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      <title>IEEE Std 1686-2007</title>
      <slug>ieee-std-1686-2007</slug>
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        <alias>1686-2007</alias>
        <alias>1686-2007 - IEEE Standard for Substation Intelligent Electronic Devices (IEDs) Cyber Security Capabilities</alias>
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      <summary>IEEE Std 1686-2007 是电气电子工程师学会的技术标准，题为“IEEE Standard for Substation Intelligent Electronic Devices (IEDs) Cyber Security Capabilities”；公开目录标为已被替代（Superseded），著录年份为 2008 年。</summary>
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          <title>IEEE Std 1686-2007 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4453837</url>
          <locator>standard_number=1686-2007; status=Superseded; modifier=</locator>
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          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <body>**IEEE Std 1686-2007**（IEEE Standard for Substation Intelligent Electronic Devices (IEDs) Cyber Security Capabilities）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <title>IEEE Std 1686-2013</title>
      <slug>ieee-std-1686-2013-6704700</slug>
      <aliases>
        <alias>1686-2013</alias>
        <alias>1686-2013 - IEEE Standard for Intelligent Electronic Devices Cyber Security Capabilities</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1686-2013 是电气电子工程师学会的技术标准，题为“IEEE Standard for Intelligent Electronic Devices Cyber Security Capabilities”；公开目录标为已被替代（Superseded），著录年份为 2014 年。</summary>
      <status>published</status>
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      <tags>
        <tag>tag-ieee-standard</tag>
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          <id>s1</id>
          <title>IEEE Std 1686-2013 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6704700</url>
          <locator>standard_number=1686-2013; status=Superseded; modifier=</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:00:13+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:13+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1686-2013**（IEEE Standard for Intelligent Electronic Devices Cyber Security Capabilities）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2014 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <fallback>true</fallback>
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      <workKind>standard</workKind>
      <published>
        <year>2014</year>
        <precision>year</precision>
        <display>2014年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1686_2013_6747944_redline</id>
      <type>work</type>
      <title>IEEE Std 1686-2013</title>
      <slug>ieee-std-1686-2013-6747944-redline</slug>
      <aliases>
        <alias>1686-2013</alias>
        <alias>1686-2013 - IEEE Standard for Intelligent Electronic Devices Cyber Security Capabilities - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1686-2013 是电气电子工程师学会的技术标准，题为“IEEE Standard for Intelligent Electronic Devices Cyber Security Capabilities - Redline”；公开目录标为已被替代（Superseded），红线对照（Redline），著录年份为 2014 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
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        <source>
          <id>s1</id>
          <title>IEEE Std 1686-2013 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6747944</url>
          <locator>standard_number=1686-2013; status=Superseded; modifier=Redline</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:00:13+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:13+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1686-2013**（IEEE Standard for Intelligent Electronic Devices Cyber Security Capabilities - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），红线对照（Redline），著录年份为 2014 年，主题领域包括 Fields, Waves and Electromagnetics、Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1686-2013-6747944-redline.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
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        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2014</year>
        <precision>year</precision>
        <display>2014年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p1788_d9_5_oct_2014</id>
      <type>work</type>
      <title>IEEE Std P1788/D9.5, Oct 2014</title>
      <slug>ieee-std-p1788-d9-5-oct-2014</slug>
      <aliases>
        <alias>P1788/D9.5, Oct 2014</alias>
        <alias>P1788/D9.5, Oct 2014 - IEEE Draft Standard for Interval Arithmetic</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1788/D9.5, Oct 2014 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Interval Arithmetic”；公开目录标为非现行（Inactive），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1788/D9.5, Oct 2014 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6994197</url>
          <locator>standard_number=P1788/D9.5, Oct 2014; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:00:13+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:13+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1788/D9.5, Oct 2014**（IEEE Draft Standard for Interval Arithmetic）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1788-d9-5-oct-2014.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p1788_d9_6_mar_2014</id>
      <type>work</type>
      <title>IEEE Std P1788/D9.6, Mar 2014</title>
      <slug>ieee-std-p1788-d9-6-mar-2014</slug>
      <aliases>
        <alias>P1788/D9.6, Mar 2014</alias>
        <alias>P1788/D9.6, Mar 2014 - IEEE Draft Standard for Interval Arithmetic</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1788/D9.6, Mar 2014 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Interval Arithmetic”；公开目录标为非现行（Inactive），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1788/D9.6, Mar 2014 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7081716</url>
          <locator>standard_number=P1788/D9.6, Mar 2014; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T22:00:13+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:13+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1788/D9.6, Mar 2014**（IEEE Draft Standard for Interval Arithmetic）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2015 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1788-d9-6-mar-2014.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p1789_d2_sept_2014</id>
      <type>work</type>
      <title>IEEE Std P1789/D2, Sept 2014</title>
      <slug>ieee-std-p1789-d2-sept-2014</slug>
      <aliases>
        <alias>P1789/D2, Sept 2014</alias>
        <alias>P1789/D2, Sept 2014 - IEEE Draft Recommended Practices of Modulating Current in High Brightness LEDs for Mitigating Health Risks to Viewers</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1789/D2, Sept 2014 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practices of Modulating Current in High Brightness LEDs for Mitigating Health Risks to Viewers”；公开目录标为非现行（Inactive），著录年份为 2014 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1789/D2, Sept 2014 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6936824</url>
          <locator>standard_number=P1789/D2, Sept 2014; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T22:00:13+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:13+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1789/D2, Sept 2014**（IEEE Draft Recommended Practices of Modulating Current in High Brightness LEDs for Mitigating Health Risks to Viewers）是[[organization_ieee|电气电子工程师学会]]于 2014 年 9 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1789-d2-sept-2014.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2014</year>
        <precision>year</precision>
        <display>2014年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1680_1_2009</id>
      <type>work</type>
      <title>IEEE Std 1680.1-2009</title>
      <slug>ieee-std-1680-1-2009</slug>
      <aliases>
        <alias>1680.1-2009</alias>
        <alias>1680.1-2009 - IEEE Standard for Environmental Assessment of Personal Computer Products, Including Notebook Personal Computers, Desktop Personal Computers, and Personal Computer Displays</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1680.1-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard for Environmental Assessment of Personal Computer Products, Including Notebook Personal Computers, Desktop Personal Computers, and Personal Computer Displays”；公开目录标为已被替代（Superseded），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1680.1-2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5431176</url>
          <locator>standard_number=1680.1-2009; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:12+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1680.1-2009**（IEEE Standard for Environmental Assessment of Personal Computer Products, Including Notebook Personal Computers, Desktop Personal Computers, and Personal Computer Displays）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2010 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1680-1-2009.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1680_1_2018_8697199_redline</id>
      <type>work</type>
      <title>IEEE Std 1680.1-2018</title>
      <slug>ieee-std-1680-1-2018-8697199-redline</slug>
      <aliases>
        <alias>1680.1-2018</alias>
        <alias>1680.1-2018 - IEEE Standard for Environmental and Social Responsibility Assessment of Computers and Displays - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1680.1-2018 是电气电子工程师学会的技术标准，题为“IEEE Standard for Environmental and Social Responsibility Assessment of Computers and Displays - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2018 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1680.1-2018 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8697199</url>
          <locator>standard_number=1680.1-2018; status=Active; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:12+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1680.1-2018**（IEEE Standard for Environmental and Social Responsibility Assessment of Computers and Displays - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2018 年，主题领域包括 Computing and Processing、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1680-1-2018-8697199-redline.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2018</year>
        <precision>year</precision>
        <display>2018年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1680_2009_5953418</id>
      <type>work</type>
      <title>IEEE Std 1680-2009</title>
      <slug>ieee-std-1680-2009-5953418</slug>
      <aliases>
        <alias>1680-2009</alias>
        <alias>1680-2009 - IEEE Standard for Environmental Assessment of Electronic Products - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1680-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard for Environmental Assessment of Electronic Products - Redline”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1680-2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5953418</url>
          <locator>standard_number=1680-2009; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:00:12+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1680-2009**（IEEE Standard for Environmental Assessment of Electronic Products - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2010 年，主题领域包括 Computing and Processing、Geoscience、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1680-2009-5953418.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1680_2_2012</id>
      <type>work</type>
      <title>IEEE Std 1680.2-2012</title>
      <slug>ieee-std-1680-2-2012</slug>
      <aliases>
        <alias>1680.2-2012</alias>
        <alias>1680.2-2012 - IEEE Standard for Environmental Assessment of Imaging Equipment</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1680.2-2012 是电气电子工程师学会的技术标准，题为“IEEE Standard for Environmental Assessment of Imaging Equipment”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1680.2-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6330970</url>
          <locator>standard_number=1680.2-2012; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T22:00:12+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1680.2-2012**（IEEE Standard for Environmental Assessment of Imaging Equipment）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2012 年，主题领域包括 Computing and Processing、General Topics for Engineers、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1680-2-2012.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_1680_2_2024_11051169_redline</id>
      <type>work</type>
      <title>IEEE Std 1680.2-2024</title>
      <slug>ieee-std-1680-2-2024-11051169-redline</slug>
      <aliases>
        <alias>1680.2-2024</alias>
        <alias>1680.2-2024 - IEEE Standard for Environmental Assessment of Imaging Equipment - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1680.2-2024 是电气电子工程师学会的技术标准，题为“IEEE Standard for Environmental Assessment of Imaging Equipment - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1680.2-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11051169</url>
          <locator>standard_number=1680.2-2024; status=Active; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T22:00:12+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1680.2-2024**（IEEE Standard for Environmental Assessment of Imaging Equipment - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2024 年，主题领域包括 Computing and Processing、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1680-2-2024-11051169-redline.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1680_2a_2017</id>
      <type>work</type>
      <title>IEEE Std 1680.2a-2017</title>
      <slug>ieee-std-1680-2a-2017</slug>
      <aliases>
        <alias>1680.2a-2017</alias>
        <alias>1680.2a-2017 - IEEE Standard for Environmental Assessment of Imaging Equipment - Amendment 1</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1680.2a-2017 是电气电子工程师学会的技术标准，题为“IEEE Standard for Environmental Assessment of Imaging Equipment - Amendment 1”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2017 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1680.2a-2017 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8237221</url>
          <locator>standard_number=1680.2a-2017; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T22:00:12+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1680.2a-2017**（IEEE Standard for Environmental Assessment of Imaging Equipment - Amendment 1）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2017 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Geoscience[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1680-2a-2017.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2017</year>
        <precision>year</precision>
        <display>2017年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <perspectives></perspectives>
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      <id>work_ieee_1680_3_2012</id>
      <type>work</type>
      <title>IEEE Std 1680.3-2012</title>
      <slug>ieee-std-1680-3-2012</slug>
      <aliases>
        <alias>1680.3-2012</alias>
        <alias>1680.3-2012 - IEEE Standard for Environmental Assessment of Televisions</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1680.3-2012 是电气电子工程师学会的技术标准，题为“IEEE Standard for Environmental Assessment of Televisions”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1680.3-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6331497</url>
          <locator>standard_number=1680.3-2012; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:12+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1680.3-2012**（IEEE Standard for Environmental Assessment of Televisions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2012 年，主题领域包括 Power, Energy and Industry Applications、Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1680-3-2012.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1680_3_2024_10945560_redline</id>
      <type>work</type>
      <title>IEEE Std 1680.3-2024</title>
      <slug>ieee-std-1680-3-2024-10945560-redline</slug>
      <aliases>
        <alias>1680.3-2024</alias>
        <alias>1680.3-2024 - IEEE Standard for Environmental Assessment of Televisions - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1680.3-2024 是电气电子工程师学会的技术标准，题为“IEEE Standard for Environmental Assessment of Televisions - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1680.3-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10945560</url>
          <locator>standard_number=1680.3-2024; status=Active; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:12+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1680.3-2024**（IEEE Standard for Environmental Assessment of Televisions - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2024 年，主题领域包括 Communication, Networking and Broadcast Technologies、Geoscience[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1680-3-2024-10945560-redline.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_1680_3a_2017</id>
      <type>work</type>
      <title>IEEE Std 1680.3a-2017</title>
      <slug>ieee-std-1680-3a-2017</slug>
      <aliases>
        <alias>1680.3a-2017</alias>
        <alias>1680.3a-2017 - IEEE Standard for Environmental Assessment of Televisions - Amendment 1</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1680.3a-2017 是电气电子工程师学会的技术标准，题为“IEEE Standard for Environmental Assessment of Televisions - Amendment 1”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2017 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1680.3a-2017 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8237224</url>
          <locator>standard_number=1680.3a-2017; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:12+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1680.3a-2017**（IEEE Standard for Environmental Assessment of Televisions - Amendment 1）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2017 年，主题领域包括 Communication, Networking and Broadcast Technologies、Geoscience、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1680-3a-2017.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2017</year>
        <precision>year</precision>
        <display>2017年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1682_2011</id>
      <type>work</type>
      <title>IEEE Std 1682-2011</title>
      <slug>ieee-std-1682-2011</slug>
      <aliases>
        <alias>1682-2011</alias>
        <alias>1682-2011 - IEEE Standard for Qualifying Fiber Optic Cables, Connections, and Optical Fiber Splices for Use in Safety Systems in Nuclear Power Generating Stations</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1682-2011 是电气电子工程师学会的技术标准，题为“IEEE Standard for Qualifying Fiber Optic Cables, Connections, and Optical Fiber Splices for Use in Safety Systems in Nuclear Power Generating Stations”；公开目录标为已被替代（Superseded），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1682-2011 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6062365</url>
          <locator>standard_number=1682-2011; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:12+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1682-2011**（IEEE Standard for Qualifying Fiber Optic Cables, Connections, and Optical Fiber Splices for Use in Safety Systems in Nuclear Power Generating Stations）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2013 年，主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1682-2011.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
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        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
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      <creators></creators>
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      <id>work_ieee_1682_2023_10101735</id>
      <type>work</type>
      <title>IEEE Std 1682-2023</title>
      <slug>ieee-std-1682-2023-10101735</slug>
      <aliases>
        <alias>1682-2023</alias>
        <alias>1682-2023 - IEEE Appoved Draft Standard for Qualifying Fiber Optic Cables, Connections, and Optical Fiber Splices for Use in Safety Systems in Nuclear Power Generating Stations</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1682-2023 是电气电子工程师学会的草案，题为“IEEE Appoved Draft Standard for Qualifying Fiber Optic Cables, Connections, and Optical Fiber Splices for Use in Safety Systems in Nuclear Power Generating Stations”；公开目录标为非现行（Inactive），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1682-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10101735</url>
          <locator>standard_number=1682-2023; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T22:00:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1682-2023**（IEEE Appoved Draft Standard for Qualifying Fiber Optic Cables, Connections, and Optical Fiber Splices for Use in Safety Systems in Nuclear Power Generating Stations）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2023 年，主题领域包括 Photonics and Electrooptics、Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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        <precision>year</precision>
        <display>2023年</display>
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      <language>英语</language>
      <creators></creators>
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      <title>IEEE Std 1682-2023</title>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1682-2023 是电气电子工程师学会的技术标准，题为“IEEE Standard for Qualifying Fiber Optic Cables, Connections, and Optical Fiber Splices for Use in Safety Systems in Nuclear Power Generating Stations - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
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        <source>
          <id>s1</id>
          <title>IEEE Std 1682-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10897779</url>
          <locator>standard_number=1682-2023; status=Active; modifier=Redline</locator>
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          <id>s2</id>
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          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T22:00:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1682-2023**（IEEE Standard for Qualifying Fiber Optic Cables, Connections, and Optical Fiber Splices for Use in Safety Systems in Nuclear Power Generating Stations - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2023 年，主题领域包括 Communication, Networking and Broadcast Technologies、Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <lang>fr</lang>
      <fallback>true</fallback>
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        <lang>zh</lang>
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        <precision>year</precision>
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      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <title>IEEE Std 1683-2014</title>
      <slug>ieee-std-1683-2014-6781527</slug>
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        <alias>1683-2014</alias>
        <alias>1683-2014 - IEEE Guide for Motor Control Centers Rated up to and including 600 V AC or 1000 V DC with Recommendations Intended to Help Reduce Electrical Hazards</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1683-2014 是电气电子工程师学会的草案，题为“IEEE Guide for Motor Control Centers Rated up to and including 600 V AC or 1000 V DC with Recommendations Intended to Help Reduce Electrical Hazards”；公开目录标为非现行（Inactive），著录年份为 2014 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1683-2014 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6781527</url>
          <locator>standard_number=1683-2014; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T22:00:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1683-2014**（IEEE Guide for Motor Control Centers Rated up to and including 600 V AC or 1000 V DC with Recommendations Intended to Help Reduce Electrical Hazards）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2014 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1683-2014-6781527.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2014</year>
        <precision>year</precision>
        <display>2014年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <title>IEEE Std 1685-2009</title>
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      <aliases>
        <alias>1685-2009</alias>
        <alias>1685-2009 - IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1685-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows”；公开目录标为已被替代（Superseded），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
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      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1685-2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5417307</url>
          <locator>standard_number=1685-2009; status=Superseded; modifier=</locator>
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          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T22:00:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1685-2009**（IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2010 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1685-2009.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1685_2014</id>
      <type>work</type>
      <title>IEEE Std 1685-2014</title>
      <slug>ieee-std-1685-2014</slug>
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        <alias>1685-2014</alias>
        <alias>1685-2014 - IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1685-2014 是电气电子工程师学会的技术标准，题为“IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows”；公开目录标为已被替代（Superseded），著录年份为 2014 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
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      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1685-2014 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6898801</url>
          <locator>standard_number=1685-2014; status=Superseded; modifier=</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T22:00:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1685-2014**（IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2014 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1685-2014.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2014</year>
        <precision>year</precision>
        <display>2014年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <type>work</type>
      <title>IEEE Std 1685-2022</title>
      <slug>ieee-std-1685-2022-10186338-redline</slug>
      <aliases>
        <alias>1685-2022</alias>
        <alias>1685-2022 - IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1685-2022 是电气电子工程师学会的技术标准，题为“IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1685-2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10186338</url>
          <locator>standard_number=1685-2022; status=Active; modifier=Redline</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T22:00:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1685-2022**（IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2023 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1685-2022-10186338-redline.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <type>work</type>
      <title>IEEE Std 1679-2020</title>
      <slug>ieee-std-1679-2020-9080673-redline</slug>
      <aliases>
        <alias>1679-2020</alias>
        <alias>1679-2020 - IEEE Recommended Practice for the Characterization and Evaluation of Energy Storage Technologies in Stationary Applications - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1679-2020 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for the Characterization and Evaluation of Energy Storage Technologies in Stationary Applications - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2020 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
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      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1679-2020 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9080673</url>
          <locator>standard_number=1679-2020; status=Active; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T22:00:00+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:00+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1679-2020**（IEEE Recommended Practice for the Characterization and Evaluation of Energy Storage Technologies in Stationary Applications - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2020 年，主题领域包括 Power, Energy and Industry Applications、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1679-2020-9080673-redline.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2020</year>
        <precision>year</precision>
        <display>2020年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <type>work</type>
      <title>IEEE Std 1679.3-2025</title>
      <slug>ieee-std-1679-3-2025-10763411</slug>
      <aliases>
        <alias>1679.3-2025</alias>
        <alias>1679.3-2025 - IEEE Draft Guide for the Characterization and Evaluation of Flow Batteries in Stationary Applications</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1679.3-2025 是电气电子工程师学会的草案，题为“IEEE Draft Guide for the Characterization and Evaluation of Flow Batteries in Stationary Applications”；公开目录标为非现行（Inactive），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1679.3-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10763411</url>
          <locator>standard_number=1679.3-2025; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <updatedAt>2026-11-01T22:00:00+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1679.3-2025**（IEEE Draft Guide for the Characterization and Evaluation of Flow Batteries in Stationary Applications）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2024 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1679-3-2025-10763411.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_167a_1_1995</id>
      <type>work</type>
      <title>IEEE Std 167A.1-1995</title>
      <slug>ieee-std-167a-1-1995</slug>
      <aliases>
        <alias>167A.1-1995</alias>
        <alias>167A.1-1995 - IEEE Standard Facsimile Test Chart: Bilevel (Black and White)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 167A.1-1995 是电气电子工程师学会的技术标准，题为“IEEE Standard Facsimile Test Chart: Bilevel (Black and White)”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1995 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 167A.1-1995 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4692</url>
          <locator>standard_number=167A.1-1995; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:00+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:00+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 167A.1-1995**（IEEE Standard Facsimile Test Chart: Bilevel (Black and White)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1995 年，主题领域包括 Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-167a-1-1995.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1995</year>
        <precision>year</precision>
        <display>1995年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_167a_2_1996</id>
      <type>work</type>
      <title>IEEE Std 167A.2-1996</title>
      <slug>ieee-std-167a-2-1996</slug>
      <aliases>
        <alias>167A.2-1996</alias>
        <alias>167A.2-1996 - IEEE Standard Facsimile Test Chart: High Contrast (Gray Scale)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 167A.2-1996 是电气电子工程师学会的技术标准，题为“IEEE Standard Facsimile Test Chart: High Contrast (Gray Scale)”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1997 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 167A.2-1996 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6118</url>
          <locator>standard_number=167A.2-1996; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:00+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:00+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 167A.2-1996**（IEEE Standard Facsimile Test Chart: High Contrast (Gray Scale)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1997 年，主题领域包括 Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-167a-2-1996.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1997</year>
        <precision>year</precision>
        <display>1997年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1680_2006</id>
      <type>work</type>
      <title>IEEE Std 1680-2006</title>
      <slug>ieee-std-1680-2006</slug>
      <aliases>
        <alias>1680-2006</alias>
        <alias>1680-2006 - IEEE Standard for Environmental Assessment of Personal Computer Products, including Laptop Personal Computers, Desktop Personal Computers, and Personal Computer Monitors</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1680-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard for Environmental Assessment of Personal Computer Products, including Laptop Personal Computers, Desktop Personal Computers, and Personal Computer Monitors”；公开目录标为已被替代（Superseded），著录年份为 2006 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1680-2006 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10876</url>
          <locator>standard_number=1680-2006; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:00+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:00+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1680-2006**（IEEE Standard for Environmental Assessment of Personal Computer Products, including Laptop Personal Computers, Desktop Personal Computers, and Personal Computer Monitors）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2006 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1680-2006.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2006</year>
        <precision>year</precision>
        <display>2006年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1680_2009_5429923</id>
      <type>work</type>
      <title>IEEE Std 1680-2009</title>
      <slug>ieee-std-1680-2009-5429923</slug>
      <aliases>
        <alias>1680-2009</alias>
        <alias>1680-2009 - IEEE Standard for Environmental Assessment of Electronic Products</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1680-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard for Environmental Assessment of Electronic Products”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1680-2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5429923</url>
          <locator>standard_number=1680-2009; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:00+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:00+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1680-2009**（IEEE Standard for Environmental Assessment of Electronic Products）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2010 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1680-2009-5429923.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_168_1956</id>
      <type>work</type>
      <title>IEEE Std 168-1956</title>
      <slug>ieee-std-168-1956</slug>
      <aliases>
        <alias>168-1956</alias>
        <alias>168-1956 - IEEE Standard Definitions of Terms on Facsimile</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 168-1956 是电气电子工程师学会的技术标准，题为“IEEE Standard Definitions of Terms on Facsimile”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1956 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 168-1956 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=2743</url>
          <locator>standard_number=168-1956; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:00+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:00+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 168-1956**（IEEE Standard Definitions of Terms on Facsimile）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1956 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-168-1956.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1956</year>
        <precision>year</precision>
        <display>1956年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1788_1_d9_9_jun_2017</id>
      <type>work</type>
      <title>IEEE Std P1788.1/D9.9, Jun 2017</title>
      <slug>ieee-std-p1788-1-d9-9-jun-2017</slug>
      <aliases>
        <alias>P1788.1/D9.9, Jun 2017</alias>
        <alias>P1788.1/D9.9, Jun 2017 - IEEE Approved Draft Standard for Interval Arithmetic (Simplified)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1788.1/D9.9, Jun 2017 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Interval Arithmetic (Simplified)”；公开目录标为非现行（Inactive），著录年份为 2017 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1788.1/D9.9, Jun 2017 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7987840</url>
          <locator>standard_number=P1788.1/D9.9, Jun 2017; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:00+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:00+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1788.1/D9.9, Jun 2017**（IEEE Approved Draft Standard for Interval Arithmetic (Simplified)）是[[organization_ieee|电气电子工程师学会]]于 2017 年 6 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1788-1-d9-9-jun-2017.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2017</year>
        <precision>year</precision>
        <display>2017年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1671_6_2008_4723925</id>
      <type>work</type>
      <title>IEEE Std 1671.6-2008</title>
      <slug>ieee-std-1671-6-2008-4723925</slug>
      <aliases>
        <alias>1671.6-2008</alias>
        <alias>1671.6-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671.6-2008 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information”；公开目录标为已被替代（Superseded），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1671.6-2008 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4723925</url>
          <locator>standard_number=1671.6-2008; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671.6-2008**（IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2013 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1671-6-2008-4723925.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1671_6_2008_6809828</id>
      <type>work</type>
      <title>IEEE Std 1671.6-2008</title>
      <slug>ieee-std-1671-6-2008-6809828</slug>
      <aliases>
        <alias>1671.6-2008</alias>
        <alias>1671.6-2008 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671.6-2008 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information”；公开目录标为已被替代（Superseded），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1671.6-2008 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6809828</url>
          <locator>standard_number=1671.6-2008; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671.6-2008**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2013 年，主题领域包括 Computing and Processing、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1671-6-2008-6809828.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1671_6_2015_7102653</id>
      <type>work</type>
      <title>IEEE Std 1671.6-2015</title>
      <slug>ieee-std-1671-6-2015-7102653</slug>
      <aliases>
        <alias>1671.6-2015</alias>
        <alias>1671.6-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671.6-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1671.6-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7102653</url>
          <locator>standard_number=1671.6-2015; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T21:59:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671.6-2015**（IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1671-6-2015-7102653.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
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        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1671_6_2015_7118619_redline</id>
      <type>work</type>
      <title>IEEE Std 1671.6-2015</title>
      <slug>ieee-std-1671-6-2015-7118619-redline</slug>
      <aliases>
        <alias>1671.6-2015</alias>
        <alias>1671.6-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671.6-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1671.6-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7118619</url>
          <locator>standard_number=1671.6-2015; status=Inactive; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671.6-2015**（IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1671-6-2015-7118619-redline.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1672_2006</id>
      <type>work</type>
      <title>IEEE Std 1672-2006</title>
      <slug>ieee-std-1672-2006</slug>
      <aliases>
        <alias>1672-2006</alias>
        <alias>1672-2006 - IEEE Standard for Ultrawideband Radar Definitions</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1672-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard for Ultrawideband Radar Definitions”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2007 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1672-2006 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4201974</url>
          <locator>standard_number=1672-2006; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1672-2006**（IEEE Standard for Ultrawideband Radar Definitions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2007 年，主题领域包括 Aerospace、Components, Circuits, Devices and Systems、Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1672-2006.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2007</year>
        <precision>year</precision>
        <display>2007年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <id>work_ieee_1672_2006_cor_1_2008</id>
      <type>work</type>
      <title>IEEE Std 1672-2006/Cor 1-2008</title>
      <slug>ieee-std-1672-2006-cor-1-2008</slug>
      <aliases>
        <alias>1672-2006/Cor 1-2008</alias>
        <alias>1672-2006/Cor 1-2008 - IEEE Standard for Ultrawideband Radar Definitions - Corrigendum 1</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1672-2006/Cor 1-2008 是电气电子工程师学会的技术标准，题为“IEEE Standard for Ultrawideband Radar Definitions - Corrigendum 1”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2008 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1672-2006/Cor 1-2008 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6264057</url>
          <locator>standard_number=1672-2006/Cor 1-2008; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1672-2006/Cor 1-2008**（IEEE Standard for Ultrawideband Radar Definitions - Corrigendum 1）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2008 年，主题领域包括 Aerospace、Fields, Waves and Electromagnetics、Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1672-2006-cor-1-2008.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2008</year>
        <precision>year</precision>
        <display>2008年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <id>work_ieee_1673_2015_7426673</id>
      <type>work</type>
      <title>IEEE Std 1673-2015</title>
      <slug>ieee-std-1673-2015-7426673</slug>
      <aliases>
        <alias>1673-2015</alias>
        <alias>1673-2015 - IEEE Standard for Requirements for Conduit and Cable Seals for Field Connected Wiring to Equipment in Petroleum and Chemical Industry Exposed to Pressures above Atmospheric (1.5 kPa, 0.22 </alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1673-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Requirements for Conduit and Cable Seals for Field Connected Wiring to Equipment in Petroleum and Chemical Industry Exposed to Pressures above Atmospheric (1.5 kPa, 0.22”；公开目录标为非现行（Inactive），已批准（Approved），著录年份为 2016 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1673-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7426673</url>
          <locator>standard_number=1673-2015; status=Inactive; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T21:59:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1673-2015**（IEEE Standard for Requirements for Conduit and Cable Seals for Field Connected Wiring to Equipment in Petroleum and Chemical Industry Exposed to Pressures above Atmospheric (1.5 kPa, 0.22）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已批准（Approved），著录年份为 2016 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1673-2015-7426673.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2016</year>
        <precision>year</precision>
        <display>2016年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1675_2008</id>
      <type>work</type>
      <title>IEEE Std 1675-2008</title>
      <slug>ieee-std-1675-2008</slug>
      <aliases>
        <alias>1675-2008</alias>
        <alias>1675-2008 - IEEE Standard for Broadband Over Powerline Hardware</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1675-2008 是电气电子工程师学会的技术标准，题为“IEEE Standard for Broadband Over Powerline Hardware”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2009 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1675-2008 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4747591</url>
          <locator>standard_number=1675-2008; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1675-2008**（IEEE Standard for Broadband Over Powerline Hardware）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2009 年，主题领域包括 Communication, Networking and Broadcast Technologies、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1675-2008.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2009</year>
        <precision>year</precision>
        <display>2009年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <id>work_ieee_1676_2010</id>
      <type>work</type>
      <title>IEEE Std 1676-2010</title>
      <slug>ieee-std-1676-2010</slug>
      <aliases>
        <alias>1676-2010</alias>
        <alias>1676-2010 - IEEE Guide for Control Architecture for High Power Electronics (1 MW and Greater) Used in Electric Power Transmission and Distribution Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1676-2010 是电气电子工程师学会的技术标准，题为“IEEE Guide for Control Architecture for High Power Electronics (1 MW and Greater) Used in Electric Power Transmission and Distribution Systems”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1676-2010 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5712776</url>
          <locator>standard_number=1676-2010; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1676-2010**（IEEE Guide for Control Architecture for High Power Electronics (1 MW and Greater) Used in Electric Power Transmission and Distribution Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Power, Energy and Industry Applications、Signal Processing and Analysis、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1676-2010.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2011</year>
        <precision>year</precision>
        <display>2011年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_1679_2010</id>
      <type>work</type>
      <title>IEEE Std 1679-2010</title>
      <slug>ieee-std-1679-2010</slug>
      <aliases>
        <alias>1679-2010</alias>
        <alias>1679-2010 - IEEE Recommended Practice for the Characterization and Evaluation of Emerging Energy Storage Technologies in Stationary Applications</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1679-2010 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for the Characterization and Evaluation of Emerging Energy Storage Technologies in Stationary Applications”；公开目录标为已被替代（Superseded），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1679-2010 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5618901</url>
          <locator>standard_number=1679-2010; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1679-2010**（IEEE Recommended Practice for the Characterization and Evaluation of Emerging Energy Storage Technologies in Stationary Applications）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2010 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1679-2010.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_167a_1975</id>
      <type>work</type>
      <title>IEEE Std 167A-1975</title>
      <slug>ieee-std-167a-1975</slug>
      <aliases>
        <alias>167A-1975</alias>
        <alias>167A-1975 - IEEE Facsimile Test Chart</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 167A-1975 是电气电子工程师学会的技术标准，题为“IEEE Facsimile Test Chart”；公开目录标为已被替代（Superseded），著录年份为 1974 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 167A-1975 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7368055</url>
          <locator>standard_number=167A-1975; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T21:59:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 167A-1975**（IEEE Facsimile Test Chart）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1974 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-167a-1975.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1974</year>
        <precision>year</precision>
        <display>1974年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_167a_1980</id>
      <type>work</type>
      <title>IEEE Std 167A-1980</title>
      <slug>ieee-std-167a-1980</slug>
      <aliases>
        <alias>167A-1980</alias>
        <alias>167A-1980 - IEEE Standard Facsimile Test Chart</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 167A-1980 是电气电子工程师学会的技术标准，题为“IEEE Standard Facsimile Test Chart”；公开目录标为已被替代（Superseded），著录年份为 1979 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 167A-1980 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7368856</url>
          <locator>standard_number=167A-1980; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 167A-1980**（IEEE Standard Facsimile Test Chart）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1979 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-167a-1980.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1979</year>
        <precision>year</precision>
        <display>1979年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <id>work_ieee_167a_1987</id>
      <type>work</type>
      <title>IEEE Std 167A-1987</title>
      <slug>ieee-std-167a-1987</slug>
      <aliases>
        <alias>167A-1987</alias>
        <alias>167A-1987 - IEEE Standard Facsimile Test Charts (Revised as 167A.1)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 167A-1987 是电气电子工程师学会的技术标准，题为“IEEE Standard Facsimile Test Charts (Revised as 167A.1)”；公开目录标为已被替代（Superseded），著录年份为 1987 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 167A-1987 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=2512</url>
          <locator>standard_number=167A-1987; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 167A-1987**（IEEE Standard Facsimile Test Charts (Revised as 167A.1)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1987 年，主题领域包括 Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-167a-1987.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1987</year>
        <precision>year</precision>
        <display>1987年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <id>work_ieee_p1786_d2_nov_2025</id>
      <type>work</type>
      <title>IEEE Std P1786/D2, Nov 2025</title>
      <slug>ieee-std-p1786-d2-nov-2025</slug>
      <aliases>
        <alias>P1786/D2, Nov 2025</alias>
        <alias>P1786/D2, Nov 2025 - IEEE Approved Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear F</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1786/D2, Nov 2025 是电气电子工程师学会的草案，题为“IEEE Approved Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear F”；公开目录标为非现行（Inactive），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1786/D2, Nov 2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11302985</url>
          <locator>standard_number=P1786/D2, Nov 2025; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:59+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:59+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1786/D2, Nov 2025**（IEEE Approved Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear F）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2026 年，主题领域包括 Computing and Processing、Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1786-d2-nov-2025.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
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      <id>work_ieee_p1786_d2_nov_2021</id>
      <type>work</type>
      <title>IEEE Std P1786/D2, Nov 2021</title>
      <slug>ieee-std-p1786-d2-nov-2021</slug>
      <aliases>
        <alias>P1786/D2, Nov 2021</alias>
        <alias>P1786/D2, Nov 2021 - IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1786/D2, Nov 2021 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities”；公开目录标为非现行（Inactive），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1786/D2, Nov 2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9620000</url>
          <locator>standard_number=P1786/D2, Nov 2021; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:58+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:58+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1786/D2, Nov 2021**（IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities）是[[organization_ieee|电气电子工程师学会]]于 2021 年 11 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Nuclear Engineering、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1786-d2-nov-2021.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <id>work_ieee_p1786_d11_apr_2011</id>
      <type>work</type>
      <title>IEEE Std P1786/D11, Apr 2011</title>
      <slug>ieee-std-p1786-d11-apr-2011</slug>
      <aliases>
        <alias>P1786/D11, Apr 2011</alias>
        <alias>P1786/D11, Apr 2011 - IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1786/D11, Apr 2011 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities”；公开目录标为非现行（Inactive），著录年份为 2011 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1786/D11, Apr 2011 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5764894</url>
          <locator>standard_number=P1786/D11, Apr 2011; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:57+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:57+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1786/D11, Apr 2011**（IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities）是[[organization_ieee|电气电子工程师学会]]于 2011 年 4 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1786-d11-apr-2011.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2011</year>
        <precision>year</precision>
        <display>2011年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_p1786</id>
      <type>work</type>
      <title>IEEE Std P1786</title>
      <slug>ieee-std-p1786</slug>
      <aliases>
        <alias>P1786</alias>
        <alias>P1786 - IEEE Draft Human Factors Guide for Applications of Computerized Operating Procedure Systems at Nuclear Power Generating Stations and Other Nuclear Facilities.</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1786 是电气电子工程师学会的草案，题为“IEEE Draft Human Factors Guide for Applications of Computerized Operating Procedure Systems at Nuclear Power Generating Stations and Other Nuclear Facilities.”；公开目录标为非现行（Inactive），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1786 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5601930</url>
          <locator>standard_number=P1786; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:56+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:56+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1786**（IEEE Draft Human Factors Guide for Applications of Computerized Operating Procedure Systems at Nuclear Power Generating Stations and Other Nuclear Facilities.）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2010 年，主题领域包括 Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1786.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1786_d1_sept_2025</id>
      <type>work</type>
      <title>IEEE Std P1786/D1, Sept 2025</title>
      <slug>ieee-std-p1786-d1-sept-2025</slug>
      <aliases>
        <alias>P1786/D1, Sept 2025</alias>
        <alias>P1786/D1, Sept 2025 - IEEE Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilitie</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1786/D1, Sept 2025 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilitie”；公开目录标为非现行（Inactive），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1786/D1, Sept 2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11170394</url>
          <locator>standard_number=P1786/D1, Sept 2025; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T21:59:56+08:00</updatedAt>
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      <body>**IEEE Std P1786/D1, Sept 2025**（IEEE Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilitie）是[[organization_ieee|电气电子工程师学会]]于 2025 年 9 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing、Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <title>IEEE Std P1785.3/D33, Sept. 2015</title>
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        <alias>P1785.3/D33, Sept. 2015</alias>
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      <summary>IEEE Std P1785.3/D33, Sept. 2015 是电气电子工程师学会的草案，题为“IEEE Approved Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performanc”；公开目录标为非现行（Inactive），著录年份为 2016 年。</summary>
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          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7471396</url>
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      <updatedAt>2026-11-01T21:59:55+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1785.3/D33, Sept. 2015**（IEEE Approved Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performanc）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2016 年，主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <updatedAt>2026-11-01T21:59:54+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1785.2/D2a, Jul 2015**（IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above-- Part 2: Waveguide Interfaces）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2016 年，主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6849920</url>
          <locator>standard_number=P1785.3/D31, Jun 2014; status=Inactive; modifier=Draft</locator>
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      <updatedAt>2026-11-01T21:59:54+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1785.3/D31, Jun 2014**（IEEE Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performance and Uncer）是[[organization_ieee|电气电子工程师学会]]于 2014 年 6 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <type>work</type>
      <title>IEEE Std P1785.1/D3, July 2012</title>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1785.1/D3, July 2012 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 1: Frequency Bands and Waveguide Dimensions”；公开目录标为非现行（Inactive），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
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      <tags>
        <tag>tag-ieee-standard</tag>
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          <locator>standard_number=P1785.1/D3, July 2012; status=Inactive; modifier=Draft</locator>
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      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1785.1/D3, July 2012**（IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 1: Frequency Bands and Waveguide Dimensions）是[[organization_ieee|电气电子工程师学会]]于 2012 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1785-1-d3-july-2012.html</url>
      <lang>fr</lang>
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      <title>IEEE Std P1785.1/D2, Oct 2025</title>
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      <summary>IEEE Std P1785.1/D2, Oct 2025 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions”；公开目录标为非现行（Inactive），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
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          <id>s1</id>
          <title>IEEE Std P1785.1/D2, Oct 2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11224739</url>
          <locator>standard_number=P1785.1/D2, Oct 2025; status=Inactive; modifier=Draft</locator>
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          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T21:59:52+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:52+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1785.1/D2, Oct 2025**（IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2026 年，主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <language>英语</language>
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      <summary>IEEE Std P1785.1/D1, Aug 2025 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions”；公开目录标为非现行（Inactive），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
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      <tags>
        <tag>tag-ieee-standard</tag>
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          <id>s1</id>
          <title>IEEE Std P1785.1/D1, Aug 2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
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          <locator>standard_number=P1785.1/D1, Aug 2025; status=Inactive; modifier=Draft</locator>
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          <author>IEEE</author>
          <date>2026-11-01</date>
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      <createdAt>2026-11-01T21:59:51+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:51+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1785.1/D1, Aug 2025**（IEEE Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions）是[[organization_ieee|电气电子工程师学会]]于 2025 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1785-1-d1-aug-2025.html</url>
      <lang>fr</lang>
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      <language>英语</language>
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      <summary>IEEE Std P1783/D2.1 Dec 2008 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions”；公开目录标为非现行（Inactive），著录年份为 2008 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
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      <tags>
        <tag>tag-ieee-standard</tag>
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      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1783/D2.1 Dec 2008 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4749829</url>
          <locator>standard_number=P1783/D2.1 Dec 2008; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T21:59:50+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:50+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1783/D2.1 Dec 2008**（IEEE Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions）是[[organization_ieee|电气电子工程师学会]]于 2008 年 12 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1783-d2-1-dec-2008.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2008</year>
        <precision>year</precision>
        <display>2008年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <perspectives></perspectives>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_p1783_d3_apr_2009</id>
      <type>work</type>
      <title>IEEE Std P1783/D3, Apr 2009</title>
      <slug>ieee-std-p1783-d3-apr-2009</slug>
      <aliases>
        <alias>P1783/D3, Apr 2009</alias>
        <alias>P1783/D3, Apr 2009 - Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1783/D3, Apr 2009 是电气电子工程师学会的草案，题为“Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions”；公开目录标为非现行（Inactive），著录年份为 2009 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1783/D3, Apr 2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4977262</url>
          <locator>standard_number=P1783/D3, Apr 2009; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:50+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:50+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1783/D3, Apr 2009**（Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions）是[[organization_ieee|电气电子工程师学会]]于 2009 年 4 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1783-d3-apr-2009.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2009</year>
        <precision>year</precision>
        <display>2009年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p1782_d5_july_2013</id>
      <type>work</type>
      <title>IEEE Std P1782/D5, July 2013</title>
      <slug>ieee-std-p1782-d5-july-2013</slug>
      <aliases>
        <alias>P1782/D5, July 2013</alias>
        <alias>P1782/D5, July 2013 - IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1782/D5, July 2013 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events”；公开目录标为非现行（Inactive），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1782/D5, July 2013 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6557400</url>
          <locator>standard_number=P1782/D5, July 2013; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:49+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:49+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1782/D5, July 2013**（IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]于 2013 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1782-d5-july-2013.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <perspectives></perspectives>
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      <id>work_ieee_p1782_d4_nov_2012</id>
      <type>work</type>
      <title>IEEE Std P1782/D4, Nov 2012</title>
      <slug>ieee-std-p1782-d4-nov-2012</slug>
      <aliases>
        <alias>P1782/D4, Nov 2012</alias>
        <alias>P1782/D4, Nov 2012 - IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1782/D4, Nov 2012 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events”；公开目录标为非现行（Inactive），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1782/D4, Nov 2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6357339</url>
          <locator>standard_number=P1782/D4, Nov 2012; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:48+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:48+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1782/D4, Nov 2012**（IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]于 2012 年 11 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1782-d4-nov-2012.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_p1782_d1_jan_2022</id>
      <type>work</type>
      <title>IEEE Std P1782/D1, Jan 2022</title>
      <slug>ieee-std-p1782-d1-jan-2022</slug>
      <aliases>
        <alias>P1782/D1, Jan 2022</alias>
        <alias>P1782/D1, Jan 2022 - IEEE Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1782/D1, Jan 2022 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events”；公开目录标为非现行（Inactive），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1782/D1, Jan 2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9698146</url>
          <locator>standard_number=P1782/D1, Jan 2022; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:47+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:47+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1782/D1, Jan 2022**（IEEE Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]于 2022 年 1 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1782-d1-jan-2022.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_p1780_d30_oct_2021</id>
      <type>work</type>
      <title>IEEE Std P1780/D30, Oct 2021</title>
      <slug>ieee-std-p1780-d30-oct-2021</slug>
      <aliases>
        <alias>P1780/D30, Oct 2021</alias>
        <alias>P1780/D30, Oct 2021 - IEEE Aproved Draft Standard for the Specification of Inertial Measurement Units (IMU)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1780/D30, Oct 2021 是电气电子工程师学会的草案，题为“IEEE Aproved Draft Standard for the Specification of Inertial Measurement Units (IMU)”；公开目录标为非现行（Inactive），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1780/D30, Oct 2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9715056</url>
          <locator>standard_number=P1780/D30, Oct 2021; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:46+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:46+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1780/D30, Oct 2021**（IEEE Aproved Draft Standard for the Specification of Inertial Measurement Units (IMU)）是[[organization_ieee|电气电子工程师学会]]于 2021 年 10 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1780-d30-oct-2021.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <id>work_ieee_p1782_d002_mar_2022</id>
      <type>work</type>
      <title>IEEE Std P1782/D002, Mar 2022</title>
      <slug>ieee-std-p1782-d002-mar-2022</slug>
      <aliases>
        <alias>P1782/D002, Mar 2022</alias>
        <alias>P1782/D002, Mar 2022 - IEEE Approved Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1782/D002, Mar 2022 是电气电子工程师学会的草案，题为“IEEE Approved Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events”；公开目录标为非现行（Inactive），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1782/D002, Mar 2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9732938</url>
          <locator>standard_number=P1782/D002, Mar 2022; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:46+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:46+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1782/D002, Mar 2022**（IEEE Approved Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]于 2022 年 3 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1782-d002-mar-2022.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingEntries></rankingEntries>
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      <type>work</type>
      <title>IEEE Std 1667-2018</title>
      <slug>ieee-std-1667-2018-8575226-redline</slug>
      <aliases>
        <alias>1667-2018</alias>
        <alias>1667-2018 - IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1667-2018 是电气电子工程师学会的技术标准，题为“IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2018 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1667-2018 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8575226</url>
          <locator>standard_number=1667-2018; status=Active; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:45+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1667-2018**（IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2018 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1667-2018-8575226-redline.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2018</year>
        <precision>year</precision>
        <display>2018年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <id>work_ieee_1668_2014</id>
      <type>work</type>
      <title>IEEE Std 1668-2014</title>
      <slug>ieee-std-1668-2014</slug>
      <aliases>
        <alias>1668-2014</alias>
        <alias>1668-2014 - IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1668-2014 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V”；公开目录标为已被替代（Superseded），著录年份为 2014 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1668-2014 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6895234</url>
          <locator>standard_number=1668-2014; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:45+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1668-2014**（IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2014 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1668-2014.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2014</year>
        <precision>year</precision>
        <display>2014年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1668_2017_8365161_redline</id>
      <type>work</type>
      <title>IEEE Std 1668-2017</title>
      <slug>ieee-std-1668-2017-8365161-redline</slug>
      <aliases>
        <alias>1668-2017</alias>
        <alias>1668-2017 - IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1668-2017 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2017 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1668-2017 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8365161</url>
          <locator>standard_number=1668-2017; status=Active; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T21:59:45+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1668-2017**（IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2017 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1668-2017-8365161-redline.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2017</year>
        <precision>year</precision>
        <display>2017年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1671_1_2009_5353115</id>
      <type>work</type>
      <title>IEEE Std 1671.1-2009</title>
      <slug>ieee-std-1671-1-2009-5353115</slug>
      <aliases>
        <alias>1671.1-2009</alias>
        <alias>1671.1-2009 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671.1-2009 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions”；公开目录标为已被替代（Superseded），著录年份为 2009 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1671.1-2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5353115</url>
          <locator>standard_number=1671.1-2009; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:45+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671.1-2009**（IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2009 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1671-1-2009-5353115.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2009</year>
        <precision>year</precision>
        <display>2009年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_1671_1_2009_6781519</id>
      <type>work</type>
      <title>IEEE Std 1671.1-2009</title>
      <slug>ieee-std-1671-1-2009-6781519</slug>
      <aliases>
        <alias>1671.1-2009</alias>
        <alias>1671.1-2009 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671.1-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions”；公开目录标为已被替代（Superseded），著录年份为 2009 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1671.1-2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6781519</url>
          <locator>standard_number=1671.1-2009; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:45+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671.1-2009**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2009 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1671-1-2009-6781519.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2009</year>
        <precision>year</precision>
        <display>2009年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
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      <id>work_ieee_1671_2006_4035723</id>
      <type>work</type>
      <title>IEEE Std 1671-2006</title>
      <slug>ieee-std-1671-2006-4035723</slug>
      <aliases>
        <alias>1671-2006</alias>
        <alias>1671-2006 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information Via XML</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671-2006 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information Via XML”；公开目录标为已被替代（Superseded），著录年份为 2006 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1671-2006 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4035723</url>
          <locator>standard_number=1671-2006; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:45+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671-2006**（IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information Via XML）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2006 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1671-2006-4035723.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2006</year>
        <precision>year</precision>
        <display>2006年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
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      <id>work_ieee_1671_2006_5250285</id>
      <type>work</type>
      <title>IEEE Std 1671-2006</title>
      <slug>ieee-std-1671-2006-5250285</slug>
      <aliases>
        <alias>1671-2006</alias>
        <alias>1671-2006 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML”；公开目录标为已被替代（Superseded），著录年份为 2009 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1671-2006 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5250285</url>
          <locator>standard_number=1671-2006; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:45+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671-2006**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2009 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1671-2006-5250285.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2009</year>
        <precision>year</precision>
        <display>2009年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
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      <id>work_ieee_1671_2010</id>
      <type>work</type>
      <title>IEEE Std 1671-2010</title>
      <slug>ieee-std-1671-2010</slug>
      <aliases>
        <alias>1671-2010</alias>
        <alias>1671-2010 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671-2010 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1671-2010 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5706288</url>
          <locator>standard_number=1671-2010; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:45+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671-2010**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1671-2010.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2011</year>
        <precision>year</precision>
        <display>2011年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <id>work_ieee_1671_2_2008</id>
      <type>work</type>
      <title>IEEE Std 1671.2-2008</title>
      <slug>ieee-std-1671-2-2008</slug>
      <aliases>
        <alias>1671.2-2008</alias>
        <alias>1671.2-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671.2-2008 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions”；公开目录标为已被替代（Superseded），著录年份为 2008 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1671.2-2008 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4723949</url>
          <locator>standard_number=1671.2-2008; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:45+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671.2-2008**（IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1671-2-2008.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2008</year>
        <precision>year</precision>
        <display>2008年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_1671_2_2012_6461895</id>
      <type>work</type>
      <title>IEEE Std 1671.2-2012</title>
      <slug>ieee-std-1671-2-2012-6461895</slug>
      <aliases>
        <alias>1671.2-2012</alias>
        <alias>1671.2-2012 - IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671.2-2012 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1671.2-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6461895</url>
          <locator>standard_number=1671.2-2012; status=Inactive; modifier=Reserved</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671.2-2012**（IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2013 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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        <display>2013年</display>
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      <language>英语</language>
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      <title>IEEE Std 1671.2-2012</title>
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        <alias>1671.2-2012 - IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline</alias>
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      <summary>IEEE Std 1671.2-2012 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2013 年。</summary>
      <status>published</status>
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        <category>category-science-technology</category>
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          <id>s1</id>
          <title>IEEE Std 1671.2-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6522436</url>
          <locator>standard_number=1671.2-2012; status=Inactive; modifier=Redline</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671.2-2012**（IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2013 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <title>IEEE Std 1671.2/D15, Sep 2012</title>
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      <summary>IEEE Std 1671.2/D15, Sep 2012 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Instrument Description”；公开目录标为非现行（Inactive），著录年份为 2012 年。</summary>
      <status>published</status>
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          <id>s1</id>
          <title>IEEE Std 1671.2/D15, Sep 2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6376069</url>
          <locator>standard_number=1671.2/D15, Sep 2012; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671.2/D15, Sep 2012**（IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Instrument Description）是[[organization_ieee|电气电子工程师学会]]于 2012 年 9 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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        <precision>year</precision>
        <display>2012年</display>
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      <language>英语</language>
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      <id>work_ieee_1671_3_2007</id>
      <type>work</type>
      <title>IEEE Std 1671.3-2007</title>
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        <alias>1671.3-2007</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671.3-2007 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Infor”；公开目录标为已被替代（Superseded），著录年份为 2008 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
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      <tags>
        <tag>tag-ieee-standard</tag>
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        <source>
          <id>s1</id>
          <title>IEEE Std 1671.3-2007 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4479536</url>
          <locator>standard_number=1671.3-2007; status=Superseded; modifier=</locator>
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        <source>
          <id>s2</id>
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          <author>IEEE</author>
          <date>2026-11-01</date>
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      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671.3-2007**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Infor）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <published>
        <year>2008</year>
        <precision>year</precision>
        <display>2008年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <type>work</type>
      <title>IEEE Std 1671.4-2007</title>
      <slug>ieee-std-1671-4-2007</slug>
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        <alias>1671.4-2007</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671.4-2007 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information”；公开目录标为已被替代（Superseded），著录年份为 2008 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
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      <tags>
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          <id>s1</id>
          <title>IEEE Std 1671.4-2007 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4509492</url>
          <locator>standard_number=1671.4-2007; status=Superseded; modifier=</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T21:59:45+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671.4-2007**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1671-4-2007.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2008</year>
        <precision>year</precision>
        <display>2008年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1671_4_2014</id>
      <type>work</type>
      <title>IEEE Std 1671.4-2014</title>
      <slug>ieee-std-1671-4-2014</slug>
      <aliases>
        <alias>1671.4-2014</alias>
        <alias>1671.4-2014 - IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671.4-2014 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2014 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
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        <source>
          <id>s1</id>
          <title>IEEE Std 1671.4-2014 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6808400</url>
          <locator>standard_number=1671.4-2014; status=Inactive; modifier=Reserved</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T21:59:45+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671.4-2014**（IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2014 年，主题领域包括 Computing and Processing、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1671-4-2014.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2014</year>
        <precision>year</precision>
        <display>2014年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1671_5_2008_4733021</id>
      <type>work</type>
      <title>IEEE Std 1671.5-2008</title>
      <slug>ieee-std-1671-5-2008-4733021</slug>
      <aliases>
        <alias>1671.5-2008</alias>
        <alias>1671.5-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671.5-2008 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information”；公开目录标为已被替代（Superseded），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1671.5-2008 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4733021</url>
          <locator>standard_number=1671.5-2008; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T21:59:45+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671.5-2008**（IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2012 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1671-5-2008-4733021.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
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        <precision>year</precision>
        <display>2012年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1671_5_2008_6781501</id>
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      <title>IEEE Std 1671.5-2008</title>
      <slug>ieee-std-1671-5-2008-6781501</slug>
      <aliases>
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        <alias>1671.5-2008 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671.5-2008 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information”；公开目录标为已被替代（Superseded），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
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          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6781501</url>
          <locator>standard_number=1671.5-2008; status=Superseded; modifier=</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T21:59:45+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671.5-2008**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2012 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1671-5-2008-6781501.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <type>work</type>
      <title>IEEE Std 1671.5-2015</title>
      <slug>ieee-std-1671-5-2015-7102656</slug>
      <aliases>
        <alias>1671.5-2015</alias>
        <alias>1671.5-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671.5-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1671.5-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7102656</url>
          <locator>standard_number=1671.5-2015; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T21:59:45+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671.5-2015**（IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1671-5-2015-7102656.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1671_5_2015_7166296_redline</id>
      <type>work</type>
      <title>IEEE Std 1671.5-2015</title>
      <slug>ieee-std-1671-5-2015-7166296-redline</slug>
      <aliases>
        <alias>1671.5-2015</alias>
        <alias>1671.5-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1671.5-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1671.5-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7166296</url>
          <locator>standard_number=1671.5-2015; status=Inactive; modifier=Redline</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T21:59:45+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1671.5-2015**（IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1671-5-2015-7166296-redline.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <id>work_ieee_167_1966</id>
      <type>work</type>
      <title>IEEE Std 167-1966</title>
      <slug>ieee-std-167-1966</slug>
      <aliases>
        <alias>167-1966</alias>
        <alias>167-1966 - IEEE Test Procedure for Facsimile</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 167-1966 是电气电子工程师学会的技术标准，题为“IEEE Test Procedure for Facsimile”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1966 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 167-1966 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7368070</url>
          <locator>standard_number=167-1966; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:45+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 167-1966**（IEEE Test Procedure for Facsimile）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1966 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-167-1966.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1966</year>
        <precision>year</precision>
        <display>1966年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <id>work_ieee_p1780_d29_oct_2020</id>
      <type>work</type>
      <title>IEEE Std P1780/D29, Oct 2020</title>
      <slug>ieee-std-p1780-d29-oct-2020</slug>
      <aliases>
        <alias>P1780/D29, Oct 2020</alias>
        <alias>P1780/D29, Oct 2020 - IEEE Draft Standard for the Specification of Inertial Measurement Units (IMU)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1780/D29, Oct 2020 是电气电子工程师学会的草案，题为“IEEE Draft Standard for the Specification of Inertial Measurement Units (IMU)”；公开目录标为非现行（Inactive），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1780/D29, Oct 2020 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9369228</url>
          <locator>standard_number=P1780/D29, Oct 2020; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:45+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1780/D29, Oct 2020**（IEEE Draft Standard for the Specification of Inertial Measurement Units (IMU)）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2021 年，主题领域包括 Aerospace、Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1780-d29-oct-2020.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1776_d08_dec_2007</id>
      <type>work</type>
      <title>IEEE Std P1776_D08, Dec 2007</title>
      <slug>ieee-std-p1776-d08-dec-2007</slug>
      <aliases>
        <alias>P1776_D08, Dec 2007</alias>
        <alias>P1776_D08, Dec 2007 - IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1776_D08, Dec 2007 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach”；公开目录标为非现行（Inactive），著录年份为 2007 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1776_D08, Dec 2007 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4447422</url>
          <locator>standard_number=P1776_D08, Dec 2007; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:44+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:44+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1776_D08, Dec 2007**（IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach）是[[organization_ieee|电气电子工程师学会]]于 2007 年 12 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1776-d08-dec-2007.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2007</year>
        <precision>year</precision>
        <display>2007年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1776_d12_jun_2008</id>
      <type>work</type>
      <title>IEEE Std P1776/D12, Jun 2008</title>
      <slug>ieee-std-p1776-d12-jun-2008</slug>
      <aliases>
        <alias>P1776/D12, Jun 2008</alias>
        <alias>P1776/D12, Jun 2008 - IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1776/D12, Jun 2008 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach”；公开目录标为非现行（Inactive），著录年份为 2008 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1776/D12, Jun 2008 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4588269</url>
          <locator>standard_number=P1776/D12, Jun 2008; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:43+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:43+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1776/D12, Jun 2008**（IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach）是[[organization_ieee|电气电子工程师学会]]于 2008 年 6 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1776-d12-jun-2008.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2008</year>
        <precision>year</precision>
        <display>2008年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1776_d9b_feb_2008</id>
      <type>work</type>
      <title>IEEE Std P1776/D9b, Feb. 2008</title>
      <slug>ieee-std-p1776-d9b-feb-2008</slug>
      <aliases>
        <alias>P1776/D9b, Feb. 2008</alias>
        <alias>P1776/D9b, Feb. 2008 - IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for AC Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mac</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1776/D9b, Feb. 2008 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for AC Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mac”；公开目录标为非现行（Inactive），著录年份为 2008 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1776/D9b, Feb. 2008 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4489719</url>
          <locator>standard_number=P1776/D9b, Feb. 2008; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:43+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:43+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1776/D9b, Feb. 2008**（IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for AC Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mac）是[[organization_ieee|电气电子工程师学会]]于 2008 年 2 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1776-d9b-feb-2008.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2008</year>
        <precision>year</precision>
        <display>2008年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_p1775_d1_9_8_dec_2009</id>
      <type>work</type>
      <title>IEEE Std P1775/D1.9.8, Dec 2009</title>
      <slug>ieee-std-p1775-d1-9-8-dec-2009</slug>
      <aliases>
        <alias>P1775/D1.9.8, Dec 2009</alias>
        <alias>P1775/D1.9.8, Dec 2009 - IEEE Draft Standard for Powerline Communication Equipment -- Electromagnetic Compatibility (EMC) Requirements -- Testing and Measurements Methods</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1775/D1.9.8, Dec 2009 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Powerline Communication Equipment -- Electromagnetic Compatibility (EMC) Requirements -- Testing and Measurements Methods”；公开目录标为非现行（Inactive），著录年份为 2009 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1775/D1.9.8, Dec 2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5385202</url>
          <locator>standard_number=P1775/D1.9.8, Dec 2009; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:42+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:42+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1775/D1.9.8, Dec 2009**（IEEE Draft Standard for Powerline Communication Equipment -- Electromagnetic Compatibility (EMC) Requirements -- Testing and Measurements Methods）是[[organization_ieee|电气电子工程师学会]]于 2009 年 12 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1775-d1-9-8-dec-2009.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
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      <published>
        <year>2009</year>
        <precision>year</precision>
        <display>2009年</display>
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      <language>英语</language>
      <creators></creators>
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      <id>work_ieee_p1775_1_9_7_mar_2009</id>
      <type>work</type>
      <title>IEEE Std P1775/1.9.7, Mar 2009</title>
      <slug>ieee-std-p1775-1-9-7-mar-2009</slug>
      <aliases>
        <alias>P1775/1.9.7, Mar 2009</alias>
        <alias>P1775/1.9.7, Mar 2009 - IEEE Draft Standard for Powerline Communication Equipment - Electromagnetic Compatibility (EMC) Requirements - Testing and Measurements Methods</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1775/1.9.7, Mar 2009 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Powerline Communication Equipment - Electromagnetic Compatibility (EMC) Requirements - Testing and Measurements Methods”；公开目录标为非现行（Inactive），著录年份为 2009 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1775/1.9.7, Mar 2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4810943</url>
          <locator>standard_number=P1775/1.9.7, Mar 2009; status=Inactive; modifier=Draft</locator>
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          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T21:59:41+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:41+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1775/1.9.7, Mar 2009**（IEEE Draft Standard for Powerline Communication Equipment - Electromagnetic Compatibility (EMC) Requirements - Testing and Measurements Methods）是[[organization_ieee|电气电子工程师学会]]于 2009 年 3 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1775-1-9-7-mar-2009.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
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        <lang>zh</lang>
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      <occupations></occupations>
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      <published>
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        <precision>year</precision>
        <display>2009年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1667_2006</id>
      <type>work</type>
      <title>IEEE Std 1667-2006</title>
      <slug>ieee-std-1667-2006</slug>
      <aliases>
        <alias>1667-2006</alias>
        <alias>1667-2006 - IEEE Standard Protocol for Authentication in Host Attachments of Transient Storage Devices</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1667-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard Protocol for Authentication in Host Attachments of Transient Storage Devices”；公开目录标为已被替代（Superseded），著录年份为 2007 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1667-2006 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4233253</url>
          <locator>standard_number=1667-2006; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T21:59:33+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:33+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1667-2006**（IEEE Standard Protocol for Authentication in Host Attachments of Transient Storage Devices）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2007 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1667-2006.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2007</year>
        <precision>year</precision>
        <display>2007年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <perspectives></perspectives>
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      <id>work_ieee_1667_2009_5438721</id>
      <type>work</type>
      <title>IEEE Std 1667-2009</title>
      <slug>ieee-std-1667-2009-5438721</slug>
      <aliases>
        <alias>1667-2009</alias>
        <alias>1667-2009 - IEEE Standard for Authentication in Host Attachments of Transient Storage Devices</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1667-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard for Authentication in Host Attachments of Transient Storage Devices”；公开目录标为已被替代（Superseded），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1667-2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5438721</url>
          <locator>standard_number=1667-2009; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T21:59:33+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:33+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1667-2009**（IEEE Standard for Authentication in Host Attachments of Transient Storage Devices）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2010 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1667-2009-5438721.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <id>work_ieee_1667_2009_5953415_redline</id>
      <type>work</type>
      <title>IEEE Std 1667-2009</title>
      <slug>ieee-std-1667-2009-5953415-redline</slug>
      <aliases>
        <alias>1667-2009</alias>
        <alias>1667-2009 - IEEE Standard for Authentication in Host Attachments of Transient Storage Devices - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1667-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard for Authentication in Host Attachments of Transient Storage Devices - Redline”；公开目录标为已被替代（Superseded），红线对照（Redline），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1667-2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5953415</url>
          <locator>standard_number=1667-2009; status=Superseded; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T21:59:33+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:33+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1667-2009**（IEEE Standard for Authentication in Host Attachments of Transient Storage Devices - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），红线对照（Redline），著录年份为 2010 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1667-2009-5953415-redline.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1667_2015_7389947</id>
      <type>work</type>
      <title>IEEE Std 1667-2015</title>
      <slug>ieee-std-1667-2015-7389947</slug>
      <aliases>
        <alias>1667-2015</alias>
        <alias>1667-2015 - IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1667-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices”；公开目录标为已被替代（Superseded），著录年份为 2016 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1667-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7389947</url>
          <locator>standard_number=1667-2015; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:33+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:33+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1667-2015**（IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2016 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1667-2015-7389947.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2016</year>
        <precision>year</precision>
        <display>2016年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <perspectives></perspectives>
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      <id>work_ieee_1667_2015_7544434_redline</id>
      <type>work</type>
      <title>IEEE Std 1667-2015</title>
      <slug>ieee-std-1667-2015-7544434-redline</slug>
      <aliases>
        <alias>1667-2015</alias>
        <alias>1667-2015 - IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1667-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline”；公开目录标为已被替代（Superseded），红线对照（Redline），著录年份为 2016 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1667-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7544434</url>
          <locator>standard_number=1667-2015; status=Superseded; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T21:59:33+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:33+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1667-2015**（IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），红线对照（Redline），著录年份为 2016 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1667-2015-7544434-redline.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2016</year>
        <precision>year</precision>
        <display>2016年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <perspectives></perspectives>
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      <id>work_ieee_1657_2009</id>
      <type>work</type>
      <title>IEEE Std 1657-2009</title>
      <slug>ieee-std-1657-2009</slug>
      <aliases>
        <alias>1657-2009</alias>
        <alias>1657-2009 - IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1657-2009 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries”；公开目录标为已被替代（Superseded），著录年份为 2009 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1657-2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5357368</url>
          <locator>standard_number=1657-2009; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:32+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:32+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1657-2009**（IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2009 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1657-2009.html</url>
      <lang>fr</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2009</year>
        <precision>year</precision>
        <display>2009年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <id>work_ieee_1657_2018_8697214_redline</id>
      <type>work</type>
      <title>IEEE Std 1657-2018</title>
      <slug>ieee-std-1657-2018-8697214-redline</slug>
      <aliases>
        <alias>1657-2018</alias>
        <alias>1657-2018 - IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1657-2018 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2018 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1657-2018 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8697214</url>
          <locator>standard_number=1657-2018; status=Active; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:59:32+08:00</createdAt>
      <updatedAt>2026-11-01T21:59:32+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1657-2018**（IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2018 年，主题领域包括 Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <body>**IEEE Std 1660-2008**（IEEE Guide for Application and Management of Stationary Batteries Used in Cycling Service）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <body>**IEEE Std 1661-2007**（IEEE Guide for Test and Evaluation of Lead-Acid Batteries Used in Photovoltaic (PV) Hybrid Power Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <body>**IEEE Std 1661-2019**（IEEE Guide for Test and Evaluation of Lead-Acid Batteries Used in Photovoltaic (PV) Hybrid Power Systems - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2019 年，主题领域包括 Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas、Photonics and Electrooptics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <body>**IEEE Std 1662-2008**（IEEE Guide for the Design and Application of Power Electronics in Electrical Power Systems on Ships）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2009 年，主题领域包括 Power, Energy and Industry Applications、Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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