<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>IEEE 标准 · Relaciones</title>
  <description>IEEE 标准是电气电子工程师学会发布的技术标准文献集合，涵盖通信、电力、计算与电磁兼容等领域；公开目录以 KBART 列表提供编号、题名、状态与 IEEE Xplore 题录链接。</description>
  <url>/es/concepts/ieee-standards/relation-21.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>concept_ieee_standards</id>
    <type>concept</type>
    <title>IEEE 标准</title>
    <slug>ieee-standards</slug>
    <aliases>
      <alias>IEEE Standards</alias>
      <alias>IEEE Std</alias>
      <alias>电气电子工程师学会标准</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>IEEE 标准是电气电子工程师学会发布的技术标准文献集合，涵盖通信、电力、计算与电磁兼容等领域；公开目录以 KBART 列表提供编号、题名、状态与 IEEE Xplore 题录链接。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        <locator>2026-11-01 下载</locator>
      </source>
      <source>
        <id>s2</id>
        <title>KBART Title Lists</title>
        <author>IEEE Xplore Help</author>
        <url>https://ieeexplore.ieee.org/Xplorehelp/discovery-services/kbart-title-lists</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Standards Association / standards.ieee.org</title>
        <author>IEEE</author>
        <url>https://standards.ieee.org/</url>
      </source>
      <source>
        <id>s4</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:58+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:58+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**IEEE 标准**是[[organization_ieee|电气电子工程师学会]]（IEEE）通过其标准化活动发布的技术标准文献[^s3][^s4]。&#xA;&#xA;## 定义与范围&#xA;&#xA;公开机读目录「IEEE Xplore All Standards」以 KBART 格式列出标准编号、题名、出版年份、状态（如 Active、Superseded、Inactive）及 IEEE Xplore 题录链接等元数据，不提供付费全文[^s1][^s2]。本知识库按该目录逐条建立标准词条（work，workKind=standard），每条保留官方目录出处。&#xA;&#xA;## 沿革&#xA;&#xA;IEEE 由 AIEE 与 IRE 于1963年合并成立后继续并扩展标准制定；现行与历史版本均出现在 Xplore 标准集合中[^s4][^s1]。&#xA;&#xA;## 相关概念&#xA;&#xA;词条之间以发布机构、主题关系连接；同一标准号的多年版本各自成条或在正文互相链接，以便维护。</body>
    <url>/concepts/ieee-standards.html</url>
    <lang>es</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <conceptKind>theme</conceptKind>
    <scopeNote>本条为总览；各标准号以独立 work 词条著录，勿仅在本条列表省略。</scopeNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_5c7d356f6320ead6a17476f6</id>
      <fromId>work_ieee_3834_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_3834_2025</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_3834_2025</targetId>
      <targetTitle>IEEE Std 3834-2025</targetTitle>
      <targetUrl>/es/works/ieee-std-3834-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3586da0269a2df2c4e5be328</id>
      <fromId>work_ieee_3835_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_3835_2025</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_3835_2025</targetId>
      <targetTitle>IEEE Std 3835-2025</targetTitle>
      <targetUrl>/es/works/ieee-std-3835-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4677492cc9ab1364a3ea3341</id>
      <fromId>work_ieee_384_2018</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_384_2018</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_384_2018</targetId>
      <targetTitle>IEEE Std 384-2018</targetTitle>
      <targetUrl>/es/works/ieee-std-384-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0a8c342ad1b098374754afda</id>
      <fromId>work_ieee_386_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_386_2025</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_386_2025</targetId>
      <targetTitle>IEEE Std 386-2025</targetTitle>
      <targetUrl>/es/works/ieee-std-386-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_68aedafb7609d9f9fb878a3e</id>
      <fromId>work_ieee_387_2017</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_387_2017</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_387_2017</targetId>
      <targetTitle>IEEE Std 387-2017</targetTitle>
      <targetUrl>/es/works/ieee-std-387-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_57938717a613a5471d7218e5</id>
      <fromId>work_ieee_389_1996</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_389_1996</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_389_1996</targetId>
      <targetTitle>IEEE Std 389-1996</targetTitle>
      <targetUrl>/es/works/ieee-std-389-1996.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2df85f7dbd4ba8ff3ae1c02d</id>
      <fromId>work_ieee_39274_1_1_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_39274_1_1_2025</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_39274_1_1_2025</targetId>
      <targetTitle>IEEE Std 39274-1-1-2025</targetTitle>
      <targetUrl>/es/works/ieee-std-39274-1-1-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8f98aa1b61b224c5ef83c823</id>
      <fromId>work_ieee_400_2023_10336849</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_400_2023_10336849</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_400_2023_10336849</targetId>
      <targetTitle>IEEE Std 400-2023</targetTitle>
      <targetUrl>/es/works/ieee-std-400-2023-10336849.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6803930a7967fd54324d47f1</id>
      <fromId>work_ieee_400_1_2018</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_400_1_2018</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_400_1_2018</targetId>
      <targetTitle>IEEE Std 400.1-2018</targetTitle>
      <targetUrl>/es/works/ieee-std-400-1-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2c35ea816efc7025813d67fa</id>
      <fromId>work_ieee_400_2_2024_10694769</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_400_2_2024_10694769</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_400_2_2024_10694769</targetId>
      <targetTitle>IEEE Std 400.2-2024</targetTitle>
      <targetUrl>/es/works/ieee-std-400-2-2024-10694769.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_71143423279dc0b041e52d28</id>
      <fromId>work_ieee_400_3_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_400_3_2022</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_400_3_2022</targetId>
      <targetTitle>IEEE Std 400.3-2022</targetTitle>
      <targetUrl>/es/works/ieee-std-400-3-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e74e510a082d76d0339d6bd3</id>
      <fromId>work_ieee_400_5_2021</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_400_5_2021</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_400_5_2021</targetId>
      <targetTitle>IEEE Std 400.5-2021</targetTitle>
      <targetUrl>/es/works/ieee-std-400-5-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4bdf6daa1b2966dc137044fe</id>
      <fromId>work_ieee_4001_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_4001_2025</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_4001_2025</targetId>
      <targetTitle>IEEE Std 4001-2025</targetTitle>
      <targetUrl>/es/works/ieee-std-4001-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_938c6a662fd0a2c4ae0f4e81</id>
      <fromId>work_ieee_4003_2021_9594779</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_4003_2021_9594779</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_4003_2021_9594779</targetId>
      <targetTitle>IEEE Std 4003-2021</targetTitle>
      <targetUrl>/es/works/ieee-std-4003-2021-9594779.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4344c258e8d65bb1e9ea8d05</id>
      <fromId>work_ieee_404_2022_10077509</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_404_2022_10077509</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_404_2022_10077509</targetId>
      <targetTitle>IEEE Std 404-2022</targetTitle>
      <targetUrl>/es/works/ieee-std-404-2022-10077509.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_620a89a1d2dd7cfa9195f356</id>
      <fromId>work_ieee_522_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_522_2023</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_522_2023</targetId>
      <targetTitle>IEEE Std 522-2023</targetTitle>
      <targetUrl>/es/works/ieee-std-522-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9134e1602cf41a8f4ed35420</id>
      <fromId>work_ieee_41062_2024_10713131</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_41062_2024_10713131</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_41062_2024_10713131</targetId>
      <targetTitle>IEEE Std 41062-2024</targetTitle>
      <targetUrl>/es/works/ieee-std-41062-2024-10713131.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_129601ffee3c87b6aba1ca1b</id>
      <fromId>work_ieee_524_2016_7912222</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_524_2016_7912222</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_524_2016_7912222</targetId>
      <targetTitle>IEEE Std 524-2016</targetTitle>
      <targetUrl>/es/works/ieee-std-524-2016-7912222.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e8566492e13eb759b696bc2b</id>
      <fromId>work_ieee_420_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_420_2023</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_420_2023</targetId>
      <targetTitle>IEEE Std 420-2023</targetTitle>
      <targetUrl>/es/works/ieee-std-420-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3c0b0f00aa487150043d3361</id>
      <fromId>work_ieee_525_2025_10981989</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_525_2025_10981989</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_525_2025_10981989</targetId>
      <targetTitle>IEEE Std 525-2025</targetTitle>
      <targetUrl>/es/works/ieee-std-525-2025-10981989.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0de2b5bef6d60b749df691cf</id>
      <fromId>work_ieee_42010_2022_9938424</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_42010_2022_9938424</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_42010_2022_9938424</targetId>
      <targetTitle>IEEE Std 42010-2022</targetTitle>
      <targetUrl>/es/works/ieee-std-42010-2022-9938424.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f035d27d97ec60e330cd4369</id>
      <fromId>work_ieee_528_2019_8863797</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_528_2019_8863797</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_528_2019_8863797</targetId>
      <targetTitle>IEEE Std 528-2019</targetTitle>
      <targetUrl>/es/works/ieee-std-528-2019-8863797.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_57202d82c9b65b71fb570c8a</id>
      <fromId>work_ieee_42020_2019</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_42020_2019</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_42020_2019</targetId>
      <targetTitle>IEEE Std 42020-2019</targetTitle>
      <targetUrl>/es/works/ieee-std-42020-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_33c1ba2a95ba5dd8d39aab1b</id>
      <fromId>work_ieee_532_2007_4443895</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_532_2007_4443895</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_532_2007_4443895</targetId>
      <targetTitle>IEEE Std 532-2007</targetTitle>
      <targetUrl>/es/works/ieee-std-532-2007-4443895.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ae96b99245c2b6ef76d1e614</id>
      <fromId>work_ieee_42030_2019</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_42030_2019</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_42030_2019</targetId>
      <targetTitle>IEEE Std 42030-2019</targetTitle>
      <targetUrl>/es/works/ieee-std-42030-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9c690a235ae9157aed60226f</id>
      <fromId>work_ieee_532_2021_9416974</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_532_2021_9416974</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_532_2021_9416974</targetId>
      <targetTitle>IEEE Std 532-2021</targetTitle>
      <targetUrl>/es/works/ieee-std-532-2021-9416974.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d9812552bf8896f0e3cb4cbd</id>
      <fromId>work_ieee_535_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_535_2022</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_535_2022</targetId>
      <targetTitle>IEEE Std 535-2022</targetTitle>
      <targetUrl>/es/works/ieee-std-535-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_548bd54aa8a262f9d493cd29</id>
      <fromId>work_ieee_421_1_2021_9737075</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_421_1_2021_9737075</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_421_1_2021_9737075</targetId>
      <targetTitle>IEEE Std 421.1-2021</targetTitle>
      <targetUrl>/es/works/ieee-std-421-1-2021-9737075.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2543b8d4c33b2b3eb68200a7</id>
      <fromId>work_ieee_539_2005</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_539_2005</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_539_2005</targetId>
      <targetTitle>IEEE Std 539-2005</targetTitle>
      <targetUrl>/es/works/ieee-std-539-2005.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_79a6298dbe8bac311b52a2b4</id>
      <fromId>work_ieee_421_3_2016_7444085</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_421_3_2016_7444085</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_421_3_2016_7444085</targetId>
      <targetTitle>IEEE Std 421.3-2016</targetTitle>
      <targetUrl>/es/works/ieee-std-421-3-2016-7444085.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_affe564b83ff935ab7189bd2</id>
      <fromId>work_ieee_539_2020</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_539_2020</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_539_2020</targetId>
      <targetTitle>IEEE Std 539-2020</targetTitle>
      <targetUrl>/es/works/ieee-std-539-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9663d1c3e44e5695cc16a6b5</id>
      <fromId>work_ieee_421_5_2016_7553419</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_421_5_2016_7553419</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_421_5_2016_7553419</targetId>
      <targetTitle>IEEE Std 421.5-2016</targetTitle>
      <targetUrl>/es/works/ieee-std-421-5-2016-7553419.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_03274e3aab2817219f2e3b30</id>
      <fromId>work_ieee_56_2016_7740865</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_56_2016_7740865</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_56_2016_7740865</targetId>
      <targetTitle>IEEE Std 56-2016</targetTitle>
      <targetUrl>/es/works/ieee-std-56-2016-7740865.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_053dac968bb4c914f2f51253</id>
      <fromId>work_ieee_421_6_2017</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_421_6_2017</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_421_6_2017</targetId>
      <targetTitle>IEEE Std 421.6-2017</targetTitle>
      <targetUrl>/es/works/ieee-std-421-6-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bb86fbbb79df55f53d85b726</id>
      <fromId>work_ieee_572_2019_8704241</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_572_2019_8704241</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_572_2019_8704241</targetId>
      <targetTitle>IEEE Std 572-2019</targetTitle>
      <targetUrl>/es/works/ieee-std-572-2019-8704241.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_95eedd8d386b7fb5dd2efe8d</id>
      <fromId>work_ieee_430_2017</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_430_2017</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_430_2017</targetId>
      <targetTitle>IEEE Std 430-2017</targetTitle>
      <targetUrl>/es/works/ieee-std-430-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_81c196652ff3f66bad17ff9f</id>
      <fromId>work_ieee_577_2022_9761116</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_577_2022_9761116</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_577_2022_9761116</targetId>
      <targetTitle>IEEE Std 577-2022</targetTitle>
      <targetUrl>/es/works/ieee-std-577-2022-9761116.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_dee0ea6b64b687b5323006c2</id>
      <fromId>work_ieee_433_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_433_2022</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_433_2022</targetId>
      <targetTitle>IEEE Std 433-2022</targetTitle>
      <targetUrl>/es/works/ieee-std-433-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_07fb0a3d60133d9d259c7258</id>
      <fromId>work_ieee_592_2018_8400608</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_592_2018_8400608</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_592_2018_8400608</targetId>
      <targetTitle>IEEE Std 592-2018</targetTitle>
      <targetUrl>/es/works/ieee-std-592-2018-8400608.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_50412c4a2d2db09eafd38a9b</id>
      <fromId>work_ieee_442_2017</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_442_2017</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_442_2017</targetId>
      <targetTitle>IEEE Std 442-2017</targetTitle>
      <targetUrl>/es/works/ieee-std-442-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_49c8434f6b4d618a94d92825</id>
      <fromId>work_ieee_60076_16_2018</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_60076_16_2018</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_60076_16_2018</targetId>
      <targetTitle>IEEE Std 60076-16-2018</targetTitle>
      <targetUrl>/es/works/ieee-std-60076-16-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e7da9a1a168c21f758ceb757</id>
      <fromId>work_ieee_45_1_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_45_1_2023</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_45_1_2023</targetId>
      <targetTitle>IEEE Std 45.1-2023</targetTitle>
      <targetUrl>/es/works/ieee-std-45-1-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_06dabdf996a618a6298297ba</id>
      <fromId>work_ieee_60076_57_1202_2016</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_60076_57_1202_2016</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_60076_57_1202_2016</targetId>
      <targetTitle>IEEE Std 60076-57-1202-2016</targetTitle>
      <targetUrl>/es/works/ieee-std-60076-57-1202-2016.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0da323051d1228f6fc5776ad</id>
      <fromId>work_ieee_45_2_2023_10600162</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_45_2_2023_10600162</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_45_2_2023_10600162</targetId>
      <targetTitle>IEEE Std 45.2-2023</targetTitle>
      <targetUrl>/es/works/ieee-std-45-2-2023-10600162.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2cc0f57ca660406f53365b8c</id>
      <fromId>work_ieee_60076_57_129_2017</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_60076_57_129_2017</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_60076_57_129_2017</targetId>
      <targetTitle>IEEE Std 60076-57-129-2017</targetTitle>
      <targetUrl>/es/works/ieee-std-60076-57-129-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7f4455d7f23c3ff9f5cdf78f</id>
      <fromId>work_ieee_45_3_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_45_3_2025</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_45_3_2025</targetId>
      <targetTitle>IEEE Std 45.3-2025</targetTitle>
      <targetUrl>/es/works/ieee-std-45-3-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_da68ddb5c465d1a5a121b206</id>
      <fromId>work_ieee_60079_30_1_2025_11303381</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_60079_30_1_2025_11303381</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_60079_30_1_2025_11303381</targetId>
      <targetTitle>IEEE Std 60079-30-1-2025</targetTitle>
      <targetUrl>/es/works/ieee-std-60079-30-1-2025-11303381.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_43200c3d3eb31082a8e6718e</id>
      <fromId>work_ieee_45_4_2018</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_45_4_2018</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_45_4_2018</targetId>
      <targetTitle>IEEE Std 45.4-2018</targetTitle>
      <targetUrl>/es/works/ieee-std-45-4-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_97fa446fb429cf981bccc30f</id>
      <fromId>work_ieee_60079_30_2_2015</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_60079_30_2_2015</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_60079_30_2_2015</targetId>
      <targetTitle>IEEE Std 60079-30-2-2015</targetTitle>
      <targetUrl>/es/works/ieee-std-60079-30-2-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e25f6886b9aa0733ee89773d</id>
      <fromId>work_ieee_45_6_2016</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_45_6_2016</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_45_6_2016</targetId>
      <targetTitle>IEEE Std 45.6-2016</targetTitle>
      <targetUrl>/es/works/ieee-std-45-6-2016.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/es/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/es/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/es/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/es/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/es/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/es/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/es/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/es/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/es/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_1_1988</fromId>
      <fromTitle>IEEE Std 1003.1-1988</fromTitle>
      <fromUrl>/es/works/ieee-std-1003-1-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>es</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>concept_kind</key>
      <label>Concept kind</label>
      <value>Tema</value>
    </field>
    <field>
      <key>aliases</key>
      <label>Aliases</label>
      <value>IEEE Standards, IEEE Std, 电气电子工程师学会标准</value>
    </field>
    <field>
      <key>scope_note</key>
      <label>Scope note</label>
      <value>本条为总览；各标准号以独立 work 词条著录，勿仅在本条列表省略。</value>
    </field>
  </infoFields>
  <pagination>
    <page>21</page>
    <pageSize>50</pageSize>
    <total>8263</total>
    <pageCount>166</pageCount>
    <prevUrl>/es/concepts/ieee-standards/relation-20.xml</prevUrl>
    <nextUrl>/es/concepts/ieee-standards/relation-22.xml</nextUrl>
  </pagination>
  <relationsTotal>8263</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8278</mentionsTotal>
  <mentionsUrl>/es/concepts/ieee-standards/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>