<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>电气电子工程师学会 · İlişkiler</title>
  <description>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</description>
  <url>/tr/organizations/ieee/relation-93.html</url>
  <entity>
    <perspectives></perspectives>
    <customFields></customFields>
    <rankingTiers></rankingTiers>
    <rankingColumns></rankingColumns>
    <rankingEntries></rankingEntries>
    <id>organization_ieee</id>
    <type>organization</type>
    <title>电气电子工程师学会</title>
    <slug>ieee</slug>
    <aliases>
      <alias>IEEE</alias>
      <alias>Institute of Electrical and Electronics Engineers</alias>
      <alias>电气和电子工程师协会</alias>
    </aliases>
    <previousSlugs></previousSlugs>
    <summary>电气电子工程师学会（IEEE）是1963年由美国电气工程师学会与无线电工程师学会合并成立的专业技术协会，总部位于纽约，从事电气、电子及相关领域的标准制定、会议与学术出版。</summary>
    <status>published</status>
    <categories>
      <category>category-science-technology</category>
    </categories>
    <tags>
      <tag>tag-ieee-standard</tag>
      <tag>tag-publishing</tag>
    </tags>
    <sources>
      <source>
        <id>s1</id>
        <title>Institute of Electrical and Electronics Engineers</title>
        <author>Wikipedia</author>
        <url>https://en.wikipedia.org/wiki/Institute_of_Electrical_and_Electronics_Engineers</url>
        <locator>2026-11-01 访问</locator>
      </source>
      <source>
        <id>s2</id>
        <title>IEEE 官方网站</title>
        <author>IEEE</author>
        <url>https://www.ieee.org/</url>
      </source>
      <source>
        <id>s3</id>
        <title>IEEE Xplore All Standards（KBART）</title>
        <author>IEEE</author>
        <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
      </source>
    </sources>
    <createdAt>2026-11-01T21:05:52+08:00</createdAt>
    <updatedAt>2026-11-01T21:05:52+08:00</updatedAt>
    <updatedBy>user:admin</updatedBy>
    <revision>1</revision>
    <body>**电气电子工程师学会**（Institute of Electrical and Electronics Engineers，简称 IEEE）是1963年1月1日由美国电气工程师学会（AIEE）与无线电工程师学会（IRE）合并成立的专业技术协会，面向电气工程、电子工程及相关学科[^s1]。&#xA;&#xA;## 沿革&#xA;&#xA;该会可追溯至1884年成立的 AIEE；1912年另成立 IRE。两会于1963年合并为 IEEE[^s1]。总会设在纽约，1975年起主要业务在新泽西州皮斯卡特维的运营中心开展[^s1]。&#xA;&#xA;## 职能与业务&#xA;&#xA;IEEE 发布同行评议期刊与会议录，并通过标准化委员会制定技术标准；相关内容可在 IEEE Xplore 平台检索[^s1][^s3]。标准公开目录（KBART）列出标准编号、题名、状态与题录链接等元数据[^s3]。&#xA;&#xA;## 现状&#xA;&#xA;据公开介绍，该会为美国 501(c)(3) 公益性专业协会，全球会员逾48.6万[^s1]。官网为 https://www.ieee.org/ [^s2]。</body>
    <url>/organizations/ieee.html</url>
    <lang>tr</lang>
    <fallback>true</fallback>
    <availableLangs>
      <lang>zh</lang>
    </availableLangs>
    <occupations></occupations>
    <orgKind>专业协会</orgKind>
    <founded>
      <year>1963</year>
      <month>1</month>
      <day>1</day>
      <precision>day</precision>
      <display>1963年1月1日</display>
    </founded>
    <orgStatus>active</orgStatus>
    <headquartersNote>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</headquartersNote>
    <creators></creators>
    <relatedTerms></relatedTerms>
  </entity>
  <entities></entities>
  <tags></tags>
  <categories></categories>
  <relations>
    <relation>
      <id>relation_api_bc9ce25299abf2efba6f0db9</id>
      <fromId>work_ieee_1673_2015_7426673</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1673_2015_7426673</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1673_2015_7426673</targetId>
      <targetTitle>IEEE Std 1673-2015</targetTitle>
      <targetUrl>/tr/works/ieee-std-1673-2015-7426673.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_b26594dec7f9dddb04e5d90f</id>
      <fromId>work_ieee_1675_2008</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1675_2008</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1675_2008</targetId>
      <targetTitle>IEEE Std 1675-2008</targetTitle>
      <targetUrl>/tr/works/ieee-std-1675-2008.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9e025f11fee2db17d785e036</id>
      <fromId>work_ieee_1676_2010</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1676_2010</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1676_2010</targetId>
      <targetTitle>IEEE Std 1676-2010</targetTitle>
      <targetUrl>/tr/works/ieee-std-1676-2010.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_fd81775295880774883232de</id>
      <fromId>work_ieee_1679_2010</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1679_2010</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1679_2010</targetId>
      <targetTitle>IEEE Std 1679-2010</targetTitle>
      <targetUrl>/tr/works/ieee-std-1679-2010.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3d7eb285d0c3bd875a4f5971</id>
      <fromId>work_ieee_1679_2020_9080673_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1679_2020_9080673_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1679_2020_9080673_redline</targetId>
      <targetTitle>IEEE Std 1679-2020</targetTitle>
      <targetUrl>/tr/works/ieee-std-1679-2020-9080673-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6fcf41148c49b9e210dc3928</id>
      <fromId>work_ieee_1679_3_2025_10763411</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1679_3_2025_10763411</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1679_3_2025_10763411</targetId>
      <targetTitle>IEEE Std 1679.3-2025</targetTitle>
      <targetUrl>/tr/works/ieee-std-1679-3-2025-10763411.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_75d386a17fef06870aae920c</id>
      <fromId>work_ieee_167a_1975</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_167a_1975</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_167a_1975</targetId>
      <targetTitle>IEEE Std 167A-1975</targetTitle>
      <targetUrl>/tr/works/ieee-std-167a-1975.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_fc6c0c894117b2a8c9cf2936</id>
      <fromId>work_ieee_p1775_1_9_7_mar_2009</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1775_1_9_7_mar_2009</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1775_1_9_7_mar_2009</targetId>
      <targetTitle>IEEE Std P1775/1.9.7, Mar 2009</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1775-1-9-7-mar-2009.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c2ac28c031aa5fd735bc1c19</id>
      <fromId>work_ieee_167a_1980</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_167a_1980</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_167a_1980</targetId>
      <targetTitle>IEEE Std 167A-1980</targetTitle>
      <targetUrl>/tr/works/ieee-std-167a-1980.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7e5a4149befeb8036cd7e9c5</id>
      <fromId>work_ieee_p1775_d1_9_8_dec_2009</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1775_d1_9_8_dec_2009</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1775_d1_9_8_dec_2009</targetId>
      <targetTitle>IEEE Std P1775/D1.9.8, Dec 2009</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1775-d1-9-8-dec-2009.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c5bd5231c3ee5523e67a8bb3</id>
      <fromId>work_ieee_167a_1987</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_167a_1987</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_167a_1987</targetId>
      <targetTitle>IEEE Std 167A-1987</targetTitle>
      <targetUrl>/tr/works/ieee-std-167a-1987.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3eab830c4bc4bb9c241d4830</id>
      <fromId>work_ieee_p1776_d12_jun_2008</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1776_d12_jun_2008</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1776_d12_jun_2008</targetId>
      <targetTitle>IEEE Std P1776/D12, Jun 2008</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1776-d12-jun-2008.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ad0a17922a8fe6ed499d66db</id>
      <fromId>work_ieee_167a_1_1995</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_167a_1_1995</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_167a_1_1995</targetId>
      <targetTitle>IEEE Std 167A.1-1995</targetTitle>
      <targetUrl>/tr/works/ieee-std-167a-1-1995.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_05ff106daeb30b5cd897997c</id>
      <fromId>work_ieee_p1776_d9b_feb_2008</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1776_d9b_feb_2008</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1776_d9b_feb_2008</targetId>
      <targetTitle>IEEE Std P1776/D9b, Feb. 2008</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1776-d9b-feb-2008.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3fb121cf991131c376c3f070</id>
      <fromId>work_ieee_167a_2_1996</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_167a_2_1996</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_167a_2_1996</targetId>
      <targetTitle>IEEE Std 167A.2-1996</targetTitle>
      <targetUrl>/tr/works/ieee-std-167a-2-1996.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c7a636089f2284b0d86208c1</id>
      <fromId>work_ieee_p1776_d08_dec_2007</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1776_d08_dec_2007</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1776_d08_dec_2007</targetId>
      <targetTitle>IEEE Std P1776_D08, Dec 2007</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1776-d08-dec-2007.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c9fdb0b199b2277f111a19c3</id>
      <fromId>work_ieee_168_1956</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_168_1956</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_168_1956</targetId>
      <targetTitle>IEEE Std 168-1956</targetTitle>
      <targetUrl>/tr/works/ieee-std-168-1956.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8ca883a970bacbcb4a56a957</id>
      <fromId>work_ieee_p1780_d29_oct_2020</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1780_d29_oct_2020</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1780_d29_oct_2020</targetId>
      <targetTitle>IEEE Std P1780/D29, Oct 2020</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1780-d29-oct-2020.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_ddf72b045a145d5aa035dd23</id>
      <fromId>work_ieee_1680_2006</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1680_2006</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1680_2006</targetId>
      <targetTitle>IEEE Std 1680-2006</targetTitle>
      <targetUrl>/tr/works/ieee-std-1680-2006.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_cb63086e2fc9c3ad3419b983</id>
      <fromId>work_ieee_p1780_d30_oct_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1780_d30_oct_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1780_d30_oct_2021</targetId>
      <targetTitle>IEEE Std P1780/D30, Oct 2021</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1780-d30-oct-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3db833e2e521272e81021d77</id>
      <fromId>work_ieee_p1782_d002_mar_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1782_d002_mar_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1782_d002_mar_2022</targetId>
      <targetTitle>IEEE Std P1782/D002, Mar 2022</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1782-d002-mar-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_565b5ff786c96ea48693d431</id>
      <fromId>work_ieee_1680_2009_5429923</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1680_2009_5429923</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1680_2009_5429923</targetId>
      <targetTitle>IEEE Std 1680-2009</targetTitle>
      <targetUrl>/tr/works/ieee-std-1680-2009-5429923.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6dd27e0f1e580235a9cf019c</id>
      <fromId>work_ieee_p1782_d1_jan_2022</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1782_d1_jan_2022</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1782_d1_jan_2022</targetId>
      <targetTitle>IEEE Std P1782/D1, Jan 2022</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1782-d1-jan-2022.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_21a6477a05a0cb25445aa750</id>
      <fromId>work_ieee_p1782_d4_nov_2012</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1782_d4_nov_2012</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1782_d4_nov_2012</targetId>
      <targetTitle>IEEE Std P1782/D4, Nov 2012</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1782-d4-nov-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d311bd409c43d02f3fe49bfb</id>
      <fromId>work_ieee_p1782_d5_july_2013</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1782_d5_july_2013</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1782_d5_july_2013</targetId>
      <targetTitle>IEEE Std P1782/D5, July 2013</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1782-d5-july-2013.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_5ccd7fd3e60f2653e723d7fc</id>
      <fromId>work_ieee_p1783_d2_1_dec_2008</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1783_d2_1_dec_2008</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1783_d2_1_dec_2008</targetId>
      <targetTitle>IEEE Std P1783/D2.1 Dec 2008</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1783-d2-1-dec-2008.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_40414c7bd07dd7942ff8a730</id>
      <fromId>work_ieee_p1783_d3_apr_2009</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1783_d3_apr_2009</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1783_d3_apr_2009</targetId>
      <targetTitle>IEEE Std P1783/D3, Apr 2009</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1783-d3-apr-2009.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_483c240a3538fabe09c44e5b</id>
      <fromId>work_ieee_p1785_1_d1_aug_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1785_1_d1_aug_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1785_1_d1_aug_2025</targetId>
      <targetTitle>IEEE Std P1785.1/D1, Aug 2025</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1785-1-d1-aug-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_dd6c0d2422f48e0430998183</id>
      <fromId>work_ieee_p1785_1_d2_oct_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1785_1_d2_oct_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1785_1_d2_oct_2025</targetId>
      <targetTitle>IEEE Std P1785.1/D2, Oct 2025</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1785-1-d2-oct-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_cb58502267bcfc55ed7662f6</id>
      <fromId>work_ieee_p1785_1_d3_july_2012</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1785_1_d3_july_2012</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1785_1_d3_july_2012</targetId>
      <targetTitle>IEEE Std P1785.1/D3, July 2012</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1785-1-d3-july-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_efae82884a009c916cd2c132</id>
      <fromId>work_ieee_p1785_2_d2a_jul_2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1785_2_d2a_jul_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1785_2_d2a_jul_2015</targetId>
      <targetTitle>IEEE Std P1785.2/D2a, Jul 2015</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1785-2-d2a-jul-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_bbe5b70eaa0e10cd64585176</id>
      <fromId>work_ieee_p1785_3_d31_jun_2014</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1785_3_d31_jun_2014</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1785_3_d31_jun_2014</targetId>
      <targetTitle>IEEE Std P1785.3/D31, Jun 2014</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1785-3-d31-jun-2014.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_af4154811369f41ee17ad043</id>
      <fromId>work_ieee_p1785_3_d33_sept_2015</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1785_3_d33_sept_2015</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1785_3_d33_sept_2015</targetId>
      <targetTitle>IEEE Std P1785.3/D33, Sept. 2015</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1785-3-d33-sept-2015.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_9730bc4360b75c10e610d383</id>
      <fromId>work_ieee_p1786</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1786</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1786</targetId>
      <targetTitle>IEEE Std P1786</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1786.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_31651027fd60fb4d27873d42</id>
      <fromId>work_ieee_p1786_d1_sept_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1786_d1_sept_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1786_d1_sept_2025</targetId>
      <targetTitle>IEEE Std P1786/D1, Sept 2025</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1786-d1-sept-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_35b51060487808ca9835ac44</id>
      <fromId>work_ieee_p1786_d11_apr_2011</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1786_d11_apr_2011</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1786_d11_apr_2011</targetId>
      <targetTitle>IEEE Std P1786/D11, Apr 2011</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1786-d11-apr-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_7ea11437e8c4722302585a32</id>
      <fromId>work_ieee_p1786_d2_nov_2021</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1786_d2_nov_2021</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1786_d2_nov_2021</targetId>
      <targetTitle>IEEE Std P1786/D2, Nov 2021</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1786-d2-nov-2021.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_368002632ab5a403ba826d49</id>
      <fromId>work_ieee_p1786_d2_nov_2025</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1786_d2_nov_2025</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1786_d2_nov_2025</targetId>
      <targetTitle>IEEE Std P1786/D2, Nov 2025</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1786-d2-nov-2025.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6862565e53e5d4b820c059d0</id>
      <fromId>work_ieee_p1788_1_d9_9_jun_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_p1788_1_d9_9_jun_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_p1788_1_d9_9_jun_2017</targetId>
      <targetTitle>IEEE Std P1788.1/D9.9, Jun 2017</targetTitle>
      <targetUrl>/tr/works/ieee-std-p1788-1-d9-9-jun-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_8dfae9311ac3034e1aeae9b8</id>
      <fromId>work_ieee_1680_2009_5953418</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1680_2009_5953418</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1680_2009_5953418</targetId>
      <targetTitle>IEEE Std 1680-2009</targetTitle>
      <targetUrl>/tr/works/ieee-std-1680-2009-5953418.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_89ca1301e5764d57fdb1a6cc</id>
      <fromId>work_ieee_1680_1_2009</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1680_1_2009</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1680_1_2009</targetId>
      <targetTitle>IEEE Std 1680.1-2009</targetTitle>
      <targetUrl>/tr/works/ieee-std-1680-1-2009.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_fdc7495b01443c9f6759221a</id>
      <fromId>work_ieee_1680_1_2018_8697199_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1680_1_2018_8697199_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1680_1_2018_8697199_redline</targetId>
      <targetTitle>IEEE Std 1680.1-2018</targetTitle>
      <targetUrl>/tr/works/ieee-std-1680-1-2018-8697199-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_c2465e65c0f85188f077c320</id>
      <fromId>work_ieee_1680_2_2012</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1680_2_2012</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1680_2_2012</targetId>
      <targetTitle>IEEE Std 1680.2-2012</targetTitle>
      <targetUrl>/tr/works/ieee-std-1680-2-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_6a4d6e1a2643f61c82f82822</id>
      <fromId>work_ieee_1680_2_2024_11051169_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1680_2_2024_11051169_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1680_2_2024_11051169_redline</targetId>
      <targetTitle>IEEE Std 1680.2-2024</targetTitle>
      <targetUrl>/tr/works/ieee-std-1680-2-2024-11051169-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_3c6f76da4981fc9440fdc565</id>
      <fromId>work_ieee_1680_2a_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1680_2a_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1680_2a_2017</targetId>
      <targetTitle>IEEE Std 1680.2a-2017</targetTitle>
      <targetUrl>/tr/works/ieee-std-1680-2a-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_2a99e5d6118c21fcd1670ba8</id>
      <fromId>work_ieee_1680_3_2012</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1680_3_2012</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1680_3_2012</targetId>
      <targetTitle>IEEE Std 1680.3-2012</targetTitle>
      <targetUrl>/tr/works/ieee-std-1680-3-2012.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_f97674a5b8f4be34bbf4863f</id>
      <fromId>work_ieee_1680_3_2024_10945560_redline</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1680_3_2024_10945560_redline</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1680_3_2024_10945560_redline</targetId>
      <targetTitle>IEEE Std 1680.3-2024</targetTitle>
      <targetUrl>/tr/works/ieee-std-1680-3-2024-10945560-redline.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_574486354a46f05e068f20de</id>
      <fromId>work_ieee_1680_3a_2017</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1680_3a_2017</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1680_3a_2017</targetId>
      <targetTitle>IEEE Std 1680.3a-2017</targetTitle>
      <targetUrl>/tr/works/ieee-std-1680-3a-2017.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_d0748a1d5348249fc038133f</id>
      <fromId>work_ieee_1682_2011</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1682_2011</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1682_2011</targetId>
      <targetTitle>IEEE Std 1682-2011</targetTitle>
      <targetUrl>/tr/works/ieee-std-1682-2011.html</targetUrl>
      <incoming>true</incoming>
    </relation>
    <relation>
      <id>relation_api_5cd0642f4f7cba537ee594bd</id>
      <fromId>work_ieee_1682_2023_10101735</fromId>
      <relationType>published_by</relationType>
      <toId>organization_ieee</toId>
      <sourceRefs>
        <sourceRef>
          <entityId>work_ieee_1682_2023_10101735</entityId>
          <sourceId>s1</sourceId>
        </sourceRef>
      </sourceRefs>
      <label>Published works</label>
      <targetId>work_ieee_1682_2023_10101735</targetId>
      <targetTitle>IEEE Std 1682-2023</targetTitle>
      <targetUrl>/tr/works/ieee-std-1682-2023-10101735.html</targetUrl>
      <incoming>true</incoming>
    </relation>
  </relations>
  <mentions>
    <mention>
      <fromId>concept_ieee_standards</fromId>
      <fromTitle>IEEE 标准</fromTitle>
      <fromUrl>/tr/concepts/ieee-standards.html</fromUrl>
      <fromType>concept</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_2607</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/tr/works/ieee-std-1000-1987-2607.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1000_1987_9506</fromId>
      <fromTitle>IEEE Std 1000-1987</fromTitle>
      <fromUrl>/tr/works/ieee-std-1000-1987-9506.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1001_1988</fromId>
      <fromTitle>IEEE Std 1001-1988</fromTitle>
      <fromUrl>/tr/works/ieee-std-1001-1988.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1002_1987</fromId>
      <fromTitle>IEEE Std 1002-1987</fromTitle>
      <fromUrl>/tr/works/ieee-std-1002-1987.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_10038_1993</fromId>
      <fromTitle>IEEE Std 10038-1993</fromTitle>
      <fromUrl>/tr/works/ieee-std-10038-1993.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_0_1995</fromId>
      <fromTitle>IEEE Std 1003.0-1995</fromTitle>
      <fromUrl>/tr/works/ieee-std-1003-0-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_10_1995</fromId>
      <fromTitle>IEEE Std 1003.10-1995</fromTitle>
      <fromUrl>/tr/works/ieee-std-1003-10-1995.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_1998</fromId>
      <fromTitle>IEEE Std 1003.13-1998</fromTitle>
      <fromUrl>/tr/works/ieee-std-1003-13-1998.html</fromUrl>
      <fromType>work</fromType>
    </mention>
    <mention>
      <fromId>work_ieee_1003_13_2003</fromId>
      <fromTitle>IEEE Std 1003.13-2003</fromTitle>
      <fromUrl>/tr/works/ieee-std-1003-13-2003.html</fromUrl>
      <fromType>work</fromType>
    </mention>
  </mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>tr</lang>
  <availableLangs>
    <lang>zh</lang>
  </availableLangs>
  <fallback>true</fallback>
  <infoFields>
    <field>
      <key>org_kind</key>
      <label>Organization kind</label>
      <value>专业协会</value>
    </field>
    <field>
      <key>founded</key>
      <label>Founded</label>
      <value>1963年1月1日</value>
    </field>
    <field>
      <key>org_status</key>
      <label>Status</label>
      <value>Faal</value>
    </field>
    <field>
      <key>headquarters_note</key>
      <label>Headquarters</label>
      <value>美国纽约市公园大道3号；业务运营中心位于新泽西州皮斯卡特维。</value>
    </field>
  </infoFields>
  <pagination>
    <page>93</page>
    <pageSize>50</pageSize>
    <total>8265</total>
    <pageCount>166</pageCount>
    <prevUrl>/tr/organizations/ieee/relation-92.xml</prevUrl>
    <nextUrl>/tr/organizations/ieee/relation-94.xml</nextUrl>
  </pagination>
  <relationsTotal>8265</relationsTotal>
  <relationCounts></relationCounts>
  <mentionsTotal>8279</mentionsTotal>
  <mentionsUrl>/tr/organizations/ieee/relation/mentions.html</mentionsUrl>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>