{ "contentStorage": "postgres", "title": "作品", "url": "/zh-hant/works-110.html", "entities": [ { "id": "work_ieee_1685_2009", "type": "work", "title": "IEEE Std 1685-2009", "slug": "ieee-std-1685-2009", "aliases": [ "1685-2009", "1685-2009 - IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows" ], "summary": "IEEE Std 1685-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows”；公开目录标为已被替代（Superseded），著录年份为 2010 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1685-2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5417307", "locator": "standard_number=1685-2009; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:12+08:00", "updatedAt": "2026-11-01T22:00:12+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1685-2009**（IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2010 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1685-2009.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2010, "precision": "year", "display": "2010年" }, "language": "英语" }, { "id": "work_ieee_1685_2014", "type": "work", "title": "IEEE Std 1685-2014", "slug": "ieee-std-1685-2014", "aliases": [ "1685-2014", "1685-2014 - IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows" ], "summary": "IEEE Std 1685-2014 是电气电子工程师学会的技术标准，题为“IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows”；公开目录标为已被替代（Superseded），著录年份为 2014 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1685-2014 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6898801", "locator": "standard_number=1685-2014; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:12+08:00", "updatedAt": "2026-11-01T22:00:12+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1685-2014**（IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2014 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1685-2014.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2014, "precision": "year", "display": "2014年" }, "language": "英语" }, { "id": "work_ieee_1685_2022_10186338_redline", "type": "work", "title": "IEEE Std 1685-2022", "slug": "ieee-std-1685-2022-10186338-redline", "aliases": [ "1685-2022", "1685-2022 - IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows - Redline" ], "summary": "IEEE Std 1685-2022 是电气电子工程师学会的技术标准，题为“IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2023 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1685-2022 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=10186338", "locator": "standard_number=1685-2022; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:12+08:00", "updatedAt": "2026-11-01T22:00:12+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1685-2022**（IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2023 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1685-2022-10186338-redline.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2023, "precision": "year", "display": "2023年" }, "language": "英语" }, { "id": "work_ieee_1679_2020_9080673_redline", "type": "work", "title": "IEEE Std 1679-2020", "slug": "ieee-std-1679-2020-9080673-redline", "aliases": [ "1679-2020", "1679-2020 - IEEE Recommended Practice for the Characterization and Evaluation of Energy Storage Technologies in Stationary Applications - Redline" ], "summary": "IEEE Std 1679-2020 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for the Characterization and Evaluation of Energy Storage Technologies in Stationary Applications - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2020 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1679-2020 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9080673", "locator": "standard_number=1679-2020; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:00+08:00", "updatedAt": "2026-11-01T22:00:00+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1679-2020**（IEEE Recommended Practice for the Characterization and Evaluation of Energy Storage Technologies in Stationary Applications - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2020 年，主题领域包括 Power, Energy and Industry Applications、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1679-2020-9080673-redline.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2020, "precision": "year", "display": "2020年" }, "language": "英语" }, { "id": "work_ieee_167a_1_1995", "type": "work", "title": "IEEE Std 167A.1-1995", "slug": "ieee-std-167a-1-1995", "aliases": [ "167A.1-1995", "167A.1-1995 - IEEE Standard Facsimile Test Chart: Bilevel (Black and White)" ], "summary": "IEEE Std 167A.1-1995 是电气电子工程师学会的技术标准，题为“IEEE Standard Facsimile Test Chart: Bilevel (Black and White)”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1995 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 167A.1-1995 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4692", "locator": "standard_number=167A.1-1995; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:00+08:00", "updatedAt": "2026-11-01T22:00:00+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 167A.1-1995**（IEEE Standard Facsimile Test Chart: Bilevel (Black and White)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1995 年，主题领域包括 Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-167a-1-1995.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1995, "precision": "year", "display": "1995年" }, "language": "英语" }, { "id": "work_ieee_167a_2_1996", "type": "work", "title": "IEEE Std 167A.2-1996", "slug": "ieee-std-167a-2-1996", "aliases": [ "167A.2-1996", "167A.2-1996 - IEEE Standard Facsimile Test Chart: High Contrast (Gray Scale)" ], "summary": "IEEE Std 167A.2-1996 是电气电子工程师学会的技术标准，题为“IEEE Standard Facsimile Test Chart: High Contrast (Gray Scale)”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1997 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 167A.2-1996 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6118", "locator": "standard_number=167A.2-1996; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:00+08:00", "updatedAt": "2026-11-01T22:00:00+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 167A.2-1996**（IEEE Standard Facsimile Test Chart: High Contrast (Gray Scale)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1997 年，主题领域包括 Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-167a-2-1996.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1997, "precision": "year", "display": "1997年" }, "language": "英语" }, { "id": "work_ieee_1680_2006", "type": "work", "title": "IEEE Std 1680-2006", "slug": "ieee-std-1680-2006", "aliases": [ "1680-2006", "1680-2006 - IEEE Standard for Environmental Assessment of Personal Computer Products, including Laptop Personal Computers, Desktop Personal Computers, and Personal Computer Monitors" ], "summary": "IEEE Std 1680-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard for Environmental Assessment of Personal Computer Products, including Laptop Personal Computers, Desktop Personal Computers, and Personal Computer Monitors”；公开目录标为已被替代（Superseded），著录年份为 2006 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1680-2006 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=10876", "locator": "standard_number=1680-2006; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:00+08:00", "updatedAt": "2026-11-01T22:00:00+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1680-2006**（IEEE Standard for Environmental Assessment of Personal Computer Products, including Laptop Personal Computers, Desktop Personal Computers, and Personal Computer Monitors）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2006 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1680-2006.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2006, "precision": "year", "display": "2006年" }, "language": "英语" }, { "id": "work_ieee_168_1956", "type": "work", "title": "IEEE Std 168-1956", "slug": "ieee-std-168-1956", "aliases": [ "168-1956", "168-1956 - IEEE Standard Definitions of Terms on Facsimile" ], "summary": "IEEE Std 168-1956 是电气电子工程师学会的技术标准，题为“IEEE Standard Definitions of Terms on Facsimile”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1956 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 168-1956 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=2743", "locator": "standard_number=168-1956; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:00+08:00", "updatedAt": "2026-11-01T22:00:00+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 168-1956**（IEEE Standard Definitions of Terms on Facsimile）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1956 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-168-1956.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1956, "precision": "year", "display": "1956年" }, "language": "英语" }, { "id": "work_ieee_p1788_1_d9_9_jun_2017", "type": "work", "title": "IEEE Std P1788.1/D9.9, Jun 2017", "slug": "ieee-std-p1788-1-d9-9-jun-2017", "aliases": [ "P1788.1/D9.9, Jun 2017", "P1788.1/D9.9, Jun 2017 - IEEE Approved Draft Standard for Interval Arithmetic (Simplified)" ], "summary": "IEEE Std P1788.1/D9.9, Jun 2017 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Interval Arithmetic (Simplified)”；公开目录标为非现行（Inactive），著录年份为 2017 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1788.1/D9.9, Jun 2017 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7987840", "locator": "standard_number=P1788.1/D9.9, Jun 2017; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T22:00:00+08:00", "updatedAt": "2026-11-01T22:00:00+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1788.1/D9.9, Jun 2017**（IEEE Approved Draft Standard for Interval Arithmetic (Simplified)）是[[organization_ieee|电气电子工程师学会]]于 2017 年 6 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1788-1-d9-9-jun-2017.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2017, "precision": "year", "display": "2017年" }, "language": "英语" }, { "id": "work_ieee_1671_6_2015_7118619_redline", "type": "work", "title": "IEEE Std 1671.6-2015", "slug": "ieee-std-1671-6-2015-7118619-redline", "aliases": [ "1671.6-2015", "1671.6-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description - Redline" ], "summary": "IEEE Std 1671.6-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2015 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.6-2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7118619", "locator": "standard_number=1671.6-2015; status=Inactive; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:59+08:00", "updatedAt": "2026-11-01T21:59:59+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.6-2015**（IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-6-2015-7118619-redline.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2015, "precision": "year", "display": "2015年" }, "language": "英语" }, { "id": "work_ieee_1672_2006", "type": "work", "title": "IEEE Std 1672-2006", "slug": "ieee-std-1672-2006", "aliases": [ "1672-2006", "1672-2006 - IEEE Standard for Ultrawideband Radar Definitions" ], "summary": "IEEE Std 1672-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard for Ultrawideband Radar Definitions”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2007 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1672-2006 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4201974", "locator": "standard_number=1672-2006; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:59+08:00", "updatedAt": "2026-11-01T21:59:59+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1672-2006**（IEEE Standard for Ultrawideband Radar Definitions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2007 年，主题领域包括 Aerospace、Components, Circuits, Devices and Systems、Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1672-2006.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2007, "precision": "year", "display": "2007年" }, "language": "英语" }, { "id": "work_ieee_1672_2006_cor_1_2008", "type": "work", "title": "IEEE Std 1672-2006/Cor 1-2008", "slug": "ieee-std-1672-2006-cor-1-2008", "aliases": [ "1672-2006/Cor 1-2008", "1672-2006/Cor 1-2008 - IEEE Standard for Ultrawideband Radar Definitions - Corrigendum 1" ], "summary": "IEEE Std 1672-2006/Cor 1-2008 是电气电子工程师学会的技术标准，题为“IEEE Standard for Ultrawideband Radar Definitions - Corrigendum 1”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1672-2006/Cor 1-2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6264057", "locator": "standard_number=1672-2006/Cor 1-2008; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:59+08:00", "updatedAt": "2026-11-01T21:59:59+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1672-2006/Cor 1-2008**（IEEE Standard for Ultrawideband Radar Definitions - Corrigendum 1）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2008 年，主题领域包括 Aerospace、Fields, Waves and Electromagnetics、Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1672-2006-cor-1-2008.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_1675_2008", "type": "work", "title": "IEEE Std 1675-2008", "slug": "ieee-std-1675-2008", "aliases": [ "1675-2008", "1675-2008 - IEEE Standard for Broadband Over Powerline Hardware" ], "summary": "IEEE Std 1675-2008 是电气电子工程师学会的技术标准，题为“IEEE Standard for Broadband Over Powerline Hardware”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1675-2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4747591", "locator": "standard_number=1675-2008; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:59+08:00", "updatedAt": "2026-11-01T21:59:59+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1675-2008**（IEEE Standard for Broadband Over Powerline Hardware）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2009 年，主题领域包括 Communication, Networking and Broadcast Technologies、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1675-2008.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_1676_2010", "type": "work", "title": "IEEE Std 1676-2010", "slug": "ieee-std-1676-2010", "aliases": [ "1676-2010", "1676-2010 - IEEE Guide for Control Architecture for High Power Electronics (1 MW and Greater) Used in Electric Power Transmission and Distribution Systems" ], "summary": "IEEE Std 1676-2010 是电气电子工程师学会的技术标准，题为“IEEE Guide for Control Architecture for High Power Electronics (1 MW and Greater) Used in Electric Power Transmission and Distribution Systems”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1676-2010 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5712776", "locator": "standard_number=1676-2010; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:59+08:00", "updatedAt": "2026-11-01T21:59:59+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1676-2010**（IEEE Guide for Control Architecture for High Power Electronics (1 MW and Greater) Used in Electric Power Transmission and Distribution Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Power, Energy and Industry Applications、Signal Processing and Analysis、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1676-2010.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2011, "precision": "year", "display": "2011年" }, "language": "英语" }, { "id": "work_ieee_1679_2010", "type": "work", "title": "IEEE Std 1679-2010", "slug": "ieee-std-1679-2010", "aliases": [ "1679-2010", "1679-2010 - IEEE Recommended Practice for the Characterization and Evaluation of Emerging Energy Storage Technologies in Stationary Applications" ], "summary": "IEEE Std 1679-2010 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for the Characterization and Evaluation of Emerging Energy Storage Technologies in Stationary Applications”；公开目录标为已被替代（Superseded），著录年份为 2010 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1679-2010 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5618901", "locator": "standard_number=1679-2010; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:59+08:00", "updatedAt": "2026-11-01T21:59:59+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1679-2010**（IEEE Recommended Practice for the Characterization and Evaluation of Emerging Energy Storage Technologies in Stationary Applications）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2010 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1679-2010.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2010, "precision": "year", "display": "2010年" }, "language": "英语" }, { "id": "work_ieee_167a_1975", "type": "work", "title": "IEEE Std 167A-1975", "slug": "ieee-std-167a-1975", "aliases": [ "167A-1975", "167A-1975 - IEEE Facsimile Test Chart" ], "summary": "IEEE Std 167A-1975 是电气电子工程师学会的技术标准，题为“IEEE Facsimile Test Chart”；公开目录标为已被替代（Superseded），著录年份为 1974 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 167A-1975 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7368055", "locator": "standard_number=167A-1975; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:59+08:00", "updatedAt": "2026-11-01T21:59:59+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 167A-1975**（IEEE Facsimile Test Chart）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1974 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-167a-1975.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1974, "precision": "year", "display": "1974年" }, "language": "英语" }, { "id": "work_ieee_167a_1980", "type": "work", "title": "IEEE Std 167A-1980", "slug": "ieee-std-167a-1980", "aliases": [ "167A-1980", "167A-1980 - IEEE Standard Facsimile Test Chart" ], "summary": "IEEE Std 167A-1980 是电气电子工程师学会的技术标准，题为“IEEE Standard Facsimile Test Chart”；公开目录标为已被替代（Superseded），著录年份为 1979 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 167A-1980 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7368856", "locator": "standard_number=167A-1980; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:59+08:00", "updatedAt": "2026-11-01T21:59:59+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 167A-1980**（IEEE Standard Facsimile Test Chart）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1979 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-167a-1980.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1979, "precision": "year", "display": "1979年" }, "language": "英语" }, { "id": "work_ieee_167a_1987", "type": "work", "title": "IEEE Std 167A-1987", "slug": "ieee-std-167a-1987", "aliases": [ "167A-1987", "167A-1987 - IEEE Standard Facsimile Test Charts (Revised as 167A.1)" ], "summary": "IEEE Std 167A-1987 是电气电子工程师学会的技术标准，题为“IEEE Standard Facsimile Test Charts (Revised as 167A.1)”；公开目录标为已被替代（Superseded），著录年份为 1987 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 167A-1987 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=2512", "locator": "standard_number=167A-1987; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:59+08:00", "updatedAt": "2026-11-01T21:59:59+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 167A-1987**（IEEE Standard Facsimile Test Charts (Revised as 167A.1)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1987 年，主题领域包括 Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-167a-1987.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1987, "precision": "year", "display": "1987年" }, "language": "英语" }, { "id": "work_ieee_p1786_d2_nov_2025", "type": "work", "title": "IEEE Std P1786/D2, Nov 2025", "slug": "ieee-std-p1786-d2-nov-2025", "aliases": [ "P1786/D2, Nov 2025", "P1786/D2, Nov 2025 - IEEE Approved Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear F" ], "summary": "IEEE Std P1786/D2, Nov 2025 是电气电子工程师学会的草案，题为“IEEE Approved Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear F”；公开目录标为非现行（Inactive），著录年份为 2026 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1786/D2, Nov 2025 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=11302985", "locator": "standard_number=P1786/D2, Nov 2025; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:59+08:00", "updatedAt": "2026-11-01T21:59:59+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1786/D2, Nov 2025**（IEEE Approved Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear F）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2026 年，主题领域包括 Computing and Processing、Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1786-d2-nov-2025.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2026, "precision": "year", "display": "2026年" }, "language": "英语" }, { "id": "work_ieee_p1786_d2_nov_2021", "type": "work", "title": "IEEE Std P1786/D2, Nov 2021", "slug": "ieee-std-p1786-d2-nov-2021", "aliases": [ "P1786/D2, Nov 2021", "P1786/D2, Nov 2021 - IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities" ], "summary": "IEEE Std P1786/D2, Nov 2021 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities”；公开目录标为非现行（Inactive），著录年份为 2021 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1786/D2, Nov 2021 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9620000", "locator": "standard_number=P1786/D2, Nov 2021; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:58+08:00", "updatedAt": "2026-11-01T21:59:58+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1786/D2, Nov 2021**（IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities）是[[organization_ieee|电气电子工程师学会]]于 2021 年 11 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Nuclear Engineering、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1786-d2-nov-2021.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2021, "precision": "year", "display": "2021年" }, "language": "英语" }, { "id": "work_ieee_p1786_d11_apr_2011", "type": "work", "title": "IEEE Std P1786/D11, Apr 2011", "slug": "ieee-std-p1786-d11-apr-2011", "aliases": [ "P1786/D11, Apr 2011", "P1786/D11, Apr 2011 - IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities" ], "summary": "IEEE Std P1786/D11, Apr 2011 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities”；公开目录标为非现行（Inactive），著录年份为 2011 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1786/D11, Apr 2011 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5764894", "locator": "standard_number=P1786/D11, Apr 2011; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:57+08:00", "updatedAt": "2026-11-01T21:59:57+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1786/D11, Apr 2011**（IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities）是[[organization_ieee|电气电子工程师学会]]于 2011 年 4 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1786-d11-apr-2011.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2011, "precision": "year", "display": "2011年" }, "language": "英语" }, { "id": "work_ieee_p1786", "type": "work", "title": "IEEE Std P1786", "slug": "ieee-std-p1786", "aliases": [ "P1786", "P1786 - IEEE Draft Human Factors Guide for Applications of Computerized Operating Procedure Systems at Nuclear Power Generating Stations and Other Nuclear Facilities." ], "summary": "IEEE Std P1786 是电气电子工程师学会的草案，题为“IEEE Draft Human Factors Guide for Applications of Computerized Operating Procedure Systems at Nuclear Power Generating Stations and Other Nuclear Facilities.”；公开目录标为非现行（Inactive），著录年份为 2010 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1786 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5601930", "locator": "standard_number=P1786; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:56+08:00", "updatedAt": "2026-11-01T21:59:56+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1786**（IEEE Draft Human Factors Guide for Applications of Computerized Operating Procedure Systems at Nuclear Power Generating Stations and Other Nuclear Facilities.）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2010 年，主题领域包括 Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1786.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2010, "precision": "year", "display": "2010年" }, "language": "英语" }, { "id": "work_ieee_p1786_d1_sept_2025", "type": "work", "title": "IEEE Std P1786/D1, Sept 2025", "slug": "ieee-std-p1786-d1-sept-2025", "aliases": [ "P1786/D1, Sept 2025", "P1786/D1, Sept 2025 - IEEE Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilitie" ], "summary": "IEEE Std P1786/D1, Sept 2025 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilitie”；公开目录标为非现行（Inactive），著录年份为 2025 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1786/D1, Sept 2025 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=11170394", "locator": "standard_number=P1786/D1, Sept 2025; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:56+08:00", "updatedAt": "2026-11-01T21:59:56+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1786/D1, Sept 2025**（IEEE Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilitie）是[[organization_ieee|电气电子工程师学会]]于 2025 年 9 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing、Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1786-d1-sept-2025.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2025, "precision": "year", "display": "2025年" }, "language": "英语" }, { "id": "work_ieee_p1785_3_d33_sept_2015", "type": "work", "title": "IEEE Std P1785.3/D33, Sept. 2015", "slug": "ieee-std-p1785-3-d33-sept-2015", "aliases": [ "P1785.3/D33, Sept. 2015", "P1785.3/D33, Sept. 2015 - IEEE Approved Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performanc" ], "summary": "IEEE Std P1785.3/D33, Sept. 2015 是电气电子工程师学会的草案，题为“IEEE Approved Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performanc”；公开目录标为非现行（Inactive），著录年份为 2016 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1785.3/D33, Sept. 2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7471396", "locator": "standard_number=P1785.3/D33, Sept. 2015; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:55+08:00", "updatedAt": "2026-11-01T21:59:55+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1785.3/D33, Sept. 2015**（IEEE Approved Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performanc）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2016 年，主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1785-3-d33-sept-2015.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2016, "precision": "year", "display": "2016年" }, "language": "英语" }, { "id": "work_ieee_p1785_2_d2a_jul_2015", "type": "work", "title": "IEEE Std P1785.2/D2a, Jul 2015", "slug": "ieee-std-p1785-2-d2a-jul-2015", "aliases": [ "P1785.2/D2a, Jul 2015", "P1785.2/D2a, Jul 2015 - IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above-- Part 2: Waveguide Interfaces" ], "summary": "IEEE Std P1785.2/D2a, Jul 2015 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above-- Part 2: Waveguide Interfaces”；公开目录标为非现行（Inactive），著录年份为 2016 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1785.2/D2a, Jul 2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7283528", "locator": "standard_number=P1785.2/D2a, Jul 2015; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:54+08:00", "updatedAt": "2026-11-01T21:59:54+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1785.2/D2a, Jul 2015**（IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above-- Part 2: Waveguide Interfaces）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2016 年，主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1785-2-d2a-jul-2015.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2016, "precision": "year", "display": "2016年" }, "language": "英语" }, { "id": "work_ieee_p1785_3_d31_jun_2014", "type": "work", "title": "IEEE Std P1785.3/D31, Jun 2014", "slug": "ieee-std-p1785-3-d31-jun-2014", "aliases": [ "P1785.3/D31, Jun 2014", "P1785.3/D31, Jun 2014 - IEEE Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performance and Uncer" ], "summary": "IEEE Std P1785.3/D31, Jun 2014 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performance and Uncer”；公开目录标为非现行（Inactive），著录年份为 2014 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1785.3/D31, Jun 2014 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6849920", "locator": "standard_number=P1785.3/D31, Jun 2014; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:54+08:00", "updatedAt": "2026-11-01T21:59:54+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1785.3/D31, Jun 2014**（IEEE Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performance and Uncer）是[[organization_ieee|电气电子工程师学会]]于 2014 年 6 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1785-3-d31-jun-2014.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2014, "precision": "year", "display": "2014年" }, "language": "英语" }, { "id": "work_ieee_p1785_1_d3_july_2012", "type": "work", "title": "IEEE Std P1785.1/D3, July 2012", "slug": "ieee-std-p1785-1-d3-july-2012", "aliases": [ "P1785.1/D3, July 2012", "P1785.1/D3, July 2012 - IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 1: Frequency Bands and Waveguide Dimensions" ], "summary": "IEEE Std P1785.1/D3, July 2012 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 1: Frequency Bands and Waveguide Dimensions”；公开目录标为非现行（Inactive），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1785.1/D3, July 2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6378378", "locator": "standard_number=P1785.1/D3, July 2012; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:53+08:00", "updatedAt": "2026-11-01T21:59:53+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1785.1/D3, July 2012**（IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 1: Frequency Bands and Waveguide Dimensions）是[[organization_ieee|电气电子工程师学会]]于 2012 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1785-1-d3-july-2012.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_p1785_1_d2_oct_2025", "type": "work", "title": "IEEE Std P1785.1/D2, Oct 2025", "slug": "ieee-std-p1785-1-d2-oct-2025", "aliases": [ "P1785.1/D2, Oct 2025", "P1785.1/D2, Oct 2025 - IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions" ], "summary": "IEEE Std P1785.1/D2, Oct 2025 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions”；公开目录标为非现行（Inactive），著录年份为 2026 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1785.1/D2, Oct 2025 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=11224739", "locator": "standard_number=P1785.1/D2, Oct 2025; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:52+08:00", "updatedAt": "2026-11-01T21:59:52+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1785.1/D2, Oct 2025**（IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2026 年，主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1785-1-d2-oct-2025.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2026, "precision": "year", "display": "2026年" }, "language": "英语" }, { "id": "work_ieee_p1785_1_d1_aug_2025", "type": "work", "title": "IEEE Std P1785.1/D1, Aug 2025", "slug": "ieee-std-p1785-1-d1-aug-2025", "aliases": [ "P1785.1/D1, Aug 2025", "P1785.1/D1, Aug 2025 - IEEE Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions" ], "summary": "IEEE Std P1785.1/D1, Aug 2025 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions”；公开目录标为非现行（Inactive），著录年份为 2025 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1785.1/D1, Aug 2025 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=11124502", "locator": "standard_number=P1785.1/D1, Aug 2025; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:51+08:00", "updatedAt": "2026-11-01T21:59:51+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1785.1/D1, Aug 2025**（IEEE Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions）是[[organization_ieee|电气电子工程师学会]]于 2025 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1785-1-d1-aug-2025.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2025, "precision": "year", "display": "2025年" }, "language": "英语" }, { "id": "work_ieee_p1783_d2_1_dec_2008", "type": "work", "title": "IEEE Std P1783/D2.1 Dec 2008", "slug": "ieee-std-p1783-d2-1-dec-2008", "aliases": [ "P1783/D2.1 Dec 2008", "P1783/D2.1 Dec 2008 - IEEE Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions" ], "summary": "IEEE Std P1783/D2.1 Dec 2008 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions”；公开目录标为非现行（Inactive），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1783/D2.1 Dec 2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4749829", "locator": "standard_number=P1783/D2.1 Dec 2008; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:50+08:00", "updatedAt": "2026-11-01T21:59:50+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1783/D2.1 Dec 2008**（IEEE Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions）是[[organization_ieee|电气电子工程师学会]]于 2008 年 12 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1783-d2-1-dec-2008.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_p1783_d3_apr_2009", "type": "work", "title": "IEEE Std P1783/D3, Apr 2009", "slug": "ieee-std-p1783-d3-apr-2009", "aliases": [ "P1783/D3, Apr 2009", "P1783/D3, Apr 2009 - Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions" ], "summary": "IEEE Std P1783/D3, Apr 2009 是电气电子工程师学会的草案，题为“Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions”；公开目录标为非现行（Inactive），著录年份为 2009 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1783/D3, Apr 2009 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4977262", "locator": "standard_number=P1783/D3, Apr 2009; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:50+08:00", "updatedAt": "2026-11-01T21:59:50+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1783/D3, Apr 2009**（Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions）是[[organization_ieee|电气电子工程师学会]]于 2009 年 4 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1783-d3-apr-2009.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2009, "precision": "year", "display": "2009年" }, "language": "英语" }, { "id": "work_ieee_p1782_d5_july_2013", "type": "work", "title": "IEEE Std P1782/D5, July 2013", "slug": "ieee-std-p1782-d5-july-2013", "aliases": [ "P1782/D5, July 2013", "P1782/D5, July 2013 - IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events" ], "summary": "IEEE Std P1782/D5, July 2013 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events”；公开目录标为非现行（Inactive），著录年份为 2013 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1782/D5, July 2013 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6557400", "locator": "standard_number=P1782/D5, July 2013; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:49+08:00", "updatedAt": "2026-11-01T21:59:49+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1782/D5, July 2013**（IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]于 2013 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1782-d5-july-2013.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2013, "precision": "year", "display": "2013年" }, "language": "英语" }, { "id": "work_ieee_p1782_d4_nov_2012", "type": "work", "title": "IEEE Std P1782/D4, Nov 2012", "slug": "ieee-std-p1782-d4-nov-2012", "aliases": [ "P1782/D4, Nov 2012", "P1782/D4, Nov 2012 - IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events" ], "summary": "IEEE Std P1782/D4, Nov 2012 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events”；公开目录标为非现行（Inactive），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1782/D4, Nov 2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6357339", "locator": "standard_number=P1782/D4, Nov 2012; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:48+08:00", "updatedAt": "2026-11-01T21:59:48+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1782/D4, Nov 2012**（IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]于 2012 年 11 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1782-d4-nov-2012.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_p1782_d1_jan_2022", "type": "work", "title": "IEEE Std P1782/D1, Jan 2022", "slug": "ieee-std-p1782-d1-jan-2022", "aliases": [ "P1782/D1, Jan 2022", "P1782/D1, Jan 2022 - IEEE Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events" ], "summary": "IEEE Std P1782/D1, Jan 2022 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events”；公开目录标为非现行（Inactive），著录年份为 2022 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1782/D1, Jan 2022 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9698146", "locator": "standard_number=P1782/D1, Jan 2022; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:47+08:00", "updatedAt": "2026-11-01T21:59:47+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1782/D1, Jan 2022**（IEEE Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]于 2022 年 1 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1782-d1-jan-2022.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2022, "precision": "year", "display": "2022年" }, "language": "英语" }, { "id": "work_ieee_p1780_d30_oct_2021", "type": "work", "title": "IEEE Std P1780/D30, Oct 2021", "slug": "ieee-std-p1780-d30-oct-2021", "aliases": [ "P1780/D30, Oct 2021", "P1780/D30, Oct 2021 - IEEE Aproved Draft Standard for the Specification of Inertial Measurement Units (IMU)" ], "summary": "IEEE Std P1780/D30, Oct 2021 是电气电子工程师学会的草案，题为“IEEE Aproved Draft Standard for the Specification of Inertial Measurement Units (IMU)”；公开目录标为非现行（Inactive），著录年份为 2021 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1780/D30, Oct 2021 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9715056", "locator": "standard_number=P1780/D30, Oct 2021; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:46+08:00", "updatedAt": "2026-11-01T21:59:46+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1780/D30, Oct 2021**（IEEE Aproved Draft Standard for the Specification of Inertial Measurement Units (IMU)）是[[organization_ieee|电气电子工程师学会]]于 2021 年 10 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1780-d30-oct-2021.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2021, "precision": "year", "display": "2021年" }, "language": "英语" }, { "id": "work_ieee_p1782_d002_mar_2022", "type": "work", "title": "IEEE Std P1782/D002, Mar 2022", "slug": "ieee-std-p1782-d002-mar-2022", "aliases": [ "P1782/D002, Mar 2022", "P1782/D002, Mar 2022 - IEEE Approved Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events" ], "summary": "IEEE Std P1782/D002, Mar 2022 是电气电子工程师学会的草案，题为“IEEE Approved Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events”；公开目录标为非现行（Inactive），著录年份为 2022 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1782/D002, Mar 2022 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9732938", "locator": "standard_number=P1782/D002, Mar 2022; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:46+08:00", "updatedAt": "2026-11-01T21:59:46+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1782/D002, Mar 2022**（IEEE Approved Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]于 2022 年 3 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1782-d002-mar-2022.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2022, "precision": "year", "display": "2022年" }, "language": "英语" }, { "id": "work_ieee_1667_2018_8575226_redline", "type": "work", "title": "IEEE Std 1667-2018", "slug": "ieee-std-1667-2018-8575226-redline", "aliases": [ "1667-2018", "1667-2018 - IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline" ], "summary": "IEEE Std 1667-2018 是电气电子工程师学会的技术标准，题为“IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2018 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1667-2018 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8575226", "locator": "standard_number=1667-2018; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1667-2018**（IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2018 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1667-2018-8575226-redline.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2018, "precision": "year", "display": "2018年" }, "language": "英语" }, { "id": "work_ieee_1668_2014", "type": "work", "title": "IEEE Std 1668-2014", "slug": "ieee-std-1668-2014", "aliases": [ "1668-2014", "1668-2014 - IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V" ], "summary": "IEEE Std 1668-2014 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V”；公开目录标为已被替代（Superseded），著录年份为 2014 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1668-2014 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6895234", "locator": "standard_number=1668-2014; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1668-2014**（IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2014 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1668-2014.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2014, "precision": "year", "display": "2014年" }, "language": "英语" }, { "id": "work_ieee_1668_2017_8365161_redline", "type": "work", "title": "IEEE Std 1668-2017", "slug": "ieee-std-1668-2017-8365161-redline", "aliases": [ "1668-2017", "1668-2017 - IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V - Redline" ], "summary": "IEEE Std 1668-2017 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2017 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1668-2017 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=8365161", "locator": "standard_number=1668-2017; status=Active; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1668-2017**（IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2017 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1668-2017-8365161-redline.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2017, "precision": "year", "display": "2017年" }, "language": "英语" }, { "id": "work_ieee_1671_2010", "type": "work", "title": "IEEE Std 1671-2010", "slug": "ieee-std-1671-2010", "aliases": [ "1671-2010", "1671-2010 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" ], "summary": "IEEE Std 1671-2010 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671-2010 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=5706288", "locator": "standard_number=1671-2010; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671-2010**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2010.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2011, "precision": "year", "display": "2011年" }, "language": "英语" }, { "id": "work_ieee_1671_2_2008", "type": "work", "title": "IEEE Std 1671.2-2008", "slug": "ieee-std-1671-2-2008", "aliases": [ "1671.2-2008", "1671.2-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions" ], "summary": "IEEE Std 1671.2-2008 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions”；公开目录标为已被替代（Superseded），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.2-2008 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4723949", "locator": "standard_number=1671.2-2008; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.2-2008**（IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2-2008.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_1671_2_2012_6522436_redline", "type": "work", "title": "IEEE Std 1671.2-2012", "slug": "ieee-std-1671-2-2012-6522436-redline", "aliases": [ "1671.2-2012", "1671.2-2012 - IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline" ], "summary": "IEEE Std 1671.2-2012 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2013 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.2-2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6522436", "locator": "standard_number=1671.2-2012; status=Inactive; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.2-2012**（IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2013 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2-2012-6522436-redline.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2013, "precision": "year", "display": "2013年" }, "language": "英语" }, { "id": "work_ieee_1671_2_d15_sep_2012", "type": "work", "title": "IEEE Std 1671.2/D15, Sep 2012", "slug": "ieee-std-1671-2-d15-sep-2012", "aliases": [ "1671.2/D15, Sep 2012", "1671.2/D15, Sep 2012 - IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Instrument Description" ], "summary": "IEEE Std 1671.2/D15, Sep 2012 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Instrument Description”；公开目录标为非现行（Inactive），著录年份为 2012 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.2/D15, Sep 2012 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6376069", "locator": "standard_number=1671.2/D15, Sep 2012; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.2/D15, Sep 2012**（IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Instrument Description）是[[organization_ieee|电气电子工程师学会]]于 2012 年 9 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-2-d15-sep-2012.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2012, "precision": "year", "display": "2012年" }, "language": "英语" }, { "id": "work_ieee_1671_3_2007", "type": "work", "title": "IEEE Std 1671.3-2007", "slug": "ieee-std-1671-3-2007", "aliases": [ "1671.3-2007", "1671.3-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Infor" ], "summary": "IEEE Std 1671.3-2007 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Infor”；公开目录标为已被替代（Superseded），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.3-2007 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4479536", "locator": "standard_number=1671.3-2007; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.3-2007**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Infor）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-3-2007.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_1671_4_2007", "type": "work", "title": "IEEE Std 1671.4-2007", "slug": "ieee-std-1671-4-2007", "aliases": [ "1671.4-2007", "1671.4-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information" ], "summary": "IEEE Std 1671.4-2007 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information”；公开目录标为已被替代（Superseded），著录年份为 2008 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.4-2007 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4509492", "locator": "standard_number=1671.4-2007; status=Superseded; modifier=" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.4-2007**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-4-2007.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2008, "precision": "year", "display": "2008年" }, "language": "英语" }, { "id": "work_ieee_1671_4_2014", "type": "work", "title": "IEEE Std 1671.4-2014", "slug": "ieee-std-1671-4-2014", "aliases": [ "1671.4-2014", "1671.4-2014 - IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration" ], "summary": "IEEE Std 1671.4-2014 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2014 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.4-2014 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=6808400", "locator": "standard_number=1671.4-2014; status=Inactive; modifier=Reserved" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.4-2014**（IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2014 年，主题领域包括 Computing and Processing、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-4-2014.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2014, "precision": "year", "display": "2014年" }, "language": "英语" }, { "id": "work_ieee_1671_5_2015_7166296_redline", "type": "work", "title": "IEEE Std 1671.5-2015", "slug": "ieee-std-1671-5-2015-7166296-redline", "aliases": [ "1671.5-2015", "1671.5-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description - Redline" ], "summary": "IEEE Std 1671.5-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2015 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 1671.5-2015 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7166296", "locator": "standard_number=1671.5-2015; status=Inactive; modifier=Redline" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 1671.5-2015**（IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-1671-5-2015-7166296-redline.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2015, "precision": "year", "display": "2015年" }, "language": "英语" }, { "id": "work_ieee_167_1966", "type": "work", "title": "IEEE Std 167-1966", "slug": "ieee-std-167-1966", "aliases": [ "167-1966", "167-1966 - IEEE Test Procedure for Facsimile" ], "summary": "IEEE Std 167-1966 是电气电子工程师学会的技术标准，题为“IEEE Test Procedure for Facsimile”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1966 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std 167-1966 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=7368070", "locator": "standard_number=167-1966; status=Inactive; modifier=Withdrawn" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std 167-1966**（IEEE Test Procedure for Facsimile）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1966 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-167-1966.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 1966, "precision": "year", "display": "1966年" }, "language": "英语" }, { "id": "work_ieee_p1780_d29_oct_2020", "type": "work", "title": "IEEE Std P1780/D29, Oct 2020", "slug": "ieee-std-p1780-d29-oct-2020", "aliases": [ "P1780/D29, Oct 2020", "P1780/D29, Oct 2020 - IEEE Draft Standard for the Specification of Inertial Measurement Units (IMU)" ], "summary": "IEEE Std P1780/D29, Oct 2020 是电气电子工程师学会的草案，题为“IEEE Draft Standard for the Specification of Inertial Measurement Units (IMU)”；公开目录标为非现行（Inactive），著录年份为 2021 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1780/D29, Oct 2020 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=9369228", "locator": "standard_number=P1780/D29, Oct 2020; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:45+08:00", "updatedAt": "2026-11-01T21:59:45+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1780/D29, Oct 2020**（IEEE Draft Standard for the Specification of Inertial Measurement Units (IMU)）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2021 年，主题领域包括 Aerospace、Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1780-d29-oct-2020.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2021, "precision": "year", "display": "2021年" }, "language": "英语" }, { "id": "work_ieee_p1776_d08_dec_2007", "type": "work", "title": "IEEE Std P1776_D08, Dec 2007", "slug": "ieee-std-p1776-d08-dec-2007", "aliases": [ "P1776_D08, Dec 2007", "P1776_D08, Dec 2007 - IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach" ], "summary": "IEEE Std P1776_D08, Dec 2007 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach”；公开目录标为非现行（Inactive），著录年份为 2007 年。", "status": "published", "categories": [ "category-science-technology" ], "tags": [ "tag-ieee-standard" ], "sources": [ { "id": "s1", "title": "IEEE Std P1776_D08, Dec 2007 — IEEE Xplore 题录", "author": "IEEE", "url": "https://ieeexplore.ieee.org/servlet/opac?punumber=4447422", "locator": "standard_number=P1776_D08, Dec 2007; status=Inactive; modifier=Draft" }, { "id": "s2", "title": "IEEE Xplore All Standards（KBART）", "author": "IEEE", "date": "2026-11-01", "url": "https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt" } ], "createdAt": "2026-11-01T21:59:44+08:00", "updatedAt": "2026-11-01T21:59:44+08:00", "updatedBy": "user:admin", "revision": 1, "body": "**IEEE Std P1776_D08, Dec 2007**（IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach）是[[organization_ieee|电气电子工程师学会]]于 2007 年 12 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。", "url": "/works/ieee-std-p1776-d08-dec-2007.html", "lang": "zh-hant", "sourceLang": "zh", "fallback": true, "availableLangs": [ "zh" ], "workKind": "standard", "published": { "year": 2007, "precision": "year", "display": "2007年" }, "language": "英语" } ], "lang": "zh-hant", "pagination": { "page": 110, "pageSize": 50, "total": 11998, "pageCount": 240, "prevUrl": "/zh-hant/works-109.json?type=work", "nextUrl": "/zh-hant/works-111.json?type=work" } }