---
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  "aliases": [
    "61671-2012",
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  "published": {
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    "year": 2012
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  "revision": 1,
  "slug": "ieee-std-61671-2012",
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      "author": "IEEE",
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      "locator": "standard_number=61671-2012; status=Active; modifier=Approved",
      "title": "IEEE Std 61671-2012 — IEEE Xplore 题录",
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    {
      "author": "IEEE",
      "date": "2026-11-01",
      "id": "s2",
      "title": "IEEE Xplore All Standards（KBART）",
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  "summary": "IEEE Std 61671-2012 是电气电子工程师学会的技术标准，题为“IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML”；公开目录标为现行（Active），已批准（Approved），著录年份为 2012 年。",
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---

# IEEE Std 61671-2012

IEEE Std 61671-2012 是电气电子工程师学会的技术标准，题为“IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML”；公开目录标为现行（Active），已批准（Approved），著录年份为 2012 年。

**IEEE Std 61671-2012**（IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML）是[电气电子工程师学会](/es/organizations/ieee.html)的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2012 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications、Fields, Waves and Electromagnetics[^s1]。参见[IEEE 标准](/es/concepts/ieee-standards.html)。

更新时间：2026-11-01

## 标签


## 关系

- Published by：[电气电子工程师学会](/es/organizations/ieee.html) 
- About：[IEEE 标准](/es/concepts/ieee-standards.html) 

第 1 / 1 页，共 2 条。

## 来源

- IEEE Std 61671-2012 — IEEE Xplore 题录：https://ieeexplore.ieee.org/servlet/opac?punumber=6238290 standard\_number=61671-2012; status=Active; modifier=Approved
- IEEE Xplore All Standards（KBART）：https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 
