<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>电气电子工程师学会 · 関係</title>
  <description>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</description>
  <url>/ja/organizations/ieee/relation-105.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>organization_ieee</id>
    <type>organization</type>
    <title>电气电子工程师学会</title>
    <slug>ieee</slug>
    <aliases>
      <alias>IEEE</alias>
      <alias>Institute of Electrical and Electronics Engineers</alias>
      <alias>电气和电子工程师协会</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
      <tag>tag-publishing</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
        <locator>2026-11-01 访问</locator>
      </source>
      <source>
        <id>s2</id>
        <title>IEEE 官方网站</title>
        <author>IEEE</author>
        <url>https://www.ieee.org/</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:52+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:52+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**电气电子工程师学会**（Institute of Electrical and Electronics Engineers，简称 IEEE）是1963年1月1日由美国电气工程师学会（AIEE）与无线电工程师学会（IRE）合并成立的专业技术协会，面向电气工程、电子工程及相关学科[^s1]。&#xA;&#xA;## 沿革&#xA;&#xA;该会可追溯至1884年成立的 AIEE；1912年另成立 IRE。两会于1963年合并为 IEEE[^s1]。总会设在纽约，1975年起主要业务在新泽西州皮斯卡特维的运营中心开展[^s1]。&#xA;&#xA;## 职能与业务&#xA;&#xA;IEEE 发布同行评议期刊与会议录，并通过标准化委员会制定技术标准；相关内容可在 IEEE Xplore 平台检索[^s1][^s3]。标准公开目录（KBART）列出标准编号、题名、状态与题录链接等元数据[^s3]。&#xA;&#xA;## 现状&#xA;&#xA;据公开介绍，该会为美国 501(c)(3) 公益性专业协会，全球会员逾48.6万[^s1]。官网为 https://www.ieee.org/ [^s2]。</body>
    <url>/organizations/ieee.html</url>
    <lang>ja</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <orgKind>专业协会</orgKind>
    <founded>
      <year>1963</year>
      <month>1</month>
      <day>1</day>
      <precision>day</precision>
      <display>1963年1月1日</display>
    </founded>
    <orgStatus>active</orgStatus>
    <headquartersNote>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</headquartersNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_06fb7093fc0f029a9581d09c</id>
      <fromId>work_ieee_26513_2010</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_26513_2010</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_26513_2010</targetId>
      <targetTitle>IEEE Std 26513-2010</targetTitle>
      <targetUrl>/ja/works/ieee-std-26513-2010.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7cc7a9e3814674cb55a3061a</id>
      <fromId>work_ieee_26513_2017_8372829_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_26513_2017_8372829_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_26513_2017_8372829_redline</targetId>
      <targetTitle>IEEE Std 26513-2017</targetTitle>
      <targetUrl>/ja/works/ieee-std-26513-2017-8372829-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_37ee6f049aa3d81a6d3b0b69</id>
      <fromId>work_ieee_26514</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_26514</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_26514</targetId>
      <targetTitle>IEEE Std 26514</targetTitle>
      <targetUrl>/ja/works/ieee-std-26514.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1f83315509a13361c4d3bb48</id>
      <fromId>work_ieee_26514_2010</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_26514_2010</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_26514_2010</targetId>
      <targetTitle>IEEE Std 26514-2010</targetTitle>
      <targetUrl>/ja/works/ieee-std-26514-2010.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_fc06559b594bc2e625f81078</id>
      <fromId>work_ieee_26514_2021_9519583</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_26514_2021_9519583</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_26514_2021_9519583</targetId>
      <targetTitle>IEEE Std 26514-2021</targetTitle>
      <targetUrl>/ja/works/ieee-std-26514-2021-9519583.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4ee63e379fdc42774bbc1089</id>
      <fromId>work_ieee_26515_2012</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_26515_2012</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_26515_2012</targetId>
      <targetTitle>IEEE Std 26515-2012</targetTitle>
      <targetUrl>/ja/works/ieee-std-26515-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_aa7ffa33da476a8792ab87ec</id>
      <fromId>work_ieee_26531_2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_26531_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_26531_2015</targetId>
      <targetTitle>IEEE Std 26531-2015</targetTitle>
      <targetUrl>/ja/works/ieee-std-26531-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_913f28129ceb9722ddff8ee8</id>
      <fromId>work_ieee_26531_2023_10184921_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_26531_2023_10184921_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_26531_2023_10184921_redline</targetId>
      <targetTitle>IEEE Std 26531-2023</targetTitle>
      <targetUrl>/ja/works/ieee-std-26531-2023-10184921-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3c10d340c1341df681192d7b</id>
      <fromId>work_ieee_266_1969</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_266_1969</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_266_1969</targetId>
      <targetTitle>IEEE Std 266-1969</targetTitle>
      <targetUrl>/ja/works/ieee-std-266-1969.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b745df6f3e953db4fa6ad76d</id>
      <fromId>work_ieee_267_1966</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_267_1966</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_267_1966</targetId>
      <targetTitle>IEEE Std 267-1966</targetTitle>
      <targetUrl>/ja/works/ieee-std-267-1966.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_580b944a5199895d2fdc22ff</id>
      <fromId>work_ieee_26702_2007</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_26702_2007</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_26702_2007</targetId>
      <targetTitle>IEEE Std 26702-2007</targetTitle>
      <targetUrl>/ja/works/ieee-std-26702-2007.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_dd738d654c50b256b01f9ef9</id>
      <fromId>work_ieee_268_1966</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_268_1966</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_268_1966</targetId>
      <targetTitle>IEEE Std 268-1966</targetTitle>
      <targetUrl>/ja/works/ieee-std-268-1966.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8c83056c70bab835faa0248c</id>
      <fromId>work_ieee_268_1973</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_268_1973</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_268_1973</targetId>
      <targetTitle>IEEE Std 268-1973</targetTitle>
      <targetUrl>/ja/works/ieee-std-268-1973.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9fe46fc97108d043a4198c81</id>
      <fromId>work_ieee_268_1976</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_268_1976</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_268_1976</targetId>
      <targetTitle>IEEE Std 268-1976</targetTitle>
      <targetUrl>/ja/works/ieee-std-268-1976.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e934d09a8bc90c3e72ab3d23</id>
      <fromId>work_ieee_268_1979</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_268_1979</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_268_1979</targetId>
      <targetTitle>IEEE Std 268-1979</targetTitle>
      <targetUrl>/ja/works/ieee-std-268-1979.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4dfb9a2e0fc874298dbd0691</id>
      <fromId>work_ieee_268_1982</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_268_1982</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_268_1982</targetId>
      <targetTitle>IEEE Std 268-1982</targetTitle>
      <targetUrl>/ja/works/ieee-std-268-1982.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7bd61d6dbfbfd7b1bac91171</id>
      <fromId>work_ieee_268_1992</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_268_1992</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_268_1992</targetId>
      <targetTitle>IEEE Std 268-1992</targetTitle>
      <targetUrl>/ja/works/ieee-std-268-1992.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_240b825b74c159fb35e2dc1f</id>
      <fromId>work_ieee_268a_1980_7843799</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_268a_1980_7843799</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_268a_1980_7843799</targetId>
      <targetTitle>IEEE Std 268A-1980</targetTitle>
      <targetUrl>/ja/works/ieee-std-268a-1980-7843799.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_149b9b7693f4b14627a64293</id>
      <fromId>work_ieee_268a_1980_5795</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_268a_1980_5795</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_268a_1980_5795</targetId>
      <targetTitle>IEEE Std 268A-1980</targetTitle>
      <targetUrl>/ja/works/ieee-std-268a-1980-5795.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_61a0f528e608e9e79f303ee2</id>
      <fromId>work_ieee_269_1966</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_269_1966</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_269_1966</targetId>
      <targetTitle>IEEE Std 269-1966</targetTitle>
      <targetUrl>/ja/works/ieee-std-269-1966.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ed6200bbc0cc7dd9a3038c0c</id>
      <fromId>work_ieee_269_1971</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_269_1971</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_269_1971</targetId>
      <targetTitle>IEEE Std 269-1971</targetTitle>
      <targetUrl>/ja/works/ieee-std-269-1971.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0bcca1c7ca50214194961707</id>
      <fromId>work_ieee_269_1983</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_269_1983</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_269_1983</targetId>
      <targetTitle>IEEE Std 269-1983</targetTitle>
      <targetUrl>/ja/works/ieee-std-269-1983.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2f6cdc7fb412211a36d1a5de</id>
      <fromId>work_ieee_269_1992</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_269_1992</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_269_1992</targetId>
      <targetTitle>IEEE Std 269-1992</targetTitle>
      <targetUrl>/ja/works/ieee-std-269-1992.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3ed5bdf4e8b868084d2b4f7e</id>
      <fromId>work_ieee_269_2002</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_269_2002</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_269_2002</targetId>
      <targetTitle>IEEE Std 269-2002</targetTitle>
      <targetUrl>/ja/works/ieee-std-269-2002.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ca27aa6290e243495a878318</id>
      <fromId>work_ieee_269_2010_5562711</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_269_2010_5562711</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_269_2010_5562711</targetId>
      <targetTitle>IEEE Std 269-2010</targetTitle>
      <targetUrl>/ja/works/ieee-std-269-2010-5562711.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a549580addccd0988baaadf3</id>
      <fromId>work_ieee_269_2010_5953421_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_269_2010_5953421_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_269_2010_5953421_redline</targetId>
      <targetTitle>IEEE Std 269-2010</targetTitle>
      <targetUrl>/ja/works/ieee-std-269-2010-5953421-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_18bdef5fa9c40af210fa6436</id>
      <fromId>work_ieee_269a_2007</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_269a_2007</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_269a_2007</targetId>
      <targetTitle>IEEE Std 269a-2007</targetTitle>
      <targetUrl>/ja/works/ieee-std-269a-2007.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d14620c48ac792afef7997d2</id>
      <fromId>work_ieee_269a_2012</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_269a_2012</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_269a_2012</targetId>
      <targetTitle>IEEE Std 269a-2012</targetTitle>
      <targetUrl>/ja/works/ieee-std-269a-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_58d564a59c82fc705433f891</id>
      <fromId>work_ieee_27_1930</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_27_1930</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_27_1930</targetId>
      <targetTitle>IEEE Std 27-1930</targetTitle>
      <targetUrl>/ja/works/ieee-std-27-1930.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6eb5ddf6e55e34fd264190b8</id>
      <fromId>work_ieee_27_1942</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_27_1942</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_27_1942</targetId>
      <targetTitle>IEEE Std 27-1942</targetTitle>
      <targetUrl>/ja/works/ieee-std-27-1942.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b902bff966e0755ea1f64c14</id>
      <fromId>work_ieee_270_1966</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_270_1966</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_270_1966</targetId>
      <targetTitle>IEEE Std 270-1966</targetTitle>
      <targetUrl>/ja/works/ieee-std-270-1966.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a698d717614b792accef79d4</id>
      <fromId>work_ieee_270_2006</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_270_2006</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_270_2006</targetId>
      <targetTitle>IEEE Std 270-2006</targetTitle>
      <targetUrl>/ja/works/ieee-std-270-2006.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c9bbb6eec743976954cf964c</id>
      <fromId>work_ieee_2700_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_2700_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_2700_2014</targetId>
      <targetTitle>IEEE Std 2700-2014</targetTitle>
      <targetUrl>/ja/works/ieee-std-2700-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a105426bfb737a05f4901d84</id>
      <fromId>work_ieee_271_1966</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_271_1966</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_271_1966</targetId>
      <targetTitle>IEEE Std 271-1966</targetTitle>
      <targetUrl>/ja/works/ieee-std-271-1966.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_01ac0b531ce5786fb2244639</id>
      <fromId>work_ieee_2716_2022_9913395</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_2716_2022_9913395</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_2716_2022_9913395</targetId>
      <targetTitle>IEEE Std 2716-2022</targetTitle>
      <targetUrl>/ja/works/ieee-std-2716-2022-9913395.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ab17b16be792205fba371f83</id>
      <fromId>work_ieee_272_1970</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_272_1970</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_272_1970</targetId>
      <targetTitle>IEEE Std 272-1970</targetTitle>
      <targetUrl>/ja/works/ieee-std-272-1970.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a9e559cff72fb9ce501c9d6a</id>
      <fromId>work_ieee_273_1967</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_273_1967</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_273_1967</targetId>
      <targetTitle>IEEE Std 273-1967</targetTitle>
      <targetUrl>/ja/works/ieee-std-273-1967.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_79c79f90262a4e69f9d62c76</id>
      <fromId>work_ieee_274_1966</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_274_1966</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_274_1966</targetId>
      <targetTitle>IEEE Std 274-1966</targetTitle>
      <targetUrl>/ja/works/ieee-std-274-1966.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_87dcb1aab0d6805146e76d1e</id>
      <fromId>work_ieee_2745_4_2022_9853247</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_2745_4_2022_9853247</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_2745_4_2022_9853247</targetId>
      <targetTitle>IEEE Std 2745.4-2022</targetTitle>
      <targetUrl>/ja/works/ieee-std-2745-4-2022-9853247.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7710a40cb37b13ada693522c</id>
      <fromId>work_ieee_p187_d1_apr_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p187_d1_apr_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p187_d1_apr_2017</targetId>
      <targetTitle>IEEE Std P187/D1, Apr 2017</targetTitle>
      <targetUrl>/ja/works/ieee-std-p187-d1-apr-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7a455e2cfab108d87708c498</id>
      <fromId>work_ieee_p187_d2_nov_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p187_d2_nov_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p187_d2_nov_2017</targetId>
      <targetTitle>IEEE Std P187/D2, Nov 2017</targetTitle>
      <targetUrl>/ja/works/ieee-std-p187-d2-nov-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f1cb453002d9ab3e2487c97e</id>
      <fromId>work_ieee_p1870_d7_oct_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1870_d7_oct_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1870_d7_oct_2018</targetId>
      <targetTitle>IEEE Std P1870/D7, Oct 2018</targetTitle>
      <targetUrl>/ja/works/ieee-std-p1870-d7-oct-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_648798c0f430525d00544f3b</id>
      <fromId>work_ieee_p1871_1_d4_apr_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1871_1_d4_apr_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1871_1_d4_apr_2014</targetId>
      <targetTitle>IEEE Std P1871.1/D4, Apr 2014</targetTitle>
      <targetUrl>/ja/works/ieee-std-p1871-1-d4-apr-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8b57df05e82c43018b7ea175</id>
      <fromId>work_ieee_p1871_2_d18_august_2016</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1871_2_d18_august_2016</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1871_2_d18_august_2016</targetId>
      <targetTitle>IEEE Std P1871.2/D18, August 2016</targetTitle>
      <targetUrl>/ja/works/ieee-std-p1871-2-d18-august-2016.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a8456a80bc02e2f72237a8bd</id>
      <fromId>work_ieee_p1871_2_d22_apr_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1871_2_d22_apr_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1871_2_d22_apr_2017</targetId>
      <targetTitle>IEEE Std P1871.2/D22, Apr 2017</targetTitle>
      <targetUrl>/ja/works/ieee-std-p1871-2-d22-apr-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_00c6171046e129d9d43e5c91</id>
      <fromId>work_ieee_p1872_1_d5_oct_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1872_1_d5_oct_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1872_1_d5_oct_2023</targetId>
      <targetTitle>IEEE Std P1872.1/D5, Oct 2023</targetTitle>
      <targetUrl>/ja/works/ieee-std-p1872-1-d5-oct-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9e0f3278bc874cb510d490bc</id>
      <fromId>work_ieee_p1872_2_d1_jun_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1872_2_d1_jun_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1872_2_d1_jun_2021</targetId>
      <targetTitle>IEEE Std P1872.2/D1, Jun 2021</targetTitle>
      <targetUrl>/ja/works/ieee-std-p1872-2-d1-jun-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9bfbe72f800223ff58342de9</id>
      <fromId>work_ieee_p1872_2_d2_aug_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1872_2_d2_aug_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1872_2_d2_aug_2021</targetId>
      <targetTitle>IEEE Std P1872.2/D2, Aug 2021</targetTitle>
      <targetUrl>/ja/works/ieee-std-p1872-2-d2-aug-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_57ffe551a61620a0efcf98ad</id>
      <fromId>work_ieee_p1872_d2_aug_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1872_d2_aug_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1872_d2_aug_2014</targetId>
      <targetTitle>IEEE Std P1872/D2, Aug 2014</targetTitle>
      <targetUrl>/ja/works/ieee-std-p1872-d2-aug-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b34bedf47f88691c182e0ddc</id>
      <fromId>work_ieee_p1872_d3_august_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1872_d3_august_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1872_d3_august_2014</targetId>
      <targetTitle>IEEE Std P1872/D3, August 2014</targetTitle>
      <targetUrl>/ja/works/ieee-std-p1872-d3-august-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>concept_ieee_standards</fromId>
      <fromTitle>IEEE 标准</fromTitle>
      <fromUrl>/ja/concepts/ieee-standards.html</fromUrl>
      <fromType>concept</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/ja/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/ja/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/ja/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/ja/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/ja/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/ja/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/ja/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/ja/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/ja/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>ja</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>org_kind</key>
      <label>Organization kind</label>
      <value>专业协会</value>
    </field>
    <field>
      <key>founded</key>
      <label>Founded</label>
      <value>1963年1月1日</value>
    </field>
    <field>
      <key>org_status</key>
      <label>Status</label>
      <value>存続</value>
    </field>
    <field>
      <key>headquarters_note</key>
      <label>Headquarters</label>
      <value>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</value>
    </field>
  </infoFields>
  <pagination>
    <page>105</page>
    <pageSize>50</pageSize>
    <total>8265</total>
    <pageCount>166</pageCount>
    <prevUrl>/ja/organizations/ieee/relation-104.xml</prevUrl>
    <nextUrl>/ja/organizations/ieee/relation-106.xml</nextUrl>
  </pagination>
  <relationsTotal>8265</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8279</mentionsTotal>
  <mentionsUrl>/ja/organizations/ieee/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>