<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>电气电子工程师学会 · ความสัมพันธ์</title>
  <description>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</description>
  <url>/th/organizations/ieee/relation-128.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>organization_ieee</id>
    <type>organization</type>
    <title>电气电子工程师学会</title>
    <slug>ieee</slug>
    <aliases>
      <alias>IEEE</alias>
      <alias>Institute of Electrical and Electronics Engineers</alias>
      <alias>电气和电子工程师协会</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
      <tag>tag-publishing</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
        <locator>2026-11-01 访问</locator>
      </source>
      <source>
        <id>s2</id>
        <title>IEEE 官方网站</title>
        <author>IEEE</author>
        <url>https://www.ieee.org/</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:52+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:52+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**电气电子工程师学会**（Institute of Electrical and Electronics Engineers，简称 IEEE）是1963年1月1日由美国电气工程师学会（AIEE）与无线电工程师学会（IRE）合并成立的专业技术协会，面向电气工程、电子工程及相关学科[^s1]。&#xA;&#xA;## 沿革&#xA;&#xA;该会可追溯至1884年成立的 AIEE；1912年另成立 IRE。两会于1963年合并为 IEEE[^s1]。总会设在纽约，1975年起主要业务在新泽西州皮斯卡特维的运营中心开展[^s1]。&#xA;&#xA;## 职能与业务&#xA;&#xA;IEEE 发布同行评议期刊与会议录，并通过标准化委员会制定技术标准；相关内容可在 IEEE Xplore 平台检索[^s1][^s3]。标准公开目录（KBART）列出标准编号、题名、状态与题录链接等元数据[^s3]。&#xA;&#xA;## 现状&#xA;&#xA;据公开介绍，该会为美国 501(c)(3) 公益性专业协会，全球会员逾48.6万[^s1]。官网为 https://www.ieee.org/ [^s2]。</body>
    <url>/organizations/ieee.html</url>
    <lang>th</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <orgKind>专业协会</orgKind>
    <founded>
      <year>1963</year>
      <month>1</month>
      <day>1</day>
      <precision>day</precision>
      <display>1963年1月1日</display>
    </founded>
    <orgStatus>active</orgStatus>
    <headquartersNote>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</headquartersNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_3cdedcecfc7673faf6c7ff6b</id>
      <fromId>work_ieee_p2427_d0_42_june_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2427_d0_42_june_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2427_d0_42_june_2025</targetId>
      <targetTitle>IEEE Std P2427/D0.42, June 2025</targetTitle>
      <targetUrl>/th/works/ieee-std-p2427-d0-42-june-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_fedeee0081aee7c71a01822e</id>
      <fromId>work_ieee_p2430_d2_aug_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2430_d2_aug_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2430_d2_aug_2018</targetId>
      <targetTitle>IEEE Std P2430/D2, Aug 2018</targetTitle>
      <targetUrl>/th/works/ieee-std-p2430-d2-aug-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_cd649c4d2d7c7124b149e30a</id>
      <fromId>work_ieee_p2445_d2_may_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2445_d2_may_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2445_d2_may_2018</targetId>
      <targetTitle>IEEE Std P2445/D2, May 2018</targetTitle>
      <targetUrl>/th/works/ieee-std-p2445-d2-may-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_32e62ddeb0c6e73161a8af09</id>
      <fromId>work_ieee_p2450_d2_sept_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2450_d2_sept_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2450_d2_sept_2017</targetId>
      <targetTitle>IEEE Std P2450/D2, Sept 2017</targetTitle>
      <targetUrl>/th/works/ieee-std-p2450-d2-sept-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f1ed4a05b4993cef31d7c22a</id>
      <fromId>work_ieee_p2450_d5_mar2019</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2450_d5_mar2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2450_d5_mar2019</targetId>
      <targetTitle>IEEE Std P2450/D5, Mar2019</targetTitle>
      <targetUrl>/th/works/ieee-std-p2450-d5-mar2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7a23c132ca62acb96c09395e</id>
      <fromId>work_ieee_p2450_d6_apr_2019</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2450_d6_apr_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2450_d6_apr_2019</targetId>
      <targetTitle>IEEE Std P2450/D6, Apr 2019</targetTitle>
      <targetUrl>/th/works/ieee-std-p2450-d6-apr-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_33c733226a04fbcadf2edca2</id>
      <fromId>work_ieee_p2450_d4_oct_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2450_d4_oct_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2450_d4_oct_2018</targetId>
      <targetTitle>IEEE Std P2450_D4, Oct 2018</targetTitle>
      <targetUrl>/th/works/ieee-std-p2450-d4-oct-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bbb84a17ed427286cd708220</id>
      <fromId>work_ieee_p2455_d93_sept_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2455_d93_sept_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2455_d93_sept_2022</targetId>
      <targetTitle>IEEE Std P2455/D93, Sept 2022</targetTitle>
      <targetUrl>/th/works/ieee-std-p2455-d93-sept-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4768be24759cab54c8a991b0</id>
      <fromId>work_ieee_p2455_d95_apr_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2455_d95_apr_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2455_d95_apr_2023</targetId>
      <targetTitle>IEEE Std P2455/D95, Apr 2023</targetTitle>
      <targetUrl>/th/works/ieee-std-p2455-d95-apr-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_730f06a1d181d11a6f5a1fd7</id>
      <fromId>work_ieee_p24641_dis_sept_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24641_dis_sept_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24641_dis_sept_2021</targetId>
      <targetTitle>IEEE Std P24641/DIS, Sept 2021</targetTitle>
      <targetUrl>/th/works/ieee-std-p24641-dis-sept-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b39dbea398719482950789ca</id>
      <fromId>work_ieee_p24641_fdis_jan_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24641_fdis_jan_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24641_fdis_jan_2023</targetId>
      <targetTitle>IEEE Std P24641/FDIS, Jan 2023</targetTitle>
      <targetUrl>/th/works/ieee-std-p24641-fdis-jan-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_671a923bc0b6a733ed29647a</id>
      <fromId>work_ieee_p24641_d2_cd_jun_2020</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24641_d2_cd_jun_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24641_d2_cd_jun_2020</targetId>
      <targetTitle>IEEE Std P24641_D2_CD, Jun 2020</targetTitle>
      <targetUrl>/th/works/ieee-std-p24641-d2-cd-jun-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_29b8aa29f1dd2553aadafbca</id>
      <fromId>work_ieee_p24641_d3_cd2_mar_2020</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24641_d3_cd2_mar_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24641_d3_cd2_mar_2020</targetId>
      <targetTitle>IEEE Std P24641_D3_CD2, Mar 2020</targetTitle>
      <targetUrl>/th/works/ieee-std-p24641-d3-cd2-mar-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e48bce8be8de036e8708fee4</id>
      <fromId>work_ieee_p2465_d15_oct_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2465_d15_oct_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2465_d15_oct_2022</targetId>
      <targetTitle>IEEE Std P2465/D15, Oct 2022</targetTitle>
      <targetUrl>/th/works/ieee-std-p2465-d15-oct-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8a7d50b3b222cb0b439189b9</id>
      <fromId>work_ieee_p2465_d16_sept_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p2465_d16_sept_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p2465_d16_sept_2023</targetId>
      <targetTitle>IEEE Std P2465/D16, Sept 2023</targetTitle>
      <targetUrl>/th/works/ieee-std-p2465-d16-sept-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_516e14be57aaa0ce1ceab862</id>
      <fromId>work_ieee_p24748_1</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_1</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_1</targetId>
      <targetTitle>IEEE Std P24748-1</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-1.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_de7ef4efc14cc6219dbfedc5</id>
      <fromId>work_ieee_p24748_1_cd_aug_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_1_cd_aug_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_1_cd_aug_2022</targetId>
      <targetTitle>IEEE Std P24748-1/CD, Aug 2022</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-1-cd-aug-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4e0e42bb0ba55fa04db5820e</id>
      <fromId>work_ieee_p24748_1_d1_aug_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_1_d1_aug_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_1_d1_aug_2017</targetId>
      <targetTitle>IEEE Std P24748-1/D1, Aug 2017</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-1-d1-aug-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4453351f4e0284f81ef4398b</id>
      <fromId>work_ieee_p24748_1_d2_feb_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_1_d2_feb_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_1_d2_feb_2018</targetId>
      <targetTitle>IEEE Std P24748-1/D2, Feb 2018</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-1-d2-feb-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_18dddf0fb0ffd00776d79a50</id>
      <fromId>work_ieee_p24748_1_dis_may_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_1_dis_may_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_1_dis_may_2023</targetId>
      <targetTitle>IEEE Std P24748-1/DIS, May 2023</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-1-dis-may-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e2565799695f607523c270f5</id>
      <fromId>work_ieee_p24748_1_fdis_may_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_1_fdis_may_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_1_fdis_may_2018</targetId>
      <targetTitle>IEEE Std P24748-1/FDIS, May 2018</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-1-fdis-may-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b4e6bbc72ba5c27c91d9f18c</id>
      <fromId>work_ieee_p24748_10_d2_sept_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_10_d2_sept_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_10_d2_sept_2025</targetId>
      <targetTitle>IEEE Std P24748-10/D2, Sept 2025</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-10-d2-sept-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_78f61d1c91954903a6874066</id>
      <fromId>work_ieee_p24748_10_dis_nov_2024</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_10_dis_nov_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_10_dis_nov_2024</targetId>
      <targetTitle>IEEE Std P24748-10/DIS, Nov 2024</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-10-dis-nov-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ad25a2a068d8b3dd4d8dd79d</id>
      <fromId>work_ieee_p24748_2_oct_2011</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_2_oct_2011</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_2_oct_2011</targetId>
      <targetTitle>IEEE Std P24748-2, Oct 2011</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-2-oct-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_eda9fe0139968bc3f2081a3e</id>
      <fromId>work_ieee_p24748_2_fdis_nov_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_2_fdis_nov_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_2_fdis_nov_2023</targetId>
      <targetTitle>IEEE Std P24748-2/ FDIS, Nov 2023</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-2-fdis-nov-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f7c79dff460c297d0d682eaf</id>
      <fromId>work_ieee_p24748_2_cd_august_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_2_cd_august_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_2_cd_august_2022</targetId>
      <targetTitle>IEEE Std P24748-2/CD, August 2022</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-2-cd-august-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c47103b7544c8116495ee3ef</id>
      <fromId>work_ieee_p24748_2_d1_aug_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_2_d1_aug_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_2_d1_aug_2017</targetId>
      <targetTitle>IEEE Std P24748-2/D1, Aug 2017</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-2-d1-aug-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4ca82edc3f78469860c5028c</id>
      <fromId>work_ieee_p24748_2_d2_feb_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_2_d2_feb_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_2_d2_feb_2018</targetId>
      <targetTitle>IEEE Std P24748-2/D2, Feb 2018</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-2-d2-feb-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0227b9014ff6398eff47d973</id>
      <fromId>work_ieee_p24748_2_d3_jun_2018</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_2_d3_jun_2018</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_2_d3_jun_2018</targetId>
      <targetTitle>IEEE Std P24748-2/D3, Jun 2018</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-2-d3-jun-2018.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2b92fff4fb0eec6d960cff47</id>
      <fromId>work_ieee_p24748_2_dis_mar_2023</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_2_dis_mar_2023</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_2_dis_mar_2023</targetId>
      <targetTitle>IEEE Std P24748-2/DIS, Mar 2023</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-2-dis-mar-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_51b5a567825d4cda861c3e8e</id>
      <fromId>work_ieee_p24748_3_jan_2019</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_3_jan_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_3_jan_2019</targetId>
      <targetTitle>IEEE Std P24748-3, Jan 2019</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-3-jan-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_28f15ed10a43435ec723be4d</id>
      <fromId>work_ieee_p24748_3_oct_2011</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_3_oct_2011</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_3_oct_2011</targetId>
      <targetTitle>IEEE Std P24748-3, Oct 2011</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-3-oct-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8dfc0e5af7be9fb491239da9</id>
      <fromId>work_ieee_p24748_3_d3_fdis_apr_2020</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_3_d3_fdis_apr_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_3_d3_fdis_apr_2020</targetId>
      <targetTitle>IEEE Std P24748-3/D3_FDIS, Apr 2020</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-3-d3-fdis-apr-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_579b225f176e458feb994432</id>
      <fromId>work_ieee_p24748_3_dis_aug_2019</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_3_dis_aug_2019</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_3_dis_aug_2019</targetId>
      <targetTitle>IEEE Std P24748-3/DIS, Aug 2019</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-3-dis-aug-2019.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_741035d41187fe9473dcede2</id>
      <fromId>work_ieee_p24748_4_dis_1404_apr_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_4_dis_1404_apr_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_4_dis_1404_apr_2014</targetId>
      <targetTitle>IEEE Std P24748-4-DIS-1404, Apr 2014</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-4-dis-1404-apr-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_543823d7169cddd6a99da85d</id>
      <fromId>work_ieee_p24748_4_cd2_jun_2024</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_4_cd2_jun_2024</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_4_cd2_jun_2024</targetId>
      <targetTitle>IEEE Std P24748-4/CD2, Jun 2024</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-4-cd2-jun-2024.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f3b53e6da8e8040abb567347</id>
      <fromId>work_ieee_p24748_4_d2_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_4_d2_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_4_d2_2025</targetId>
      <targetTitle>IEEE Std P24748-4/D2, 2025</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-4-d2-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ffe6773a90a98cfb06419bc4</id>
      <fromId>work_ieee_p24748_4_d3_sept_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_4_d3_sept_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_4_d3_sept_2025</targetId>
      <targetTitle>IEEE Std P24748-4/D3, Sept 2025</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-4-d3-sept-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e81338095f1132a6d8d0c053</id>
      <fromId>work_ieee_p24748_4_dis2_jan_2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p24748_4_dis2_jan_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p24748_4_dis2_jan_2015</targetId>
      <targetTitle>IEEE Std P24748-4/DIS2-Jan 2015</targetTitle>
      <targetUrl>/th/works/ieee-std-p24748-4-dis2-jan-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4db3fa0b1e85a132da477843</id>
      <fromId>work_ieee_634_1978</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_634_1978</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_634_1978</targetId>
      <targetTitle>IEEE Std 634-1978</targetTitle>
      <targetUrl>/th/works/ieee-std-634-1978.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6ce10184994f43ef5d70d17f</id>
      <fromId>work_ieee_634_2004</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_634_2004</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_634_2004</targetId>
      <targetTitle>IEEE Std 634-2004</targetTitle>
      <targetUrl>/th/works/ieee-std-634-2004.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_680283c78b29b48a8424a724</id>
      <fromId>work_ieee_635_1978</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_635_1978</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_635_1978</targetId>
      <targetTitle>IEEE Std 635-1978</targetTitle>
      <targetUrl>/th/works/ieee-std-635-1978.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_5469b250308136d315cff76e</id>
      <fromId>work_ieee_635_1989</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_635_1989</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_635_1989</targetId>
      <targetTitle>IEEE Std 635-1989</targetTitle>
      <targetUrl>/th/works/ieee-std-635-1989.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_fab218fa612caff5bd86c855</id>
      <fromId>work_ieee_635_2003</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_635_2003</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_635_2003</targetId>
      <targetTitle>IEEE Std 635-2003</targetTitle>
      <targetUrl>/th/works/ieee-std-635-2003.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e60958d7696a83c7c3b44a4d</id>
      <fromId>work_ieee_637_1985</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_637_1985</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_637_1985</targetId>
      <targetTitle>IEEE Std 637-1985</targetTitle>
      <targetUrl>/th/works/ieee-std-637-1985.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8cba0b5646da9932be23007e</id>
      <fromId>work_ieee_638_1992</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_638_1992</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_638_1992</targetId>
      <targetTitle>IEEE Std 638-1992</targetTitle>
      <targetUrl>/th/works/ieee-std-638-1992.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_dfacfa7c3e92487d4bc49605</id>
      <fromId>work_ieee_638_2013_6766173</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_638_2013_6766173</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_638_2013_6766173</targetId>
      <targetTitle>IEEE Std 638-2013</targetTitle>
      <targetUrl>/th/works/ieee-std-638-2013-6766173.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9e9323e027a969a500f6c74b</id>
      <fromId>work_ieee_638_2013_6827161_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_638_2013_6827161_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_638_2013_6827161_redline</targetId>
      <targetTitle>IEEE Std 638-2013</targetTitle>
      <targetUrl>/th/works/ieee-std-638-2013-6827161-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ff267d350c188013d594fd0e</id>
      <fromId>work_ieee_64_1956</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_64_1956</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_64_1956</targetId>
      <targetTitle>IEEE Std 64-1956</targetTitle>
      <targetUrl>/th/works/ieee-std-64-1956.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c114bb92c90886885624bf15</id>
      <fromId>work_ieee_64_1969</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_64_1969</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_64_1969</targetId>
      <targetTitle>IEEE Std 64-1969</targetTitle>
      <targetUrl>/th/works/ieee-std-64-1969.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>concept_ieee_standards</fromId>
      <fromTitle>IEEE 标准</fromTitle>
      <fromUrl>/th/concepts/ieee-standards.html</fromUrl>
      <fromType>concept</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/th/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/th/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/th/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/th/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/th/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/th/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/th/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/th/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/th/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>th</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>org_kind</key>
      <label>Organization kind</label>
      <value>专业协会</value>
    </field>
    <field>
      <key>founded</key>
      <label>Founded</label>
      <value>1963年1月1日</value>
    </field>
    <field>
      <key>org_status</key>
      <label>Status</label>
      <value>ยังดำเนินการ</value>
    </field>
    <field>
      <key>headquarters_note</key>
      <label>Headquarters</label>
      <value>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</value>
    </field>
  </infoFields>
  <pagination>
    <page>128</page>
    <pageSize>50</pageSize>
    <total>8265</total>
    <pageCount>166</pageCount>
    <prevUrl>/th/organizations/ieee/relation-127.xml</prevUrl>
    <nextUrl>/th/organizations/ieee/relation-129.xml</nextUrl>
  </pagination>
  <relationsTotal>8265</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8279</mentionsTotal>
  <mentionsUrl>/th/organizations/ieee/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>