromId": "work_ieee_white_paper_11627218",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_white_paper_11627218",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_white_paper_11627218",
      "targetTitle": "IEEE Std White Paper",
      "targetUrl": "/en/works/ieee-std-white-paper-11627218.html",
      "incoming": true
    },
    {
      "id": "relation_api_50fef3a1acfd5fd000bfd41e",
      "fromId": "work_ieee_white_paper_8305684",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_white_paper_8305684",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_white_paper_8305684",
      "targetTitle": "IEEE Std White Paper",
      "targetUrl": "/en/works/ieee-std-white-paper-8305684.html",
      "incoming": true
    },
    {
      "id": "relation_api_3e9b400c5231a01ff22fb5f6",
      "fromId": "work_ieee_white_paper_10496565",
      "relationType": "published_by",
      "toId": "organization_ieee",
      "sourceRefs": [
        {
          "entityId": "work_ieee_white_paper_10496565",
          "sourceId": "s1"
        }
      ],
      "label": "Published works",
      "targetId": "work_ieee_white_paper_10496565",
      "targetTitle": "IEEE Std White Paper",
      "targetUrl": "/en/works/ieee-std-white-paper-10496565.html",
      "incoming": true
    }
  ],
  "mentions": [
    {
      "fromId": "concept_ieee_standards",
      "fromTitle": "IEEE 标准",
      "fromUrl": "/en/concepts/ieee-standards.html",
      "fromType": "concept"
    },
    {
      "fromId": "work_ieee_1000_1987_2607",
      "fromTitle": "IEEE Std 1000-1987",
      "fromUrl": "/en/works/ieee-std-1000-1987-2607.html",
      "fromType": "work"
    },
    {
      "fromId": "work_ieee_1000_1987_9506",
      "fromTitle": "IEEE Std 1000-1987",
      "fromUrl": "/en/works/ieee-std-1000-1987-9506.html",
      "fromType": "work"
    },
    {
      "fromId": "work_ieee_1001_1988",
      "fromTitle": "IEEE Std 1001-1988",
      "fromUrl": "/en/works/ieee-std-1001-1988.html",
      "fromType": "work"
    },
    {
      "fromId": "work_ieee_1002_1987",
      "fromTitle": "IEEE Std 1002-1987",
      "fromUrl": "/en/works/ieee-std-1002-1987.html",
      "fromType": "work"
    },
    {
      "fromId": "work_ieee_10038_1993",
      "fromTitle": "IEEE Std 10038-1993",
      "fromUrl": "/en/works/ieee-std-10038-1993.html",
      "fromType": "work"
    },
    {
      "fromId": "work_ieee_1003_0_1995",
      "fromTitle": "IEEE Std 1003.0-1995",
      "fromUrl": "/en/works/ieee-std-1003-0-1995.html",
      "fromType": "work"
    },
    {
      "fromId": "work_ieee_1003_10_1995",
      "fromTitle": "IEEE Std 1003.10-1995",
      "fromUrl": "/en/works/ieee-std-1003-10-1995.html",
      "fromType": "work"
    },
    {
      "fromId": "work_ieee_1003_13_1998",
      "fromTitle": "IEEE Std 1003.13-1998",
      "fromUrl": "/en/works/ieee-std-1003-13-1998.html",
      "fromType": "work"
    },
    {
      "fromId": "work_ieee_1003_13_2003",
      "fromTitle": "IEEE Std 1003.13-2003",
      "fromUrl": "/en/works/ieee-std-1003-13-2003.html",
      "fromType": "work"
    }
  ],
  "lang": "en",
  "availableLangs": [
    "zh"
  ],
  "fallback": true,
  "infoFields": [
    {
      "key": "org_kind",
      "label": "Organization kind",
      "value": "专业协会"
    },
    {
      "key": "founded",
      "label": "Founded",
      "value": "1963年1月1日"
    },
    {
      "key": "org_status",
      "label": "Status",
      "value": "Active"
    },
    {
      "key": "headquarters_note",
      "label": "Headquarters",
      "value": "美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。"
    }
  ],
  "pagination": {
    "page": 63,
    "pageSize": 50,
    "total": 8265,
    "pageCount": 166,
    "prevUrl": "/en/organizations/ieee/relation-62.json",
    "nextUrl": "/en/organizations/ieee/relation-64.json"
  },
  "relationsTotal": 8265,
  "mentionsTotal": 8279,
  "mentionsUrl": "/en/organizations/ieee/relation/mentions.html"
}