{ "contentStorage": "postgres", "title": "Ara", "url": "/tr/search-273.html", "entities": [ { "id": "work_ieee_2600_1_2009", "type": "work", "title": "IEEE Std 2600.1-2009", "slug": "ieee-std-2600-1-2009", "aliases": [ "2600.1-2009", "2600.1-2009 - IEEE Standard for a Protection Profile in Operational Environment A" ], "summary": "IEEE Std 2600.1-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard for a Protection Profile in Operational Environment A”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 2600.1-2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5075669", "locator": "standard_number=2600.1-2009; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 2600.1-2009**（IEEE Standard for a Protection Profile in Operational Environment A）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2009 年，主题领域包括 General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-2600-1-2009.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_2600_2008", "type": "work", "title": "IEEE Std 2600-2008", "slug": "ieee-std-2600-2008", "aliases": [ "2600-2008", "2600-2008 - IEEE Standard for Information Technology: Hardcopy Device and System Security" ], "summary": "IEEE Std 2600-2008 是电气电子工程师学会的技术标准，题为“IEEE Standard for Information Technology: Hardcopy Device and System Security”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 2600-2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4556650", "locator": "standard_number=2600-2008; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 2600-2008**（IEEE Standard for Information Technology: Hardcopy Device and System Security）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2008 年，主题领域包括 General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-2600-2008.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_2600_2_2009", "type": "work", "title": "IEEE Std 2600.2-2009", "slug": "ieee-std-2600-2-2009", "aliases": [ "2600.2-2009", "2600.2-2009 - IEEE Standard Protection Profile for Hardcopy Devices in IEEE Std 2600-2008 Operational Environment B" ], "summary": "IEEE Std 2600.2-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard Protection Profile for Hardcopy Devices in IEEE Std 2600-2008 Operational Environment B”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2010 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 2600.2-2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5422056", "locator": "standard_number=2600.2-2009; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 2600.2-2009**（IEEE Standard Protection Profile for Hardcopy Devices in IEEE Std 2600-2008 Operational Environment B）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2010 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-2600-2-2009.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2010, "precision": "year", "display": "2010年" }, "language": "英语" }, { "id": "work_ieee_2600_3_2009", "type": "work", "title": "IEEE Std 2600.3-2009", "slug": "ieee-std-2600-3-2009", "aliases": [ "2600.3-2009", "2600.3-2009 - IEEE Standard Protection Profile for Hardcopy Devices in IEEE Std 2600-2008 Operational Environment C" ], "summary": "IEEE Std 2600.3-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard Protection Profile for Hardcopy Devices in IEEE Std 2600-2008 Operational Environment C”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2010 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 2600.3-2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5426353", "locator": "standard_number=2600.3-2009; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 2600.3-2009**（IEEE Standard Protection Profile for Hardcopy Devices in IEEE Std 2600-2008 Operational Environment C）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2010 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-2600-3-2009.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2010, "precision": "year", "display": "2010年" }, "language": "英语" }, { "id": "work_ieee_2600_4_2010", "type": "work", "title": "IEEE Std 2600.4-2010", "slug": "ieee-std-2600-4-2010", "aliases": [ "2600.4-2010", "2600.4-2010 - IEEE Standard Protection Profile for Hardcopy Devices in IEEE Std 2600(TM)-2008 Operational Environment D" ], "summary": "IEEE Std 2600.4-2010 是电气电子工程师学会的技术标准，题为“IEEE Standard Protection Profile for Hardcopy Devices in IEEE Std 2600(TM)-2008 Operational Environment D”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2010 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 2600.4-2010 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5426391", "locator": "standard_number=2600.4-2010; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 2600.4-2010**（IEEE Standard Protection Profile for Hardcopy Devices in IEEE Std 2600(TM)-2008 Operational Environment D）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2010 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-2600-4-2010.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2010, "precision": "year", "display": "2010年" }, "language": "英语" }, { "id": "work_ieee_260_1_1993", "type": "work", "title": "IEEE Std 260.1-1993", "slug": "ieee-std-260-1-1993", "aliases": [ "260.1-1993", "260.1-1993 - American National Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units)" ], "summary": "IEEE Std 260.1-1993 是电气电子工程师学会的技术标准，题为“American National Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units)”；公开目录标为已被替代（Superseded），著录年份为 1994 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 260.1-1993 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=3109", "locator": "standard_number=260.1-1993; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 260.1-1993**（American National Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1994 年，主题领域包括 General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-260-1-1993.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1994, "precision": "year", "display": "1994年" }, "language": "英语" }, { "id": "work_ieee_260_1_2004", "type": "work", "title": "IEEE Std 260.1-2004", "slug": "ieee-std-260-1-2004", "aliases": [ "260.1-2004", "260.1-2004 - IEEE Standard Letter Symbols for Units of Measurement (SI Customary Inch-Pound Units, and Certain Other Units)" ], "summary": "IEEE Std 260.1-2004 是电气电子工程师学会的技术标准，题为“IEEE Standard Letter Symbols for Units of Measurement (SI Customary Inch-Pound Units, and Certain Other Units)”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2004 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 260.1-2004 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9287", "locator": "standard_number=260.1-2004; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 260.1-2004**（IEEE Standard Letter Symbols for Units of Measurement (SI Customary Inch-Pound Units, and Certain Other Units)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2004 年，主题领域包括 General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-260-1-2004.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2004, "precision": "year", "display": "2004年" }, "language": "英语" }, { "id": "work_ieee_260_3_1993", "type": "work", "title": "IEEE Std 260.3-1993", "slug": "ieee-std-260-3-1993", "aliases": [ "260.3-1993", "260.3-1993 - American National Standard Mathematical Signs and Symbols for Use in Physical Sciences and Technology" ], "summary": "IEEE Std 260.3-1993 是电气电子工程师学会的技术标准，题为“American National Standard Mathematical Signs and Symbols for Use in Physical Sciences and Technology”；公开目录标为非现行（Inactive），已批准（Approved），著录年份为 1993 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 260.3-1993 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=2804", "locator": "standard_number=260.3-1993; status=Inactive; modifier=Approved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 260.3-1993**（American National Standard Mathematical Signs and Symbols for Use in Physical Sciences and Technology）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已批准（Approved），著录年份为 1993 年，主题领域包括 General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-260-3-1993.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1993, "precision": "year", "display": "1993年" }, "language": "英语" }, { "id": "work_ieee_260_4_1996", "type": "work", "title": "IEEE Std 260.4-1996", "slug": "ieee-std-260-4-1996", "aliases": [ "260.4-1996", "260.4-1996 - American National Standard Letter Symbols and Abbreviations for Quantities Used in Acoustics" ], "summary": "IEEE Std 260.4-1996 是电气电子工程师学会的技术标准，题为“American National Standard Letter Symbols and Abbreviations for Quantities Used in Acoustics”；公开目录标为已被替代（Superseded），著录年份为 1995 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 260.4-1996 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4088", "locator": "standard_number=260.4-1996; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 260.4-1996**（American National Standard Letter Symbols and Abbreviations for Quantities Used in Acoustics）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1995 年，主题领域包括 General Topics for Engineers、Signal Processing and Analysis、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-260-4-1996.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1995, "precision": "year", "display": "1995年" }, "language": "英语" }, { "id": "work_ieee_261_1965", "type": "work", "title": "IEEE Std 261-1965", "slug": "ieee-std-261-1965", "aliases": [ "261-1965", "261-1965 - IEEE Letter Symbols for Thermoelectric Devices" ], "summary": "IEEE Std 261-1965 是电气电子工程师学会的技术标准，题为“IEEE Letter Symbols for Thermoelectric Devices”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1965 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 261-1965 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7387656", "locator": "standard_number=261-1965; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 261-1965**（IEEE Letter Symbols for Thermoelectric Devices）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1965 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-261-1965.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1965, "precision": "year", "display": "1965年" }, "language": "英语" }, { "id": "work_ieee_262_1968", "type": "work", "title": "IEEE Std 262-1968", "slug": "ieee-std-262-1968", "aliases": [ "262-1968", "262-1968 - USA Standard Test Code for Distribution , Power and Regulating Transformers, and Shunt Reactors" ], "summary": "IEEE Std 262-1968 是电气电子工程师学会的技术标准，题为“USA Standard Test Code for Distribution , Power and Regulating Transformers, and Shunt Reactors”；公开目录标为已被替代（Superseded），著录年份为 1968 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 262-1968 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7387659", "locator": "standard_number=262-1968; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 262-1968**（USA Standard Test Code for Distribution , Power and Regulating Transformers, and Shunt Reactors）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1968 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-262-1968.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1968, "precision": "year", "display": "1968年" }, "language": "英语" }, { "id": "work_ieee_262_1973", "type": "work", "title": "IEEE Std 262-1973", "slug": "ieee-std-262-1973", "aliases": [ "262-1973", "262-1973 - American National Standard Test Code for Distribution, Power, and Regulating Transformers" ], "summary": "IEEE Std 262-1973 是电气电子工程师学会的技术标准，题为“American National Standard Test Code for Distribution, Power, and Regulating Transformers”；公开目录标为已被替代（Superseded），著录年份为 1973 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 262-1973 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7387651", "locator": "standard_number=262-1973; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 262-1973**（American National Standard Test Code for Distribution, Power, and Regulating Transformers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1973 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-262-1973.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1973, "precision": "year", "display": "1973年" }, "language": "英语" }, { "id": "work_ieee_262b_1977", "type": "work", "title": "IEEE Std 262B-1977", "slug": "ieee-std-262b-1977", "aliases": [ "262B-1977", "262B-1977 - IEEE Trial Use Standard Dielectric Test Requirements for Power Transformers for Operation on Effectively Grounded Systems 345 kV and Above" ], "summary": "IEEE Std 262B-1977 是电气电子工程师学会的技术标准，题为“IEEE Trial Use Standard Dielectric Test Requirements for Power Transformers for Operation on Effectively Grounded Systems 345 kV and Above”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1977 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 262B-1977 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7387662", "locator": "standard_number=262B-1977; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 262B-1977**（IEEE Trial Use Standard Dielectric Test Requirements for Power Transformers for Operation on Effectively Grounded Systems 345 kV and Above）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1977 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-262b-1977.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1977, "precision": "year", "display": "1977年" }, "language": "英语" }, { "id": "work_ieee_263_1965", "type": "work", "title": "IEEE Std 263-1965", "slug": "ieee-std-263-1965", "aliases": [ "263-1965", "263-1965 - IEEE Standard for Measurement of Radio Noise Generated by Motor Vehicles and Affecting Mobile Communications Receivers in the Frequency Range 25-1000 megahertz" ], "summary": "IEEE Std 263-1965 是电气电子工程师学会的技术标准，题为“IEEE Standard for Measurement of Radio Noise Generated by Motor Vehicles and Affecting Mobile Communications Receivers in the Frequency Range 25-1000 megahertz”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1965 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 263-1965 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7948689", "locator": "standard_number=263-1965; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 263-1965**（IEEE Standard for Measurement of Radio Noise Generated by Motor Vehicles and Affecting Mobile Communications Receivers in the Frequency Range 25-1000 megahertz）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1965 年，主题领域包括 Fields, Waves and Electromagnetics、Transportation、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-263-1965.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1965, "precision": "year", "display": "1965年" }, "language": "英语" }, { "id": "work_ieee_264_1968", "type": "work", "title": "IEEE Std 264-1968", "slug": "ieee-std-264-1968", "aliases": [ "264-1968", "264-1968 - IEEE Standard for High-Power Wide-Band Transformers." ], "summary": "IEEE Std 264-1968 是电气电子工程师学会的技术标准，题为“IEEE Standard for High-Power Wide-Band Transformers.”；公开目录标为已被替代（Superseded），著录年份为 1968 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 264-1968 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7394093", "locator": "standard_number=264-1968; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 264-1968**（IEEE Standard for High-Power Wide-Band Transformers.）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1968 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-264-1968.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1968, "precision": "year", "display": "1968年" }, "language": "英语" }, { "id": "work_ieee_264_1977", "type": "work", "title": "IEEE Std 264-1977", "slug": "ieee-std-264-1977", "aliases": [ "264-1977", "264-1977 - IEEE Standard for High-Power Wide-Band Transformers (100 Watts and Above)" ], "summary": "IEEE Std 264-1977 是电气电子工程师学会的技术标准，题为“IEEE Standard for High-Power Wide-Band Transformers (100 Watts and Above)”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1977 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 264-1977 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7384642", "locator": "standard_number=264-1977; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 264-1977**（IEEE Standard for High-Power Wide-Band Transformers (100 Watts and Above)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1977 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-264-1977.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1977, "precision": "year", "display": "1977年" }, "language": "英语" }, { "id": "work_ieee_26511_2012", "type": "work", "title": "IEEE Std 26511-2012", "slug": "ieee-std-26511-2012", "aliases": [ "26511-2012", "26511-2012 - ISO/IEC/IEEE International Standard - Systems and software engineering -- Requirements for managers of user documentation" ], "summary": "IEEE Std 26511-2012 是电气电子工程师学会的技术标准，题为“ISO/IEC/IEEE International Standard - Systems and software engineering -- Requirements for managers of user documentation”；公开目录标为已被替代（Superseded），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 26511-2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6170924", "locator": "standard_number=26511-2012; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 26511-2012**（ISO/IEC/IEEE International Standard - Systems and software engineering -- Requirements for managers of user documentation）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2012 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-26511-2012.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_26512_2011", "type": "work", "title": "IEEE Std 26512-2011", "slug": "ieee-std-26512-2011", "aliases": [ "26512-2011", "26512-2011 - IEEE/ISO/IEC Systems and software engineering -- Requirements for acquirers and suppliers of user documentation" ], "summary": "IEEE Std 26512-2011 是电气电子工程师学会的技术标准，题为“IEEE/ISO/IEC Systems and software engineering -- Requirements for acquirers and suppliers of user documentation”；公开目录标为已被替代（Superseded），著录年份为 2011 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 26512-2011 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5871661", "locator": "standard_number=26512-2011; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 26512-2011**（IEEE/ISO/IEC Systems and software engineering -- Requirements for acquirers and suppliers of user documentation）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2011 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-26512-2011.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2011, "precision": "year", "display": "2011年" }, "language": "英语" }, { "id": "work_ieee_26512_2017", "type": "work", "title": "IEEE Std 26512-2017", "slug": "ieee-std-26512-2017", "aliases": [ "26512-2017", "26512-2017 - ISO/IEC/IEEE International Standard - Systems and software engineering - Requirements for acquirers and suppliers of information for users" ], "summary": "IEEE Std 26512-2017 是电气电子工程师学会的技术标准，题为“ISO/IEC/IEEE International Standard - Systems and software engineering - Requirements for acquirers and suppliers of information for users”；公开目录标为已被替代（Superseded），著录年份为 2017 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 26512-2017 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8288805", "locator": "standard_number=26512-2017; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 26512-2017**（ISO/IEC/IEEE International Standard - Systems and software engineering - Requirements for acquirers and suppliers of information for users）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2017 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-26512-2017.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2017, "precision": "year", "display": "2017年" }, "language": "英语" }, { "id": "work_ieee_265_1966", "type": "work", "title": "IEEE Std 265-1966", "slug": "ieee-std-265-1966", "aliases": [ "265-1966", "265-1966 - IEEE Recommended Practices for Burst Measurements in the Frequency Domain" ], "summary": "IEEE Std 265-1966 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practices for Burst Measurements in the Frequency Domain”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1966 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 265-1966 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7393397", "locator": "standard_number=265-1966; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:14+08:00", "updatedAt": "2026-11-01T22:04:14+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 265-1966**（IEEE Recommended Practices for Burst Measurements in the Frequency Domain）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1966 年，主题领域包括 Communication, Networking and Broadcast Technologies、Signal Processing and Analysis[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-265-1966.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1966, "precision": "year", "display": "1966年" }, "language": "英语" }, { "id": "work_ieee_p1858_d1_oct_2022", "type": "work", "title": "IEEE Std P1858/D1, Oct 2022", "slug": "ieee-std-p1858-d1-oct-2022", "aliases": [ "P1858/D1, Oct 2022", "P1858/D1, Oct 2022 - IEEE Approved Draft Standard for Camera Phone Image Quality (CPIQ)" ], "summary": "IEEE Std P1858/D1, Oct 2022 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Camera Phone Image Quality (CPIQ)”；公开目录标为非现行（Inactive），著录年份为 2023 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1858/D1, Oct 2022 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9950442", "locator": "standard_number=P1858/D1, Oct 2022; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:13+08:00", "updatedAt": "2026-11-01T22:04:13+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1858/D1, Oct 2022**（IEEE Approved Draft Standard for Camera Phone Image Quality (CPIQ)）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2023 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1858-d1-oct-2022.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2023, "precision": "year", "display": "2023年" }, "language": "英语" }, { "id": "work_ieee_p1858_d1_dec_2015", "type": "work", "title": "IEEE Std P1858/D1, Dec 2015", "slug": "ieee-std-p1858-d1-dec-2015", "aliases": [ "P1858/D1, Dec 2015", "P1858/D1, Dec 2015 - IEEE Draft Standard for Camera Phone Image Quality (CPIQ)" ], "summary": "IEEE Std P1858/D1, Dec 2015 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Camera Phone Image Quality (CPIQ)”；公开目录标为非现行（Inactive），著录年份为 2016 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1858/D1, Dec 2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7489056", "locator": "standard_number=P1858/D1, Dec 2015; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:11+08:00", "updatedAt": "2026-11-01T22:04:11+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1858/D1, Dec 2015**（IEEE Draft Standard for Camera Phone Image Quality (CPIQ)）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2016 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies、Signal Processing and Analysis[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1858-d1-dec-2015.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2016, "precision": "year", "display": "2016年" }, "language": "英语" }, { "id": "work_ieee_p1858_2016_cor1_d2_dec_2016", "type": "work", "title": "IEEE Std P1858-2016_Cor1_D2, Dec 2016", "slug": "ieee-std-p1858-2016-cor1-d2-dec-2016", "aliases": [ "P1858-2016_Cor1_D2, Dec 2016", "P1858-2016_Cor1_D2, Dec 2016 - IEEE Approved Standard for Camera Phone Image Quality (CPIQ) - Corrigendum 1" ], "summary": "IEEE Std P1858-2016_Cor1_D2, Dec 2016 是电气电子工程师学会的草案，题为“IEEE Approved Standard for Camera Phone Image Quality (CPIQ) - Corrigendum 1”；公开目录标为非现行（Inactive），著录年份为 2017 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1858-2016_Cor1_D2, Dec 2016 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7888902", "locator": "standard_number=P1858-2016_Cor1_D2, Dec 2016; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:10+08:00", "updatedAt": "2026-11-01T22:04:10+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1858-2016_Cor1_D2, Dec 2016**（IEEE Approved Standard for Camera Phone Image Quality (CPIQ) - Corrigendum 1）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2017 年，主题领域包括 Signal Processing and Analysis、Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1858-2016-cor1-d2-dec-2016.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2017, "precision": "year", "display": "2017年" }, "language": "英语" }, { "id": "work_ieee_p1857a_d1_dec_2013", "type": "work", "title": "IEEE Std P1857a/D1, Dec 2013", "slug": "ieee-std-p1857a-d1-dec-2013", "aliases": [ "P1857a/D1, Dec 2013", "P1857a/D1, Dec 2013 - IEEE Draft Standard for Advanced Audio and Video Coding Amendment 1: Extension on timing and location information to support object tracking across multiple cameras at Surveillan" ], "summary": "IEEE Std P1857a/D1, Dec 2013 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Advanced Audio and Video Coding Amendment 1: Extension on timing and location information to support object tracking across multiple cameras at Surveillan”；公开目录标为非现行（Inactive），著录年份为 2014 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1857a/D1, Dec 2013 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6705539", "locator": "standard_number=P1857a/D1, Dec 2013; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:09+08:00", "updatedAt": "2026-11-01T22:04:09+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1857a/D1, Dec 2013**（IEEE Draft Standard for Advanced Audio and Video Coding Amendment 1: Extension on timing and location information to support object tracking across multiple cameras at Surveillan）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2014 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1857a-d1-dec-2013.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2014, "precision": "year", "display": "2014年" }, "language": "英语" }, { "id": "work_ieee_p1857a_d2_jan_2014", "type": "work", "title": "IEEE Std P1857a/D2, Jan 2014", "slug": "ieee-std-p1857a-d2-jan-2014", "aliases": [ "P1857a/D2, Jan 2014", "P1857a/D2, Jan 2014 - IEEE Approved Draft Standard for Advanced Audio and Video Coding Amendment 1: Extension on timing and location information to support object tracking across multiple cameras at S" ], "summary": "IEEE Std P1857a/D2, Jan 2014 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Advanced Audio and Video Coding Amendment 1: Extension on timing and location information to support object tracking across multiple cameras at S”；公开目录标为非现行（Inactive），著录年份为 2014 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1857a/D2, Jan 2014 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6728599", "locator": "standard_number=P1857a/D2, Jan 2014; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:09+08:00", "updatedAt": "2026-11-01T22:04:09+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1857a/D2, Jan 2014**（IEEE Approved Draft Standard for Advanced Audio and Video Coding Amendment 1: Extension on timing and location information to support object tracking across multiple cameras at S）是[[organization_ieee|电气电子工程师学会]]于 2014 年 1 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1857a-d2-jan-2014.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2014, "precision": "year", "display": "2014年" }, "language": "英语" }, { "id": "work_ieee_p1857_d2_nov_2012", "type": "work", "title": "IEEE Std P1857/D2, Nov 2012", "slug": "ieee-std-p1857-d2-nov-2012", "aliases": [ "P1857/D2, Nov 2012", "P1857/D2, Nov 2012 - IEEE Approved Draft Standard for Advanced Audio and Video Coding" ], "summary": "IEEE Std P1857/D2, Nov 2012 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Advanced Audio and Video Coding”；公开目录标为非现行（Inactive），著录年份为 2013 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1857/D2, Nov 2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6476600", "locator": "standard_number=P1857/D2, Nov 2012; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:08+08:00", "updatedAt": "2026-11-01T22:04:08+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1857/D2, Nov 2012**（IEEE Approved Draft Standard for Advanced Audio and Video Coding）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2013 年，主题领域包括 Signal Processing and Analysis、Communication, Networking and Broadcast Technologies、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1857-d2-nov-2012.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2013, "precision": "year", "display": "2013年" }, "language": "英语" }, { "id": "work_ieee_p1857_d2_feb_2023", "type": "work", "title": "IEEE Std P1857/D2, Feb 2023", "slug": "ieee-std-p1857-d2-feb-2023", "aliases": [ "P1857/D2, Feb 2023", "P1857/D2, Feb 2023 - IEEE Approved Draft Standard for Advanced Audio and Video Coding" ], "summary": "IEEE Std P1857/D2, Feb 2023 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Advanced Audio and Video Coding”；公开目录标为非现行（Inactive），著录年份为 2023 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1857/D2, Feb 2023 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=10044618", "locator": "standard_number=P1857/D2, Feb 2023; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:07+08:00", "updatedAt": "2026-11-01T22:04:07+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1857/D2, Feb 2023**（IEEE Approved Draft Standard for Advanced Audio and Video Coding）是[[organization_ieee|电气电子工程师学会]]于 2023 年 2 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Signal Processing and Analysis、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1857-d2-feb-2023.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2023, "precision": "year", "display": "2023年" }, "language": "英语" }, { "id": "work_ieee_p1857_9_d4_aug_2021", "type": "work", "title": "IEEE Std P1857.9/D4, Aug 2021", "slug": "ieee-std-p1857-9-d4-aug-2021", "aliases": [ "P1857.9/D4, Aug 2021", "P1857.9/D4, Aug 2021 - IEEE Approved Draft Standard for Immersive Visual Content Coding" ], "summary": "IEEE Std P1857.9/D4, Aug 2021 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Immersive Visual Content Coding”；公开目录标为非现行（Inactive），著录年份为 2021 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1857.9/D4, Aug 2021 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9528308", "locator": "standard_number=P1857.9/D4, Aug 2021; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:06+08:00", "updatedAt": "2026-11-01T22:04:06+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1857.9/D4, Aug 2021**（IEEE Approved Draft Standard for Immersive Visual Content Coding）是[[organization_ieee|电气电子工程师学会]]于 2021 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Signal Processing and Analysis、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1857-9-d4-aug-2021.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2021, "precision": "year", "display": "2021年" }, "language": "英语" }, { "id": "work_ieee_255_1963", "type": "work", "title": "IEEE Std 255-1963", "slug": "ieee-std-255-1963", "aliases": [ "255-1963", "255-1963 - IEEE Standard Letter Symbols for Semiconductor Devices" ], "summary": "IEEE Std 255-1963 是电气电子工程师学会的技术标准，题为“IEEE Standard Letter Symbols for Semiconductor Devices”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1963 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 255-1963 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=2728", "locator": "standard_number=255-1963; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:01+08:00", "updatedAt": "2026-11-01T22:04:01+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 255-1963**（IEEE Standard Letter Symbols for Semiconductor Devices）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1963 年，主题领域包括 General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-255-1963.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1963, "precision": "year", "display": "1963年" }, "language": "英语" }, { "id": "work_ieee_256_1963", "type": "work", "title": "IEEE Std 256-1963", "slug": "ieee-std-256-1963", "aliases": [ "256-1963", "256-1963 - IEEE Test Procedure for Semiconductor Diodes" ], "summary": "IEEE Std 256-1963 是电气电子工程师学会的技术标准，题为“IEEE Test Procedure for Semiconductor Diodes”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1963 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 256-1963 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7385413", "locator": "standard_number=256-1963; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:01+08:00", "updatedAt": "2026-11-01T22:04:01+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 256-1963**（IEEE Test Procedure for Semiconductor Diodes）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1963 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-256-1963.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1963, "precision": "year", "display": "1963年" }, "language": "英语" }, { "id": "work_ieee_257_1964", "type": "work", "title": "IEEE Std 257-1964", "slug": "ieee-std-257-1964", "aliases": [ "257-1964", "257-1964 - IEEE Technical Committee Report on Recommended Practices for Burst Measurements in the Time Domain" ], "summary": "IEEE Std 257-1964 是电气电子工程师学会的技术标准，题为“IEEE Technical Committee Report on Recommended Practices for Burst Measurements in the Time Domain”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1964 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 257-1964 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7385410", "locator": "standard_number=257-1964; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:01+08:00", "updatedAt": "2026-11-01T22:04:01+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 257-1964**（IEEE Technical Committee Report on Recommended Practices for Burst Measurements in the Time Domain）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1964 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-257-1964.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1964, "precision": "year", "display": "1964年" }, "language": "英语" }, { "id": "work_ieee_258_1965", "type": "work", "title": "IEEE Std 258-1965", "slug": "ieee-std-258-1965", "aliases": [ "258-1965", "258-1965 - IEEE Test Procedure for Close-Talking Pressure-Type Microphones" ], "summary": "IEEE Std 258-1965 是电气电子工程师学会的技术标准，题为“IEEE Test Procedure for Close-Talking Pressure-Type Microphones”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1965 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 258-1965 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7384633", "locator": "standard_number=258-1965; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:01+08:00", "updatedAt": "2026-11-01T22:04:01+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 258-1965**（IEEE Test Procedure for Close-Talking Pressure-Type Microphones）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1965 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems、Signal Processing and Analysis[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-258-1965.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1965, "precision": "year", "display": "1965年" }, "language": "英语" }, { "id": "work_ieee_259_1965", "type": "work", "title": "IEEE Std 259-1965", "slug": "ieee-std-259-1965", "aliases": [ "259-1965", "259-1965 - IEEE Proposed Test Procedure for Evaluation of Systems of Insulation for Specialty Transformers" ], "summary": "IEEE Std 259-1965 是电气电子工程师学会的技术标准，题为“IEEE Proposed Test Procedure for Evaluation of Systems of Insulation for Specialty Transformers”；公开目录标为已被替代（Superseded），著录年份为 1964 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 259-1965 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7384645", "locator": "standard_number=259-1965; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:01+08:00", "updatedAt": "2026-11-01T22:04:01+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 259-1965**（IEEE Proposed Test Procedure for Evaluation of Systems of Insulation for Specialty Transformers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1964 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-259-1965.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1964, "precision": "year", "display": "1964年" }, "language": "英语" }, { "id": "work_ieee_259_1974", "type": "work", "title": "IEEE Std 259-1974", "slug": "ieee-std-259-1974", "aliases": [ "259-1974", "259-1974 - IEEE Standard Test Procedure for Evaluation of Systems of Insulation for Specialty Transformers" ], "summary": "IEEE Std 259-1974 是电气电子工程师学会的技术标准，题为“IEEE Standard Test Procedure for Evaluation of Systems of Insulation for Specialty Transformers”；公开目录标为已被替代（Superseded），著录年份为 1974 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 259-1974 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=2698", "locator": "standard_number=259-1974; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:01+08:00", "updatedAt": "2026-11-01T22:04:01+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 259-1974**（IEEE Standard Test Procedure for Evaluation of Systems of Insulation for Specialty Transformers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1974 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-259-1974.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1974, "precision": "year", "display": "1974年" }, "language": "英语" }, { "id": "work_ieee_259_1994", "type": "work", "title": "IEEE Std 259-1994", "slug": "ieee-std-259-1994", "aliases": [ "259-1994", "259-1994 - IEEE Standard Test Procedure for Evaluation of Systems of Insulation for Specialty Transformers" ], "summary": "IEEE Std 259-1994 是电气电子工程师学会的技术标准，题为“IEEE Standard Test Procedure for Evaluation of Systems of Insulation for Specialty Transformers”；公开目录标为已被替代（Superseded），著录年份为 1994 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 259-1994 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=3445", "locator": "standard_number=259-1994; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:01+08:00", "updatedAt": "2026-11-01T22:04:01+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 259-1994**（IEEE Standard Test Procedure for Evaluation of Systems of Insulation for Specialty Transformers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1994 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-259-1994.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1994, "precision": "year", "display": "1994年" }, "language": "英语" }, { "id": "work_ieee_259_1999", "type": "work", "title": "IEEE Std 259-1999", "slug": "ieee-std-259-1999", "aliases": [ "259-1999", "259-1999 - IEEE Standard Test Procedure for Evaluation of Systems of Insulation for Dry-Type Specialty and General-Purpose Transformers" ], "summary": "IEEE Std 259-1999 是电气电子工程师学会的技术标准，题为“IEEE Standard Test Procedure for Evaluation of Systems of Insulation for Dry-Type Specialty and General-Purpose Transformers”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 1999 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 259-1999 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6486", "locator": "standard_number=259-1999; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:01+08:00", "updatedAt": "2026-11-01T22:04:01+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 259-1999**（IEEE Standard Test Procedure for Evaluation of Systems of Insulation for Dry-Type Specialty and General-Purpose Transformers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 1999 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-259-1999.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1999, "precision": "year", "display": "1999年" }, "language": "英语" }, { "id": "work_ieee_260_1978", "type": "work", "title": "IEEE Std 260-1978", "slug": "ieee-std-260-1978", "aliases": [ "260-1978", "260-1978 - IEEE Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units)" ], "summary": "IEEE Std 260-1978 是电气电子工程师学会的技术标准，题为“IEEE Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units)”；公开目录标为已被替代（Superseded），著录年份为 1978 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 260-1978 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=2649", "locator": "standard_number=260-1978; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:01+08:00", "updatedAt": "2026-11-01T22:04:01+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 260-1978**（IEEE Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1978 年，主题领域包括 General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-260-1978.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1978, "precision": "year", "display": "1978年" }, "language": "英语" }, { "id": "work_ieee_26_1930", "type": "work", "title": "IEEE Std 26-1930", "slug": "ieee-std-26-1930", "aliases": [ "26-1930", "26-1930 - AIEE Automatic Stations" ], "summary": "IEEE Std 26-1930 是电气电子工程师学会的技术标准，题为“AIEE Automatic Stations”；公开目录标为已被替代（Superseded），著录年份为 1930 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 26-1930 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7387648", "locator": "standard_number=26-1930; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:01+08:00", "updatedAt": "2026-11-01T22:04:01+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 26-1930**（AIEE Automatic Stations）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1930 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-26-1930.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1930, "precision": "year", "display": "1930年" }, "language": "英语" }, { "id": "work_ieee_251_1963", "type": "work", "title": "IEEE Std 251-1963", "slug": "ieee-std-251-1963", "aliases": [ "251-1963", "251-1963 - IEEE Proposed Test Procedure for Direct Current Tachometer Generators" ], "summary": "IEEE Std 251-1963 是电气电子工程师学会的技术标准，题为“IEEE Proposed Test Procedure for Direct Current Tachometer Generators”；公开目录标为已被替代（Superseded），著录年份为 1963 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 251-1963 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7381573", "locator": "standard_number=251-1963; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:00+08:00", "updatedAt": "2026-11-01T22:04:00+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 251-1963**（IEEE Proposed Test Procedure for Direct Current Tachometer Generators）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1963 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-251-1963.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1963, "precision": "year", "display": "1963年" }, "language": "英语" }, { "id": "work_ieee_251_1984", "type": "work", "title": "IEEE Std 251-1984", "slug": "ieee-std-251-1984", "aliases": [ "251-1984", "251-1984 - IEEE Guide: Test Procedures for Direct-Current Tachometer Generators" ], "summary": "IEEE Std 251-1984 是电气电子工程师学会的技术标准，题为“IEEE Guide: Test Procedures for Direct-Current Tachometer Generators”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1984 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 251-1984 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4345", "locator": "standard_number=251-1984; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:00+08:00", "updatedAt": "2026-11-01T22:04:00+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 251-1984**（IEEE Guide: Test Procedures for Direct-Current Tachometer Generators）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1984 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-251-1984.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1984, "precision": "year", "display": "1984年" }, "language": "英语" }, { "id": "work_ieee_252_1963", "type": "work", "title": "IEEE Std 252-1963", "slug": "ieee-std-252-1963", "aliases": [ "252-1963", "252-1963 - IEEE Proposed Procedure for Polyphase Induction Motors Having Liquid in the Magnetic Gap" ], "summary": "IEEE Std 252-1963 是电气电子工程师学会的技术标准，题为“IEEE Proposed Procedure for Polyphase Induction Motors Having Liquid in the Magnetic Gap”；公开目录标为已被替代（Superseded），著录年份为 1963 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 252-1963 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7385404", "locator": "standard_number=252-1963; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:00+08:00", "updatedAt": "2026-11-01T22:04:00+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 252-1963**（IEEE Proposed Procedure for Polyphase Induction Motors Having Liquid in the Magnetic Gap）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1963 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-252-1963.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1963, "precision": "year", "display": "1963年" }, "language": "英语" }, { "id": "work_ieee_252_1977", "type": "work", "title": "IEEE Std 252-1977", "slug": "ieee-std-252-1977", "aliases": [ "252-1977", "252-1977 - IEEE Test Procedure for Polyphase Induction Motors Having Liquid in the Magnetic Gap" ], "summary": "IEEE Std 252-1977 是电气电子工程师学会的技术标准，题为“IEEE Test Procedure for Polyphase Induction Motors Having Liquid in the Magnetic Gap”；公开目录标为已被替代（Superseded），著录年份为 1977 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 252-1977 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=2668", "locator": "standard_number=252-1977; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:00+08:00", "updatedAt": "2026-11-01T22:04:00+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 252-1977**（IEEE Test Procedure for Polyphase Induction Motors Having Liquid in the Magnetic Gap）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1977 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-252-1977.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1977, "precision": "year", "display": "1977年" }, "language": "英语" }, { "id": "work_ieee_252_1995", "type": "work", "title": "IEEE Std 252-1995", "slug": "ieee-std-252-1995", "aliases": [ "252-1995", "252-1995 - IEEE Standard Test Procedure for Polyphase Induction Motors Having Liquid in the Magnetic Gap" ], "summary": "IEEE Std 252-1995 是电气电子工程师学会的技术标准，题为“IEEE Standard Test Procedure for Polyphase Induction Motors Having Liquid in the Magnetic Gap”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 1995 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 252-1995 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=3689", "locator": "standard_number=252-1995; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:00+08:00", "updatedAt": "2026-11-01T22:04:00+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 252-1995**（IEEE Standard Test Procedure for Polyphase Induction Motors Having Liquid in the Magnetic Gap）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 1995 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-252-1995.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1995, "precision": "year", "display": "1995年" }, "language": "英语" }, { "id": "work_ieee_252_2022_10505232_redline", "type": "work", "title": "IEEE Std 252-2022", "slug": "ieee-std-252-2022-10505232-redline", "aliases": [ "252-2022", "252-2022 - IEEE Standard Test Procedure for Polyphase Induction Motors Having Liquid in the Magnetic Gap - Redline" ], "summary": "IEEE Std 252-2022 是电气电子工程师学会的技术标准，题为“IEEE Standard Test Procedure for Polyphase Induction Motors Having Liquid in the Magnetic Gap - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2023 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 252-2022 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=10505232", "locator": "standard_number=252-2022; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:00+08:00", "updatedAt": "2026-11-01T22:04:00+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 252-2022**（IEEE Standard Test Procedure for Polyphase Induction Motors Having Liquid in the Magnetic Gap - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2023 年，主题领域包括 Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-252-2022-10505232-redline.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2023, "precision": "year", "display": "2023年" }, "language": "英语" }, { "id": "work_ieee_254_1963", "type": "work", "title": "IEEE Std 254-1963", "slug": "ieee-std-254-1963", "aliases": [ "254-1963", "254-1963 - IEEE Standard Definitions of Parametric Device Terms" ], "summary": "IEEE Std 254-1963 是电气电子工程师学会的技术标准，题为“IEEE Standard Definitions of Parametric Device Terms”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1963 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 254-1963 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7385407", "locator": "standard_number=254-1963; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:00+08:00", "updatedAt": "2026-11-01T22:04:00+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 254-1963**（IEEE Standard Definitions of Parametric Device Terms）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1963 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-254-1963.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1963, "precision": "year", "display": "1963年" }, "language": "英语" }, { "id": "work_ieee_25_1945", "type": "work", "title": "IEEE Std 25-1945", "slug": "ieee-std-25-1945", "aliases": [ "25-1945", "25-1945 - AIEE Standards for Fuses Above 600 Volts" ], "summary": "IEEE Std 25-1945 是电气电子工程师学会的技术标准，题为“AIEE Standards for Fuses Above 600 Volts”；公开目录标为已被替代（Superseded），著录年份为 1945 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 25-1945 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7381582", "locator": "standard_number=25-1945; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:00+08:00", "updatedAt": "2026-11-01T22:04:00+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 25-1945**（AIEE Standards for Fuses Above 600 Volts）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1945 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-25-1945.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1945, "precision": "year", "display": "1945年" }, "language": "英语" }, { "id": "work_ieee_25_1952", "type": "work", "title": "IEEE Std 25-1952", "slug": "ieee-std-25-1952", "aliases": [ "25-1952", "25-1952 - AIEE Standards for Fuses Above 600 Volts" ], "summary": "IEEE Std 25-1952 是电气电子工程师学会的技术标准，题为“AIEE Standards for Fuses Above 600 Volts”；公开目录标为已被替代（Superseded），著录年份为 1952 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 25-1952 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7383199", "locator": "standard_number=25-1952; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:00+08:00", "updatedAt": "2026-11-01T22:04:00+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 25-1952**（AIEE Standards for Fuses Above 600 Volts）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1952 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-25-1952.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1952, "precision": "year", "display": "1952年" }, "language": "英语" }, { "id": "work_ieee_25_1958", "type": "work", "title": "IEEE Std 25-1958", "slug": "ieee-std-25-1958", "aliases": [ "25-1958", "25-1958 - AIEE Standards for Fuses Above 600 Volts" ], "summary": "IEEE Std 25-1958 是电气电子工程师学会的技术标准，题为“AIEE Standards for Fuses Above 600 Volts”；公开目录标为已被替代（Superseded），著录年份为 1958 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 25-1958 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7383205", "locator": "standard_number=25-1958; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:04:00+08:00", "updatedAt": "2026-11-01T22:04:00+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 25-1958**（AIEE Standards for Fuses Above 600 Volts）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1958 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-25-1958.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1958, "precision": "year", "display": "1958年" }, "language": "英语" }, { "id": "work_ieee_p1857_9_d3_aug_2021", "type": "work", "title": "IEEE Std P1857.9/D3, Aug 2021", "slug": "ieee-std-p1857-9-d3-aug-2021", "aliases": [ "P1857.9/D3, Aug 2021", "P1857.9/D3, Aug 2021 - IEEE Draft Standard for Immersive Visual Content Coding" ], "summary": "IEEE Std P1857.9/D3, Aug 2021 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Immersive Visual Content Coding”；公开目录标为非现行（Inactive），著录年份为 2021 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1857.9/D3, Aug 2021 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9520857", "locator": "standard_number=P1857.9/D3, Aug 2021; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:03:52+08:00", "updatedAt": "2026-11-01T22:03:52+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1857.9/D3, Aug 2021**（IEEE Draft Standard for Immersive Visual Content Coding）是[[organization_ieee|电气电子工程师学会]]于 2021 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Signal Processing and Analysis、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1857-9-d3-aug-2021.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2021, "precision": "year", "display": "2021年" }, "language": "英语" }, { "id": "work_ieee_p1857_8_d3_mar_2020", "type": "work", "title": "IEEE Std P1857.8/D3, Mar 2020", "slug": "ieee-std-p1857-8-d3-mar-2020", "aliases": [ "P1857.8/D3, Mar 2020", "P1857.8/D3, Mar 2020 - IEEE Draft Standard for 2nd Generation Audio Coding" ], "summary": "IEEE Std P1857.8/D3, Mar 2020 是电气电子工程师学会的草案，题为“IEEE Draft Standard for 2nd Generation Audio Coding”；公开目录标为非现行（Inactive），著录年份为 2020 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1857.8/D3, Mar 2020 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9052091", "locator": "standard_number=P1857.8/D3, Mar 2020; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:03:51+08:00", "updatedAt": "2026-11-01T22:03:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1857.8/D3, Mar 2020**（IEEE Draft Standard for 2nd Generation Audio Coding）是[[organization_ieee|电气电子工程师学会]]于 2020 年 3 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Signal Processing and Analysis[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1857-8-d3-mar-2020.html", "lang": "tr", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2020, "precision": "year", "display": "2020年" }, "language": "英语" } ], "lang": "tr", "pagination": { "page": 273, "pageSize": 50, "total": 50001, "pageCount": 1000, "prevUrl": "/tr/search-272.json", "nextUrl": "/tr/search-274.json" } }