<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>IEEE 标准 · İlişkiler</title>
  <description>IEEE 标准是电气电子工程师学会发布的技术标准文献集合，涵盖通信、电力、计算与电磁兼容等领域；公开目录以 KBART 列表提供编号、题名、状态与 IEEE Xplore 题录链接。</description>
  <url>/tr/concepts/ieee-standards/relation-63.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>concept_ieee_standards</id>
    <type>concept</type>
    <title>IEEE 标准</title>
    <slug>ieee-standards</slug>
    <aliases>
      <alias>IEEE Standards</alias>
      <alias>IEEE Std</alias>
      <alias>电气电子工程师学会标准</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>IEEE 标准是电气电子工程师学会发布的技术标准文献集合，涵盖通信、电力、计算与电磁兼容等领域；公开目录以 KBART 列表提供编号、题名、状态与 IEEE Xplore 题录链接。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        <locator>2026-11-01 下载</locator>
      </source>
      <source>
        <id>s2</id>
        <title>KBART Title Lists</title>
        <author>IEEE Xplore Help</author>
        <url>https://ieeexplore.ieee.org/Xplorehelp/discovery-services/kbart-title-lists</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Standards Association / standards.ieee.org</title>
        <author>IEEE</author>
        <url>https://standards.ieee.org/</url>
      </source>
      <source>
        <id>s4</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:58+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:58+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**IEEE 标准**是[[organization_ieee|电气电子工程师学会]]（IEEE）通过其标准化活动发布的技术标准文献[^s3][^s4]。&#xA;&#xA;## 定义与范围&#xA;&#xA;公开机读目录「IEEE Xplore All Standards」以 KBART 格式列出标准编号、题名、出版年份、状态（如 Active、Superseded、Inactive）及 IEEE Xplore 题录链接等元数据，不提供付费全文[^s1][^s2]。本知识库按该目录逐条建立标准词条（work，workKind=standard），每条保留官方目录出处。&#xA;&#xA;## 沿革&#xA;&#xA;IEEE 由 AIEE 与 IRE 于1963年合并成立后继续并扩展标准制定；现行与历史版本均出现在 Xplore 标准集合中[^s4][^s1]。&#xA;&#xA;## 相关概念&#xA;&#xA;词条之间以发布机构、主题关系连接；同一标准号的多年版本各自成条或在正文互相链接，以便维护。</body>
    <url>/concepts/ieee-standards.html</url>
    <lang>tr</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <conceptKind>theme</conceptKind>
    <scopeNote>本条为总览；各标准号以独立 work 词条著录，勿仅在本条列表省略。</scopeNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_9bc1adc003573283fca8964b</id>
      <fromId>work_ieee_st_430_4_2008_am1_2011</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_430_4_2008_am1_2011</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_430_4_2008_am1_2011</targetId>
      <targetTitle>IEEE Std ST 430-4:2008 Am1:2011</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-430-4-2008-am1-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_692f34000d055b69b8638c9e</id>
      <fromId>work_ieee_st_430_5_2023</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_430_5_2023</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_430_5_2023</targetId>
      <targetTitle>IEEE Std ST 430-5:2023</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-430-5-2023.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c2cab28ad4bb09e59d9aebbb</id>
      <fromId>work_ieee_st_430_6_2010</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_430_6_2010</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_430_6_2010</targetId>
      <targetTitle>IEEE Std ST 430-6:2010</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-430-6-2010.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_68005481e221d8398730cc93</id>
      <fromId>work_ieee_st_430_9_2008</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_430_9_2008</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_430_9_2008</targetId>
      <targetTitle>IEEE Std ST 430-9:2008</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-430-9-2008.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_40cbd59efdd5d6f9ce6ed613</id>
      <fromId>work_ieee_st_430_9_2008_am1_2011</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_430_9_2008_am1_2011</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_430_9_2008_am1_2011</targetId>
      <targetTitle>IEEE Std ST 430-9:2008 Am1:2011</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-430-9-2008-am1-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f94237bde897c4f375049708</id>
      <fromId>work_ieee_st_431_1_2006</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_431_1_2006</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_431_1_2006</targetId>
      <targetTitle>IEEE Std ST 431-1:2006</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-431-1-2006.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6b900132e376f51275753ec6</id>
      <fromId>work_ieee_st_433_2008</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_433_2008</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_433_2008</targetId>
      <targetTitle>IEEE Std ST 433:2008</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-433-2008.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c37e7d0305202834c31e4175</id>
      <fromId>work_ieee_st_433_2008_am1_2011</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_433_2008_am1_2011</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_433_2008_am1_2011</targetId>
      <targetTitle>IEEE Std ST 433:2008 Am1:2011</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-433-2008-am1-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8ac4a8a496a0d286a147d9c2</id>
      <fromId>work_ieee_st_434_2014</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_434_2014</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_434_2014</targetId>
      <targetTitle>IEEE Std ST 434:2014</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-434-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_86c45f1bcf4954629730424e</id>
      <fromId>work_ieee_st_435_1_2012</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_435_1_2012</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_435_1_2012</targetId>
      <targetTitle>IEEE Std ST 435-1:2012</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-435-1-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_757b719e5a35d6e8ee18e025</id>
      <fromId>work_ieee_st_435_2_2012</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_435_2_2012</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_435_2_2012</targetId>
      <targetTitle>IEEE Std ST 435-2:2012</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-435-2-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b23a8d8bdcdbadcb36bd1476</id>
      <fromId>work_ieee_st_435_3_2012</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_435_3_2012</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_435_3_2012</targetId>
      <targetTitle>IEEE Std ST 435-3:2012</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-435-3-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0ed5286a0fd060174cae35b2</id>
      <fromId>work_ieee_st_436_1_2013</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_436_1_2013</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_436_1_2013</targetId>
      <targetTitle>IEEE Std ST 436-1:2013</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-436-1-2013.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_48452a672344e09fa37cca64</id>
      <fromId>work_ieee_st_48_1995</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_48_1995</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_48_1995</targetId>
      <targetTitle>IEEE Std ST 48:1995</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-48-1995.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_aabf34158ecda59a91ccfb28</id>
      <fromId>work_ieee_st_4_1995</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_4_1995</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_4_1995</targetId>
      <targetTitle>IEEE Std ST 4:1995</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-4-1995.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3627d2aa6b3994f94bd49397</id>
      <fromId>work_ieee_st_55_2011</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_55_2011</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_55_2011</targetId>
      <targetTitle>IEEE Std ST 55:2011</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-55-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_83e2af515a1f0d075101ca00</id>
      <fromId>work_ieee_st_56_2005</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_56_2005</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_56_2005</targetId>
      <targetTitle>IEEE Std ST 56:2005</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-56-2005.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_36bf7e2a7af51344f5ced6d9</id>
      <fromId>work_ieee_st_59_1998</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_59_1998</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_59_1998</targetId>
      <targetTitle>IEEE Std ST 59:1998</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-59-1998.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_20315bf9a2eb13b0ec8680fd</id>
      <fromId>work_ieee_st_5_1995</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_5_1995</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_5_1995</targetId>
      <targetTitle>IEEE Std ST 5:1995</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-5-1995.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_12c01b69bc868f4bfad56865</id>
      <fromId>work_ieee_st_6_1998</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_6_1998</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_6_1998</targetId>
      <targetTitle>IEEE Std ST 6:1998</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-6-1998.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_017121b61cf6a2e62c1bf441</id>
      <fromId>work_ieee_st_73_2003</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_73_2003</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_73_2003</targetId>
      <targetTitle>IEEE Std ST 73:2003</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-73-2003.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_44479d683bec762a59ee7ab0</id>
      <fromId>work_ieee_st_74_1993</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_74_1993</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_74_1993</targetId>
      <targetTitle>IEEE Std ST 74:1993</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-74-1993.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_755dd8ad06fd1758a7ce4814</id>
      <fromId>work_ieee_st_75_1994</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_75_1994</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_75_1994</targetId>
      <targetTitle>IEEE Std ST 75:1994</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-75-1994.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d11e6e329c9fbf35d4e1a571</id>
      <fromId>work_ieee_st_76_1996</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_76_1996</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_76_1996</targetId>
      <targetTitle>IEEE Std ST 76:1996</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-76-1996.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b724c0b2923b98f28b7743fd</id>
      <fromId>work_ieee_st_7_2004</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_7_2004</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_7_2004</targetId>
      <targetTitle>IEEE Std ST 7:2004</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-7-2004.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_95e2e28497a70c258f53deaf</id>
      <fromId>work_ieee_st_83_1996</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_83_1996</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_83_1996</targetId>
      <targetTitle>IEEE Std ST 83:1996</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-83-1996.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ddd75a47156e2a755fce6387</id>
      <fromId>work_ieee_st_86_2005</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_86_2005</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_86_2005</targetId>
      <targetTitle>IEEE Std ST 86:2005</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-86-2005.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_0ffc120b2a298fb079a369fd</id>
      <fromId>work_ieee_st_87_1996</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_87_1996</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_87_1996</targetId>
      <targetTitle>IEEE Std ST 87:1996</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-87-1996.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b734d8fdafe1df418bd10b27</id>
      <fromId>work_ieee_st_8_1995</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_8_1995</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_8_1995</targetId>
      <targetTitle>IEEE Std ST 8:1995</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-8-1995.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_500fa1516ca09052f1f453f1</id>
      <fromId>work_ieee_st_93_2005</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_93_2005</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_93_2005</targetId>
      <targetTitle>IEEE Std ST 93:2005</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-93-2005.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e649566c081cedacf72a752e</id>
      <fromId>work_ieee_st_96_2004</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_96_2004</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_96_2004</targetId>
      <targetTitle>IEEE Std ST 96:2004</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-96-2004.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f5f4e6e01b7815c9baee14d8</id>
      <fromId>work_ieee_st_97_2004</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st_97_2004</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st_97_2004</targetId>
      <targetTitle>IEEE Std ST 97:2004</targetTitle>
      <targetUrl>/tr/works/ieee-std-st-97-2004.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4c814ce16e106f735fc428b3</id>
      <fromId>work_ieee_st2036_3_2012_am1_2015</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st2036_3_2012_am1_2015</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st2036_3_2012_am1_2015</targetId>
      <targetTitle>IEEE Std ST2036-3:2012 Am1:2015</targetTitle>
      <targetUrl>/tr/works/ieee-std-st2036-3-2012-am1-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1ff4ca16f94cdc23811136a1</id>
      <fromId>work_ieee_st2112_10_2020</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_st2112_10_2020</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_st2112_10_2020</targetId>
      <targetTitle>IEEE Std st2112-10-2020</targetTitle>
      <targetUrl>/tr/works/ieee-std-st2112-10-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1261a91c03e113bb40108bc6</id>
      <fromId>work_ieee_test_suite_specification</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_test_suite_specification</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_test_suite_specification</targetId>
      <targetTitle>IEEE Std Test Suite Specification</targetTitle>
      <targetUrl>/tr/works/ieee-std-test-suite-specification.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_e5a695c3e036545d0ab6ebf0</id>
      <fromId>work_ieee_test_suite_specification_electric_vehicles</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_test_suite_specification_electric_vehicles</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_test_suite_specification_electric_vehicles</targetId>
      <targetTitle>IEEE Std Test Suite Specification: Electric Vehicles</targetTitle>
      <targetUrl>/tr/works/ieee-std-test-suite-specification-electric-vehicles.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_4f674d6bf6299483b94ff373</id>
      <fromId>work_ieee_test_suite_specification_synchrophasor_8765654</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_test_suite_specification_synchrophasor_8765654</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_test_suite_specification_synchrophasor_8765654</targetId>
      <targetTitle>IEEE Std Test Suite Specification: Synchrophasor</targetTitle>
      <targetUrl>/tr/works/ieee-std-test-suite-specification-synchrophasor-8765654.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_44529987aceedde4f2c8bcd7</id>
      <fromId>work_ieee_white_paper_10028719</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_white_paper_10028719</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_white_paper_10028719</targetId>
      <targetTitle>IEEE Std White Paper</targetTitle>
      <targetUrl>/tr/works/ieee-std-white-paper-10028719.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_fe151944e53dced0595c7321</id>
      <fromId>work_ieee_white_paper_9398620</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_white_paper_9398620</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_white_paper_9398620</targetId>
      <targetTitle>IEEE Std White Paper</targetTitle>
      <targetUrl>/tr/works/ieee-std-white-paper-9398620.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7678b42b06c0dc3f1b01cc21</id>
      <fromId>work_ieee_white_paper_10707137</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_white_paper_10707137</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_white_paper_10707137</targetId>
      <targetTitle>IEEE Std White paper</targetTitle>
      <targetUrl>/tr/works/ieee-std-white-paper-10707137.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3d88cb991bacb2096ddbaf5d</id>
      <fromId>work_ieee_white_paper_9468430</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_white_paper_9468430</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_white_paper_9468430</targetId>
      <targetTitle>IEEE Std White Paper</targetTitle>
      <targetUrl>/tr/works/ieee-std-white-paper-9468430.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f0a465341ac5d910d163aed4</id>
      <fromId>work_ieee_white_paper_10251108</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_white_paper_10251108</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_white_paper_10251108</targetId>
      <targetTitle>IEEE Std White Paper</targetTitle>
      <targetUrl>/tr/works/ieee-std-white-paper-10251108.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c538571b6253f536118780a6</id>
      <fromId>work_ieee_white_paper_10630695</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_white_paper_10630695</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_white_paper_10630695</targetId>
      <targetTitle>IEEE Std White Paper</targetTitle>
      <targetUrl>/tr/works/ieee-std-white-paper-10630695.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d344592bc0b7e8efbd0b7b21</id>
      <fromId>work_ieee_white_paper_10298052</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_white_paper_10298052</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_white_paper_10298052</targetId>
      <targetTitle>IEEE Std White Paper</targetTitle>
      <targetUrl>/tr/works/ieee-std-white-paper-10298052.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ee0552da404c703c97e2f8e0</id>
      <fromId>work_ieee_white_paper_11179921</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_white_paper_11179921</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_white_paper_11179921</targetId>
      <targetTitle>IEEE Std White Paper</targetTitle>
      <targetUrl>/tr/works/ieee-std-white-paper-11179921.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b7654e624913c3a59d81bfdf</id>
      <fromId>work_ieee_white_paper_10319430</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_white_paper_10319430</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_white_paper_10319430</targetId>
      <targetTitle>IEEE Std White Paper</targetTitle>
      <targetUrl>/tr/works/ieee-std-white-paper-10319430.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_950be64161e07b2dd14d61d2</id>
      <fromId>work_ieee_white_paper_11204739</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_white_paper_11204739</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_white_paper_11204739</targetId>
      <targetTitle>IEEE Std White Paper</targetTitle>
      <targetUrl>/tr/works/ieee-std-white-paper-11204739.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_740eecbd1a9d693fddaac345</id>
      <fromId>work_ieee_white_paper_11627218</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_white_paper_11627218</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_white_paper_11627218</targetId>
      <targetTitle>IEEE Std White Paper</targetTitle>
      <targetUrl>/tr/works/ieee-std-white-paper-11627218.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_fb3329ad56a96f89e6f0c83d</id>
      <fromId>work_ieee_white_paper_8305684</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_white_paper_8305684</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_white_paper_8305684</targetId>
      <targetTitle>IEEE Std White Paper</targetTitle>
      <targetUrl>/tr/works/ieee-std-white-paper-8305684.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_1f9074474c66c881d89ea320</id>
      <fromId>work_ieee_white_paper_10496565</fromId>
      <relationType>about</relationType>
      <toId>concept_ieee_standards</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_white_paper_10496565</entityId>
          <sourceId>s2</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Discusses this topic</label>
      <targetId>work_ieee_white_paper_10496565</targetId>
      <targetTitle>IEEE Std White Paper</targetTitle>
      <targetUrl>/tr/works/ieee-std-white-paper-10496565.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/tr/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/tr/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/tr/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/tr/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/tr/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/tr/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/tr/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/tr/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/tr/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_1_1988</fromId>
      <fromTitle>IEEE Std 1003.1-1988</fromTitle>
      <fromUrl>/tr/works/ieee-std-1003-1-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>tr</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>concept_kind</key>
      <label>Concept kind</label>
      <value>Tema</value>
    </field>
    <field>
      <key>aliases</key>
      <label>Aliases</label>
      <value>IEEE Standards, IEEE Std, 电气电子工程师学会标准</value>
    </field>
    <field>
      <key>scope_note</key>
      <label>Scope note</label>
      <value>本条为总览；各标准号以独立 work 词条著录，勿仅在本条列表省略。</value>
    </field>
  </infoFields>
  <pagination>
    <page>63</page>
    <pageSize>50</pageSize>
    <total>8263</total>
    <pageCount>166</pageCount>
    <prevUrl>/tr/concepts/ieee-standards/relation-62.xml</prevUrl>
    <nextUrl>/tr/concepts/ieee-standards/relation-64.xml</nextUrl>
  </pagination>
  <relationsTotal>8263</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8278</mentionsTotal>
  <mentionsUrl>/tr/concepts/ieee-standards/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>