<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>电气电子工程师学会 · Relaties</title>
  <description>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</description>
  <url>/nl/organizations/ieee/relation-121.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>organization_ieee</id>
    <type>organization</type>
    <title>电气电子工程师学会</title>
    <slug>ieee</slug>
    <aliases>
      <alias>IEEE</alias>
      <alias>Institute of Electrical and Electronics Engineers</alias>
      <alias>电气和电子工程师协会</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
      <tag>tag-publishing</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
        <locator>2026-11-01 访问</locator>
      </source>
      <source>
        <id>s2</id>
        <title>IEEE 官方网站</title>
        <author>IEEE</author>
        <url>https://www.ieee.org/</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:52+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:52+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**电气电子工程师学会**（Institute of Electrical and Electronics Engineers，简称 IEEE）是1963年1月1日由美国电气工程师学会（AIEE）与无线电工程师学会（IRE）合并成立的专业技术协会，面向电气工程、电子工程及相关学科[^s1]。&#xA;&#xA;## 沿革&#xA;&#xA;该会可追溯至1884年成立的 AIEE；1912年另成立 IRE。两会于1963年合并为 IEEE[^s1]。总会设在纽约，1975年起主要业务在新泽西州皮斯卡特维的运营中心开展[^s1]。&#xA;&#xA;## 职能与业务&#xA;&#xA;IEEE 发布同行评议期刊与会议录，并通过标准化委员会制定技术标准；相关内容可在 IEEE Xplore 平台检索[^s1][^s3]。标准公开目录（KBART）列出标准编号、题名、状态与题录链接等元数据[^s3]。&#xA;&#xA;## 现状&#xA;&#xA;据公开介绍，该会为美国 501(c)(3) 公益性专业协会，全球会员逾48.6万[^s1]。官网为 https://www.ieee.org/ [^s2]。</body>
    <url>/organizations/ieee.html</url>
    <lang>nl</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <orgKind>专业协会</orgKind>
    <founded>
      <year>1963</year>
      <month>1</month>
      <day>1</day>
      <precision>day</precision>
      <display>1963年1月1日</display>
    </founded>
    <orgStatus>active</orgStatus>
    <headquartersNote>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</headquartersNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_1944fc704d07e3eea828f237</id>
      <fromId>work_ieee_521_1976</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_521_1976</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_521_1976</targetId>
      <targetTitle>IEEE Std 521-1976</targetTitle>
      <targetUrl>/nl/works/ieee-std-521-1976.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a82aa78be77e9a5213a0306e</id>
      <fromId>work_ieee_521_1984</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_521_1984</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_521_1984</targetId>
      <targetTitle>IEEE Std 521-1984</targetTitle>
      <targetUrl>/nl/works/ieee-std-521-1984.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_09ac22aeba39c0c3e8e8e795</id>
      <fromId>work_ieee_521_2002</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_521_2002</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_521_2002</targetId>
      <targetTitle>IEEE Std 521-2002</targetTitle>
      <targetUrl>/nl/works/ieee-std-521-2002.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1766175a334297549a0d872c</id>
      <fromId>work_ieee_521_2019_9027203_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_521_2019_9027203_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_521_2019_9027203_redline</targetId>
      <targetTitle>IEEE Std 521-2019</targetTitle>
      <targetUrl>/nl/works/ieee-std-521-2019-9027203-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_25cb10b48548353b213480a6</id>
      <fromId>work_ieee_522_1977</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_522_1977</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_522_1977</targetId>
      <targetTitle>IEEE Std 522-1977</targetTitle>
      <targetUrl>/nl/works/ieee-std-522-1977.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_816dfc9b1212bc0247dc5b25</id>
      <fromId>work_ieee_522_1992</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_522_1992</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_522_1992</targetId>
      <targetTitle>IEEE Std 522-1992</targetTitle>
      <targetUrl>/nl/works/ieee-std-522-1992.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8c8fa223d7baf813c3633ab2</id>
      <fromId>work_ieee_522_2004</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_522_2004</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_522_2004</targetId>
      <targetTitle>IEEE Std 522-2004</targetTitle>
      <targetUrl>/nl/works/ieee-std-522-2004.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_19c2d798365803353da1b0db</id>
      <fromId>work_ieee_524_1980</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_524_1980</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_524_1980</targetId>
      <targetTitle>IEEE Std 524-1980</targetTitle>
      <targetUrl>/nl/works/ieee-std-524-1980.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8964dfb388a0c8323e16737b</id>
      <fromId>work_ieee_524_1992</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_524_1992</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_524_1992</targetId>
      <targetTitle>IEEE Std 524-1992</targetTitle>
      <targetUrl>/nl/works/ieee-std-524-1992.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a529c4e5197cc07e624e4e00</id>
      <fromId>work_ieee_524_2003</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_524_2003</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_524_2003</targetId>
      <targetTitle>IEEE Std 524-2003</targetTitle>
      <targetUrl>/nl/works/ieee-std-524-2003.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_59d396304c427e54594abf18</id>
      <fromId>work_ieee_524_2016_8082766_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_524_2016_8082766_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_524_2016_8082766_redline</targetId>
      <targetTitle>IEEE Std 524-2016</targetTitle>
      <targetUrl>/nl/works/ieee-std-524-2016-8082766-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e825da21aae2e79117173960</id>
      <fromId>work_ieee_524a_1993</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_524a_1993</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_524a_1993</targetId>
      <targetTitle>IEEE Std 524a-1993</targetTitle>
      <targetUrl>/nl/works/ieee-std-524a-1993.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ee679caa0ea422ea8e291c25</id>
      <fromId>work_ieee_525_1978</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_525_1978</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_525_1978</targetId>
      <targetTitle>IEEE Std 525-1978</targetTitle>
      <targetUrl>/nl/works/ieee-std-525-1978.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d8365bcc299a0ed1938d0fd7</id>
      <fromId>work_ieee_525_1987</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_525_1987</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_525_1987</targetId>
      <targetTitle>IEEE Std 525-1987</targetTitle>
      <targetUrl>/nl/works/ieee-std-525-1987.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c81be5a43ff4edd81a7bfe33</id>
      <fromId>work_ieee_525_1992</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_525_1992</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_525_1992</targetId>
      <targetTitle>IEEE Std 525-1992</targetTitle>
      <targetUrl>/nl/works/ieee-std-525-1992.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_eb3972727c53d358792806e4</id>
      <fromId>work_ieee_525_2007_4481665</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_525_2007_4481665</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_525_2007_4481665</targetId>
      <targetTitle>IEEE Std 525-2007</targetTitle>
      <targetUrl>/nl/works/ieee-std-525-2007-4481665.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9a1c5310af3e3ba38148fae1</id>
      <fromId>work_ieee_525_2007_5961593_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_525_2007_5961593_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_525_2007_5961593_redline</targetId>
      <targetTitle>IEEE Std 525-2007</targetTitle>
      <targetUrl>/nl/works/ieee-std-525-2007-5961593-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_28cb16f87977d0bfa42f9ca0</id>
      <fromId>work_ieee_525_2016_7747732</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_525_2016_7747732</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_525_2016_7747732</targetId>
      <targetTitle>IEEE Std 525-2016</targetTitle>
      <targetUrl>/nl/works/ieee-std-525-2016-7747732.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_332eeb49079ebed63878e98e</id>
      <fromId>work_ieee_525_2016_7829242_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_525_2016_7829242_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_525_2016_7829242_redline</targetId>
      <targetTitle>IEEE Std 525-2016</targetTitle>
      <targetUrl>/nl/works/ieee-std-525-2016-7829242-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_557c93824700899730ffb2e2</id>
      <fromId>work_ieee_525_2025_11096098_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_525_2025_11096098_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_525_2025_11096098_redline</targetId>
      <targetTitle>IEEE Std 525-2025</targetTitle>
      <targetUrl>/nl/works/ieee-std-525-2025-11096098-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_85fd141cde8aca557b22a035</id>
      <fromId>work_ieee_528_1984</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_528_1984</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_528_1984</targetId>
      <targetTitle>IEEE Std 528-1984</targetTitle>
      <targetUrl>/nl/works/ieee-std-528-1984.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ae936069baa87b603c4484fe</id>
      <fromId>work_ieee_528_1994</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_528_1994</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_528_1994</targetId>
      <targetTitle>IEEE Std 528-1994</targetTitle>
      <targetUrl>/nl/works/ieee-std-528-1994.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0a8f5285f05d8c7cffa4acc5</id>
      <fromId>work_ieee_528_2001</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_528_2001</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_528_2001</targetId>
      <targetTitle>IEEE Std 528-2001</targetTitle>
      <targetUrl>/nl/works/ieee-std-528-2001.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c0b61fd185e005e451ba9487</id>
      <fromId>work_ieee_528_2019_8906250_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_528_2019_8906250_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_528_2019_8906250_redline</targetId>
      <targetTitle>IEEE Std 528-2019</targetTitle>
      <targetUrl>/nl/works/ieee-std-528-2019-8906250-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_dde16c6bdf499a5ccd90b908</id>
      <fromId>work_ieee_529_1980</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_529_1980</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_529_1980</targetId>
      <targetTitle>IEEE Std 529-1980</targetTitle>
      <targetUrl>/nl/works/ieee-std-529-1980.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4edcd29522d92e80ff7bfe98</id>
      <fromId>work_ieee_529_1980_cor_1_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_529_1980_cor_1_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_529_1980_cor_1_2017</targetId>
      <targetTitle>IEEE Std 529-1980/Cor 1-2017</targetTitle>
      <targetUrl>/nl/works/ieee-std-529-1980-cor-1-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c9c8a4d5be9f1651922ca377</id>
      <fromId>work_ieee_53_1952</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_53_1952</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_53_1952</targetId>
      <targetTitle>IEEE Std 53-1952</targetTitle>
      <targetUrl>/nl/works/ieee-std-53-1952.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_87642564d8682b12067d9111</id>
      <fromId>work_ieee_530_1978</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_530_1978</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_530_1978</targetId>
      <targetTitle>IEEE Std 530-1978</targetTitle>
      <targetUrl>/nl/works/ieee-std-530-1978.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_be0f9be2bd4cda6f4f88c1d8</id>
      <fromId>work_ieee_532_1982</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_532_1982</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_532_1982</targetId>
      <targetTitle>IEEE Std 532-1982</targetTitle>
      <targetUrl>/nl/works/ieee-std-532-1982.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_686eb529e0e0db6bb9790cd2</id>
      <fromId>work_ieee_532_1993</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_532_1993</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_532_1993</targetId>
      <targetTitle>IEEE Std 532-1993</targetTitle>
      <targetUrl>/nl/works/ieee-std-532-1993.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b53aa278cc7f028e783b7c5c</id>
      <fromId>work_ieee_532_2007_5961596_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_532_2007_5961596_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_532_2007_5961596_redline</targetId>
      <targetTitle>IEEE Std 532-2007</targetTitle>
      <targetUrl>/nl/works/ieee-std-532-2007-5961596-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_aa1e648e9639d26ca637eddf</id>
      <fromId>work_ieee_532_2021_9459600_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_532_2021_9459600_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_532_2021_9459600_redline</targetId>
      <targetTitle>IEEE Std 532-2021</targetTitle>
      <targetUrl>/nl/works/ieee-std-532-2021-9459600-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_325d3d6b2ae9b28d255f62ff</id>
      <fromId>work_ieee_535</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_535</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_535</targetId>
      <targetTitle>IEEE Std 535</targetTitle>
      <targetUrl>/nl/works/ieee-std-535.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a67489f1a008425aa9539cbb</id>
      <fromId>work_ieee_535_1979</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_535_1979</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_535_1979</targetId>
      <targetTitle>IEEE Std 535-1979</targetTitle>
      <targetUrl>/nl/works/ieee-std-535-1979.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_905aa8ded4427a1ed56fcbbd</id>
      <fromId>work_ieee_535_1986</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_535_1986</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_535_1986</targetId>
      <targetTitle>IEEE Std 535-1986</targetTitle>
      <targetUrl>/nl/works/ieee-std-535-1986.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3696814bac5d318242583d1b</id>
      <fromId>work_ieee_535_2006</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_535_2006</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_535_2006</targetId>
      <targetTitle>IEEE Std 535-2006</targetTitle>
      <targetUrl>/nl/works/ieee-std-535-2006.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_cbba326b7492c4bf864a0da0</id>
      <fromId>work_ieee_535_2013_6673994</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_535_2013_6673994</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_535_2013_6673994</targetId>
      <targetTitle>IEEE Std 535-2013</targetTitle>
      <targetUrl>/nl/works/ieee-std-535-2013-6673994.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8ee01289eaf9af84b9505407</id>
      <fromId>work_ieee_535_2013_7046314_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_535_2013_7046314_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_535_2013_7046314_redline</targetId>
      <targetTitle>IEEE Std 535-2013</targetTitle>
      <targetUrl>/nl/works/ieee-std-535-2013-7046314-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d4150e88f4807b24195b4cd7</id>
      <fromId>work_ieee_535_2013_cor_1_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_535_2013_cor_1_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_535_2013_cor_1_2017</targetId>
      <targetTitle>IEEE Std 535-2013/Cor 1-2017</targetTitle>
      <targetUrl>/nl/works/ieee-std-535-2013-cor-1-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e3a1df675268af67f8645079</id>
      <fromId>work_ieee_538_1976</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_538_1976</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_538_1976</targetId>
      <targetTitle>IEEE Std 538-1976</targetTitle>
      <targetUrl>/nl/works/ieee-std-538-1976.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2f8a1339f71ec7873c893c56</id>
      <fromId>work_ieee_539_1979</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_539_1979</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_539_1979</targetId>
      <targetTitle>IEEE Std 539-1979</targetTitle>
      <targetUrl>/nl/works/ieee-std-539-1979.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_209fe88738e8ed88e2e07099</id>
      <fromId>work_ieee_539_1990</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_539_1990</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_539_1990</targetId>
      <targetTitle>IEEE Std 539-1990</targetTitle>
      <targetUrl>/nl/works/ieee-std-539-1990.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bce5cbac685bfb9dbb19ad92</id>
      <fromId>work_ieee_54_1955</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_54_1955</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_54_1955</targetId>
      <targetTitle>IEEE Std 54-1955</targetTitle>
      <targetUrl>/nl/works/ieee-std-54-1955.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_452a8702b6ed064a43c90eda</id>
      <fromId>work_ieee_544_1975</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_544_1975</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_544_1975</targetId>
      <targetTitle>IEEE Std 544-1975</targetTitle>
      <targetUrl>/nl/works/ieee-std-544-1975.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c7d1b42ba2671f5e173226ad</id>
      <fromId>work_ieee_548_1984</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_548_1984</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_548_1984</targetId>
      <targetTitle>IEEE Std 548-1984</targetTitle>
      <targetUrl>/nl/works/ieee-std-548-1984.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_12d99fc9bfc40a40d1016e97</id>
      <fromId>work_ieee_55_ire_2_s1_1955</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_55_ire_2_s1_1955</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_55_ire_2_s1_1955</targetId>
      <targetTitle>IEEE Std 55 IRE 2.S1-1955</targetTitle>
      <targetUrl>/nl/works/ieee-std-55-ire-2-s1-1955.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2caf4d0baa815cd4a078b49d</id>
      <fromId>work_ieee_55_1953</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_55_1953</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_55_1953</targetId>
      <targetTitle>IEEE Std 55-1953</targetTitle>
      <targetUrl>/nl/works/ieee-std-55-1953.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4ed9f1800f60df257bd756bd</id>
      <fromId>work_ieee_551_2006</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_551_2006</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_551_2006</targetId>
      <targetTitle>IEEE Std 551-2006</targetTitle>
      <targetUrl>/nl/works/ieee-std-551-2006.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7b9734b73f33e0e776159267</id>
      <fromId>work_ieee_56_1977</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_56_1977</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_56_1977</targetId>
      <targetTitle>IEEE Std 56-1977</targetTitle>
      <targetUrl>/nl/works/ieee-std-56-1977.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_deb6113e26e63ab3ca370885</id>
      <fromId>work_ieee_p2030_11_d11_2_mar_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2030_11_d11_2_mar_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2030_11_d11_2_mar_2021</targetId>
      <targetTitle>IEEE Std P2030.11/D11.2, Mar 2021</targetTitle>
      <targetUrl>/nl/works/ieee-std-p2030-11-d11-2-mar-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>concept_ieee_standards</fromId>
      <fromTitle>IEEE 标准</fromTitle>
      <fromUrl>/nl/concepts/ieee-standards.html</fromUrl>
      <fromType>concept</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/nl/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/nl/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/nl/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/nl/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/nl/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/nl/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/nl/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/nl/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/nl/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>nl</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>org_kind</key>
      <label>Organization kind</label>
      <value>专业协会</value>
    </field>
    <field>
      <key>founded</key>
      <label>Founded</label>
      <value>1963年1月1日</value>
    </field>
    <field>
      <key>org_status</key>
      <label>Status</label>
      <value>Actief</value>
    </field>
    <field>
      <key>headquarters_note</key>
      <label>Headquarters</label>
      <value>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</value>
    </field>
  </infoFields>
  <pagination>
    <page>121</page>
    <pageSize>50</pageSize>
    <total>8265</total>
    <pageCount>166</pageCount>
    <prevUrl>/nl/organizations/ieee/relation-120.xml</prevUrl>
    <nextUrl>/nl/organizations/ieee/relation-122.xml</nextUrl>
  </pagination>
  <relationsTotal>8265</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8279</mentionsTotal>
  <mentionsUrl>/nl/organizations/ieee/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>