<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>电气电子工程师学会 · Relations</title>
  <description>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</description>
  <url>/fr/organizations/ieee/relation-117.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>organization_ieee</id>
    <type>organization</type>
    <title>电气电子工程师学会</title>
    <slug>ieee</slug>
    <aliases>
      <alias>IEEE</alias>
      <alias>Institute of Electrical and Electronics Engineers</alias>
      <alias>电气和电子工程师协会</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
      <tag>tag-publishing</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
        <locator>2026-11-01 访问</locator>
      </source>
      <source>
        <id>s2</id>
        <title>IEEE 官方网站</title>
        <author>IEEE</author>
        <url>https://www.ieee.org/</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:52+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:52+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**电气电子工程师学会**（Institute of Electrical and Electronics Engineers，简称 IEEE）是1963年1月1日由美国电气工程师学会（AIEE）与无线电工程师学会（IRE）合并成立的专业技术协会，面向电气工程、电子工程及相关学科[^s1]。&#xA;&#xA;## 沿革&#xA;&#xA;该会可追溯至1884年成立的 AIEE；1912年另成立 IRE。两会于1963年合并为 IEEE[^s1]。总会设在纽约，1975年起主要业务在新泽西州皮斯卡特维的运营中心开展[^s1]。&#xA;&#xA;## 职能与业务&#xA;&#xA;IEEE 发布同行评议期刊与会议录，并通过标准化委员会制定技术标准；相关内容可在 IEEE Xplore 平台检索[^s1][^s3]。标准公开目录（KBART）列出标准编号、题名、状态与题录链接等元数据[^s3]。&#xA;&#xA;## 现状&#xA;&#xA;据公开介绍，该会为美国 501(c)(3) 公益性专业协会，全球会员逾48.6万[^s1]。官网为 https://www.ieee.org/ [^s2]。</body>
    <url>/organizations/ieee.html</url>
    <lang>fr</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <orgKind>专业协会</orgKind>
    <founded>
      <year>1963</year>
      <month>1</month>
      <day>1</day>
      <precision>day</precision>
      <display>1963年1月1日</display>
    </founded>
    <orgStatus>active</orgStatus>
    <headquartersNote>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</headquartersNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_e4e6ceb51ca0fef2a6e22f2d</id>
      <fromId>work_ieee_455_1985</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_455_1985</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_455_1985</targetId>
      <targetTitle>IEEE Std 455-1985</targetTitle>
      <targetUrl>/fr/works/ieee-std-455-1985.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_321c38e3ea173b10fb70b3af</id>
      <fromId>work_ieee_457_1982</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_457_1982</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_457_1982</targetId>
      <targetTitle>IEEE Std 457-1982</targetTitle>
      <targetUrl>/fr/works/ieee-std-457-1982.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9370e929f923170856b6be18</id>
      <fromId>work_ieee_46_1927</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_46_1927</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_46_1927</targetId>
      <targetTitle>IEEE Std 46-1927</targetTitle>
      <targetUrl>/fr/works/ieee-std-46-1927.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8e11d5215a676f3316756f55</id>
      <fromId>work_ieee_460_1988</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_460_1988</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_460_1988</targetId>
      <targetTitle>IEEE Std 460-1988</targetTitle>
      <targetUrl>/fr/works/ieee-std-460-1988.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_db65e26ae580dbe28c4ef974</id>
      <fromId>work_ieee_463_1974</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_463_1974</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_463_1974</targetId>
      <targetTitle>IEEE Std 463-1974</targetTitle>
      <targetUrl>/fr/works/ieee-std-463-1974.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_53e994b3e2e02faf97b9b076</id>
      <fromId>work_ieee_463_1977</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_463_1977</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_463_1977</targetId>
      <targetTitle>IEEE Std 463-1977</targetTitle>
      <targetUrl>/fr/works/ieee-std-463-1977.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_968171396e9e1bbefae0e695</id>
      <fromId>work_ieee_463_1993</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_463_1993</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_463_1993</targetId>
      <targetTitle>IEEE Std 463-1993</targetTitle>
      <targetUrl>/fr/works/ieee-std-463-1993.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a8b7fb1ff6b7feb5a504fe70</id>
      <fromId>work_ieee_463_2006</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_463_2006</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_463_2006</targetId>
      <targetTitle>IEEE Std 463-2006</targetTitle>
      <targetUrl>/fr/works/ieee-std-463-2006.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9b41093e584bbb8108f3c616</id>
      <fromId>work_ieee_463_2013_6619397</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_463_2013_6619397</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_463_2013_6619397</targetId>
      <targetTitle>IEEE Std 463-2013</targetTitle>
      <targetUrl>/fr/works/ieee-std-463-2013-6619397.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_274f4319973d7268512b1e04</id>
      <fromId>work_ieee_463_2013_6658814_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_463_2013_6658814_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_463_2013_6658814_redline</targetId>
      <targetTitle>IEEE Std 463-2013</targetTitle>
      <targetUrl>/fr/works/ieee-std-463-2013-6658814-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bf58c7b3998e0834ce014121</id>
      <fromId>work_ieee_463_2019_8906262_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_463_2019_8906262_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_463_2019_8906262_redline</targetId>
      <targetTitle>IEEE Std 463-2019</targetTitle>
      <targetUrl>/fr/works/ieee-std-463-2019-8906262-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_76d9bcd0a08fa6ff1eac106e</id>
      <fromId>work_ieee_464_1981</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_464_1981</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_464_1981</targetId>
      <targetTitle>IEEE Std 464-1981</targetTitle>
      <targetUrl>/fr/works/ieee-std-464-1981.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a03b5b359fb8aa1eb56742c1</id>
      <fromId>work_ieee_465_1_1977</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_465_1_1977</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_465_1_1977</targetId>
      <targetTitle>IEEE Std 465.1-1977</targetTitle>
      <targetUrl>/fr/works/ieee-std-465-1-1977.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c77c36a0e87d2a42f193c29d</id>
      <fromId>work_ieee_467_1980</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_467_1980</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_467_1980</targetId>
      <targetTitle>IEEE Std 467-1980</targetTitle>
      <targetUrl>/fr/works/ieee-std-467-1980.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ea75be17e75b7929980ce903</id>
      <fromId>work_ieee_p1929_1_d1_oct_2024</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1929_1_d1_oct_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1929_1_d1_oct_2024</targetId>
      <targetTitle>IEEE Std P1929.1/D1, Oct 2024</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1929-1-d1-oct-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9f73595803e666306a20901a</id>
      <fromId>work_ieee_p1929_1_d1_1_sept_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1929_1_d1_1_sept_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1929_1_d1_1_sept_2025</targetId>
      <targetTitle>IEEE Std P1929.1/D1.1, Sept 2025</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1929-1-d1-1-sept-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_274d421160eccc5bc431d855</id>
      <fromId>work_ieee_p1930_1_d1_dec_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1930_1_d1_dec_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1930_1_d1_dec_2021</targetId>
      <targetTitle>IEEE Std P1930.1/D1, Dec 2021</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1930-1-d1-dec-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7a8e777af120d2eb2373a269</id>
      <fromId>work_ieee_p1930_1_d2_may_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1930_1_d2_may_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1930_1_d2_may_2022</targetId>
      <targetTitle>IEEE Std P1930.1/D2, May 2022</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1930-1-d2-may-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_234b1b43e585cb18f43234a9</id>
      <fromId>work_ieee_p1932_1_dv0_3_mar_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1932_1_dv0_3_mar_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1932_1_dv0_3_mar_2023</targetId>
      <targetTitle>IEEE Std P1932.1/Dv0.3, Mar 2023</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1932-1-dv0-3-mar-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6cc12f6895f7c4bf73b7ed88</id>
      <fromId>work_ieee_p1932_1_dv0_4_jul_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1932_1_dv0_4_jul_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1932_1_dv0_4_jul_2023</targetId>
      <targetTitle>IEEE Std P1932.1/Dv0.4, Jul 2023</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1932-1-dv0-4-jul-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_af9e1342cc2c8680927929b4</id>
      <fromId>work_ieee_p1932_1_dv0_5_jul_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1932_1_dv0_5_jul_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1932_1_dv0_5_jul_2023</targetId>
      <targetTitle>IEEE Std P1932.1/Dv0.5, Jul 2023</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1932-1-dv0-5-jul-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1a148bd45385b2cfe5d4ac52</id>
      <fromId>work_ieee_p1932_1_dv0_6_july_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1932_1_dv0_6_july_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1932_1_dv0_6_july_2023</targetId>
      <targetTitle>IEEE Std P1932.1/Dv0.6, July 2023</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1932-1-dv0-6-july-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_57e34ca351a4e0924c2bcd7a</id>
      <fromId>work_ieee_p1932_1_dv0_7_jul_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1932_1_dv0_7_jul_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1932_1_dv0_7_jul_2023</targetId>
      <targetTitle>IEEE Std P1932.1/Dv0.7, Jul 2023</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1932-1-dv0-7-jul-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_395d61f2c5a69822b4a29c7f</id>
      <fromId>work_ieee_p1934_d1_0_feb_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1934_d1_0_feb_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1934_d1_0_feb_2018</targetId>
      <targetTitle>IEEE Std P1934/D1.0, Feb 2018</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1934-d1-0-feb-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d3d66828e498bb36c7407b36</id>
      <fromId>work_ieee_p1934_d2_0_apr_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1934_d2_0_apr_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1934_d2_0_apr_2018</targetId>
      <targetTitle>IEEE Std P1934/D2.0, Apr 2018</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1934-d2-0-apr-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d3f6178c7c7fc80f964a2244</id>
      <fromId>work_ieee_p1935_d1_may_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1935_d1_may_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1935_d1_may_2022</targetId>
      <targetTitle>IEEE Std P1935/D1, May 2022</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1935-d1-may-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d8eec03cfeaea0ea029d2b2b</id>
      <fromId>work_ieee_p1936_1_2020</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1936_1_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1936_1_2020</targetId>
      <targetTitle>IEEE Std P1936.1, 2020</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1936-1-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bf9356b166ea0c3776e4edd0</id>
      <fromId>work_ieee_p1936_1_d7_0_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1936_1_d7_0_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1936_1_d7_0_2021</targetId>
      <targetTitle>IEEE Std P1936.1/D7.0, 2021</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1936-1-d7-0-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8cf0440280bc201d5b49797b</id>
      <fromId>work_ieee_p1936_13_d5_sep_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1936_13_d5_sep_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1936_13_d5_sep_2025</targetId>
      <targetTitle>IEEE Std P1936.13/D5, Sep 2025</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1936-13-d5-sep-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d2fd1d4df9726aef31c5b677</id>
      <fromId>work_ieee_p1936_15_d12_aug_2026</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1936_15_d12_aug_2026</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1936_15_d12_aug_2026</targetId>
      <targetTitle>IEEE Std P1936.15/D12, Aug 2026</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1936-15-d12-aug-2026.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6997779694153530f2e9f043</id>
      <fromId>work_ieee_p1936_2_d3_2_sept_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1936_2_d3_2_sept_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1936_2_d3_2_sept_2022</targetId>
      <targetTitle>IEEE Std P1936.2/D3.2, Sept 2022</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1936-2-d3-2-sept-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_64dce9cff9da272c0074b3d3</id>
      <fromId>work_ieee_p1936_20_d3_1_aug_2026</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1936_20_d3_1_aug_2026</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1936_20_d3_1_aug_2026</targetId>
      <targetTitle>IEEE Std P1936.20/D3.1, Aug 2026</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1936-20-d3-1-aug-2026.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2c4f8b5cb720dbafcac26388</id>
      <fromId>work_ieee_p1936_3_d1_0_nov_2024</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1936_3_d1_0_nov_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1936_3_d1_0_nov_2024</targetId>
      <targetTitle>IEEE Std P1936.3/D1.0, Nov 2024</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1936-3-d1-0-nov-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a8dde5e2dd1cb7ac5f18ef6f</id>
      <fromId>work_ieee_p1936_4_d2_feb_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1936_4_d2_feb_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1936_4_d2_feb_2025</targetId>
      <targetTitle>IEEE Std P1936.4/D2, Feb 2025</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1936-4-d2-feb-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9d51b73c511353e7214929d9</id>
      <fromId>work_ieee_p1936_5_d7_1_mar_2024</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1936_5_d7_1_mar_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1936_5_d7_1_mar_2024</targetId>
      <targetTitle>IEEE Std P1936.5/D7.1, Mar 2024</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1936-5-d7-1-mar-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_5e68916789422cd58597e507</id>
      <fromId>work_ieee_p1936_8_d5_2_jul_2026</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1936_8_d5_2_jul_2026</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1936_8_d5_2_jul_2026</targetId>
      <targetTitle>IEEE Std P1936.8/D5.2, Jul 2026</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1936-8-d5-2-jul-2026.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_5461f74cbc5ebb84a9b5b240</id>
      <fromId>work_ieee_p1937_1_d6_0_may_2020</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1937_1_d6_0_may_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1937_1_d6_0_may_2020</targetId>
      <targetTitle>IEEE Std P1937.1/D6.0, May 2020</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1937-1-d6-0-may-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_fd81643f5ea4f9d41b2fb8c2</id>
      <fromId>work_ieee_p1937_1_d7_0_jun_2020</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1937_1_d7_0_jun_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1937_1_d7_0_jun_2020</targetId>
      <targetTitle>IEEE Std P1937.1/D7.0, Jun 2020</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1937-1-d7-0-jun-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_812d5e6854042253333fb07f</id>
      <fromId>work_ieee_p1937_11_apr_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1937_11_apr_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1937_11_apr_2023</targetId>
      <targetTitle>IEEE Std P1937.11, Apr 2023</targetTitle>
      <targetUrl>/fr/works/ieee-std-p1937-11-apr-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c4425322eaa434f14097cb59</id>
      <fromId>work_ieee_469_1977</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_469_1977</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_469_1977</targetId>
      <targetTitle>IEEE Std 469-1977</targetTitle>
      <targetUrl>/fr/works/ieee-std-469-1977.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ceeb33d0ecd596886f67c25a</id>
      <fromId>work_ieee_469_1988</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_469_1988</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_469_1988</targetId>
      <targetTitle>IEEE Std 469-1988</targetTitle>
      <targetUrl>/fr/works/ieee-std-469-1988.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0a8cd91fea1253cbf617e9ba</id>
      <fromId>work_ieee_470_1972</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_470_1972</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_470_1972</targetId>
      <targetTitle>IEEE Std 470-1972</targetTitle>
      <targetUrl>/fr/works/ieee-std-470-1972.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0e4b0b4f55333c817ccad4c1</id>
      <fromId>work_ieee_473_1985</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_473_1985</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_473_1985</targetId>
      <targetTitle>IEEE Std 473-1985</targetTitle>
      <targetUrl>/fr/works/ieee-std-473-1985.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_fbd92e95f8b0ef4f8826c9ec</id>
      <fromId>work_ieee_474_1973</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_474_1973</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_474_1973</targetId>
      <targetTitle>IEEE Std 474-1973</targetTitle>
      <targetUrl>/fr/works/ieee-std-474-1973.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_831c526cc9fad40ac54bf3c6</id>
      <fromId>work_ieee_475_1983</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_475_1983</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_475_1983</targetId>
      <targetTitle>IEEE Std 475-1983</targetTitle>
      <targetUrl>/fr/works/ieee-std-475-1983.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b893d232fff84ea4e66fa584</id>
      <fromId>work_ieee_475_2000</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_475_2000</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_475_2000</targetId>
      <targetTitle>IEEE Std 475-2000</targetTitle>
      <targetUrl>/fr/works/ieee-std-475-2000.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_844aa067f43696c8ca1e7865</id>
      <fromId>work_ieee_48_1948</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_48_1948</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_48_1948</targetId>
      <targetTitle>IEEE Std 48-1948</targetTitle>
      <targetUrl>/fr/works/ieee-std-48-1948.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_33f10c928dbdd4e9fefc3968</id>
      <fromId>work_ieee_48_1962</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_48_1962</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_48_1962</targetId>
      <targetTitle>IEEE Std 48-1962</targetTitle>
      <targetUrl>/fr/works/ieee-std-48-1962.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_503541c346023815b2573434</id>
      <fromId>work_ieee_48_1975</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_48_1975</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_48_1975</targetId>
      <targetTitle>IEEE Std 48-1975</targetTitle>
      <targetUrl>/fr/works/ieee-std-48-1975.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_20713cb9ea2f7bf8db6316ae</id>
      <fromId>work_ieee_48_1990</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_48_1990</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_48_1990</targetId>
      <targetTitle>IEEE Std 48-1990</targetTitle>
      <targetUrl>/fr/works/ieee-std-48-1990.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>concept_ieee_standards</fromId>
      <fromTitle>IEEE 标准</fromTitle>
      <fromUrl>/fr/concepts/ieee-standards.html</fromUrl>
      <fromType>concept</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/fr/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/fr/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/fr/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/fr/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/fr/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/fr/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/fr/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/fr/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/fr/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>fr</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>org_kind</key>
      <label>Organization kind</label>
      <value>专业协会</value>
    </field>
    <field>
      <key>founded</key>
      <label>Founded</label>
      <value>1963年1月1日</value>
    </field>
    <field>
      <key>org_status</key>
      <label>Status</label>
      <value>En activité</value>
    </field>
    <field>
      <key>headquarters_note</key>
      <label>Headquarters</label>
      <value>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</value>
    </field>
  </infoFields>
  <pagination>
    <page>117</page>
    <pageSize>50</pageSize>
    <total>8265</total>
    <pageCount>166</pageCount>
    <prevUrl>/fr/organizations/ieee/relation-116.xml</prevUrl>
    <nextUrl>/fr/organizations/ieee/relation-118.xml</nextUrl>
  </pagination>
  <relationsTotal>8265</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8279</mentionsTotal>
  <mentionsUrl>/fr/organizations/ieee/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>