{ "contentStorage": "postgres", "title": "Nieuw", "description": "Explore recently updated entries.", "url": "/nl/new-165.html", "entities": [ { "id": "work_ieee_p1801_d9_oct_2015", "type": "work", "title": "IEEE Std P1801/D9, Oct 2015", "slug": "ieee-std-p1801-d9-oct-2015", "aliases": [ "P1801/D9, Oct 2015", "P1801/D9, Oct 2015 - IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems" ], "summary": "IEEE Std P1801/D9, Oct 2015 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems”；公开目录标为非现行（Inactive），著录年份为 2015 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1801/D9, Oct 2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7320929", "locator": "standard_number=P1801/D9, Oct 2015; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:01:00+08:00", "updatedAt": "2026-11-01T22:01:00+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1801/D9, Oct 2015**（IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems）是[[organization_ieee|电气电子工程师学会]]于 2015 年 10 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1801-d9-oct-2015.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2015, "precision": "year", "display": "2015年" }, "language": "英语" }, { "id": "work_ieee_p1801_d14_january_23_2013", "type": "work", "title": "IEEE Std P1801/D14, January 23, 2013", "slug": "ieee-std-p1801-d14-january-23-2013", "aliases": [ "P1801/D14, January 23, 2013", "P1801/D14, January 23, 2013 - IEEE Standard for Design and Verification of Low-Power Integrated Circuits" ], "summary": "IEEE Std P1801/D14, January 23, 2013 是电气电子工程师学会的草案，题为“IEEE Standard for Design and Verification of Low-Power Integrated Circuits”；公开目录标为非现行（Inactive），著录年份为 2013 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1801/D14, January 23, 2013 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6422310", "locator": "standard_number=P1801/D14, January 23, 2013; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:59+08:00", "updatedAt": "2026-11-01T22:00:59+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1801/D14, January 23, 2013**（IEEE Standard for Design and Verification of Low-Power Integrated Circuits）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2013 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1801-d14-january-23-2013.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2013, "precision": "year", "display": "2013年" }, "language": "英语" }, { "id": "work_ieee_p1801_d7_aug_2015", "type": "work", "title": "IEEE Std P1801/D7, Aug 2015", "slug": "ieee-std-p1801-d7-aug-2015", "aliases": [ "P1801/D7, Aug 2015", "P1801/D7, Aug 2015 - IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems" ], "summary": "IEEE Std P1801/D7, Aug 2015 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems”；公开目录标为非现行（Inactive），著录年份为 2015 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1801/D7, Aug 2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7293039", "locator": "standard_number=P1801/D7, Aug 2015; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:59+08:00", "updatedAt": "2026-11-01T22:00:59+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1801/D7, Aug 2015**（IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems）是[[organization_ieee|电气电子工程师学会]]于 2015 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1801-d7-aug-2015.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2015, "precision": "year", "display": "2015年" }, "language": "英语" }, { "id": "work_ieee_p1801_d13_jan_2013", "type": "work", "title": "IEEE Std P1801/D13, Jan 2013", "slug": "ieee-std-p1801-d13-jan-2013", "aliases": [ "P1801/D13, Jan 2013", "P1801/D13, Jan 2013 - IEEE Draft Standard for Design and Verification of Low Power Integrated Circuits" ], "summary": "IEEE Std P1801/D13, Jan 2013 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Design and Verification of Low Power Integrated Circuits”；公开目录标为非现行（Inactive），著录年份为 2013 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1801/D13, Jan 2013 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6413154", "locator": "standard_number=P1801/D13, Jan 2013; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:56+08:00", "updatedAt": "2026-11-01T22:00:56+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1801/D13, Jan 2013**（IEEE Draft Standard for Design and Verification of Low Power Integrated Circuits）是[[organization_ieee|电气电子工程师学会]]于 2013 年 1 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Fields, Waves and Electromagnetics、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1801-d13-jan-2013.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2013, "precision": "year", "display": "2013年" }, "language": "英语" }, { "id": "work_ieee_p1801_d12_jul_2018", "type": "work", "title": "IEEE Std P1801/D12, Jul 2018", "slug": "ieee-std-p1801-d12-jul-2018", "aliases": [ "P1801/D12, Jul 2018", "P1801/D12, Jul 2018 - IEEE Approved Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems" ], "summary": "IEEE Std P1801/D12, Jul 2018 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems”；公开目录标为非现行（Inactive），著录年份为 2018 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1801/D12, Jul 2018 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8423467", "locator": "standard_number=P1801/D12, Jul 2018; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:55+08:00", "updatedAt": "2026-11-01T22:00:55+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1801/D12, Jul 2018**（IEEE Approved Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems）是[[organization_ieee|电气电子工程师学会]]于 2018 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1801-d12-jul-2018.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2018, "precision": "year", "display": "2018年" }, "language": "英语" }, { "id": "work_ieee_p1801_d10_26_jul_2024", "type": "work", "title": "IEEE Std P1801/D10.26, Jul 2024", "slug": "ieee-std-p1801-d10-26-jul-2024", "aliases": [ "P1801/D10.26, Jul 2024", "P1801/D10.26, Jul 2024 - IEEE Approved Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems" ], "summary": "IEEE Std P1801/D10.26, Jul 2024 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems”；公开目录标为非现行（Inactive），著录年份为 2024 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1801/D10.26, Jul 2024 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=10623590", "locator": "standard_number=P1801/D10.26, Jul 2024; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:54+08:00", "updatedAt": "2026-11-01T22:00:54+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1801/D10.26, Jul 2024**（IEEE Approved Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems）是[[organization_ieee|电气电子工程师学会]]于 2024 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1801-d10-26-jul-2024.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2024, "precision": "year", "display": "2024年" }, "language": "英语" }, { "id": "work_ieee_p1801_d11_jul_2018", "type": "work", "title": "IEEE Std P1801/D11, Jul 2018", "slug": "ieee-std-p1801-d11-jul-2018", "aliases": [ "P1801/D11, Jul 2018", "P1801/D11, Jul 2018 - IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems" ], "summary": "IEEE Std P1801/D11, Jul 2018 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems”；公开目录标为非现行（Inactive），著录年份为 2018 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1801/D11, Jul 2018 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8405778", "locator": "standard_number=P1801/D11, Jul 2018; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:54+08:00", "updatedAt": "2026-11-01T22:00:54+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1801/D11, Jul 2018**（IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems）是[[organization_ieee|电气电子工程师学会]]于 2018 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1801-d11-jul-2018.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2018, "precision": "year", "display": "2018年" }, "language": "英语" }, { "id": "work_ieee_p1801_d10_25_jul_2024", "type": "work", "title": "IEEE Std P1801/D10.25, Jul 2024", "slug": "ieee-std-p1801-d10-25-jul-2024", "aliases": [ "P1801/D10.25, Jul 2024", "P1801/D10.25, Jul 2024 - IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems" ], "summary": "IEEE Std P1801/D10.25, Jul 2024 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems”；公开目录标为非现行（Inactive），著录年份为 2024 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1801/D10.25, Jul 2024 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=10605746", "locator": "standard_number=P1801/D10.25, Jul 2024; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:52+08:00", "updatedAt": "2026-11-01T22:00:52+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1801/D10.25, Jul 2024**（IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems）是[[organization_ieee|电气电子工程师学会]]于 2024 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1801-d10-25-jul-2024.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2024, "precision": "year", "display": "2024年" }, "language": "英语" }, { "id": "work_ieee_1730_1_2013", "type": "work", "title": "IEEE Std 1730.1-2013", "slug": "ieee-std-1730-1-2013", "aliases": [ "1730.1-2013", "1730.1-2013 - IEEE Recommended Practice for Distributed Simulation Engineering and Execution Process Multi-Architecture Overlay (DMAO)" ], "summary": "IEEE Std 1730.1-2013 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Distributed Simulation Engineering and Execution Process Multi-Architecture Overlay (DMAO)”；公开目录标为已被替代（Superseded），著录年份为 2013 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1730.1-2013 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6654217", "locator": "standard_number=1730.1-2013; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1730.1-2013**（IEEE Recommended Practice for Distributed Simulation Engineering and Execution Process Multi-Architecture Overlay (DMAO)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2013 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1730-1-2013.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2013, "precision": "year", "display": "2013年" }, "language": "英语" }, { "id": "work_ieee_1730_1_2023_10897752_redline", "type": "work", "title": "IEEE Std 1730.1-2023", "slug": "ieee-std-1730-1-2023-10897752-redline", "aliases": [ "1730.1-2023", "1730.1-2023 - IEEE Recommended Practice for Distributed Simulation Engineering and Execution Process Multi‐Architecture Overlay - Redline" ], "summary": "IEEE Std 1730.1-2023 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Distributed Simulation Engineering and Execution Process Multi‐Architecture Overlay - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2024 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1730.1-2023 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=10897752", "locator": "standard_number=1730.1-2023; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1730.1-2023**（IEEE Recommended Practice for Distributed Simulation Engineering and Execution Process Multi‐Architecture Overlay - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2024 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1730-1-2023-10897752-redline.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2024, "precision": "year", "display": "2024年" }, "language": "英语" }, { "id": "work_ieee_1730_2022_10897770_redline", "type": "work", "title": "IEEE Std 1730-2022", "slug": "ieee-std-1730-2022-10897770-redline", "aliases": [ "1730-2022", "1730-2022 - IEEE Recommended Practice for Distributed Simulation Engineering and Execution Process (DSEEP - Redline" ], "summary": "IEEE Std 1730-2022 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Distributed Simulation Engineering and Execution Process (DSEEP - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2022 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1730-2022 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=10897770", "locator": "standard_number=1730-2022; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1730-2022**（IEEE Recommended Practice for Distributed Simulation Engineering and Execution Process (DSEEP - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2022 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1730-2022-10897770-redline.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2022, "precision": "year", "display": "2022年" }, "language": "英语" }, { "id": "work_ieee_1733_2011", "type": "work", "title": "IEEE Std 1733-2011", "slug": "ieee-std-1733-2011", "aliases": [ "1733-2011", "1733-2011 - IEEE Standard for Layer 3 Transport Protocol for Time-Sensitive Applications in Local Area Networks" ], "summary": "IEEE Std 1733-2011 是电气电子工程师学会的技术标准，题为“IEEE Standard for Layer 3 Transport Protocol for Time-Sensitive Applications in Local Area Networks”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1733-2011 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5762651", "locator": "standard_number=1733-2011; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1733-2011**（IEEE Standard for Layer 3 Transport Protocol for Time-Sensitive Applications in Local Area Networks）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Components, Circuits, Devices and Systems、Communication, Networking and Broadcast Technologies、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1733-2011.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2011, "precision": "year", "display": "2011年" }, "language": "英语" }, { "id": "work_ieee_1734_2011", "type": "work", "title": "IEEE Std 1734-2011", "slug": "ieee-std-1734-2011", "aliases": [ "1734-2011", "1734-2011 - IEEE Standard for Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs" ], "summary": "IEEE Std 1734-2011 是电气电子工程师学会的技术标准，题为“IEEE Standard for Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1734-2011 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6035729", "locator": "standard_number=1734-2011; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1734-2011**（IEEE Standard for Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1734-2011.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2011, "precision": "year", "display": "2011年" }, "language": "英语" }, { "id": "work_ieee_1735_2014", "type": "work", "title": "IEEE Std 1735-2014", "slug": "ieee-std-1735-2014", "aliases": [ "1735-2014", "1735-2014 - IEEE Recommended Practice for Encryption and Management of Electronic Design Intellectual Property (IP)" ], "summary": "IEEE Std 1735-2014 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Encryption and Management of Electronic Design Intellectual Property (IP)”；公开目录标为已被替代（Superseded），著录年份为 2015 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1735-2014 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7274479", "locator": "standard_number=1735-2014; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1735-2014**（IEEE Recommended Practice for Encryption and Management of Electronic Design Intellectual Property (IP)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1735-2014.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2015, "precision": "year", "display": "2015年" }, "language": "英语" }, { "id": "work_ieee_1735_2023_10505229_redline", "type": "work", "title": "IEEE Std 1735-2023", "slug": "ieee-std-1735-2023-10505229-redline", "aliases": [ "1735-2023", "1735-2023 - IEEE Recommended Practice for Encryption and Management of Electronic Design Intellectual Property (IP) - Redline" ], "summary": "IEEE Std 1735-2023 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Encryption and Management of Electronic Design Intellectual Property (IP) - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2023 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1735-2023 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=10505229", "locator": "standard_number=1735-2023; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1735-2023**（IEEE Recommended Practice for Encryption and Management of Electronic Design Intellectual Property (IP) - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2023 年，主题领域包括 Computing and Processing、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1735-2023-10505229-redline.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2023, "precision": "year", "display": "2023年" }, "language": "英语" }, { "id": "work_ieee_1754_1994", "type": "work", "title": "IEEE Std 1754-1994", "slug": "ieee-std-1754-1994", "aliases": [ "1754-1994", "1754-1994 - IEEE Standard for a 32-bit Microprocessor Architecture" ], "summary": "IEEE Std 1754-1994 是电气电子工程师学会的技术标准，题为“IEEE Standard for a 32-bit Microprocessor Architecture”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1995 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1754-1994 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=3435", "locator": "standard_number=1754-1994; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1754-1994**（IEEE Standard for a 32-bit Microprocessor Architecture）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1995 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1754-1994.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1995, "precision": "year", "display": "1995年" }, "language": "英语" }, { "id": "work_ieee_175_1960", "type": "work", "title": "IEEE Std 175-1960", "slug": "ieee-std-175-1960", "aliases": [ "175-1960", "175-1960 - IRE Standards on Nuclear Techniques: Definitions for the Scintillation Counter Field, 1960" ], "summary": "IEEE Std 175-1960 是电气电子工程师学会的技术标准，题为“IRE Standards on Nuclear Techniques: Definitions for the Scintillation Counter Field, 1960”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1960 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 175-1960 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6529091", "locator": "standard_number=175-1960; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 175-1960**（IRE Standards on Nuclear Techniques: Definitions for the Scintillation Counter Field, 1960）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1960 年，主题领域包括 Nuclear Engineering、Engineered Materials, Dielectrics and Plasmas、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-175-1960.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1960, "precision": "year", "display": "1960年" }, "language": "英语" }, { "id": "work_ieee_176_1949", "type": "work", "title": "IEEE Std 176-1949", "slug": "ieee-std-176-1949", "aliases": [ "176-1949", "176-1949 - IEEE Standards on Piezoelectric Crystals, 1949" ], "summary": "IEEE Std 176-1949 是电气电子工程师学会的技术标准，题为“IEEE Standards on Piezoelectric Crystals, 1949”；公开目录标为已被替代（Superseded），著录年份为 1949 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 176-1949 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8631111", "locator": "standard_number=176-1949; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 176-1949**（IEEE Standards on Piezoelectric Crystals, 1949）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1949 年，主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-176-1949.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1949, "precision": "year", "display": "1949年" }, "language": "英语" }, { "id": "work_ieee_176_1978", "type": "work", "title": "IEEE Std 176-1978", "slug": "ieee-std-176-1978", "aliases": [ "176-1978", "176-1978 - IEEE Standard on Piezoelectricity" ], "summary": "IEEE Std 176-1978 是电气电子工程师学会的技术标准，题为“IEEE Standard on Piezoelectricity”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1978 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 176-1978 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8941329", "locator": "standard_number=176-1978; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 176-1978**（IEEE Standard on Piezoelectricity）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1978 年，主题领域包括 Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-176-1978.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1978, "precision": "year", "display": "1978年" }, "language": "英语" }, { "id": "work_ieee_176_1987", "type": "work", "title": "IEEE Std 176-1987", "slug": "ieee-std-176-1987", "aliases": [ "176-1987", "176-1987 - IEEE Standard on Piezoelectricity" ], "summary": "IEEE Std 176-1987 是电气电子工程师学会的技术标准，题为“IEEE Standard on Piezoelectricity”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1988 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 176-1987 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=2511", "locator": "standard_number=176-1987; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 176-1987**（IEEE Standard on Piezoelectricity）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1988 年，主题领域包括 Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-176-1987.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1988, "precision": "year", "display": "1988年" }, "language": "英语" }, { "id": "work_ieee_1775_2010", "type": "work", "title": "IEEE Std 1775-2010", "slug": "ieee-std-1775-2010", "aliases": [ "1775-2010", "1775-2010 - IEEE Standard for Power Line Communication Equipment--Electromagnetic Compatibility (EMC) Requirements--Testing and Measurement Methods" ], "summary": "IEEE Std 1775-2010 是电气电子工程师学会的技术标准，题为“IEEE Standard for Power Line Communication Equipment--Electromagnetic Compatibility (EMC) Requirements--Testing and Measurement Methods”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1775-2010 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5682871", "locator": "standard_number=1775-2010; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1775-2010**（IEEE Standard for Power Line Communication Equipment--Electromagnetic Compatibility (EMC) Requirements--Testing and Measurement Methods）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1775-2010.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2011, "precision": "year", "display": "2011年" }, "language": "英语" }, { "id": "work_ieee_1776_2008", "type": "work", "title": "IEEE Std 1776-2008", "slug": "ieee-std-1776-2008", "aliases": [ "1776-2008", "1776-2008 - IEEE Recommended Practice for Thermal Evaluation of Unsealed or Sealed Insulation Systems for AC Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Machines Rated 15 00" ], "summary": "IEEE Std 1776-2008 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Thermal Evaluation of Unsealed or Sealed Insulation Systems for AC Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Machines Rated 15 00”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1776-2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4784471", "locator": "standard_number=1776-2008; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1776-2008**（IEEE Recommended Practice for Thermal Evaluation of Unsealed or Sealed Insulation Systems for AC Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Machines Rated 15 00）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2009 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1776-2008.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_177_1966", "type": "work", "title": "IEEE Std 177-1966", "slug": "ieee-std-177-1966", "aliases": [ "177-1966", "177-1966 - IEEE Standard Definitions and Methods of Measurement for Piezoelectric Vibrators" ], "summary": "IEEE Std 177-1966 是电气电子工程师学会的技术标准，题为“IEEE Standard Definitions and Methods of Measurement for Piezoelectric Vibrators”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1966 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 177-1966 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=2726", "locator": "standard_number=177-1966; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 177-1966**（IEEE Standard Definitions and Methods of Measurement for Piezoelectric Vibrators）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1966 年，主题领域包括 Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-177-1966.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1966, "precision": "year", "display": "1966年" }, "language": "英语" }, { "id": "work_ieee_1782_2014", "type": "work", "title": "IEEE Std 1782-2014", "slug": "ieee-std-1782-2014", "aliases": [ "1782-2014", "1782-2014 - IEEE Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events" ], "summary": "IEEE Std 1782-2014 是电气电子工程师学会的技术标准，题为“IEEE Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events”；公开目录标为已被替代（Superseded），著录年份为 2014 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1782-2014 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6878407", "locator": "standard_number=1782-2014; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1782-2014**（IEEE Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2014 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1782-2014.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2014, "precision": "year", "display": "2014年" }, "language": "英语" }, { "id": "work_ieee_1782_2022_9927303_redline", "type": "work", "title": "IEEE Std 1782-2022", "slug": "ieee-std-1782-2022-9927303-redline", "aliases": [ "1782-2022", "1782-2022 - IEEE Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events - Redline" ], "summary": "IEEE Std 1782-2022 是电气电子工程师学会的技术标准，题为“IEEE Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2022 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1782-2022 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9927303", "locator": "standard_number=1782-2022; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1782-2022**（IEEE Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2022 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1782-2022-9927303-redline.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2022, "precision": "year", "display": "2022年" }, "language": "英语" }, { "id": "work_ieee_1783_2009", "type": "work", "title": "IEEE Std 1783-2009", "slug": "ieee-std-1783-2009", "aliases": [ "1783-2009", "1783-2009 - IEEE Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions" ], "summary": "IEEE Std 1783-2009 是电气电子工程师学会的技术标准，题为“IEEE Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1783-2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5291196", "locator": "standard_number=1783-2009; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1783-2009**（IEEE Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2009 年，主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1783-2009.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_1785_1_2012", "type": "work", "title": "IEEE Std 1785.1-2012", "slug": "ieee-std-1785-1-2012", "aliases": [ "1785.1-2012", "1785.1-2012 - IEEE Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above—Part 1: Frequency Bands and Waveguide Dimensions" ], "summary": "IEEE Std 1785.1-2012 是电气电子工程师学会的技术标准，题为“IEEE Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above—Part 1: Frequency Bands and Waveguide Dimensions”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2013 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1785.1-2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6471985", "locator": "standard_number=1785.1-2012; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1785.1-2012**（IEEE Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above—Part 1: Frequency Bands and Waveguide Dimensions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2013 年，主题领域包括 Fields, Waves and Electromagnetics、Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1785-1-2012.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2013, "precision": "year", "display": "2013年" }, "language": "英语" }, { "id": "work_ieee_178_1958", "type": "work", "title": "IEEE Std 178-1958", "slug": "ieee-std-178-1958", "aliases": [ "178-1958", "178-1958 - IEEE Standards on Piezoelectric Crystals:Determination of The Elastic. Piezoelectric and Dielectric Constants- The Electro mechanical Coupling Factor, 1958" ], "summary": "IEEE Std 178-1958 是电气电子工程师学会的技术标准，题为“IEEE Standards on Piezoelectric Crystals:Determination of The Elastic. Piezoelectric and Dielectric Constants- The Electro mechanical Coupling Factor, 1958”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1958 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 178-1958 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8941332", "locator": "standard_number=178-1958; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 178-1958**（IEEE Standards on Piezoelectric Crystals:Determination of The Elastic. Piezoelectric and Dielectric Constants- The Electro mechanical Coupling Factor, 1958）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1958 年，主题领域包括 Components, Circuits, Devices and Systems、General Topics for Engineers、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-178-1958.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1958, "precision": "year", "display": "1958年" }, "language": "英语" }, { "id": "work_ieee_p1801_d10_23_may_2024", "type": "work", "title": "IEEE Std P1801/D10.23, May 2024", "slug": "ieee-std-p1801-d10-23-may-2024", "aliases": [ "P1801/D10.23, May 2024", "P1801/D10.23, May 2024 - IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems" ], "summary": "IEEE Std P1801/D10.23, May 2024 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems”；公开目录标为非现行（Inactive），著录年份为 2024 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1801/D10.23, May 2024 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=10545334", "locator": "standard_number=P1801/D10.23, May 2024; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1801/D10.23, May 2024**（IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems）是[[organization_ieee|电气电子工程师学会]]于 2024 年 5 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1801-d10-23-may-2024.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2024, "precision": "year", "display": "2024年" }, "language": "英语" }, { "id": "work_ieee_p1801_d10_aug_2017", "type": "work", "title": "IEEE Std P1801/D10, Aug 2017", "slug": "ieee-std-p1801-d10-aug-2017", "aliases": [ "P1801/D10, Aug 2017", "P1801/D10, Aug 2017 - IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems" ], "summary": "IEEE Std P1801/D10, Aug 2017 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems”；公开目录标为非现行（Inactive），著录年份为 2017 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1801/D10, Aug 2017 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8405775", "locator": "standard_number=P1801/D10, Aug 2017; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:51+08:00", "updatedAt": "2026-11-01T22:00:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1801/D10, Aug 2017**（IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems）是[[organization_ieee|电气电子工程师学会]]于 2017 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1801-d10-aug-2017.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2017, "precision": "year", "display": "2017年" }, "language": "英语" }, { "id": "work_ieee_p1800_d8_feb_2009", "type": "work", "title": "IEEE Std P1800/D8, Feb, 2009", "slug": "ieee-std-p1800-d8-feb-2009", "aliases": [ "P1800/D8, Feb, 2009", "P1800/D8, Feb, 2009 - IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language" ], "summary": "IEEE Std P1800/D8, Feb, 2009 是电气电子工程师学会的草案，题为“IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language”；公开目录标为非现行（Inactive），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1800/D8, Feb, 2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4796918", "locator": "standard_number=P1800/D8, Feb, 2009; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:50+08:00", "updatedAt": "2026-11-01T22:00:50+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1800/D8, Feb, 2009**（IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2009 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1800-d8-feb-2009.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_p1800_d6", "type": "work", "title": "IEEE Std P1800/D6", "slug": "ieee-std-p1800-d6", "aliases": [ "P1800/D6", "P1800/D6 - IEEE Unapproved IEEE Draft Standard for System Verilog: Unified Hardware Design, Specification and Verification Language (Superseded by P1800/D6)" ], "summary": "IEEE Std P1800/D6 是电气电子工程师学会的草案，题为“IEEE Unapproved IEEE Draft Standard for System Verilog: Unified Hardware Design, Specification and Verification Language (Superseded by P1800/D6)”；公开目录标为非现行（Inactive），著录年份为 2005 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1800/D6 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4040481", "locator": "standard_number=P1800/D6; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:49+08:00", "updatedAt": "2026-11-01T22:00:49+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1800/D6**（IEEE Unapproved IEEE Draft Standard for System Verilog: Unified Hardware Design, Specification and Verification Language (Superseded by P1800/D6)）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2005 年，主题领域包括 General Topics for Engineers、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1800-d6.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2005, "precision": "year", "display": "2005年" }, "language": "英语" }, { "id": "work_ieee_p1800_d6_aug_2012", "type": "work", "title": "IEEE Std P1800/D6, Aug 2012", "slug": "ieee-std-p1800-d6-aug-2012", "aliases": [ "P1800/D6, Aug 2012", "P1800/D6, Aug 2012 - IEEE Approved Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language" ], "summary": "IEEE Std P1800/D6, Aug 2012 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language”；公开目录标为非现行（Inactive），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1800/D6, Aug 2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6313596", "locator": "standard_number=P1800/D6, Aug 2012; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:49+08:00", "updatedAt": "2026-11-01T22:00:49+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1800/D6, Aug 2012**（IEEE Approved Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language）是[[organization_ieee|电气电子工程师学会]]于 2012 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1800-d6-aug-2012.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_p1800_d5_feb_2012", "type": "work", "title": "IEEE Std P1800/D5, Feb 2012", "slug": "ieee-std-p1800-d5-feb-2012", "aliases": [ "P1800/D5, Feb 2012", "P1800/D5, Feb 2012 - IEEE Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language" ], "summary": "IEEE Std P1800/D5, Feb 2012 是电气电子工程师学会的草案，题为“IEEE Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language”；公开目录标为非现行（Inactive），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1800/D5, Feb 2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6156383", "locator": "standard_number=P1800/D5, Feb 2012; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:48+08:00", "updatedAt": "2026-11-01T22:00:48+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1800/D5, Feb 2012**（IEEE Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language）是[[organization_ieee|电气电子工程师学会]]于 2012 年 2 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1800-d5-feb-2012.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_p1800_d4a_jul_2017", "type": "work", "title": "IEEE Std P1800/D4a, Jul 2017", "slug": "ieee-std-p1800-d4a-jul-2017", "aliases": [ "P1800/D4a, Jul 2017", "P1800/D4a, Jul 2017 - IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language" ], "summary": "IEEE Std P1800/D4a, Jul 2017 是电气电子工程师学会的草案，题为“IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language”；公开目录标为非现行（Inactive），著录年份为 2017 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1800/D4a, Jul 2017 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8027221", "locator": "standard_number=P1800/D4a, Jul 2017; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:47+08:00", "updatedAt": "2026-11-01T22:00:47+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1800/D4a, Jul 2017**（IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language）是[[organization_ieee|电气电子工程师学会]]于 2017 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1800-d4a-jul-2017.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2017, "precision": "year", "display": "2017年" }, "language": "英语" }, { "id": "work_ieee_p1800_d3_nov_2011", "type": "work", "title": "IEEE Std P1800/D3, Nov 2011", "slug": "ieee-std-p1800-d3-nov-2011", "aliases": [ "P1800/D3, Nov 2011", "P1800/D3, Nov 2011 - IEEE Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language" ], "summary": "IEEE Std P1800/D3, Nov 2011 是电气电子工程师学会的草案，题为“IEEE Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language”；公开目录标为非现行（Inactive），著录年份为 2011 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1800/D3, Nov 2011 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6092420", "locator": "standard_number=P1800/D3, Nov 2011; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:46+08:00", "updatedAt": "2026-11-01T22:00:46+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1800/D3, Nov 2011**（IEEE Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language）是[[organization_ieee|电气电子工程师学会]]于 2011 年 11 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1800-d3-nov-2011.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2011, "precision": "year", "display": "2011年" }, "language": "英语" }, { "id": "work_ieee_p1800_d18_aug_2023", "type": "work", "title": "IEEE Std P1800/D18, Aug 2023", "slug": "ieee-std-p1800-d18-aug-2023", "aliases": [ "P1800/D18, Aug 2023", "P1800/D18, Aug 2023 - IEEE Approved Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language" ], "summary": "IEEE Std P1800/D18, Aug 2023 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language”；公开目录标为非现行（Inactive），著录年份为 2023 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1800/D18, Aug 2023 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=10247196", "locator": "standard_number=P1800/D18, Aug 2023; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:45+08:00", "updatedAt": "2026-11-01T22:00:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1800/D18, Aug 2023**（IEEE Approved Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language）是[[organization_ieee|电气电子工程师学会]]于 2023 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1800-d18-aug-2023.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2023, "precision": "year", "display": "2023年" }, "language": "英语" }, { "id": "work_ieee_p1800_d3_apr_2017", "type": "work", "title": "IEEE Std P1800/D3, Apr 2017", "slug": "ieee-std-p1800-d3-apr-2017", "aliases": [ "P1800/D3, Apr 2017", "P1800/D3, Apr 2017 - IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language" ], "summary": "IEEE Std P1800/D3, Apr 2017 是电气电子工程师学会的草案，题为“IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language”；公开目录标为非现行（Inactive），著录年份为 2017 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1800/D3, Apr 2017 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7921683", "locator": "standard_number=P1800/D3, Apr 2017; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:45+08:00", "updatedAt": "2026-11-01T22:00:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1800/D3, Apr 2017**（IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language）是[[organization_ieee|电气电子工程师学会]]于 2017 年 4 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1800-d3-apr-2017.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2017, "precision": "year", "display": "2017年" }, "language": "英语" }, { "id": "work_ieee_p1800_d17_mar_2023", "type": "work", "title": "IEEE Std P1800/D17, Mar 2023", "slug": "ieee-std-p1800-d17-mar-2023", "aliases": [ "P1800/D17, Mar 2023", "P1800/D17, Mar 2023 - IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language" ], "summary": "IEEE Std P1800/D17, Mar 2023 是电气电子工程师学会的草案，题为“IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language”；公开目录标为非现行（Inactive），著录年份为 2023 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1800/D17, Mar 2023 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=10117463", "locator": "standard_number=P1800/D17, Mar 2023; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:44+08:00", "updatedAt": "2026-11-01T22:00:44+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1800/D17, Mar 2023**（IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language）是[[organization_ieee|电气电子工程师学会]]于 2023 年 3 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1800-d17-mar-2023.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2023, "precision": "year", "display": "2023年" }, "language": "英语" }, { "id": "work_ieee_1717_2024_10901980_redline", "type": "work", "title": "IEEE Std 1717-2024", "slug": "ieee-std-1717-2024-10901980-redline", "aliases": [ "1717-2024", "1717-2024 - IEEE Standard for Testing Fire-Resistive, Circuit Integrity Cables and Cable Systems Using a Hydrocarbon Pool Fire Test Protocol - Redline" ], "summary": "IEEE Std 1717-2024 是电气电子工程师学会的技术标准，题为“IEEE Standard for Testing Fire-Resistive, Circuit Integrity Cables and Cable Systems Using a Hydrocarbon Pool Fire Test Protocol - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2024 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1717-2024 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=10901980", "locator": "standard_number=1717-2024; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:39+08:00", "updatedAt": "2026-11-01T22:00:39+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1717-2024**（IEEE Standard for Testing Fire-Resistive, Circuit Integrity Cables and Cable Systems Using a Hydrocarbon Pool Fire Test Protocol - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2024 年，主题领域包括 Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1717-2024-10901980-redline.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2024, "precision": "year", "display": "2024年" }, "language": "英语" }, { "id": "work_ieee_1718_2012", "type": "work", "title": "IEEE Std 1718-2012", "slug": "ieee-std-1718-2012", "aliases": [ "1718-2012", "1718-2012 - IEEE Guide for Temperature Monitoring of Cable Systems" ], "summary": "IEEE Std 1718-2012 是电气电子工程师学会的技术标准，题为“IEEE Guide for Temperature Monitoring of Cable Systems”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1718-2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6214560", "locator": "standard_number=1718-2012; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:39+08:00", "updatedAt": "2026-11-01T22:00:39+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1718-2012**（IEEE Guide for Temperature Monitoring of Cable Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2012 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1718-2012.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_1720_2012", "type": "work", "title": "IEEE Std 1720-2012", "slug": "ieee-std-1720-2012", "aliases": [ "1720-2012", "1720-2012 - IEEE Recommended Practice for Near-Field Antenna Measurements" ], "summary": "IEEE Std 1720-2012 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Near-Field Antenna Measurements”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1720-2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6375743", "locator": "standard_number=1720-2012; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:39+08:00", "updatedAt": "2026-11-01T22:00:39+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1720-2012**（IEEE Recommended Practice for Near-Field Antenna Measurements）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2012 年，主题领域包括 Fields, Waves and Electromagnetics、Aerospace、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1720-2012.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_1722_1_2013", "type": "work", "title": "IEEE Std 1722.1-2013", "slug": "ieee-std-1722-1-2013", "aliases": [ "1722.1-2013", "1722.1-2013 - IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722(TM) Based Devices" ], "summary": "IEEE Std 1722.1-2013 是电气电子工程师学会的技术标准，题为“IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722(TM) Based Devices”；公开目录标为已被替代（Superseded），著录年份为 2013 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1722.1-2013 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6627914", "locator": "standard_number=1722.1-2013; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:39+08:00", "updatedAt": "2026-11-01T22:00:39+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1722.1-2013**（IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722(TM) Based Devices）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2013 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1722-1-2013.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2013, "precision": "year", "display": "2013年" }, "language": "英语" }, { "id": "work_ieee_1722_1_2013_cor_1_2018", "type": "work", "title": "IEEE Std 1722.1-2013/Cor 1-2018", "slug": "ieee-std-1722-1-2013-cor-1-2018", "aliases": [ "1722.1-2013/Cor 1-2018", "1722.1-2013/Cor 1-2018 - IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722(TM) Based Devices - Corrigendum 1:Technical and Editorial Corrections" ], "summary": "IEEE Std 1722.1-2013/Cor 1-2018 是电气电子工程师学会的技术标准，题为“IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722(TM) Based Devices - Corrigendum 1:Technical and Editorial Corrections”；公开目录标为已被替代（Superseded），著录年份为 2019 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1722.1-2013/Cor 1-2018 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8666951", "locator": "standard_number=1722.1-2013/Cor 1-2018; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:39+08:00", "updatedAt": "2026-11-01T22:00:39+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1722.1-2013/Cor 1-2018**（IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722(TM) Based Devices - Corrigendum 1:Technical and Editorial Corrections）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2019 年，主题领域包括 Components, Circuits, Devices and Systems、Communication, Networking and Broadcast Technologies、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1722-1-2013-cor-1-2018.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2019, "precision": "year", "display": "2019年" }, "language": "英语" }, { "id": "work_ieee_1722_1_2021_10053665_redline", "type": "work", "title": "IEEE Std 1722.1-2021", "slug": "ieee-std-1722-1-2021-10053665-redline", "aliases": [ "1722.1-2021", "1722.1-2021 - IEEE Standard for Device Discovery, Connection Management, and Control Protocol for Time-Sensitive Networking System - Redline" ], "summary": "IEEE Std 1722.1-2021 是电气电子工程师学会的技术标准，题为“IEEE Standard for Device Discovery, Connection Management, and Control Protocol for Time-Sensitive Networking System - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2022 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1722.1-2021 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=10053665", "locator": "standard_number=1722.1-2021; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:39+08:00", "updatedAt": "2026-11-01T22:00:39+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1722.1-2021**（IEEE Standard for Device Discovery, Connection Management, and Control Protocol for Time-Sensitive Networking System - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2022 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1722-1-2021-10053665-redline.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2022, "precision": "year", "display": "2022年" }, "language": "英语" }, { "id": "work_ieee_1722_2011", "type": "work", "title": "IEEE Std 1722-2011", "slug": "ieee-std-1722-2011", "aliases": [ "1722-2011", "1722-2011 - IEEE Standard for Layer 2 Transport Protocol for Time Sensitive Applications in a Bridged Local Area Network" ], "summary": "IEEE Std 1722-2011 是电气电子工程师学会的技术标准，题为“IEEE Standard for Layer 2 Transport Protocol for Time Sensitive Applications in a Bridged Local Area Network”；公开目录标为已被替代（Superseded），著录年份为 2011 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1722-2011 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5764873", "locator": "standard_number=1722-2011; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:39+08:00", "updatedAt": "2026-11-01T22:00:39+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1722-2011**（IEEE Standard for Layer 2 Transport Protocol for Time Sensitive Applications in a Bridged Local Area Network）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2011 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1722-2011.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2011, "precision": "year", "display": "2011年" }, "language": "英语" }, { "id": "work_ieee_1722_2016", "type": "work", "title": "IEEE Std 1722-2016", "slug": "ieee-std-1722-2016", "aliases": [ "1722-2016", "1722-2016 - IEEE Standard for a Transport Protocol for Time-Sensitive Applications in Bridged Local Area Networks" ], "summary": "IEEE Std 1722-2016 是电气电子工程师学会的技术标准，题为“IEEE Standard for a Transport Protocol for Time-Sensitive Applications in Bridged Local Area Networks”；公开目录标为已被替代（Superseded），著录年份为 2016 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1722-2016 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7782714", "locator": "standard_number=1722-2016; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:39+08:00", "updatedAt": "2026-11-01T22:00:39+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1722-2016**（IEEE Standard for a Transport Protocol for Time-Sensitive Applications in Bridged Local Area Networks）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2016 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1722-2016.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2016, "precision": "year", "display": "2016年" }, "language": "英语" }, { "id": "work_ieee_1724_2011", "type": "work", "title": "IEEE Std 1724-2011", "slug": "ieee-std-1724-2011", "aliases": [ "1724-2011", "1724-2011 - IEEE Guide for the Preparation of a Transmission Line Design Criteria Document" ], "summary": "IEEE Std 1724-2011 是电气电子工程师学会的技术标准，题为“IEEE Guide for the Preparation of a Transmission Line Design Criteria Document”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1724-2011 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5783875", "locator": "standard_number=1724-2011; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:39+08:00", "updatedAt": "2026-11-01T22:00:39+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1724-2011**（IEEE Guide for the Preparation of a Transmission Line Design Criteria Document）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Power, Energy and Industry Applications、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1724-2011.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2011, "precision": "year", "display": "2011年" }, "language": "英语" }, { "id": "work_ieee_1725_2006", "type": "work", "title": "IEEE Std 1725-2006", "slug": "ieee-std-1725-2006", "aliases": [ "1725-2006", "1725-2006 - IEEE Standard for Rechargeable Batteries for Cellular Telephones" ], "summary": "IEEE Std 1725-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard for Rechargeable Batteries for Cellular Telephones”；公开目录标为已被替代（Superseded），著录年份为 2006 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1725-2006 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=10816", "locator": "standard_number=1725-2006; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:39+08:00", "updatedAt": "2026-11-01T22:00:39+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1725-2006**（IEEE Standard for Rechargeable Batteries for Cellular Telephones）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2006 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1725-2006.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2006, "precision": "year", "display": "2006年" }, "language": "英语" }, { "id": "work_ieee_1725_2011_5930302", "type": "work", "title": "IEEE Std 1725-2011", "slug": "ieee-std-1725-2011-5930302", "aliases": [ "1725-2011", "1725-2011 - IEEE Standard for Rechargeable Batteries for Cellular Telephones" ], "summary": "IEEE Std 1725-2011 是电气电子工程师学会的技术标准，题为“IEEE Standard for Rechargeable Batteries for Cellular Telephones”；公开目录标为已被替代（Superseded），著录年份为 2011 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1725-2011 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5930302", "locator": "standard_number=1725-2011; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:39+08:00", "updatedAt": "2026-11-01T22:00:39+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1725-2011**（IEEE Standard for Rechargeable Batteries for Cellular Telephones）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2011 年，主题领域包括 Power, Energy and Industry Applications、Geoscience、Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1725-2011-5930302.html", "lang": "nl", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2011, "precision": "year", "display": "2011年" }, "language": "英语" } ], "lang": "nl", "pagination": { "page": 165, "pageSize": 50, "total": 75050, "pageCount": 1000, "prevUrl": "/nl/new-164.json", "nextUrl": "/nl/new-166.json" } }