<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>IEEE 标准 · Relasi</title>
  <description>IEEE 标准是电气电子工程师学会发布的技术标准文献集合，涵盖通信、电力、计算与电磁兼容等领域；公开目录以 KBART 列表提供编号、题名、状态与 IEEE Xplore 题录链接。</description>
  <url>/ms/concepts/ieee-standards/relation-95.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>concept_ieee_standards</id>
    <type>concept</type>
    <title>IEEE 标准</title>
    <slug>ieee-standards</slug>
    <aliases>
      <alias>IEEE Standards</alias>
      <alias>IEEE Std</alias>
      <alias>电气电子工程师学会标准</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>IEEE 标准是电气电子工程师学会发布的技术标准文献集合，涵盖通信、电力、计算与电磁兼容等领域；公开目录以 KBART 列表提供编号、题名、状态与 IEEE Xplore 题录链接。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        <locator>2026-11-01 下载</locator>
      </source>
      <source>
        <id>s2</id>
        <title>KBART Title Lists</title>
        <author>IEEE Xplore Help</author>
        <url>https://ieeexplore.ieee.org/Xplorehelp/discovery-services/kbart-title-lists</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Standards Association / standards.ieee.org</title>
        <author>IEEE</author>
        <url>https://standards.ieee.org/</url>
      </source>
      <source>
        <id>s4</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:58+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:58+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**IEEE 标准**是[[organization_ieee|电气电子工程师学会]]（IEEE）通过其标准化活动发布的技术标准文献[^s3][^s4]。&#xA;&#xA;## 定义与范围&#xA;&#xA;公开机读目录「IEEE Xplore All Standards」以 KBART 格式列出标准编号、题名、出版年份、状态（如 Active、Superseded、Inactive）及 IEEE Xplore 题录链接等元数据，不提供付费全文[^s1][^s2]。本知识库按该目录逐条建立标准词条（work，workKind=standard），每条保留官方目录出处。&#xA;&#xA;## 沿革&#xA;&#xA;IEEE 由 AIEE 与 IRE 于1963年合并成立后继续并扩展标准制定；现行与历史版本均出现在 Xplore 标准集合中[^s4][^s1]。&#xA;&#xA;## 相关概念&#xA;&#xA;词条之间以发布机构、主题关系连接；同一标准号的多年版本各自成条或在正文互相链接，以便维护。</body>
    <url>/concepts/ieee-standards.html</url>
    <lang>ms</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <conceptKind>theme</conceptKind>
    <scopeNote>本条为总览；各标准号以独立 work 词条著录，勿仅在本条列表省略。</scopeNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_28ea680bb31cd9d45cf1383e</id>
      <fromId>work_ieee_p1800_2_d7_nov_2016</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1800_2_d7_nov_2016</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1800_2_d7_nov_2016</targetId>
      <targetTitle>IEEE Std P1800.2/D7, Nov 2016</targetTitle>
      <targetUrl>/ms/works/ieee-std-p1800-2-d7-nov-2016.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e7313b669c453a3eeedf297f</id>
      <fromId>work_ieee_p1800_2_d7_oct2019</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1800_2_d7_oct2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1800_2_d7_oct2019</targetId>
      <targetTitle>IEEE Std P1800.2/D7, Oct2019</targetTitle>
      <targetUrl>/ms/works/ieee-std-p1800-2-d7-oct2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4012d731580fd13d329ee68a</id>
      <fromId>work_ieee_p1800_2_d8_mar_2020</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1800_2_d8_mar_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1800_2_d8_mar_2020</targetId>
      <targetTitle>IEEE Std P1800.2/D8, Mar 2020</targetTitle>
      <targetUrl>/ms/works/ieee-std-p1800-2-d8-mar-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_fd91a925673c37d08e9a6b12</id>
      <fromId>work_ieee_1717_2024_10901980_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1717_2024_10901980_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1717_2024_10901980_redline</targetId>
      <targetTitle>IEEE Std 1717-2024</targetTitle>
      <targetUrl>/ms/works/ieee-std-1717-2024-10901980-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9ecff4311fb8d54f30304c43</id>
      <fromId>work_ieee_1718_2012</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1718_2012</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1718_2012</targetId>
      <targetTitle>IEEE Std 1718-2012</targetTitle>
      <targetUrl>/ms/works/ieee-std-1718-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bf6629ffeadf0a62ee700a8a</id>
      <fromId>work_ieee_172_1971</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_172_1971</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_172_1971</targetId>
      <targetTitle>IEEE Std 172-1971</targetTitle>
      <targetUrl>/ms/works/ieee-std-172-1971.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c6fdbe5e5fe7a997fec728d9</id>
      <fromId>work_ieee_172_1983</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_172_1983</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_172_1983</targetId>
      <targetTitle>IEEE Std 172-1983</targetTitle>
      <targetUrl>/ms/works/ieee-std-172-1983.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b24172c0ccb76b5dcc30b873</id>
      <fromId>work_ieee_1720_2012</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1720_2012</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1720_2012</targetId>
      <targetTitle>IEEE Std 1720-2012</targetTitle>
      <targetUrl>/ms/works/ieee-std-1720-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0b8d1a206bb2685bdd78d840</id>
      <fromId>work_ieee_1722_2011</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1722_2011</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1722_2011</targetId>
      <targetTitle>IEEE Std 1722-2011</targetTitle>
      <targetUrl>/ms/works/ieee-std-1722-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_47e21436a1ef86e5624c561f</id>
      <fromId>work_ieee_1722_2016</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1722_2016</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1722_2016</targetId>
      <targetTitle>IEEE Std 1722-2016</targetTitle>
      <targetUrl>/ms/works/ieee-std-1722-2016.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d618faaca3fe13da9e24fc68</id>
      <fromId>work_ieee_1722_1_2013</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1722_1_2013</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1722_1_2013</targetId>
      <targetTitle>IEEE Std 1722.1-2013</targetTitle>
      <targetUrl>/ms/works/ieee-std-1722-1-2013.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_de1eb58e04c5099f1639fdba</id>
      <fromId>work_ieee_1722_1_2013_cor_1_2018</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1722_1_2013_cor_1_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1722_1_2013_cor_1_2018</targetId>
      <targetTitle>IEEE Std 1722.1-2013/Cor 1-2018</targetTitle>
      <targetUrl>/ms/works/ieee-std-1722-1-2013-cor-1-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9e5aa28944cb05caf70aeb02</id>
      <fromId>work_ieee_1722_1_2021_10053665_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1722_1_2021_10053665_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1722_1_2021_10053665_redline</targetId>
      <targetTitle>IEEE Std 1722.1-2021</targetTitle>
      <targetUrl>/ms/works/ieee-std-1722-1-2021-10053665-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b592cab571843c03f9ec1be1</id>
      <fromId>work_ieee_1724_2011</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1724_2011</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1724_2011</targetId>
      <targetTitle>IEEE Std 1724-2011</targetTitle>
      <targetUrl>/ms/works/ieee-std-1724-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b6f0e4994346138ad15d580f</id>
      <fromId>work_ieee_1725_2006</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1725_2006</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1725_2006</targetId>
      <targetTitle>IEEE Std 1725-2006</targetTitle>
      <targetUrl>/ms/works/ieee-std-1725-2006.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_99c49883f63f105cae065259</id>
      <fromId>work_ieee_1725_2011_5930302</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1725_2011_5930302</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1725_2011_5930302</targetId>
      <targetTitle>IEEE Std 1725-2011</targetTitle>
      <targetUrl>/ms/works/ieee-std-1725-2011-5930302.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a67ec06eec3c7c52ee242f6a</id>
      <fromId>work_ieee_1725_2011_6046068_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1725_2011_6046068_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1725_2011_6046068_redline</targetId>
      <targetTitle>IEEE Std 1725-2011</targetTitle>
      <targetUrl>/ms/works/ieee-std-1725-2011-6046068-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f964e806166426ccfed9a2ec</id>
      <fromId>work_ieee_1725_2021_9709253_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1725_2021_9709253_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1725_2021_9709253_redline</targetId>
      <targetTitle>IEEE Std 1725-2021</targetTitle>
      <targetUrl>/ms/works/ieee-std-1725-2021-9709253-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c1a190cab0728ed0a61f2a90</id>
      <fromId>work_ieee_1726_2013</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1726_2013</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1726_2013</targetId>
      <targetTitle>IEEE Std 1726-2013</targetTitle>
      <targetUrl>/ms/works/ieee-std-1726-2013.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d866d2780f1c6d6c5bd153ea</id>
      <fromId>work_ieee_1727_2013</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1727_2013</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1727_2013</targetId>
      <targetTitle>IEEE Std 1727-2013</targetTitle>
      <targetUrl>/ms/works/ieee-std-1727-2013.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f426a50baa3b8a8944c023c5</id>
      <fromId>work_ieee_1727_2013_cor_1_2015</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1727_2013_cor_1_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1727_2013_cor_1_2015</targetId>
      <targetTitle>IEEE Std 1727-2013/Cor 1-2015</targetTitle>
      <targetUrl>/ms/works/ieee-std-1727-2013-cor-1-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_75c854ae6269ae797ec709ec</id>
      <fromId>work_ieee_1729_2014</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1729_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1729_2014</targetId>
      <targetTitle>IEEE Std 1729-2014</targetTitle>
      <targetUrl>/ms/works/ieee-std-1729-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3f913b8d8ea0412291637b76</id>
      <fromId>work_ieee_1730_2010</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1730_2010</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1730_2010</targetId>
      <targetTitle>IEEE Std 1730-2010</targetTitle>
      <targetUrl>/ms/works/ieee-std-1730-2010.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_95b631eeddaa9a6559007fc2</id>
      <fromId>work_ieee_1730_2022_10897770_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1730_2022_10897770_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1730_2022_10897770_redline</targetId>
      <targetTitle>IEEE Std 1730-2022</targetTitle>
      <targetUrl>/ms/works/ieee-std-1730-2022-10897770-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_cc6aebb12cbdeb780f29b581</id>
      <fromId>work_ieee_1730_1_2013</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1730_1_2013</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1730_1_2013</targetId>
      <targetTitle>IEEE Std 1730.1-2013</targetTitle>
      <targetUrl>/ms/works/ieee-std-1730-1-2013.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1b030e0ae11ee3848b8faae7</id>
      <fromId>work_ieee_1730_1_2023_10897752_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1730_1_2023_10897752_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1730_1_2023_10897752_redline</targetId>
      <targetTitle>IEEE Std 1730.1-2023</targetTitle>
      <targetUrl>/ms/works/ieee-std-1730-1-2023-10897752-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a59a548e681c97a9c65ec4dc</id>
      <fromId>work_ieee_1733_2011</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1733_2011</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1733_2011</targetId>
      <targetTitle>IEEE Std 1733-2011</targetTitle>
      <targetUrl>/ms/works/ieee-std-1733-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2b40bda8c44fd5000c8c113a</id>
      <fromId>work_ieee_1734_2011</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1734_2011</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1734_2011</targetId>
      <targetTitle>IEEE Std 1734-2011</targetTitle>
      <targetUrl>/ms/works/ieee-std-1734-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d600d45c5eb5958d98d59ddd</id>
      <fromId>work_ieee_1735_2014</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1735_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1735_2014</targetId>
      <targetTitle>IEEE Std 1735-2014</targetTitle>
      <targetUrl>/ms/works/ieee-std-1735-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8910a227c650a18bd53bf563</id>
      <fromId>work_ieee_1735_2023_10505229_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1735_2023_10505229_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1735_2023_10505229_redline</targetId>
      <targetTitle>IEEE Std 1735-2023</targetTitle>
      <targetUrl>/ms/works/ieee-std-1735-2023-10505229-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8fb407fc8c1a88162ce1c91d</id>
      <fromId>work_ieee_175_1960</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_175_1960</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_175_1960</targetId>
      <targetTitle>IEEE Std 175-1960</targetTitle>
      <targetUrl>/ms/works/ieee-std-175-1960.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_85117afc87e0cd1720088857</id>
      <fromId>work_ieee_1754_1994</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1754_1994</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1754_1994</targetId>
      <targetTitle>IEEE Std 1754-1994</targetTitle>
      <targetUrl>/ms/works/ieee-std-1754-1994.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c1a0a5ddf6d6760a9d60bd43</id>
      <fromId>work_ieee_176_1949</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_176_1949</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_176_1949</targetId>
      <targetTitle>IEEE Std 176-1949</targetTitle>
      <targetUrl>/ms/works/ieee-std-176-1949.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_fee596888ef69ace1ed74c04</id>
      <fromId>work_ieee_176_1978</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_176_1978</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_176_1978</targetId>
      <targetTitle>IEEE Std 176-1978</targetTitle>
      <targetUrl>/ms/works/ieee-std-176-1978.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_952ef87777ef5210408d0d9c</id>
      <fromId>work_ieee_176_1987</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_176_1987</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_176_1987</targetId>
      <targetTitle>IEEE Std 176-1987</targetTitle>
      <targetUrl>/ms/works/ieee-std-176-1987.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_98e3851f6fbd4dd07c60d5f3</id>
      <fromId>work_ieee_177_1966</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_177_1966</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_177_1966</targetId>
      <targetTitle>IEEE Std 177-1966</targetTitle>
      <targetUrl>/ms/works/ieee-std-177-1966.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_046925f227dbc6579927fc66</id>
      <fromId>work_ieee_1775_2010</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1775_2010</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1775_2010</targetId>
      <targetTitle>IEEE Std 1775-2010</targetTitle>
      <targetUrl>/ms/works/ieee-std-1775-2010.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d8d47cddbec7f2f0e34e8602</id>
      <fromId>work_ieee_1776_2008</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1776_2008</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1776_2008</targetId>
      <targetTitle>IEEE Std 1776-2008</targetTitle>
      <targetUrl>/ms/works/ieee-std-1776-2008.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6890521e0b10f8138cedf804</id>
      <fromId>work_ieee_178_1958</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_178_1958</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_178_1958</targetId>
      <targetTitle>IEEE Std 178-1958</targetTitle>
      <targetUrl>/ms/works/ieee-std-178-1958.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_99d971ac6905861adbdf35c2</id>
      <fromId>work_ieee_1782_2014</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1782_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1782_2014</targetId>
      <targetTitle>IEEE Std 1782-2014</targetTitle>
      <targetUrl>/ms/works/ieee-std-1782-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b6fc90d4fe60f8896cb20b40</id>
      <fromId>work_ieee_1782_2022_9927303_redline</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1782_2022_9927303_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1782_2022_9927303_redline</targetId>
      <targetTitle>IEEE Std 1782-2022</targetTitle>
      <targetUrl>/ms/works/ieee-std-1782-2022-9927303-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_065fe6045eac0859e41acf70</id>
      <fromId>work_ieee_1783_2009</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1783_2009</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1783_2009</targetId>
      <targetTitle>IEEE Std 1783-2009</targetTitle>
      <targetUrl>/ms/works/ieee-std-1783-2009.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d1428ea2d3e12841d28ebb3e</id>
      <fromId>work_ieee_1785_1_2012</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1785_1_2012</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_1785_1_2012</targetId>
      <targetTitle>IEEE Std 1785.1-2012</targetTitle>
      <targetUrl>/ms/works/ieee-std-1785-1-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_758a704807d58bc2656a83c2</id>
      <fromId>work_ieee_p1800_d17_mar_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1800_d17_mar_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1800_d17_mar_2023</targetId>
      <targetTitle>IEEE Std P1800/D17, Mar 2023</targetTitle>
      <targetUrl>/ms/works/ieee-std-p1800-d17-mar-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bdd486fd48b0a508e2ff5580</id>
      <fromId>work_ieee_p1800_d18_aug_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1800_d18_aug_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1800_d18_aug_2023</targetId>
      <targetTitle>IEEE Std P1800/D18, Aug 2023</targetTitle>
      <targetUrl>/ms/works/ieee-std-p1800-d18-aug-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8050e923c3274139f37599f2</id>
      <fromId>work_ieee_p1800_d3_apr_2017</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1800_d3_apr_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1800_d3_apr_2017</targetId>
      <targetTitle>IEEE Std P1800/D3, Apr 2017</targetTitle>
      <targetUrl>/ms/works/ieee-std-p1800-d3-apr-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_457f411dfd0ef0d50e662b9d</id>
      <fromId>work_ieee_p1800_d3_nov_2011</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1800_d3_nov_2011</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1800_d3_nov_2011</targetId>
      <targetTitle>IEEE Std P1800/D3, Nov 2011</targetTitle>
      <targetUrl>/ms/works/ieee-std-p1800-d3-nov-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_92b2d49c3b69eb83725e59a7</id>
      <fromId>work_ieee_p1800_d4a_jul_2017</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1800_d4a_jul_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1800_d4a_jul_2017</targetId>
      <targetTitle>IEEE Std P1800/D4a, Jul 2017</targetTitle>
      <targetUrl>/ms/works/ieee-std-p1800-d4a-jul-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7b357e22abe2acba66a619fe</id>
      <fromId>work_ieee_p1800_d5_feb_2012</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1800_d5_feb_2012</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1800_d5_feb_2012</targetId>
      <targetTitle>IEEE Std P1800/D5, Feb 2012</targetTitle>
      <targetUrl>/ms/works/ieee-std-p1800-d5-feb-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8fbc76b65de8501fb22acf72</id>
      <fromId>work_ieee_p1800_d6</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1800_d6</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_p1800_d6</targetId>
      <targetTitle>IEEE Std P1800/D6</targetTitle>
      <targetUrl>/ms/works/ieee-std-p1800-d6.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/ms/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/ms/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/ms/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/ms/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/ms/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/ms/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/ms/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/ms/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/ms/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_1_1988</fromId>
      <fromTitle>IEEE Std 1003.1-1988</fromTitle>
      <fromUrl>/ms/works/ieee-std-1003-1-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>ms</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>concept_kind</key>
      <label>Concept kind</label>
      <value>Tema</value>
    </field>
    <field>
      <key>aliases</key>
      <label>Aliases</label>
      <value>IEEE Standards, IEEE Std, 电气电子工程师学会标准</value>
    </field>
    <field>
      <key>scope_note</key>
      <label>Scope note</label>
      <value>本条为总览；各标准号以独立 work 词条著录，勿仅在本条列表省略。</value>
    </field>
  </infoFields>
  <pagination>
    <page>95</page>
    <pageSize>50</pageSize>
    <total>8263</total>
    <pageCount>166</pageCount>
    <prevUrl>/ms/concepts/ieee-standards/relation-94.xml</prevUrl>
    <nextUrl>/ms/concepts/ieee-standards/relation-96.xml</nextUrl>
  </pagination>
  <relationsTotal>8263</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8278</mentionsTotal>
  <mentionsUrl>/ms/concepts/ieee-standards/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>