<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>作品</title>
  <url>/ja/works-100.html</url>
  <entities>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15288_2015_7106433</id>
      <type>work</type>
      <title>IEEE Std 15288-2015</title>
      <slug>ieee-std-15288-2015-7106433</slug>
      <aliases>
        <alias>15288-2015</alias>
        <alias>15288-2015 - ISO/IEC/IEEE International Standard - Systems and software engineering -- System life cycle processes</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15288-2015 是电气电子工程师学会的技术标准，题为“ISO/IEC/IEEE International Standard - Systems and software engineering -- System life cycle processes”；公开目录标为已被替代（Superseded），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15288-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7106433</url>
          <locator>standard_number=15288-2015; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:48+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:48+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15288-2015**（ISO/IEC/IEEE International Standard - Systems and software engineering -- System life cycle processes）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15288-2015-7106433.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15288_2023_10877740_redline</id>
      <type>work</type>
      <title>IEEE Std 15288-2023</title>
      <slug>ieee-std-15288-2023-10877740-redline</slug>
      <aliases>
        <alias>15288-2023</alias>
        <alias>15288-2023 - ISO/IEC/IEEE International Standard - Systems and software engineering--System life cycle processes - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15288-2023 是电气电子工程师学会的技术标准，题为“ISO/IEC/IEEE International Standard - Systems and software engineering--System life cycle processes - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15288-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10877740</url>
          <locator>standard_number=15288-2023; status=Active; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:48+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:48+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15288-2023**（ISO/IEC/IEEE International Standard - Systems and software engineering--System life cycle processes - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2023 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15288-2023-10877740-redline.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15288_2_2014</id>
      <type>work</type>
      <title>IEEE Std 15288.2-2014</title>
      <slug>ieee-std-15288-2-2014</slug>
      <aliases>
        <alias>15288.2-2014</alias>
        <alias>15288.2-2014 - IEEE Standard for Technical Reviews and Audits on Defense Programs</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15288.2-2014 是电气电子工程师学会的技术标准，题为“IEEE Standard for Technical Reviews and Audits on Defense Programs”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15288.2-2014 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7105319</url>
          <locator>standard_number=15288.2-2014; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:48+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:48+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15288.2-2014**（IEEE Standard for Technical Reviews and Audits on Defense Programs）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2015 年，主题领域包括 Computing and Processing、Aerospace、Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15288-2-2014.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15289_2011</id>
      <type>work</type>
      <title>IEEE Std 15289-2011</title>
      <slug>ieee-std-15289-2011</slug>
      <aliases>
        <alias>15289-2011</alias>
        <alias>15289-2011 - ISO/IEC/IEEE Systems and software engineering -- Content of life-cycle information products (documentation)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15289-2011 是电气电子工程师学会的技术标准，题为“ISO/IEC/IEEE Systems and software engineering -- Content of life-cycle information products (documentation)”；公开目录标为已被替代（Superseded），著录年份为 2011 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15289-2011 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6104077</url>
          <locator>standard_number=15289-2011; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:48+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:48+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15289-2011**（ISO/IEC/IEEE Systems and software engineering -- Content of life-cycle information products (documentation)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2011 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15289-2011.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2011</year>
        <precision>year</precision>
        <display>2011年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15289_2015_7109793</id>
      <type>work</type>
      <title>IEEE Std 15289-2015</title>
      <slug>ieee-std-15289-2015-7109793</slug>
      <aliases>
        <alias>15289-2015</alias>
        <alias>15289-2015 - ISO/IEC/IEEE International Standard Systems and software engineering -- Content of life-cycle information items (documentation)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15289-2015 是电气电子工程师学会的技术标准，题为“ISO/IEC/IEEE International Standard Systems and software engineering -- Content of life-cycle information items (documentation)”；公开目录标为已被替代（Superseded），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15289-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7109793</url>
          <locator>standard_number=15289-2015; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:48+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:48+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15289-2015**（ISO/IEC/IEEE International Standard Systems and software engineering -- Content of life-cycle information items (documentation)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15289-2015-7109793.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15289_2015_7270962_redline</id>
      <type>work</type>
      <title>IEEE Std 15289-2015</title>
      <slug>ieee-std-15289-2015-7270962-redline</slug>
      <aliases>
        <alias>15289-2015</alias>
        <alias>15289-2015 - ISO/IEC/IEEE International Standard Systems and software engineering -- Content of life-cycle information items (documentation) - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15289-2015 是电气电子工程师学会的技术标准，题为“ISO/IEC/IEEE International Standard Systems and software engineering -- Content of life-cycle information items (documentation) - Redline”；公开目录标为已被替代（Superseded），红线对照（Redline），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15289-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7270962</url>
          <locator>standard_number=15289-2015; status=Superseded; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:48+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:48+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15289-2015**（ISO/IEC/IEEE International Standard Systems and software engineering -- Content of life-cycle information items (documentation) - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），红线对照（Redline），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15289-2015-7270962-redline.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15289_2017</id>
      <type>work</type>
      <title>IEEE Std 15289-2017</title>
      <slug>ieee-std-15289-2017</slug>
      <aliases>
        <alias>15289-2017</alias>
        <alias>15289-2017 - ISO/IEC/IEEE International Standard - Systems and software engineering -- Content of life-cycle information items (documentation)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15289-2017 是电气电子工程师学会的技术标准，题为“ISO/IEC/IEEE International Standard - Systems and software engineering -- Content of life-cycle information items (documentation)”；公开目录标为已被替代（Superseded），著录年份为 2017 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15289-2017 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7942149</url>
          <locator>standard_number=15289-2017; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:48+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:48+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15289-2017**（ISO/IEC/IEEE International Standard - Systems and software engineering -- Content of life-cycle information items (documentation)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2017 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15289-2017.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2017</year>
        <precision>year</precision>
        <display>2017年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15289_2nd_ed_july_2014</id>
      <type>work</type>
      <title>IEEE Std 15289, 2nd ED, July 2014</title>
      <slug>ieee-std-15289-2nd-ed-july-2014</slug>
      <aliases>
        <alias>15289, 2nd ED, July 2014</alias>
        <alias>15289, 2nd ED, July 2014 - ISO/IEC/IEEE Draft International Standard Systems and software engineering -- Content of life-cycle information products (documentation)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15289, 2nd ED, July 2014 是电气电子工程师学会的草案，题为“ISO/IEC/IEEE Draft International Standard Systems and software engineering -- Content of life-cycle information products (documentation)”；公开目录标为非现行（Inactive），著录年份为 2014 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15289, 2nd ED, July 2014 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6870353</url>
          <locator>standard_number=15289, 2nd ED, July 2014; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:48+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:48+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15289, 2nd ED, July 2014**（ISO/IEC/IEEE Draft International Standard Systems and software engineering -- Content of life-cycle information products (documentation)）是[[organization_ieee|电气电子工程师学会]]于 2014 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15289-2nd-ed-july-2014.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2014</year>
        <precision>year</precision>
        <display>2014年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1528_2003</id>
      <type>work</type>
      <title>IEEE Std 1528-2003</title>
      <slug>ieee-std-1528-2003</slug>
      <aliases>
        <alias>1528-2003</alias>
        <alias>1528-2003 - IEEE Recommended Practice for Determining the Peak Spatial-Average Specific Absorption Rate (SAR) in the Human Head from Wireless Communications Devices: Measurement Techniques</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1528-2003 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Determining the Peak Spatial-Average Specific Absorption Rate (SAR) in the Human Head from Wireless Communications Devices: Measurement Techniques”；公开目录标为已被替代（Superseded），著录年份为 2003 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1528-2003 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8904</url>
          <locator>standard_number=1528-2003; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:48+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:48+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1528-2003**（IEEE Recommended Practice for Determining the Peak Spatial-Average Specific Absorption Rate (SAR) in the Human Head from Wireless Communications Devices: Measurement Techniques）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2003 年，主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1528-2003.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2003</year>
        <precision>year</precision>
        <display>2003年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1528_2013_6589091</id>
      <type>work</type>
      <title>IEEE Std 1528-2013</title>
      <slug>ieee-std-1528-2013-6589091</slug>
      <aliases>
        <alias>1528-2013</alias>
        <alias>1528-2013 - IEEE Recommended Practice for Determining the Peak Spatial-Average Specific Absorption Rate (SAR) in the Human Head from Wireless Communications Devices: Measurement Techniques</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1528-2013 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Determining the Peak Spatial-Average Specific Absorption Rate (SAR) in the Human Head from Wireless Communications Devices: Measurement Techniques”；公开目录标为已被替代（Superseded），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1528-2013 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6589091</url>
          <locator>standard_number=1528-2013; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:48+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:48+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1528-2013**（IEEE Recommended Practice for Determining the Peak Spatial-Average Specific Absorption Rate (SAR) in the Human Head from Wireless Communications Devices: Measurement Techniques）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2013 年，主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1528-2013-6589091.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1528_2013_6719583_redline</id>
      <type>work</type>
      <title>IEEE Std 1528-2013</title>
      <slug>ieee-std-1528-2013-6719583-redline</slug>
      <aliases>
        <alias>1528-2013</alias>
        <alias>1528-2013 - IEEE Recommended Practice for Determining the Peak Spatial-Average Specific Absorption Rate (SAR) in the Human Head from Wireless Communications Devices: Measurement Techniques - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1528-2013 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Determining the Peak Spatial-Average Specific Absorption Rate (SAR) in the Human Head from Wireless Communications Devices: Measurement Techniques - Redline”；公开目录标为已被替代（Superseded），红线对照（Redline），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1528-2013 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6719583</url>
          <locator>standard_number=1528-2013; status=Superseded; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:48+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:48+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1528-2013**（IEEE Recommended Practice for Determining the Peak Spatial-Average Specific Absorption Rate (SAR) in the Human Head from Wireless Communications Devices: Measurement Techniques - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），红线对照（Redline），著录年份为 2013 年，主题领域包括 Fields, Waves and Electromagnetics、Bioengineering、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1528-2013-6719583-redline.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1515_2000</id>
      <type>work</type>
      <title>IEEE Std 1515-2000</title>
      <slug>ieee-std-1515-2000</slug>
      <aliases>
        <alias>1515-2000</alias>
        <alias>1515-2000 - IEEE Recommended Practice for Electronic Power Subsystems: Parameter Definitions, Test Conditions, and Test Methods</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1515-2000 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Electronic Power Subsystems: Parameter Definitions, Test Conditions, and Test Methods”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2000 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1515-2000 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6982</url>
          <locator>standard_number=1515-2000; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1515-2000**（IEEE Recommended Practice for Electronic Power Subsystems: Parameter Definitions, Test Conditions, and Test Methods）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2000 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1515-2000.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2000</year>
        <precision>year</precision>
        <display>2000年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1516_1_2000</id>
      <type>work</type>
      <title>IEEE Std 1516.1-2000</title>
      <slug>ieee-std-1516-1-2000</slug>
      <aliases>
        <alias>1516.1-2000</alias>
        <alias>1516.1-2000 - IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA) Federate Interface Specification</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1516.1-2000 是电气电子工程师学会的技术标准，题为“IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA) Federate Interface Specification”；公开目录标为已被替代（Superseded），著录年份为 2001 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1516.1-2000 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7303</url>
          <locator>standard_number=1516.1-2000; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1516.1-2000**（IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA) Federate Interface Specification）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2001 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1516-1-2000.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2001</year>
        <precision>year</precision>
        <display>2001年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1516_1_2010_5557726</id>
      <type>work</type>
      <title>IEEE Std 1516.1-2010</title>
      <slug>ieee-std-1516-1-2010-5557726</slug>
      <aliases>
        <alias>1516.1-2010</alias>
        <alias>1516.1-2010 - IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Federate Interface Specification</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1516.1-2010 是电气电子工程师学会的技术标准，题为“IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Federate Interface Specification”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1516.1-2010 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5557726</url>
          <locator>standard_number=1516.1-2010; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1516.1-2010**（IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Federate Interface Specification）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2010 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1516-1-2010-5557726.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1516_1_2010_5954118_redline</id>
      <type>work</type>
      <title>IEEE Std 1516.1-2010</title>
      <slug>ieee-std-1516-1-2010-5954118-redline</slug>
      <aliases>
        <alias>1516.1-2010</alias>
        <alias>1516.1-2010 - IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Federate Interface Specification - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1516.1-2010 是电气电子工程师学会的技术标准，题为“IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Federate Interface Specification - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1516.1-2010 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5954118</url>
          <locator>standard_number=1516.1-2010; status=Inactive; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1516.1-2010**（IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Federate Interface Specification - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2010 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1516-1-2010-5954118-redline.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1516_2000</id>
      <type>work</type>
      <title>IEEE Std 1516-2000</title>
      <slug>ieee-std-1516-2000</slug>
      <aliases>
        <alias>1516-2000</alias>
        <alias>1516-2000 - IEEE Standard for Modeling and Simulation (M&amp;S) High Level ARchitecture (HLA) - Framework and Rules</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1516-2000 是电气电子工程师学会的技术标准，题为“IEEE Standard for Modeling and Simulation (M&amp;S) High Level ARchitecture (HLA) - Framework and Rules”；公开目录标为已被替代（Superseded），著录年份为 2000 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1516-2000 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7179</url>
          <locator>standard_number=1516-2000; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1516-2000**（IEEE Standard for Modeling and Simulation (M&amp;S) High Level ARchitecture (HLA) - Framework and Rules）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2000 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1516-2000.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2000</year>
        <precision>year</precision>
        <display>2000年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1516_2010_5553438</id>
      <type>work</type>
      <title>IEEE Std 1516-2010</title>
      <slug>ieee-std-1516-2010-5553438</slug>
      <aliases>
        <alias>1516-2010</alias>
        <alias>1516-2010 - IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Framework and Rules</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1516-2010 是电气电子工程师学会的技术标准，题为“IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Framework and Rules”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1516-2010 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5553438</url>
          <locator>standard_number=1516-2010; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1516-2010**（IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Framework and Rules）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2010 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1516-2010-5553438.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1516_2010_5953409_redline</id>
      <type>work</type>
      <title>IEEE Std 1516-2010</title>
      <slug>ieee-std-1516-2010-5953409-redline</slug>
      <aliases>
        <alias>1516-2010</alias>
        <alias>1516-2010 - IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Framework and Rules - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1516-2010 是电气电子工程师学会的技术标准，题为“IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Framework and Rules - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1516-2010 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5953409</url>
          <locator>standard_number=1516-2010; status=Inactive; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1516-2010**（IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Framework and Rules - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2010 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1516-2010-5953409-redline.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1516_2_2000</id>
      <type>work</type>
      <title>IEEE Std 1516.2-2000</title>
      <slug>ieee-std-1516-2-2000</slug>
      <aliases>
        <alias>1516.2-2000</alias>
        <alias>1516.2-2000 - IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA) - HLA Object Model Template (OMT) Specification</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1516.2-2000 是电气电子工程师学会的技术标准，题为“IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA) - HLA Object Model Template (OMT) Specification”；公开目录标为已被替代（Superseded），著录年份为 2001 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1516.2-2000 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7319</url>
          <locator>standard_number=1516.2-2000; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1516.2-2000**（IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA) - HLA Object Model Template (OMT) Specification）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2001 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1516-2-2000.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2001</year>
        <precision>year</precision>
        <display>2001年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1516_2_2010_5557729</id>
      <type>work</type>
      <title>IEEE Std 1516.2-2010</title>
      <slug>ieee-std-1516-2-2010-5557729</slug>
      <aliases>
        <alias>1516.2-2010</alias>
        <alias>1516.2-2010 - IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Object Model Template (OMT) Specification</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1516.2-2010 是电气电子工程师学会的技术标准，题为“IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Object Model Template (OMT) Specification”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1516.2-2010 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5557729</url>
          <locator>standard_number=1516.2-2010; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1516.2-2010**（IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Object Model Template (OMT) Specification）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2010 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1516-2-2010-5557729.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1516_2_2010_5953406_redline</id>
      <type>work</type>
      <title>IEEE Std 1516.2-2010</title>
      <slug>ieee-std-1516-2-2010-5953406-redline</slug>
      <aliases>
        <alias>1516.2-2010</alias>
        <alias>1516.2-2010 - IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Object Model Template (OMT) Specification - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1516.2-2010 是电气电子工程师学会的技术标准，题为“IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Object Model Template (OMT) Specification - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1516.2-2010 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5953406</url>
          <locator>standard_number=1516.2-2010; status=Inactive; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1516.2-2010**（IEEE Standard for Modeling and Simulation (M&amp;S) High Level Architecture (HLA)-- Object Model Template (OMT) Specification - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2010 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1516-2-2010-5953406-redline.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1516_3_2003</id>
      <type>work</type>
      <title>IEEE Std 1516.3-2003</title>
      <slug>ieee-std-1516-3-2003</slug>
      <aliases>
        <alias>1516.3-2003</alias>
        <alias>1516.3-2003 - IEEE Recommended Practice for High Level Architecture (HLA) Federation Development and Execution Process (FEDEP)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1516.3-2003 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for High Level Architecture (HLA) Federation Development and Execution Process (FEDEP)”；公开目录标为已被替代（Superseded），著录年份为 2003 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1516.3-2003 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8526</url>
          <locator>standard_number=1516.3-2003; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1516.3-2003**（IEEE Recommended Practice for High Level Architecture (HLA) Federation Development and Execution Process (FEDEP)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2003 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1516-3-2003.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2003</year>
        <precision>year</precision>
        <display>2003年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1517_1999</id>
      <type>work</type>
      <title>IEEE Std 1517-1999</title>
      <slug>ieee-std-1517-1999</slug>
      <aliases>
        <alias>1517-1999</alias>
        <alias>1517-1999 - IEEE Standard for Information Technology - Software Life Cycle Processes - Reuse Processes</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1517-1999 是电气电子工程师学会的技术标准，题为“IEEE Standard for Information Technology - Software Life Cycle Processes - Reuse Processes”；公开目录标为已被替代（Superseded），著录年份为 1999 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1517-1999 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10098</url>
          <locator>standard_number=1517-1999; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1517-1999**（IEEE Standard for Information Technology - Software Life Cycle Processes - Reuse Processes）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1999 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1517-1999.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1999</year>
        <precision>year</precision>
        <display>1999年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1517_2010</id>
      <type>work</type>
      <title>IEEE Std 1517-2010</title>
      <slug>ieee-std-1517-2010</slug>
      <aliases>
        <alias>1517-2010</alias>
        <alias>1517-2010 - IEEE Standard for Information Technology--System and Software Life Cycle Processes--Reuse Processes</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1517-2010 是电气电子工程师学会的技术标准，题为“IEEE Standard for Information Technology--System and Software Life Cycle Processes--Reuse Processes”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1517-2010 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5551091</url>
          <locator>standard_number=1517-2010; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1517-2010**（IEEE Standard for Information Technology--System and Software Life Cycle Processes--Reuse Processes）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2010 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1517-2010.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15205_2000</id>
      <type>work</type>
      <title>IEEE Std 15205-2000</title>
      <slug>ieee-std-15205-2000</slug>
      <aliases>
        <alias>15205-2000</alias>
        <alias>15205-2000 - ISO/IEC 15205:2000 (IEEE Std 1496-1993) SBus -- Chip and Module Interconnect Bus</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15205-2000 是电气电子工程师学会的技术标准，题为“ISO/IEC 15205:2000 (IEEE Std 1496-1993) SBus -- Chip and Module Interconnect Bus”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 2001 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15205-2000 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4140853</url>
          <locator>standard_number=15205-2000; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15205-2000**（ISO/IEC 15205:2000 (IEEE Std 1496-1993) SBus -- Chip and Module Interconnect Bus）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 2001 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15205-2000.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2001</year>
        <precision>year</precision>
        <display>2001年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1521_2003_5250246</id>
      <type>work</type>
      <title>IEEE Std 1521-2003</title>
      <slug>ieee-std-1521-2003-5250246</slug>
      <aliases>
        <alias>1521-2003</alias>
        <alias>1521-2003 - IEEE Standard for Measurement of Video Jitter and Wander</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1521-2003 是电气电子工程师学会的技术标准，题为“IEEE Standard for Measurement of Video Jitter and Wander”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2004 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1521-2003 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5250246</url>
          <locator>standard_number=1521-2003; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1521-2003**（IEEE Standard for Measurement of Video Jitter and Wander）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2004 年，主题领域包括 Communication, Networking and Broadcast Technologies、Signal Processing and Analysis[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1521-2003-5250246.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2004</year>
        <precision>year</precision>
        <display>2004年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1522_2004</id>
      <type>work</type>
      <title>IEEE Std 1522-2004</title>
      <slug>ieee-std-1522-2004</slug>
      <aliases>
        <alias>1522-2004</alias>
        <alias>1522-2004 - IEEE Standard for Testability and Diagnosability Characteristics and Metrics</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1522-2004 是电气电子工程师学会的技术标准，题为“IEEE Standard for Testability and Diagnosability Characteristics and Metrics”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 2005 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1522-2004 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9702</url>
          <locator>standard_number=1522-2004; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1522-2004**（IEEE Standard for Testability and Diagnosability Characteristics and Metrics）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 2005 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1522-2004.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2005</year>
        <precision>year</precision>
        <display>2005年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1523_2002</id>
      <type>work</type>
      <title>IEEE Std 1523-2002</title>
      <slug>ieee-std-1523-2002</slug>
      <aliases>
        <alias>1523-2002</alias>
        <alias>1523-2002 - IEEE Guide for the Application, Maintenance, and Evaluation of Room Temperature Vulcanizing (RTV) Silicone Rubber Coatings for Outdoor Ceramic Insulators</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1523-2002 是电气电子工程师学会的技术标准，题为“IEEE Guide for the Application, Maintenance, and Evaluation of Room Temperature Vulcanizing (RTV) Silicone Rubber Coatings for Outdoor Ceramic Insulators”；公开目录标为已被替代（Superseded），著录年份为 2003 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1523-2002 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8461</url>
          <locator>standard_number=1523-2002; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1523-2002**（IEEE Guide for the Application, Maintenance, and Evaluation of Room Temperature Vulcanizing (RTV) Silicone Rubber Coatings for Outdoor Ceramic Insulators）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2003 年，主题领域包括 Power, Energy and Industry Applications、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1523-2002.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2003</year>
        <precision>year</precision>
        <display>2003年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1526_2003</id>
      <type>work</type>
      <title>IEEE Std 1526-2003</title>
      <slug>ieee-std-1526-2003</slug>
      <aliases>
        <alias>1526-2003</alias>
        <alias>1526-2003 - IEEE Recommended Practice for Testing the Performance of Stand-Alone Photovoltaic Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1526-2003 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Testing the Performance of Stand-Alone Photovoltaic Systems”；公开目录标为已被替代（Superseded），著录年份为 2004 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1526-2003 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8929</url>
          <locator>standard_number=1526-2003; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1526-2003**（IEEE Recommended Practice for Testing the Performance of Stand-Alone Photovoltaic Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2004 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1526-2003.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2004</year>
        <precision>year</precision>
        <display>2004年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_152_1953</id>
      <type>work</type>
      <title>IEEE Std 152-1953</title>
      <slug>ieee-std-152-1953</slug>
      <aliases>
        <alias>152-1953</alias>
        <alias>152-1953 - IEEE Recommended Practice for Volume Measurements of Electric Speech and Program Waves</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 152-1953 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Volume Measurements of Electric Speech and Program Waves”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1952 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 152-1953 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7368058</url>
          <locator>standard_number=152-1953; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 152-1953**（IEEE Recommended Practice for Volume Measurements of Electric Speech and Program Waves）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1952 年，主题领域包括 Signal Processing and Analysis、Communication, Networking and Broadcast Technologies、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-152-1953.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1952</year>
        <precision>year</precision>
        <display>1952年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_152_1991</id>
      <type>work</type>
      <title>IEEE Std 152-1991</title>
      <slug>ieee-std-152-1991</slug>
      <aliases>
        <alias>152-1991</alias>
        <alias>152-1991 - IEEE Standard for Audio Program Level Measurement</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 152-1991 是电气电子工程师学会的技术标准，题为“IEEE Standard for Audio Program Level Measurement”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1992 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 152-1991 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=2862</url>
          <locator>standard_number=152-1991; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:35+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 152-1991**（IEEE Standard for Audio Program Level Measurement）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1992 年，主题领域包括 Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-152-1991.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1992</year>
        <precision>year</precision>
        <display>1992年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1716_d12_feb_2014</id>
      <type>work</type>
      <title>IEEE Std P1716/D12, Feb 2014</title>
      <slug>ieee-std-p1716-d12-feb-2014</slug>
      <aliases>
        <alias>P1716/D12, Feb 2014</alias>
        <alias>P1716/D12, Feb 2014 - IEEE Recommended Practice for Managing Natural Disaster Impact on Key Electrical Systems and Installations in Petroleum and Chemical Facilities</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1716/D12, Feb 2014 是电气电子工程师学会的草案，题为“IEEE Recommended Practice for Managing Natural Disaster Impact on Key Electrical Systems and Installations in Petroleum and Chemical Facilities”；公开目录标为非现行（Inactive），著录年份为 2014 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1716/D12, Feb 2014 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6758431</url>
          <locator>standard_number=P1716/D12, Feb 2014; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:28+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:28+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1716/D12, Feb 2014**（IEEE Recommended Practice for Managing Natural Disaster Impact on Key Electrical Systems and Installations in Petroleum and Chemical Facilities）是[[organization_ieee|电气电子工程师学会]]于 2014 年 2 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 General Topics for Engineers、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1716-d12-feb-2014.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2014</year>
        <precision>year</precision>
        <display>2014年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1717_d1_5_aug_2023</id>
      <type>work</type>
      <title>IEEE Std P1717/D1.5, Aug 2023</title>
      <slug>ieee-std-p1717-d1-5-aug-2023</slug>
      <aliases>
        <alias>P1717/D1.5, Aug 2023</alias>
        <alias>P1717/D1.5, Aug 2023 - IEEE Draft Standard for Testing Fire-Resistive, Circuit Integrity Cables and Cable Systems Using a Hydrocarbon Pool Fire Test Protocol</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1717/D1.5, Aug 2023 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Testing Fire-Resistive, Circuit Integrity Cables and Cable Systems Using a Hydrocarbon Pool Fire Test Protocol”；公开目录标为非现行（Inactive），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1717/D1.5, Aug 2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10255686</url>
          <locator>standard_number=P1717/D1.5, Aug 2023; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:28+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:28+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1717/D1.5, Aug 2023**（IEEE Draft Standard for Testing Fire-Resistive, Circuit Integrity Cables and Cable Systems Using a Hydrocarbon Pool Fire Test Protocol）是[[organization_ieee|电气电子工程师学会]]于 2023 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1717-d1-5-aug-2023.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1716_d1_january_2013</id>
      <type>work</type>
      <title>IEEE Std P1716/D1, January 2013</title>
      <slug>ieee-std-p1716-d1-january-2013</slug>
      <aliases>
        <alias>P1716/D1, January 2013</alias>
        <alias>P1716/D1, January 2013 - IEEE Draft Recommended Practice for Managing Natural Disaster Impact on key electrical systems and installations in Petroleum and Chemical Facilities</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1716/D1, January 2013 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Managing Natural Disaster Impact on key electrical systems and installations in Petroleum and Chemical Facilities”；公开目录标为非现行（Inactive），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1716/D1, January 2013 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6450013</url>
          <locator>standard_number=P1716/D1, January 2013; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:27+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:27+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1716/D1, January 2013**（IEEE Draft Recommended Practice for Managing Natural Disaster Impact on key electrical systems and installations in Petroleum and Chemical Facilities）是[[organization_ieee|电气电子工程师学会]]于 2013 年 1 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Geoscience[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1716-d1-january-2013.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1711_2_d43_aug_2019</id>
      <type>work</type>
      <title>IEEE Std P1711.2/D43 Aug 2019</title>
      <slug>ieee-std-p1711-2-d43-aug-2019</slug>
      <aliases>
        <alias>P1711.2/D43 Aug 2019</alias>
        <alias>P1711.2/D43 Aug 2019 - IEEE Draft Standard for Secure SCADA Communications Protocol (SSCP)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1711.2/D43 Aug 2019 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Secure SCADA Communications Protocol (SSCP)”；公开目录标为非现行（Inactive），著录年份为 2019 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1711.2/D43 Aug 2019 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8824258</url>
          <locator>standard_number=P1711.2/D43 Aug 2019; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:26+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:26+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1711.2/D43 Aug 2019**（IEEE Draft Standard for Secure SCADA Communications Protocol (SSCP)）是[[organization_ieee|电气电子工程师学会]]于 2019 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1711-2-d43-aug-2019.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2019</year>
        <precision>year</precision>
        <display>2019年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1712</id>
      <type>work</type>
      <title>IEEE Std P1712</title>
      <slug>ieee-std-p1712</slug>
      <aliases>
        <alias>P1712</alias>
        <alias>P1712 - IEEE Draft Guide for Sulphur Hexafluoride (SF6) Gas Handling for High Voltage (over 1000Vac)Equipment</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1712 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Sulphur Hexafluoride (SF6) Gas Handling for High Voltage (over 1000Vac)Equipment”；公开目录标为非现行（Inactive），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1712 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5587295</url>
          <locator>standard_number=P1712; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:26+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:26+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1712**（IEEE Draft Guide for Sulphur Hexafluoride (SF6) Gas Handling for High Voltage (over 1000Vac)Equipment）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2010 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1712.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1711_1_d10_dec_2023</id>
      <type>work</type>
      <title>IEEE Std P1711.1/D10, Dec 2023</title>
      <slug>ieee-std-p1711-1-d10-dec-2023</slug>
      <aliases>
        <alias>P1711.1/D10, Dec 2023</alias>
        <alias>P1711.1/D10, Dec 2023 - IEEE Draft Standard for a Cryptographic Protocol for Cyber Security of Substation Serial Links: Substation Serial Protection Protocol</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1711.1/D10, Dec 2023 是电气电子工程师学会的草案，题为“IEEE Draft Standard for a Cryptographic Protocol for Cyber Security of Substation Serial Links: Substation Serial Protection Protocol”；公开目录标为非现行（Inactive），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1711.1/D10, Dec 2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10791499</url>
          <locator>standard_number=P1711.1/D10, Dec 2023; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:25+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:25+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1711.1/D10, Dec 2023**（IEEE Draft Standard for a Cryptographic Protocol for Cyber Security of Substation Serial Links: Substation Serial Protection Protocol）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2024 年，主题领域包括 Computing and Processing、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1711-1-d10-dec-2023.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1711_1_d11_dec_2024</id>
      <type>work</type>
      <title>IEEE Std P1711.1/D11, Dec 2024</title>
      <slug>ieee-std-p1711-1-d11-dec-2024</slug>
      <aliases>
        <alias>P1711.1/D11, Dec 2024</alias>
        <alias>P1711.1/D11, Dec 2024 - IEEE Draft Standard for a Cryptographic Protocol for Cyber Security of Substation Serial Links: Substation Serial Protection Protocol</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1711.1/D11, Dec 2024 是电气电子工程师学会的草案，题为“IEEE Draft Standard for a Cryptographic Protocol for Cyber Security of Substation Serial Links: Substation Serial Protection Protocol”；公开目录标为非现行（Inactive），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1711.1/D11, Dec 2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11112822</url>
          <locator>standard_number=P1711.1/D11, Dec 2024; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:25+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:25+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1711.1/D11, Dec 2024**（IEEE Draft Standard for a Cryptographic Protocol for Cyber Security of Substation Serial Links: Substation Serial Protection Protocol）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2025 年，主题领域包括 Communication, Networking and Broadcast Technologies、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1711-1-d11-dec-2024.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1711_1_d12_sept_2025</id>
      <type>work</type>
      <title>IEEE Std P1711.1/D12, Sept 2025</title>
      <slug>ieee-std-p1711-1-d12-sept-2025</slug>
      <aliases>
        <alias>P1711.1/D12, Sept 2025</alias>
        <alias>P1711.1/D12, Sept 2025 - IEEE Approved Draft Standard for a Cryptographic Protocol for Cyber Security of Substation Serial Links: Substation Serial Protection Protocol</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1711.1/D12, Sept 2025 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for a Cryptographic Protocol for Cyber Security of Substation Serial Links: Substation Serial Protection Protocol”；公开目录标为非现行（Inactive），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1711.1/D12, Sept 2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11170382</url>
          <locator>standard_number=P1711.1/D12, Sept 2025; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:25+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:25+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1711.1/D12, Sept 2025**（IEEE Approved Draft Standard for a Cryptographic Protocol for Cyber Security of Substation Serial Links: Substation Serial Protection Protocol）是[[organization_ieee|电气电子工程师学会]]于 2025 年 9 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1711-1-d12-sept-2025.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1711_2_d3_aug_2019</id>
      <type>work</type>
      <title>IEEE Std P1711.2/D3 Aug 2019</title>
      <slug>ieee-std-p1711-2-d3-aug-2019</slug>
      <aliases>
        <alias>P1711.2/D3 Aug 2019</alias>
        <alias>P1711.2/D3 Aug 2019 - IEEE Draft Standard for Secure SCADA Communications Protocol (SSCP)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1711.2/D3 Aug 2019 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Secure SCADA Communications Protocol (SSCP)”；公开目录标为非现行（Inactive），著录年份为 2019 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1711.2/D3 Aug 2019 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8792416</url>
          <locator>standard_number=P1711.2/D3 Aug 2019; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:25+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:25+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1711.2/D3 Aug 2019**（IEEE Draft Standard for Secure SCADA Communications Protocol (SSCP)）是[[organization_ieee|电气电子工程师学会]]于 2019 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Communication, Networking and Broadcast Technologies、Power, Energy and Industry Applications、Robotics and Control Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1711-2-d3-aug-2019.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2019</year>
        <precision>year</precision>
        <display>2019年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1711_1_d09_may_2023</id>
      <type>work</type>
      <title>IEEE Std P1711.1/D09, May 2023</title>
      <slug>ieee-std-p1711-1-d09-may-2023</slug>
      <aliases>
        <alias>P1711.1/D09, May 2023</alias>
        <alias>P1711.1/D09, May 2023 - IEEE Draft Standard for a Cryptographic Protocol for Cyber Security of Substation Serial Links: Substation Serial Protection Protocol</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1711.1/D09, May 2023 是电气电子工程师学会的草案，题为“IEEE Draft Standard for a Cryptographic Protocol for Cyber Security of Substation Serial Links: Substation Serial Protection Protocol”；公开目录标为非现行（Inactive），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1711.1/D09, May 2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10251102</url>
          <locator>standard_number=P1711.1/D09, May 2023; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:24+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:24+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1711.1/D09, May 2023**（IEEE Draft Standard for a Cryptographic Protocol for Cyber Security of Substation Serial Links: Substation Serial Protection Protocol）是[[organization_ieee|电气电子工程师学会]]于 2023 年 5 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1711-1-d09-may-2023.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1709_d5_may_2018</id>
      <type>work</type>
      <title>IEEE Std P1709/D5, May 2018</title>
      <slug>ieee-std-p1709-d5-may-2018</slug>
      <aliases>
        <alias>P1709/D5, May 2018</alias>
        <alias>P1709/D5, May 2018 - IEEE Draft Recommended Practice for 1 kV to 35 kV Medium-Voltage DC Power Systems on Ships</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1709/D5, May 2018 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for 1 kV to 35 kV Medium-Voltage DC Power Systems on Ships”；公开目录标为非现行（Inactive），著录年份为 2018 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1709/D5, May 2018 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8363117</url>
          <locator>standard_number=P1709/D5, May 2018; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:23+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:23+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1709/D5, May 2018**（IEEE Draft Recommended Practice for 1 kV to 35 kV Medium-Voltage DC Power Systems on Ships）是[[organization_ieee|电气电子工程师学会]]于 2018 年 5 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems、Signal Processing and Analysis、Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1709-d5-may-2018.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2018</year>
        <precision>year</precision>
        <display>2018年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1709_d1_1_feb_2010</id>
      <type>work</type>
      <title>IEEE Std P1709/D1.1, Feb 2010</title>
      <slug>ieee-std-p1709-d1-1-feb-2010</slug>
      <aliases>
        <alias>P1709/D1.1, Feb 2010</alias>
        <alias>P1709/D1.1, Feb 2010 - Recommended Practice for 1 to 35 kV Medium Voltage DC Power Systems on Ships</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1709/D1.1, Feb 2010 是电气电子工程师学会的草案，题为“Recommended Practice for 1 to 35 kV Medium Voltage DC Power Systems on Ships”；公开目录标为非现行（Inactive），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1709/D1.1, Feb 2010 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5434896</url>
          <locator>standard_number=P1709/D1.1, Feb 2010; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:21+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:21+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1709/D1.1, Feb 2010**（Recommended Practice for 1 to 35 kV Medium Voltage DC Power Systems on Ships）是[[organization_ieee|电气电子工程师学会]]于 2010 年 2 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1709-d1-1-feb-2010.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1709_d5_jan_2018</id>
      <type>work</type>
      <title>IEEE Std P1709/D5 Jan 2018</title>
      <slug>ieee-std-p1709-d5-jan-2018</slug>
      <aliases>
        <alias>P1709/D5 Jan 2018</alias>
        <alias>P1709/D5 Jan 2018 - IEEE Draft Recommended Practice for 1 kV to 35 kV Medium-Voltage DC Power Systems on Ships</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1709/D5 Jan 2018 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for 1 kV to 35 kV Medium-Voltage DC Power Systems on Ships”；公开目录标为非现行（Inactive），著录年份为 2018 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1709/D5 Jan 2018 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8319884</url>
          <locator>standard_number=P1709/D5 Jan 2018; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:21+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:21+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1709/D5 Jan 2018**（IEEE Draft Recommended Practice for 1 kV to 35 kV Medium-Voltage DC Power Systems on Ships）是[[organization_ieee|电气电子工程师学会]]于 2018 年 1 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1709-d5-jan-2018.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2018</year>
        <precision>year</precision>
        <display>2018年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1512_1_2003</id>
      <type>work</type>
      <title>IEEE Std 1512.1-2003</title>
      <slug>ieee-std-1512-1-2003</slug>
      <aliases>
        <alias>1512.1-2003</alias>
        <alias>1512.1-2003 - IEEE Standard for Traffic Incident Management Message Sets for Use by Emergency Management Centers</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1512.1-2003 是电气电子工程师学会的技术标准，题为“IEEE Standard for Traffic Incident Management Message Sets for Use by Emergency Management Centers”；公开目录标为已被替代（Superseded），著录年份为 2003 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1512.1-2003 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8556</url>
          <locator>standard_number=1512.1-2003; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:20+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:20+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1512.1-2003**（IEEE Standard for Traffic Incident Management Message Sets for Use by Emergency Management Centers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2003 年，主题领域包括 Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1512-1-2003.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2003</year>
        <precision>year</precision>
        <display>2003年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1512_1_2006</id>
      <type>work</type>
      <title>IEEE Std 1512.1-2006</title>
      <slug>ieee-std-1512-1-2006</slug>
      <aliases>
        <alias>1512.1-2006</alias>
        <alias>1512.1-2006 - IEEE Standard for Common Traffic Incident Management Message Sets for Use by Emergency Management Centers</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1512.1-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard for Common Traffic Incident Management Message Sets for Use by Emergency Management Centers”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2006 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1512.1-2006 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4014403</url>
          <locator>standard_number=1512.1-2006; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:20+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:20+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1512.1-2006**（IEEE Standard for Common Traffic Incident Management Message Sets for Use by Emergency Management Centers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2006 年，主题领域包括 Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1512-1-2006.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2006</year>
        <precision>year</precision>
        <display>2006年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1512_2006</id>
      <type>work</type>
      <title>IEEE Std 1512-2006</title>
      <slug>ieee-std-1512-2006</slug>
      <aliases>
        <alias>1512-2006</alias>
        <alias>1512-2006 - IEEE Standard for Common Incident Management Message Sets for Use by Emergency Management Centers</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1512-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard for Common Incident Management Message Sets for Use by Emergency Management Centers”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2006 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1512-2006 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11078</url>
          <locator>standard_number=1512-2006; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:20+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:20+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1512-2006**（IEEE Standard for Common Incident Management Message Sets for Use by Emergency Management Centers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2006 年，主题领域包括 Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1512-2006.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2006</year>
        <precision>year</precision>
        <display>2006年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1512_2_2004</id>
      <type>work</type>
      <title>IEEE Std 1512.2-2004</title>
      <slug>ieee-std-1512-2-2004</slug>
      <aliases>
        <alias>1512.2-2004</alias>
        <alias>1512.2-2004 - IEEE Standard for Public Safety Traffic Incident Management Message Sets for Use By Emergency Management Centers</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1512.2-2004 是电气电子工程师学会的技术标准，题为“IEEE Standard for Public Safety Traffic Incident Management Message Sets for Use By Emergency Management Centers”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 2004 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1512.2-2004 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9914</url>
          <locator>standard_number=1512.2-2004; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:20+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:20+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1512.2-2004**（IEEE Standard for Public Safety Traffic Incident Management Message Sets for Use By Emergency Management Centers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 2004 年，主题领域包括 Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1512-2-2004.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2004</year>
        <precision>year</precision>
        <display>2004年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1513_2001</id>
      <type>work</type>
      <title>IEEE Std 1513-2001</title>
      <slug>ieee-std-1513-2001</slug>
      <aliases>
        <alias>1513-2001</alias>
        <alias>1513-2001 - IEEE Recommended Practice for Qualification of Concentrator Photovoltaic (PV) Receiver Sections and Modules</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1513-2001 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Qualification of Concentrator Photovoltaic (PV) Receiver Sections and Modules”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 2001 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1513-2001 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7391</url>
          <locator>standard_number=1513-2001; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:20+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:20+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1513-2001**（IEEE Recommended Practice for Qualification of Concentrator Photovoltaic (PV) Receiver Sections and Modules）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 2001 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1513-2001.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2001</year>
        <precision>year</precision>
        <display>2001年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1708a_d3_apr_2019</id>
      <type>work</type>
      <title>IEEE Std P1708a/D3, Apr 2019</title>
      <slug>ieee-std-p1708a-d3-apr-2019</slug>
      <aliases>
        <alias>P1708a/D3, Apr 2019</alias>
        <alias>P1708a/D3, Apr 2019 - IEEE Approved Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1708a/D3, Apr 2019 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices”；公开目录标为非现行（Inactive），著录年份为 2019 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1708a/D3, Apr 2019 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8699133</url>
          <locator>standard_number=P1708a/D3, Apr 2019; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:20+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:20+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1708a/D3, Apr 2019**（IEEE Approved Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices）是[[organization_ieee|电气电子工程师学会]]于 2019 年 4 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Bioengineering、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1708a-d3-apr-2019.html</url>
      <lang>ja</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2019</year>
        <precision>year</precision>
        <display>2019年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
  </entities>
  <tags></tags>
  <categories></categories>
  <relations></relations>
  <mentions></mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>ja</lang>
  <availableLangs></availableLangs>
  <infoFields></infoFields>
  <pagination>
    <page>100</page>
    <pageSize>50</pageSize>
    <total>11882</total>
    <pageCount>238</pageCount>
    <prevUrl>/ja/works-99.xml?type=work</prevUrl>
    <nextUrl>/ja/works-101.xml?type=work</nextUrl>
  </pagination>
  <relationCounts></relationCounts>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>