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      <title>IEEE Std 15026-4-2013</title>
      <slug>ieee-std-15026-4-2013</slug>
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        <alias>15026-4-2013</alias>
        <alias>15026-4-2013 - IEEE Standard Adoption of ISO/IEC 15026-4--Systems and Software Engineering--Systems and Software Assurance--Part 4: Assurance in the Life Cycle</alias>
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      <summary>IEEE Std 15026-4-2013 是电气电子工程师学会的技术标准，题为“IEEE Standard Adoption of ISO/IEC 15026-4--Systems and Software Engineering--Systems and Software Assurance--Part 4: Assurance in the Life Cycle”；公开目录标为已被替代（Superseded），著录年份为 2013 年。</summary>
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          <title>IEEE Std 15026-4-2013 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6587251</url>
          <locator>standard_number=15026-4-2013; status=Superseded; modifier=</locator>
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          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <updatedAt>2026-11-01T21:56:19+08:00</updatedAt>
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      <revision>1</revision>
      <body>**IEEE Std 15026-4-2013**（IEEE Standard Adoption of ISO/IEC 15026-4--Systems and Software Engineering--Systems and Software Assurance--Part 4: Assurance in the Life Cycle）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2013 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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        <precision>year</precision>
        <display>2013年</display>
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      <language>英语</language>
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      <title>IEEE Std 1505.1-2008</title>
      <slug>ieee-std-1505-1-2008-7386553</slug>
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        <alias>1505.1-2008</alias>
        <alias>1505.1-2008 - IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505</alias>
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      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1505.1-2008 是电气电子工程师学会的技术标准，题为“IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505”；公开目录标为已被替代（Superseded），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1505.1-2008 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7386553</url>
          <locator>standard_number=1505.1-2008; status=Superseded; modifier=</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T21:56:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1505.1-2008**（IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2013 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1505-1-2008-7386553.html</url>
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      <fallback>true</fallback>
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      <workKind>standard</workKind>
      <published>
        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
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      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1505_1_2019_8866823_redline</id>
      <type>work</type>
      <title>IEEE Std 1505.1-2019</title>
      <slug>ieee-std-1505-1-2019-8866823-redline</slug>
      <aliases>
        <alias>1505.1-2019</alias>
        <alias>1505.1-2019 - IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505 - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1505.1-2019 是电气电子工程师学会的技术标准，题为“IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505 - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2019 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1505.1-2019 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8866823</url>
          <locator>standard_number=1505.1-2019; status=Active; modifier=Redline</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <createdAt>2026-11-01T21:56:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1505.1-2019**（IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505 - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2019 年，主题领域包括 Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1505-1-2019-8866823-redline.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
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        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2019</year>
        <precision>year</precision>
        <display>2019年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1505_2006</id>
      <type>work</type>
      <title>IEEE Std 1505-2006</title>
      <slug>ieee-std-1505-2006</slug>
      <aliases>
        <alias>1505-2006</alias>
        <alias>1505-2006 - IEEE Standard for Receiver Fixture Interface</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1505-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard for Receiver Fixture Interface”；公开目录标为已被替代（Superseded），著录年份为 2007 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
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      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1505-2006 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4161136</url>
          <locator>standard_number=1505-2006; status=Superseded; modifier=</locator>
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        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
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      <createdAt>2026-11-01T21:56:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1505-2006**（IEEE Standard for Receiver Fixture Interface）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2007 年，主题领域包括 Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1505-2006.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
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        <lang>zh</lang>
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      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2007</year>
        <precision>year</precision>
        <display>2007年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1505_2010_5641536</id>
      <type>work</type>
      <title>IEEE Std 1505-2010</title>
      <slug>ieee-std-1505-2010-5641536</slug>
      <aliases>
        <alias>1505-2010</alias>
        <alias>1505-2010 - IEEE Standard for Receiver Fixture Interface</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1505-2010 是电气电子工程师学会的技术标准，题为“IEEE Standard for Receiver Fixture Interface”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1505-2010 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5641536</url>
          <locator>standard_number=1505-2010; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1505-2010**（IEEE Standard for Receiver Fixture Interface）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2010 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1505-2010-5641536.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1505_2010_6046062_redline</id>
      <type>work</type>
      <title>IEEE Std 1505-2010</title>
      <slug>ieee-std-1505-2010-6046062-redline</slug>
      <aliases>
        <alias>1505-2010</alias>
        <alias>1505-2010 - IEEE Standard for Receiver Fixture Interface - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1505-2010 是电气电子工程师学会的技术标准，题为“IEEE Standard for Receiver Fixture Interface - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1505-2010 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6046062</url>
          <locator>standard_number=1505-2010; status=Inactive; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1505-2010**（IEEE Standard for Receiver Fixture Interface - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2010 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1505-2010-6046062-redline.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <id>work_ieee_1505_3_2015</id>
      <type>work</type>
      <title>IEEE Std 1505.3-2015</title>
      <slug>ieee-std-1505-3-2015</slug>
      <aliases>
        <alias>1505.3-2015</alias>
        <alias>1505.3-2015 - IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1505.3-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2016 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1505.3-2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7389976</url>
          <locator>standard_number=1505.3-2015; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1505.3-2015**（IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2016 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1505-3-2015.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2016</year>
        <precision>year</precision>
        <display>2016年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <id>work_ieee_15068_2_1999</id>
      <type>work</type>
      <title>IEEE Std 15068-2-1999</title>
      <slug>ieee-std-15068-2-1999</slug>
      <aliases>
        <alias>15068-2-1999</alias>
        <alias>15068-2-1999 - ISO/IEC 15068-2 : 1999 (IEEE 1387.2-1995), International Standard Information technology - Portable Operating System Interface (POSIX(TM)) system administration - Part 2: Software admin</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15068-2-1999 是电气电子工程师学会的技术标准，题为“ISO/IEC 15068-2 : 1999 (IEEE 1387.2-1995), International Standard Information technology - Portable Operating System Interface (POSIX(TM)) system administration - Part 2: Software admin”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1999 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15068-2-1999 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6334497</url>
          <locator>standard_number=15068-2-1999; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15068-2-1999**（ISO/IEC 15068-2 : 1999 (IEEE 1387.2-1995), International Standard Information technology - Portable Operating System Interface (POSIX(TM)) system administration - Part 2: Software admin）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1999 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15068-2-1999.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1999</year>
        <precision>year</precision>
        <display>1999年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <id>work_ieee_1511_1_2010</id>
      <type>work</type>
      <title>IEEE Std 1511.1-2010</title>
      <slug>ieee-std-1511-1-2010</slug>
      <aliases>
        <alias>1511.1-2010</alias>
        <alias>1511.1-2010 - IEEE Guide for Investigating and Analyzing Shielded Power Cable Failures on Systems Rated 5 kV Through 46 kV</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1511.1-2010 是电气电子工程师学会的技术标准，题为“IEEE Guide for Investigating and Analyzing Shielded Power Cable Failures on Systems Rated 5 kV Through 46 kV”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1511.1-2010 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5741055</url>
          <locator>standard_number=1511.1-2010; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1511.1-2010**（IEEE Guide for Investigating and Analyzing Shielded Power Cable Failures on Systems Rated 5 kV Through 46 kV）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1511-1-2010.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2011</year>
        <precision>year</precision>
        <display>2011年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_1511_2004</id>
      <type>work</type>
      <title>IEEE Std 1511-2004</title>
      <slug>ieee-std-1511-2004</slug>
      <aliases>
        <alias>1511-2004</alias>
        <alias>1511-2004 - IEEE Guide for Investigating and Analyzing Power Cable, Joint, and Termination Failures on Systems Rated 5 kV Through 46 kV</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1511-2004 是电气电子工程师学会的技术标准，题为“IEEE Guide for Investigating and Analyzing Power Cable, Joint, and Termination Failures on Systems Rated 5 kV Through 46 kV”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2004 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1511-2004 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9748</url>
          <locator>standard_number=1511-2004; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1511-2004**（IEEE Guide for Investigating and Analyzing Power Cable, Joint, and Termination Failures on Systems Rated 5 kV Through 46 kV）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2004 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1511-2004.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2004</year>
        <precision>year</precision>
        <display>2004年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_1512</id>
      <type>work</type>
      <title>IEEE Std 1512</title>
      <slug>ieee-std-1512</slug>
      <aliases>
        <alias>1512</alias>
        <alias>1512 - Guide for Implementing IEEE Std 1512(tm) - Using a Systems Engineering Process</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1512 是电气电子工程师学会的技术标准，题为“Guide for Implementing IEEE Std 1512(tm) - Using a Systems Engineering Process”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 2008 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1512 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8736528</url>
          <locator>standard_number=1512; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1512**（Guide for Implementing IEEE Std 1512(tm) - Using a Systems Engineering Process）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 2008 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Signal Processing and Analysis[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1512.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2008</year>
        <precision>year</precision>
        <display>2008年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1512_2000</id>
      <type>work</type>
      <title>IEEE Std 1512-2000</title>
      <slug>ieee-std-1512-2000</slug>
      <aliases>
        <alias>1512-2000</alias>
        <alias>1512-2000 - IEEE Standard for Common Incident Management Message Sets for use by Emergency Management Centers</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1512-2000 是电气电子工程师学会的技术标准，题为“IEEE Standard for Common Incident Management Message Sets for use by Emergency Management Centers”；公开目录标为已被替代（Superseded），著录年份为 2000 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1512-2000 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6926</url>
          <locator>standard_number=1512-2000; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1512-2000**（IEEE Standard for Common Incident Management Message Sets for use by Emergency Management Centers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2000 年，主题领域包括 Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1512-2000.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2000</year>
        <precision>year</precision>
        <display>2000年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1512_3_2002</id>
      <type>work</type>
      <title>IEEE Std 1512.3-2002</title>
      <slug>ieee-std-1512-3-2002</slug>
      <aliases>
        <alias>1512.3-2002</alias>
        <alias>1512.3-2002 - IEEE Standard for Hazardous Material Incident Management Message Sets for Use by Emergency Management Centers</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1512.3-2002 是电气电子工程师学会的技术标准，题为“IEEE Standard for Hazardous Material Incident Management Message Sets for Use by Emergency Management Centers”；公开目录标为已被替代（Superseded），著录年份为 2002 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1512.3-2002 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8156</url>
          <locator>standard_number=1512.3-2002; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1512.3-2002**（IEEE Standard for Hazardous Material Incident Management Message Sets for Use by Emergency Management Centers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2002 年，主题领域包括 Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1512-3-2002.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2002</year>
        <precision>year</precision>
        <display>2002年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_1512_3_2006</id>
      <type>work</type>
      <title>IEEE Std 1512.3-2006</title>
      <slug>ieee-std-1512-3-2006</slug>
      <aliases>
        <alias>1512.3-2006</alias>
        <alias>1512.3-2006 - IEEE Standard for Hazardous Material Incident Management Message Sets for Use by Emergency Management Centers</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1512.3-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard for Hazardous Material Incident Management Message Sets for Use by Emergency Management Centers”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2006 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1512.3-2006 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11015</url>
          <locator>standard_number=1512.3-2006; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1512.3-2006**（IEEE Standard for Hazardous Material Incident Management Message Sets for Use by Emergency Management Centers）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2006 年，主题领域包括 Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1512-3-2006.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2006</year>
        <precision>year</precision>
        <display>2006年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_151_1965</id>
      <type>work</type>
      <title>IEEE Std 151-1965</title>
      <slug>ieee-std-151-1965</slug>
      <aliases>
        <alias>151-1965</alias>
        <alias>151-1965 - Standard Definitions of Terms for Audio and Electroacoustics</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 151-1965 是电气电子工程师学会的技术标准，题为“Standard Definitions of Terms for Audio and Electroacoustics”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1965 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 151-1965 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7366733</url>
          <locator>standard_number=151-1965; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 151-1965**（Standard Definitions of Terms for Audio and Electroacoustics）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1965 年，主题领域包括 Communication, Networking and Broadcast Technologies、Signal Processing and Analysis、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-151-1965.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1965</year>
        <precision>year</precision>
        <display>1965年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1708a_d2_feb_2019</id>
      <type>work</type>
      <title>IEEE Std P1708a/D2, Feb 2019</title>
      <slug>ieee-std-p1708a-d2-feb-2019</slug>
      <aliases>
        <alias>P1708a/D2, Feb 2019</alias>
        <alias>P1708a/D2, Feb 2019 - IEEE Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1708a/D2, Feb 2019 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices”；公开目录标为非现行（Inactive），著录年份为 2019 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1708a/D2, Feb 2019 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8664691</url>
          <locator>standard_number=P1708a/D2, Feb 2019; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1708a/D2, Feb 2019**（IEEE Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices）是[[organization_ieee|电气电子工程师学会]]于 2019 年 2 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Bioengineering、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1708a-d2-feb-2019.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2019</year>
        <precision>year</precision>
        <display>2019年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1708_d4_july_2025</id>
      <type>work</type>
      <title>IEEE Std P1708/D4, July 2025</title>
      <slug>ieee-std-p1708-d4-july-2025</slug>
      <aliases>
        <alias>P1708/D4, July 2025</alias>
        <alias>P1708/D4, July 2025 - IEEE Approved Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1708/D4, July 2025 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices”；公开目录标为非现行（Inactive），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1708/D4, July 2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11119224</url>
          <locator>standard_number=P1708/D4, July 2025; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:18+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:18+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1708/D4, July 2025**（IEEE Approved Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices）是[[organization_ieee|电气电子工程师学会]]于 2025 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Bioengineering、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1708-d4-july-2025.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <perspectives></perspectives>
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      <rankingEntries></rankingEntries>
      <id>work_ieee_p1708_d04_jun_2014</id>
      <type>work</type>
      <title>IEEE Std P1708/D04, Jun 2014</title>
      <slug>ieee-std-p1708-d04-jun-2014</slug>
      <aliases>
        <alias>P1708/D04, Jun 2014</alias>
        <alias>P1708/D04, Jun 2014 - IEEE Standard for Wearable Cuffless Blood Pressure Measuring Devices</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1708/D04, Jun 2014 是电气电子工程师学会的草案，题为“IEEE Standard for Wearable Cuffless Blood Pressure Measuring Devices”；公开目录标为非现行（Inactive），著录年份为 2014 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1708/D04, Jun 2014 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6846262</url>
          <locator>standard_number=P1708/D04, Jun 2014; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:17+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:17+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1708/D04, Jun 2014**（IEEE Standard for Wearable Cuffless Blood Pressure Measuring Devices）是[[organization_ieee|电气电子工程师学会]]于 2014 年 6 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Bioengineering、Computing and Processing、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1708-d04-jun-2014.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2014</year>
        <precision>year</precision>
        <display>2014年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1708_d3_may_2025</id>
      <type>work</type>
      <title>IEEE Std P1708/D3, May 2025</title>
      <slug>ieee-std-p1708-d3-may-2025</slug>
      <aliases>
        <alias>P1708/D3, May 2025</alias>
        <alias>P1708/D3, May 2025 - IEEE Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1708/D3, May 2025 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices”；公开目录标为非现行（Inactive），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1708/D3, May 2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11003468</url>
          <locator>standard_number=P1708/D3, May 2025; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:17+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:17+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1708/D3, May 2025**（IEEE Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices）是[[organization_ieee|电气电子工程师学会]]于 2025 年 5 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Bioengineering、Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1708-d3-may-2025.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1708_d03_feb_2014</id>
      <type>work</type>
      <title>IEEE Std P1708/D03, Feb 2014</title>
      <slug>ieee-std-p1708-d03-feb-2014</slug>
      <aliases>
        <alias>P1708/D03, Feb 2014</alias>
        <alias>P1708/D03, Feb 2014 - IEEE Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1708/D03, Feb 2014 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices”；公开目录标为非现行（Inactive），著录年份为 2014 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1708/D03, Feb 2014 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6745994</url>
          <locator>standard_number=P1708/D03, Feb 2014; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:16+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:16+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1708/D03, Feb 2014**（IEEE Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices）是[[organization_ieee|电气电子工程师学会]]于 2014 年 2 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Bioengineering、Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1708-d03-feb-2014.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2014</year>
        <precision>year</precision>
        <display>2014年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1707_d2_dec_2025</id>
      <type>work</type>
      <title>IEEE Std P1707/D2, Dec 2025</title>
      <slug>ieee-std-p1707-d2-dec-2025</slug>
      <aliases>
        <alias>P1707/D2, Dec 2025</alias>
        <alias>P1707/D2, Dec 2025 - IEEE Draft Recommended Practice for the Investigation of Events at Nuclear Facilities</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1707/D2, Dec 2025 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for the Investigation of Events at Nuclear Facilities”；公开目录标为非现行（Inactive），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1707/D2, Dec 2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11302976</url>
          <locator>standard_number=P1707/D2, Dec 2025; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:15+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:15+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1707/D2, Dec 2025**（IEEE Draft Recommended Practice for the Investigation of Events at Nuclear Facilities）是[[organization_ieee|电气电子工程师学会]]于 2025 年 12 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1707-d2-dec-2025.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1708_d02_aug_2013</id>
      <type>work</type>
      <title>IEEE Std P1708/D02, Aug 2013</title>
      <slug>ieee-std-p1708-d02-aug-2013</slug>
      <aliases>
        <alias>P1708/D02, Aug 2013</alias>
        <alias>P1708/D02, Aug 2013 - IEEE Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1708/D02, Aug 2013 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices”；公开目录标为非现行（Inactive），著录年份为 2013 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1708/D02, Aug 2013 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6626344</url>
          <locator>standard_number=P1708/D02, Aug 2013; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:15+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:15+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1708/D02, Aug 2013**（IEEE Draft Standard for Wearable Cuffless Blood Pressure Measuring Devices）是[[organization_ieee|电气电子工程师学会]]于 2013 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Bioengineering、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1708-d02-aug-2013.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2013</year>
        <precision>year</precision>
        <display>2013年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1707_d1_may_2025</id>
      <type>work</type>
      <title>IEEE Std P1707/D1, May 2025</title>
      <slug>ieee-std-p1707-d1-may-2025</slug>
      <aliases>
        <alias>P1707/D1, May 2025</alias>
        <alias>P1707/D1, May 2025 - IEEE Draft Recommended Practice for the Investigation of Events at Nuclear Facilities</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1707/D1, May 2025 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for the Investigation of Events at Nuclear Facilities”；公开目录标为非现行（Inactive），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1707/D1, May 2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11017494</url>
          <locator>standard_number=P1707/D1, May 2025; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:14+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:14+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1707/D1, May 2025**（IEEE Draft Recommended Practice for the Investigation of Events at Nuclear Facilities）是[[organization_ieee|电气电子工程师学会]]于 2025 年 5 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1707-d1-may-2025.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1707_d0_jul_2015</id>
      <type>work</type>
      <title>IEEE Std P1707/D0, Jul 2015</title>
      <slug>ieee-std-p1707-d0-jul-2015</slug>
      <aliases>
        <alias>P1707/D0, Jul 2015</alias>
        <alias>P1707/D0, Jul 2015 - IEEE Draft Recommended Practice for the Investigation of Events at Nuclear Facilities</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1707/D0, Jul 2015 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for the Investigation of Events at Nuclear Facilities”；公开目录标为非现行（Inactive），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1707/D0, Jul 2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7172976</url>
          <locator>standard_number=P1707/D0, Jul 2015; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:13+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:13+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1707/D0, Jul 2015**（IEEE Draft Recommended Practice for the Investigation of Events at Nuclear Facilities）是[[organization_ieee|电气电子工程师学会]]于 2015 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1707-d0-jul-2015.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1707_d1_aug_2015</id>
      <type>work</type>
      <title>IEEE Std P1707/D1, Aug 2015</title>
      <slug>ieee-std-p1707-d1-aug-2015</slug>
      <aliases>
        <alias>P1707/D1, Aug 2015</alias>
        <alias>P1707/D1, Aug 2015 - IEEE Approved Draft Recommended Practice for the Investigation of Events at Nuclear Facilities</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1707/D1, Aug 2015 是电气电子工程师学会的草案，题为“IEEE Approved Draft Recommended Practice for the Investigation of Events at Nuclear Facilities”；公开目录标为非现行（Inactive），著录年份为 2015 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1707/D1, Aug 2015 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7240191</url>
          <locator>standard_number=P1707/D1, Aug 2015; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:13+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:13+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1707/D1, Aug 2015**（IEEE Approved Draft Recommended Practice for the Investigation of Events at Nuclear Facilities）是[[organization_ieee|电气电子工程师学会]]于 2015 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1707-d1-aug-2015.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2015</year>
        <precision>year</precision>
        <display>2015年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_p1704_d28_sept_2021</id>
      <type>work</type>
      <title>IEEE Std P1704/D28, Sept 2021</title>
      <slug>ieee-std-p1704-d28-sept-2021</slug>
      <aliases>
        <alias>P1704/D28, Sept 2021</alias>
        <alias>P1704/D28, Sept 2021 - IEEE Approved Draft Standard for Utility Industry End Device Communications Module</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std P1704/D28, Sept 2021 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Utility Industry End Device Communications Module”；公开目录标为非现行（Inactive），著录年份为 2021 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std P1704/D28, Sept 2021 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9586450</url>
          <locator>standard_number=P1704/D28, Sept 2021; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:12+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std P1704/D28, Sept 2021**（IEEE Approved Draft Standard for Utility Industry End Device Communications Module）是[[organization_ieee|电气电子工程师学会]]于 2021 年 9 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-p1704-d28-sept-2021.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2021</year>
        <precision>year</precision>
        <display>2021年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15026_1</id>
      <type>work</type>
      <title>IEEE Std 15026-1</title>
      <slug>ieee-std-15026-1</slug>
      <aliases>
        <alias>15026-1</alias>
        <alias>15026-1 - IEEE Draft Trial-Use Standard for Adoption of ISO/IEC TR 15026-1:2010 -- Systems and Software Engineering -- Systems and Software Assurance -- Part 1: Concepts and Vocabulary</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15026-1 是电气电子工程师学会的草案，题为“IEEE Draft Trial-Use Standard for Adoption of ISO/IEC TR 15026-1:2010 -- Systems and Software Engineering -- Systems and Software Assurance -- Part 1: Concepts and Vocabulary”；公开目录标为非现行（Inactive），著录年份为 2010 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15026-1 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5621026</url>
          <locator>standard_number=15026-1; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:06+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:06+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15026-1**（IEEE Draft Trial-Use Standard for Adoption of ISO/IEC TR 15026-1:2010 -- Systems and Software Engineering -- Systems and Software Assurance -- Part 1: Concepts and Vocabulary）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2010 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15026-1.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2010</year>
        <precision>year</precision>
        <display>2010年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15026_1_2011</id>
      <type>work</type>
      <title>IEEE Std 15026-1-2011</title>
      <slug>ieee-std-15026-1-2011</slug>
      <aliases>
        <alias>15026-1-2011</alias>
        <alias>15026-1-2011 - IEEE Trial-Use Standard--Adoption of ISO/IEC TR 15026-1:2010 Systems and Software Engineering--Systems and Software Assurance--Part 1: Concepts and Vocabulary</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15026-1-2011 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard--Adoption of ISO/IEC TR 15026-1:2010 Systems and Software Engineering--Systems and Software Assurance--Part 1: Concepts and Vocabulary”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 2011 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15026-1-2011 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=5871658</url>
          <locator>standard_number=15026-1-2011; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:06+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:06+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15026-1-2011**（IEEE Trial-Use Standard--Adoption of ISO/IEC TR 15026-1:2010 Systems and Software Engineering--Systems and Software Assurance--Part 1: Concepts and Vocabulary）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 2011 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15026-1-2011.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2011</year>
        <precision>year</precision>
        <display>2011年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15026_1_2014</id>
      <type>work</type>
      <title>IEEE Std 15026-1-2014</title>
      <slug>ieee-std-15026-1-2014</slug>
      <aliases>
        <alias>15026-1-2014</alias>
        <alias>15026-1-2014 - IEEE Standard Adoption of ISO/IEC 15026-1--Systems and Software Engineering--Systems and Software Assurance--Part 1: Concepts and Vocabulary</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15026-1-2014 是电气电子工程师学会的技术标准，题为“IEEE Standard Adoption of ISO/IEC 15026-1--Systems and Software Engineering--Systems and Software Assurance--Part 1: Concepts and Vocabulary”；公开目录标为已被替代（Superseded），著录年份为 2014 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15026-1-2014 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6948213</url>
          <locator>standard_number=15026-1-2014; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:06+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:06+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15026-1-2014**（IEEE Standard Adoption of ISO/IEC 15026-1--Systems and Software Engineering--Systems and Software Assurance--Part 1: Concepts and Vocabulary）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2014 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15026-1-2014.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2014</year>
        <precision>year</precision>
        <display>2014年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15026_2_2011</id>
      <type>work</type>
      <title>IEEE Std 15026-2-2011</title>
      <slug>ieee-std-15026-2-2011</slug>
      <aliases>
        <alias>15026-2-2011</alias>
        <alias>15026-2-2011 - IEEE Standard--Adoption of ISO/IEC 15026-2:2011 Systems and Software Engineering--Systems and Software Assurance--Part 2: Assurance Case</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15026-2-2011 是电气电子工程师学会的技术标准，题为“IEEE Standard--Adoption of ISO/IEC 15026-2:2011 Systems and Software Engineering--Systems and Software Assurance--Part 2: Assurance Case”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15026-2-2011 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6045291</url>
          <locator>standard_number=15026-2-2011; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:06+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:06+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15026-2-2011**（IEEE Standard--Adoption of ISO/IEC 15026-2:2011 Systems and Software Engineering--Systems and Software Assurance--Part 2: Assurance Case）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15026-2-2011.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2011</year>
        <precision>year</precision>
        <display>2011年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1491_2012_6322990_redline</id>
      <type>work</type>
      <title>IEEE Std 1491-2012</title>
      <slug>ieee-std-1491-2012-6322990-redline</slug>
      <aliases>
        <alias>1491-2012</alias>
        <alias>1491-2012 - IEEE Guide for Selection and Use of Battery Monitoring Equipment in Stationary Applications - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1491-2012 是电气电子工程师学会的技术标准，题为“IEEE Guide for Selection and Use of Battery Monitoring Equipment in Stationary Applications - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1491-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6322990</url>
          <locator>standard_number=1491-2012; status=Inactive; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1491-2012**（IEEE Guide for Selection and Use of Battery Monitoring Equipment in Stationary Applications - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2012 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1491-2012-6322990-redline.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1493_2006</id>
      <type>work</type>
      <title>IEEE Std 1493-2006</title>
      <slug>ieee-std-1493-2006</slug>
      <aliases>
        <alias>1493-2006</alias>
        <alias>1493-2006 - IEEE Guide for the Evaluation of Solvents Used for Cleaning Electrical Cables and Accessories</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1493-2006 是电气电子工程师学会的技术标准，题为“IEEE Guide for the Evaluation of Solvents Used for Cleaning Electrical Cables and Accessories”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2006 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1493-2006 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4231504</url>
          <locator>standard_number=1493-2006; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1493-2006**（IEEE Guide for the Evaluation of Solvents Used for Cleaning Electrical Cables and Accessories）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2006 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1493-2006.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2006</year>
        <precision>year</precision>
        <display>2006年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1493_2024_10964820_redline</id>
      <type>work</type>
      <title>IEEE Std 1493-2024</title>
      <slug>ieee-std-1493-2024-10964820-redline</slug>
      <aliases>
        <alias>1493-2024</alias>
        <alias>1493-2024 - IEEE Guide for Evaluation of Solvents Used for Cleaning Electrical Cables and Accessories - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1493-2024 是电气电子工程师学会的技术标准，题为“IEEE Guide for Evaluation of Solvents Used for Cleaning Electrical Cables and Accessories - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1493-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10964820</url>
          <locator>standard_number=1493-2024; status=Active; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1493-2024**（IEEE Guide for Evaluation of Solvents Used for Cleaning Electrical Cables and Accessories - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2024 年，主题领域包括 Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1493-2024-10964820-redline.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
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    <entity>
      <perspectives></perspectives>
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      <id>work_ieee_1496_1993</id>
      <type>work</type>
      <title>IEEE Std 1496-1993</title>
      <slug>ieee-std-1496-1993</slug>
      <aliases>
        <alias>1496-1993</alias>
        <alias>1496-1993 - IEEE Standard for a Chip and Module Interconnect Bus: SBus</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1496-1993 是电气电子工程师学会的技术标准，题为“IEEE Standard for a Chip and Module Interconnect Bus: SBus”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1993 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1496-1993 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=2787</url>
          <locator>standard_number=1496-1993; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1496-1993**（IEEE Standard for a Chip and Module Interconnect Bus: SBus）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1993 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1496-1993.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1993</year>
        <precision>year</precision>
        <display>1993年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1497_2001</id>
      <type>work</type>
      <title>IEEE Std 1497-2001</title>
      <slug>ieee-std-1497-2001</slug>
      <aliases>
        <alias>1497-2001</alias>
        <alias>1497-2001 - IEEE Standard for Standard Delay Format (SDF) for the Electronic Design Process</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1497-2001 是电气电子工程师学会的技术标准，题为“IEEE Standard for Standard Delay Format (SDF) for the Electronic Design Process”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2001 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1497-2001 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7671</url>
          <locator>standard_number=1497-2001; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1497-2001**（IEEE Standard for Standard Delay Format (SDF) for the Electronic Design Process）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2001 年，主题领域包括 General Topics for Engineers、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1497-2001.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2001</year>
        <precision>year</precision>
        <display>2001年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
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      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1499_1998</id>
      <type>work</type>
      <title>IEEE Std 1499-1998</title>
      <slug>ieee-std-1499-1998</slug>
      <aliases>
        <alias>1499-1998</alias>
        <alias>1499-1998 - IEEE Standard Interface for Hardware Description Models of Electronic Components</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1499-1998 是电气电子工程师学会的技术标准，题为“IEEE Standard Interface for Hardware Description Models of Electronic Components”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1999 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1499-1998 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6548</url>
          <locator>standard_number=1499-1998; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1499-1998**（IEEE Standard Interface for Hardware Description Models of Electronic Components）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1999 年，主题领域包括 General Topics for Engineers、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1499-1998.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1999</year>
        <precision>year</precision>
        <display>1999年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1500_2005</id>
      <type>work</type>
      <title>IEEE Std 1500-2005</title>
      <slug>ieee-std-1500-2005</slug>
      <aliases>
        <alias>1500-2005</alias>
        <alias>1500-2005 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1500-2005 是电气电子工程师学会的技术标准，题为“IEEE Standard Testability Method for Embedded Core-based Integrated Circuits”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2005 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1500-2005 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10075</url>
          <locator>standard_number=1500-2005; status=Inactive; modifier=Reserved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1500-2005**（IEEE Standard Testability Method for Embedded Core-based Integrated Circuits）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2005 年，主题领域包括 Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1500-2005.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2005</year>
        <precision>year</precision>
        <display>2005年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1500_2022_10887091_redline</id>
      <type>work</type>
      <title>IEEE Std 1500-2022</title>
      <slug>ieee-std-1500-2022-10887091-redline</slug>
      <aliases>
        <alias>1500-2022</alias>
        <alias>1500-2022 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1500-2022 是电气电子工程师学会的技术标准，题为“IEEE Standard Testability Method for Embedded Core-based Integrated Circuits - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1500-2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10887091</url>
          <locator>standard_number=1500-2022; status=Active; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1500-2022**（IEEE Standard Testability Method for Embedded Core-based Integrated Circuits - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2022 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1500-2022-10887091-redline.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15026_1_2019</id>
      <type>work</type>
      <title>IEEE Std 15026-1-2019</title>
      <slug>ieee-std-15026-1-2019</slug>
      <aliases>
        <alias>15026-1-2019</alias>
        <alias>15026-1-2019 - ISO/IEC/IEEE International Standard - Systems and software engineering--Systems and software assurance --Part 1:Concepts and vocabulary</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15026-1-2019 是电气电子工程师学会的技术标准，题为“ISO/IEC/IEEE International Standard - Systems and software engineering--Systems and software assurance --Part 1:Concepts and vocabulary”；公开目录标为已被替代（Superseded），著录年份为 2019 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15026-1-2019 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=8657408</url>
          <locator>standard_number=15026-1-2019; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15026-1-2019**（ISO/IEC/IEEE International Standard - Systems and software engineering--Systems and software assurance --Part 1:Concepts and vocabulary）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2019 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15026-1-2019.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2019</year>
        <precision>year</precision>
        <display>2019年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15026_1_2025_11105036</id>
      <type>work</type>
      <title>IEEE Std 15026-1-2025</title>
      <slug>ieee-std-15026-1-2025-11105036</slug>
      <aliases>
        <alias>15026-1-2025</alias>
        <alias>15026-1-2025 - ISO/IEC/IEEE Approved Draft International Standard for Systems and software engineering--Systems and software assurance --Part 1:Concepts and vocabulary</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15026-1-2025 是电气电子工程师学会的草案，题为“ISO/IEC/IEEE Approved Draft International Standard for Systems and software engineering--Systems and software assurance --Part 1:Concepts and vocabulary”；公开目录标为非现行（Inactive），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15026-1-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11105036</url>
          <locator>standard_number=15026-1-2025; status=Inactive; modifier=Draft</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15026-1-2025**（ISO/IEC/IEEE Approved Draft International Standard for Systems and software engineering--Systems and software assurance --Part 1:Concepts and vocabulary）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2025 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15026-1-2025-11105036.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15026_2_2022_10848050_redline</id>
      <type>work</type>
      <title>IEEE Std 15026-2-2022</title>
      <slug>ieee-std-15026-2-2022-10848050-redline</slug>
      <aliases>
        <alias>15026-2-2022</alias>
        <alias>15026-2-2022 - ISO/IEC/IEEE International Standard - Systems and software engineering--Systems and software assurance--Part 2: Assurance case - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15026-2-2022 是电气电子工程师学会的技术标准，题为“ISO/IEC/IEEE International Standard - Systems and software engineering--Systems and software assurance--Part 2: Assurance case - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2022 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15026-2-2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10848050</url>
          <locator>standard_number=15026-2-2022; status=Active; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15026-2-2022**（ISO/IEC/IEEE International Standard - Systems and software engineering--Systems and software assurance--Part 2: Assurance case - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2022 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15026-2-2022-10848050-redline.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2022</year>
        <precision>year</precision>
        <display>2022年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1502_2007</id>
      <type>work</type>
      <title>IEEE Std 1502-2007</title>
      <slug>ieee-std-1502-2007</slug>
      <aliases>
        <alias>1502-2007</alias>
        <alias>1502-2007 - IEEE Recommended Practice for Radar Cross-Section Test Procedures</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1502-2007 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Radar Cross-Section Test Procedures”；公开目录标为已被替代（Superseded），著录年份为 2007 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1502-2007 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=4301370</url>
          <locator>standard_number=1502-2007; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1502-2007**（IEEE Recommended Practice for Radar Cross-Section Test Procedures）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2007 年，主题领域包括 Components, Circuits, Devices and Systems、Communication, Networking and Broadcast Technologies、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1502-2007.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2007</year>
        <precision>year</precision>
        <display>2007年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15_1928</id>
      <type>work</type>
      <title>IEEE Std 15-1928</title>
      <slug>ieee-std-15-1928</slug>
      <aliases>
        <alias>15-1928</alias>
        <alias>15-1928 - A.I.E.E. Standards: Industrial Control Apparatus</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15-1928 是电气电子工程师学会的技术标准，题为“A.I.E.E. Standards: Industrial Control Apparatus”；公开目录标为非现行（Inactive），著录年份为 1928 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15-1928 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7368046</url>
          <locator>standard_number=15-1928; status=Inactive; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15-1928**（A.I.E.E. Standards: Industrial Control Apparatus）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），著录年份为 1928 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15-1928.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1928</year>
        <precision>year</precision>
        <display>1928年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15_1944</id>
      <type>work</type>
      <title>IEEE Std 15-1944</title>
      <slug>ieee-std-15-1944</slug>
      <aliases>
        <alias>15-1944</alias>
        <alias>15-1944 - AIEE American Standard for Industrial Control Apparatus</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15-1944 是电气电子工程师学会的技术标准，题为“AIEE American Standard for Industrial Control Apparatus”；公开目录标为已被替代（Superseded），著录年份为 1943 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15-1944 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7368067</url>
          <locator>standard_number=15-1944; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15-1944**（AIEE American Standard for Industrial Control Apparatus）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1943 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15-1944.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1943</year>
        <precision>year</precision>
        <display>1943年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15_1959</id>
      <type>work</type>
      <title>IEEE Std 15-1959</title>
      <slug>ieee-std-15-1959</slug>
      <aliases>
        <alias>15-1959</alias>
        <alias>15-1959 - AIEE American Standard for Industrial Control Apparatus</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15-1959 是电气电子工程师学会的技术标准，题为“AIEE American Standard for Industrial Control Apparatus”；公开目录标为已被替代（Superseded），著录年份为 1958 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15-1959 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7368061</url>
          <locator>standard_number=15-1959; status=Superseded; modifier=</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15-1959**（AIEE American Standard for Industrial Control Apparatus）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1958 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems、Robotics and Control Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15-1959.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1958</year>
        <precision>year</precision>
        <display>1958年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_15_s1_1961</id>
      <type>work</type>
      <title>IEEE Std 15.S1-1961</title>
      <slug>ieee-std-15-s1-1961</slug>
      <aliases>
        <alias>15.S1-1961</alias>
        <alias>15.S1-1961 - IRE Standards on Radio Transmitters: Definitions of Terms, 1961</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 15.S1-1961 是电气电子工程师学会的技术标准，题为“IRE Standards on Radio Transmitters: Definitions of Terms, 1961”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1961 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 15.S1-1961 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=7368043</url>
          <locator>standard_number=15.S1-1961; status=Inactive; modifier=Withdrawn</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:56:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:56:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 15.S1-1961**（IRE Standards on Radio Transmitters: Definitions of Terms, 1961）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1961 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems、Signal Processing and Analysis[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-15-s1-1961.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>1961</year>
        <precision>year</precision>
        <display>1961年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1484_12_1_2020_9352668_redline</id>
      <type>work</type>
      <title>IEEE Std 1484.12.1-2020</title>
      <slug>ieee-std-1484-12-1-2020-9352668-redline</slug>
      <aliases>
        <alias>1484.12.1-2020</alias>
        <alias>1484.12.1-2020 - IEEE Standard for Learning Object Metadata - Redline</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1484.12.1-2020 是电气电子工程师学会的技术标准，题为“IEEE Standard for Learning Object Metadata - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2020 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1484.12.1-2020 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=9352668</url>
          <locator>standard_number=1484.12.1-2020; status=Active; modifier=Redline</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:55:48+08:00</createdAt>
      <updatedAt>2026-11-01T21:55:48+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 1484.12.1-2020**（IEEE Standard for Learning Object Metadata - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2020 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-1484-12-1-2020-9352668-redline.html</url>
      <lang>vi</lang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2020</year>
        <precision>year</precision>
        <display>2020年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_1484_12_3_2005</id>
      <type>work</type>
      <title>IEEE Std 1484.12.3-2005</title>
      <slug>ieee-std-1484-12-3-2005</slug>
      <aliases>
        <alias>1484.12.3-2005</alias>
        <alias>1484.12.3-2005 - IEEE Standard for Extensible Markup Language (XML) Schema Definition Language Binding for Learning Object Metadata</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 1484.12.3-2005 是电气电子工程师学会的技术标准，题为“IEEE Standard for Extensible Markup Language (XML) Schema Definition Language Binding for Learning Object Metadata”；公开目录标为已被替代（Superseded），著录年份为 2005 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 1484.12.3-2005 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10263</url>
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          <author>IEEE</author>
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          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <body>**IEEE Std 1484.12.3-2005**（IEEE Standard for Extensible Markup Language (XML) Schema Definition Language Binding for Learning Object Metadata）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2005 年，主题领域包括 General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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      <summary>IEEE Std 1484.12.3-2020 是电气电子工程师学会的技术标准，题为“IEEE Standard for Learning Technology--Extensible Markup Language (XML) Schema Definition Language Binding for Learning Object Metadata - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2020 年。</summary>
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      <body>**IEEE Std 1484.12.3-2020**（IEEE Standard for Learning Technology--Extensible Markup Language (XML) Schema Definition Language Binding for Learning Object Metadata - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2020 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
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      <body>**IEEE Std 1484.13.1-2012**（IEEE Standard for Learning Technology -- Conceptual Model for Resource Aggregation for Learning, Education, and Training）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2012 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
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