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      <title>IEEE Std 796-1983</title>
      <slug>ieee-std-796-1983</slug>
      <aliases>
        <alias>796-1983</alias>
        <alias>796-1983 - IEEE Standard Microcomputer System Bus</alias>
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      <summary>IEEE Std 796-1983 是电气电子工程师学会的技术标准，题为“IEEE Standard Microcomputer System Bus”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1983 年。</summary>
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          <title>IEEE Std 796-1983 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4335</url>
          <locator>standard_number=796-1983; status=Inactive; modifier=Withdrawn</locator>
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          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <body>**IEEE Std 796-1983**（IEEE Standard Microcomputer System Bus）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1983 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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        <year>1983</year>
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        <display>1983年</display>
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      <title>IEEE Std 799-1987</title>
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        <alias>799-1987</alias>
        <alias>799-1987 - IEEE Guide for Handling and Disposal of Transformer Grade Insulating Liquids Containing PCBs</alias>
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      <summary>IEEE Std 799-1987 是电气电子工程师学会的技术标准，题为“IEEE Guide for Handling and Disposal of Transformer Grade Insulating Liquids Containing PCBs”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1987 年。</summary>
      <status>published</status>
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        <category>category-science-technology</category>
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        <tag>tag-ieee-standard</tag>
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          <title>IEEE Std 799-1987 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=2505</url>
          <locator>standard_number=799-1987; status=Inactive; modifier=Withdrawn</locator>
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          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <body>**IEEE Std 799-1987**（IEEE Guide for Handling and Disposal of Transformer Grade Insulating Liquids Containing PCBs）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1987 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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        <year>1987</year>
        <precision>year</precision>
        <display>1987年</display>
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      <language>英语</language>
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      <title>IEEE Std P2735/D4.2, August 2022</title>
      <slug>ieee-std-p2735-d4-2-august-2022</slug>
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        <alias>P2735/D4.2, August 2022</alias>
        <alias>P2735/D4.2, August 2022 - IEEE Draft Standard for Interoperability of Complex Virtual Instruments for Internet of Things</alias>
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      <summary>IEEE Std P2735/D4.2, August 2022 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Interoperability of Complex Virtual Instruments for Internet of Things”；公开目录标为非现行（Inactive），著录年份为 2022 年。</summary>
      <status>published</status>
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        <category>category-science-technology</category>
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      <tags>
        <tag>tag-ieee-standard</tag>
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          <id>s1</id>
          <title>IEEE Std P2735/D4.2, August 2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9889253</url>
          <locator>standard_number=P2735/D4.2, August 2022; status=Inactive; modifier=Draft</locator>
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          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <revision>1</revision>
      <body>**IEEE Std P2735/D4.2, August 2022**（IEEE Draft Standard for Interoperability of Complex Virtual Instruments for Internet of Things）是[[organization_ieee|电气电子工程师学会]]于 2022 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
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      <language>英语</language>
      <creators></creators>
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      <id>work_ieee_765_2012_6420846</id>
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      <title>IEEE Std 765-2012</title>
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        <alias>765-2012</alias>
        <alias>765-2012 - IEEE Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations (NPGS)</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std 765-2012 是电气电子工程师学会的技术标准，题为“IEEE Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations (NPGS)”；公开目录标为已被替代（Superseded），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
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      <tags>
        <tag>tag-ieee-standard</tag>
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          <title>IEEE Std 765-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6420846</url>
          <locator>standard_number=765-2012; status=Superseded; modifier=</locator>
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          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <body>**IEEE Std 765-2012**（IEEE Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations (NPGS)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2013 年，主题领域包括 Power, Energy and Industry Applications、Nuclear Engineering、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <published>
        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
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      <language>英语</language>
      <creators></creators>
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      <type>work</type>
      <title>IEEE Std 765-2012</title>
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      <aliases>
        <alias>765-2012</alias>
        <alias>765-2012 - IEEE Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations (NPGS) - Redline</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std 765-2012 是电气电子工程师学会的技术标准，题为“IEEE Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations (NPGS) - Redline”；公开目录标为已被替代（Superseded），红线对照（Redline），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
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      <tags>
        <tag>tag-ieee-standard</tag>
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          <id>s1</id>
          <title>IEEE Std 765-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6523048</url>
          <locator>standard_number=765-2012; status=Superseded; modifier=Redline</locator>
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          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 765-2012**（IEEE Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations (NPGS) - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），红线对照（Redline），著录年份为 2013 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-765-2012-6523048-redline.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <type>work</type>
      <title>IEEE Std 765-2022</title>
      <slug>ieee-std-765-2022-10094311-redline</slug>
      <aliases>
        <alias>765-2022</alias>
        <alias>765-2022 - IEEE Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations (NPGS) - Redline</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std 765-2022 是电气电子工程师学会的技术标准，题为“IEEE Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations (NPGS) - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
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      <tags>
        <tag>tag-ieee-standard</tag>
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          <id>s1</id>
          <title>IEEE Std 765-2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10094311</url>
          <locator>standard_number=765-2022; status=Active; modifier=Redline</locator>
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          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:17:45+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 765-2022**（IEEE Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations (NPGS) - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2022 年，主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <fallback>true</fallback>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_770x3_160_1989</id>
      <type>work</type>
      <title>IEEE Std 770X3.160-1989</title>
      <slug>ieee-std-770x3-160-1989</slug>
      <aliases>
        <alias>770X3.160-1989</alias>
        <alias>770X3.160-1989 - IEEE/ANSI Standard for the Programming Language Extended Pascal</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std 770X3.160-1989 是电气电子工程师学会的技术标准，题为“IEEE/ANSI Standard for the Programming Language Extended Pascal”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1990 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 770X3.160-1989 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=2242</url>
          <locator>standard_number=770X3.160-1989; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:45+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 770X3.160-1989**（IEEE/ANSI Standard for the Programming Language Extended Pascal）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1990 年，主题领域包括 Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-770x3-160-1989.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1990</year>
        <precision>year</precision>
        <display>1990年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_770x3_97_1983</id>
      <type>work</type>
      <title>IEEE Std 770X3.97-1983</title>
      <slug>ieee-std-770x3-97-1983</slug>
      <aliases>
        <alias>770X3.97-1983</alias>
        <alias>770X3.97-1983 - IEEE Standard Pascal Computer Programming Language</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 770X3.97-1983 是电气电子工程师学会的技术标准，题为“IEEE Standard Pascal Computer Programming Language”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1983 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
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      <tags>
        <tag>tag-ieee-standard</tag>
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      <sources>
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          <id>s1</id>
          <title>IEEE Std 770X3.97-1983 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=2619</url>
          <locator>standard_number=770X3.97-1983; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T22:17:45+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 770X3.97-1983**（IEEE Standard Pascal Computer Programming Language）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1983 年，主题领域包括 Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-770x3-97-1983.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1983</year>
        <precision>year</precision>
        <display>1983年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_771_1984</id>
      <type>work</type>
      <title>IEEE Std 771-1984</title>
      <slug>ieee-std-771-1984</slug>
      <aliases>
        <alias>771-1984</alias>
        <alias>771-1984 - IEEE Guide to the Use of ATLAS</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 771-1984 是电气电子工程师学会的技术标准，题为“IEEE Guide to the Use of ATLAS”；公开目录标为已被替代（Superseded），著录年份为 1984 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 771-1984 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7437342</url>
          <locator>standard_number=771-1984; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:45+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 771-1984**（IEEE Guide to the Use of ATLAS）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1984 年，主题领域包括 Power, Energy and Industry Applications、Aerospace、Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-771-1984.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1984</year>
        <precision>year</precision>
        <display>1984年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <id>work_ieee_771_1989</id>
      <type>work</type>
      <title>IEEE Std 771-1989</title>
      <slug>ieee-std-771-1989</slug>
      <aliases>
        <alias>771-1989</alias>
        <alias>771-1989 - IEEE Guide to the Use of the ATLAS Specification</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 771-1989 是电气电子工程师学会的技术标准，题为“IEEE Guide to the Use of the ATLAS Specification”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1989 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 771-1989 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=2335</url>
          <locator>standard_number=771-1989; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:45+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 771-1989**（IEEE Guide to the Use of the ATLAS Specification）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1989 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-771-1989.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1989</year>
        <precision>year</precision>
        <display>1989年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_771_1998</id>
      <type>work</type>
      <title>IEEE Std 771-1998</title>
      <slug>ieee-std-771-1998</slug>
      <aliases>
        <alias>771-1998</alias>
        <alias>771-1998 - IEEE Guide to the Use of the ATLAS Specification</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 771-1998 是电气电子工程师学会的技术标准，题为“IEEE Guide to the Use of the ATLAS Specification”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 1998 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 771-1998 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9090395</url>
          <locator>standard_number=771-1998; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:45+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 771-1998**（IEEE Guide to the Use of the ATLAS Specification）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 1998 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-771-1998.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1998</year>
        <precision>year</precision>
        <display>1998年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_775_1993</id>
      <type>work</type>
      <title>IEEE Std 775-1993</title>
      <slug>ieee-std-775-1993</slug>
      <aliases>
        <alias>775-1993</alias>
        <alias>775-1993 - IEEE Guide for Designing Multistress Aging Tests of Electrical Insulation in a Radiation Environment</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 775-1993 是电气电子工程师学会的技术标准，题为“IEEE Guide for Designing Multistress Aging Tests of Electrical Insulation in a Radiation Environment”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1993 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 775-1993 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=2803</url>
          <locator>standard_number=775-1993; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:45+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 775-1993**（IEEE Guide for Designing Multistress Aging Tests of Electrical Insulation in a Radiation Environment）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1993 年，主题领域包括 Power, Energy and Industry Applications、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-775-1993.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1993</year>
        <precision>year</precision>
        <display>1993年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_77_1965</id>
      <type>work</type>
      <title>IEEE Std 77-1965</title>
      <slug>ieee-std-77-1965</slug>
      <aliases>
        <alias>77-1965</alias>
        <alias>77-1965 - IEEE Recommended Practice for Electric Installations on Textile Machinery</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 77-1965 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Electric Installations on Textile Machinery”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1965 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 77-1965 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7437345</url>
          <locator>standard_number=77-1965; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:45+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 77-1965**（IEEE Recommended Practice for Electric Installations on Textile Machinery）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1965 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-77-1965.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1965</year>
        <precision>year</precision>
        <display>1965年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_789_1988</id>
      <type>work</type>
      <title>IEEE Std 789-1988</title>
      <slug>ieee-std-789-1988</slug>
      <aliases>
        <alias>789-1988</alias>
        <alias>789-1988 - IEEE Standard Performance Requirements for Communications and Control Cables for Application in High Voltage Environments</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 789-1988 是电气电子工程师学会的技术标准，题为“IEEE Standard Performance Requirements for Communications and Control Cables for Application in High Voltage Environments”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1989 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 789-1988 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4334</url>
          <locator>standard_number=789-1988; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:45+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 789-1988**（IEEE Standard Performance Requirements for Communications and Control Cables for Application in High Voltage Environments）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1989 年，主题领域包括 Power, Energy and Industry Applications、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-789-1988.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1989</year>
        <precision>year</precision>
        <display>1989年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_78_1960</id>
      <type>work</type>
      <title>IEEE Std 78-1960</title>
      <slug>ieee-std-78-1960</slug>
      <aliases>
        <alias>78-1960</alias>
        <alias>78-1960 - AIEE-FEMA-NEMA Standards Publication for Arc Furnace Transformer</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 78-1960 是电气电子工程师学会的技术标准，题为“AIEE-FEMA-NEMA Standards Publication for Arc Furnace Transformer”；公开目录标为已被替代（Superseded），著录年份为 1958 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 78-1960 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7438708</url>
          <locator>standard_number=78-1960; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:45+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 78-1960**（AIEE-FEMA-NEMA Standards Publication for Arc Furnace Transformer）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1958 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-78-1960.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1958</year>
        <precision>year</precision>
        <display>1958年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p2735_1_d4_2_aug_2022</id>
      <type>work</type>
      <title>IEEE Std P2735.1/D4.2, Aug 2022</title>
      <slug>ieee-std-p2735-1-d4-2-aug-2022</slug>
      <aliases>
        <alias>P2735.1/D4.2, Aug 2022</alias>
        <alias>P2735.1/D4.2, Aug 2022 - IEEE Approved Draft Standard Design Criteria of Complex Virtual Instruments for Household Appliance Test</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2735.1/D4.2, Aug 2022 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard Design Criteria of Complex Virtual Instruments for Household Appliance Test”；公开目录标为非现行（Inactive），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2735.1/D4.2, Aug 2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9873874</url>
          <locator>standard_number=P2735.1/D4.2, Aug 2022; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:45+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2735.1/D4.2, Aug 2022**（IEEE Approved Draft Standard Design Criteria of Complex Virtual Instruments for Household Appliance Test）是[[organization_ieee|电气电子工程师学会]]于 2022 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 General Topics for Engineers、Power, Energy and Industry Applications、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p2735-1-d4-2-aug-2022.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
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      <id>work_ieee_p2735_d4_1_jul_2022</id>
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      <title>IEEE Std P2735/D4.1, Jul 2022</title>
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        <alias>P2735/D4.1, Jul 2022</alias>
        <alias>P2735/D4.1, Jul 2022 - IEEE Draft Standard for Interoperability of Complex Virtual Instruments for Internet of Things</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2735/D4.1, Jul 2022 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Interoperability of Complex Virtual Instruments for Internet of Things”；公开目录标为非现行（Inactive），著录年份为 2022 年。</summary>
      <status>published</status>
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        <category>category-science-technology</category>
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          <title>IEEE Std P2735/D4.1, Jul 2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9844315</url>
          <locator>standard_number=P2735/D4.1, Jul 2022; status=Inactive; modifier=Draft</locator>
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          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
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          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T22:17:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2735/D4.1, Jul 2022**（IEEE Draft Standard for Interoperability of Complex Virtual Instruments for Internet of Things）是[[organization_ieee|电气电子工程师学会]]于 2022 年 7 月形成的草案。公开目录将其标为非现行（Inactive）[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <title>IEEE Std P2735.1/D4.1, Aug 2022</title>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2735.1/D4.1, Aug 2022 是电气电子工程师学会的草案，题为“IEEE Draft Standard Design Criteria of Complex Virtual Instruments for Household Appliance Test”；公开目录标为非现行（Inactive），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
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      <sources>
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          <id>s1</id>
          <title>IEEE Std P2735.1/D4.1, Aug 2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9867943</url>
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          <author>IEEE</author>
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      <updatedAt>2026-11-01T22:17:44+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2735.1/D4.1, Aug 2022**（IEEE Draft Standard Design Criteria of Complex Virtual Instruments for Household Appliance Test）是[[organization_ieee|电气电子工程师学会]]于 2022 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Power, Energy and Industry Applications、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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        <precision>year</precision>
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      <language>英语</language>
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      <type>work</type>
      <title>IEEE Std P2730/D1.3, May 2022</title>
      <slug>ieee-std-p2730-d1-3-may-2022</slug>
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        <alias>P2730/D1.3, May 2022</alias>
        <alias>P2730/D1.3, May 2022 - IEEE Approved Draft Standard for Terms, Definitions, and Classification of Medical Electrical Equipment/Systems Employing Robotic Technology</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2730/D1.3, May 2022 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Terms, Definitions, and Classification of Medical Electrical Equipment/Systems Employing Robotic Technology”；公开目录标为非现行（Inactive），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
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      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2730/D1.3, May 2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9780275</url>
          <locator>standard_number=P2730/D1.3, May 2022; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:17:43+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:43+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2730/D1.3, May 2022**（IEEE Approved Draft Standard for Terms, Definitions, and Classification of Medical Electrical Equipment/Systems Employing Robotic Technology）是[[organization_ieee|电气电子工程师学会]]于 2022 年 5 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Bioengineering、Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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        <precision>year</precision>
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      <language>英语</language>
      <creators></creators>
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      <title>IEEE Std P2735.1/D4.0, July 2022</title>
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      <aliases>
        <alias>P2735.1/D4.0, July 2022</alias>
        <alias>P2735.1/D4.0, July 2022 - IEEE Draft Standard Design Criteria of Complex Virtual Instruments for Household Appliance Test</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2735.1/D4.0, July 2022 是电气电子工程师学会的草案，题为“IEEE Draft Standard Design Criteria of Complex Virtual Instruments for Household Appliance Test”；公开目录标为非现行（Inactive），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2735.1/D4.0, July 2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9844306</url>
          <locator>standard_number=P2735.1/D4.0, July 2022; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
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      <updatedAt>2026-11-01T22:17:43+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2735.1/D4.0, July 2022**（IEEE Draft Standard Design Criteria of Complex Virtual Instruments for Household Appliance Test）是[[organization_ieee|电气电子工程师学会]]于 2022 年 7 月形成的草案。公开目录将其标为非现行（Inactive）[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p2735-1-d4-0-july-2022.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p2730_d1_2_jul_2019</id>
      <type>work</type>
      <title>IEEE Std P2730/D1.2, Jul 2019</title>
      <slug>ieee-std-p2730-d1-2-jul-2019</slug>
      <aliases>
        <alias>P2730/D1.2, Jul 2019</alias>
        <alias>P2730/D1.2, Jul 2019 - IEEE Draft Standard for Terms, Definitions, and Classification of Medical Electrical Equipment/Systems Employing Robotic Technology</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2730/D1.2, Jul 2019 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Terms, Definitions, and Classification of Medical Electrical Equipment/Systems Employing Robotic Technology”；公开目录标为非现行（Inactive），著录年份为 2019 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
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      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2730/D1.2, Jul 2019 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8766178</url>
          <locator>standard_number=P2730/D1.2, Jul 2019; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:17:42+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:42+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2730/D1.2, Jul 2019**（IEEE Draft Standard for Terms, Definitions, and Classification of Medical Electrical Equipment/Systems Employing Robotic Technology）是[[organization_ieee|电气电子工程师学会]]于 2019 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Bioengineering、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p2730-d1-2-jul-2019.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2019</year>
        <precision>year</precision>
        <display>2019年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p2725_1_d4_aug_2024</id>
      <type>work</type>
      <title>IEEE Std P2725.1/D4, Aug 2024</title>
      <slug>ieee-std-p2725-1-d4-aug-2024</slug>
      <aliases>
        <alias>P2725.1/D4, Aug 2024</alias>
        <alias>P2725.1/D4, Aug 2024 - IEEE Approved Draft Standard for Microwave Structural, Vascular, or Functional Brain Imaging Device Safety</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2725.1/D4, Aug 2024 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Microwave Structural, Vascular, or Functional Brain Imaging Device Safety”；公开目录标为非现行（Inactive），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2725.1/D4, Aug 2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10670241</url>
          <locator>standard_number=P2725.1/D4, Aug 2024; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:17:41+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:41+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2725.1/D4, Aug 2024**（IEEE Approved Draft Standard for Microwave Structural, Vascular, or Functional Brain Imaging Device Safety）是[[organization_ieee|电气电子工程师学会]]于 2024 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Bioengineering、Communication, Networking and Broadcast Technologies、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p2725-1-d4-aug-2024.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p2720_d11_mar_2021</id>
      <type>work</type>
      <title>IEEE Std P2720/D11, Mar 2021</title>
      <slug>ieee-std-p2720-d11-mar-2021</slug>
      <aliases>
        <alias>P2720/D11, Mar 2021</alias>
        <alias>P2720/D11, Mar 2021 - IEEE Approved Draft Guide for Rail Potential Management Guide for Direct Current Traction Electrification Systems</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2720/D11, Mar 2021 是电气电子工程师学会的草案，题为“IEEE Approved Draft Guide for Rail Potential Management Guide for Direct Current Traction Electrification Systems”；公开目录标为非现行（Inactive），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2720/D11, Mar 2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9382194</url>
          <locator>standard_number=P2720/D11, Mar 2021; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T22:17:40+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:40+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2720/D11, Mar 2021**（IEEE Approved Draft Guide for Rail Potential Management Guide for Direct Current Traction Electrification Systems）是[[organization_ieee|电气电子工程师学会]]于 2021 年 3 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics、Power, Energy and Industry Applications、Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p2720-d11-mar-2021.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p2725_1_d3_jun_2024</id>
      <type>work</type>
      <title>IEEE Std P2725.1/D3, Jun 2024</title>
      <slug>ieee-std-p2725-1-d3-jun-2024</slug>
      <aliases>
        <alias>P2725.1/D3, Jun 2024</alias>
        <alias>P2725.1/D3, Jun 2024 - IEEE Draft Standard for Microwave Structural, Vascular, or Functional Brain Imaging Device Safety</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2725.1/D3, Jun 2024 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Microwave Structural, Vascular, or Functional Brain Imaging Device Safety”；公开目录标为非现行（Inactive），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2725.1/D3, Jun 2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10584465</url>
          <locator>standard_number=P2725.1/D3, Jun 2024; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T22:17:40+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:40+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2725.1/D3, Jun 2024**（IEEE Draft Standard for Microwave Structural, Vascular, or Functional Brain Imaging Device Safety）是[[organization_ieee|电气电子工程师学会]]于 2024 年 6 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Bioengineering、Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p2725-1-d3-jun-2024.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p2720_d10_oct_2020</id>
      <type>work</type>
      <title>IEEE Std P2720/D10, Oct 2020</title>
      <slug>ieee-std-p2720-d10-oct-2020</slug>
      <aliases>
        <alias>P2720/D10, Oct 2020</alias>
        <alias>P2720/D10, Oct 2020 - IEEE Draft Guide for Rail Potential Management Guide for Direct Current Traction Electrification Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2720/D10, Oct 2020 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Rail Potential Management Guide for Direct Current Traction Electrification Systems”；公开目录标为非现行（Inactive），著录年份为 2020 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2720/D10, Oct 2020 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9262119</url>
          <locator>standard_number=P2720/D10, Oct 2020; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:17:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2720/D10, Oct 2020**（IEEE Draft Guide for Rail Potential Management Guide for Direct Current Traction Electrification Systems）是[[organization_ieee|电气电子工程师学会]]于 2020 年 10 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics、Power, Energy and Industry Applications、Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p2720-d10-oct-2020.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2020</year>
        <precision>year</precision>
        <display>2020年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p2718_d9_jul_2023</id>
      <type>work</type>
      <title>IEEE Std P2718/D9, Jul 2023</title>
      <slug>ieee-std-p2718-d9-jul-2023</slug>
      <aliases>
        <alias>P2718/D9, Jul 2023</alias>
        <alias>P2718/D9, Jul 2023 - IEEE Draft Guide for Near Field Characterization of Unintentional Stochastic Radiators</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2718/D9, Jul 2023 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Near Field Characterization of Unintentional Stochastic Radiators”；公开目录标为非现行（Inactive），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2718/D9, Jul 2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10192533</url>
          <locator>standard_number=P2718/D9, Jul 2023; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:38+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:38+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2718/D9, Jul 2023**（IEEE Draft Guide for Near Field Characterization of Unintentional Stochastic Radiators）是[[organization_ieee|电气电子工程师学会]]于 2023 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p2718-d9-jul-2023.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p2718_d10_aug2023</id>
      <type>work</type>
      <title>IEEE Std P2718/D10, Aug2023</title>
      <slug>ieee-std-p2718-d10-aug2023</slug>
      <aliases>
        <alias>P2718/D10, Aug2023</alias>
        <alias>P2718/D10, Aug2023 - IEEE Approved Draft Guide for Near Field Characterization of Unintentional Stochastic Radiators</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2718/D10, Aug2023 是电气电子工程师学会的草案，题为“IEEE Approved Draft Guide for Near Field Characterization of Unintentional Stochastic Radiators”；公开目录标为非现行（Inactive），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2718/D10, Aug2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10236951</url>
          <locator>standard_number=P2718/D10, Aug2023; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:37+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:37+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2718/D10, Aug2023**（IEEE Approved Draft Guide for Near Field Characterization of Unintentional Stochastic Radiators）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2023 年，主题领域包括 Power, Energy and Industry Applications、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p2718-d10-aug2023.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p2718_d8_mar_2023</id>
      <type>work</type>
      <title>IEEE Std P2718/D8, Mar 2023</title>
      <slug>ieee-std-p2718-d8-mar-2023</slug>
      <aliases>
        <alias>P2718/D8, Mar 2023</alias>
        <alias>P2718/D8, Mar 2023 - IEEE Draft Guide for Near Field Characterization of Unintentional Stochastic Radiators</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2718/D8, Mar 2023 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Near Field Characterization of Unintentional Stochastic Radiators”；公开目录标为非现行（Inactive），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2718/D8, Mar 2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10120686</url>
          <locator>standard_number=P2718/D8, Mar 2023; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:17:37+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:37+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2718/D8, Mar 2023**（IEEE Draft Guide for Near Field Characterization of Unintentional Stochastic Radiators）是[[organization_ieee|电气电子工程师学会]]于 2023 年 3 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p2718-d8-mar-2023.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
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      <id>work_ieee_p2717_d4_3_apr_2024</id>
      <type>work</type>
      <title>IEEE Std P2717/D4.3, Apr 2024</title>
      <slug>ieee-std-p2717-d4-3-apr-2024</slug>
      <aliases>
        <alias>P2717/D4.3, Apr 2024</alias>
        <alias>P2717/D4.3, Apr 2024 - IEEE Approved Draft Trial-Use Recommended Practice for Passive Intermodulation Test Methods for Wireless Systems in Low Noise Environments</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2717/D4.3, Apr 2024 是电气电子工程师学会的草案，题为“IEEE Approved Draft Trial-Use Recommended Practice for Passive Intermodulation Test Methods for Wireless Systems in Low Noise Environments”；公开目录标为非现行（Inactive），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2717/D4.3, Apr 2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10565814</url>
          <locator>standard_number=P2717/D4.3, Apr 2024; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:36+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:36+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2717/D4.3, Apr 2024**（IEEE Approved Draft Trial-Use Recommended Practice for Passive Intermodulation Test Methods for Wireless Systems in Low Noise Environments）是[[organization_ieee|电气电子工程师学会]]于 2024 年 4 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p2717-d4-3-apr-2024.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p2717_d4_1_jun_2023</id>
      <type>work</type>
      <title>IEEE Std P2717/D4.1, Jun 2023</title>
      <slug>ieee-std-p2717-d4-1-jun-2023</slug>
      <aliases>
        <alias>P2717/D4.1, Jun 2023</alias>
        <alias>P2717/D4.1, Jun 2023 - IEEE Draft Standard for Passive Intermodulation Test Methods for Wireless Systems in Low Noise Environments</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2717/D4.1, Jun 2023 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Passive Intermodulation Test Methods for Wireless Systems in Low Noise Environments”；公开目录标为非现行（Inactive），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2717/D4.1, Jun 2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10219440</url>
          <locator>standard_number=P2717/D4.1, Jun 2023; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:35+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2717/D4.1, Jun 2023**（IEEE Draft Standard for Passive Intermodulation Test Methods for Wireless Systems in Low Noise Environments）是[[organization_ieee|电气电子工程师学会]]于 2023 年 6 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems、Signal Processing and Analysis[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p2717-d4-1-jun-2023.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <id>work_ieee_p2717_d4_2_jan_2024</id>
      <type>work</type>
      <title>IEEE Std P2717/D4.2, Jan 2024</title>
      <slug>ieee-std-p2717-d4-2-jan-2024</slug>
      <aliases>
        <alias>P2717/D4.2, Jan 2024</alias>
        <alias>P2717/D4.2, Jan 2024 - IEEE Draft Trail-Use Recommended Practice for Passive Intermodulation Test Methods for Wireless Systems in Low Noise Environments</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2717/D4.2, Jan 2024 是电气电子工程师学会的草案，题为“IEEE Draft Trail-Use Recommended Practice for Passive Intermodulation Test Methods for Wireless Systems in Low Noise Environments”；公开目录标为非现行（Inactive），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2717/D4.2, Jan 2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10431697</url>
          <locator>standard_number=P2717/D4.2, Jan 2024; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:35+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:35+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2717/D4.2, Jan 2024**（IEEE Draft Trail-Use Recommended Practice for Passive Intermodulation Test Methods for Wireless Systems in Low Noise Environments）是[[organization_ieee|电气电子工程师学会]]于 2024 年 1 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems、Signal Processing and Analysis[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p2717-d4-2-jan-2024.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p2716_d1_apr_2022</id>
      <type>work</type>
      <title>IEEE Std P2716/D1, Apr 2022</title>
      <slug>ieee-std-p2716-d1-apr-2022</slug>
      <aliases>
        <alias>P2716/D1, Apr 2022</alias>
        <alias>P2716/D1, Apr 2022 - IEEE Draft Guide for the Characterization of the Effectiveness of Printed Circuit Board Level Shielding</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2716/D1, Apr 2022 是电气电子工程师学会的草案，题为“IEEE Draft Guide for the Characterization of the Effectiveness of Printed Circuit Board Level Shielding”；公开目录标为非现行（Inactive），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
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      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2716/D1, Apr 2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9826601</url>
          <locator>standard_number=P2716/D1, Apr 2022; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:17:34+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:34+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2716/D1, Apr 2022**（IEEE Draft Guide for the Characterization of the Effectiveness of Printed Circuit Board Level Shielding）是[[organization_ieee|电气电子工程师学会]]于 2022 年 4 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <language>英语</language>
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      <type>work</type>
      <title>IEEE Std P2715/D3, Oct 2022</title>
      <slug>ieee-std-p2715-d3-oct-2022</slug>
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        <alias>P2715/D3, Oct 2022</alias>
        <alias>P2715/D3, Oct 2022 - IEEE Draft Guide for the Characterization of the Shielding Effectiveness of Planar Materials</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2715/D3, Oct 2022 是电气电子工程师学会的草案，题为“IEEE Draft Guide for the Characterization of the Shielding Effectiveness of Planar Materials”；公开目录标为非现行（Inactive），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
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      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2715/D3, Oct 2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9945894</url>
          <locator>standard_number=P2715/D3, Oct 2022; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
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          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T22:17:33+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2715/D3, Oct 2022**（IEEE Draft Guide for the Characterization of the Shielding Effectiveness of Planar Materials）是[[organization_ieee|电气电子工程师学会]]于 2022 年 10 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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        <precision>year</precision>
        <display>2022年</display>
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      <language>英语</language>
      <creators></creators>
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      <type>work</type>
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      <slug>ieee-std-p2715-d4-nov-2022</slug>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2715/D4, Nov 2022 是电气电子工程师学会的草案，题为“IEEE Approved Draft Guide for the Characterization of the Shielding Effectiveness of Planar Materials”；公开目录标为非现行（Inactive），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2715/D4, Nov 2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9969534</url>
          <locator>standard_number=P2715/D4, Nov 2022; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:17:33+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:33+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2715/D4, Nov 2022**（IEEE Approved Draft Guide for the Characterization of the Shielding Effectiveness of Planar Materials）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2023 年，主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <lang>ko</lang>
      <fallback>true</fallback>
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        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <type>work</type>
      <title>IEEE Std P2715/D2, Apr 2022</title>
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        <alias>P2715/D2, Apr 2022</alias>
        <alias>P2715/D2, Apr 2022 - IEEE Draft Guide for the Characterization of the Shielding Effectiveness of Planar Materials</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2715/D2, Apr 2022 是电气电子工程师学会的草案，题为“IEEE Draft Guide for the Characterization of the Shielding Effectiveness of Planar Materials”；公开目录标为非现行（Inactive），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
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      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2715/D2, Apr 2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9913407</url>
          <locator>standard_number=P2715/D2, Apr 2022; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:17:32+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:32+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2715/D2, Apr 2022**（IEEE Draft Guide for the Characterization of the Shielding Effectiveness of Planar Materials）是[[organization_ieee|电气电子工程师学会]]于 2022 年 4 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <lang>ko</lang>
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      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p2700_d3_apr_2017</id>
      <type>work</type>
      <title>IEEE Std P2700/D3, Apr 2017</title>
      <slug>ieee-std-p2700-d3-apr-2017</slug>
      <aliases>
        <alias>P2700/D3, Apr 2017</alias>
        <alias>P2700/D3, Apr 2017 - IEEE Approved Draft Standard for Sensor Performance Parameter Definitions</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2700/D3, Apr 2017 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Sensor Performance Parameter Definitions”；公开目录标为非现行（Inactive），著录年份为 2017 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
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      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2700/D3, Apr 2017 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7912219</url>
          <locator>standard_number=P2700/D3, Apr 2017; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:17:31+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:31+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2700/D3, Apr 2017**（IEEE Approved Draft Standard for Sensor Performance Parameter Definitions）是[[organization_ieee|电气电子工程师学会]]于 2017 年 4 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p2700-d3-apr-2017.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2017</year>
        <precision>year</precision>
        <display>2017年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p2715_d1_apr_2022</id>
      <type>work</type>
      <title>IEEE Std P2715/D1, Apr 2022</title>
      <slug>ieee-std-p2715-d1-apr-2022</slug>
      <aliases>
        <alias>P2715/D1, Apr 2022</alias>
        <alias>P2715/D1, Apr 2022 - IEEE Draft Guide for the Characterization of the Shielding Effectiveness of Planar Materials</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P2715/D1, Apr 2022 是电气电子工程师学会的草案，题为“IEEE Draft Guide for the Characterization of the Shielding Effectiveness of Planar Materials”；公开目录标为非现行（Inactive），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
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      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P2715/D1, Apr 2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9826595</url>
          <locator>standard_number=P2715/D1, Apr 2022; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:17:31+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:31+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P2715/D1, Apr 2022**（IEEE Draft Guide for the Characterization of the Shielding Effectiveness of Planar Materials）是[[organization_ieee|电气电子工程师学会]]于 2022 年 4 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics、Photonics and Electrooptics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p2715-d1-apr-2022.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
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        <lang>zh</lang>
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        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_762_2006</id>
      <type>work</type>
      <title>IEEE Std 762-2006</title>
      <slug>ieee-std-762-2006</slug>
      <aliases>
        <alias>762-2006</alias>
        <alias>762-2006 - IEEE Standard Definitions for Use in Reporting Electric Generating Unit Reliability, Availability, and Productivity</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 762-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard Definitions for Use in Reporting Electric Generating Unit Reliability, Availability, and Productivity”；公开目录标为已被替代（Superseded），著录年份为 2007 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
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      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 762-2006 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4135888</url>
          <locator>standard_number=762-2006; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:30+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:30+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 762-2006**（IEEE Standard Definitions for Use in Reporting Electric Generating Unit Reliability, Availability, and Productivity）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2007 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-762-2006.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2007</year>
        <precision>year</precision>
        <display>2007年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_765_1995</id>
      <type>work</type>
      <title>IEEE Std 765-1995</title>
      <slug>ieee-std-765-1995</slug>
      <aliases>
        <alias>765-1995</alias>
        <alias>765-1995 - IEEE Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 765-1995 是电气电子工程师学会的技术标准，题为“IEEE Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations”；公开目录标为已被替代（Superseded），著录年份为 1995 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 765-1995 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=3286</url>
          <locator>standard_number=765-1995; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:30+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:30+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 765-1995**（IEEE Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1995 年，主题领域包括 Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-765-1995.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1995</year>
        <precision>year</precision>
        <display>1995年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_765_2002</id>
      <type>work</type>
      <title>IEEE Std 765-2002</title>
      <slug>ieee-std-765-2002</slug>
      <aliases>
        <alias>765-2002</alias>
        <alias>765-2002 - IEEE Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 765-2002 是电气电子工程师学会的技术标准，题为“IEEE Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations”；公开目录标为已被替代（Superseded），著录年份为 2002 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 765-2002 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7860</url>
          <locator>standard_number=765-2002; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:30+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:30+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 765-2002**（IEEE Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2002 年，主题领域包括 Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-765-2002.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2002</year>
        <precision>year</precision>
        <display>2002年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <perspectives></perspectives>
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      <id>work_ieee_765_2006</id>
      <type>work</type>
      <title>IEEE Std 765-2006</title>
      <slug>ieee-std-765-2006</slug>
      <aliases>
        <alias>765-2006</alias>
        <alias>765-2006 - Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations (NPGS)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 765-2006 是电气电子工程师学会的技术标准，题为“Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations (NPGS)”；公开目录标为已被替代（Superseded），著录年份为 2006 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 765-2006 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4013609</url>
          <locator>standard_number=765-2006; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <updatedAt>2026-11-01T22:17:30+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 765-2006**（Standard for Preferred Power Supply (PPS) for Nuclear Power Generating Stations (NPGS)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2006 年，主题领域包括 Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-765-2006.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2006</year>
        <precision>year</precision>
        <display>2006年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_752_1986</id>
      <type>work</type>
      <title>IEEE Std 752-1986</title>
      <slug>ieee-std-752-1986</slug>
      <aliases>
        <alias>752-1986</alias>
        <alias>752-1986 - IEEE Standard for Functional Requirements for Methods and Equipment for Measuring the Performance of Tone Address Signaling Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 752-1986 是电气电子工程师学会的技术标准，题为“IEEE Standard for Functional Requirements for Methods and Equipment for Measuring the Performance of Tone Address Signaling Systems”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1986 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 752-1986 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=2494</url>
          <locator>standard_number=752-1986; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:29+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:29+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 752-1986**（IEEE Standard for Functional Requirements for Methods and Equipment for Measuring the Performance of Tone Address Signaling Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1986 年，主题领域包括 Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-752-1986.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1986</year>
        <precision>year</precision>
        <display>1986年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <id>work_ieee_753_1983</id>
      <type>work</type>
      <title>IEEE Std 753-1983</title>
      <slug>ieee-std-753-1983</slug>
      <aliases>
        <alias>753-1983</alias>
        <alias>753-1983 - IEEE Standard Functional Methods and Equipment for Measuring the Performance of Dial-Pulse (DP) Address Signaling Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 753-1983 是电气电子工程师学会的技术标准，题为“IEEE Standard Functional Methods and Equipment for Measuring the Performance of Dial-Pulse (DP) Address Signaling Systems”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1983 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 753-1983 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7437339</url>
          <locator>standard_number=753-1983; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:29+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:29+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 753-1983**（IEEE Standard Functional Methods and Equipment for Measuring the Performance of Dial-Pulse (DP) Address Signaling Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1983 年，主题领域包括 Signal Processing and Analysis、Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-753-1983.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1983</year>
        <precision>year</precision>
        <display>1983年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_754_1985</id>
      <type>work</type>
      <title>IEEE Std 754-1985</title>
      <slug>ieee-std-754-1985</slug>
      <aliases>
        <alias>754-1985</alias>
        <alias>754-1985 - IEEE Standard for Binary Floating-Point Arithmetic</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 754-1985 是电气电子工程师学会的技术标准，题为“IEEE Standard for Binary Floating-Point Arithmetic”；公开目录标为已被替代（Superseded），著录年份为 1985 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 754-1985 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=2355</url>
          <locator>standard_number=754-1985; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:29+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:29+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 754-1985**（IEEE Standard for Binary Floating-Point Arithmetic）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1985 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-754-1985.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1985</year>
        <precision>year</precision>
        <display>1985年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <perspectives></perspectives>
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      <id>work_ieee_754_2008_4610933</id>
      <type>work</type>
      <title>IEEE Std 754-2008</title>
      <slug>ieee-std-754-2008-4610933</slug>
      <aliases>
        <alias>754-2008</alias>
        <alias>754-2008 - IEEE Standard for Floating-Point Arithmetic</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 754-2008 是电气电子工程师学会的技术标准，题为“IEEE Standard for Floating-Point Arithmetic”；公开目录标为已被替代（Superseded），著录年份为 2008 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 754-2008 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4610933</url>
          <locator>standard_number=754-2008; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:29+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:29+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 754-2008**（IEEE Standard for Floating-Point Arithmetic）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-754-2008-4610933.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2008</year>
        <precision>year</precision>
        <display>2008年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_754_2008_5976966_redline</id>
      <type>work</type>
      <title>IEEE Std 754-2008</title>
      <slug>ieee-std-754-2008-5976966-redline</slug>
      <aliases>
        <alias>754-2008</alias>
        <alias>754-2008 - IEEE Standard for Floating-Point Arithmetic - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 754-2008 是电气电子工程师学会的技术标准，题为“IEEE Standard for Floating-Point Arithmetic - Redline”；公开目录标为已被替代（Superseded），红线对照（Redline），著录年份为 2008 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 754-2008 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5976966</url>
          <locator>standard_number=754-2008; status=Superseded; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:29+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:29+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 754-2008**（IEEE Standard for Floating-Point Arithmetic - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），红线对照（Redline），著录年份为 2008 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-754-2008-5976966-redline.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2008</year>
        <precision>year</precision>
        <display>2008年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_754_2019_8866808_redline</id>
      <type>work</type>
      <title>IEEE Std 754-2019</title>
      <slug>ieee-std-754-2019-8866808-redline</slug>
      <aliases>
        <alias>754-2019</alias>
        <alias>754-2019 - IEEE Standard for Floating-Point Arithmetic - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 754-2019 是电气电子工程师学会的技术标准，题为“IEEE Standard for Floating-Point Arithmetic - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2019 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 754-2019 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8866808</url>
          <locator>standard_number=754-2019; status=Active; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:17:29+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:29+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 754-2019**（IEEE Standard for Floating-Point Arithmetic - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2019 年，主题领域包括 Computing and Processing、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-754-2019-8866808-redline.html</url>
      <lang>ko</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2019</year>
        <precision>year</precision>
        <display>2019年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_755_1985</id>
      <type>work</type>
      <title>IEEE Std 755-1985</title>
      <slug>ieee-std-755-1985</slug>
      <aliases>
        <alias>755-1985</alias>
        <alias>755-1985 - IEEE Trial-Use Extending High Level Language Implementations for Microprocessors</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 755-1985 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Extending High Level Language Implementations for Microprocessors”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1985 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
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          <title>IEEE Std 755-1985 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=2354</url>
          <locator>standard_number=755-1985; status=Inactive; modifier=Withdrawn</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T22:17:29+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
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      <body>**IEEE Std 755-1985**（IEEE Trial-Use Extending High Level Language Implementations for Microprocessors）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1985 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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        <year>1985</year>
        <precision>year</precision>
        <display>1985年</display>
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      <type>work</type>
      <title>IEEE Std 756-1984</title>
      <slug>ieee-std-756-1984</slug>
      <aliases>
        <alias>756-1984</alias>
        <alias>756-1984 - IEEE Trial Use Guide for loading Mineral-Oil Immersed Power Transformers Rated in Excess of 100 MVA (65 Degree C Winding Rise)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 756-1984 是电气电子工程师学会的技术标准，题为“IEEE Trial Use Guide for loading Mineral-Oil Immersed Power Transformers Rated in Excess of 100 MVA (65 Degree C Winding Rise)”；公开目录标为已被替代（Superseded），著录年份为 1984 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
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      <tags>
        <tag>tag-ieee-standard</tag>
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          <id>s1</id>
          <title>IEEE Std 756-1984 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7437333</url>
          <locator>standard_number=756-1984; status=Superseded; modifier=</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:17:29+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:29+08:00</updatedAt>
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      <body>**IEEE Std 756-1984**（IEEE Trial Use Guide for loading Mineral-Oil Immersed Power Transformers Rated in Excess of 100 MVA (65 Degree C Winding Rise)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1984 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <title>IEEE Std 758-1979</title>
      <slug>ieee-std-758-1979</slug>
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        <alias>758-1979</alias>
        <alias>758-1979 - IEEE Standard Subroutines for Computer Automated Measurement and Control (CAMAC)</alias>
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      <summary>IEEE Std 758-1979 是电气电子工程师学会的技术标准，题为“IEEE Standard Subroutines for Computer Automated Measurement and Control (CAMAC)”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 1979 年。</summary>
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          <title>IEEE Std 758-1979 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=2630</url>
          <locator>standard_number=758-1979; status=Inactive; modifier=Reserved</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:17:29+08:00</createdAt>
      <updatedAt>2026-11-01T22:17:29+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 758-1979**（IEEE Standard Subroutines for Computer Automated Measurement and Control (CAMAC)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 1979 年，主题领域包括 Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <workKind>standard</workKind>
      <published>
        <year>1979</year>
        <precision>year</precision>
        <display>1979年</display>
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      <language>英语</language>
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