IEEE Std 301-1969
URL: https://knowledge.ivjn.us/it/works/ieee-std-301-1969.html

IEEE Std 301-1969 是电气电子工程师学会的技术标准，题为“IEEE Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors (For Ionizing Radiation)”；公开目录标为已被替代（Superseded），著录年份为 1968 年。

**IEEE Std 301-1969**（IEEE Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors (For Ionizing Radiation)）是[电气电子工程师学会](https://knowledge.ivjn.us/it/organizations/ieee.html)的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1968 年，主题领域包括 Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics、Signal Processing and Analysis[^s1]。参见[IEEE 标准](https://knowledge.ivjn.us/it/concepts/ieee-standards.html)。

Updated: 2026-11-01

Tags:
- IEEE standard https://knowledge.ivjn.us/it/tags/ieee-standard.html

Relations:
- Published by: 电气电子工程师学会 https://knowledge.ivjn.us/it/organizations/ieee.html
- About: IEEE 标准 https://knowledge.ivjn.us/it/concepts/ieee-standards.html

Sources:
- IEEE Std 301-1969 — IEEE Xplore 题录 https://ieeexplore.ieee.org/servlet/opac?punumber=7405220 standard_number=301-1969; status=Superseded; modifier=
- IEEE Xplore All Standards（KBART） https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt