IEEE Std 63003-2015
URL: https://knowledge.ivjn.us/th/works/ieee-std-63003-2015.html

IEEE Std 63003-2015 是电气电子工程师学会的技术标准，题为“IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2015 年。

**IEEE Std 63003-2015**（IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)）是[电气电子工程师学会](https://knowledge.ivjn.us/th/organizations/ieee.html)的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[IEEE 标准](https://knowledge.ivjn.us/th/concepts/ieee-standards.html)。

Updated: 2026-11-01

Tags:
- IEEE standard https://knowledge.ivjn.us/th/tags/ieee-standard.html

Relations:
- Published by: 电气电子工程师学会 https://knowledge.ivjn.us/th/organizations/ieee.html
- About: IEEE 标准 https://knowledge.ivjn.us/th/concepts/ieee-standards.html

Sources:
- IEEE Std 63003-2015 — IEEE Xplore 题录 https://ieeexplore.ieee.org/servlet/opac?punumber=7358450 standard_number=63003-2015; status=Active; modifier=Approved
- IEEE Xplore All Standards（KBART） https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt