postgres /zh-hant/works-110.html work_ieee_1685_2009 work ieee-std-1685-2009 1685-2009 1685-2009 - IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows

IEEE Std 1685-2009 是电气电子工程师学会的技术标准，题为“IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows”；公开目录标为已被替代（Superseded），著录年份为 2010 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=5417307 standard_number=1685-2009; status=Superseded; modifier= s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T22:00:12+08:00 2026-11-01T22:00:12+08:00 user:admin 1 **IEEE Std 1685-2009**（IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2010 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1685-2009.html zh-hant zh true zh standard 2010 year 2010年 英语 work_ieee_1685_2014 work ieee-std-1685-2014 1685-2014 1685-2014 - IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows

IEEE Std 1685-2014 是电气电子工程师学会的技术标准，题为“IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows”；公开目录标为已被替代（Superseded），著录年份为 2014 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=6898801 standard_number=1685-2014; status=Superseded; modifier= s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T22:00:12+08:00 2026-11-01T22:00:12+08:00 user:admin 1 **IEEE Std 1685-2014**（IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2014 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1685-2014.html zh-hant zh true zh standard 2014 year 2014年 英语 work_ieee_1685_2022_10186338_redline work ieee-std-1685-2022-10186338-redline 1685-2022 1685-2022 - IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows - Redline

IEEE Std 1685-2022 是电气电子工程师学会的技术标准，题为“IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2023 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=10186338 standard_number=1685-2022; status=Active; modifier=Redline s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T22:00:12+08:00 2026-11-01T22:00:12+08:00 user:admin 1 **IEEE Std 1685-2022**（IEEE Standard for IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2023 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1685-2022-10186338-redline.html zh-hant zh true zh standard 2023 year 2023年 英语 work_ieee_1679_2020_9080673_redline work ieee-std-1679-2020-9080673-redline 1679-2020 1679-2020 - IEEE Recommended Practice for the Characterization and Evaluation of Energy Storage Technologies in Stationary Applications - Redline

IEEE Std 1679-2020 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for the Characterization and Evaluation of Energy Storage Technologies in Stationary Applications - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2020 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=9080673 standard_number=1679-2020; status=Active; modifier=Redline s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T22:00:00+08:00 2026-11-01T22:00:00+08:00 user:admin 1 **IEEE Std 1679-2020**（IEEE Recommended Practice for the Characterization and Evaluation of Energy Storage Technologies in Stationary Applications - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2020 年，主题领域包括 Power, Energy and Industry Applications、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1679-2020-9080673-redline.html zh-hant zh true zh standard 2020 year 2020年 英语 work_ieee_167a_1_1995 work ieee-std-167a-1-1995 167A.1-1995 167A.1-1995 - IEEE Standard Facsimile Test Chart: Bilevel (Black and White)

IEEE Std 167A.1-1995 是电气电子工程师学会的技术标准，题为“IEEE Standard Facsimile Test Chart: Bilevel (Black and White)”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1995 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=4692 standard_number=167A.1-1995; status=Inactive; modifier=Withdrawn s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T22:00:00+08:00 2026-11-01T22:00:00+08:00 user:admin 1 **IEEE Std 167A.1-1995**（IEEE Standard Facsimile Test Chart: Bilevel (Black and White)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1995 年，主题领域包括 Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-167a-1-1995.html zh-hant zh true zh standard 1995 year 1995年 英语 work_ieee_167a_2_1996 work ieee-std-167a-2-1996 167A.2-1996 167A.2-1996 - IEEE Standard Facsimile Test Chart: High Contrast (Gray Scale)

IEEE Std 167A.2-1996 是电气电子工程师学会的技术标准，题为“IEEE Standard Facsimile Test Chart: High Contrast (Gray Scale)”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1997 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=6118 standard_number=167A.2-1996; status=Inactive; modifier=Withdrawn s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T22:00:00+08:00 2026-11-01T22:00:00+08:00 user:admin 1 **IEEE Std 167A.2-1996**（IEEE Standard Facsimile Test Chart: High Contrast (Gray Scale)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1997 年，主题领域包括 Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-167a-2-1996.html zh-hant zh true zh standard 1997 year 1997年 英语 work_ieee_1680_2006 work ieee-std-1680-2006 1680-2006 1680-2006 - IEEE Standard for Environmental Assessment of Personal Computer Products, including Laptop Personal Computers, Desktop Personal Computers, and Personal Computer Monitors

IEEE Std 1680-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard for Environmental Assessment of Personal Computer Products, including Laptop Personal Computers, Desktop Personal Computers, and Personal Computer Monitors”；公开目录标为已被替代（Superseded），著录年份为 2006 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=10876 standard_number=1680-2006; status=Superseded; modifier= s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T22:00:00+08:00 2026-11-01T22:00:00+08:00 user:admin 1 **IEEE Std 1680-2006**（IEEE Standard for Environmental Assessment of Personal Computer Products, including Laptop Personal Computers, Desktop Personal Computers, and Personal Computer Monitors）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2006 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1680-2006.html zh-hant zh true zh standard 2006 year 2006年 英语 work_ieee_168_1956 work ieee-std-168-1956 168-1956 168-1956 - IEEE Standard Definitions of Terms on Facsimile

IEEE Std 168-1956 是电气电子工程师学会的技术标准，题为“IEEE Standard Definitions of Terms on Facsimile”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1956 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=2743 standard_number=168-1956; status=Inactive; modifier=Withdrawn s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T22:00:00+08:00 2026-11-01T22:00:00+08:00 user:admin 1 **IEEE Std 168-1956**（IEEE Standard Definitions of Terms on Facsimile）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1956 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-168-1956.html zh-hant zh true zh standard 1956 year 1956年 英语 work_ieee_p1788_1_d9_9_jun_2017 work ieee-std-p1788-1-d9-9-jun-2017 P1788.1/D9.9, Jun 2017 P1788.1/D9.9, Jun 2017 - IEEE Approved Draft Standard for Interval Arithmetic (Simplified)

IEEE Std P1788.1/D9.9, Jun 2017 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Interval Arithmetic (Simplified)”；公开目录标为非现行（Inactive），著录年份为 2017 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=7987840 standard_number=P1788.1/D9.9, Jun 2017; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T22:00:00+08:00 2026-11-01T22:00:00+08:00 user:admin 1 **IEEE Std P1788.1/D9.9, Jun 2017**（IEEE Approved Draft Standard for Interval Arithmetic (Simplified)）是[[organization_ieee|电气电子工程师学会]]于 2017 年 6 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1788-1-d9-9-jun-2017.html zh-hant zh true zh standard 2017 year 2017年 英语 work_ieee_1671_6_2015_7118619_redline work ieee-std-1671-6-2015-7118619-redline 1671.6-2015 1671.6-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description - Redline

IEEE Std 1671.6-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2015 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=7118619 standard_number=1671.6-2015; status=Inactive; modifier=Redline s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:59+08:00 2026-11-01T21:59:59+08:00 user:admin 1 **IEEE Std 1671.6-2015**（IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1671-6-2015-7118619-redline.html zh-hant zh true zh standard 2015 year 2015年 英语 work_ieee_1672_2006 work ieee-std-1672-2006 1672-2006 1672-2006 - IEEE Standard for Ultrawideband Radar Definitions

IEEE Std 1672-2006 是电气电子工程师学会的技术标准，题为“IEEE Standard for Ultrawideband Radar Definitions”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2007 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=4201974 standard_number=1672-2006; status=Inactive; modifier=Reserved s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:59+08:00 2026-11-01T21:59:59+08:00 user:admin 1 **IEEE Std 1672-2006**（IEEE Standard for Ultrawideband Radar Definitions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2007 年，主题领域包括 Aerospace、Components, Circuits, Devices and Systems、Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1672-2006.html zh-hant zh true zh standard 2007 year 2007年 英语 work_ieee_1672_2006_cor_1_2008 work ieee-std-1672-2006-cor-1-2008 1672-2006/Cor 1-2008 1672-2006/Cor 1-2008 - IEEE Standard for Ultrawideband Radar Definitions - Corrigendum 1

IEEE Std 1672-2006/Cor 1-2008 是电气电子工程师学会的技术标准，题为“IEEE Standard for Ultrawideband Radar Definitions - Corrigendum 1”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2008 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=6264057 standard_number=1672-2006/Cor 1-2008; status=Inactive; modifier=Reserved s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:59+08:00 2026-11-01T21:59:59+08:00 user:admin 1 **IEEE Std 1672-2006/Cor 1-2008**（IEEE Standard for Ultrawideband Radar Definitions - Corrigendum 1）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2008 年，主题领域包括 Aerospace、Fields, Waves and Electromagnetics、Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1672-2006-cor-1-2008.html zh-hant zh true zh standard 2008 year 2008年 英语 work_ieee_1675_2008 work ieee-std-1675-2008 1675-2008 1675-2008 - IEEE Standard for Broadband Over Powerline Hardware

IEEE Std 1675-2008 是电气电子工程师学会的技术标准，题为“IEEE Standard for Broadband Over Powerline Hardware”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2009 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=4747591 standard_number=1675-2008; status=Inactive; modifier=Reserved s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:59+08:00 2026-11-01T21:59:59+08:00 user:admin 1 **IEEE Std 1675-2008**（IEEE Standard for Broadband Over Powerline Hardware）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2009 年，主题领域包括 Communication, Networking and Broadcast Technologies、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1675-2008.html zh-hant zh true zh standard 2009 year 2009年 英语 work_ieee_1676_2010 work ieee-std-1676-2010 1676-2010 1676-2010 - IEEE Guide for Control Architecture for High Power Electronics (1 MW and Greater) Used in Electric Power Transmission and Distribution Systems

IEEE Std 1676-2010 是电气电子工程师学会的技术标准，题为“IEEE Guide for Control Architecture for High Power Electronics (1 MW and Greater) Used in Electric Power Transmission and Distribution Systems”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=5712776 standard_number=1676-2010; status=Inactive; modifier=Reserved s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:59+08:00 2026-11-01T21:59:59+08:00 user:admin 1 **IEEE Std 1676-2010**（IEEE Guide for Control Architecture for High Power Electronics (1 MW and Greater) Used in Electric Power Transmission and Distribution Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Power, Energy and Industry Applications、Signal Processing and Analysis、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1676-2010.html zh-hant zh true zh standard 2011 year 2011年 英语 work_ieee_1679_2010 work ieee-std-1679-2010 1679-2010 1679-2010 - IEEE Recommended Practice for the Characterization and Evaluation of Emerging Energy Storage Technologies in Stationary Applications

IEEE Std 1679-2010 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for the Characterization and Evaluation of Emerging Energy Storage Technologies in Stationary Applications”；公开目录标为已被替代（Superseded），著录年份为 2010 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=5618901 standard_number=1679-2010; status=Superseded; modifier= s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:59+08:00 2026-11-01T21:59:59+08:00 user:admin 1 **IEEE Std 1679-2010**（IEEE Recommended Practice for the Characterization and Evaluation of Emerging Energy Storage Technologies in Stationary Applications）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2010 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1679-2010.html zh-hant zh true zh standard 2010 year 2010年 英语 work_ieee_167a_1975 work ieee-std-167a-1975 167A-1975 167A-1975 - IEEE Facsimile Test Chart

IEEE Std 167A-1975 是电气电子工程师学会的技术标准，题为“IEEE Facsimile Test Chart”；公开目录标为已被替代（Superseded），著录年份为 1974 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=7368055 standard_number=167A-1975; status=Superseded; modifier= s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:59+08:00 2026-11-01T21:59:59+08:00 user:admin 1 **IEEE Std 167A-1975**（IEEE Facsimile Test Chart）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1974 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-167a-1975.html zh-hant zh true zh standard 1974 year 1974年 英语 work_ieee_167a_1980 work ieee-std-167a-1980 167A-1980 167A-1980 - IEEE Standard Facsimile Test Chart

IEEE Std 167A-1980 是电气电子工程师学会的技术标准，题为“IEEE Standard Facsimile Test Chart”；公开目录标为已被替代（Superseded），著录年份为 1979 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=7368856 standard_number=167A-1980; status=Superseded; modifier= s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:59+08:00 2026-11-01T21:59:59+08:00 user:admin 1 **IEEE Std 167A-1980**（IEEE Standard Facsimile Test Chart）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1979 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-167a-1980.html zh-hant zh true zh standard 1979 year 1979年 英语 work_ieee_167a_1987 work ieee-std-167a-1987 167A-1987 167A-1987 - IEEE Standard Facsimile Test Charts (Revised as 167A.1)

IEEE Std 167A-1987 是电气电子工程师学会的技术标准，题为“IEEE Standard Facsimile Test Charts (Revised as 167A.1)”；公开目录标为已被替代（Superseded），著录年份为 1987 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=2512 standard_number=167A-1987; status=Superseded; modifier= s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:59+08:00 2026-11-01T21:59:59+08:00 user:admin 1 **IEEE Std 167A-1987**（IEEE Standard Facsimile Test Charts (Revised as 167A.1)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1987 年，主题领域包括 Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-167a-1987.html zh-hant zh true zh standard 1987 year 1987年 英语 work_ieee_p1786_d2_nov_2025 work ieee-std-p1786-d2-nov-2025 P1786/D2, Nov 2025 P1786/D2, Nov 2025 - IEEE Approved Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear F

IEEE Std P1786/D2, Nov 2025 是电气电子工程师学会的草案，题为“IEEE Approved Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear F”；公开目录标为非现行（Inactive），著录年份为 2026 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=11302985 standard_number=P1786/D2, Nov 2025; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:59+08:00 2026-11-01T21:59:59+08:00 user:admin 1 **IEEE Std P1786/D2, Nov 2025**（IEEE Approved Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear F）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2026 年，主题领域包括 Computing and Processing、Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1786-d2-nov-2025.html zh-hant zh true zh standard 2026 year 2026年 英语 work_ieee_p1786_d2_nov_2021 work ieee-std-p1786-d2-nov-2021 P1786/D2, Nov 2021 P1786/D2, Nov 2021 - IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities

IEEE Std P1786/D2, Nov 2021 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities”；公开目录标为非现行（Inactive），著录年份为 2021 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=9620000 standard_number=P1786/D2, Nov 2021; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:58+08:00 2026-11-01T21:59:58+08:00 user:admin 1 **IEEE Std P1786/D2, Nov 2021**（IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities）是[[organization_ieee|电气电子工程师学会]]于 2021 年 11 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Computing and Processing、Nuclear Engineering、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1786-d2-nov-2021.html zh-hant zh true zh standard 2021 year 2021年 英语 work_ieee_p1786_d11_apr_2011 work ieee-std-p1786-d11-apr-2011 P1786/D11, Apr 2011 P1786/D11, Apr 2011 - IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities

IEEE Std P1786/D11, Apr 2011 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities”；公开目录标为非现行（Inactive），著录年份为 2011 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=5764894 standard_number=P1786/D11, Apr 2011; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:57+08:00 2026-11-01T21:59:57+08:00 user:admin 1 **IEEE Std P1786/D11, Apr 2011**（IEEE Draft Guide for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilities）是[[organization_ieee|电气电子工程师学会]]于 2011 年 4 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1786-d11-apr-2011.html zh-hant zh true zh standard 2011 year 2011年 英语 work_ieee_p1786 work ieee-std-p1786 P1786 P1786 - IEEE Draft Human Factors Guide for Applications of Computerized Operating Procedure Systems at Nuclear Power Generating Stations and Other Nuclear Facilities.

IEEE Std P1786 是电气电子工程师学会的草案，题为“IEEE Draft Human Factors Guide for Applications of Computerized Operating Procedure Systems at Nuclear Power Generating Stations and Other Nuclear Facilities.”；公开目录标为非现行（Inactive），著录年份为 2010 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=5601930 standard_number=P1786; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:56+08:00 2026-11-01T21:59:56+08:00 user:admin 1 **IEEE Std P1786**（IEEE Draft Human Factors Guide for Applications of Computerized Operating Procedure Systems at Nuclear Power Generating Stations and Other Nuclear Facilities.）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2010 年，主题领域包括 Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1786.html zh-hant zh true zh standard 2010 year 2010年 英语 work_ieee_p1786_d1_sept_2025 work ieee-std-p1786-d1-sept-2025 P1786/D1, Sept 2025 P1786/D1, Sept 2025 - IEEE Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilitie

IEEE Std P1786/D1, Sept 2025 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilitie”；公开目录标为非现行（Inactive），著录年份为 2025 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=11170394 standard_number=P1786/D1, Sept 2025; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:56+08:00 2026-11-01T21:59:56+08:00 user:admin 1 **IEEE Std P1786/D1, Sept 2025**（IEEE Draft Recommended Practice for Human Factors Applications of Computerized Operating Procedure Systems (COPS) at Nuclear Power Generating Stations and Other Nuclear Facilitie）是[[organization_ieee|电气电子工程师学会]]于 2025 年 9 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing、Nuclear Engineering[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1786-d1-sept-2025.html zh-hant zh true zh standard 2025 year 2025年 英语 work_ieee_p1785_3_d33_sept_2015 work ieee-std-p1785-3-d33-sept-2015 P1785.3/D33, Sept. 2015 P1785.3/D33, Sept. 2015 - IEEE Approved Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performanc

IEEE Std P1785.3/D33, Sept. 2015 是电气电子工程师学会的草案，题为“IEEE Approved Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performanc”；公开目录标为非现行（Inactive），著录年份为 2016 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=7471396 standard_number=P1785.3/D33, Sept. 2015; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:55+08:00 2026-11-01T21:59:55+08:00 user:admin 1 **IEEE Std P1785.3/D33, Sept. 2015**（IEEE Approved Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performanc）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2016 年，主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1785-3-d33-sept-2015.html zh-hant zh true zh standard 2016 year 2016年 英语 work_ieee_p1785_2_d2a_jul_2015 work ieee-std-p1785-2-d2a-jul-2015 P1785.2/D2a, Jul 2015 P1785.2/D2a, Jul 2015 - IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above-- Part 2: Waveguide Interfaces

IEEE Std P1785.2/D2a, Jul 2015 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above-- Part 2: Waveguide Interfaces”；公开目录标为非现行（Inactive），著录年份为 2016 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=7283528 standard_number=P1785.2/D2a, Jul 2015; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:54+08:00 2026-11-01T21:59:54+08:00 user:admin 1 **IEEE Std P1785.2/D2a, Jul 2015**（IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above-- Part 2: Waveguide Interfaces）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2016 年，主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1785-2-d2a-jul-2015.html zh-hant zh true zh standard 2016 year 2016年 英语 work_ieee_p1785_3_d31_jun_2014 work ieee-std-p1785-3-d31-jun-2014 P1785.3/D31, Jun 2014 P1785.3/D31, Jun 2014 - IEEE Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performance and Uncer

IEEE Std P1785.3/D31, Jun 2014 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performance and Uncer”；公开目录标为非现行（Inactive），著录年份为 2014 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=6849920 standard_number=P1785.3/D31, Jun 2014; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:54+08:00 2026-11-01T21:59:54+08:00 user:admin 1 **IEEE Std P1785.3/D31, Jun 2014**（IEEE Draft Recommended Practice for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 3: Recommendations for Performance and Uncer）是[[organization_ieee|电气电子工程师学会]]于 2014 年 6 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1785-3-d31-jun-2014.html zh-hant zh true zh standard 2014 year 2014年 英语 work_ieee_p1785_1_d3_july_2012 work ieee-std-p1785-1-d3-july-2012 P1785.1/D3, July 2012 P1785.1/D3, July 2012 - IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 1: Frequency Bands and Waveguide Dimensions

IEEE Std P1785.1/D3, July 2012 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 1: Frequency Bands and Waveguide Dimensions”；公开目录标为非现行（Inactive），著录年份为 2012 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=6378378 standard_number=P1785.1/D3, July 2012; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:53+08:00 2026-11-01T21:59:53+08:00 user:admin 1 **IEEE Std P1785.1/D3, July 2012**（IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above. Part 1: Frequency Bands and Waveguide Dimensions）是[[organization_ieee|电气电子工程师学会]]于 2012 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics、Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1785-1-d3-july-2012.html zh-hant zh true zh standard 2012 year 2012年 英语 work_ieee_p1785_1_d2_oct_2025 work ieee-std-p1785-1-d2-oct-2025 P1785.1/D2, Oct 2025 P1785.1/D2, Oct 2025 - IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions

IEEE Std P1785.1/D2, Oct 2025 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions”；公开目录标为非现行（Inactive），著录年份为 2026 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=11224739 standard_number=P1785.1/D2, Oct 2025; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:52+08:00 2026-11-01T21:59:52+08:00 user:admin 1 **IEEE Std P1785.1/D2, Oct 2025**（IEEE Approved Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2026 年，主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1785-1-d2-oct-2025.html zh-hant zh true zh standard 2026 year 2026年 英语 work_ieee_p1785_1_d1_aug_2025 work ieee-std-p1785-1-d1-aug-2025 P1785.1/D1, Aug 2025 P1785.1/D1, Aug 2025 - IEEE Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions

IEEE Std P1785.1/D1, Aug 2025 是电气电子工程师学会的草案，题为“IEEE Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions”；公开目录标为非现行（Inactive），著录年份为 2025 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=11124502 standard_number=P1785.1/D1, Aug 2025; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:51+08:00 2026-11-01T21:59:51+08:00 user:admin 1 **IEEE Std P1785.1/D1, Aug 2025**（IEEE Draft Standard for Rectangular Metallic Waveguides and Their Interfaces for Frequencies of 110 GHz and Above--Part 1: Frequency Bands and Waveguide Dimensions）是[[organization_ieee|电气电子工程师学会]]于 2025 年 8 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1785-1-d1-aug-2025.html zh-hant zh true zh standard 2025 year 2025年 英语 work_ieee_p1783_d2_1_dec_2008 work ieee-std-p1783-d2-1-dec-2008 P1783/D2.1 Dec 2008 P1783/D2.1 Dec 2008 - IEEE Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions

IEEE Std P1783/D2.1 Dec 2008 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions”；公开目录标为非现行（Inactive），著录年份为 2008 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=4749829 standard_number=P1783/D2.1 Dec 2008; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:50+08:00 2026-11-01T21:59:50+08:00 user:admin 1 **IEEE Std P1783/D2.1 Dec 2008**（IEEE Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions）是[[organization_ieee|电气电子工程师学会]]于 2008 年 12 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1783-d2-1-dec-2008.html zh-hant zh true zh standard 2008 year 2008年 英语 work_ieee_p1783_d3_apr_2009 work ieee-std-p1783-d3-apr-2009 P1783/D3, Apr 2009 P1783/D3, Apr 2009 - Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions

IEEE Std P1783/D3, Apr 2009 是电气电子工程师学会的草案，题为“Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions”；公开目录标为非现行（Inactive），著录年份为 2009 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=4977262 standard_number=P1783/D3, Apr 2009; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:50+08:00 2026-11-01T21:59:50+08:00 user:admin 1 **IEEE Std P1783/D3, Apr 2009**（Draft Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions）是[[organization_ieee|电气电子工程师学会]]于 2009 年 4 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1783-d3-apr-2009.html zh-hant zh true zh standard 2009 year 2009年 英语 work_ieee_p1782_d5_july_2013 work ieee-std-p1782-d5-july-2013 P1782/D5, July 2013 P1782/D5, July 2013 - IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events

IEEE Std P1782/D5, July 2013 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events”；公开目录标为非现行（Inactive），著录年份为 2013 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=6557400 standard_number=P1782/D5, July 2013; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:49+08:00 2026-11-01T21:59:49+08:00 user:admin 1 **IEEE Std P1782/D5, July 2013**（IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]于 2013 年 7 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1782-d5-july-2013.html zh-hant zh true zh standard 2013 year 2013年 英语 work_ieee_p1782_d4_nov_2012 work ieee-std-p1782-d4-nov-2012 P1782/D4, Nov 2012 P1782/D4, Nov 2012 - IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events

IEEE Std P1782/D4, Nov 2012 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events”；公开目录标为非现行（Inactive），著录年份为 2012 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=6357339 standard_number=P1782/D4, Nov 2012; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:48+08:00 2026-11-01T21:59:48+08:00 user:admin 1 **IEEE Std P1782/D4, Nov 2012**（IEEE Draft Guide for Collecting, Categorizing and Utilization of Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]于 2012 年 11 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1782-d4-nov-2012.html zh-hant zh true zh standard 2012 year 2012年 英语 work_ieee_p1782_d1_jan_2022 work ieee-std-p1782-d1-jan-2022 P1782/D1, Jan 2022 P1782/D1, Jan 2022 - IEEE Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events

IEEE Std P1782/D1, Jan 2022 是电气电子工程师学会的草案，题为“IEEE Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events”；公开目录标为非现行（Inactive），著录年份为 2022 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=9698146 standard_number=P1782/D1, Jan 2022; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:47+08:00 2026-11-01T21:59:47+08:00 user:admin 1 **IEEE Std P1782/D1, Jan 2022**（IEEE Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]于 2022 年 1 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1782-d1-jan-2022.html zh-hant zh true zh standard 2022 year 2022年 英语 work_ieee_p1780_d30_oct_2021 work ieee-std-p1780-d30-oct-2021 P1780/D30, Oct 2021 P1780/D30, Oct 2021 - IEEE Aproved Draft Standard for the Specification of Inertial Measurement Units (IMU)

IEEE Std P1780/D30, Oct 2021 是电气电子工程师学会的草案，题为“IEEE Aproved Draft Standard for the Specification of Inertial Measurement Units (IMU)”；公开目录标为非现行（Inactive），著录年份为 2021 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=9715056 standard_number=P1780/D30, Oct 2021; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:46+08:00 2026-11-01T21:59:46+08:00 user:admin 1 **IEEE Std P1780/D30, Oct 2021**（IEEE Aproved Draft Standard for the Specification of Inertial Measurement Units (IMU)）是[[organization_ieee|电气电子工程师学会]]于 2021 年 10 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1780-d30-oct-2021.html zh-hant zh true zh standard 2021 year 2021年 英语 work_ieee_p1782_d002_mar_2022 work ieee-std-p1782-d002-mar-2022 P1782/D002, Mar 2022 P1782/D002, Mar 2022 - IEEE Approved Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events

IEEE Std P1782/D002, Mar 2022 是电气电子工程师学会的草案，题为“IEEE Approved Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events”；公开目录标为非现行（Inactive），著录年份为 2022 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=9732938 standard_number=P1782/D002, Mar 2022; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:46+08:00 2026-11-01T21:59:46+08:00 user:admin 1 **IEEE Std P1782/D002, Mar 2022**（IEEE Approved Draft Guide for Collecting, Categorizing, and Utilizing Information Related to Electric Power Distribution Interruption Events）是[[organization_ieee|电气电子工程师学会]]于 2022 年 3 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1782-d002-mar-2022.html zh-hant zh true zh standard 2022 year 2022年 英语 work_ieee_1667_2018_8575226_redline work ieee-std-1667-2018-8575226-redline 1667-2018 1667-2018 - IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline

IEEE Std 1667-2018 是电气电子工程师学会的技术标准，题为“IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2018 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=8575226 standard_number=1667-2018; status=Active; modifier=Redline s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:45+08:00 2026-11-01T21:59:45+08:00 user:admin 1 **IEEE Std 1667-2018**（IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2018 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1667-2018-8575226-redline.html zh-hant zh true zh standard 2018 year 2018年 英语 work_ieee_1668_2014 work ieee-std-1668-2014 1668-2014 1668-2014 - IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V

IEEE Std 1668-2014 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V”；公开目录标为已被替代（Superseded），著录年份为 2014 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=6895234 standard_number=1668-2014; status=Superseded; modifier= s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:45+08:00 2026-11-01T21:59:45+08:00 user:admin 1 **IEEE Std 1668-2014**（IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2014 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1668-2014.html zh-hant zh true zh standard 2014 year 2014年 英语 work_ieee_1668_2017_8365161_redline work ieee-std-1668-2017-8365161-redline 1668-2017 1668-2017 - IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V - Redline

IEEE Std 1668-2017 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V - Redline”；公开目录标为现行（Active），红线对照（Redline），著录年份为 2017 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=8365161 standard_number=1668-2017; status=Active; modifier=Redline s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:45+08:00 2026-11-01T21:59:45+08:00 user:admin 1 **IEEE Std 1668-2017**（IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），红线对照（Redline），著录年份为 2017 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1668-2017-8365161-redline.html zh-hant zh true zh standard 2017 year 2017年 英语 work_ieee_1671_2010 work ieee-std-1671-2010 1671-2010 1671-2010 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

IEEE Std 1671-2010 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2011 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=5706288 standard_number=1671-2010; status=Inactive; modifier=Reserved s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:45+08:00 2026-11-01T21:59:45+08:00 user:admin 1 **IEEE Std 1671-2010**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2011 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1671-2010.html zh-hant zh true zh standard 2011 year 2011年 英语 work_ieee_1671_2_2008 work ieee-std-1671-2-2008 1671.2-2008 1671.2-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions

IEEE Std 1671.2-2008 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions”；公开目录标为已被替代（Superseded），著录年份为 2008 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=4723949 standard_number=1671.2-2008; status=Superseded; modifier= s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:45+08:00 2026-11-01T21:59:45+08:00 user:admin 1 **IEEE Std 1671.2-2008**（IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1671-2-2008.html zh-hant zh true zh standard 2008 year 2008年 英语 work_ieee_1671_2_2012_6522436_redline work ieee-std-1671-2-2012-6522436-redline 1671.2-2012 1671.2-2012 - IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline

IEEE Std 1671.2-2012 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2013 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=6522436 standard_number=1671.2-2012; status=Inactive; modifier=Redline s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:45+08:00 2026-11-01T21:59:45+08:00 user:admin 1 **IEEE Std 1671.2-2012**（IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2013 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1671-2-2012-6522436-redline.html zh-hant zh true zh standard 2013 year 2013年 英语 work_ieee_1671_2_d15_sep_2012 work ieee-std-1671-2-d15-sep-2012 1671.2/D15, Sep 2012 1671.2/D15, Sep 2012 - IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Instrument Description

IEEE Std 1671.2/D15, Sep 2012 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Instrument Description”；公开目录标为非现行（Inactive），著录年份为 2012 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=6376069 standard_number=1671.2/D15, Sep 2012; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:45+08:00 2026-11-01T21:59:45+08:00 user:admin 1 **IEEE Std 1671.2/D15, Sep 2012**（IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Instrument Description）是[[organization_ieee|电气电子工程师学会]]于 2012 年 9 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1671-2-d15-sep-2012.html zh-hant zh true zh standard 2012 year 2012年 英语 work_ieee_1671_3_2007 work ieee-std-1671-3-2007 1671.3-2007 1671.3-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Infor

IEEE Std 1671.3-2007 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Infor”；公开目录标为已被替代（Superseded），著录年份为 2008 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=4479536 standard_number=1671.3-2007; status=Superseded; modifier= s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:45+08:00 2026-11-01T21:59:45+08:00 user:admin 1 **IEEE Std 1671.3-2007**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Infor）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1671-3-2007.html zh-hant zh true zh standard 2008 year 2008年 英语 work_ieee_1671_4_2007 work ieee-std-1671-4-2007 1671.4-2007 1671.4-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information

IEEE Std 1671.4-2007 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information”；公开目录标为已被替代（Superseded），著录年份为 2008 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=4509492 standard_number=1671.4-2007; status=Superseded; modifier= s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:45+08:00 2026-11-01T21:59:45+08:00 user:admin 1 **IEEE Std 1671.4-2007**（IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1671-4-2007.html zh-hant zh true zh standard 2008 year 2008年 英语 work_ieee_1671_4_2014 work ieee-std-1671-4-2014 1671.4-2014 1671.4-2014 - IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration

IEEE Std 1671.4-2014 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration”；公开目录标为非现行（Inactive），保留（Reserved），著录年份为 2014 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=6808400 standard_number=1671.4-2014; status=Inactive; modifier=Reserved s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:45+08:00 2026-11-01T21:59:45+08:00 user:admin 1 **IEEE Std 1671.4-2014**（IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），保留（Reserved），著录年份为 2014 年，主题领域包括 Computing and Processing、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1671-4-2014.html zh-hant zh true zh standard 2014 year 2014年 英语 work_ieee_1671_5_2015_7166296_redline work ieee-std-1671-5-2015-7166296-redline 1671.5-2015 1671.5-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description - Redline

IEEE Std 1671.5-2015 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description - Redline”；公开目录标为非现行（Inactive），红线对照（Redline），著录年份为 2015 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=7166296 standard_number=1671.5-2015; status=Inactive; modifier=Redline s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:45+08:00 2026-11-01T21:59:45+08:00 user:admin 1 **IEEE Std 1671.5-2015**（IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description - Redline）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），红线对照（Redline），著录年份为 2015 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-1671-5-2015-7166296-redline.html zh-hant zh true zh standard 2015 year 2015年 英语 work_ieee_167_1966 work ieee-std-167-1966 167-1966 167-1966 - IEEE Test Procedure for Facsimile

IEEE Std 167-1966 是电气电子工程师学会的技术标准，题为“IEEE Test Procedure for Facsimile”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1966 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=7368070 standard_number=167-1966; status=Inactive; modifier=Withdrawn s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:45+08:00 2026-11-01T21:59:45+08:00 user:admin 1 **IEEE Std 167-1966**（IEEE Test Procedure for Facsimile）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1966 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-167-1966.html zh-hant zh true zh standard 1966 year 1966年 英语 work_ieee_p1780_d29_oct_2020 work ieee-std-p1780-d29-oct-2020 P1780/D29, Oct 2020 P1780/D29, Oct 2020 - IEEE Draft Standard for the Specification of Inertial Measurement Units (IMU)

IEEE Std P1780/D29, Oct 2020 是电气电子工程师学会的草案，题为“IEEE Draft Standard for the Specification of Inertial Measurement Units (IMU)”；公开目录标为非现行（Inactive），著录年份为 2021 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=9369228 standard_number=P1780/D29, Oct 2020; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:45+08:00 2026-11-01T21:59:45+08:00 user:admin 1 **IEEE Std P1780/D29, Oct 2020**（IEEE Draft Standard for the Specification of Inertial Measurement Units (IMU)）是[[organization_ieee|电气电子工程师学会]]的草案。公开目录将其标为非现行（Inactive），著录年份为 2021 年，主题领域包括 Aerospace、Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1780-d29-oct-2020.html zh-hant zh true zh standard 2021 year 2021年 英语 work_ieee_p1776_d08_dec_2007 work ieee-std-p1776-d08-dec-2007 P1776_D08, Dec 2007 P1776_D08, Dec 2007 - IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach

IEEE Std P1776_D08, Dec 2007 是电气电子工程师学会的草案，题为“IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach”；公开目录标为非现行（Inactive），著录年份为 2007 年。

published category-science-technology tag-ieee-standard s1 IEEE https://ieeexplore.ieee.org/servlet/opac?punumber=4447422 standard_number=P1776_D08, Dec 2007; status=Inactive; modifier=Draft s2 IEEE 2026-11-01 https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt 2026-11-01T21:59:44+08:00 2026-11-01T21:59:44+08:00 user:admin 1 **IEEE Std P1776_D08, Dec 2007**（IEEE Draft Recommended Practice for Thermal Evaluation of Unsealed Or Sealed Insulation Systems for Ac Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Mach）是[[organization_ieee|电气电子工程师学会]]于 2007 年 12 月形成的草案。公开目录将其标为非现行（Inactive），主题领域包括 Engineered Materials, Dielectrics and Plasmas[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。 /works/ieee-std-p1776-d08-dec-2007.html zh-hant zh true zh standard 2007 year 2007年 英语 zh-hant 110 50 11998 240 /zh-hant/works-109.xml?type=work /zh-hant/works-111.xml?type=work