<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>电气电子工程师学会 · ความสัมพันธ์</title>
  <description>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</description>
  <url>/th/organizations/ieee/relation-125.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>organization_ieee</id>
    <type>organization</type>
    <title>电气电子工程师学会</title>
    <slug>ieee</slug>
    <aliases>
      <alias>IEEE</alias>
      <alias>Institute of Electrical and Electronics Engineers</alias>
      <alias>电气和电子工程师协会</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
      <tag>tag-publishing</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
        <locator>2026-11-01 访问</locator>
      </source>
      <source>
        <id>s2</id>
        <title>IEEE 官方网站</title>
        <author>IEEE</author>
        <url>https://www.ieee.org/</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:52+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:52+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**电气电子工程师学会**（Institute of Electrical and Electronics Engineers，简称 IEEE）是1963年1月1日由美国电气工程师学会（AIEE）与无线电工程师学会（IRE）合并成立的专业技术协会，面向电气工程、电子工程及相关学科[^s1]。&#xA;&#xA;## 沿革&#xA;&#xA;该会可追溯至1884年成立的 AIEE；1912年另成立 IRE。两会于1963年合并为 IEEE[^s1]。总会设在纽约，1975年起主要业务在新泽西州皮斯卡特维的运营中心开展[^s1]。&#xA;&#xA;## 职能与业务&#xA;&#xA;IEEE 发布同行评议期刊与会议录，并通过标准化委员会制定技术标准；相关内容可在 IEEE Xplore 平台检索[^s1][^s3]。标准公开目录（KBART）列出标准编号、题名、状态与题录链接等元数据[^s3]。&#xA;&#xA;## 现状&#xA;&#xA;据公开介绍，该会为美国 501(c)(3) 公益性专业协会，全球会员逾48.6万[^s1]。官网为 https://www.ieee.org/ [^s2]。</body>
    <url>/organizations/ieee.html</url>
    <lang>th</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <orgKind>专业协会</orgKind>
    <founded>
      <year>1963</year>
      <month>1</month>
      <day>1</day>
      <precision>day</precision>
      <display>1963年1月1日</display>
    </founded>
    <orgStatus>active</orgStatus>
    <headquartersNote>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</headquartersNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_cf905478e37e4c93e607064e</id>
      <fromId>work_ieee_61691_6_2009_6489994</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_61691_6_2009_6489994</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_61691_6_2009_6489994</targetId>
      <targetTitle>IEEE Std 61691-6-2009</targetTitle>
      <targetUrl>/th/works/ieee-std-61691-6-2009-6489994.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b1cf108cf8b647e761c10335</id>
      <fromId>work_ieee_618_1984</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_618_1984</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_618_1984</targetId>
      <targetTitle>IEEE Std 618-1984</targetTitle>
      <targetUrl>/th/works/ieee-std-618-1984.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_eda8bb2683e33977976bdf68</id>
      <fromId>work_ieee_62_ire12_s1_1962</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_62_ire12_s1_1962</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_62_ire12_s1_1962</targetId>
      <targetTitle>IEEE Std 62 IRE12.S1-1962</targetTitle>
      <targetUrl>/th/works/ieee-std-62-ire12-s1-1962.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_be0a179c0786b13cb4fec268</id>
      <fromId>work_ieee_62_1956</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_62_1956</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_62_1956</targetId>
      <targetTitle>IEEE Std 62-1956</targetTitle>
      <targetUrl>/th/works/ieee-std-62-1956.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0caed662e0f5699ff3a316c5</id>
      <fromId>work_ieee_62_1958</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_62_1958</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_62_1958</targetId>
      <targetTitle>IEEE Std 62-1958</targetTitle>
      <targetUrl>/th/works/ieee-std-62-1958.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b9a121bf009ca3422f4ce09d</id>
      <fromId>work_ieee_62_1978</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_62_1978</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_62_1978</targetId>
      <targetTitle>IEEE Std 62-1978</targetTitle>
      <targetUrl>/th/works/ieee-std-62-1978.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_493bee530887013b778ff3d9</id>
      <fromId>work_ieee_62_1995</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_62_1995</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_62_1995</targetId>
      <targetTitle>IEEE Std 62-1995</targetTitle>
      <targetUrl>/th/works/ieee-std-62-1995.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6a83612ec56383e0c9faf479</id>
      <fromId>work_ieee_62_2_2004</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_62_2_2004</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_62_2_2004</targetId>
      <targetTitle>IEEE Std 62.2-2004</targetTitle>
      <targetUrl>/th/works/ieee-std-62-2-2004.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_37b075dada868760c05e3cf1</id>
      <fromId>work_ieee_620_1981</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_620_1981</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_620_1981</targetId>
      <targetTitle>IEEE Std 620-1981</targetTitle>
      <targetUrl>/th/works/ieee-std-620-1981.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_36c1f85abfeead1f40778cba</id>
      <fromId>work_ieee_620_1987</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_620_1987</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_620_1987</targetId>
      <targetTitle>IEEE Std 620-1987</targetTitle>
      <targetUrl>/th/works/ieee-std-620-1987.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_669898a9f2add3b4086e09d1</id>
      <fromId>work_ieee_620_1996</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_620_1996</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_620_1996</targetId>
      <targetTitle>IEEE Std 620-1996</targetTitle>
      <targetUrl>/th/works/ieee-std-620-1996.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_789acbae8fac9e444cf8d49d</id>
      <fromId>work_ieee_620_2022_9926028_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_620_2022_9926028_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_620_2022_9926028_redline</targetId>
      <targetTitle>IEEE Std 620-2022</targetTitle>
      <targetUrl>/th/works/ieee-std-620-2022-9926028-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_53e9809c283cf0e54eae0fbe</id>
      <fromId>work_ieee_62032_2005</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_62032_2005</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_62032_2005</targetId>
      <targetTitle>IEEE Std 62032-2005</targetTitle>
      <targetUrl>/th/works/ieee-std-62032-2005.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9ba8fe4a85606d25676ff4bc</id>
      <fromId>work_ieee_62032_2012_6329911_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_62032_2012_6329911_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_62032_2012_6329911_redline</targetId>
      <targetTitle>IEEE Std 62032-2012</targetTitle>
      <targetUrl>/th/works/ieee-std-62032-2012-6329911-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_251d005fb15f0caf061c84f1</id>
      <fromId>work_ieee_62050_2005</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_62050_2005</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_62050_2005</targetId>
      <targetTitle>IEEE Std 62050-2005</targetTitle>
      <targetUrl>/th/works/ieee-std-62050-2005.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_61eec1e4d27cd124bb33a0f7</id>
      <fromId>work_ieee_62142_2005</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_62142_2005</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_62142_2005</targetId>
      <targetTitle>IEEE Std 62142-2005</targetTitle>
      <targetUrl>/th/works/ieee-std-62142-2005.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f601db8d0687070e53f2e518</id>
      <fromId>work_ieee_622_1979</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_622_1979</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_622_1979</targetId>
      <targetTitle>IEEE Std 622-1979</targetTitle>
      <targetUrl>/th/works/ieee-std-622-1979.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e16f8db2e054658f675c2516</id>
      <fromId>work_ieee_622_1987</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_622_1987</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_622_1987</targetId>
      <targetTitle>IEEE Std 622-1987</targetTitle>
      <targetUrl>/th/works/ieee-std-622-1987.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_041cbdc97662de7fcee33ded</id>
      <fromId>work_ieee_62209_1528_2020_8920245</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_62209_1528_2020_8920245</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_62209_1528_2020_8920245</targetId>
      <targetTitle>IEEE Std 62209-1528-2020</targetTitle>
      <targetUrl>/th/works/ieee-std-62209-1528-2020-8920245.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_eb88f7eaed2729d7b64b3553</id>
      <fromId>work_ieee_62209_1528_2020_9351793_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_62209_1528_2020_9351793_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_62209_1528_2020_9351793_redline</targetId>
      <targetTitle>IEEE Std 62209-1528-2020</targetTitle>
      <targetUrl>/th/works/ieee-std-62209-1528-2020-9351793-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6ab24ba1e401f8f019036b8c</id>
      <fromId>work_ieee_62243_2002</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_62243_2002</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_62243_2002</targetId>
      <targetTitle>IEEE Std 62243-2002</targetTitle>
      <targetUrl>/th/works/ieee-std-62243-2002.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b4dbfc152469acfec516a980</id>
      <fromId>work_ieee_62243_2012_6383176_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_62243_2012_6383176_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_62243_2012_6383176_redline</targetId>
      <targetTitle>IEEE Std 62243-2012</targetTitle>
      <targetUrl>/th/works/ieee-std-62243-2012-6383176-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2c0be4b092bcd376cd3dd397</id>
      <fromId>work_ieee_62265_2005</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_62265_2005</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_62265_2005</targetId>
      <targetTitle>IEEE Std 62265-2005</targetTitle>
      <targetUrl>/th/works/ieee-std-62265-2005.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_77dcb3e3783cd7af79bf1958</id>
      <fromId>work_ieee_62271_111_2005</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_62271_111_2005</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_62271_111_2005</targetId>
      <targetTitle>IEEE Std 62271-111-2005</targetTitle>
      <targetUrl>/th/works/ieee-std-62271-111-2005.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bf986691ec975b74694412b5</id>
      <fromId>work_ieee_p21839_apr_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p21839_apr_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p21839_apr_2017</targetId>
      <targetTitle>IEEE Std P21839, Apr 2017</targetTitle>
      <targetUrl>/th/works/ieee-std-p21839-apr-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_758b665b5a00204fbf54a9c0</id>
      <fromId>work_ieee_p21839_cd_1_oct_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p21839_cd_1_oct_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p21839_cd_1_oct_2017</targetId>
      <targetTitle>IEEE Std P21839/CD.1, Oct 2017</targetTitle>
      <targetUrl>/th/works/ieee-std-p21839-cd-1-oct-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_a388bc6e87bc2b3e5a33d617</id>
      <fromId>work_ieee_p21839_dis_sept_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p21839_dis_sept_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p21839_dis_sept_2025</targetId>
      <targetTitle>IEEE Std P21839/DIS, Sept 2025</targetTitle>
      <targetUrl>/th/works/ieee-std-p21839-dis-sept-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_35b805f3bc86b67e6e58412c</id>
      <fromId>work_ieee_p21839_dis_july_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p21839_dis_july_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p21839_dis_july_2018</targetId>
      <targetTitle>IEEE Std P21839_DIS, July 2018</targetTitle>
      <targetUrl>/th/works/ieee-std-p21839-dis-july-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c17d225919f0670bec0237d5</id>
      <fromId>work_ieee_p21840_dis_2019</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p21840_dis_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p21840_dis_2019</targetId>
      <targetTitle>IEEE Std P21840, DIS-2019</targetTitle>
      <targetUrl>/th/works/ieee-std-p21840-dis-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6cbee0baac419b6eedfeab87</id>
      <fromId>work_ieee_p21840_cd_feb_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p21840_cd_feb_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p21840_cd_feb_2018</targetId>
      <targetTitle>IEEE Std P21840/CD, Feb 2018</targetTitle>
      <targetUrl>/th/works/ieee-std-p21840-cd-feb-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7c90ed23eff87363dced4719</id>
      <fromId>work_ieee_p21840_dis_sept_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p21840_dis_sept_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p21840_dis_sept_2025</targetId>
      <targetTitle>IEEE Std P21840/DIS, Sept 2025</targetTitle>
      <targetUrl>/th/works/ieee-std-p21840-dis-sept-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_67016fc14073d4d7b69b1921</id>
      <fromId>work_ieee_p21841_cd2</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p21841_cd2</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p21841_cd2</targetId>
      <targetTitle>IEEE Std P21841/CD2</targetTitle>
      <targetUrl>/th/works/ieee-std-p21841-cd2.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d3f4d04147c81a97dbf1606c</id>
      <fromId>work_ieee_p21841_dis_sept_2025_en</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p21841_dis_sept_2025_en</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p21841_dis_sept_2025_en</targetId>
      <targetTitle>IEEE Std P21841/DIS, Sept 2025(en)</targetTitle>
      <targetUrl>/th/works/ieee-std-p21841-dis-sept-2025-en.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_46136ee9f1b2c20837dfecda</id>
      <fromId>work_ieee_p21841_fdis_apr_2019</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p21841_fdis_apr_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p21841_fdis_apr_2019</targetId>
      <targetTitle>IEEE Std P21841/FDIS, Apr 2019</targetTitle>
      <targetUrl>/th/works/ieee-std-p21841-fdis-apr-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bd222a5bf66d0d8703a178b8</id>
      <fromId>work_ieee_p2200_d7_april_2012</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2200_d7_april_2012</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2200_d7_april_2012</targetId>
      <targetTitle>IEEE Std P2200/D7, April 2012</targetTitle>
      <targetUrl>/th/works/ieee-std-p2200-d7-april-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ac719d10b9646fb04ad0b4c0</id>
      <fromId>work_ieee_p2247_1_d20_dec_2020</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2247_1_d20_dec_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2247_1_d20_dec_2020</targetId>
      <targetTitle>IEEE Std P2247.1/D20, Dec 2020</targetTitle>
      <targetUrl>/th/works/ieee-std-p2247-1-d20-dec-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_066410e4b0706447ea08223e</id>
      <fromId>work_ieee_p2247_4_d1_jan_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2247_4_d1_jan_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2247_4_d1_jan_2025</targetId>
      <targetTitle>IEEE Std P2247.4/D1, Jan 2025</targetTitle>
      <targetUrl>/th/works/ieee-std-p2247-4-d1-jan-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b929a332afbac2439fbdcfea</id>
      <fromId>work_ieee_p2247_4_d3_sept_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2247_4_d3_sept_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2247_4_d3_sept_2025</targetId>
      <targetTitle>IEEE Std P2247.4/D3, Sept 2025</targetTitle>
      <targetUrl>/th/works/ieee-std-p2247-4-d3-sept-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_38ecdad4c56983c93ed34253</id>
      <fromId>work_ieee_p2301_d13_oct_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2301_d13_oct_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2301_d13_oct_2018</targetId>
      <targetTitle>IEEE Std P2301/D13, Oct 2018</targetTitle>
      <targetUrl>/th/works/ieee-std-p2301-d13-oct-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_681a56930b980e26137c76e1</id>
      <fromId>work_ieee_p2301_d14_oct_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2301_d14_oct_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2301_d14_oct_2018</targetId>
      <targetTitle>IEEE Std P2301/D14, Oct 2018</targetTitle>
      <targetUrl>/th/works/ieee-std-p2301-d14-oct-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8d4b5720101b3755f1c6aabf</id>
      <fromId>work_ieee_p2302_d1_jun_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2302_d1_jun_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2302_d1_jun_2021</targetId>
      <targetTitle>IEEE Std P2302/D1, Jun 2021</targetTitle>
      <targetUrl>/th/works/ieee-std-p2302-d1-jun-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_beb127a154712956994d2247</id>
      <fromId>work_ieee_p2302_d2_sept_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2302_d2_sept_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2302_d2_sept_2021</targetId>
      <targetTitle>IEEE Std P2302/D2, Sept 2021</targetTitle>
      <targetUrl>/th/works/ieee-std-p2302-d2-sept-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_eee1121bfc8d88505255a55f</id>
      <fromId>work_ieee_p2302_d3_oct_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2302_d3_oct_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2302_d3_oct_2021</targetId>
      <targetTitle>IEEE Std P2302/D3, Oct 2021</targetTitle>
      <targetUrl>/th/works/ieee-std-p2302-d3-oct-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8f5a30a337584453e72536b5</id>
      <fromId>work_ieee_p23026_cd_jan_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p23026_cd_jan_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p23026_cd_jan_2022</targetId>
      <targetTitle>IEEE Std P23026/CD, Jan 2022</targetTitle>
      <targetUrl>/th/works/ieee-std-p23026-cd-jan-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2832121f0df7056788eabda9</id>
      <fromId>work_ieee_p23026_dis_sept_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p23026_dis_sept_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p23026_dis_sept_2022</targetId>
      <targetTitle>IEEE Std P23026/DIS, Sept 2022</targetTitle>
      <targetUrl>/th/works/ieee-std-p23026-dis-sept-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f07b86c0ec2d1469d768f912</id>
      <fromId>work_ieee_p23026_fdis_apr2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p23026_fdis_apr2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p23026_fdis_apr2023</targetId>
      <targetTitle>IEEE Std P23026/FDIS, Apr2023</targetTitle>
      <targetUrl>/th/works/ieee-std-p23026-fdis-apr2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3098decf300a54c10d6c8aa5</id>
      <fromId>work_ieee_p23026_2013</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p23026_2013</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p23026_2013</targetId>
      <targetTitle>IEEE Std P23026:2013</targetTitle>
      <targetUrl>/th/works/ieee-std-p23026-2013.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0640801f612947dbb35f6e98</id>
      <fromId>work_ieee_p23026_d2_2013</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p23026_d2_2013</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p23026_d2_2013</targetId>
      <targetTitle>IEEE Std P23026_D2, 2013</targetTitle>
      <targetUrl>/th/works/ieee-std-p23026-d2-2013.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_64ef1bcaa04a9452d8fef425</id>
      <fromId>work_ieee_p23026_d3_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p23026_d3_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p23026_d3_2014</targetId>
      <targetTitle>IEEE Std P23026_D3, 2014</targetTitle>
      <targetUrl>/th/works/ieee-std-p23026-d3-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3f626745402b0aee4b7860b7</id>
      <fromId>work_ieee_p23612_d2_oct_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p23612_d2_oct_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p23612_d2_oct_2025</targetId>
      <targetTitle>IEEE Std P23612/D2, Oct 2025</targetTitle>
      <targetUrl>/th/works/ieee-std-p23612-d2-oct-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>concept_ieee_standards</fromId>
      <fromTitle>IEEE 标准</fromTitle>
      <fromUrl>/th/concepts/ieee-standards.html</fromUrl>
      <fromType>concept</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/th/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/th/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/th/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/th/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/th/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/th/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/th/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/th/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/th/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>th</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>org_kind</key>
      <label>Organization kind</label>
      <value>专业协会</value>
    </field>
    <field>
      <key>founded</key>
      <label>Founded</label>
      <value>1963年1月1日</value>
    </field>
    <field>
      <key>org_status</key>
      <label>Status</label>
      <value>ยังดำเนินการ</value>
    </field>
    <field>
      <key>headquarters_note</key>
      <label>Headquarters</label>
      <value>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</value>
    </field>
  </infoFields>
  <pagination>
    <page>125</page>
    <pageSize>50</pageSize>
    <total>8265</total>
    <pageCount>166</pageCount>
    <prevUrl>/th/organizations/ieee/relation-124.xml</prevUrl>
    <nextUrl>/th/organizations/ieee/relation-126.xml</nextUrl>
  </pagination>
  <relationsTotal>8265</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8279</mentionsTotal>
  <mentionsUrl>/th/organizations/ieee/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>