{ "contentStorage": "postgres", "title": "ค้นหา", "url": "/th/search-168.html", "entities": [ { "id": "work_ieee_p1785_3_d33_sept_2015", "type": "work", "title": "IEEE Std P1785.3/D33, Sept. 2015", "slug": "ieee-std-p1785-3-d33-sept-2015", "aliases": [ "P1785.3/D33, Sept. 2015", "P1785.3/D33, Sept. 2015 - IEEE Approved Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performanc" ], "summary": "IEEE Std P1785.3/D33, Sept. 2015 是电气电子工程师学会的草案，题为“IEEE Approved Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performanc”；公开目录标为非现行（Inactive），著录年份为 2016 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1785.3/D33, Sept. 2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7471396", "locator": "standard_number=P1785.3/D33, Sept. 2015; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:55+08:00", "updatedAt": "2026-11-01T21:59:55+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1785.3/D33, Sept. 2015**（IEEE Approved Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performanc）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2016 年，主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1785-3-d33-sept-2015.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2016, "precision": "year", "display": "2016年" }, "language": "英语" }, { "id": "work_ieee_p1785_2_d2a_jul_2015", "type": "work", "title": "IEEE Std P1785.2/D2a, Jul 2015", "slug": "ieee-std-p1785-2-d2a-jul-2015", "aliases": [ "P1785.2/D2a, Jul 2015", "P1785.2/D2a, Jul 2015 - IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above-- Part 2: Waveguide Interfaces" ], "summary": "IEEE Std P1785.2/D2a, Jul 2015 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above-- Part 2: Waveguide Interfaces”；公开目录标为非现行（Inactive），著录年份为 2016 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1785.2/D2a, Jul 2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7283528", "locator": "standard_number=P1785.2/D2a, Jul 2015; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:54+08:00", "updatedAt": "2026-11-01T21:59:54+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1785.2/D2a, Jul 2015**（IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above-- Part 2: Waveguide Interfaces）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2016 年，主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1785-2-d2a-jul-2015.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2016, "precision": "year", "display": "2016年" }, "language": "英语" }, { "id": "work_ieee_p1785_3_d31_jun_2014", "type": "work", "title": "IEEE Std P1785.3/D31, Jun 2014", "slug": "ieee-std-p1785-3-d31-jun-2014", "aliases": [ "P1785.3/D31, Jun 2014", "P1785.3/D31, Jun 2014 - IEEE Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performance and Uncer" ], "summary": "IEEE Std P1785.3/D31, Jun 2014 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performance and Uncer”；公开目录标为非现行（Inactive），著录年份为 2014 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1785.3/D31, Jun 2014 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6849920", "locator": "standard_number=P1785.3/D31, Jun 2014; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:54+08:00", "updatedAt": "2026-11-01T21:59:54+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1785.3/D31, Jun 2014**（IEEE Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performance and Uncer）是[[organization_ieee|电气电子工程师学会]]于 2014 年 6 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1785-3-d31-jun-2014.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2014, "precision": "year", "display": "2014年" }, "language": "英语" }, { "id": "work_ieee_p1785_1_d3_july_2012", "type": "work", "title": "IEEE Std P1785.1/D3, July 2012", "slug": "ieee-std-p1785-1-d3-july-2012", "aliases": [ "P1785.1/D3, July 2012", "P1785.1/D3, July 2012 - IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 1: Frequency Bands and Waveguide Dimensions" ], "summary": "IEEE Std P1785.1/D3, July 2012 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 1: Frequency Bands and Waveguide Dimensions”；公开目录标为非现行（Inactive），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1785.1/D3, July 2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6378378", "locator": "standard_number=P1785.1/D3, July 2012; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:53+08:00", "updatedAt": "2026-11-01T21:59:53+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1785.1/D3, July 2012**（IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 1: Frequency Bands and Waveguide Dimensions）是[[organization_ieee|电气电子工程师学会]]于 2012 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1785-1-d3-july-2012.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_p1785_1_d2_oct_2025", "type": "work", "title": "IEEE Std P1785.1/D2, Oct 2025", "slug": "ieee-std-p1785-1-d2-oct-2025", "aliases": [ "P1785.1/D2, Oct 2025", "P1785.1/D2, Oct 2025 - IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions" ], "summary": "IEEE Std P1785.1/D2, Oct 2025 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions”；公开目录标为非现行（Inactive），著录年份为 2026 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1785.1/D2, Oct 2025 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=11224739", "locator": "standard_number=P1785.1/D2, Oct 2025; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:52+08:00", "updatedAt": "2026-11-01T21:59:52+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1785.1/D2, Oct 2025**（IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2026 年，主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1785-1-d2-oct-2025.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2026, "precision": "year", "display": "2026年" }, "language": "英语" }, { "id": "work_ieee_p1785_1_d1_aug_2025", "type": "work", "title": "IEEE Std P1785.1/D1, Aug 2025", "slug": "ieee-std-p1785-1-d1-aug-2025", "aliases": [ "P1785.1/D1, Aug 2025", "P1785.1/D1, Aug 2025 - IEEE Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions" ], "summary": "IEEE Std P1785.1/D1, Aug 2025 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions”；公开目录标为非现行（Inactive），著录年份为 2025 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1785.1/D1, Aug 2025 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=11124502", "locator": "standard_number=P1785.1/D1, Aug 2025; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:51+08:00", "updatedAt": "2026-11-01T21:59:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1785.1/D1, Aug 2025**（IEEE Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions）是[[organization_ieee|电气电子工程师学会]]于 2025 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1785-1-d1-aug-2025.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2025, "precision": "year", "display": "2025年" }, "language": "英语" }, { "id": "work_ieee_p1783_d2_1_dec_2008", "type": "work", "title": "IEEE Std P1783/D2.1 Dec 2008", "slug": "ieee-std-p1783-d2-1-dec-2008", "aliases": [ "P1783/D2.1 Dec 2008", "P1783/D2.1 Dec 2008 - IEEE Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions" ], "summary": "IEEE Std P1783/D2.1 Dec 2008 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions”；公开目录标为非现行（Inactive），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1783/D2.1 Dec 2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4749829", "locator": "standard_number=P1783/D2.1 Dec 2008; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:50+08:00", "updatedAt": "2026-11-01T21:59:50+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1783/D2.1 Dec 2008**（IEEE Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions）是[[organization_ieee|电气电子工程师学会]]于 2008 年 12 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1783-d2-1-dec-2008.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_p1783_d3_apr_2009", "type": "work", "title": "IEEE Std P1783/D3, Apr 2009", "slug": "ieee-std-p1783-d3-apr-2009", "aliases": [ "P1783/D3, Apr 2009", "P1783/D3, Apr 2009 - Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions" ], "summary": "IEEE Std P1783/D3, Apr 2009 是电气电子工程师学会的草案，题为“Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions”；公开目录标为非现行（Inactive），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1783/D3, Apr 2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4977262", "locator": "standard_number=P1783/D3, Apr 2009; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:50+08:00", "updatedAt": "2026-11-01T21:59:50+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1783/D3, Apr 2009**（Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions）是[[organization_ieee|电气电子工程师学会]]于 2009 年 4 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1783-d3-apr-2009.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_p1782_d5_july_2013", "type": "work", "title": "IEEE Std P1782/D5, July 2013", "slug": "ieee-std-p1782-d5-july-2013", "aliases": [ "P1782/D5, July 2013", "P1782/D5, July 2013 - IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events" ], "summary": "IEEE Std P1782/D5, July 2013 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events”；公开目录标为非现行（Inactive），著录年份为 2013 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1782/D5, July 2013 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6557400", "locator": "standard_number=P1782/D5, July 2013; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:49+08:00", "updatedAt": "2026-11-01T21:59:49+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1782/D5, July 2013**（IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]于 2013 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1782-d5-july-2013.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2013, "precision": "year", "display": "2013年" }, "language": "英语" }, { "id": "work_ieee_p1782_d4_nov_2012", "type": "work", "title": "IEEE Std P1782/D4, Nov 2012", "slug": "ieee-std-p1782-d4-nov-2012", "aliases": [ "P1782/D4, Nov 2012", "P1782/D4, Nov 2012 - IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events" ], "summary": "IEEE Std P1782/D4, Nov 2012 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events”；公开目录标为非现行（Inactive），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1782/D4, Nov 2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6357339", "locator": "standard_number=P1782/D4, Nov 2012; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:48+08:00", "updatedAt": "2026-11-01T21:59:48+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1782/D4, Nov 2012**（IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]于 2012 年 11 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1782-d4-nov-2012.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_p1782_d1_jan_2022", "type": "work", "title": "IEEE Std P1782/D1, Jan 2022", "slug": "ieee-std-p1782-d1-jan-2022", "aliases": [ "P1782/D1, Jan 2022", "P1782/D1, Jan 2022 - IEEE Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events" ], "summary": "IEEE Std P1782/D1, Jan 2022 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events”；公开目录标为非现行（Inactive），著录年份为 2022 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1782/D1, Jan 2022 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9698146", "locator": "standard_number=P1782/D1, Jan 2022; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:47+08:00", "updatedAt": "2026-11-01T21:59:47+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1782/D1, Jan 2022**（IEEE Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]于 2022 年 1 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1782-d1-jan-2022.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2022, "precision": "year", "display": "2022年" }, "language": "英语" }, { "id": "work_ieee_p1780_d30_oct_2021", "type": "work", "title": "IEEE Std P1780/D30, Oct 2021", "slug": "ieee-std-p1780-d30-oct-2021", "aliases": [ "P1780/D30, Oct 2021", "P1780/D30, Oct 2021 - IEEE Aproved Draft Standard for the Specification of Inertial Measurement Units (IMU)" ], "summary": "IEEE Std P1780/D30, Oct 2021 是电气电子工程师学会的草案，题为“IEEE Aproved Draft Standard for the Specification of Inertial Measurement Units (IMU)”；公开目录标为非现行（Inactive），著录年份为 2021 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1780/D30, Oct 2021 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9715056", "locator": "standard_number=P1780/D30, Oct 2021; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:46+08:00", "updatedAt": "2026-11-01T21:59:46+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1780/D30, Oct 2021**（IEEE Aproved Draft Standard for the Specification of Inertial Measurement Units (IMU)）是[[organization_ieee|电气电子工程师学会]]于 2021 年 10 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1780-d30-oct-2021.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2021, "precision": "year", "display": "2021年" }, "language": "英语" }, { "id": "work_ieee_p1782_d002_mar_2022", "type": "work", "title": "IEEE Std P1782/D002, Mar 2022", "slug": "ieee-std-p1782-d002-mar-2022", "aliases": [ "P1782/D002, Mar 2022", "P1782/D002, Mar 2022 - IEEE Approved Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events" ], "summary": "IEEE Std P1782/D002, Mar 2022 是电气电子工程师学会的草案，题为“IEEE Approved Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events”；公开目录标为非现行（Inactive），著录年份为 2022 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1782/D002, Mar 2022 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9732938", "locator": "standard_number=P1782/D002, Mar 2022; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:46+08:00", "updatedAt": "2026-11-01T21:59:46+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1782/D002, Mar 2022**（IEEE Approved Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]于 2022 年 3 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1782-d002-mar-2022.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2022, "precision": "year", "display": "2022年" }, "language": "英语" }, { "id": "work_ieee_1667_2018_8575226_redline", "type": "work", "title": "IEEE Std 1667-2018", "slug": "ieee-std-1667-2018-8575226-redline", "aliases": [ "1667-2018", "1667-2018 - IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline" ], "summary": "IEEE Std 1667-2018 是电气电子工程师学会的技术标准，题为“IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2018 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1667-2018 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8575226", "locator": "standard_number=1667-2018; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1667-2018**（IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2018 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1667-2018-8575226-redline.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2018, "precision": "year", "display": "2018年" }, "language": "英语" }, { "id": "work_ieee_1668_2014", "type": "work", "title": "IEEE Std 1668-2014", "slug": "ieee-std-1668-2014", "aliases": [ "1668-2014", "1668-2014 - IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V" ], "summary": "IEEE Std 1668-2014 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V”；公开目录标为已被替代（Superseded），著录年份为 2014 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1668-2014 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6895234", "locator": "standard_number=1668-2014; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1668-2014**（IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2014 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1668-2014.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2014, "precision": "year", "display": "2014年" }, "language": "英语" }, { "id": "work_ieee_1668_2017_8365161_redline", "type": "work", "title": "IEEE Std 1668-2017", "slug": "ieee-std-1668-2017-8365161-redline", "aliases": [ "1668-2017", "1668-2017 - IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V - Redline" ], "summary": "IEEE Std 1668-2017 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2017 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1668-2017 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8365161", "locator": "standard_number=1668-2017; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1668-2017**（IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2017 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1668-2017-8365161-redline.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2017, "precision": "year", "display": "2017年" }, "language": "英语" }, { "id": "work_ieee_1671_1_2009_5353115", "type": "work", "title": "IEEE Std 1671.1-2009", "slug": "ieee-std-1671-1-2009-5353115", "aliases": [ "1671.1-2009", "1671.1-2009 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions" ], "summary": "IEEE Std 1671.1-2009 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions”；公开目录标为已被替代（Superseded），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.1-2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5353115", "locator": "standard_number=1671.1-2009; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.1-2009**（IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2009 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-1-2009-5353115.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_1671_1_2009_6781519", "type": "work", "title": "IEEE Std 1671.1-2009", "slug": "ieee-std-1671-1-2009-6781519", "aliases": [ "1671.1-2009", "1671.1-2009 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions" ], "summary": "IEEE Std 1671.1-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions”；公开目录标为已被替代（Superseded），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.1-2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6781519", "locator": "standard_number=1671.1-2009; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.1-2009**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2009 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-1-2009-6781519.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_1671_2006_4035723", "type": "work", "title": "IEEE Std 1671-2006", "slug": "ieee-std-1671-2006-4035723", "aliases": [ "1671-2006", "1671-2006 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information Via XML" ], "summary": "IEEE Std 1671-2006 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information Via XML”；公开目录标为已被替代（Superseded），著录年份为 2006 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671-2006 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4035723", "locator": "standard_number=1671-2006; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671-2006**（IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information Via XML）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2006 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2006-4035723.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2006, "precision": "year", "display": "2006年" }, "language": "英语" }, { "id": "work_ieee_1671_2006_5250285", "type": "work", "title": "IEEE Std 1671-2006", "slug": "ieee-std-1671-2006-5250285", "aliases": [ "1671-2006", "1671-2006 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" ], "summary": "IEEE Std 1671-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML”；公开目录标为已被替代（Superseded），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671-2006 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5250285", "locator": "standard_number=1671-2006; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671-2006**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2009 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2006-5250285.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_1671_2010", "type": "work", "title": "IEEE Std 1671-2010", "slug": "ieee-std-1671-2010", "aliases": [ "1671-2010", "1671-2010 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" ], "summary": "IEEE Std 1671-2010 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671-2010 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5706288", "locator": "standard_number=1671-2010; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671-2010**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2010.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2011, "precision": "year", "display": "2011年" }, "language": "英语" }, { "id": "work_ieee_1671_2_2008", "type": "work", "title": "IEEE Std 1671.2-2008", "slug": "ieee-std-1671-2-2008", "aliases": [ "1671.2-2008", "1671.2-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions" ], "summary": "IEEE Std 1671.2-2008 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions”；公开目录标为已被替代（Superseded），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.2-2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4723949", "locator": "standard_number=1671.2-2008; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.2-2008**（IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2-2008.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_1671_2_2012_6461895", "type": "work", "title": "IEEE Std 1671.2-2012", "slug": "ieee-std-1671-2-2012-6461895", "aliases": [ "1671.2-2012", "1671.2-2012 - IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description" ], "summary": "IEEE Std 1671.2-2012 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2013 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.2-2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6461895", "locator": "standard_number=1671.2-2012; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.2-2012**（IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2013 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2-2012-6461895.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2013, "precision": "year", "display": "2013年" }, "language": "英语" }, { "id": "work_ieee_1671_2_2012_6522436_redline", "type": "work", "title": "IEEE Std 1671.2-2012", "slug": "ieee-std-1671-2-2012-6522436-redline", "aliases": [ "1671.2-2012", "1671.2-2012 - IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline" ], "summary": "IEEE Std 1671.2-2012 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2013 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.2-2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6522436", "locator": "standard_number=1671.2-2012; status=Inactive; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.2-2012**（IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2013 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2-2012-6522436-redline.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2013, "precision": "year", "display": "2013年" }, "language": "英语" }, { "id": "work_ieee_1671_2_d15_sep_2012", "type": "work", "title": "IEEE Std 1671.2/D15, Sep 2012", "slug": "ieee-std-1671-2-d15-sep-2012", "aliases": [ "1671.2/D15, Sep 2012", "1671.2/D15, Sep 2012 - IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Instrument Description" ], "summary": "IEEE Std 1671.2/D15, Sep 2012 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Instrument Description”；公开目录标为非现行（Inactive），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.2/D15, Sep 2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6376069", "locator": "standard_number=1671.2/D15, Sep 2012; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.2/D15, Sep 2012**（IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Instrument Description）是[[organization_ieee|电气电子工程师学会]]于 2012 年 9 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2-d15-sep-2012.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_1671_3_2007", "type": "work", "title": "IEEE Std 1671.3-2007", "slug": "ieee-std-1671-3-2007", "aliases": [ "1671.3-2007", "1671.3-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Infor" ], "summary": "IEEE Std 1671.3-2007 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Infor”；公开目录标为已被替代（Superseded），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.3-2007 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4479536", "locator": "standard_number=1671.3-2007; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.3-2007**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Infor）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-3-2007.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_1671_4_2007", "type": "work", "title": "IEEE Std 1671.4-2007", "slug": "ieee-std-1671-4-2007", "aliases": [ "1671.4-2007", "1671.4-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information" ], "summary": "IEEE Std 1671.4-2007 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information”；公开目录标为已被替代（Superseded），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.4-2007 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4509492", "locator": "standard_number=1671.4-2007; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.4-2007**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-4-2007.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_1671_4_2014", "type": "work", "title": "IEEE Std 1671.4-2014", "slug": "ieee-std-1671-4-2014", "aliases": [ "1671.4-2014", "1671.4-2014 - IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration" ], "summary": "IEEE Std 1671.4-2014 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2014 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.4-2014 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6808400", "locator": "standard_number=1671.4-2014; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.4-2014**（IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2014 年，主题领域包括 Computing and Processing、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-4-2014.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2014, "precision": "year", "display": "2014年" }, "language": "英语" }, { "id": "work_ieee_1671_5_2008_4733021", "type": "work", "title": "IEEE Std 1671.5-2008", "slug": "ieee-std-1671-5-2008-4733021", "aliases": [ "1671.5-2008", "1671.5-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information" ], "summary": "IEEE Std 1671.5-2008 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information”；公开目录标为已被替代（Superseded），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.5-2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4733021", "locator": "standard_number=1671.5-2008; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.5-2008**（IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2012 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-5-2008-4733021.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_1671_5_2008_6781501", "type": "work", "title": "IEEE Std 1671.5-2008", "slug": "ieee-std-1671-5-2008-6781501", "aliases": [ "1671.5-2008", "1671.5-2008 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information" ], "summary": "IEEE Std 1671.5-2008 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information”；公开目录标为已被替代（Superseded），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.5-2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6781501", "locator": "standard_number=1671.5-2008; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.5-2008**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2012 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-5-2008-6781501.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_1671_5_2015_7102656", "type": "work", "title": "IEEE Std 1671.5-2015", "slug": "ieee-std-1671-5-2015-7102656", "aliases": [ "1671.5-2015", "1671.5-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description" ], "summary": "IEEE Std 1671.5-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2015 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.5-2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7102656", "locator": "standard_number=1671.5-2015; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.5-2015**（IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-5-2015-7102656.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2015, "precision": "year", "display": "2015年" }, "language": "英语" }, { "id": "work_ieee_1671_5_2015_7166296_redline", "type": "work", "title": "IEEE Std 1671.5-2015", "slug": "ieee-std-1671-5-2015-7166296-redline", "aliases": [ "1671.5-2015", "1671.5-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description - Redline" ], "summary": "IEEE Std 1671.5-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2015 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.5-2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7166296", "locator": "standard_number=1671.5-2015; status=Inactive; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.5-2015**（IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-5-2015-7166296-redline.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2015, "precision": "year", "display": "2015年" }, "language": "英语" }, { "id": "work_ieee_167_1966", "type": "work", "title": "IEEE Std 167-1966", "slug": "ieee-std-167-1966", "aliases": [ "167-1966", "167-1966 - IEEE Test Procedure for Facsimile" ], "summary": "IEEE Std 167-1966 是电气电子工程师学会的技术标准，题为“IEEE Test Procedure for Facsimile”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1966 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 167-1966 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7368070", "locator": "standard_number=167-1966; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 167-1966**（IEEE Test Procedure for Facsimile）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1966 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-167-1966.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1966, "precision": "year", "display": "1966年" }, "language": "英语" }, { "id": "work_ieee_p1780_d29_oct_2020", "type": "work", "title": "IEEE Std P1780/D29, Oct 2020", "slug": "ieee-std-p1780-d29-oct-2020", "aliases": [ "P1780/D29, Oct 2020", "P1780/D29, Oct 2020 - IEEE Draft Standard for the Specification of Inertial Measurement Units (IMU)" ], "summary": "IEEE Std P1780/D29, Oct 2020 是电气电子工程师学会的草案，题为“IEEE Draft Standard for the Specification of Inertial Measurement Units (IMU)”；公开目录标为非现行（Inactive），著录年份为 2021 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1780/D29, Oct 2020 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9369228", "locator": "standard_number=P1780/D29, Oct 2020; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1780/D29, Oct 2020**（IEEE Draft Standard for the Specification of Inertial Measurement Units (IMU)）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2021 年，主题领域包括 Aerospace、Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1780-d29-oct-2020.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2021, "precision": "year", "display": "2021年" }, "language": "英语" }, { "id": "work_ieee_p1776_d08_dec_2007", "type": "work", "title": "IEEE Std P1776_D08, Dec 2007", "slug": "ieee-std-p1776-d08-dec-2007", "aliases": [ "P1776_D08, Dec 2007", "P1776_D08, Dec 2007 - IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach" ], "summary": "IEEE Std P1776_D08, Dec 2007 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach”；公开目录标为非现行（Inactive），著录年份为 2007 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1776_D08, Dec 2007 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4447422", "locator": "standard_number=P1776_D08, Dec 2007; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:44+08:00", "updatedAt": "2026-11-01T21:59:44+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1776_D08, Dec 2007**（IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach）是[[organization_ieee|电气电子工程师学会]]于 2007 年 12 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1776-d08-dec-2007.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2007, "precision": "year", "display": "2007年" }, "language": "英语" }, { "id": "work_ieee_p1776_d12_jun_2008", "type": "work", "title": "IEEE Std P1776/D12, Jun 2008", "slug": "ieee-std-p1776-d12-jun-2008", "aliases": [ "P1776/D12, Jun 2008", "P1776/D12, Jun 2008 - IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach" ], "summary": "IEEE Std P1776/D12, Jun 2008 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach”；公开目录标为非现行（Inactive），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1776/D12, Jun 2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4588269", "locator": "standard_number=P1776/D12, Jun 2008; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:43+08:00", "updatedAt": "2026-11-01T21:59:43+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1776/D12, Jun 2008**（IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach）是[[organization_ieee|电气电子工程师学会]]于 2008 年 6 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1776-d12-jun-2008.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_p1776_d9b_feb_2008", "type": "work", "title": "IEEE Std P1776/D9b, Feb. 2008", "slug": "ieee-std-p1776-d9b-feb-2008", "aliases": [ "P1776/D9b, Feb. 2008", "P1776/D9b, Feb. 2008 - IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for AC Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mac" ], "summary": "IEEE Std P1776/D9b, Feb. 2008 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for AC Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mac”；公开目录标为非现行（Inactive），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1776/D9b, Feb. 2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4489719", "locator": "standard_number=P1776/D9b, Feb. 2008; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:43+08:00", "updatedAt": "2026-11-01T21:59:43+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1776/D9b, Feb. 2008**（IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for AC Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mac）是[[organization_ieee|电气电子工程师学会]]于 2008 年 2 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1776-d9b-feb-2008.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_p1775_d1_9_8_dec_2009", "type": "work", "title": "IEEE Std P1775/D1.9.8, Dec 2009", "slug": "ieee-std-p1775-d1-9-8-dec-2009", "aliases": [ "P1775/D1.9.8, Dec 2009", "P1775/D1.9.8, Dec 2009 - IEEE Draft Standard for Powerline Communication Equipment -- Electromagnetic Compatibility (EMC) Requirements -- Testing and Measurements Methods" ], "summary": "IEEE Std P1775/D1.9.8, Dec 2009 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Powerline Communication Equipment -- Electromagnetic Compatibility (EMC) Requirements -- Testing and Measurements Methods”；公开目录标为非现行（Inactive），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1775/D1.9.8, Dec 2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5385202", "locator": "standard_number=P1775/D1.9.8, Dec 2009; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:42+08:00", "updatedAt": "2026-11-01T21:59:42+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1775/D1.9.8, Dec 2009**（IEEE Draft Standard for Powerline Communication Equipment -- Electromagnetic Compatibility (EMC) Requirements -- Testing and Measurements Methods）是[[organization_ieee|电气电子工程师学会]]于 2009 年 12 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1775-d1-9-8-dec-2009.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_p1775_1_9_7_mar_2009", "type": "work", "title": "IEEE Std P1775/1.9.7, Mar 2009", "slug": "ieee-std-p1775-1-9-7-mar-2009", "aliases": [ "P1775/1.9.7, Mar 2009", "P1775/1.9.7, Mar 2009 - IEEE Draft Standard for Powerline Communication Equipment - Electromagnetic Compatibility (EMC) Requirements - Testing and Measurements Methods" ], "summary": "IEEE Std P1775/1.9.7, Mar 2009 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Powerline Communication Equipment - Electromagnetic Compatibility (EMC) Requirements - Testing and Measurements Methods”；公开目录标为非现行（Inactive），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1775/1.9.7, Mar 2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4810943", "locator": "standard_number=P1775/1.9.7, Mar 2009; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:41+08:00", "updatedAt": "2026-11-01T21:59:41+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1775/1.9.7, Mar 2009**（IEEE Draft Standard for Powerline Communication Equipment - Electromagnetic Compatibility (EMC) Requirements - Testing and Measurements Methods）是[[organization_ieee|电气电子工程师学会]]于 2009 年 3 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1775-1-9-7-mar-2009.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_1667_2006", "type": "work", "title": "IEEE Std 1667-2006", "slug": "ieee-std-1667-2006", "aliases": [ "1667-2006", "1667-2006 - IEEE Standard Protocol for Authentication in Host Attachments of Transient Storage Devices" ], "summary": "IEEE Std 1667-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard Protocol for Authentication in Host Attachments of Transient Storage Devices”；公开目录标为已被替代（Superseded），著录年份为 2007 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1667-2006 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4233253", "locator": "standard_number=1667-2006; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:33+08:00", "updatedAt": "2026-11-01T21:59:33+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1667-2006**（IEEE Standard Protocol for Authentication in Host Attachments of Transient Storage Devices）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2007 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1667-2006.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2007, "precision": "year", "display": "2007年" }, "language": "英语" }, { "id": "work_ieee_1667_2009_5438721", "type": "work", "title": "IEEE Std 1667-2009", "slug": "ieee-std-1667-2009-5438721", "aliases": [ "1667-2009", "1667-2009 - IEEE Standard for Authentication in Host Attachments of Transient Storage Devices" ], "summary": "IEEE Std 1667-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard for Authentication in Host Attachments of Transient Storage Devices”；公开目录标为已被替代（Superseded），著录年份为 2010 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1667-2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5438721", "locator": "standard_number=1667-2009; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:33+08:00", "updatedAt": "2026-11-01T21:59:33+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1667-2009**（IEEE Standard for Authentication in Host Attachments of Transient Storage Devices）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2010 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1667-2009-5438721.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2010, "precision": "year", "display": "2010年" }, "language": "英语" }, { "id": "work_ieee_1667_2009_5953415_redline", "type": "work", "title": "IEEE Std 1667-2009", "slug": "ieee-std-1667-2009-5953415-redline", "aliases": [ "1667-2009", "1667-2009 - IEEE Standard for Authentication in Host Attachments of Transient Storage Devices - Redline" ], "summary": "IEEE Std 1667-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard for Authentication in Host Attachments of Transient Storage Devices - Redline”；公开目录标为已被替代（Superseded），红线对照（Redline），著录年份为 2010 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1667-2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5953415", "locator": "standard_number=1667-2009; status=Superseded; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:33+08:00", "updatedAt": "2026-11-01T21:59:33+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1667-2009**（IEEE Standard for Authentication in Host Attachments of Transient Storage Devices - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），红线对照（Redline），著录年份为 2010 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1667-2009-5953415-redline.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2010, "precision": "year", "display": "2010年" }, "language": "英语" }, { "id": "work_ieee_1667_2015_7389947", "type": "work", "title": "IEEE Std 1667-2015", "slug": "ieee-std-1667-2015-7389947", "aliases": [ "1667-2015", "1667-2015 - IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices" ], "summary": "IEEE Std 1667-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices”；公开目录标为已被替代（Superseded），著录年份为 2016 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1667-2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7389947", "locator": "standard_number=1667-2015; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:33+08:00", "updatedAt": "2026-11-01T21:59:33+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1667-2015**（IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2016 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1667-2015-7389947.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2016, "precision": "year", "display": "2016年" }, "language": "英语" }, { "id": "work_ieee_1667_2015_7544434_redline", "type": "work", "title": "IEEE Std 1667-2015", "slug": "ieee-std-1667-2015-7544434-redline", "aliases": [ "1667-2015", "1667-2015 - IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline" ], "summary": "IEEE Std 1667-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline”；公开目录标为已被替代（Superseded），红线对照（Redline），著录年份为 2016 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1667-2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7544434", "locator": "standard_number=1667-2015; status=Superseded; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:33+08:00", "updatedAt": "2026-11-01T21:59:33+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1667-2015**（IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），红线对照（Redline），著录年份为 2016 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1667-2015-7544434-redline.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2016, "precision": "year", "display": "2016年" }, "language": "英语" }, { "id": "work_ieee_1657_2009", "type": "work", "title": "IEEE Std 1657-2009", "slug": "ieee-std-1657-2009", "aliases": [ "1657-2009", "1657-2009 - IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries" ], "summary": "IEEE Std 1657-2009 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries”；公开目录标为已被替代（Superseded），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1657-2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5357368", "locator": "standard_number=1657-2009; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1657-2009**（IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2009 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1657-2009.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_1657_2018_8697214_redline", "type": "work", "title": "IEEE Std 1657-2018", "slug": "ieee-std-1657-2018-8697214-redline", "aliases": [ "1657-2018", "1657-2018 - IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries - Redline" ], "summary": "IEEE Std 1657-2018 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2018 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1657-2018 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8697214", "locator": "standard_number=1657-2018; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1657-2018**（IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2018 年，主题领域包括 Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1657-2018-8697214-redline.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2018, "precision": "year", "display": "2018年" }, "language": "英语" }, { "id": "work_ieee_1657a_2015", "type": "work", "title": "IEEE Std 1657a-2015", "slug": "ieee-std-1657a-2015", "aliases": [ "1657a-2015", "1657a-2015 - IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries - Amendment 1: Updated Safety Sections" ], "summary": "IEEE Std 1657a-2015 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries - Amendment 1: Updated Safety Sections”；公开目录标为已被替代（Superseded），著录年份为 2015 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1657a-2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7286924", "locator": "standard_number=1657a-2015; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1657a-2015**（IEEE Recommended Practice for Personnel Qualifications for Installation and Maintenance of Stationary Batteries - Amendment 1: Updated Safety Sections）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2015 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1657a-2015.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2015, "precision": "year", "display": "2015年" }, "language": "英语" }, { "id": "work_ieee_1658_2011", "type": "work", "title": "IEEE Std 1658-2011", "slug": "ieee-std-1658-2011", "aliases": [ "1658-2011", "1658-2011 - IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices" ], "summary": "IEEE Std 1658-2011 是电气电子工程师学会的技术标准，题为“IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1658-2011 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6152111", "locator": "standard_number=1658-2011; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1658-2011**（IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2012 年，主题领域包括 Power, Energy and Industry Applications、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1658-2011.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_1660_2008", "type": "work", "title": "IEEE Std 1660-2008", "slug": "ieee-std-1660-2008", "aliases": [ "1660-2008", "1660-2008 - IEEE Guide for Application and Management of Stationary Batteries Used in Cycling Service" ], "summary": "IEEE Std 1660-2008 是电气电子工程师学会的技术标准，题为“IEEE Guide for Application and Management of Stationary Batteries Used in Cycling Service”；公开目录标为已被替代（Superseded），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1660-2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4690896", "locator": "standard_number=1660-2008; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1660-2008**（IEEE Guide for Application and Management of Stationary Batteries Used in Cycling Service）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1660-2008.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_1661_2007", "type": "work", "title": "IEEE Std 1661-2007", "slug": "ieee-std-1661-2007", "aliases": [ "1661-2007", "1661-2007 - IEEE Guide for Test and Evaluation of Lead-Acid Batteries Used in Photovoltaic (PV) Hybrid Power Systems" ], "summary": "IEEE Std 1661-2007 是电气电子工程师学会的技术标准，题为“IEEE Guide for Test and Evaluation of Lead-Acid Batteries Used in Photovoltaic (PV) Hybrid Power Systems”；公开目录标为已被替代（Superseded），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1661-2007 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4449090", "locator": "standard_number=1661-2007; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:32+08:00", "updatedAt": "2026-11-01T21:59:32+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1661-2007**（IEEE Guide for Test and Evaluation of Lead-Acid Batteries Used in Photovoltaic (PV) Hybrid Power Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1661-2007.html", "lang": "th", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" } ], "lang": "th", "pagination": { "page": 168, "pageSize": 50, "total": 50001, "pageCount": 1000, "prevUrl": "/th/search-167.json", "nextUrl": "/th/search-169.json" } }