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      <id>work_ieee_1735_2014</id>
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      <title>IEEE Std 1735-2014</title>
      <slug>ieee-std-1735-2014</slug>
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        <alias>1735-2014</alias>
        <alias>1735-2014 - IEEE Recommended Practice for Encryption and Management of Electronic Design Intellectual Property (IP)</alias>
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      <summary>IEEE Std 1735-2014 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Encryption and Management of Electronic Design Intellectual Property (IP)”；公开目录标为已被替代（Superseded），著录年份为 2015 年。</summary>
      <status>published</status>
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        <category>category-science-technology</category>
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        <tag>tag-ieee-standard</tag>
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          <id>s1</id>
          <title>IEEE Std 1735-2014 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7274479</url>
          <locator>standard_number=1735-2014; status=Superseded; modifier=</locator>
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          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T22:00:51+08:00</updatedAt>
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      <revision>1</revision>
      <body>**IEEE Std 1735-2014**（IEEE Recommended Practice for Encryption and Management of Electronic Design Intellectual Property (IP)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <lang>ru</lang>
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      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
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      <language>英语</language>
      <creators></creators>
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      <id>work_ieee_1735_2023_10505229_redline</id>
      <type>work</type>
      <title>IEEE Std 1735-2023</title>
      <slug>ieee-std-1735-2023-10505229-redline</slug>
      <aliases>
        <alias>1735-2023</alias>
        <alias>1735-2023 - IEEE Recommended Practice for Encryption and Management of Electronic Design Intellectual Property (IP) - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1735-2023 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Encryption and Management of Electronic Design Intellectual Property (IP) - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
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      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1735-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10505229</url>
          <locator>standard_number=1735-2023; status=Active; modifier=Redline</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:00:51+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:51+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1735-2023**（IEEE Recommended Practice for Encryption and Management of Electronic Design Intellectual Property (IP) - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2023 年，主题领域包括 Computing and Processing、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <lang>ru</lang>
      <fallback>true</fallback>
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        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1754_1994</id>
      <type>work</type>
      <title>IEEE Std 1754-1994</title>
      <slug>ieee-std-1754-1994</slug>
      <aliases>
        <alias>1754-1994</alias>
        <alias>1754-1994 - IEEE Standard for a 32-bit Microprocessor Architecture</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1754-1994 是电气电子工程师学会的技术标准，题为“IEEE Standard for a 32-bit Microprocessor Architecture”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1995 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1754-1994 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=3435</url>
          <locator>standard_number=1754-1994; status=Inactive; modifier=Withdrawn</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:51+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:51+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1754-1994**（IEEE Standard for a 32-bit Microprocessor Architecture）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1995 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1754-1994.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1995</year>
        <precision>year</precision>
        <display>1995年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_175_1960</id>
      <type>work</type>
      <title>IEEE Std 175-1960</title>
      <slug>ieee-std-175-1960</slug>
      <aliases>
        <alias>175-1960</alias>
        <alias>175-1960 - IRE Standards on Nuclear Techniques: Definitions for the Scintillation Counter Field, 1960</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 175-1960 是电气电子工程师学会的技术标准，题为“IRE Standards on Nuclear Techniques: Definitions for the Scintillation Counter Field, 1960”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1960 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 175-1960 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6529091</url>
          <locator>standard_number=175-1960; status=Inactive; modifier=Withdrawn</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T22:00:51+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:51+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 175-1960**（IRE Standards on Nuclear Techniques: Definitions for the Scintillation Counter Field, 1960）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1960 年，主题领域包括 Nuclear Engineering、Engineered Materials, Dielectrics and Plasmas、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-175-1960.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
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        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1960</year>
        <precision>year</precision>
        <display>1960年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_176_1949</id>
      <type>work</type>
      <title>IEEE Std 176-1949</title>
      <slug>ieee-std-176-1949</slug>
      <aliases>
        <alias>176-1949</alias>
        <alias>176-1949 - IEEE Standards on Piezoelectric Crystals, 1949</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 176-1949 是电气电子工程师学会的技术标准，题为“IEEE Standards on Piezoelectric Crystals, 1949”；公开目录标为已被替代（Superseded），著录年份为 1949 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 176-1949 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8631111</url>
          <locator>standard_number=176-1949; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:51+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:51+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 176-1949**（IEEE Standards on Piezoelectric Crystals, 1949）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1949 年，主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-176-1949.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1949</year>
        <precision>year</precision>
        <display>1949年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_176_1978</id>
      <type>work</type>
      <title>IEEE Std 176-1978</title>
      <slug>ieee-std-176-1978</slug>
      <aliases>
        <alias>176-1978</alias>
        <alias>176-1978 - IEEE Standard on Piezoelectricity</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 176-1978 是电气电子工程师学会的技术标准，题为“IEEE Standard on Piezoelectricity”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1978 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 176-1978 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8941329</url>
          <locator>standard_number=176-1978; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:51+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:51+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 176-1978**（IEEE Standard on Piezoelectricity）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1978 年，主题领域包括 Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-176-1978.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1978</year>
        <precision>year</precision>
        <display>1978年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_176_1987</id>
      <type>work</type>
      <title>IEEE Std 176-1987</title>
      <slug>ieee-std-176-1987</slug>
      <aliases>
        <alias>176-1987</alias>
        <alias>176-1987 - IEEE Standard on Piezoelectricity</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 176-1987 是电气电子工程师学会的技术标准，题为“IEEE Standard on Piezoelectricity”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1988 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 176-1987 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=2511</url>
          <locator>standard_number=176-1987; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:51+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:51+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 176-1987**（IEEE Standard on Piezoelectricity）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1988 年，主题领域包括 Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-176-1987.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1988</year>
        <precision>year</precision>
        <display>1988年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1775_2010</id>
      <type>work</type>
      <title>IEEE Std 1775-2010</title>
      <slug>ieee-std-1775-2010</slug>
      <aliases>
        <alias>1775-2010</alias>
        <alias>1775-2010 - IEEE Standard for Power Line Communication Equipment--Electromagnetic Compatibility (EMC) Requirements--Testing and Measurement Methods</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1775-2010 是电气电子工程师学会的技术标准，题为“IEEE Standard for Power Line Communication Equipment--Electromagnetic Compatibility (EMC) Requirements--Testing and Measurement Methods”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1775-2010 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5682871</url>
          <locator>standard_number=1775-2010; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T22:00:51+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:51+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1775-2010**（IEEE Standard for Power Line Communication Equipment--Electromagnetic Compatibility (EMC) Requirements--Testing and Measurement Methods）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1775-2010.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2011</year>
        <precision>year</precision>
        <display>2011年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1776_2008</id>
      <type>work</type>
      <title>IEEE Std 1776-2008</title>
      <slug>ieee-std-1776-2008</slug>
      <aliases>
        <alias>1776-2008</alias>
        <alias>1776-2008 - IEEE Recommended Practice for Thermal Evaluation of Unsealed or Sealed Insulation Systems for AC Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Machines Rated 15 00</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1776-2008 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Thermal Evaluation of Unsealed or Sealed Insulation Systems for AC Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Machines Rated 15 00”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2009 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1776-2008 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4784471</url>
          <locator>standard_number=1776-2008; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:51+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:51+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1776-2008**（IEEE Recommended Practice for Thermal Evaluation of Unsealed or Sealed Insulation Systems for AC Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Machines Rated 15 00）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2009 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1776-2008.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2009</year>
        <precision>year</precision>
        <display>2009年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <perspectives></perspectives>
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      <id>work_ieee_177_1966</id>
      <type>work</type>
      <title>IEEE Std 177-1966</title>
      <slug>ieee-std-177-1966</slug>
      <aliases>
        <alias>177-1966</alias>
        <alias>177-1966 - IEEE Standard Definitions and Methods of Measurement for Piezoelectric Vibrators</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 177-1966 是电气电子工程师学会的技术标准，题为“IEEE Standard Definitions and Methods of Measurement for Piezoelectric Vibrators”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1966 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 177-1966 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=2726</url>
          <locator>standard_number=177-1966; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:51+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:51+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 177-1966**（IEEE Standard Definitions and Methods of Measurement for Piezoelectric Vibrators）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1966 年，主题领域包括 Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-177-1966.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1966</year>
        <precision>year</precision>
        <display>1966年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_1782_2014</id>
      <type>work</type>
      <title>IEEE Std 1782-2014</title>
      <slug>ieee-std-1782-2014</slug>
      <aliases>
        <alias>1782-2014</alias>
        <alias>1782-2014 - IEEE Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1782-2014 是电气电子工程师学会的技术标准，题为“IEEE Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events”；公开目录标为已被替代（Superseded），著录年份为 2014 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1782-2014 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6878407</url>
          <locator>standard_number=1782-2014; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:51+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:51+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1782-2014**（IEEE Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2014 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1782-2014.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2014</year>
        <precision>year</precision>
        <display>2014年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1782_2022_9927303_redline</id>
      <type>work</type>
      <title>IEEE Std 1782-2022</title>
      <slug>ieee-std-1782-2022-9927303-redline</slug>
      <aliases>
        <alias>1782-2022</alias>
        <alias>1782-2022 - IEEE Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1782-2022 是电气电子工程师学会的技术标准，题为“IEEE Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1782-2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9927303</url>
          <locator>standard_number=1782-2022; status=Active; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:51+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:51+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1782-2022**（IEEE Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2022 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1782-2022-9927303-redline.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1783_2009</id>
      <type>work</type>
      <title>IEEE Std 1783-2009</title>
      <slug>ieee-std-1783-2009</slug>
      <aliases>
        <alias>1783-2009</alias>
        <alias>1783-2009 - IEEE Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1783-2009 是电气电子工程师学会的技术标准，题为“IEEE Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2009 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1783-2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5291196</url>
          <locator>standard_number=1783-2009; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:51+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:51+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1783-2009**（IEEE Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2009 年，主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1783-2009.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2009</year>
        <precision>year</precision>
        <display>2009年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1785_1_2012</id>
      <type>work</type>
      <title>IEEE Std 1785.1-2012</title>
      <slug>ieee-std-1785-1-2012</slug>
      <aliases>
        <alias>1785.1-2012</alias>
        <alias>1785.1-2012 - IEEE Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above—Part 1: Frequency Bands and Waveguide Dimensions</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1785.1-2012 是电气电子工程师学会的技术标准，题为“IEEE Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above—Part 1: Frequency Bands and Waveguide Dimensions”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1785.1-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6471985</url>
          <locator>standard_number=1785.1-2012; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:51+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:51+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1785.1-2012**（IEEE Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above—Part 1: Frequency Bands and Waveguide Dimensions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2013 年，主题领域包括 Fields, Waves and Electromagnetics、Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1785-1-2012.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_178_1958</id>
      <type>work</type>
      <title>IEEE Std 178-1958</title>
      <slug>ieee-std-178-1958</slug>
      <aliases>
        <alias>178-1958</alias>
        <alias>178-1958 - IEEE Standards on Piezoelectric Crystals:Determination of The Elastic. Piezoelectric and Dielectric Constants- The Electro mechanical Coupling Factor, 1958</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 178-1958 是电气电子工程师学会的技术标准，题为“IEEE Standards on Piezoelectric Crystals:Determination of The Elastic. Piezoelectric and Dielectric Constants- The Electro mechanical Coupling Factor, 1958”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1958 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 178-1958 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8941332</url>
          <locator>standard_number=178-1958; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:51+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:51+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 178-1958**（IEEE Standards on Piezoelectric Crystals:Determination of The Elastic. Piezoelectric and Dielectric Constants- The Electro mechanical Coupling Factor, 1958）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1958 年，主题领域包括 Components, Circuits, Devices and Systems、General Topics for Engineers、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-178-1958.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1958</year>
        <precision>year</precision>
        <display>1958年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1801_d10_23_may_2024</id>
      <type>work</type>
      <title>IEEE Std P1801/D10.23, May 2024</title>
      <slug>ieee-std-p1801-d10-23-may-2024</slug>
      <aliases>
        <alias>P1801/D10.23, May 2024</alias>
        <alias>P1801/D10.23, May 2024 - IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1801/D10.23, May 2024 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems”；公开目录标为非现行（Inactive），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1801/D10.23, May 2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10545334</url>
          <locator>standard_number=P1801/D10.23, May 2024; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:51+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:51+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1801/D10.23, May 2024**（IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems）是[[organization_ieee|电气电子工程师学会]]于 2024 年 5 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1801-d10-23-may-2024.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
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      <id>work_ieee_p1801_d10_aug_2017</id>
      <type>work</type>
      <title>IEEE Std P1801/D10, Aug 2017</title>
      <slug>ieee-std-p1801-d10-aug-2017</slug>
      <aliases>
        <alias>P1801/D10, Aug 2017</alias>
        <alias>P1801/D10, Aug 2017 - IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1801/D10, Aug 2017 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems”；公开目录标为非现行（Inactive），著录年份为 2017 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1801/D10, Aug 2017 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8405775</url>
          <locator>standard_number=P1801/D10, Aug 2017; status=Inactive; modifier=Draft</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:51+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:51+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1801/D10, Aug 2017**（IEEE Draft Standard for Design and Verification of Low Power, Energy Aware Electronic Systems）是[[organization_ieee|电气电子工程师学会]]于 2017 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1801-d10-aug-2017.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
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        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2017</year>
        <precision>year</precision>
        <display>2017年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p1800_d8_feb_2009</id>
      <type>work</type>
      <title>IEEE Std P1800/D8, Feb, 2009</title>
      <slug>ieee-std-p1800-d8-feb-2009</slug>
      <aliases>
        <alias>P1800/D8, Feb, 2009</alias>
        <alias>P1800/D8, Feb, 2009 - IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1800/D8, Feb, 2009 是电气电子工程师学会的草案，题为“IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language”；公开目录标为非现行（Inactive），著录年份为 2009 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1800/D8, Feb, 2009 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4796918</url>
          <locator>standard_number=P1800/D8, Feb, 2009; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:50+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:50+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1800/D8, Feb, 2009**（IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2009 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1800-d8-feb-2009.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2009</year>
        <precision>year</precision>
        <display>2009年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_p1800_d6</id>
      <type>work</type>
      <title>IEEE Std P1800/D6</title>
      <slug>ieee-std-p1800-d6</slug>
      <aliases>
        <alias>P1800/D6</alias>
        <alias>P1800/D6 - IEEE Unapproved IEEE Draft Standard for System Verilog: Unified Hardware Design, Specification and Verification Language (Superseded by P1800/D6)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1800/D6 是电气电子工程师学会的草案，题为“IEEE Unapproved IEEE Draft Standard for System Verilog: Unified Hardware Design, Specification and Verification Language (Superseded by P1800/D6)”；公开目录标为非现行（Inactive），著录年份为 2005 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1800/D6 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4040481</url>
          <locator>standard_number=P1800/D6; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:49+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:49+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1800/D6**（IEEE Unapproved IEEE Draft Standard for System Verilog: Unified Hardware Design, Specification and Verification Language (Superseded by P1800/D6)）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2005 年，主题领域包括 General Topics for Engineers、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1800-d6.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2005</year>
        <precision>year</precision>
        <display>2005年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_p1800_d6_aug_2012</id>
      <type>work</type>
      <title>IEEE Std P1800/D6, Aug 2012</title>
      <slug>ieee-std-p1800-d6-aug-2012</slug>
      <aliases>
        <alias>P1800/D6, Aug 2012</alias>
        <alias>P1800/D6, Aug 2012 - IEEE Approved Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1800/D6, Aug 2012 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language”；公开目录标为非现行（Inactive），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1800/D6, Aug 2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6313596</url>
          <locator>standard_number=P1800/D6, Aug 2012; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:49+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:49+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1800/D6, Aug 2012**（IEEE Approved Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language）是[[organization_ieee|电气电子工程师学会]]于 2012 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1800-d6-aug-2012.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_p1800_d5_feb_2012</id>
      <type>work</type>
      <title>IEEE Std P1800/D5, Feb 2012</title>
      <slug>ieee-std-p1800-d5-feb-2012</slug>
      <aliases>
        <alias>P1800/D5, Feb 2012</alias>
        <alias>P1800/D5, Feb 2012 - IEEE Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1800/D5, Feb 2012 是电气电子工程师学会的草案，题为“IEEE Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language”；公开目录标为非现行（Inactive），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1800/D5, Feb 2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6156383</url>
          <locator>standard_number=P1800/D5, Feb 2012; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:48+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:48+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1800/D5, Feb 2012**（IEEE Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language）是[[organization_ieee|电气电子工程师学会]]于 2012 年 2 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1800-d5-feb-2012.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <perspectives></perspectives>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_p1800_d4a_jul_2017</id>
      <type>work</type>
      <title>IEEE Std P1800/D4a, Jul 2017</title>
      <slug>ieee-std-p1800-d4a-jul-2017</slug>
      <aliases>
        <alias>P1800/D4a, Jul 2017</alias>
        <alias>P1800/D4a, Jul 2017 - IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1800/D4a, Jul 2017 是电气电子工程师学会的草案，题为“IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language”；公开目录标为非现行（Inactive），著录年份为 2017 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1800/D4a, Jul 2017 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8027221</url>
          <locator>standard_number=P1800/D4a, Jul 2017; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:47+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:47+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1800/D4a, Jul 2017**（IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language）是[[organization_ieee|电气电子工程师学会]]于 2017 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1800-d4a-jul-2017.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2017</year>
        <precision>year</precision>
        <display>2017年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_p1800_d3_nov_2011</id>
      <type>work</type>
      <title>IEEE Std P1800/D3, Nov 2011</title>
      <slug>ieee-std-p1800-d3-nov-2011</slug>
      <aliases>
        <alias>P1800/D3, Nov 2011</alias>
        <alias>P1800/D3, Nov 2011 - IEEE Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1800/D3, Nov 2011 是电气电子工程师学会的草案，题为“IEEE Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language”；公开目录标为非现行（Inactive），著录年份为 2011 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1800/D3, Nov 2011 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6092420</url>
          <locator>standard_number=P1800/D3, Nov 2011; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:46+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:46+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1800/D3, Nov 2011**（IEEE Draft Standard for System Verilog--Unified Hardware Design, Specification, and Verification Language）是[[organization_ieee|电气电子工程师学会]]于 2011 年 11 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1800-d3-nov-2011.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2011</year>
        <precision>year</precision>
        <display>2011年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1800_d18_aug_2023</id>
      <type>work</type>
      <title>IEEE Std P1800/D18, Aug 2023</title>
      <slug>ieee-std-p1800-d18-aug-2023</slug>
      <aliases>
        <alias>P1800/D18, Aug 2023</alias>
        <alias>P1800/D18, Aug 2023 - IEEE Approved Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1800/D18, Aug 2023 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language”；公开目录标为非现行（Inactive），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1800/D18, Aug 2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10247196</url>
          <locator>standard_number=P1800/D18, Aug 2023; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:45+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1800/D18, Aug 2023**（IEEE Approved Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language）是[[organization_ieee|电气电子工程师学会]]于 2023 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1800-d18-aug-2023.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <customFields></customFields>
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      <id>work_ieee_p1800_d3_apr_2017</id>
      <type>work</type>
      <title>IEEE Std P1800/D3, Apr 2017</title>
      <slug>ieee-std-p1800-d3-apr-2017</slug>
      <aliases>
        <alias>P1800/D3, Apr 2017</alias>
        <alias>P1800/D3, Apr 2017 - IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1800/D3, Apr 2017 是电气电子工程师学会的草案，题为“IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language”；公开目录标为非现行（Inactive），著录年份为 2017 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1800/D3, Apr 2017 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7921683</url>
          <locator>standard_number=P1800/D3, Apr 2017; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:45+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:45+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1800/D3, Apr 2017**（IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language）是[[organization_ieee|电气电子工程师学会]]于 2017 年 4 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1800-d3-apr-2017.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2017</year>
        <precision>year</precision>
        <display>2017年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_p1800_d17_mar_2023</id>
      <type>work</type>
      <title>IEEE Std P1800/D17, Mar 2023</title>
      <slug>ieee-std-p1800-d17-mar-2023</slug>
      <aliases>
        <alias>P1800/D17, Mar 2023</alias>
        <alias>P1800/D17, Mar 2023 - IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1800/D17, Mar 2023 是电气电子工程师学会的草案，题为“IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language”；公开目录标为非现行（Inactive），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1800/D17, Mar 2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10117463</url>
          <locator>standard_number=P1800/D17, Mar 2023; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:44+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:44+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1800/D17, Mar 2023**（IEEE Draft Standard for SystemVerilog--Unified Hardware Design, Specification, and Verification Language）是[[organization_ieee|电气电子工程师学会]]于 2023 年 3 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1800-d17-mar-2023.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1717_2024_10901980_redline</id>
      <type>work</type>
      <title>IEEE Std 1717-2024</title>
      <slug>ieee-std-1717-2024-10901980-redline</slug>
      <aliases>
        <alias>1717-2024</alias>
        <alias>1717-2024 - IEEE Standard for Testing Fire-Resistive, Circuit Integrity Cables and Cable Systems Using a Hydrocarbon Pool Fire Test Protocol - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1717-2024 是电气电子工程师学会的技术标准，题为“IEEE Standard for Testing Fire-Resistive, Circuit Integrity Cables and Cable Systems Using a Hydrocarbon Pool Fire Test Protocol - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1717-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10901980</url>
          <locator>standard_number=1717-2024; status=Active; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1717-2024**（IEEE Standard for Testing Fire-Resistive, Circuit Integrity Cables and Cable Systems Using a Hydrocarbon Pool Fire Test Protocol - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2024 年，主题领域包括 Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1717-2024-10901980-redline.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_1718_2012</id>
      <type>work</type>
      <title>IEEE Std 1718-2012</title>
      <slug>ieee-std-1718-2012</slug>
      <aliases>
        <alias>1718-2012</alias>
        <alias>1718-2012 - IEEE Guide for Temperature Monitoring of Cable Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1718-2012 是电气电子工程师学会的技术标准，题为“IEEE Guide for Temperature Monitoring of Cable Systems”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1718-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6214560</url>
          <locator>standard_number=1718-2012; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1718-2012**（IEEE Guide for Temperature Monitoring of Cable Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2012 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1718-2012.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1720_2012</id>
      <type>work</type>
      <title>IEEE Std 1720-2012</title>
      <slug>ieee-std-1720-2012</slug>
      <aliases>
        <alias>1720-2012</alias>
        <alias>1720-2012 - IEEE Recommended Practice for Near-Field Antenna Measurements</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1720-2012 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Near-Field Antenna Measurements”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1720-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6375743</url>
          <locator>standard_number=1720-2012; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1720-2012**（IEEE Recommended Practice for Near-Field Antenna Measurements）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2012 年，主题领域包括 Fields, Waves and Electromagnetics、Aerospace、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1720-2012.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_1722_1_2013</id>
      <type>work</type>
      <title>IEEE Std 1722.1-2013</title>
      <slug>ieee-std-1722-1-2013</slug>
      <aliases>
        <alias>1722.1-2013</alias>
        <alias>1722.1-2013 - IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722(TM) Based Devices</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1722.1-2013 是电气电子工程师学会的技术标准，题为“IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722(TM) Based Devices”；公开目录标为已被替代（Superseded），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1722.1-2013 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6627914</url>
          <locator>standard_number=1722.1-2013; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1722.1-2013**（IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722(TM) Based Devices）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2013 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1722-1-2013.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1722_1_2013_cor_1_2018</id>
      <type>work</type>
      <title>IEEE Std 1722.1-2013/Cor 1-2018</title>
      <slug>ieee-std-1722-1-2013-cor-1-2018</slug>
      <aliases>
        <alias>1722.1-2013/Cor 1-2018</alias>
        <alias>1722.1-2013/Cor 1-2018 - IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722(TM) Based Devices - Corrigendum 1:Technical and Editorial Corrections</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1722.1-2013/Cor 1-2018 是电气电子工程师学会的技术标准，题为“IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722(TM) Based Devices - Corrigendum 1:Technical and Editorial Corrections”；公开目录标为已被替代（Superseded），著录年份为 2019 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1722.1-2013/Cor 1-2018 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8666951</url>
          <locator>standard_number=1722.1-2013/Cor 1-2018; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1722.1-2013/Cor 1-2018**（IEEE Standard for Device Discovery, Connection Management, and Control Protocol for IEEE 1722(TM) Based Devices - Corrigendum 1:Technical and Editorial Corrections）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2019 年，主题领域包括 Components, Circuits, Devices and Systems、Communication, Networking and Broadcast Technologies、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1722-1-2013-cor-1-2018.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2019</year>
        <precision>year</precision>
        <display>2019年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1722_1_2021_10053665_redline</id>
      <type>work</type>
      <title>IEEE Std 1722.1-2021</title>
      <slug>ieee-std-1722-1-2021-10053665-redline</slug>
      <aliases>
        <alias>1722.1-2021</alias>
        <alias>1722.1-2021 - IEEE Standard for Device Discovery, Connection Management, and Control Protocol for Time-Sensitive Networking System - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1722.1-2021 是电气电子工程师学会的技术标准，题为“IEEE Standard for Device Discovery, Connection Management, and Control Protocol for Time-Sensitive Networking System - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1722.1-2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10053665</url>
          <locator>standard_number=1722.1-2021; status=Active; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1722.1-2021**（IEEE Standard for Device Discovery, Connection Management, and Control Protocol for Time-Sensitive Networking System - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2022 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1722-1-2021-10053665-redline.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <type>work</type>
      <title>IEEE Std 1722-2011</title>
      <slug>ieee-std-1722-2011</slug>
      <aliases>
        <alias>1722-2011</alias>
        <alias>1722-2011 - IEEE Standard for Layer 2 Transport Protocol for Time Sensitive Applications in a Bridged Local Area Network</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1722-2011 是电气电子工程师学会的技术标准，题为“IEEE Standard for Layer 2 Transport Protocol for Time Sensitive Applications in a Bridged Local Area Network”；公开目录标为已被替代（Superseded），著录年份为 2011 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1722-2011 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5764873</url>
          <locator>standard_number=1722-2011; status=Superseded; modifier=</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1722-2011**（IEEE Standard for Layer 2 Transport Protocol for Time Sensitive Applications in a Bridged Local Area Network）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2011 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1722-2011.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2011</year>
        <precision>year</precision>
        <display>2011年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1722_2016</id>
      <type>work</type>
      <title>IEEE Std 1722-2016</title>
      <slug>ieee-std-1722-2016</slug>
      <aliases>
        <alias>1722-2016</alias>
        <alias>1722-2016 - IEEE Standard for a Transport Protocol for Time-Sensitive Applications in Bridged Local Area Networks</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1722-2016 是电气电子工程师学会的技术标准，题为“IEEE Standard for a Transport Protocol for Time-Sensitive Applications in Bridged Local Area Networks”；公开目录标为已被替代（Superseded），著录年份为 2016 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1722-2016 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7782714</url>
          <locator>standard_number=1722-2016; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1722-2016**（IEEE Standard for a Transport Protocol for Time-Sensitive Applications in Bridged Local Area Networks）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2016 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1722-2016.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2016</year>
        <precision>year</precision>
        <display>2016年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <id>work_ieee_1724_2011</id>
      <type>work</type>
      <title>IEEE Std 1724-2011</title>
      <slug>ieee-std-1724-2011</slug>
      <aliases>
        <alias>1724-2011</alias>
        <alias>1724-2011 - IEEE Guide for the Preparation of a Transmission Line Design Criteria Document</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1724-2011 是电气电子工程师学会的技术标准，题为“IEEE Guide for the Preparation of a Transmission Line Design Criteria Document”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1724-2011 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5783875</url>
          <locator>standard_number=1724-2011; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1724-2011**（IEEE Guide for the Preparation of a Transmission Line Design Criteria Document）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Power, Energy and Industry Applications、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1724-2011.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2011</year>
        <precision>year</precision>
        <display>2011年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <id>work_ieee_1725_2006</id>
      <type>work</type>
      <title>IEEE Std 1725-2006</title>
      <slug>ieee-std-1725-2006</slug>
      <aliases>
        <alias>1725-2006</alias>
        <alias>1725-2006 - IEEE Standard for Rechargeable Batteries for Cellular Telephones</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1725-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard for Rechargeable Batteries for Cellular Telephones”；公开目录标为已被替代（Superseded），著录年份为 2006 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1725-2006 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10816</url>
          <locator>standard_number=1725-2006; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1725-2006**（IEEE Standard for Rechargeable Batteries for Cellular Telephones）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2006 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1725-2006.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2006</year>
        <precision>year</precision>
        <display>2006年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <id>work_ieee_1725_2011_5930302</id>
      <type>work</type>
      <title>IEEE Std 1725-2011</title>
      <slug>ieee-std-1725-2011-5930302</slug>
      <aliases>
        <alias>1725-2011</alias>
        <alias>1725-2011 - IEEE Standard for Rechargeable Batteries for Cellular Telephones</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1725-2011 是电气电子工程师学会的技术标准，题为“IEEE Standard for Rechargeable Batteries for Cellular Telephones”；公开目录标为已被替代（Superseded），著录年份为 2011 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1725-2011 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5930302</url>
          <locator>standard_number=1725-2011; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1725-2011**（IEEE Standard for Rechargeable Batteries for Cellular Telephones）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2011 年，主题领域包括 Power, Energy and Industry Applications、Geoscience、Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1725-2011-5930302.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2011</year>
        <precision>year</precision>
        <display>2011年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <id>work_ieee_1725_2011_6046068_redline</id>
      <type>work</type>
      <title>IEEE Std 1725-2011</title>
      <slug>ieee-std-1725-2011-6046068-redline</slug>
      <aliases>
        <alias>1725-2011</alias>
        <alias>1725-2011 - IEEE Standard for Rechargeable Batteries for Cellular Telephones - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1725-2011 是电气电子工程师学会的技术标准，题为“IEEE Standard for Rechargeable Batteries for Cellular Telephones - Redline”；公开目录标为已被替代（Superseded），红线对照（Redline），著录年份为 2011 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1725-2011 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6046068</url>
          <locator>standard_number=1725-2011; status=Superseded; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1725-2011**（IEEE Standard for Rechargeable Batteries for Cellular Telephones - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），红线对照（Redline），著录年份为 2011 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1725-2011-6046068-redline.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2011</year>
        <precision>year</precision>
        <display>2011年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1725_2021_9709253_redline</id>
      <type>work</type>
      <title>IEEE Std 1725-2021</title>
      <slug>ieee-std-1725-2021-9709253-redline</slug>
      <aliases>
        <alias>1725-2021</alias>
        <alias>1725-2021 - IEEE Standard for Rechargeable Batteries for Mobile Phones - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1725-2021 是电气电子工程师学会的技术标准，题为“IEEE Standard for Rechargeable Batteries for Mobile Phones - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1725-2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9709253</url>
          <locator>standard_number=1725-2021; status=Active; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1725-2021**（IEEE Standard for Rechargeable Batteries for Mobile Phones - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2021 年，主题领域包括 Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1725-2021-9709253-redline.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <id>work_ieee_1726_2013</id>
      <type>work</type>
      <title>IEEE Std 1726-2013</title>
      <slug>ieee-std-1726-2013</slug>
      <aliases>
        <alias>1726-2013</alias>
        <alias>1726-2013 - IEEE Guide for the Functional Specification of Fixed-Series Capacitor Banks for Transmission System Applications</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1726-2013 是电气电子工程师学会的技术标准，题为“IEEE Guide for the Functional Specification of Fixed-Series Capacitor Banks for Transmission System Applications”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2014 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1726-2013 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6759721</url>
          <locator>standard_number=1726-2013; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1726-2013**（IEEE Guide for the Functional Specification of Fixed-Series Capacitor Banks for Transmission System Applications）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2014 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1726-2013.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2014</year>
        <precision>year</precision>
        <display>2014年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1727_2013</id>
      <type>work</type>
      <title>IEEE Std 1727-2013</title>
      <slug>ieee-std-1727-2013</slug>
      <aliases>
        <alias>1727-2013</alias>
        <alias>1727-2013 - IEEE Guide for Working Procedures on Underground Transmission Circuits with Induced Voltage</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1727-2013 是电气电子工程师学会的技术标准，题为“IEEE Guide for Working Procedures on Underground Transmission Circuits with Induced Voltage”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1727-2013 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6516868</url>
          <locator>standard_number=1727-2013; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1727-2013**（IEEE Guide for Working Procedures on Underground Transmission Circuits with Induced Voltage）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2013 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1727-2013.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <id>work_ieee_1727_2013_cor_1_2015</id>
      <type>work</type>
      <title>IEEE Std 1727-2013/Cor 1-2015</title>
      <slug>ieee-std-1727-2013-cor-1-2015</slug>
      <aliases>
        <alias>1727-2013/Cor 1-2015</alias>
        <alias>1727-2013/Cor 1-2015 - IEEE Guide for Working Procedures on Underground Transmission Circuits with Induced Voltage -- Corrigendum 1</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1727-2013/Cor 1-2015 是电气电子工程师学会的技术标准，题为“IEEE Guide for Working Procedures on Underground Transmission Circuits with Induced Voltage -- Corrigendum 1”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1727-2013/Cor 1-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7045457</url>
          <locator>standard_number=1727-2013/Cor 1-2015; status=Inactive; modifier=Reserved</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1727-2013/Cor 1-2015**（IEEE Guide for Working Procedures on Underground Transmission Circuits with Induced Voltage -- Corrigendum 1）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2015 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1727-2013-cor-1-2015.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_1729_2014</id>
      <type>work</type>
      <title>IEEE Std 1729-2014</title>
      <slug>ieee-std-1729-2014</slug>
      <aliases>
        <alias>1729-2014</alias>
        <alias>1729-2014 - IEEE Recommended Practice for Electric Power Distribution System Analysis</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1729-2014 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Electric Power Distribution System Analysis”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2014 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1729-2014 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6974965</url>
          <locator>standard_number=1729-2014; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1729-2014**（IEEE Recommended Practice for Electric Power Distribution System Analysis）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2014 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1729-2014.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2014</year>
        <precision>year</precision>
        <display>2014年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_172_1971</id>
      <type>work</type>
      <title>IEEE Std 172-1971</title>
      <slug>ieee-std-172-1971</slug>
      <aliases>
        <alias>172-1971</alias>
        <alias>172-1971 - IEEE Standard Definitions: Navigation Aid Terms</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 172-1971 是电气电子工程师学会的技术标准，题为“IEEE Standard Definitions: Navigation Aid Terms”；公开目录标为已被替代（Superseded），著录年份为 1970 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 172-1971 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7368859</url>
          <locator>standard_number=172-1971; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 172-1971**（IEEE Standard Definitions: Navigation Aid Terms）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1970 年，主题领域包括 Aerospace、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-172-1971.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1970</year>
        <precision>year</precision>
        <display>1970年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_172_1983</id>
      <type>work</type>
      <title>IEEE Std 172-1983</title>
      <slug>ieee-std-172-1983</slug>
      <aliases>
        <alias>172-1983</alias>
        <alias>172-1983 - IEEE Standard Definitions of Navigation Aid Terms</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 172-1983 是电气电子工程师学会的技术标准，题为“IEEE Standard Definitions of Navigation Aid Terms”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1983 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 172-1983 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=2463</url>
          <locator>standard_number=172-1983; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 172-1983**（IEEE Standard Definitions of Navigation Aid Terms）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1983 年，主题领域包括 Aerospace、Components, Circuits, Devices and Systems、Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-172-1983.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1983</year>
        <precision>year</precision>
        <display>1983年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1730_2010</id>
      <type>work</type>
      <title>IEEE Std 1730-2010</title>
      <slug>ieee-std-1730-2010</slug>
      <aliases>
        <alias>1730-2010</alias>
        <alias>1730-2010 - IEEE Recommended Practice for Distributed Simulation Engineering and Execution Process (DSEEP)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1730-2010 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Distributed Simulation Engineering and Execution Process (DSEEP)”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1730-2010 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5706285</url>
          <locator>standard_number=1730-2010; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:39+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:39+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1730-2010**（IEEE Recommended Practice for Distributed Simulation Engineering and Execution Process (DSEEP)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Communication, Networking and Broadcast Technologies、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1730-2010.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2011</year>
        <precision>year</precision>
        <display>2011年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1800_2_d8_mar_2020</id>
      <type>work</type>
      <title>IEEE Std P1800.2/D8, Mar 2020</title>
      <slug>ieee-std-p1800-2-d8-mar-2020</slug>
      <aliases>
        <alias>P1800.2/D8, Mar 2020</alias>
        <alias>P1800.2/D8, Mar 2020 - IEEE Draft Standard for Universal Verification Methodology Language Reference Manual</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1800.2/D8, Mar 2020 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Universal Verification Methodology Language Reference Manual”；公开目录标为非现行（Inactive），著录年份为 2020 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1800.2/D8, Mar 2020 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9047182</url>
          <locator>standard_number=P1800.2/D8, Mar 2020; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:30+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:30+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1800.2/D8, Mar 2020**（IEEE Draft Standard for Universal Verification Methodology Language Reference Manual）是[[organization_ieee|电气电子工程师学会]]于 2020 年 3 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1800-2-d8-mar-2020.html</url>
      <lang>ru</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2020</year>
        <precision>year</precision>
        <display>2020年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1800_2_d7_nov_2016</id>
      <type>work</type>
      <title>IEEE Std P1800.2/D7, Nov 2016</title>
      <slug>ieee-std-p1800-2-d7-nov-2016</slug>
      <aliases>
        <alias>P1800.2/D7, Nov 2016</alias>
        <alias>P1800.2/D7, Nov 2016 - IEEE Approved Draft Standard for Universal Verification Methodology Language Reference Manual</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1800.2/D7, Nov 2016 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Universal Verification Methodology Language Reference Manual”；公开目录标为非现行（Inactive），著录年份为 2016 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1800.2/D7, Nov 2016 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7755719</url>
          <locator>standard_number=P1800.2/D7, Nov 2016; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T22:00:29+08:00</createdAt>
      <updatedAt>2026-11-01T22:00:29+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1800.2/D7, Nov 2016**（IEEE Approved Draft Standard for Universal Verification Methodology Language Reference Manual）是[[organization_ieee|电气电子工程师学会]]于 2016 年 11 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <body>**IEEE Std P1800.2/D7, Oct2019**（IEEE Draft Standard for Universal Verification Methodology Language Reference Manual）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2019 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <body>**IEEE Std P18/D8, Apr 2025**（IEEE Approved Draft Standard for Shunt Power Capacitors）是[[organization_ieee|电气电子工程师学会]]于 2025 年 4 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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