<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>电气电子工程师学会 · 関係</title>
  <description>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</description>
  <url>/ja/organizations/ieee/relation-46.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>organization_ieee</id>
    <type>organization</type>
    <title>电气电子工程师学会</title>
    <slug>ieee</slug>
    <aliases>
      <alias>IEEE</alias>
      <alias>Institute of Electrical and Electronics Engineers</alias>
      <alias>电气和电子工程师协会</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
      <tag>tag-publishing</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
        <locator>2026-11-01 访问</locator>
      </source>
      <source>
        <id>s2</id>
        <title>IEEE 官方网站</title>
        <author>IEEE</author>
        <url>https://www.ieee.org/</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:52+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:52+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**电气电子工程师学会**（Institute of Electrical and Electronics Engineers，简称 IEEE）是1963年1月1日由美国电气工程师学会（AIEE）与无线电工程师学会（IRE）合并成立的专业技术协会，面向电气工程、电子工程及相关学科[^s1]。&#xA;&#xA;## 沿革&#xA;&#xA;该会可追溯至1884年成立的 AIEE；1912年另成立 IRE。两会于1963年合并为 IEEE[^s1]。总会设在纽约，1975年起主要业务在新泽西州皮斯卡特维的运营中心开展[^s1]。&#xA;&#xA;## 职能与业务&#xA;&#xA;IEEE 发布同行评议期刊与会议录，并通过标准化委员会制定技术标准；相关内容可在 IEEE Xplore 平台检索[^s1][^s3]。标准公开目录（KBART）列出标准编号、题名、状态与题录链接等元数据[^s3]。&#xA;&#xA;## 现状&#xA;&#xA;据公开介绍，该会为美国 501(c)(3) 公益性专业协会，全球会员逾48.6万[^s1]。官网为 https://www.ieee.org/ [^s2]。</body>
    <url>/organizations/ieee.html</url>
    <lang>ja</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <orgKind>专业协会</orgKind>
    <founded>
      <year>1963</year>
      <month>1</month>
      <day>1</day>
      <precision>day</precision>
      <display>1963年1月1日</display>
    </founded>
    <orgStatus>active</orgStatus>
    <headquartersNote>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</headquartersNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_605366b22d86616b8bddbc48</id>
      <fromId>work_ieee_pc57_141_d9_mar_2026</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc57_141_d9_mar_2026</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc57_141_d9_mar_2026</targetId>
      <targetTitle>IEEE Std PC57.141/D9, Mar 2026</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc57-141-d9-mar-2026.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_704c8fbf65c3d9e3994f9056</id>
      <fromId>work_ieee_pc57_156_d4_1_september_2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc57_156_d4_1_september_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc57_156_d4_1_september_2015</targetId>
      <targetTitle>IEEE Std PC57.156/D4.1, September 2015</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc57-156-d4-1-september-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f5cae4383a31b4332bdf2be8</id>
      <fromId>work_ieee_pc57_157_d6_2_may_2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc57_157_d6_2_may_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc57_157_d6_2_may_2015</targetId>
      <targetTitle>IEEE Std PC57.157/D6.2, May 2015</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc57-157-d6-2-may-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7bbd214188ea6c39d5d1af70</id>
      <fromId>work_ieee_pc57_158_d3_2_jun_2026</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc57_158_d3_2_jun_2026</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc57_158_d3_2_jun_2026</targetId>
      <targetTitle>IEEE Std PC57.158/D3.2, Jun 2026</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc57-158-d3-2-jun-2026.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_80bca478c7dfaa1d4959fcf2</id>
      <fromId>work_ieee_pc57_17_d2_4_oct_2026</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc57_17_d2_4_oct_2026</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc57_17_d2_4_oct_2026</targetId>
      <targetTitle>IEEE Std PC57.17/D2.4, Oct 2026</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc57-17-d2-4-oct-2026.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b4be5cd880929991c19cd7ad</id>
      <fromId>work_ieee_pc57_18_10_d14_sept_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc57_18_10_d14_sept_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc57_18_10_d14_sept_2021</targetId>
      <targetTitle>IEEE Std PC57.18.10/D14, Sept 2021</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc57-18-10-d14-sept-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_09ae12c9b4f32eba14362824</id>
      <fromId>work_ieee_pc57_19_00a_d1_jul_2026</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc57_19_00a_d1_jul_2026</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc57_19_00a_d1_jul_2026</targetId>
      <targetTitle>IEEE Std PC57.19.00a/D1, Jul 2026</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc57-19-00a-d1-jul-2026.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b8c9aeb81979971db54f4e79</id>
      <fromId>work_ieee_pc57_19_01_d2_aug_2026</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc57_19_01_d2_aug_2026</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc57_19_01_d2_aug_2026</targetId>
      <targetTitle>IEEE Std PC57.19.01/D2, Aug 2026</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc57-19-01-d2-aug-2026.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_866e3bf50cd20be1ea2fa805</id>
      <fromId>work_ieee_pc57_19_04_d4_oct_2026</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc57_19_04_d4_oct_2026</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc57_19_04_d4_oct_2026</targetId>
      <targetTitle>IEEE Std PC57.19.04/D4, Oct 2026</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc57-19-04-d4-oct-2026.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d24c9e6b6602eaedf607aaaf</id>
      <fromId>work_ieee_pc57_32_d16_2_sept_2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc57_32_d16_2_sept_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc57_32_d16_2_sept_2015</targetId>
      <targetTitle>IEEE Std PC57.32/D16.2, Sept 2015</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc57-32-d16-2-sept-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4be1c2f2945f3892843183a6</id>
      <fromId>work_ieee_pc57_32_d4_jun_2026</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc57_32_d4_jun_2026</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc57_32_d4_jun_2026</targetId>
      <targetTitle>IEEE Std PC57.32/D4, Jun 2026</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc57-32-d4-jun-2026.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_dd1ecaaa94cd3e322696474e</id>
      <fromId>work_ieee_pc57_637_d6_2_mar_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc57_637_d6_2_mar_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc57_637_d6_2_mar_2014</targetId>
      <targetTitle>IEEE Std PC57.637/D6.2. Mar 2014</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc57-637-d6-2-mar-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_63325c3b283b0c55648cdac7</id>
      <fromId>work_ieee_pc57_94_d10_apr_2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc57_94_d10_apr_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc57_94_d10_apr_2015</targetId>
      <targetTitle>IEEE Std PC57.94/D10, Apr 2015</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc57-94-d10-apr-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2724294b85317db4d34df025</id>
      <fromId>work_ieee_pc57_96_d3_jan_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc57_96_d3_jan_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc57_96_d3_jan_2025</targetId>
      <targetTitle>IEEE Std PC57.96/D3, Jan 2025</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc57-96-d3-jan-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f1d4bfafc952b59fcf5ca8da</id>
      <fromId>work_ieee_pc57_98_d3_apr_2026</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc57_98_d3_apr_2026</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc57_98_d3_apr_2026</targetId>
      <targetTitle>IEEE Std PC57.98/D3, Apr 2026</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc57-98-d3-apr-2026.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3b75e0b37952f4b92daf9aff</id>
      <fromId>work_ieee_pc62_21_d5_aug_2026</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc62_21_d5_aug_2026</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc62_21_d5_aug_2026</targetId>
      <targetTitle>IEEE Std PC62.21/D5, Aug 2026</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc62-21-d5-aug-2026.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bba64fdd8c7af32a4be86d94</id>
      <fromId>work_ieee_pc62_220_d8_apr_2024</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc62_220_d8_apr_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc62_220_d8_apr_2024</targetId>
      <targetTitle>IEEE Std PC62.220/D8, Apr 2024</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc62-220-d8-apr-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_11bd7938556e536c6dab0ea6</id>
      <fromId>work_ieee_pc62_72_d5_feb_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc62_72_d5_feb_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc62_72_d5_feb_2014</targetId>
      <targetTitle>IEEE Std PC62.72/D5, Feb 2014</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc62-72-d5-feb-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_837f881b11fc17285619df39</id>
      <fromId>work_ieee_pc62_92_2_d6_dec_2016</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc62_92_2_d6_dec_2016</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc62_92_2_d6_dec_2016</targetId>
      <targetTitle>IEEE Std PC62.92.2/D6, Dec 2016</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc62-92-2-d6-dec-2016.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_511ace9d782816e9d2b5e5ec</id>
      <fromId>work_ieee_pc62_92_4_d4_jun_2026</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc62_92_4_d4_jun_2026</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc62_92_4_d4_jun_2026</targetId>
      <targetTitle>IEEE Std PC62.92.4/D4, Jun 2026</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc62-92-4-d4-jun-2026.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bf7dd380a2808f508e701213</id>
      <fromId>work_ieee_pc62_92_4_d6_2_sept_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc62_92_4_d6_2_sept_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc62_92_4_d6_2_sept_2014</targetId>
      <targetTitle>IEEE Std PC62.92.4/D6.2, Sept 2014</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc62-92-4-d6-2-sept-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_02fbc9b3646066819f62d891</id>
      <fromId>work_ieee_pc63_2_d5_mar_2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pc63_2_d5_mar_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pc63_2_d5_mar_2015</targetId>
      <targetTitle>IEEE Std PC63.2/D5, Mar 2015</targetTitle>
      <targetUrl>/ja/works/ieee-std-pc63-2-d5-mar-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3a0f5d868fd6b8d9b95a5d72</id>
      <fromId>work_ieee_pn42_32_d1_4_aug_2026</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pn42_32_d1_4_aug_2026</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pn42_32_d1_4_aug_2026</targetId>
      <targetTitle>IEEE Std PN42.32/D1.4, Aug 2026</targetTitle>
      <targetUrl>/ja/works/ieee-std-pn42-32-d1-4-aug-2026.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b6a1caac060a9715b0438b70</id>
      <fromId>work_ieee_pn42_37_d1_2_may_2026</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_pn42_37_d1_2_may_2026</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_pn42_37_d1_2_may_2026</targetId>
      <targetTitle>IEEE Std PN42.37/D1.2, May 2026</targetTitle>
      <targetUrl>/ja/works/ieee-std-pn42-37-d1-2-may-2026.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8d999326eb711a3e94062fcb</id>
      <fromId>work_ieee_rdd_10_2006</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_10_2006</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_10_2006</targetId>
      <targetTitle>IEEE Std RDD 10:2006</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-10-2006.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a246b75cf8175c4285acbb2b</id>
      <fromId>work_ieee_rdd_11_2007</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_11_2007</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_11_2007</targetId>
      <targetTitle>IEEE Std RDD 11:2007</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-11-2007.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_5d752cac70d9ec5691b02d93</id>
      <fromId>work_ieee_rdd_14_2010</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_14_2010</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_14_2010</targetId>
      <targetTitle>IEEE Std RDD 14:2010</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-14-2010.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_498cba338e91e5c1bb8c6788</id>
      <fromId>work_ieee_rdd_15_2007</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_15_2007</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_15_2007</targetId>
      <targetTitle>IEEE Std RDD 15:2007</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-15-2007.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e3f2635b04d31aa85bac72f6</id>
      <fromId>work_ieee_rdd_16_2008</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_16_2008</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_16_2008</targetId>
      <targetTitle>IEEE Std RDD 16:2008</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-16-2008.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8108f3e89414365eff71fcb4</id>
      <fromId>work_ieee_rdd_17_2009</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_17_2009</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_17_2009</targetId>
      <targetTitle>IEEE Std RDD 17:2009</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-17-2009.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_5172e071d076bfe82e7d951f</id>
      <fromId>work_ieee_rdd_18_2010</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_18_2010</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_18_2010</targetId>
      <targetTitle>IEEE Std RDD 18:2010</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-18-2010.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3e81c2259ecce87c14e898be</id>
      <fromId>work_ieee_rdd_18_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_18_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_18_2021</targetId>
      <targetTitle>IEEE Std RDD 18:2021</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-18-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ed821374c0ad35ca2432d03f</id>
      <fromId>work_ieee_rdd_19_2011</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_19_2011</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_19_2011</targetId>
      <targetTitle>IEEE Std RDD 19:2011</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-19-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_17423fcfcb96e9fca66e456a</id>
      <fromId>work_ieee_rdd_1_2003</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_1_2003</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_1_2003</targetId>
      <targetTitle>IEEE Std RDD 1:2003</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-1-2003.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_06b3037d0c6e80eb1be13f44</id>
      <fromId>work_ieee_rdd_20_2010</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_20_2010</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_20_2010</targetId>
      <targetTitle>IEEE Std RDD 20:2010</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-20-2010.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e06df63839bc65d7849af411</id>
      <fromId>work_ieee_rdd_22_2012</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_22_2012</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_22_2012</targetId>
      <targetTitle>IEEE Std RDD 22:2012</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-22-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bd5e9f3cc9fab9d04edf893e</id>
      <fromId>work_ieee_rdd_24_2013</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_24_2013</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_24_2013</targetId>
      <targetTitle>IEEE Std RDD 24:2013</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-24-2013.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9f0af74a2b3843298997ba35</id>
      <fromId>work_ieee_rdd_25_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_25_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_25_2014</targetId>
      <targetTitle>IEEE Std RDD 25:2014</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-25-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8e18e2db788d56f122e95dc3</id>
      <fromId>work_ieee_rdd_26_2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_26_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_26_2015</targetId>
      <targetTitle>IEEE Std RDD 26:2015</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-26-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ef57c687bb64404ed1ba8ce8</id>
      <fromId>work_ieee_rdd_28_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_28_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_28_2014</targetId>
      <targetTitle>IEEE Std RDD 28:2014</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-28-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2630b9a8eb9f8d750056fd54</id>
      <fromId>work_ieee_rdd_29_2019</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_29_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_29_2019</targetId>
      <targetTitle>IEEE Std RDD 29:2019</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-29-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_33a90d659ccb1889c5ce4ca0</id>
      <fromId>work_ieee_rdd_2_2007</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_2_2007</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_2_2007</targetId>
      <targetTitle>IEEE Std RDD 2:2007</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-2-2007.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6c626aa4448e9deee22084fb</id>
      <fromId>work_ieee_rdd_30_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_30_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_30_2014</targetId>
      <targetTitle>IEEE Std RDD 30:2014</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-30-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1bd77ea3bbf9a99af8e50957</id>
      <fromId>work_ieee_rdd_31_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_31_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_31_2014</targetId>
      <targetTitle>IEEE Std RDD 31:2014</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-31-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_dc9f52d7d24480141186ec64</id>
      <fromId>work_ieee_rdd_32_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_32_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_32_2017</targetId>
      <targetTitle>IEEE Std RDD 32:2017</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-32-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d0812beb3c2c5099a8796b6b</id>
      <fromId>work_ieee_rdd_33_2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_33_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_33_2015</targetId>
      <targetTitle>IEEE Std RDD 33:2015</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-33-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_054b854de011ccf73839a775</id>
      <fromId>work_ieee_rdd_34_2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_34_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_34_2015</targetId>
      <targetTitle>IEEE Std RDD 34:2015</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-34-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_53a2324cee408c1c5216ed20</id>
      <fromId>work_ieee_rdd_35_2016</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_35_2016</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_35_2016</targetId>
      <targetTitle>IEEE Std RDD 35:2016</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-35-2016.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7fe8d1cba2e581fa265631d6</id>
      <fromId>work_ieee_rdd_36_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_36_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_36_2022</targetId>
      <targetTitle>IEEE Std RDD 36:2022</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-36-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_629596c23124ff5b1c5ee0f8</id>
      <fromId>work_ieee_rdd_38_2016</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_rdd_38_2016</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_rdd_38_2016</targetId>
      <targetTitle>IEEE Std RDD 38:2016</targetTitle>
      <targetUrl>/ja/works/ieee-std-rdd-38-2016.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>concept_ieee_standards</fromId>
      <fromTitle>IEEE 标准</fromTitle>
      <fromUrl>/ja/concepts/ieee-standards.html</fromUrl>
      <fromType>concept</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/ja/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/ja/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/ja/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/ja/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/ja/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/ja/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/ja/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/ja/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/ja/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>ja</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>org_kind</key>
      <label>Organization kind</label>
      <value>专业协会</value>
    </field>
    <field>
      <key>founded</key>
      <label>Founded</label>
      <value>1963年1月1日</value>
    </field>
    <field>
      <key>org_status</key>
      <label>Status</label>
      <value>存続</value>
    </field>
    <field>
      <key>headquarters_note</key>
      <label>Headquarters</label>
      <value>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</value>
    </field>
  </infoFields>
  <pagination>
    <page>46</page>
    <pageSize>50</pageSize>
    <total>8265</total>
    <pageCount>166</pageCount>
    <prevUrl>/ja/organizations/ieee/relation-45.xml</prevUrl>
    <nextUrl>/ja/organizations/ieee/relation-47.xml</nextUrl>
  </pagination>
  <relationsTotal>8265</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8279</mentionsTotal>
  <mentionsUrl>/ja/organizations/ieee/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>