<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>电气电子工程师学会 · संबंध</title>
  <description>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</description>
  <url>/hi/organizations/ieee/relation-97.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>organization_ieee</id>
    <type>organization</type>
    <title>电气电子工程师学会</title>
    <slug>ieee</slug>
    <aliases>
      <alias>IEEE</alias>
      <alias>Institute of Electrical and Electronics Engineers</alias>
      <alias>电气和电子工程师协会</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
      <tag>tag-publishing</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
        <locator>2026-11-01 访问</locator>
      </source>
      <source>
        <id>s2</id>
        <title>IEEE 官方网站</title>
        <author>IEEE</author>
        <url>https://www.ieee.org/</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:52+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:52+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**电气电子工程师学会**（Institute of Electrical and Electronics Engineers，简称 IEEE）是1963年1月1日由美国电气工程师学会（AIEE）与无线电工程师学会（IRE）合并成立的专业技术协会，面向电气工程、电子工程及相关学科[^s1]。&#xA;&#xA;## 沿革&#xA;&#xA;该会可追溯至1884年成立的 AIEE；1912年另成立 IRE。两会于1963年合并为 IEEE[^s1]。总会设在纽约，1975年起主要业务在新泽西州皮斯卡特维的运营中心开展[^s1]。&#xA;&#xA;## 职能与业务&#xA;&#xA;IEEE 发布同行评议期刊与会议录，并通过标准化委员会制定技术标准；相关内容可在 IEEE Xplore 平台检索[^s1][^s3]。标准公开目录（KBART）列出标准编号、题名、状态与题录链接等元数据[^s3]。&#xA;&#xA;## 现状&#xA;&#xA;据公开介绍，该会为美国 501(c)(3) 公益性专业协会，全球会员逾48.6万[^s1]。官网为 https://www.ieee.org/ [^s2]。</body>
    <url>/organizations/ieee.html</url>
    <lang>hi</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <orgKind>专业协会</orgKind>
    <founded>
      <year>1963</year>
      <month>1</month>
      <day>1</day>
      <precision>day</precision>
      <display>1963年1月1日</display>
    </founded>
    <orgStatus>active</orgStatus>
    <headquartersNote>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</headquartersNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_6d1a2dde6c0c821616f957f0</id>
      <fromId>work_ieee_1801_2015_7484242_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1801_2015_7484242_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1801_2015_7484242_redline</targetId>
      <targetTitle>IEEE Std 1801-2015</targetTitle>
      <targetUrl>/hi/works/ieee-std-1801-2015-7484242-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b1d9161c62b4f439ceb8c9d6</id>
      <fromId>work_ieee_1801_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1801_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1801_2018</targetId>
      <targetTitle>IEEE Std 1801-2018</targetTitle>
      <targetUrl>/hi/works/ieee-std-1801-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bf7ae4470fd8deb80c1bfe1d</id>
      <fromId>work_ieee_1801_d10_feb_2024</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1801_d10_feb_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1801_d10_feb_2024</targetId>
      <targetTitle>IEEE Std 1801/D10, Feb 2024</targetTitle>
      <targetUrl>/hi/works/ieee-std-1801-d10-feb-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f87157a3e493ddd72dfb8c63</id>
      <fromId>work_ieee_1801a_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1801a_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1801a_2014</targetId>
      <targetTitle>IEEE Std 1801a-2014</targetTitle>
      <targetUrl>/hi/works/ieee-std-1801a-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_dcb58190494d17771a0348c6</id>
      <fromId>work_ieee_1802_3_1991</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1802_3_1991</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1802_3_1991</targetId>
      <targetTitle>IEEE Std 1802.3-1991</targetTitle>
      <targetUrl>/hi/works/ieee-std-1802-3-1991.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d49282134713c95c5ab4dfa1</id>
      <fromId>work_ieee_1802_3_2001</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1802_3_2001</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1802_3_2001</targetId>
      <targetTitle>IEEE Std 1802.3-2001</targetTitle>
      <targetUrl>/hi/works/ieee-std-1802-3-2001.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_494b09746a93dd3870eb7961</id>
      <fromId>work_ieee_1802_3d_1993</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1802_3d_1993</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1802_3d_1993</targetId>
      <targetTitle>IEEE Std 1802.3d-1993</targetTitle>
      <targetUrl>/hi/works/ieee-std-1802-3d-1993.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7644712451d4f8d38d1c20dd</id>
      <fromId>work_ieee_1808_2011</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1808_2011</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1808_2011</targetId>
      <targetTitle>IEEE Std 1808-2011</targetTitle>
      <targetUrl>/hi/works/ieee-std-1808-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3972fd67d8fb96b6a3b4234d</id>
      <fromId>work_ieee_1808_2024_10899771_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1808_2024_10899771_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1808_2024_10899771_redline</targetId>
      <targetTitle>IEEE Std 1808-2024</targetTitle>
      <targetUrl>/hi/works/ieee-std-1808-2024-10899771-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_71f54b50b53bf8386f583641</id>
      <fromId>work_ieee_p1802_3_d3_0</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1802_3_d3_0</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1802_3_d3_0</targetId>
      <targetTitle>IEEE Std P1802.3/D3.0</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1802-3-d3-0.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_68f06227c452470d6b6277bf</id>
      <fromId>work_ieee_p1804_d1_4_apr_2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1804_d1_4_apr_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1804_d1_4_apr_2015</targetId>
      <targetTitle>IEEE Std P1804/D1.4, Apr 2015</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1804-d1-4-apr-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_892a031df019523d883aa2ac</id>
      <fromId>work_ieee_p1804_d1_7_sept_2016</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1804_d1_7_sept_2016</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1804_d1_7_sept_2016</targetId>
      <targetTitle>IEEE Std P1804/D1.7, Sept 2016</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1804-d1-7-sept-2016.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a7ba15006dcb29d5dd17d3fc</id>
      <fromId>work_ieee_p1804_d1_8_jul_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1804_d1_8_jul_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1804_d1_8_jul_2017</targetId>
      <targetTitle>IEEE Std P1804/D1.8 Jul 2017</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1804-d1-8-jul-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ffd7681050f3d490079e79cf</id>
      <fromId>work_ieee_p1804_d1_9_oct_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1804_d1_9_oct_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1804_d1_9_oct_2017</targetId>
      <targetTitle>IEEE Std P1804/D1.9, Oct 2017</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1804-d1-9-oct-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ab39b82927b7f4d7f0b34046</id>
      <fromId>work_ieee_p1806_2023_cor1_d1_mar_2024</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1806_2023_cor1_d1_mar_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1806_2023_cor1_d1_mar_2024</targetId>
      <targetTitle>IEEE Std P1806-2023/Cor1/D1, Mar 2024</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1806-2023-cor1-d1-mar-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a8346542f5529e3db80675ff</id>
      <fromId>work_ieee_p1806_d5_4_may_2020</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1806_d5_4_may_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1806_d5_4_may_2020</targetId>
      <targetTitle>IEEE Std P1806/D5.4, May 2020</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1806-d5-4-may-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6291cfc12d87dbb6cb439609</id>
      <fromId>work_ieee_p1806_d5_8_oct_2020</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1806_d5_8_oct_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1806_d5_8_oct_2020</targetId>
      <targetTitle>IEEE Std P1806/D5.8, Oct 2020</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1806-d5-8-oct-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ed9c1984667714c9284faff2</id>
      <fromId>work_ieee_p1806_d6_feb_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1806_d6_feb_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1806_d6_feb_2021</targetId>
      <targetTitle>IEEE Std P1806/D6, Feb 2021</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1806-d6-feb-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1b282bdc78161bae2c416748</id>
      <fromId>work_ieee_p1806_d6_1_mar_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1806_d6_1_mar_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1806_d6_1_mar_2021</targetId>
      <targetTitle>IEEE Std P1806/D6.1, Mar 2021</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1806-d6-1-mar-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_80b16a45fd39385b5011e60a</id>
      <fromId>work_ieee_p1808</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1808</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1808</targetId>
      <targetTitle>IEEE Std P1808</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1808.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2ee64864adb2afa3aadf1053</id>
      <fromId>work_ieee_p1808_d1_jul_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1808_d1_jul_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1808_d1_jul_2023</targetId>
      <targetTitle>IEEE Std P1808/D1, Jul 2023</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1808-d1-jul-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7f4e6745b1a1fd683ff7f136</id>
      <fromId>work_ieee_p1808_d3_may_2010</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1808_d3_may_2010</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1808_d3_may_2010</targetId>
      <targetTitle>IEEE Std P1808/D3, May 2010</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1808-d3-may-2010.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4d3caa276152b17ecf951aad</id>
      <fromId>work_ieee_p181_d02_nov_2010</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p181_d02_nov_2010</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p181_d02_nov_2010</targetId>
      <targetTitle>IEEE Std P181/D02, Nov 2010</targetTitle>
      <targetUrl>/hi/works/ieee-std-p181-d02-nov-2010.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_91e4e19618a6764d338edd79</id>
      <fromId>work_ieee_p181_d12_aug_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p181_d12_aug_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p181_d12_aug_2025</targetId>
      <targetTitle>IEEE Std P181/D12, Aug 2025</targetTitle>
      <targetUrl>/hi/works/ieee-std-p181-d12-aug-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0ced3f76022c09e41bf335ab</id>
      <fromId>work_ieee_p181_d13_oct_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p181_d13_oct_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p181_d13_oct_2025</targetId>
      <targetTitle>IEEE Std P181/D13, Oct 2025</targetTitle>
      <targetUrl>/hi/works/ieee-std-p181-d13-oct-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a3a00f568fc2df31386e62c6</id>
      <fromId>work_ieee_p1810_d2_4_feb_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1810_d2_4_feb_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1810_d2_4_feb_2025</targetId>
      <targetTitle>IEEE Std P1810/D2.4, Feb 2025</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1810-d2-4-feb-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ceaf1f69abdca8b1d0788c4c</id>
      <fromId>work_ieee_p1810_d2_5_apr_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1810_d2_5_apr_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1810_d2_5_apr_2025</targetId>
      <targetTitle>IEEE Std P1810/D2.5, Apr 2025</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1810-d2-5-apr-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_385db8639ccd6c71b7a73ffa</id>
      <fromId>work_ieee_p1810_d8_3_mar_2016</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1810_d8_3_mar_2016</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1810_d8_3_mar_2016</targetId>
      <targetTitle>IEEE Std P1810/D8.3, Mar 2016</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1810-d8-3-mar-2016.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_270872f0e647912c64482519</id>
      <fromId>work_ieee_p1810_d8_4_dec_2016</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1810_d8_4_dec_2016</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1810_d8_4_dec_2016</targetId>
      <targetTitle>IEEE Std P1810/D8.4, Dec 2016</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1810-d8-4-dec-2016.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b9f0e1912950ba9fb24d4523</id>
      <fromId>work_ieee_p1812</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1812</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1812</targetId>
      <targetTitle>IEEE Std P1812</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1812.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7680fa7282fe43dcd4fd9d1c</id>
      <fromId>work_ieee_p1812_d3_may_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1812_d3_may_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1812_d3_may_2022</targetId>
      <targetTitle>IEEE Std P1812/D3, May 2022</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1812-d3-may-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_557c194a442a9302b77be4c1</id>
      <fromId>work_ieee_p1812_d4_jan_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1812_d4_jan_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1812_d4_jan_2022</targetId>
      <targetTitle>IEEE Std P1812/D4, Jan 2022</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1812-d4-jan-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_15fb7a4ad21087115858d37b</id>
      <fromId>work_ieee_p1812_d4_oct_2013</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1812_d4_oct_2013</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1812_d4_oct_2013</targetId>
      <targetTitle>IEEE Std P1812/D4, Oct 2013</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1812-d4-oct-2013.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_59bf4dc8949103e211995420</id>
      <fromId>work_ieee_p1812_d5_jul_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1812_d5_jul_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1812_d5_jul_2014</targetId>
      <targetTitle>IEEE Std P1812/D5, Jul 2014</targetTitle>
      <targetUrl>/hi/works/ieee-std-p1812-d5-jul-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_dbfd289fe9c584b539840fda</id>
      <fromId>work_ieee_181_1977</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_181_1977</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_181_1977</targetId>
      <targetTitle>IEEE Std 181-1977</targetTitle>
      <targetUrl>/hi/works/ieee-std-181-1977.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7b9aaa454876f24142290341</id>
      <fromId>work_ieee_181_2003</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_181_2003</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_181_2003</targetId>
      <targetTitle>IEEE Std 181-2003</targetTitle>
      <targetUrl>/hi/works/ieee-std-181-2003.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f79a8ed34bfe952fbb2cb24a</id>
      <fromId>work_ieee_181_2011_6016196</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_181_2011_6016196</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_181_2011_6016196</targetId>
      <targetTitle>IEEE Std 181-2011</targetTitle>
      <targetUrl>/hi/works/ieee-std-181-2011-6016196.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1b9a288dc91a6de84557b979</id>
      <fromId>work_ieee_181_2011_6383173_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_181_2011_6383173_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_181_2011_6383173_redline</targetId>
      <targetTitle>IEEE Std 181-2011</targetTitle>
      <targetUrl>/hi/works/ieee-std-181-2011-6383173-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_68eddb5276529dc23bb7b1d1</id>
      <fromId>work_ieee_1810_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1810_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1810_2017</targetId>
      <targetTitle>IEEE Std 1810-2017</targetTitle>
      <targetUrl>/hi/works/ieee-std-1810-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2bc3f19282f6f0e088093fe5</id>
      <fromId>work_ieee_1812_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1812_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1812_2014</targetId>
      <targetTitle>IEEE Std 1812-2014</targetTitle>
      <targetUrl>/hi/works/ieee-std-1812-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b286535640bc8d18842f969f</id>
      <fromId>work_ieee_1812_2023_10505241_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1812_2023_10505241_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1812_2023_10505241_redline</targetId>
      <targetTitle>IEEE Std 1812-2023</targetTitle>
      <targetUrl>/hi/works/ieee-std-1812-2023-10505241-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_fd148dbec2c0697b61262b9a</id>
      <fromId>work_ieee_1815_2010</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1815_2010</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1815_2010</targetId>
      <targetTitle>IEEE Std 1815-2010</targetTitle>
      <targetUrl>/hi/works/ieee-std-1815-2010.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8318124d39b27629b89e28f3</id>
      <fromId>work_ieee_1815_2012_6327576</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1815_2012_6327576</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1815_2012_6327576</targetId>
      <targetTitle>IEEE Std 1815-2012</targetTitle>
      <targetUrl>/hi/works/ieee-std-1815-2012-6327576.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d187d2462605ae4523aeeb6d</id>
      <fromId>work_ieee_1815_2012_6675750_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1815_2012_6675750_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1815_2012_6675750_redline</targetId>
      <targetTitle>IEEE Std 1815-2012</targetTitle>
      <targetUrl>/hi/works/ieee-std-1815-2012-6675750-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_375ed6aa461c959fcd64ef1f</id>
      <fromId>work_ieee_1815_1_2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1815_1_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1815_1_2015</targetId>
      <targetTitle>IEEE Std 1815.1-2015</targetTitle>
      <targetUrl>/hi/works/ieee-std-1815-1-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b5814d4b4b94441cad7c0c76</id>
      <fromId>work_ieee_1816_2013</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1816_2013</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1816_2013</targetId>
      <targetTitle>IEEE Std 1816-2013</targetTitle>
      <targetUrl>/hi/works/ieee-std-1816-2013.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a20f57f137a8ac6ae3fb8ff7</id>
      <fromId>work_ieee_182_1961</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_182_1961</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_182_1961</targetId>
      <targetTitle>IEEE Std 182-1961</targetTitle>
      <targetUrl>/hi/works/ieee-std-182-1961.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7d072a8870f41e465bd891e6</id>
      <fromId>work_ieee_1823_2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1823_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1823_2015</targetId>
      <targetTitle>IEEE Std 1823-2015</targetTitle>
      <targetUrl>/hi/works/ieee-std-1823-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_65df331b544decdfd64f7124</id>
      <fromId>work_ieee_1826_2012</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1826_2012</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1826_2012</targetId>
      <targetTitle>IEEE Std 1826-2012</targetTitle>
      <targetUrl>/hi/works/ieee-std-1826-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2b1aa99c3291a94c5c1f589f</id>
      <fromId>work_ieee_1826_2020_9351796_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1826_2020_9351796_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1826_2020_9351796_redline</targetId>
      <targetTitle>IEEE Std 1826-2020</targetTitle>
      <targetUrl>/hi/works/ieee-std-1826-2020-9351796-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>concept_ieee_standards</fromId>
      <fromTitle>IEEE 标准</fromTitle>
      <fromUrl>/hi/concepts/ieee-standards.html</fromUrl>
      <fromType>concept</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/hi/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/hi/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/hi/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/hi/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/hi/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/hi/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/hi/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/hi/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/hi/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>hi</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>org_kind</key>
      <label>Organization kind</label>
      <value>专业协会</value>
    </field>
    <field>
      <key>founded</key>
      <label>Founded</label>
      <value>1963年1月1日</value>
    </field>
    <field>
      <key>org_status</key>
      <label>Status</label>
      <value>सक्रिय</value>
    </field>
    <field>
      <key>headquarters_note</key>
      <label>Headquarters</label>
      <value>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</value>
    </field>
  </infoFields>
  <pagination>
    <page>97</page>
    <pageSize>50</pageSize>
    <total>8265</total>
    <pageCount>166</pageCount>
    <prevUrl>/hi/organizations/ieee/relation-96.xml</prevUrl>
    <nextUrl>/hi/organizations/ieee/relation-98.xml</nextUrl>
  </pagination>
  <relationsTotal>8265</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8279</mentionsTotal>
  <mentionsUrl>/hi/organizations/ieee/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>