<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>IEEE 标准 · 関係</title>
  <description>IEEE 标准是电气电子工程师学会发布的技术标准文献集合，涵盖通信、电力、计算与电磁兼容等领域；公开目录以 KBART 列表提供编号、题名、状态与 IEEE Xplore 题录链接。</description>
  <url>/ja/concepts/ieee-standards/relation-163.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>concept_ieee_standards</id>
    <type>concept</type>
    <title>IEEE 标准</title>
    <slug>ieee-standards</slug>
    <aliases>
      <alias>IEEE Standards</alias>
      <alias>IEEE Std</alias>
      <alias>电气电子工程师学会标准</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>IEEE 标准是电气电子工程师学会发布的技术标准文献集合，涵盖通信、电力、计算与电磁兼容等领域；公开目录以 KBART 列表提供编号、题名、状态与 IEEE Xplore 题录链接。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        <locator>2026-11-01 下载</locator>
      </source>
      <source>
        <id>s2</id>
        <title>KBART Title Lists</title>
        <author>IEEE Xplore Help</author>
        <url>https://ieeexplore.ieee.org/Xplorehelp/discovery-services/kbart-title-lists</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Standards Association / standards.ieee.org</title>
        <author>IEEE</author>
        <url>https://standards.ieee.org/</url>
      </source>
      <source>
        <id>s4</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:58+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:58+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**IEEE 标准**是[[organization_ieee|电气电子工程师学会]]（IEEE）通过其标准化活动发布的技术标准文献[^s3][^s4]。&#xA;&#xA;## 定义与范围&#xA;&#xA;公开机读目录「IEEE Xplore All Standards」以 KBART 格式列出标准编号、题名、出版年份、状态（如 Active、Superseded、Inactive）及 IEEE Xplore 题录链接等元数据，不提供付费全文[^s1][^s2]。本知识库按该目录逐条建立标准词条（work，workKind=standard），每条保留官方目录出处。&#xA;&#xA;## 沿革&#xA;&#xA;IEEE 由 AIEE 与 IRE 于1963年合并成立后继续并扩展标准制定；现行与历史版本均出现在 Xplore 标准集合中[^s4][^s1]。&#xA;&#xA;## 相关概念&#xA;&#xA;词条之间以发布机构、主题关系连接；同一标准号的多年版本各自成条或在正文互相链接，以便维护。</body>
    <url>/concepts/ieee-standards.html</url>
    <lang>ja</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <conceptKind>theme</conceptKind>
    <scopeNote>本条为总览；各标准号以独立 work 词条著录，勿仅在本条列表省略。</scopeNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_4b2fba6d785d3a7dda021c14</id>
      <fromId>work_ieee_p3209_d5_apr_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3209_d5_apr_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3209_d5_apr_2023</targetId>
      <targetTitle>IEEE Std P3209/D5, Apr 2023</targetTitle>
      <targetUrl>/ja/works/ieee-std-p3209-d5-apr-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e3c0476c8df3f7a50cc91be5</id>
      <fromId>work_ieee_p3214_d4_1_mar_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3214_d4_1_mar_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3214_d4_1_mar_2024</targetId>
      <targetTitle>IEEE Std P3214/D4.1, Mar 2024</targetTitle>
      <targetUrl>/ja/works/ieee-std-p3214-d4-1-mar-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_09cb237a1487804577127a13</id>
      <fromId>work_ieee_p3216_d4_1_aug_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3216_d4_1_aug_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3216_d4_1_aug_2024</targetId>
      <targetTitle>IEEE Std P3216/D4.1, Aug 2024</targetTitle>
      <targetUrl>/ja/works/ieee-std-p3216-d4-1-aug-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d44307d309c5625e26cca816</id>
      <fromId>work_ieee_p3217_d2_jan_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3217_d2_jan_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3217_d2_jan_2023</targetId>
      <targetTitle>IEEE Std P3217/D2, Jan 2023</targetTitle>
      <targetUrl>/ja/works/ieee-std-p3217-d2-jan-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8229070000576f70decbfdcd</id>
      <fromId>work_ieee_p3217_d2_1_feb_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3217_d2_1_feb_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3217_d2_1_feb_2023</targetId>
      <targetTitle>IEEE Std P3217/D2.1, Feb 2023</targetTitle>
      <targetUrl>/ja/works/ieee-std-p3217-d2-1-feb-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_75dd9936c58730a446752f5f</id>
      <fromId>work_ieee_p3218_d3_0_aug_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3218_d3_0_aug_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3218_d3_0_aug_2022</targetId>
      <targetTitle>IEEE Std P3218/D3.0, Aug 2022</targetTitle>
      <targetUrl>/ja/works/ieee-std-p3218-d3-0-aug-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3beaf2cfdff4d72634ffddd3</id>
      <fromId>work_ieee_p3219_d2_0_jul_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3219_d2_0_jul_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3219_d2_0_jul_2023</targetId>
      <targetTitle>IEEE Std P3219/D2.0, Jul 2023</targetTitle>
      <targetUrl>/ja/works/ieee-std-p3219-d2-0-jul-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b6244b07733e230cd0f8b84d</id>
      <fromId>work_ieee_p3220_01_d3_dec_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3220_01_d3_dec_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3220_01_d3_dec_2024</targetId>
      <targetTitle>IEEE Std P3220.01/D3, Dec 2024</targetTitle>
      <targetUrl>/ja/works/ieee-std-p3220-01-d3-dec-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_915802729b3a0ff0694aa432</id>
      <fromId>work_ieee_p3220_01_d4_apr_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3220_01_d4_apr_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3220_01_d4_apr_2025</targetId>
      <targetTitle>IEEE Std P3220.01/D4, Apr 2025</targetTitle>
      <targetUrl>/ja/works/ieee-std-p3220-01-d4-apr-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f4ead4a8b9b208e21b4fa525</id>
      <fromId>work_ieee_p3221_01_d2_2_jan_2025</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3221_01_d2_2_jan_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3221_01_d2_2_jan_2025</targetId>
      <targetTitle>IEEE Std P3221.01/D2.2, Jan 2025</targetTitle>
      <targetUrl>/ja/works/ieee-std-p3221-01-d2-2-jan-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_242af5478f8c684995835fcb</id>
      <fromId>work_ieee_p3221_d1_jun_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3221_d1_jun_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3221_d1_jun_2024</targetId>
      <targetTitle>IEEE Std P3221/D1, Jun 2024</targetTitle>
      <targetUrl>/ja/works/ieee-std-p3221-d1-jun-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_31cc408be0a4c8b43b46921c</id>
      <fromId>work_ieee_p3224_d4_sep_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3224_d4_sep_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3224_d4_sep_2023</targetId>
      <targetTitle>IEEE Std P3224/D4, Sep 2023</targetTitle>
      <targetUrl>/ja/works/ieee-std-p3224-d4-sep-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_69b6f7d49c77ab91b3733e85</id>
      <fromId>work_ieee_p3224_d5_oct_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p3224_d5_oct_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p3224_d5_oct_2023</targetId>
      <targetTitle>IEEE Std P3224/D5, Oct 2023</targetTitle>
      <targetUrl>/ja/works/ieee-std-p3224-d5-oct-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f343a791ee0092beaa88cd71</id>
      <fromId>work_ieee_p62704_3_d1_0_may_2013</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62704_3_d1_0_may_2013</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62704_3_d1_0_may_2013</targetId>
      <targetTitle>IEEE Std P62704-3/D1.0, May 2013</targetTitle>
      <targetUrl>/ja/works/ieee-std-p62704-3-d1-0-may-2013.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_df3aa1fad9b361c6992cf79e</id>
      <fromId>work_ieee_p62704_3_d2</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62704_3_d2</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62704_3_d2</targetId>
      <targetTitle>IEEE Std P62704-3/D2</targetTitle>
      <targetUrl>/ja/works/ieee-std-p62704-3-d2.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b6b6dd610b853f366409d1f0</id>
      <fromId>work_ieee_p62704_3_d3_2016</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62704_3_d3_2016</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62704_3_d3_2016</targetId>
      <targetTitle>IEEE Std P62704-3/D3, 2016</targetTitle>
      <targetUrl>/ja/works/ieee-std-p62704-3-d3-2016.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a74a048b30ffe4ed7658dde7</id>
      <fromId>work_ieee_p62704_3_d4_2017</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62704_3_d4_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62704_3_d4_2017</targetId>
      <targetTitle>IEEE Std P62704-3/D4, 2017</targetTitle>
      <targetUrl>/ja/works/ieee-std-p62704-3-d4-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e44b02fcbe8e0a0ca95bfe26</id>
      <fromId>work_ieee_p62704_4_d1_mar_2019</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62704_4_d1_mar_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62704_4_d1_mar_2019</targetId>
      <targetTitle>IEEE Std P62704-4/D1, Mar 2019</targetTitle>
      <targetUrl>/ja/works/ieee-std-p62704-4-d1-mar-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_932f067934f344fa1ca3969f</id>
      <fromId>work_ieee_p62704_4_d2_aug_2019</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62704_4_d2_aug_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62704_4_d2_aug_2019</targetId>
      <targetTitle>IEEE Std P62704-4/D2, Aug 2019</targetTitle>
      <targetUrl>/ja/works/ieee-std-p62704-4-d2-aug-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_29c145cef1dfc8b942080a5a</id>
      <fromId>work_ieee_p62704_4_d3_sep_2019</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62704_4_d3_sep_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62704_4_d3_sep_2019</targetId>
      <targetTitle>IEEE Std P62704-4/D3, Sep 2019</targetTitle>
      <targetUrl>/ja/works/ieee-std-p62704-4-d3-sep-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2a79de52e16346e291c258e3</id>
      <fromId>work_ieee_p62704_5_ed1_2018</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p62704_5_ed1_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p62704_5_ed1_2018</targetId>
      <targetTitle>IEEE Std P62704-5 ED1, 2018</targetTitle>
      <targetUrl>/ja/works/ieee-std-p62704-5-ed1-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d5e51f24ad6b5e774558d3ad</id>
      <fromId>work_ieee_p628_d1_sep_2019</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p628_d1_sep_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p628_d1_sep_2019</targetId>
      <targetTitle>IEEE Std P628/D1, Sep 2019</targetTitle>
      <targetUrl>/ja/works/ieee-std-p628-d1-sep-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_fe7547bc2b02dae685f9030c</id>
      <fromId>work_ieee_p628_d2_nov_2019</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p628_d2_nov_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p628_d2_nov_2019</targetId>
      <targetTitle>IEEE Std P628/D2, Nov 2019</targetTitle>
      <targetUrl>/ja/works/ieee-std-p628-d2-nov-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_11ec7b5bca98799b66254658</id>
      <fromId>work_ieee_p628_d7_may_2011</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p628_d7_may_2011</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p628_d7_may_2011</targetId>
      <targetTitle>IEEE Std P628/D7, May 2011</targetTitle>
      <targetUrl>/ja/works/ieee-std-p628-d7-may-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a78d48d8714195321680436c</id>
      <fromId>work_ieee_p628_d8_oct_2011</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p628_d8_oct_2011</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p628_d8_oct_2011</targetId>
      <targetTitle>IEEE Std P628/D8, Oct 2011</targetTitle>
      <targetUrl>/ja/works/ieee-std-p628-d8-oct-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c034ac0e86723f06bca8066a</id>
      <fromId>work_ieee_p63113_cd4_apr_2019</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63113_cd4_apr_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63113_cd4_apr_2019</targetId>
      <targetTitle>IEEE Std P63113 CD4, Apr 2019</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63113-cd4-apr-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3dc65c20bcc5878760ea46eb</id>
      <fromId>work_ieee_p63113_cdv_may_2020</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63113_cdv_may_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63113_cdv_may_2020</targetId>
      <targetTitle>IEEE Std P63113 CDV, May 2020</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63113-cdv-may-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_12c53cdcb172e2f2f67b112c</id>
      <fromId>work_ieee_p63113_fdis_dec_2020</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63113_fdis_dec_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63113_fdis_dec_2020</targetId>
      <targetTitle>IEEE Std P63113/FDIS, Dec 2020</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63113-fdis-dec-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3a208d76ff1f440380d2324b</id>
      <fromId>work_ieee_p63184_cdv_sept_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63184_cdv_sept_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63184_cdv_sept_2022</targetId>
      <targetTitle>IEEE Std P63184/CDV, Sept 2022</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63184-cdv-sept-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b8562603d01752290e5b7543</id>
      <fromId>work_ieee_p63184_cdv_d2_june_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63184_cdv_d2_june_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63184_cdv_d2_june_2023</targetId>
      <targetTitle>IEEE Std P63184/CDV/D2, June 2023</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63184-cdv-d2-june-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6eb9e903449bc2479122a498</id>
      <fromId>work_ieee_p63184_fdis_jun_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63184_fdis_jun_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63184_fdis_jun_2024</targetId>
      <targetTitle>IEEE Std P63184/FDIS, Jun 2024</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63184-fdis-jun-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1d78a05a1438a6bff00f904a</id>
      <fromId>work_ieee_p63195_1_d7_dec_2021</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63195_1_d7_dec_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63195_1_d7_dec_2021</targetId>
      <targetTitle>IEEE Std P63195-1/D7, Dec 2021</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63195-1-d7-dec-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d14d3e933cea1d0ae1247074</id>
      <fromId>work_ieee_p63195_1_fdis_oct_2021</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63195_1_fdis_oct_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63195_1_fdis_oct_2021</targetId>
      <targetTitle>IEEE Std P63195-1_FDIS, Oct 2021</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63195-1-fdis-oct-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_35918ae5b24f3428df17a299</id>
      <fromId>work_ieee_p63195_2_ed2_feb_2020</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63195_2_ed2_feb_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63195_2_ed2_feb_2020</targetId>
      <targetTitle>IEEE Std P63195-2 ED2, Feb 2020</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63195-2-ed2-feb-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f2d7f2ba9fb83b34e3a5c3c4</id>
      <fromId>work_ieee_p63195_2_ed3_feb_2021</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63195_2_ed3_feb_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63195_2_ed3_feb_2021</targetId>
      <targetTitle>IEEE Std P63195-2 ED3, Feb 2021</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63195-2-ed3-feb-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_14d310cb1665e5522be6779a</id>
      <fromId>work_ieee_p63195_2_ed4_mar_2021</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63195_2_ed4_mar_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63195_2_ed4_mar_2021</targetId>
      <targetTitle>IEEE Std P63195-2 ED4, Mar 2021</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63195-2-ed4-mar-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8e540f3644f55c4dcae423b2</id>
      <fromId>work_ieee_p63195_2_fdis_jan_2021</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63195_2_fdis_jan_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63195_2_fdis_jan_2021</targetId>
      <targetTitle>IEEE Std P63195-2 FDIS, Jan 2021</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63195-2-fdis-jan-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d7bb6c897ce7b75cbf80a279</id>
      <fromId>work_ieee_p63195_2_d9_dec_2021</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63195_2_d9_dec_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63195_2_d9_dec_2021</targetId>
      <targetTitle>IEEE Std P63195-2/D9, Dec 2021</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63195-2-d9-dec-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_832129974447cee48c3aabe5</id>
      <fromId>work_ieee_p63195_2_fdis_oct_2021</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63195_2_fdis_oct_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63195_2_fdis_oct_2021</targetId>
      <targetTitle>IEEE Std P63195-2_FDIS, Oct 2021</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63195-2-fdis-oct-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_dd0afb554f0b97c82f12d2e1</id>
      <fromId>work_ieee_p63195_4_d1_cd_feb_2026</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63195_4_d1_cd_feb_2026</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63195_4_d1_cd_feb_2026</targetId>
      <targetTitle>IEEE Std P63195-4/D1/CD, Feb 2026</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63195-4-d1-cd-feb-2026.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f1cdf70f1d308d993e57be8a</id>
      <fromId>work_ieee_p63195_4_d2_aug_2026</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63195_4_d2_aug_2026</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63195_4_d2_aug_2026</targetId>
      <targetTitle>IEEE Std P63195-4/D2, Aug 2026</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63195-4-d2-aug-2026.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7cd83235f56ec18a762d0e09</id>
      <fromId>work_ieee_p63195_ed1_2018</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63195_ed1_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63195_ed1_2018</targetId>
      <targetTitle>IEEE Std P63195/ED1, 2018</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63195-ed1-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_31ecc2e8e6782ef3e7f6535a</id>
      <fromId>work_ieee_p63195_cdv_v3_feb_2020</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63195_cdv_v3_feb_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63195_cdv_v3_feb_2020</targetId>
      <targetTitle>IEEE Std P63195_CDV/V3, Feb 2020</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63195-cdv-v3-feb-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4dc187a8bda566ae68932759</id>
      <fromId>work_ieee_p63195_fdis_jan_2021</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63195_fdis_jan_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63195_fdis_jan_2021</targetId>
      <targetTitle>IEEE Std P63195_FDIS, Jan 2021</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63195-fdis-jan-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7de2bc92466bee098d352ea3</id>
      <fromId>work_ieee_p63198_2775_fdis_sept_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63198_2775_fdis_sept_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63198_2775_fdis_sept_2022</targetId>
      <targetTitle>IEEE Std P63198-2775/FDIS, Sept 2022</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63198-2775-fdis-sept-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bfc43e9bbd13a4696b0c8dd2</id>
      <fromId>work_ieee_p63198_2775_cd5_0_jan_2021</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63198_2775_cd5_0_jan_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63198_2775_cd5_0_jan_2021</targetId>
      <targetTitle>IEEE Std P63198-2775_CD5.0, Jan 2021</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63198-2775-cd5-0-jan-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f0a5546c52331adce4184697</id>
      <fromId>work_ieee_p63198_2775_d6_1_cdv_mar_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63198_2775_d6_1_cdv_mar_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63198_2775_d6_1_cdv_mar_2022</targetId>
      <targetTitle>IEEE Std P63198-2775_D6.1_CDV_Mar 2022</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63198-2775-d6-1-cdv-mar-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a414cc6109d6b1d7eca85889</id>
      <fromId>work_ieee_p63253_5713_8_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63253_5713_8_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63253_5713_8_2024</targetId>
      <targetTitle>IEEE Std P63253-5713-8, 2024</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63253-5713-8-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ba8ee08446a2a0636dc59f7b</id>
      <fromId>work_ieee_p63253_5713_8_fdis_feb_2024</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63253_5713_8_fdis_feb_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63253_5713_8_fdis_feb_2024</targetId>
      <targetTitle>IEEE Std P63253-5713-8, FDIS, Feb 2024</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63253-5713-8-fdis-feb-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_481ce6c00d2f066e70250fcb</id>
      <fromId>work_ieee_p63253_5713_8_ed1_sept_2022</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p63253_5713_8_ed1_sept_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p63253_5713_8_ed1_sept_2022</targetId>
      <targetTitle>IEEE Std P63253-5713-8/ED1, Sept 2022</targetTitle>
      <targetUrl>/ja/works/ieee-std-p63253-5713-8-ed1-sept-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/ja/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/ja/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/ja/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/ja/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/ja/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/ja/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/ja/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/ja/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/ja/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_1_1988</fromId>
      <fromTitle>IEEE Std 1003.1-1988</fromTitle>
      <fromUrl>/ja/works/ieee-std-1003-1-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>ja</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>concept_kind</key>
      <label>Concept kind</label>
      <value>テーマ</value>
    </field>
    <field>
      <key>aliases</key>
      <label>Aliases</label>
      <value>IEEE Standards, IEEE Std, 电气电子工程师学会标准</value>
    </field>
    <field>
      <key>scope_note</key>
      <label>Scope note</label>
      <value>本条为总览；各标准号以独立 work 词条著录，勿仅在本条列表省略。</value>
    </field>
  </infoFields>
  <pagination>
    <page>163</page>
    <pageSize>50</pageSize>
    <total>8263</total>
    <pageCount>166</pageCount>
    <prevUrl>/ja/concepts/ieee-standards/relation-162.xml</prevUrl>
    <nextUrl>/ja/concepts/ieee-standards/relation-164.xml</nextUrl>
  </pagination>
  <relationsTotal>8263</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8278</mentionsTotal>
  <mentionsUrl>/ja/concepts/ieee-standards/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>