<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>电气电子工程师学会 · 関係</title>
  <description>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</description>
  <url>/ja/organizations/ieee/relation-57.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>organization_ieee</id>
    <type>organization</type>
    <title>电气电子工程师学会</title>
    <slug>ieee</slug>
    <aliases>
      <alias>IEEE</alias>
      <alias>Institute of Electrical and Electronics Engineers</alias>
      <alias>电气和电子工程师协会</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
      <tag>tag-publishing</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
        <locator>2026-11-01 访问</locator>
      </source>
      <source>
        <id>s2</id>
        <title>IEEE 官方网站</title>
        <author>IEEE</author>
        <url>https://www.ieee.org/</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:52+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:52+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**电气电子工程师学会**（Institute of Electrical and Electronics Engineers，简称 IEEE）是1963年1月1日由美国电气工程师学会（AIEE）与无线电工程师学会（IRE）合并成立的专业技术协会，面向电气工程、电子工程及相关学科[^s1]。&#xA;&#xA;## 沿革&#xA;&#xA;该会可追溯至1884年成立的 AIEE；1912年另成立 IRE。两会于1963年合并为 IEEE[^s1]。总会设在纽约，1975年起主要业务在新泽西州皮斯卡特维的运营中心开展[^s1]。&#xA;&#xA;## 职能与业务&#xA;&#xA;IEEE 发布同行评议期刊与会议录，并通过标准化委员会制定技术标准；相关内容可在 IEEE Xplore 平台检索[^s1][^s3]。标准公开目录（KBART）列出标准编号、题名、状态与题录链接等元数据[^s3]。&#xA;&#xA;## 现状&#xA;&#xA;据公开介绍，该会为美国 501(c)(3) 公益性专业协会，全球会员逾48.6万[^s1]。官网为 https://www.ieee.org/ [^s2]。</body>
    <url>/organizations/ieee.html</url>
    <lang>ja</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <orgKind>专业协会</orgKind>
    <founded>
      <year>1963</year>
      <month>1</month>
      <day>1</day>
      <precision>day</precision>
      <display>1963年1月1日</display>
    </founded>
    <orgStatus>active</orgStatus>
    <headquartersNote>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</headquartersNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_b888c680bacc98cbdffdaf90</id>
      <fromId>work_ieee_st_209_1996</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_209_1996</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_209_1996</targetId>
      <targetTitle>IEEE Std ST 209:1996</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-209-1996.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_025699174e301bc712efdc53</id>
      <fromId>work_ieee_st_20_2003</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_20_2003</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_20_2003</targetId>
      <targetTitle>IEEE Std ST 20:2003</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-20-2003.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_83732574df73caa7d634ceee</id>
      <fromId>work_ieee_st_2100_1_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2100_1_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2100_1_2017</targetId>
      <targetTitle>IEEE Std ST 2100-1:2017</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2100-1-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c6b8d1892d5e0a270d6bd9e2</id>
      <fromId>work_ieee_st_2101_2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2101_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2101_2015</targetId>
      <targetTitle>IEEE Std ST 2101:2015</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2101-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_18ba234e1a6b5353aa0fd0a8</id>
      <fromId>work_ieee_st_2102_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2102_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2102_2017</targetId>
      <targetTitle>IEEE Std ST 2102:2017</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2102-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6a70a656dab18d9f3d4348d0</id>
      <fromId>work_ieee_st_2106_2016</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2106_2016</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2106_2016</targetId>
      <targetTitle>IEEE Std ST 2106:2016</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2106-2016.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c5d85f254fad41c9896bdfee</id>
      <fromId>work_ieee_st_2108_1_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2108_1_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2108_1_2018</targetId>
      <targetTitle>IEEE Std ST 2108-1:2018</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2108-1-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8d005cbcab4968a647d6604b</id>
      <fromId>work_ieee_st_2108_2_2019</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2108_2_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2108_2_2019</targetId>
      <targetTitle>IEEE Std ST 2108-2:2019</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2108-2-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_dde0892bf4540fbdc7b672dc</id>
      <fromId>work_ieee_st_2109_2019</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2109_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2109_2019</targetId>
      <targetTitle>IEEE Std ST 2109:2019</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2109-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_efb08a4b010fd51b3d7c2b87</id>
      <fromId>work_ieee_st_210_2004</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_210_2004</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_210_2004</targetId>
      <targetTitle>IEEE Std ST 210:2004</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-210-2004.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a323251608b4fdb4a7ed76a9</id>
      <fromId>work_ieee_st_2110_10_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2110_10_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2110_10_2022</targetId>
      <targetTitle>IEEE Std ST 2110-10:2022</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2110-10-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_185b30994678f49f7f73278f</id>
      <fromId>work_ieee_st_2110_20_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2110_20_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2110_20_2022</targetId>
      <targetTitle>IEEE Std ST 2110-20:2022</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2110-20-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8e6cf1056b9a96feec7504e9</id>
      <fromId>work_ieee_st_2110_21_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2110_21_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2110_21_2022</targetId>
      <targetTitle>IEEE Std ST 2110-21:2022</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2110-21-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_dd0b03c3a23b90c467d598e3</id>
      <fromId>work_ieee_st_2110_22_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2110_22_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2110_22_2022</targetId>
      <targetTitle>IEEE Std ST 2110-22:2022</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2110-22-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bac928bb61bd496a8cb8202a</id>
      <fromId>work_ieee_st_2110_30_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2110_30_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2110_30_2017</targetId>
      <targetTitle>IEEE Std ST 2110-30:2017</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2110-30-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_20ca5957ebf2c73a34ffc761</id>
      <fromId>work_ieee_st_2110_31_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2110_31_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2110_31_2022</targetId>
      <targetTitle>IEEE Std ST 2110-31:2022</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2110-31-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0d8ad5adb76d472aa6271976</id>
      <fromId>work_ieee_st_2110_40_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2110_40_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2110_40_2023</targetId>
      <targetTitle>IEEE Std ST 2110-40:2023</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2110-40-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a69233e4c00480a806d1c9b2</id>
      <fromId>work_ieee_st_2110_41_2024</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2110_41_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2110_41_2024</targetId>
      <targetTitle>IEEE Std ST 2110-41-2024</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2110-41-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_38a714712d58882f9a01dedd</id>
      <fromId>work_ieee_st_2112_20_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2112_20_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2112_20_2018</targetId>
      <targetTitle>IEEE Std ST 2112-20:2018</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2112-20-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d347a5a1c12666ff2da84965</id>
      <fromId>work_ieee_st_2112_20_2020</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2112_20_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2112_20_2020</targetId>
      <targetTitle>IEEE Std ST 2112-20:2020</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2112-20-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9b80f60edf6e63a9156a7e40</id>
      <fromId>work_ieee_st_2113_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2113_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2113_2018</targetId>
      <targetTitle>IEEE Std ST 2113:2018</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2113-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7dd5a39da4d1ecedc281a6b8</id>
      <fromId>work_ieee_st_2114_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2114_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2114_2017</targetId>
      <targetTitle>IEEE Std ST 2114:2017</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2114-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0e2bb335bbe5aa96cf525ab0</id>
      <fromId>work_ieee_st_2115_2019</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2115_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2115_2019</targetId>
      <targetTitle>IEEE Std ST 2115:2019</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2115-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_46a7bcd2008c876b3819cb42</id>
      <fromId>work_ieee_st_2115_2020</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2115_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2115_2020</targetId>
      <targetTitle>IEEE Std ST 2115:2020</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2115-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_fcdb84a28e3b947b4d9f2f21</id>
      <fromId>work_ieee_st_2116_2019</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2116_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2116_2019</targetId>
      <targetTitle>IEEE Std ST 2116:2019</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2116-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_dda16c0d510fbf3d4aab1cfe</id>
      <fromId>work_ieee_st_2117_1_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2117_1_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2117_1_2023</targetId>
      <targetTitle>IEEE Std ST 2117-1:2023</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2117-1-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b3a3ddc0ff51b2dd290a3645</id>
      <fromId>work_ieee_st_211_2001</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_211_2001</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_211_2001</targetId>
      <targetTitle>IEEE Std ST 211:2001</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-211-2001.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d10890c8be2498d30bdb7202</id>
      <fromId>work_ieee_st_2122_2020</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2122_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2122_2020</targetId>
      <targetTitle>IEEE Std ST 2122:2020</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2122-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_efa460e4630faf9a65a0b8ab</id>
      <fromId>work_ieee_st_2123_2023_04</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2123_2023_04</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2123_2023_04</targetId>
      <targetTitle>IEEE Std ST 2123:2023-04</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2123-2023-04.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d8209d3d2c063bdad4fe55b5</id>
      <fromId>work_ieee_st_2123_2024_05</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2123_2024_05</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2123_2024_05</targetId>
      <targetTitle>IEEE Std ST 2123:2024-05</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2123-2024-05.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_5d641e4b9e47311c44325ffd</id>
      <fromId>work_ieee_st_2124_2020</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2124_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2124_2020</targetId>
      <targetTitle>IEEE Std ST 2124:2020</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2124-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a07ca0f952ce416b6cc2b759</id>
      <fromId>work_ieee_st_2127_10_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2127_10_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2127_10_2022</targetId>
      <targetTitle>IEEE Std ST 2127-10:2022</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2127-10-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b5d8fb1fe8c55219ed216a73</id>
      <fromId>work_ieee_st_2127_1_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2127_1_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2127_1_2022</targetId>
      <targetTitle>IEEE Std ST 2127-1:2022</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2127-1-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3d011be56272318c322948e9</id>
      <fromId>work_ieee_st_2127_2_2024</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_2127_2_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_2127_2_2024</targetId>
      <targetTitle>IEEE Std ST 2127-2-2024</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-2127-2-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2932a058157847b71bbbeed0</id>
      <fromId>work_ieee_st_212_1995</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_212_1995</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_212_1995</targetId>
      <targetTitle>IEEE Std ST 212:1995</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-212-1995.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_fc6cdbc04225ca4367d2c064</id>
      <fromId>work_ieee_st_214_2007</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_214_2007</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_214_2007</targetId>
      <targetTitle>IEEE Std ST 214:2007</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-214-2007.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8734c0c15ad38f9d1aab8e86</id>
      <fromId>work_ieee_st_215_1995</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_215_1995</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_215_1995</targetId>
      <targetTitle>IEEE Std ST 215:1995</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-215-1995.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_07461509969d1d136954d55f</id>
      <fromId>work_ieee_st_216_1998</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_216_1998</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_216_1998</targetId>
      <targetTitle>IEEE Std ST 216:1998</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-216-1998.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d6d060396de4df30c95b44fe</id>
      <fromId>work_ieee_st_218_1996</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_218_1996</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_218_1996</targetId>
      <targetTitle>IEEE Std ST 218:1996</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-218-1996.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_075a11e1c45cb81fd7e3610b</id>
      <fromId>work_ieee_st_21_1997</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_21_1997</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_21_1997</targetId>
      <targetTitle>IEEE Std ST 21:1997</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-21-1997.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_afeeb92dd63c34bd142841d9</id>
      <fromId>work_ieee_st_220_1996</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_220_1996</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_220_1996</targetId>
      <targetTitle>IEEE Std ST 220:1996</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-220-1996.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_339d80019959f29525dc7841</id>
      <fromId>work_ieee_st_221_2003</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_221_2003</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_221_2003</targetId>
      <targetTitle>IEEE Std ST 221:2003</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-221-2003.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_68e1512565dc7f01d37e94d1</id>
      <fromId>work_ieee_st_222_1994</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_222_1994</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_222_1994</targetId>
      <targetTitle>IEEE Std ST 222:1994</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-222-1994.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f1390cd0d2f3f9cf745874d3</id>
      <fromId>work_ieee_st_223_2001</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_223_2001</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_223_2001</targetId>
      <targetTitle>IEEE Std ST 223:2001</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-223-2001.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_52397861a4efc3e35e1aec1e</id>
      <fromId>work_ieee_st_224_2003</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_224_2003</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_224_2003</targetId>
      <targetTitle>IEEE Std ST 224:2003</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-224-2003.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7a0531bb908b77d0a61ff4b2</id>
      <fromId>work_ieee_st_225_2003</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_225_2003</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_225_2003</targetId>
      <targetTitle>IEEE Std ST 225:2003</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-225-2003.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_46d49d42006399ed40a8593b</id>
      <fromId>work_ieee_st_226_1996</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_226_1996</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_226_1996</targetId>
      <targetTitle>IEEE Std ST 226:1996</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-226-1996.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2b37991a8613a28b553c57a1</id>
      <fromId>work_ieee_st_227_1996</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_227_1996</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_227_1996</targetId>
      <targetTitle>IEEE Std ST 227:1996</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-227-1996.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_33b8549aa3df433b4c66ca8b</id>
      <fromId>work_ieee_st_228_1996</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_228_1996</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_228_1996</targetId>
      <targetTitle>IEEE Std ST 228:1996</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-228-1996.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d3b7c11805d9ca8d7839ab3d</id>
      <fromId>work_ieee_st_229_1996</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_229_1996</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_st_229_1996</targetId>
      <targetTitle>IEEE Std ST 229:1996</targetTitle>
      <targetUrl>/ja/works/ieee-std-st-229-1996.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>concept_ieee_standards</fromId>
      <fromTitle>IEEE 标准</fromTitle>
      <fromUrl>/ja/concepts/ieee-standards.html</fromUrl>
      <fromType>concept</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/ja/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/ja/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/ja/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/ja/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/ja/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/ja/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/ja/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/ja/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/ja/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>ja</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>org_kind</key>
      <label>Organization kind</label>
      <value>专业协会</value>
    </field>
    <field>
      <key>founded</key>
      <label>Founded</label>
      <value>1963年1月1日</value>
    </field>
    <field>
      <key>org_status</key>
      <label>Status</label>
      <value>存続</value>
    </field>
    <field>
      <key>headquarters_note</key>
      <label>Headquarters</label>
      <value>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</value>
    </field>
  </infoFields>
  <pagination>
    <page>57</page>
    <pageSize>50</pageSize>
    <total>8265</total>
    <pageCount>166</pageCount>
    <prevUrl>/ja/organizations/ieee/relation-56.xml</prevUrl>
    <nextUrl>/ja/organizations/ieee/relation-58.xml</nextUrl>
  </pagination>
  <relationsTotal>8265</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8279</mentionsTotal>
  <mentionsUrl>/ja/organizations/ieee/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>