<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>knowledge</title>
  <description>Read people, places, events, organizations, works, and concepts through sourced relations.</description>
  <url>/fr/index-128.html</url>
  <entities>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_7002_2022</id>
      <type>work</type>
      <title>IEEE Std 7002-2022</title>
      <slug>ieee-std-7002-2022</slug>
      <aliases>
        <alias>7002-2022</alias>
        <alias>7002-2022 - IEEE Standard for Data Privacy Process</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 7002-2022 是电气电子工程师学会的技术标准，题为“IEEE Standard for Data Privacy Process”；公开目录标为现行（Active），已批准（Approved），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 7002-2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9760245</url>
          <locator>standard_number=7002-2022; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:31+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:31+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 7002-2022**（IEEE Standard for Data Privacy Process）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2022 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-7002-2022.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_7003_2024</id>
      <type>work</type>
      <title>IEEE Std 7003-2024</title>
      <slug>ieee-std-7003-2024</slug>
      <aliases>
        <alias>7003-2024</alias>
        <alias>7003-2024 - IEEE Standard for Algorithmic Bias Considerations</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 7003-2024 是电气电子工程师学会的技术标准，题为“IEEE Standard for Algorithmic Bias Considerations”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 7003-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10851953</url>
          <locator>standard_number=7003-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:31+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:31+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 7003-2024**（IEEE Standard for Algorithmic Bias Considerations）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-7003-2024.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_7005_2021</id>
      <type>work</type>
      <title>IEEE Std 7005-2021</title>
      <slug>ieee-std-7005-2021</slug>
      <aliases>
        <alias>7005-2021</alias>
        <alias>7005-2021 - IEEE Standard for Transparent Employer Data Governance</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 7005-2021 是电气电子工程师学会的技术标准，题为“IEEE Standard for Transparent Employer Data Governance”；公开目录标为现行（Active），已批准（Approved），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 7005-2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9618903</url>
          <locator>standard_number=7005-2021; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:31+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:31+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 7005-2021**（IEEE Standard for Transparent Employer Data Governance）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2021 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-7005-2021.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_7007_2021</id>
      <type>work</type>
      <title>IEEE Std 7007-2021</title>
      <slug>ieee-std-7007-2021</slug>
      <aliases>
        <alias>7007-2021</alias>
        <alias>7007-2021 - IEEE Ontological Standard for Ethically Driven Robotics and Automation Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 7007-2021 是电气电子工程师学会的技术标准，题为“IEEE Ontological Standard for Ethically Driven Robotics and Automation Systems”；公开目录标为现行（Active），已批准（Approved），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 7007-2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9611204</url>
          <locator>standard_number=7007-2021; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:31+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:31+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 7007-2021**（IEEE Ontological Standard for Ethically Driven Robotics and Automation Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2021 年，主题领域包括 General Topics for Engineers、Robotics and Control Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-7007-2021.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_7009_2024</id>
      <type>work</type>
      <title>IEEE Std 7009-2024</title>
      <slug>ieee-std-7009-2024</slug>
      <aliases>
        <alias>7009-2024</alias>
        <alias>7009-2024 - IEEE Standard for Fail-Safe Design of Autonomous and Semi-Autonomous Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 7009-2024 是电气电子工程师学会的技术标准，题为“IEEE Standard for Fail-Safe Design of Autonomous and Semi-Autonomous Systems”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 7009-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10582896</url>
          <locator>standard_number=7009-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:31+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:31+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 7009-2024**（IEEE Standard for Fail-Safe Design of Autonomous and Semi-Autonomous Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-7009-2024.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_7010_2020</id>
      <type>work</type>
      <title>IEEE Std 7010-2020</title>
      <slug>ieee-std-7010-2020</slug>
      <aliases>
        <alias>7010-2020</alias>
        <alias>7010-2020 - IEEE Recommended Practice for Assessing the Impact of Autonomous and Intelligent Systems on Human Well-Being</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 7010-2020 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Assessing the Impact of Autonomous and Intelligent Systems on Human Well-Being”；公开目录标为现行（Active），已批准（Approved），著录年份为 2020 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 7010-2020 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9084217</url>
          <locator>standard_number=7010-2020; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:31+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:31+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 7010-2020**（IEEE Recommended Practice for Assessing the Impact of Autonomous and Intelligent Systems on Human Well-Being）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2020 年，主题领域包括 Computing and Processing、Bioengineering、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-7010-2020.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2020</year>
        <precision>year</precision>
        <display>2020年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_7012_2025</id>
      <type>work</type>
      <title>IEEE Std 7012-2025</title>
      <slug>ieee-std-7012-2025</slug>
      <aliases>
        <alias>7012-2025</alias>
        <alias>7012-2025 - IEEE Standard for Machine Readable Personal Privacy Terms</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 7012-2025 是电气电子工程师学会的技术标准，题为“IEEE Standard for Machine Readable Personal Privacy Terms”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 7012-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11360680</url>
          <locator>standard_number=7012-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:31+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:31+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 7012-2025**（IEEE Standard for Machine Readable Personal Privacy Terms）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Computing and Processing、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-7012-2025.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_7014_1_2026</id>
      <type>work</type>
      <title>IEEE Std 7014.1-2026</title>
      <slug>ieee-std-7014-1-2026</slug>
      <aliases>
        <alias>7014.1-2026</alias>
        <alias>7014.1-2026 - IEEE Recommended Practice for Ethical Considerations of Emulated Empathy in Partner-Based General-Purpose Artificial Intelligence Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 7014.1-2026 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Ethical Considerations of Emulated Empathy in Partner-Based General-Purpose Artificial Intelligence Systems”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 7014.1-2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11559261</url>
          <locator>standard_number=7014.1-2026; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:31+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:31+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 7014.1-2026**（IEEE Recommended Practice for Ethical Considerations of Emulated Empathy in Partner-Based General-Purpose Artificial Intelligence Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-7014-1-2026.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_7014_2024</id>
      <type>work</type>
      <title>IEEE Std 7014-2024</title>
      <slug>ieee-std-7014-2024</slug>
      <aliases>
        <alias>7014-2024</alias>
        <alias>7014-2024 - IEEE Standard for Ethical Considerations in Emulated Empathy in Autonomous and Intelligent Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 7014-2024 是电气电子工程师学会的技术标准，题为“IEEE Standard for Ethical Considerations in Emulated Empathy in Autonomous and Intelligent Systems”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 7014-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10576664</url>
          <locator>standard_number=7014-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:31+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:31+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 7014-2024**（IEEE Standard for Ethical Considerations in Emulated Empathy in Autonomous and Intelligent Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-7014-2024.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_7_4_3_2_2026</id>
      <type>work</type>
      <title>IEEE Std 7-4.3.2-2026</title>
      <slug>ieee-std-7-4-3-2-2026</slug>
      <aliases>
        <alias>7-4.3.2-2026</alias>
        <alias>7-4.3.2-2026 - IEEE Standard Criteria for Programmable Digital Devices in Safety Systems of Nuclear Power Generating Stations</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 7-4.3.2-2026 是电气电子工程师学会的技术标准，题为“IEEE Standard Criteria for Programmable Digital Devices in Safety Systems of Nuclear Power Generating Stations”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 7-4.3.2-2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11719002</url>
          <locator>standard_number=7-4.3.2-2026; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:31+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:31+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 7-4.3.2-2026**（IEEE Standard Criteria for Programmable Digital Devices in Safety Systems of Nuclear Power Generating Stations）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-7-4-3-2-2026.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_649_2006</id>
      <type>work</type>
      <title>IEEE Std 649-2006</title>
      <slug>ieee-std-649-2006</slug>
      <aliases>
        <alias>649-2006</alias>
        <alias>649-2006 - IEEE Standard for Qualifying Class 1E Motor Control Centers for Nuclear Power Generating Stations</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 649-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard for Qualifying Class 1E Motor Control Centers for Nuclear Power Generating Stations”；公开目录标为现行（Active），已批准（Approved），著录年份为 2006 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 649-2006 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4062297</url>
          <locator>standard_number=649-2006; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:30+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:30+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 649-2006**（IEEE Standard for Qualifying Class 1E Motor Control Centers for Nuclear Power Generating Stations）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2006 年，主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-649-2006.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2006</year>
        <precision>year</precision>
        <display>2006年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_650_2017</id>
      <type>work</type>
      <title>IEEE Std 650-2017</title>
      <slug>ieee-std-650-2017</slug>
      <aliases>
        <alias>650-2017</alias>
        <alias>650-2017 - IEEE Standard for Qualification of Class 1E Static Battery Chargers, Inverters, and Uninterruptible Power Supply Systems for Nuclear Power Generating Stations</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 650-2017 是电气电子工程师学会的技术标准，题为“IEEE Standard for Qualification of Class 1E Static Battery Chargers, Inverters, and Uninterruptible Power Supply Systems for Nuclear Power Generating Stations”；公开目录标为现行（Active），已批准（Approved），著录年份为 2018 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 650-2017 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8307799</url>
          <locator>standard_number=650-2017; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:30+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:30+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 650-2017**（IEEE Standard for Qualification of Class 1E Static Battery Chargers, Inverters, and Uninterruptible Power Supply Systems for Nuclear Power Generating Stations）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2018 年，主题领域包括 Engineered Materials, Dielectrics and Plasmas、Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-650-2017.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2018</year>
        <precision>year</precision>
        <display>2018年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_656_2018_8331393</id>
      <type>work</type>
      <title>IEEE Std 656-2018</title>
      <slug>ieee-std-656-2018-8331393</slug>
      <aliases>
        <alias>656-2018</alias>
        <alias>656-2018 - IEEE Standard for the Measurement of Audible Noise from Overhead Transmission Lines</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 656-2018 是电气电子工程师学会的技术标准，题为“IEEE Standard for the Measurement of Audible Noise from Overhead Transmission Lines”；公开目录标为现行（Active），已批准（Approved），著录年份为 2018 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 656-2018 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8331393</url>
          <locator>standard_number=656-2018; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:30+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:30+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 656-2018**（IEEE Standard for the Measurement of Audible Noise from Overhead Transmission Lines）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2018 年，主题领域包括 Power, Energy and Industry Applications、Signal Processing and Analysis、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-656-2018-8331393.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2018</year>
        <precision>year</precision>
        <display>2018年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_65700_19_03_2025</id>
      <type>work</type>
      <title>IEEE Std 65700-19-03-2025</title>
      <slug>ieee-std-65700-19-03-2025</slug>
      <aliases>
        <alias>65700-19-03-2025</alias>
        <alias>65700-19-03-2025 - IEEE/IEC International Standard - Bushings for DC Application</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 65700-19-03-2025 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard - Bushings for DC Application”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 65700-19-03-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11083693</url>
          <locator>standard_number=65700-19-03-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:30+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:30+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 65700-19-03-2025**（IEEE/IEC International Standard - Bushings for DC Application）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-65700-19-03-2025.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_686_2024_10815036</id>
      <type>work</type>
      <title>IEEE Std 686-2024</title>
      <slug>ieee-std-686-2024-10815036</slug>
      <aliases>
        <alias>686-2024</alias>
        <alias>686-2024 - IEEE Standard for Radar Definitions</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 686-2024 是电气电子工程师学会的技术标准，题为“IEEE Standard for Radar Definitions”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 686-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10815036</url>
          <locator>standard_number=686-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:30+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:30+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 686-2024**（IEEE Standard for Radar Definitions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Aerospace、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-686-2024-10815036.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_634_2023</id>
      <type>work</type>
      <title>IEEE Std 634-2023</title>
      <slug>ieee-std-634-2023</slug>
      <aliases>
        <alias>634-2023</alias>
        <alias>634-2023 - IEEE Standard for Cable-Penetration Fire Stop Qualification Test</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 634-2023 是电气电子工程师学会的技术标准，题为“IEEE Standard for Cable-Penetration Fire Stop Qualification Test”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 634-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10388235</url>
          <locator>standard_number=634-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:29+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:29+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 634-2023**（IEEE Standard for Cable-Penetration Fire Stop Qualification Test）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Engineered Materials, Dielectrics and Plasmas、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-634-2023.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_63572_2026</id>
      <type>work</type>
      <title>IEEE Std 63572-2026</title>
      <slug>ieee-std-63572-2026</slug>
      <aliases>
        <alias>63572-2026</alias>
        <alias>63572-2026 - IEC/IEEE Technical Report - Evaluation of absorbed power density related to human exposure to radio frequency fields from wireless communication devices operating between 6 GHz and 300 GH</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 63572-2026 是电气电子工程师学会的技术标准，题为“IEC/IEEE Technical Report - Evaluation of absorbed power density related to human exposure to radio frequency fields from wireless communication devices operating between 6 GHz and 300 GH”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 63572-2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11456467</url>
          <locator>standard_number=63572-2026; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:29+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:29+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 63572-2026**（IEC/IEEE Technical Report - Evaluation of absorbed power density related to human exposure to radio frequency fields from wireless communication devices operating between 6 GHz and 300 GH）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-63572-2026.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_644_2019_9068515</id>
      <type>work</type>
      <title>IEEE Std 644-2019</title>
      <slug>ieee-std-644-2019-9068515</slug>
      <aliases>
        <alias>644-2019</alias>
        <alias>644-2019 - IEEE Standard Procedures for Measurement of Power Frequency Electric and Magnetic Fields from AC Power Lines</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 644-2019 是电气电子工程师学会的技术标准，题为“IEEE Standard Procedures for Measurement of Power Frequency Electric and Magnetic Fields from AC Power Lines”；公开目录标为现行（Active），已批准（Approved），著录年份为 2020 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 644-2019 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9068515</url>
          <locator>standard_number=644-2019; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:29+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:29+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 644-2019**（IEEE Standard Procedures for Measurement of Power Frequency Electric and Magnetic Fields from AC Power Lines）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2020 年，主题领域包括 Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-644-2019-9068515.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2020</year>
        <precision>year</precision>
        <display>2020年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_63332_387_2024_10697441</id>
      <type>work</type>
      <title>IEEE Std 63332-387-2024</title>
      <slug>ieee-std-63332-387-2024-10697441</slug>
      <aliases>
        <alias>63332-387-2024</alias>
        <alias>63332-387-2024 - IEEE/IEC International Standard for Nuclear facilities -- Electrical power systems -- Diesel generator units applied as standby power sources</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 63332-387-2024 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard for Nuclear facilities -- Electrical power systems -- Diesel generator units applied as standby power sources”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 63332-387-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10697441</url>
          <locator>standard_number=63332-387-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:28+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:28+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 63332-387-2024**（IEEE/IEC International Standard for Nuclear facilities -- Electrical power systems -- Diesel generator units applied as standby power sources）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications、Robotics and Control Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-63332-387-2024-10697441.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_63195_2_ed2_2026</id>
      <type>work</type>
      <title>IEEE Std 63195-2/ED2, 2026</title>
      <slug>ieee-std-63195-2-ed2-2026</slug>
      <aliases>
        <alias>63195-2/ED2, 2026</alias>
        <alias>63195-2/ED2, 2026 - IEC/IEEE Draft International Standard - Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequ</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 63195-2/ED2, 2026 是电气电子工程师学会的草案，题为“IEC/IEEE Draft International Standard - Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequ”；公开目录标为现行（Active），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 63195-2/ED2, 2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11396497</url>
          <locator>standard_number=63195-2/ED2, 2026; status=Active; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:27+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:27+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 63195-2/ED2, 2026**（IEC/IEEE Draft International Standard - Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequ）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为现行（Active），著录年份为 2026 年，主题领域包括 Bioengineering、Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-63195-2-ed2-2026.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_63198_2775_2023</id>
      <type>work</type>
      <title>IEEE Std 63198-2775-2023</title>
      <slug>ieee-std-63198-2775-2023</slug>
      <aliases>
        <alias>63198-2775-2023</alias>
        <alias>63198-2775-2023 - IEC/IEEE International Technical Guidelines for Smart Hydroelectric Power Plant</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 63198-2775-2023 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Technical Guidelines for Smart Hydroelectric Power Plant”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 63198-2775-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10051645</url>
          <locator>standard_number=63198-2775-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:27+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:27+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 63198-2775-2023**（IEC/IEEE International Technical Guidelines for Smart Hydroelectric Power Plant）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Geoscience、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-63198-2775-2023.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_63253_5713_8_2024</id>
      <type>work</type>
      <title>IEEE Std 63253-5713-8-2024</title>
      <slug>ieee-std-63253-5713-8-2024</slug>
      <aliases>
        <alias>63253-5713-8-2024</alias>
        <alias>63253-5713-8-2024 - IEC/IEEE International Standard - Station Service Voltage Transformers (SSVT)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 63253-5713-8-2024 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Station Service Voltage Transformers (SSVT)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 63253-5713-8-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10770177</url>
          <locator>standard_number=63253-5713-8-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:27+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:27+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 63253-5713-8-2024**（IEC/IEEE International Standard - Station Service Voltage Transformers (SSVT)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-63253-5713-8-2024.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_63260_2020</id>
      <type>work</type>
      <title>IEEE Std 63260-2020</title>
      <slug>ieee-std-63260-2020</slug>
      <aliases>
        <alias>63260-2020</alias>
        <alias>63260-2020 - IEC/IEEE International Standard - Guide for incorporating human reliability analysis into probabilistic risk assessments for nuclear power generating stations and other nuclear facilities</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 63260-2020 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Guide for incorporating human reliability analysis into probabilistic risk assessments for nuclear power generating stations and other nuclear facilities”；公开目录标为现行（Active），已批准（Approved），著录年份为 2020 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 63260-2020 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9104041</url>
          <locator>standard_number=63260-2020; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:27+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:27+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 63260-2020**（IEC/IEEE International Standard - Guide for incorporating human reliability analysis into probabilistic risk assessments for nuclear power generating stations and other nuclear facilities）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2020 年，主题领域包括 General Topics for Engineers、Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-63260-2020.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2020</year>
        <precision>year</precision>
        <display>2020年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_63004_2015</id>
      <type>work</type>
      <title>IEEE Std 63004-2015</title>
      <slug>ieee-std-63004-2015</slug>
      <aliases>
        <alias>63004-2015</alias>
        <alias>63004-2015 - IEC/IEEE International standard for receiver fixture interface</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 63004-2015 是电气电子工程师学会的技术标准，题为“IEC/IEEE International standard for receiver fixture interface”；公开目录标为现行（Active），已批准（Approved），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 63004-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7358447</url>
          <locator>standard_number=63004-2015; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:26+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:26+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 63004-2015**（IEC/IEEE International standard for receiver fixture interface）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-63004-2015.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_63055_2023</id>
      <type>work</type>
      <title>IEEE Std 63055-2023</title>
      <slug>ieee-std-63055-2023</slug>
      <aliases>
        <alias>63055-2023</alias>
        <alias>63055-2023 - IEEE/IEC International Standard--Format for LSI-Package-Board Interoperable design</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 63055-2023 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard--Format for LSI-Package-Board Interoperable design”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 63055-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10287908</url>
          <locator>standard_number=63055-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:26+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:26+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 63055-2023**（IEEE/IEC International Standard--Format for LSI-Package-Board Interoperable design）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-63055-2023.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_63113_2021</id>
      <type>work</type>
      <title>IEEE Std 63113-2021</title>
      <slug>ieee-std-63113-2021</slug>
      <aliases>
        <alias>63113-2021</alias>
        <alias>63113-2021 - IEC/IEEE International Standard--Nuclear facilities--Instrumentation important to safety--Spent fuel pool instrumentation</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 63113-2021 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard--Nuclear facilities--Instrumentation important to safety--Spent fuel pool instrumentation”；公开目录标为现行（Active），已批准（Approved），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 63113-2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9415468</url>
          <locator>standard_number=63113-2021; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:26+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:26+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 63113-2021**（IEC/IEEE International Standard--Nuclear facilities--Instrumentation important to safety--Spent fuel pool instrumentation）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2021 年，主题领域包括 Components, Circuits, Devices and Systems、Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-63113-2021.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_63147_2017</id>
      <type>work</type>
      <title>IEEE Std 63147-2017</title>
      <slug>ieee-std-63147-2017</slug>
      <aliases>
        <alias>63147-2017</alias>
        <alias>63147-2017 - IEEE/IEC International Standard - Criteria for accident monitoring instrumentation for nuclear power generating stations</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 63147-2017 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard - Criteria for accident monitoring instrumentation for nuclear power generating stations”；公开目录标为现行（Active），已批准（Approved），著录年份为 2017 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 63147-2017 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8237237</url>
          <locator>standard_number=63147-2017; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:26+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:26+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 63147-2017**（IEEE/IEC International Standard - Criteria for accident monitoring instrumentation for nuclear power generating stations）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2017 年，主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-63147-2017.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2017</year>
        <precision>year</precision>
        <display>2017年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_63184_2025</id>
      <type>work</type>
      <title>IEEE Std 63184-2025</title>
      <slug>ieee-std-63184-2025</slug>
      <aliases>
        <alias>63184-2025</alias>
        <alias>63184-2025 - IEC/IEEE International Standard - Assessment methods of the human exposure to electric and magnetic fields from wireless power transfer systems - models, instrumentation, measurement and </alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 63184-2025 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Assessment methods of the human exposure to electric and magnetic fields from wireless power transfer systems - models, instrumentation, measurement and”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 63184-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10901986</url>
          <locator>standard_number=63184-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:26+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:26+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 63184-2025**（IEC/IEEE International Standard - Assessment methods of the human exposure to electric and magnetic fields from wireless power transfer systems - models, instrumentation, measurement and）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-63184-2025.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_63195_1_2022</id>
      <type>work</type>
      <title>IEEE Std 63195-1-2022</title>
      <slug>ieee-std-63195-1-2022</slug>
      <aliases>
        <alias>63195-1-2022</alias>
        <alias>63195-1-2022 - IEEE/IEC International Standard Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range of</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 63195-1-2022 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range of”；公开目录标为现行（Active），已批准（Approved），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 63195-1-2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9770425</url>
          <locator>standard_number=63195-1-2022; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:26+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:26+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 63195-1-2022**（IEEE/IEC International Standard Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range of）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2022 年，主题领域包括 Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics、Signal Processing and Analysis[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-63195-1-2022.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_63195_2_2022</id>
      <type>work</type>
      <title>IEEE Std 63195-2-2022</title>
      <slug>ieee-std-63195-2-2022</slug>
      <aliases>
        <alias>63195-2-2022</alias>
        <alias>63195-2-2022 - IEC/IEEE International Standard - Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range </alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 63195-2-2022 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range”；公开目录标为现行（Active），已批准（Approved），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 63195-2-2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9770434</url>
          <locator>standard_number=63195-2-2022; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:26+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:26+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 63195-2-2022**（IEC/IEEE International Standard - Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2022 年，主题领域包括 Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-63195-2-2022.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62860_2013</id>
      <type>work</type>
      <title>IEEE Std 62860-2013</title>
      <slug>ieee-std-62860-2013</slug>
      <aliases>
        <alias>62860-2013</alias>
        <alias>62860-2013 - IEC/IEEE Test methods for the characterization of organic transistors and materials</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62860-2013 是电气电子工程师学会的技术标准，题为“IEC/IEEE Test methods for the characterization of organic transistors and materials”；公开目录标为现行（Active），已批准（Approved），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62860-2013 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6617655</url>
          <locator>standard_number=62860-2013; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:25+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:25+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62860-2013**（IEC/IEEE Test methods for the characterization of organic transistors and materials）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2013 年，主题领域包括 Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62860-2013.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_63003_2015</id>
      <type>work</type>
      <title>IEEE Std 63003-2015</title>
      <slug>ieee-std-63003-2015</slug>
      <aliases>
        <alias>63003-2015</alias>
        <alias>63003-2015 - IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 63003-2015 是电气电子工程师学会的技术标准，题为“IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 63003-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7358450</url>
          <locator>standard_number=63003-2015; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:25+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:25+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 63003-2015**（IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-63003-2015.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62531_2012_6228484</id>
      <type>work</type>
      <title>IEEE Std 62531-2012</title>
      <slug>ieee-std-62531-2012-6228484</slug>
      <aliases>
        <alias>62531-2012</alias>
        <alias>62531-2012 - IEC 62531:2012(E) (IEEE Std 1850-2010): Standard for Property Specification Language (PSL)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62531-2012 是电气电子工程师学会的技术标准，题为“IEC 62531:2012(E) (IEEE Std 1850-2010): Standard for Property Specification Language (PSL)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62531-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6228484</url>
          <locator>standard_number=62531-2012; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62531-2012**（IEC 62531:2012(E) (IEEE Std 1850-2010): Standard for Property Specification Language (PSL)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2012 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62531-2012-6228484.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62582_2_2022_9936044</id>
      <type>work</type>
      <title>IEEE Std 62582-2-2022</title>
      <slug>ieee-std-62582-2-2022-9936044</slug>
      <aliases>
        <alias>62582-2-2022</alias>
        <alias>62582-2-2022 - IEC/IEEE International Standard - Nuclear power plants - Instrumentation and control important to safety - Electrical equipment condition monitoring methods - Part 2: Indenter measureme</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62582-2-2022 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Nuclear power plants - Instrumentation and control important to safety - Electrical equipment condition monitoring methods - Part 2: Indenter measureme”；公开目录标为现行（Active），已批准（Approved），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62582-2-2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9936044</url>
          <locator>standard_number=62582-2-2022; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62582-2-2022**（IEC/IEEE International Standard - Nuclear power plants - Instrumentation and control important to safety - Electrical equipment condition monitoring methods - Part 2: Indenter measureme）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2022 年，主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62582-2-2022-9936044.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62582_3_2024_10609810</id>
      <type>work</type>
      <title>IEEE Std 62582-3-2024</title>
      <slug>ieee-std-62582-3-2024-10609810</slug>
      <aliases>
        <alias>62582-3-2024</alias>
        <alias>62582-3-2024 - IEC/IEEE International Standard for Nuclear Power Plants - Instrumentation and control important to safety - Electrical equipment condition monitoring methods - Part 3: Elongation at br</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62582-3-2024 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard for Nuclear Power Plants - Instrumentation and control important to safety - Electrical equipment condition monitoring methods - Part 3: Elongation at br”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62582-3-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10609810</url>
          <locator>standard_number=62582-3-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62582-3-2024**（IEC/IEEE International Standard for Nuclear Power Plants - Instrumentation and control important to safety - Electrical equipment condition monitoring methods - Part 3: Elongation at br）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62582-3-2024-10609810.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62582_4_2022_9940216</id>
      <type>work</type>
      <title>IEEE Std 62582-4-2022</title>
      <slug>ieee-std-62582-4-2022-9940216</slug>
      <aliases>
        <alias>62582-4-2022</alias>
        <alias>62582-4-2022 - IEC/IEEE International Standard - Nuclear power plants - Instrumentation and control important to safety - Electrical equipment condition monitoring methods - Part 4: Oxidation inductio</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62582-4-2022 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Nuclear power plants - Instrumentation and control important to safety - Electrical equipment condition monitoring methods - Part 4: Oxidation inductio”；公开目录标为现行（Active），已批准（Approved），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62582-4-2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9940216</url>
          <locator>standard_number=62582-4-2022; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62582-4-2022**（IEC/IEEE International Standard - Nuclear power plants - Instrumentation and control important to safety - Electrical equipment condition monitoring methods - Part 4: Oxidation inductio）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2022 年，主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62582-4-2022-9940216.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62582_6_2019</id>
      <type>work</type>
      <title>IEEE Std 62582-6-2019</title>
      <slug>ieee-std-62582-6-2019</slug>
      <aliases>
        <alias>62582-6-2019</alias>
        <alias>62582-6-2019 - IEEE/IEC International Standard - Nuclear power plants -- Instrumentation and control important to safety -- Electrical equipment condition monitoring methods - Part 6: Insulation resis</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62582-6-2019 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard - Nuclear power plants -- Instrumentation and control important to safety -- Electrical equipment condition monitoring methods - Part 6: Insulation resis”；公开目录标为现行（Active），已批准（Approved），著录年份为 2019 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62582-6-2019 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8877508</url>
          <locator>standard_number=62582-6-2019; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62582-6-2019**（IEEE/IEC International Standard - Nuclear power plants -- Instrumentation and control important to safety -- Electrical equipment condition monitoring methods - Part 6: Insulation resis）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2019 年，主题领域包括 Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas、Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62582-6-2019.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2019</year>
        <precision>year</precision>
        <display>2019年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62624_2009</id>
      <type>work</type>
      <title>IEEE Std 62624-2009</title>
      <slug>ieee-std-62624-2009</slug>
      <aliases>
        <alias>62624-2009</alias>
        <alias>62624-2009 - Test methods for measurement of electrical properties of carbon nanotubes</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62624-2009 是电气电子工程师学会的技术标准，题为“Test methods for measurement of electrical properties of carbon nanotubes”；公开目录标为现行（Active），已批准（Approved），著录年份为 2009 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62624-2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5782920</url>
          <locator>standard_number=62624-2009; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62624-2009**（Test methods for measurement of electrical properties of carbon nanotubes）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2009 年，主题领域包括 Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62624-2009.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2009</year>
        <precision>year</precision>
        <display>2009年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62704_1_2017</id>
      <type>work</type>
      <title>IEEE Std 62704-1-2017</title>
      <slug>ieee-std-62704-1-2017</slug>
      <aliases>
        <alias>62704-1-2017</alias>
        <alias>62704-1-2017 - IEC/IEEE International Standard -- Determining the peak spatial-average specific absorption rate (SAR) in the human body from wireless communications devices, 30 MHz to 6 GHz – Part 1: </alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62704-1-2017 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard -- Determining the peak spatial-average specific absorption rate (SAR) in the human body from wireless communications devices, 30 MHz to 6 GHz – Part 1:”；公开目录标为现行（Active），已批准（Approved），著录年份为 2017 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62704-1-2017 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8088402</url>
          <locator>standard_number=62704-1-2017; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62704-1-2017**（IEC/IEEE International Standard -- Determining the peak spatial-average specific absorption rate (SAR) in the human body from wireless communications devices, 30 MHz to 6 GHz – Part 1:）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2017 年，主题领域包括 Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62704-1-2017.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2017</year>
        <precision>year</precision>
        <display>2017年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62704_2_2017</id>
      <type>work</type>
      <title>IEEE Std 62704-2-2017</title>
      <slug>ieee-std-62704-2-2017</slug>
      <aliases>
        <alias>62704-2-2017</alias>
        <alias>62704-2-2017 - IEEE/IEC International Standard -- Determining the peak spatial-average specific absorption rate (SAR) in the human body from wireless communications devices, 30 MHz to 6 GHz -- Part 2:</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62704-2-2017 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard -- Determining the peak spatial-average specific absorption rate (SAR) in the human body from wireless communications devices, 30 MHz to 6 GHz -- Part 2:”；公开目录标为现行（Active），已批准（Approved），著录年份为 2017 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62704-2-2017 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7964814</url>
          <locator>standard_number=62704-2-2017; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62704-2-2017**（IEEE/IEC International Standard -- Determining the peak spatial-average specific absorption rate (SAR) in the human body from wireless communications devices, 30 MHz to 6 GHz -- Part 2:）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2017 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62704-2-2017.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2017</year>
        <precision>year</precision>
        <display>2017年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62704_2a_2025_11170376</id>
      <type>work</type>
      <title>IEEE Std 62704-2a-2025</title>
      <slug>ieee-std-62704-2a-2025-11170376</slug>
      <aliases>
        <alias>62704-2a-2025</alias>
        <alias>62704-2a-2025 - IEEE/IEC International Standard for Determining the peak spatial-average specific absorption rate (SAR) in the human body from wireless communications devices, 30 MHz to6 GHz--Part 2: </alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62704-2a-2025 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard for Determining the peak spatial-average specific absorption rate (SAR) in the human body from wireless communications devices, 30 MHz to6 GHz--Part 2:”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62704-2a-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11170376</url>
          <locator>standard_number=62704-2a-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62704-2a-2025**（IEEE/IEC International Standard for Determining the peak spatial-average specific absorption rate (SAR) in the human body from wireless communications devices, 30 MHz to6 GHz--Part 2:）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Fields, Waves and Electromagnetics、Communication, Networking and Broadcast Technologies、Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62704-2a-2025-11170376.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62704_3_2017</id>
      <type>work</type>
      <title>IEEE Std 62704-3-2017</title>
      <slug>ieee-std-62704-3-2017</slug>
      <aliases>
        <alias>62704-3-2017</alias>
        <alias>62704-3-2017 - Determining the peak spatial-average specific absorption rate (SAR) in the human body from wireless communications devices, 30 MHz to 6 GHz - Part 3: Specific requirements for using the</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62704-3-2017 是电气电子工程师学会的技术标准，题为“Determining the peak spatial-average specific absorption rate (SAR) in the human body from wireless communications devices, 30 MHz to 6 GHz - Part 3: Specific requirements for using the”；公开目录标为现行（Active），已批准（Approved），著录年份为 2017 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62704-3-2017 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8089722</url>
          <locator>standard_number=62704-3-2017; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62704-3-2017**（Determining the peak spatial-average specific absorption rate (SAR) in the human body from wireless communications devices, 30 MHz to 6 GHz - Part 3: Specific requirements for using the）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2017 年，主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62704-3-2017.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2017</year>
        <precision>year</precision>
        <display>2017年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62704_4_2020_9237215</id>
      <type>work</type>
      <title>IEEE Std 62704-4-2020</title>
      <slug>ieee-std-62704-4-2020-9237215</slug>
      <aliases>
        <alias>62704-4-2020</alias>
        <alias>62704-4-2020 - IEC/IEEE International Standard - Determining the peak spatial-average specific absorption rate (SAR) in the human body from wireless communication devices, 30 MHz to 6 GHz – Part 4: Ge</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62704-4-2020 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Determining the peak spatial-average specific absorption rate (SAR) in the human body from wireless communication devices, 30 MHz to 6 GHz – Part 4: Ge”；公开目录标为现行（Active），已批准（Approved），著录年份为 2020 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62704-4-2020 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9237215</url>
          <locator>standard_number=62704-4-2020; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62704-4-2020**（IEC/IEEE International Standard - Determining the peak spatial-average specific absorption rate (SAR) in the human body from wireless communication devices, 30 MHz to 6 GHz – Part 4: Ge）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2020 年，主题领域包括 Bioengineering、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62704-4-2020-9237215.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2020</year>
        <precision>year</precision>
        <display>2020年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_627_2019_8902293</id>
      <type>work</type>
      <title>IEEE Std 627-2019</title>
      <slug>ieee-std-627-2019-8902293</slug>
      <aliases>
        <alias>627-2019</alias>
        <alias>627-2019 - IEEE Standard for Qualification of Equipment Used in Nuclear Facilities</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 627-2019 是电气电子工程师学会的技术标准，题为“IEEE Standard for Qualification of Equipment Used in Nuclear Facilities”；公开目录标为现行（Active），已批准（Approved），著录年份为 2019 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 627-2019 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8902293</url>
          <locator>standard_number=627-2019; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 627-2019**（IEEE Standard for Qualification of Equipment Used in Nuclear Facilities）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2019 年，主题领域包括 Components, Circuits, Devices and Systems、Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-627-2019-8902293.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2019</year>
        <precision>year</precision>
        <display>2019年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62843_2013</id>
      <type>work</type>
      <title>IEEE Std 62843-2013</title>
      <slug>ieee-std-62843-2013</slug>
      <aliases>
        <alias>62843-2013</alias>
        <alias>62843-2013 - Standard for N times 64 kilobit per second optical fiber interfaces between teleprotection and multiplexer equipment</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62843-2013 是电气电子工程师学会的技术标准，题为“Standard for N times 64 kilobit per second optical fiber interfaces between teleprotection and multiplexer equipment”；公开目录标为现行（Active），已批准（Approved），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62843-2013 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6420849</url>
          <locator>standard_number=62843-2013; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62843-2013**（Standard for N times 64 kilobit per second optical fiber interfaces between teleprotection and multiplexer equipment）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2013 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Photonics and Electrooptics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62843-2013.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62860_1_2013</id>
      <type>work</type>
      <title>IEEE Std 62860-1-2013</title>
      <slug>ieee-std-62860-1-2013</slug>
      <aliases>
        <alias>62860-1-2013</alias>
        <alias>62860-1-2013 - IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62860-1-2013 是电气电子工程师学会的技术标准，题为“IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators”；公开目录标为现行（Active），已批准（Approved），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62860-1-2013 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6617652</url>
          <locator>standard_number=62860-1-2013; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62860-1-2013**（IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2013 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62860-1-2013.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_628_2011_6159042</id>
      <type>work</type>
      <title>IEEE Std 628-2011</title>
      <slug>ieee-std-628-2011-6159042</slug>
      <aliases>
        <alias>628-2011</alias>
        <alias>628-2011 - IEEE Standard Criteria for the Design, Installation, and Qualification of Raceway Systems for Class 1E Circuits for Nuclear Power Generating Stations</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 628-2011 是电气电子工程师学会的技术标准，题为“IEEE Standard Criteria for the Design, Installation, and Qualification of Raceway Systems for Class 1E Circuits for Nuclear Power Generating Stations”；公开目录标为现行（Active），已批准（Approved），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 628-2011 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6159042</url>
          <locator>standard_number=628-2011; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 628-2011**（IEEE Standard Criteria for the Design, Installation, and Qualification of Raceway Systems for Class 1E Circuits for Nuclear Power Generating Stations）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2012 年，主题领域包括 Power, Energy and Industry Applications、Nuclear Engineering、Photonics and Electrooptics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-628-2011-6159042.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_628_2020</id>
      <type>work</type>
      <title>IEEE Std 628-2020</title>
      <slug>ieee-std-628-2020</slug>
      <aliases>
        <alias>628-2020</alias>
        <alias>628-2020 - IEEE Standard Criteria for the Design, Installation, and Qualification of Raceway Systems for Class 1E Circuits for Nuclear Power Generating Stations</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 628-2020 是电气电子工程师学会的技术标准，题为“IEEE Standard Criteria for the Design, Installation, and Qualification of Raceway Systems for Class 1E Circuits for Nuclear Power Generating Stations”；公开目录标为现行（Active），已批准（Approved），著录年份为 2020 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 628-2020 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9075449</url>
          <locator>standard_number=628-2020; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 628-2020**（IEEE Standard Criteria for the Design, Installation, and Qualification of Raceway Systems for Class 1E Circuits for Nuclear Power Generating Stations）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2020 年，主题领域包括 Components, Circuits, Devices and Systems、Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-628-2020.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2020</year>
        <precision>year</precision>
        <display>2020年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62539_first_edition_2007_07_ieee_930</id>
      <type>work</type>
      <title>IEEE Std 62539 First Edition 2007-07 IEEE 930</title>
      <slug>ieee-std-62539-first-edition-2007-07-ieee-930</slug>
      <aliases>
        <alias>62539 First Edition 2007-07 IEEE 930</alias>
        <alias>62539 First Edition 2007-07 IEEE 930 - IEC/IEEE Guide for the Statistical Analysis of Electrical Insulation Breakdown Data  (Adoption of IEEE Std 930-2004)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62539 First Edition 2007-07 IEEE 930 是电气电子工程师学会的技术标准，题为“IEC/IEEE Guide for the Statistical Analysis of Electrical Insulation Breakdown Data  (Adoption of IEEE Std 930-2004)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2007 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62539 First Edition 2007-07 IEEE 930 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4288248</url>
          <locator>standard_number=62539 First Edition 2007-07 IEEE 930; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:18+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:18+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62539 First Edition 2007-07 IEEE 930**（IEC/IEEE Guide for the Statistical Analysis of Electrical Insulation Breakdown Data  (Adoption of IEEE Std 930-2004)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2007 年，主题领域包括 Power, Energy and Industry Applications、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62539-first-edition-2007-07-ieee-930.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2007</year>
        <precision>year</precision>
        <display>2007年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62582_1_2024_10697438</id>
      <type>work</type>
      <title>IEEE Std 62582-1-2024</title>
      <slug>ieee-std-62582-1-2024-10697438</slug>
      <aliases>
        <alias>62582-1-2024</alias>
        <alias>62582-1-2024 - IEEE International Standard for Nuclear power plants -- Instrumentation and control important to safety--Electrical equipment condition monitoring methods--Part 1: General</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62582-1-2024 是电气电子工程师学会的技术标准，题为“IEEE International Standard for Nuclear power plants -- Instrumentation and control important to safety--Electrical equipment condition monitoring methods--Part 1: General”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62582-1-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10697438</url>
          <locator>standard_number=62582-1-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:18+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:18+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62582-1-2024**（IEEE International Standard for Nuclear power plants -- Instrumentation and control important to safety--Electrical equipment condition monitoring methods--Part 1: General）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications、Robotics and Control Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62582-1-2024-10697438.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62530_2011</id>
      <type>work</type>
      <title>IEEE Std 62530-2011</title>
      <slug>ieee-std-62530-2011</slug>
      <aliases>
        <alias>62530-2011</alias>
        <alias>62530-2011 - IEEE/IEC International Standard - SystemVerilog -- Unified Hardware Design, Specification, and Verification Language</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62530-2011 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard - SystemVerilog -- Unified Hardware Design, Specification, and Verification Language”；公开目录标为现行（Active），已批准（Approved），著录年份为 2011 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62530-2011 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5944938</url>
          <locator>standard_number=62530-2011; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:17+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:17+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62530-2011**（IEEE/IEC International Standard - SystemVerilog -- Unified Hardware Design, Specification, and Verification Language）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2011 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62530-2011.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2011</year>
        <precision>year</precision>
        <display>2011年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62531_2007</id>
      <type>work</type>
      <title>IEEE Std 62531-2007</title>
      <slug>ieee-std-62531-2007</slug>
      <aliases>
        <alias>62531-2007</alias>
        <alias>62531-2007 - IEC 62531 Ed. 1 (2007-11) (IEEE Std 1850-2005): Standard for Property Specification Language (PSL)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62531-2007 是电气电子工程师学会的技术标准，题为“IEC 62531 Ed. 1 (2007-11) (IEEE Std 1850-2005): Standard for Property Specification Language (PSL)”；公开目录标为现行（Active），著录年份为 2007 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62531-2007 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4408635</url>
          <locator>standard_number=62531-2007; status=Active; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:17+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:17+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62531-2007**（IEC 62531 Ed. 1 (2007-11) (IEEE Std 1850-2005): Standard for Property Specification Language (PSL)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），著录年份为 2007 年，主题领域包括 Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62531-2007.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2007</year>
        <precision>year</precision>
        <display>2007年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62530_2_2023</id>
      <type>work</type>
      <title>IEEE Std 62530-2-2023</title>
      <slug>ieee-std-62530-2-2023</slug>
      <aliases>
        <alias>62530-2-2023</alias>
        <alias>62530-2-2023 - IEEE/IEC International Standard--SystemVerilog--Part 2: Universal Verification Methodology Language Reference Manual</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62530-2-2023 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard--SystemVerilog--Part 2: Universal Verification Methodology Language Reference Manual”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62530-2-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10287890</url>
          <locator>standard_number=62530-2-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:09+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:09+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62530-2-2023**（IEEE/IEC International Standard--SystemVerilog--Part 2: Universal Verification Methodology Language Reference Manual）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62530-2-2023.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62209_1528a_2026</id>
      <type>work</type>
      <title>IEEE Std 62209-1528a-2026</title>
      <slug>ieee-std-62209-1528a-2026</slug>
      <aliases>
        <alias>62209-1528a-2026</alias>
        <alias>62209-1528a-2026 - IEEE/IEC International Standard - Measurement procedure for the assessment of specific absorption rate of human exposure to radio frequency fields from hand-held and body-mounted wi</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62209-1528a-2026 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard - Measurement procedure for the assessment of specific absorption rate of human exposure to radio frequency fields from hand-held and body-mounted wi”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62209-1528a-2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11711399</url>
          <locator>standard_number=62209-1528a-2026; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62209-1528a-2026**（IEEE/IEC International Standard - Measurement procedure for the assessment of specific absorption rate of human exposure to radio frequency fields from hand-held and body-mounted wi）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Bioengineering、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62209-1528a-2026.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62243_2012_6228490</id>
      <type>work</type>
      <title>IEEE Std 62243-2012</title>
      <slug>ieee-std-62243-2012-6228490</slug>
      <aliases>
        <alias>62243-2012</alias>
        <alias>62243-2012 - IEC 62243:2012(E) (IEEE Std 1232-2010): Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62243-2012 是电气电子工程师学会的技术标准，题为“IEC 62243:2012(E) (IEEE Std 1232-2010): Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62243-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6228490</url>
          <locator>standard_number=62243-2012; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62243-2012**（IEC 62243:2012(E) (IEEE Std 1232-2010): Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2012 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62243-2012-6228490.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62270_2013</id>
      <type>work</type>
      <title>IEEE Std 62270-2013</title>
      <slug>ieee-std-62270-2013</slug>
      <aliases>
        <alias>62270-2013</alias>
        <alias>62270-2013 - IEC/IEEE Guide for Computer-based Control for Hydroelectric Power Plant Automation</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62270-2013 是电气电子工程师学会的技术标准，题为“IEC/IEEE Guide for Computer-based Control for Hydroelectric Power Plant Automation”；公开目录标为现行（Active），已批准（Approved），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62270-2013 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6617649</url>
          <locator>standard_number=62270-2013; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62270-2013**（IEC/IEEE Guide for Computer-based Control for Hydroelectric Power Plant Automation）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2013 年，主题领域包括 Computing and Processing、Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62270-2013.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62271_37_013_2015_cor_1_2017</id>
      <type>work</type>
      <title>IEEE Std 62271-37-013-2015/Cor 1-2017</title>
      <slug>ieee-std-62271-37-013-2015-cor-1-2017</slug>
      <aliases>
        <alias>62271-37-013-2015/Cor 1-2017</alias>
        <alias>62271-37-013-2015/Cor 1-2017 - IEEE/IEC International Standard for high-voltage switchgear and controlgear - Part 37-013: Alternating current generator circuit-breakers: Corrigendum 1</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62271-37-013-2015/Cor 1-2017 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard for high-voltage switchgear and controlgear - Part 37-013: Alternating current generator circuit-breakers: Corrigendum 1”；公开目录标为现行（Active），已批准（Approved），著录年份为 2017 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62271-37-013-2015/Cor 1-2017 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7967669</url>
          <locator>standard_number=62271-37-013-2015/Cor 1-2017; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62271-37-013-2015/Cor 1-2017**（IEEE/IEC International Standard for high-voltage switchgear and controlgear - Part 37-013: Alternating current generator circuit-breakers: Corrigendum 1）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2017 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62271-37-013-2015-cor-1-2017.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2017</year>
        <precision>year</precision>
        <display>2017年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62271_37_013_2021_9586447</id>
      <type>work</type>
      <title>IEEE Std 62271-37-013-2021</title>
      <slug>ieee-std-62271-37-013-2021-9586447</slug>
      <aliases>
        <alias>62271-37-013-2021</alias>
        <alias>62271-37-013-2021 - IEEE/IEC International Standard for High-voltage switchgear and controlgear--Part 37-013: Alternating current generator circuit-breakers</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62271-37-013-2021 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard for High-voltage switchgear and controlgear--Part 37-013: Alternating current generator circuit-breakers”；公开目录标为现行（Active），已批准（Approved），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62271-37-013-2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9586447</url>
          <locator>standard_number=62271-37-013-2021; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62271-37-013-2021**（IEEE/IEC International Standard for High-voltage switchgear and controlgear--Part 37-013: Alternating current generator circuit-breakers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2021 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62271-37-013-2021-9586447.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62271_37_013_2021_cor_1_2024</id>
      <type>work</type>
      <title>IEEE Std 62271-37-013-2021/Cor 1-2024</title>
      <slug>ieee-std-62271-37-013-2021-cor-1-2024</slug>
      <aliases>
        <alias>62271-37-013-2021/Cor 1-2024</alias>
        <alias>62271-37-013-2021/Cor 1-2024 - IEEE/IEC International Standard for High-voltage Switchgear and Controlgear--Part 37-013: Alternating current generator circuit-breakers - Corrigendum 1</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62271-37-013-2021/Cor 1-2024 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard for High-voltage Switchgear and Controlgear--Part 37-013: Alternating current generator circuit-breakers - Corrigendum 1”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62271-37-013-2021/Cor 1-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10763423</url>
          <locator>standard_number=62271-37-013-2021/Cor 1-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62271-37-013-2021/Cor 1-2024**（IEEE/IEC International Standard for High-voltage Switchgear and Controlgear--Part 37-013: Alternating current generator circuit-breakers - Corrigendum 1）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62271-37-013-2021-cor-1-2024.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62395_1_2024_10574185</id>
      <type>work</type>
      <title>IEEE Std 62395-1-2024</title>
      <slug>ieee-std-62395-1-2024-10574185</slug>
      <aliases>
        <alias>62395-1-2024</alias>
        <alias>62395-1-2024 - IEEE/IEC International Standard - Electrical Resistance Trace Heating Systems for Industrial and Commercial Applications - Part 1: General and testing requirements</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62395-1-2024 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard - Electrical Resistance Trace Heating Systems for Industrial and Commercial Applications - Part 1: General and testing requirements”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62395-1-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10574185</url>
          <locator>standard_number=62395-1-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62395-1-2024**（IEEE/IEC International Standard - Electrical Resistance Trace Heating Systems for Industrial and Commercial Applications - Part 1: General and testing requirements）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62395-1-2024-10574185.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62395_2_2024</id>
      <type>work</type>
      <title>IEEE Std 62395-2-2024</title>
      <slug>ieee-std-62395-2-2024</slug>
      <aliases>
        <alias>62395-2-2024</alias>
        <alias>62395-2-2024 - IEC/IEEE International Standard - Electrical Resistance Trace Heating Systems for Industrial and Commercial Applications Part 2: Application Guide for system design, installation and ma</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62395-2-2024 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Electrical Resistance Trace Heating Systems for Industrial and Commercial Applications Part 2: Application Guide for system design, installation and ma”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62395-2-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10574182</url>
          <locator>standard_number=62395-2-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62395-2-2024**（IEC/IEEE International Standard - Electrical Resistance Trace Heating Systems for Industrial and Commercial Applications Part 2: Application Guide for system design, installation and ma）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62395-2-2024.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62525_2007</id>
      <type>work</type>
      <title>IEEE Std 62525-2007</title>
      <slug>ieee-std-62525-2007</slug>
      <aliases>
        <alias>62525-2007</alias>
        <alias>62525-2007 - (IEEE Std 1450-1999) International Standard Test Interface Language (STIL) for Digital Test Vector Data</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62525-2007 是电气电子工程师学会的技术标准，题为“(IEEE Std 1450-1999) International Standard Test Interface Language (STIL) for Digital Test Vector Data”；公开目录标为现行（Active），已批准（Approved），著录年份为 2007 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62525-2007 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4432409</url>
          <locator>standard_number=62525-2007; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62525-2007**（(IEEE Std 1450-1999) International Standard Test Interface Language (STIL) for Digital Test Vector Data）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2007 年，主题领域包括 Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62525-2007.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2007</year>
        <precision>year</precision>
        <display>2007年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62526_2007</id>
      <type>work</type>
      <title>IEEE Std 62526-2007</title>
      <slug>ieee-std-62526-2007</slug>
      <aliases>
        <alias>62526-2007</alias>
        <alias>62526-2007 - IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62526-2007 是电气电子工程师学会的技术标准，题为“IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments”；公开目录标为现行（Active），已批准（Approved），著录年份为 2007 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62526-2007 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8671479</url>
          <locator>standard_number=62526-2007; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62526-2007**（IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2007 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62526-2007.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2007</year>
        <precision>year</precision>
        <display>2007年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62529_2012_6228487</id>
      <type>work</type>
      <title>IEEE Std 62529-2012</title>
      <slug>ieee-std-62529-2012-6228487</slug>
      <aliases>
        <alias>62529-2012</alias>
        <alias>62529-2012 - IEC 62529:2012(E) Standard for Signal and Test Definition</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62529-2012 是电气电子工程师学会的技术标准，题为“IEC 62529:2012(E) Standard for Signal and Test Definition”；公开目录标为现行（Active），已批准（Approved），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62529-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6228487</url>
          <locator>standard_number=62529-2012; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62529-2012**（IEC 62529:2012(E) Standard for Signal and Test Definition）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2012 年，主题领域包括 Power, Energy and Industry Applications、Fields, Waves and Electromagnetics、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62529-2012-6228487.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62529_2024</id>
      <type>work</type>
      <title>IEEE Std 62529-2024</title>
      <slug>ieee-std-62529-2024</slug>
      <aliases>
        <alias>62529-2024</alias>
        <alias>62529-2024 - IEEE/IEC International Standard for Signal and Test Definition</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62529-2024 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard for Signal and Test Definition”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62529-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10577611</url>
          <locator>standard_number=62529-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62529-2024**（IEEE/IEC International Standard for Signal and Test Definition）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Communication, Networking and Broadcast Technologies、Signal Processing and Analysis[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62529-2024.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61869_21_2025</id>
      <type>work</type>
      <title>IEEE Std 61869-21-2025</title>
      <slug>ieee-std-61869-21-2025</slug>
      <aliases>
        <alias>61869-21-2025</alias>
        <alias>61869-21-2025 - IEEE/IEC International Standard Instrument transformers--Part 21: Uncertainty evaluation in the accuracy test of instrument transformers</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61869-21-2025 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard Instrument transformers--Part 21: Uncertainty evaluation in the accuracy test of instrument transformers”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61869-21-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11299495</url>
          <locator>standard_number=61869-21-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61869-21-2025**（IEEE/IEC International Standard Instrument transformers--Part 21: Uncertainty evaluation in the accuracy test of instrument transformers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 General Topics for Engineers、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61869-21-2025.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61886_1_2021</id>
      <type>work</type>
      <title>IEEE Std 61886-1-2021</title>
      <slug>ieee-std-61886-1-2021</slug>
      <aliases>
        <alias>61886-1-2021</alias>
        <alias>61886-1-2021 - IEEE/IEC International Standard for Subsea equipment--Part 1: Power connectors, penetrators and jumper assemblies with rated voltage from 3 kV (Umax = 3,6 kV) to 30 kV (Umax = 36 kV)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61886-1-2021 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard for Subsea equipment--Part 1: Power connectors, penetrators and jumper assemblies with rated voltage from 3 kV (Umax = 3,6 kV) to 30 kV (Umax = 36 kV)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61886-1-2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9415477</url>
          <locator>standard_number=61886-1-2021; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61886-1-2021**（IEEE/IEC International Standard for Subsea equipment--Part 1: Power connectors, penetrators and jumper assemblies with rated voltage from 3 kV (Umax = 3,6 kV) to 30 kV (Umax = 36 kV)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2021 年，主题领域包括 Components, Circuits, Devices and Systems、Geoscience、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61886-1-2021.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61886_2_2023</id>
      <type>work</type>
      <title>IEEE Std 61886.2-2023</title>
      <slug>ieee-std-61886-2-2023</slug>
      <aliases>
        <alias>61886.2-2023</alias>
        <alias>61886.2-2023 - IEEE/IEC International Standard - Subsea equipment - Part 2: Power transformers</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61886.2-2023 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard - Subsea equipment - Part 2: Power transformers”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61886.2-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11141660</url>
          <locator>standard_number=61886.2-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61886.2-2023**（IEEE/IEC International Standard - Subsea equipment - Part 2: Power transformers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61886-2-2023.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62014_5_2015</id>
      <type>work</type>
      <title>IEEE Std 62014-5-2015</title>
      <slug>ieee-std-62014-5-2015</slug>
      <aliases>
        <alias>62014-5-2015</alias>
        <alias>62014-5-2015 - IEEE/IEC International Standard - Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62014-5-2015 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard - Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs”；公开目录标为现行（Active），已批准（Approved），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62014-5-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7067344</url>
          <locator>standard_number=62014-5-2015; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62014-5-2015**（IEEE/IEC International Standard - Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62014-5-2015.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62032_2012_6238287</id>
      <type>work</type>
      <title>IEEE Std 62032-2012</title>
      <slug>ieee-std-62032-2012-6238287</slug>
      <aliases>
        <alias>62032-2012</alias>
        <alias>62032-2012 - IEC 62032:2012(E)(IEEE Std C57.135-2011) Guide for the Application, Specification, and Testing of Phase-Shifting Transformers</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62032-2012 是电气电子工程师学会的技术标准，题为“IEC 62032:2012(E)(IEEE Std C57.135-2011) Guide for the Application, Specification, and Testing of Phase-Shifting Transformers”；公开目录标为现行（Active），已批准（Approved），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62032-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6238287</url>
          <locator>standard_number=62032-2012; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62032-2012**（IEC 62032:2012(E)(IEEE Std C57.135-2011) Guide for the Application, Specification, and Testing of Phase-Shifting Transformers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2012 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62032-2012-6238287.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_620_2022_9787353</id>
      <type>work</type>
      <title>IEEE Std 620-2022</title>
      <slug>ieee-std-620-2022-9787353</slug>
      <aliases>
        <alias>620-2022</alias>
        <alias>620-2022 - IEEE Guide for the Presentation of Thermal Limit Curves for Squirrel Cage Induction Machines</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 620-2022 是电气电子工程师学会的技术标准，题为“IEEE Guide for the Presentation of Thermal Limit Curves for Squirrel Cage Induction Machines”；公开目录标为现行（Active），已批准（Approved），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 620-2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9787353</url>
          <locator>standard_number=620-2022; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 620-2022**（IEEE Guide for the Presentation of Thermal Limit Curves for Squirrel Cage Induction Machines）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2022 年，主题领域包括 Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-620-2022-9787353.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62209_1528_2020_9231296</id>
      <type>work</type>
      <title>IEEE Std 62209-1528-2020</title>
      <slug>ieee-std-62209-1528-2020-9231296</slug>
      <aliases>
        <alias>62209-1528-2020</alias>
        <alias>62209-1528-2020 - IEC/IEEE International Standard - Measurement procedure for the assessment of specific absorption rate of human exposure to radio frequency fields from hand-held and body-mounted wir</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62209-1528-2020 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Measurement procedure for the assessment of specific absorption rate of human exposure to radio frequency fields from hand-held and body-mounted wir”；公开目录标为现行（Active），已批准（Approved），著录年份为 2020 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62209-1528-2020 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9231296</url>
          <locator>standard_number=62209-1528-2020; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62209-1528-2020**（IEC/IEEE International Standard - Measurement procedure for the assessment of specific absorption rate of human exposure to radio frequency fields from hand-held and body-mounted wir）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2020 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62209-1528-2020-9231296.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2020</year>
        <precision>year</precision>
        <display>2020年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_62_2_2026</id>
      <type>work</type>
      <title>IEEE Std 62.2-2026</title>
      <slug>ieee-std-62-2-2026</slug>
      <aliases>
        <alias>62.2-2026</alias>
        <alias>62.2-2026 - IEEE Guide for Diagnostic Field Testing of Electric Power Apparatus--Electrical Machinery</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 62.2-2026 是电气电子工程师学会的技术标准，题为“IEEE Guide for Diagnostic Field Testing of Electric Power Apparatus--Electrical Machinery”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 62.2-2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11718979</url>
          <locator>standard_number=62.2-2026; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 62.2-2026**（IEEE Guide for Diagnostic Field Testing of Electric Power Apparatus--Electrical Machinery）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-62-2-2026.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61691_6_2021</id>
      <type>work</type>
      <title>IEEE Std 61691-6-2021</title>
      <slug>ieee-std-61691-6-2021</slug>
      <aliases>
        <alias>61691-6-2021</alias>
        <alias>61691-6-2021 - IEC/IEEE International Standard-Behavioural languages–Part 6: VHDL Analog and Mixed-Signal Extensions</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61691-6-2021 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard-Behavioural languages–Part 6: VHDL Analog and Mixed-Signal Extensions”；公开目录标为现行（Active），已批准（Approved），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61691-6-2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9456766</url>
          <locator>standard_number=61691-6-2021; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:06+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:06+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61691-6-2021**（IEC/IEEE International Standard-Behavioural languages–Part 6: VHDL Analog and Mixed-Signal Extensions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2021 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61691-6-2021.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61691_7_2009</id>
      <type>work</type>
      <title>IEEE Std 61691-7-2009</title>
      <slug>ieee-std-61691-7-2009</slug>
      <aliases>
        <alias>61691-7-2009</alias>
        <alias>61691-7-2009 - Behavioural languages - Part 7: SystemC Language Reference Manual</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61691-7-2009 是电气电子工程师学会的技术标准，题为“Behavioural languages - Part 7: SystemC Language Reference Manual”；公开目录标为现行（Active），已批准（Approved），著录年份为 2009 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61691-7-2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5473170</url>
          <locator>standard_number=61691-7-2009; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:06+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:06+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61691-7-2009**（Behavioural languages - Part 7: SystemC Language Reference Manual）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2009 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61691-7-2009.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2009</year>
        <precision>year</precision>
        <display>2009年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61850_9_3_2016</id>
      <type>work</type>
      <title>IEEE Std 61850-9-3-2016</title>
      <slug>ieee-std-61850-9-3-2016</slug>
      <aliases>
        <alias>61850-9-3-2016</alias>
        <alias>61850-9-3-2016 - IEC/IEEE International Standard - Communication networks and systems for power utility automation – Part 9-3: Precision time protocol profile for power utility automation</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61850-9-3-2016 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Communication networks and systems for power utility automation – Part 9-3: Precision time protocol profile for power utility automation”；公开目录标为现行（Active），已批准（Approved），著录年份为 2016 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61850-9-3-2016 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7479436</url>
          <locator>standard_number=61850-9-3-2016; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:06+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:06+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61850-9-3-2016**（IEC/IEEE International Standard - Communication networks and systems for power utility automation – Part 9-3: Precision time protocol profile for power utility automation）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2016 年，主题领域包括 Power, Energy and Industry Applications、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61850-9-3-2016.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2016</year>
        <precision>year</precision>
        <display>2016年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61671_5_2016</id>
      <type>work</type>
      <title>IEEE Std 61671-5-2016</title>
      <slug>ieee-std-61671-5-2016</slug>
      <aliases>
        <alias>61671-5-2016</alias>
        <alias>61671-5-2016 - IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61671-5-2016 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description”；公开目录标为现行（Active），已批准（Approved），著录年份为 2016 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61671-5-2016 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7454656</url>
          <locator>standard_number=61671-5-2016; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61671-5-2016**（IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2016 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61671-5-2016.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2016</year>
        <precision>year</precision>
        <display>2016年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61671_6_2016</id>
      <type>work</type>
      <title>IEEE Std 61671-6-2016</title>
      <slug>ieee-std-61671-6-2016</slug>
      <aliases>
        <alias>61671-6-2016</alias>
        <alias>61671-6-2016 - IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61671-6-2016 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description”；公开目录标为现行（Active），已批准（Approved），著录年份为 2016 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61671-6-2016 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7454653</url>
          <locator>standard_number=61671-6-2016; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61671-6-2016**（IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2016 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61671-6-2016.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2016</year>
        <precision>year</precision>
        <display>2016年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61691_1_1_2023</id>
      <type>work</type>
      <title>IEEE Std 61691-1-1-2023</title>
      <slug>ieee-std-61691-1-1-2023</slug>
      <aliases>
        <alias>61691-1-1-2023</alias>
        <alias>61691-1-1-2023 - IEEE/IEC International Standard--Behavioural languages--Part 1-1: VHDL Language Reference Manual</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61691-1-1-2023 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard--Behavioural languages--Part 1-1: VHDL Language Reference Manual”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61691-1-1-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10287896</url>
          <locator>standard_number=61691-1-1-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61691-1-1-2023**（IEEE/IEC International Standard--Behavioural languages--Part 1-1: VHDL Language Reference Manual）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61691-1-1-2023.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61691_6_2009_5464490</id>
      <type>work</type>
      <title>IEEE Std 61691-6-2009</title>
      <slug>ieee-std-61691-6-2009-5464490</slug>
      <aliases>
        <alias>61691-6-2009</alias>
        <alias>61691-6-2009 - Behavioural languages - Part 6: VHDL Analog and Mixed-Signal Extensions</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61691-6-2009 是电气电子工程师学会的技术标准，题为“Behavioural languages - Part 6: VHDL Analog and Mixed-Signal Extensions”；公开目录标为现行（Active），已批准（Approved），著录年份为 2009 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61691-6-2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5464490</url>
          <locator>standard_number=61691-6-2009; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61691-6-2009**（Behavioural languages - Part 6: VHDL Analog and Mixed-Signal Extensions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2009 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61691-6-2009-5464490.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2009</year>
        <precision>year</precision>
        <display>2009年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61671_4_2016</id>
      <type>work</type>
      <title>IEEE Std 61671-4-2016</title>
      <slug>ieee-std-61671-4-2016</slug>
      <aliases>
        <alias>61671-4-2016</alias>
        <alias>61671-4-2016 - IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61671-4-2016 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration”；公开目录标为现行（Active），已批准（Approved），著录年份为 2016 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61671-4-2016 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7452513</url>
          <locator>standard_number=61671-4-2016; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:04+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:04+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61671-4-2016**（IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2016 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61671-4-2016.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2016</year>
        <precision>year</precision>
        <display>2016年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61671_2012</id>
      <type>work</type>
      <title>IEEE Std 61671-2012</title>
      <slug>ieee-std-61671-2012</slug>
      <aliases>
        <alias>61671-2012</alias>
        <alias>61671-2012 - IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61671-2012 是电气电子工程师学会的技术标准，题为“IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML”；公开目录标为现行（Active），已批准（Approved），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61671-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6238290</url>
          <locator>standard_number=61671-2012; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:03+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:03+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61671-2012**（IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2012 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61671-2012.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61636_1_2021</id>
      <type>work</type>
      <title>IEEE Std 61636-1-2021</title>
      <slug>ieee-std-61636-1-2021</slug>
      <aliases>
        <alias>61636-1-2021</alias>
        <alias>61636-1-2021 - International Standard-Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Languag</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61636-1-2021 是电气电子工程师学会的技术标准，题为“International Standard-Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Languag”；公开目录标为现行（Active），已批准（Approved），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61636-1-2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9451896</url>
          <locator>standard_number=61636-1-2021; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:01+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:01+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61636-1-2021**（International Standard-Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Languag）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2021 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61636-1-2021.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61636_2021</id>
      <type>work</type>
      <title>IEEE Std 61636-2021</title>
      <slug>ieee-std-61636-2021</slug>
      <aliases>
        <alias>61636-2021</alias>
        <alias>61636-2021 - International Standard-Software Interface for Maintenance Information Collection and Analysis (SIMICA)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61636-2021 是电气电子工程师学会的技术标准，题为“International Standard-Software Interface for Maintenance Information Collection and Analysis (SIMICA)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61636-2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9451887</url>
          <locator>standard_number=61636-2021; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:01+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:01+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61636-2021**（International Standard-Software Interface for Maintenance Information Collection and Analysis (SIMICA)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2021 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61636-2021.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61671_2_2016</id>
      <type>work</type>
      <title>IEEE Std 61671-2-2016</title>
      <slug>ieee-std-61671-2-2016</slug>
      <aliases>
        <alias>61671-2-2016</alias>
        <alias>61671-2-2016 - IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61671-2-2016 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description”；公开目录标为现行（Active），已批准（Approved），著录年份为 2016 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61671-2-2016 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7451139</url>
          <locator>standard_number=61671-2-2016; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:01+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:01+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61671-2-2016**（IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2016 年，主题领域包括 Computing and Processing、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61671-2-2016.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2016</year>
        <precision>year</precision>
        <display>2016年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61523_1_2023</id>
      <type>work</type>
      <title>IEEE Std 61523-1-2023</title>
      <slug>ieee-std-61523-1-2023</slug>
      <aliases>
        <alias>61523-1-2023</alias>
        <alias>61523-1-2023 - IEEE/IEC International Standard--Delay and power calculation standards--Part 1: Integrated Circuit (IC) Open Library Architecture (OLA)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61523-1-2023 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard--Delay and power calculation standards--Part 1: Integrated Circuit (IC) Open Library Architecture (OLA)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61523-1-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10287887</url>
          <locator>standard_number=61523-1-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:00+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:00+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61523-1-2023**（IEEE/IEC International Standard--Delay and power calculation standards--Part 1: Integrated Circuit (IC) Open Library Architecture (OLA)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61523-1-2023.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61523_4_2015</id>
      <type>work</type>
      <title>IEEE Std 61523-4-2015</title>
      <slug>ieee-std-61523-4-2015</slug>
      <aliases>
        <alias>61523-4-2015</alias>
        <alias>61523-4-2015 - IEEE/IEC International Standard - Design and Verification of Low-Power Integrated Circuits</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61523-4-2015 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard - Design and Verification of Low-Power Integrated Circuits”；公开目录标为现行（Active），已批准（Approved），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61523-4-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7076552</url>
          <locator>standard_number=61523-4-2015; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:00+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:00+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61523-4-2015**（IEEE/IEC International Standard - Design and Verification of Low-Power Integrated Circuits）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2015 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61523-4-2015.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61523_4_2023</id>
      <type>work</type>
      <title>IEEE Std 61523-4-2023</title>
      <slug>ieee-std-61523-4-2023</slug>
      <aliases>
        <alias>61523-4-2023</alias>
        <alias>61523-4-2023 - IEEE/IEC International Standard--Delay and power calculation standards--Part 4: Design and Verification of Low-Power, Energy-Aware Electronic Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61523-4-2023 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard--Delay and power calculation standards--Part 4: Design and Verification of Low-Power, Energy-Aware Electronic Systems”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61523-4-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10287902</url>
          <locator>standard_number=61523-4-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:00+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:00+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61523-4-2023**（IEEE/IEC International Standard--Delay and power calculation standards--Part 4: Design and Verification of Low-Power, Energy-Aware Electronic Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Computing and Processing、Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61523-4-2023.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61588_2021</id>
      <type>work</type>
      <title>IEEE Std 61588-2021</title>
      <slug>ieee-std-61588-2021</slug>
      <aliases>
        <alias>61588-2021</alias>
        <alias>61588-2021 - IEC/IEEE International Standard - Precision Clock Synchronization Protocol for Networked Measurement and Control Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61588-2021 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard - Precision Clock Synchronization Protocol for Networked Measurement and Control Systems”；公开目录标为现行（Active），已批准（Approved），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61588-2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9456760</url>
          <locator>standard_number=61588-2021; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:19:00+08:00</createdAt>
      <updatedAt>2026-11-01T21:19:00+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61588-2021**（IEC/IEEE International Standard - Precision Clock Synchronization Protocol for Networked Measurement and Control Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2021 年，主题领域包括 Communication, Networking and Broadcast Technologies、Power, Energy and Industry Applications、Robotics and Control Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61588-2021.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_60980_344_2020</id>
      <type>work</type>
      <title>IEEE Std 60980-344-2020</title>
      <slug>ieee-std-60980-344-2020</slug>
      <aliases>
        <alias>60980-344-2020</alias>
        <alias>60980-344-2020 - IEEE/IEC International Standard - Nuclear facilities - Equipment important to safety - Seismic qualification</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60980-344-2020 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard - Nuclear facilities - Equipment important to safety - Seismic qualification”；公开目录标为现行（Active），已批准（Approved），著录年份为 2020 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60980-344-2020 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9231293</url>
          <locator>standard_number=60980-344-2020; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60980-344-2020**（IEEE/IEC International Standard - Nuclear facilities - Equipment important to safety - Seismic qualification）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2020 年，主题领域包括 Components, Circuits, Devices and Systems、Geoscience、Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60980-344-2020.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2020</year>
        <precision>year</precision>
        <display>2020年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61007_389_2026</id>
      <type>work</type>
      <title>IEEE Std 61007-389-2026</title>
      <slug>ieee-std-61007-389-2026</slug>
      <aliases>
        <alias>61007-389-2026</alias>
        <alias>61007-389-2026 - IEEE/IEC International Standard for Transformers and Inductors for use in Electronic and Telecommunication Equipment - Part 389: Measuring methods and test procedures</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61007-389-2026 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard for Transformers and Inductors for use in Electronic and Telecommunication Equipment - Part 389: Measuring methods and test procedures”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61007-389-2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11643526</url>
          <locator>standard_number=61007-389-2026; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61007-389-2026**（IEEE/IEC International Standard for Transformers and Inductors for use in Electronic and Telecommunication Equipment - Part 389: Measuring methods and test procedures）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Communication, Networking and Broadcast Technologies、Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61007-389-2026.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_61158_2017</id>
      <type>work</type>
      <title>IEEE Std 61158-2017</title>
      <slug>ieee-std-61158-2017</slug>
      <aliases>
        <alias>61158-2017</alias>
        <alias>61158-2017 - IEEE Standard for Industrial Hard Real-Time Communication</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 61158-2017 是电气电子工程师学会的技术标准，题为“IEEE Standard for Industrial Hard Real-Time Communication”；公开目录标为现行（Active），已批准（Approved），著录年份为 2017 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 61158-2017 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8024202</url>
          <locator>standard_number=61158-2017; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 61158-2017**（IEEE Standard for Industrial Hard Real-Time Communication）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2017 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-61158-2017.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2017</year>
        <precision>year</precision>
        <display>2017年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_60780_323_2016_10205995</id>
      <type>work</type>
      <title>IEEE Std 60780-323-2016</title>
      <slug>ieee-std-60780-323-2016-10205995</slug>
      <aliases>
        <alias>60780-323-2016</alias>
        <alias>60780-323-2016 - IEEE Standard for Nuclear facilities--Electrical Equipment important to safety--Qualification</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60780-323-2016 是电气电子工程师学会的技术标准，题为“IEEE Standard for Nuclear facilities--Electrical Equipment important to safety--Qualification”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60780-323-2016 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10205995</url>
          <locator>standard_number=60780-323-2016; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:56+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:56+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60780-323-2016**（IEEE Standard for Nuclear facilities--Electrical Equipment important to safety--Qualification）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60780-323-2016-10205995.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_60802_2026</id>
      <type>work</type>
      <title>IEEE Std 60802-2026</title>
      <slug>ieee-std-60802-2026</slug>
      <aliases>
        <alias>60802-2026</alias>
        <alias>60802-2026 - IEC/IEEE International Standard Time-Sensitive Networking Profile for Industrial Automation</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60802-2026 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard Time-Sensitive Networking Profile for Industrial Automation”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60802-2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11584933</url>
          <locator>standard_number=60802-2026; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:56+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:56+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60802-2026**（IEC/IEEE International Standard Time-Sensitive Networking Profile for Industrial Automation）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60802-2026.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_60079_30_1_2025_11303381</id>
      <type>work</type>
      <title>IEEE Std 60079-30-1-2025</title>
      <slug>ieee-std-60079-30-1-2025-11303381</slug>
      <aliases>
        <alias>60079-30-1-2025</alias>
        <alias>60079-30-1-2025 - IEC/IEEE International Standard Explosive atmospheres - Part 30-1: Electrical resistance trace heating - General and testing requirements</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60079-30-1-2025 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard Explosive atmospheres - Part 30-1: Electrical resistance trace heating - General and testing requirements”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60079-30-1-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11303381</url>
          <locator>standard_number=60079-30-1-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:55+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60079-30-1-2025**（IEC/IEEE International Standard Explosive atmospheres - Part 30-1: Electrical resistance trace heating - General and testing requirements）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 General Topics for Engineers、Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60079-30-1-2025-11303381.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_60079_30_2_2015</id>
      <type>work</type>
      <title>IEEE Std 60079-30-2-2015</title>
      <slug>ieee-std-60079-30-2-2015</slug>
      <aliases>
        <alias>60079-30-2-2015</alias>
        <alias>60079-30-2-2015 - IEEE/IEC International Standard for Explosive atmospheres -- Part 30-2: Electrical resistance trace heating -- Application guide for design, installation and maintenance</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60079-30-2-2015 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard for Explosive atmospheres -- Part 30-2: Electrical resistance trace heating -- Application guide for design, installation and maintenance”；公开目录标为现行（Active），已批准（Approved），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60079-30-2-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7279039</url>
          <locator>standard_number=60079-30-2-2015; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:55+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60079-30-2-2015**（IEEE/IEC International Standard for Explosive atmospheres -- Part 30-2: Electrical resistance trace heating -- Application guide for design, installation and maintenance）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2015 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60079-30-2-2015.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_60079_30_2_2025_11303387</id>
      <type>work</type>
      <title>IEEE Std 60079-30-2-2025</title>
      <slug>ieee-std-60079-30-2-2025-11303387</slug>
      <aliases>
        <alias>60079-30-2-2025</alias>
        <alias>60079-30-2-2025 - IEC/IEEE International Standard for Explosive atmospheres - Part 30-2: Electrical resistance trace heating - Guidance on application for design, installation and maintenance</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60079-30-2-2025 是电气电子工程师学会的技术标准，题为“IEC/IEEE International Standard for Explosive atmospheres - Part 30-2: Electrical resistance trace heating - Guidance on application for design, installation and maintenance”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60079-30-2-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11303387</url>
          <locator>standard_number=60079-30-2-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:55+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60079-30-2-2025**（IEC/IEEE International Standard for Explosive atmospheres - Part 30-2: Electrical resistance trace heating - Guidance on application for design, installation and maintenance）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications、Robotics and Control Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60079-30-2-2025-11303387.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_60214_2_2019</id>
      <type>work</type>
      <title>IEEE Std 60214-2-2019</title>
      <slug>ieee-std-60214-2-2019</slug>
      <aliases>
        <alias>60214-2-2019</alias>
        <alias>60214-2-2019 - IEEE/IEC International Standard for TAP-changers --Part 2: Application guidelines</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60214-2-2019 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard for TAP-changers --Part 2: Application guidelines”；公开目录标为现行（Active），已批准（Approved），著录年份为 2019 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60214-2-2019 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8736531</url>
          <locator>standard_number=60214-2-2019; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:55+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60214-2-2019**（IEEE/IEC International Standard for TAP-changers --Part 2: Application guidelines）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2019 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60214-2-2019.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2019</year>
        <precision>year</precision>
        <display>2019年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_60255_118_1_2018</id>
      <type>work</type>
      <title>IEEE Std 60255-118-1-2018</title>
      <slug>ieee-std-60255-118-1-2018</slug>
      <aliases>
        <alias>60255-118-1-2018</alias>
        <alias>60255-118-1-2018 - IEEE/IEC International Standard - Measuring relays and protection equipment - Part 118-1: Synchrophasor for power systems - Measurements</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 60255-118-1-2018 是电气电子工程师学会的技术标准，题为“IEEE/IEC International Standard - Measuring relays and protection equipment - Part 118-1: Synchrophasor for power systems - Measurements”；公开目录标为现行（Active），已批准（Approved），著录年份为 2018 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 60255-118-1-2018 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8577043</url>
          <locator>standard_number=60255-118-1-2018; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:55+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 60255-118-1-2018**（IEEE/IEC International Standard - Measuring relays and protection equipment - Part 118-1: Synchrophasor for power systems - Measurements）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2018 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-60255-118-1-2018.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2018</year>
        <precision>year</precision>
        <display>2018年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_603_2018</id>
      <type>work</type>
      <title>IEEE Std 603-2018</title>
      <slug>ieee-std-603-2018</slug>
      <aliases>
        <alias>603-2018</alias>
        <alias>603-2018 - IEEE Standard Criteria for Safety Systems for Nuclear Power Generating Stations</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 603-2018 是电气电子工程师学会的技术标准，题为“IEEE Standard Criteria for Safety Systems for Nuclear Power Generating Stations”；公开目录标为现行（Active），已批准（Approved），著录年份为 2018 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 603-2018 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8573233</url>
          <locator>standard_number=603-2018; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:18:55+08:00</createdAt>
      <updatedAt>2026-11-01T21:18:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 603-2018**（IEEE Standard Criteria for Safety Systems for Nuclear Power Generating Stations）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2018 年，主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-603-2018.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2018</year>
        <precision>year</precision>
        <display>2018年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
  </entities>
  <tags></tags>
  <categories></categories>
  <relations></relations>
  <mentions></mentions>
  <toc></toc>
  <siteStats>
    <published>75048</published>
    <relations>77387</relations>
    <tags>43</tags>
    <categories>30</categories>
    <types>
      <type key="person">
        <label>Personnes</label>
        <count>3929</count>
      </type>
      <type key="place">
        <label>Lieux</label>
        <count>57082</count>
      </type>
      <type key="event">
        <label>Événements</label>
        <count>288</count>
      </type>
      <type key="organization">
        <label>Organisations</label>
        <count>452</count>
      </type>
      <type key="work">
        <label>Œuvres</label>
        <count>11882</count>
      </type>
      <type key="concept">
        <label>Concepts</label>
        <count>1415</count>
      </type>
    </types>
    <languages>
      <language key="zh">
        <label>简体中文</label>
        <count>75048</count>
      </language>
      <language key="en">
        <label>English</label>
        <count>48961</count>
      </language>
      <language key="ja">
        <label>日本語</label>
        <count>1158</count>
      </language>
      <language key="fr">
        <label>Français</label>
        <count>1064</count>
      </language>
      <language key="es">
        <label>Español</label>
        <count>1042</count>
      </language>
      <language key="it">
        <label>Italiano</label>
        <count>1021</count>
      </language>
      <language key="ms">
        <label>Bahasa Melayu</label>
        <count>997</count>
      </language>
      <language key="ar">
        <label>العربية</label>
        <count>993</count>
      </language>
      <language key="id">
        <label>Bahasa Indonesia</label>
        <count>990</count>
      </language>
      <language key="ru">
        <label>Русский</label>
        <count>987</count>
      </language>
      <language key="hi">
        <label>हिन्दी</label>
        <count>985</count>
      </language>
      <language key="th">
        <label>ไทย</label>
        <count>984</count>
      </language>
      <language key="pt">
        <label>Português</label>
        <count>972</count>
      </language>
      <language key="de">
        <label>Deutsch</label>
        <count>970</count>
      </language>
      <language key="nl">
        <label>Nederlands</label>
        <count>970</count>
      </language>
      <language key="vi">
        <label>Tiếng Việt</label>
        <count>962</count>
      </language>
      <language key="ko">
        <label>한국어</label>
        <count>961</count>
      </language>
      <language key="tr">
        <label>Türkçe</label>
        <count>952</count>
      </language>
      <language key="zh-hant">
        <label>繁體中文</label>
        <count>920</count>
      </language>
    </languages>
  </siteStats>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>fr</lang>
  <availableLangs></availableLangs>
  <infoFields></infoFields>
  <pagination>
    <page>128</page>
    <pageSize>100</pageSize>
    <total>50001</total>
    <pageCount>501</pageCount>
    <prevUrl>/fr/index-127.xml</prevUrl>
    <nextUrl>/fr/index-129.xml</nextUrl>
  </pagination>
  <relationCounts></relationCounts>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>