<?xml version="1.0" encoding="UTF-8"?>
<page>
  <sourceCitations></sourceCitations>
  <contentStorage>postgres</contentStorage>
  <sameNames></sameNames>
  <basedOn></basedOn>
  <title>作品</title>
  <url>/zh-hant/works-192.html</url>
  <entities>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3230_03_2025</id>
      <type>work</type>
      <title>IEEE Std 3230.03-2025</title>
      <slug>ieee-std-3230-03-2025</slug>
      <aliases>
        <alias>3230.03-2025</alias>
        <alias>3230.03-2025 - IEEE Standard for Blockchain Service Capability Evaluation</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3230.03-2025 是电气电子工程师学会的技术标准，题为“IEEE Standard for Blockchain Service Capability Evaluation”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3230.03-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11105030</url>
          <locator>standard_number=3230.03-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:25+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:25+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3230.03-2025**（IEEE Standard for Blockchain Service Capability Evaluation）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3230-03-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3218_2022</id>
      <type>work</type>
      <title>IEEE Std 3218-2022</title>
      <slug>ieee-std-3218-2022</slug>
      <aliases>
        <alias>3218-2022</alias>
        <alias>3218-2022 - IEEE Standard for Using Blockchain for Carbon Trading Applications</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3218-2022 是电气电子工程师学会的技术标准，题为“IEEE Standard for Using Blockchain for Carbon Trading Applications”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3218-2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10057184</url>
          <locator>standard_number=3218-2022; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:24+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:24+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3218-2022**（IEEE Standard for Using Blockchain for Carbon Trading Applications）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Computing and Processing、Geoscience[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3218-2022.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3219_2023</id>
      <type>work</type>
      <title>IEEE Std 3219-2023</title>
      <slug>ieee-std-3219-2023</slug>
      <aliases>
        <alias>3219-2023</alias>
        <alias>3219-2023 - IEEE Standard for Blockchain-Based Zero-Trust Framework for the Internet of Things (IoT)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3219-2023 是电气电子工程师学会的技术标准，题为“IEEE Standard for Blockchain-Based Zero-Trust Framework for the Internet of Things (IoT)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3219-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10531212</url>
          <locator>standard_number=3219-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:24+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:24+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3219-2023**（IEEE Standard for Blockchain-Based Zero-Trust Framework for the Internet of Things (IoT)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3219-2023.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3206_2023</id>
      <type>work</type>
      <title>IEEE Std 3206-2023</title>
      <slug>ieee-std-3206-2023</slug>
      <aliases>
        <alias>3206-2023</alias>
        <alias>3206-2023 - IEEE Standard for Blockchain-Based Digital Asset Classification</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3206-2023 是电气电子工程师学会的技术标准，题为“IEEE Standard for Blockchain-Based Digital Asset Classification”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3206-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10419216</url>
          <locator>standard_number=3206-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3206-2023**（IEEE Standard for Blockchain-Based Digital Asset Classification）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3206-2023.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3207_2022</id>
      <type>work</type>
      <title>IEEE Std 3207-2022</title>
      <slug>ieee-std-3207-2022</slug>
      <aliases>
        <alias>3207-2022</alias>
        <alias>3207-2022 - IEEE Standard for Blockchain-Based Digital Asset Identification</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3207-2022 是电气电子工程师学会的技术标准，题为“IEEE Standard for Blockchain-Based Digital Asset Identification”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3207-2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10077506</url>
          <locator>standard_number=3207-2022; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3207-2022**（IEEE Standard for Blockchain-Based Digital Asset Identification）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3207-2022.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3209_2023</id>
      <type>work</type>
      <title>IEEE Std 3209-2023</title>
      <slug>ieee-std-3209-2023</slug>
      <aliases>
        <alias>3209-2023</alias>
        <alias>3209-2023 - IEEE Standard for Blockchain Identity Key Management</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3209-2023 是电气电子工程师学会的技术标准，题为“IEEE Standard for Blockchain Identity Key Management”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3209-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10430136</url>
          <locator>standard_number=3209-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3209-2023**（IEEE Standard for Blockchain Identity Key Management）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3209-2023.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3217_2023</id>
      <type>work</type>
      <title>IEEE Std 3217-2023</title>
      <slug>ieee-std-3217-2023</slug>
      <aliases>
        <alias>3217-2023</alias>
        <alias>3217-2023 - IEEE Standard for Application Interface Specification for Blockchain Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3217-2023 是电气电子工程师学会的技术标准，题为“IEEE Standard for Application Interface Specification for Blockchain Systems”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3217-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10289679</url>
          <locator>standard_number=3217-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:19+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:19+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3217-2023**（IEEE Standard for Application Interface Specification for Blockchain Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3217-2023.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3192_2025</id>
      <type>work</type>
      <title>IEEE Std 3192-2025</title>
      <slug>ieee-std-3192-2025</slug>
      <aliases>
        <alias>3192-2025</alias>
        <alias>3192-2025 - IEEE Guide for Corrosion Inspection and Evaluation of High-Voltage Direct Current (HVDC) Grounding Electrodes (±400 kV to ±1100 kV)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3192-2025 是电气电子工程师学会的技术标准，题为“IEEE Guide for Corrosion Inspection and Evaluation of High-Voltage Direct Current (HVDC) Grounding Electrodes (±400 kV to ±1100 kV)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3192-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11322721</url>
          <locator>standard_number=3192-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:18+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:18+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3192-2025**（IEEE Guide for Corrosion Inspection and Evaluation of High-Voltage Direct Current (HVDC) Grounding Electrodes (±400 kV to ±1100 kV)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Fields, Waves and Electromagnetics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3192-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3198_2025</id>
      <type>work</type>
      <title>IEEE Std 3198-2025</title>
      <slug>ieee-std-3198-2025</slug>
      <aliases>
        <alias>3198-2025</alias>
        <alias>3198-2025 - IEEE Standard for Evaluation Method of Machine Learning Fairness</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3198-2025 是电气电子工程师学会的技术标准，题为“IEEE Standard for Evaluation Method of Machine Learning Fairness”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3198-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11015940</url>
          <locator>standard_number=3198-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:18+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:18+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3198-2025**（IEEE Standard for Evaluation Method of Machine Learning Fairness）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3198-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3201_2024</id>
      <type>work</type>
      <title>IEEE Std 3201-2024</title>
      <slug>ieee-std-3201-2024</slug>
      <aliases>
        <alias>3201-2024</alias>
        <alias>3201-2024 - IEEE Standard for Blockchain Access Control</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3201-2024 是电气电子工程师学会的技术标准，题为“IEEE Standard for Blockchain Access Control”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3201-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10855771</url>
          <locator>standard_number=3201-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:18+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:18+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3201-2024**（IEEE Standard for Blockchain Access Control）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies、Robotics and Control Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3201-2024.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3203_2023</id>
      <type>work</type>
      <title>IEEE Std 3203-2023</title>
      <slug>ieee-std-3203-2023</slug>
      <aliases>
        <alias>3203-2023</alias>
        <alias>3203-2023 - IEEE Standard for Blockchain Interoperability--Naming Protocol</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3203-2023 是电气电子工程师学会的技术标准，题为“IEEE Standard for Blockchain Interoperability--Naming Protocol”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3203-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10531209</url>
          <locator>standard_number=3203-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:18+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:18+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3203-2023**（IEEE Standard for Blockchain Interoperability--Naming Protocol）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3203-2023.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3205_2023</id>
      <type>work</type>
      <title>IEEE Std 3205-2023</title>
      <slug>ieee-std-3205-2023</slug>
      <aliases>
        <alias>3205-2023</alias>
        <alias>3205-2023 - IEEE Standard for Blockchain Interoperability Data Authentication and Communication Protocol</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3205-2023 是电气电子工程师学会的技术标准，题为“IEEE Standard for Blockchain Interoperability Data Authentication and Communication Protocol”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3205-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10108927</url>
          <locator>standard_number=3205-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:18+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:18+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3205-2023**（IEEE Standard for Blockchain Interoperability Data Authentication and Communication Protocol）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Communication, Networking and Broadcast Technologies、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3205-2023.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3184_1_2025</id>
      <type>work</type>
      <title>IEEE Std 3184.1-2025</title>
      <slug>ieee-std-3184-1-2025</slug>
      <aliases>
        <alias>3184.1-2025</alias>
        <alias>3184.1-2025 - IEEE Standard for Joint Calibration Framework of Multiple Roadside Sensors</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3184.1-2025 是电气电子工程师学会的技术标准，题为“IEEE Standard for Joint Calibration Framework of Multiple Roadside Sensors”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3184.1-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11087754</url>
          <locator>standard_number=3184.1-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:17+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:17+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3184.1-2025**（IEEE Standard for Joint Calibration Framework of Multiple Roadside Sensors）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Components, Circuits, Devices and Systems、Signal Processing and Analysis、Transportation[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3184-1-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3184_2_2025</id>
      <type>work</type>
      <title>IEEE Std 3184.2-2025</title>
      <slug>ieee-std-3184-2-2025</slug>
      <aliases>
        <alias>3184.2-2025</alias>
        <alias>3184.2-2025 - IEEE Standard for Property Graph Description of Road Networks</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3184.2-2025 是电气电子工程师学会的技术标准，题为“IEEE Standard for Property Graph Description of Road Networks”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3184.2-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11030247</url>
          <locator>standard_number=3184.2-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:17+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:17+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3184.2-2025**（IEEE Standard for Property Graph Description of Road Networks）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Transportation、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3184-2-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3187_2024</id>
      <type>work</type>
      <title>IEEE Std 3187-2024</title>
      <slug>ieee-std-3187-2024</slug>
      <aliases>
        <alias>3187-2024</alias>
        <alias>3187-2024 - IEEE Guide for Framework for Trustworthy Federated Machine Learning</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3187-2024 是电气电子工程师学会的技术标准，题为“IEEE Guide for Framework for Trustworthy Federated Machine Learning”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3187-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10807153</url>
          <locator>standard_number=3187-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:17+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:17+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3187-2024**（IEEE Guide for Framework for Trustworthy Federated Machine Learning）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3187-2024.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3188_2024</id>
      <type>work</type>
      <title>IEEE Std 3188-2024</title>
      <slug>ieee-std-3188-2024</slug>
      <aliases>
        <alias>3188-2024</alias>
        <alias>3188-2024 - IEEE Standard for Virtual E-Card Platform</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3188-2024 是电气电子工程师学会的技术标准，题为“IEEE Standard for Virtual E-Card Platform”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3188-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10763446</url>
          <locator>standard_number=3188-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:17+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:17+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3188-2024**（IEEE Standard for Virtual E-Card Platform）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3188-2024.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3177_2024</id>
      <type>work</type>
      <title>IEEE Std 3177-2024</title>
      <slug>ieee-std-3177-2024</slug>
      <aliases>
        <alias>3177-2024</alias>
        <alias>3177-2024 - IEEE Standard for a Modular Framework for a Robotically- Assisted Surgical System</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3177-2024 是电气电子工程师学会的技术标准，题为“IEEE Standard for a Modular Framework for a Robotically- Assisted Surgical System”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3177-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10998958</url>
          <locator>standard_number=3177-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:16+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:16+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3177-2024**（IEEE Standard for a Modular Framework for a Robotically- Assisted Surgical System）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Bioengineering、Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3177-2024.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3178_2024</id>
      <type>work</type>
      <title>IEEE Std 3178-2024</title>
      <slug>ieee-std-3178-2024</slug>
      <aliases>
        <alias>3178-2024</alias>
        <alias>3178-2024 - IEEE Standard for General Requirements and Protocols for Software-Defined Physical Layer of Wireless Backscatter Networks</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3178-2024 是电气电子工程师学会的技术标准，题为“IEEE Standard for General Requirements and Protocols for Software-Defined Physical Layer of Wireless Backscatter Networks”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3178-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10768964</url>
          <locator>standard_number=3178-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:16+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:16+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3178-2024**（IEEE Standard for General Requirements and Protocols for Software-Defined Physical Layer of Wireless Backscatter Networks）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3178-2024.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3179_2026</id>
      <type>work</type>
      <title>IEEE Std 3179-2026</title>
      <slug>ieee-std-3179-2026</slug>
      <aliases>
        <alias>3179-2026</alias>
        <alias>3179-2026 - IEEE Recommended Practice for Digital Mine Construction</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3179-2026 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Digital Mine Construction”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3179-2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11629098</url>
          <locator>standard_number=3179-2026; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:16+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:16+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3179-2026**（IEEE Recommended Practice for Digital Mine Construction）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Geoscience[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3179-2026.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3169_2025</id>
      <type>work</type>
      <title>IEEE Std 3169-2025</title>
      <slug>ieee-std-3169-2025</slug>
      <aliases>
        <alias>3169-2025</alias>
        <alias>3169-2025 - IEEE Standard for Security Requirement of Privacy-Preserving Computation</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3169-2025 是电气电子工程师学会的技术标准，题为“IEEE Standard for Security Requirement of Privacy-Preserving Computation”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3169-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11207223</url>
          <locator>standard_number=3169-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:15+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:15+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3169-2025**（IEEE Standard for Security Requirement of Privacy-Preserving Computation）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3169-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3173_2026</id>
      <type>work</type>
      <title>IEEE Std 3173-2026</title>
      <slug>ieee-std-3173-2026</slug>
      <aliases>
        <alias>3173-2026</alias>
        <alias>3173-2026 - IEEE Standard for Endocrine-Disrupting Chemical Hazard Labeling</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3173-2026 是电气电子工程师学会的技术标准，题为“IEEE Standard for Endocrine-Disrupting Chemical Hazard Labeling”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3173-2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11673772</url>
          <locator>standard_number=3173-2026; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:15+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:15+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3173-2026**（IEEE Standard for Endocrine-Disrupting Chemical Hazard Labeling）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Bioengineering、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3173-2026.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3175_2025</id>
      <type>work</type>
      <title>IEEE Std 3175-2025</title>
      <slug>ieee-std-3175-2025</slug>
      <aliases>
        <alias>3175-2025</alias>
        <alias>3175-2025 - IEEE Guide for Stray Current Corrosion Mitigation for DC Rail Transit Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3175-2025 是电气电子工程师学会的技术标准，题为“IEEE Guide for Stray Current Corrosion Mitigation for DC Rail Transit Systems”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3175-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11615036</url>
          <locator>standard_number=3175-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:15+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:15+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3175-2025**（IEEE Guide for Stray Current Corrosion Mitigation for DC Rail Transit Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Transportation、General Topics for Engineers、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3175-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_317_2025</id>
      <type>work</type>
      <title>IEEE Std 317-2025</title>
      <slug>ieee-std-317-2025</slug>
      <aliases>
        <alias>317-2025</alias>
        <alias>317-2025 - IEEE Standard for Electric Penetration Assemblies in Containment Structures for Nuclear Power Generating Stations</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 317-2025 是电气电子工程师学会的技术标准，题为“IEEE Standard for Electric Penetration Assemblies in Containment Structures for Nuclear Power Generating Stations”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 317-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11119147</url>
          <locator>standard_number=317-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:15+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:15+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 317-2025**（IEEE Standard for Electric Penetration Assemblies in Containment Structures for Nuclear Power Generating Stations）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Engineered Materials, Dielectrics and Plasmas、Nuclear Engineering、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-317-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3161_2_2025</id>
      <type>work</type>
      <title>IEEE Std 3161.2-2025</title>
      <slug>ieee-std-3161-2-2025</slug>
      <aliases>
        <alias>3161.2-2025</alias>
        <alias>3161.2-2025 - IEEE Standard for End Subsystem of Digital Retina Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3161.2-2025 是电气电子工程师学会的技术标准，题为“IEEE Standard for End Subsystem of Digital Retina Systems”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3161.2-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11303378</url>
          <locator>standard_number=3161.2-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:14+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:14+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3161.2-2025**（IEEE Standard for End Subsystem of Digital Retina Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3161-2-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3161_3_2025</id>
      <type>work</type>
      <title>IEEE Std 3161.3-2025</title>
      <slug>ieee-std-3161-3-2025</slug>
      <aliases>
        <alias>3161.3-2025</alias>
        <alias>3161.3-2025 - IEEE Standard for Edge Subsystem of Digital Retina Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3161.3-2025 是电气电子工程师学会的技术标准，题为“IEEE Standard for Edge Subsystem of Digital Retina Systems”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3161.3-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11479644</url>
          <locator>standard_number=3161.3-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:14+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:14+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3161.3-2025**（IEEE Standard for Edge Subsystem of Digital Retina Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Communication, Networking and Broadcast Technologies、Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3161-3-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3161_5_2026</id>
      <type>work</type>
      <title>IEEE Std 3161.5-2026</title>
      <slug>ieee-std-3161-5-2026</slug>
      <aliases>
        <alias>3161.5-2026</alias>
        <alias>3161.5-2026 - IEEE Standard for Algorithm and Model Repository of Digital Retina Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3161.5-2026 是电气电子工程师学会的技术标准，题为“IEEE Standard for Algorithm and Model Repository of Digital Retina Systems”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3161.5-2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11744711</url>
          <locator>standard_number=3161.5-2026; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:14+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:14+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3161.5-2026**（IEEE Standard for Algorithm and Model Repository of Digital Retina Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3161-5-2026.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3161_6_2026</id>
      <type>work</type>
      <title>IEEE Std 3161.6-2026</title>
      <slug>ieee-std-3161-6-2026</slug>
      <aliases>
        <alias>3161.6-2026</alias>
        <alias>3161.6-2026 - IEEE Standard for Storage System of Digital Retina Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3161.6-2026 是电气电子工程师学会的技术标准，题为“IEEE Standard for Storage System of Digital Retina Systems”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3161.6-2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11746188</url>
          <locator>standard_number=3161.6-2026; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:14+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:14+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3161.6-2026**（IEEE Standard for Storage System of Digital Retina Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3161-6-2026.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3161_9_2023</id>
      <type>work</type>
      <title>IEEE Std 3161.9-2023</title>
      <slug>ieee-std-3161-9-2023</slug>
      <aliases>
        <alias>3161.9-2023</alias>
        <alias>3161.9-2023 - IEEE Standard for Protocols and Interfaces of Digital Retina Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3161.9-2023 是电气电子工程师学会的技术标准，题为“IEEE Standard for Protocols and Interfaces of Digital Retina Systems”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3161.9-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10419213</url>
          <locator>standard_number=3161.9-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:14+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:14+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3161.9-2023**（IEEE Standard for Protocols and Interfaces of Digital Retina Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3161-9-2023.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3168_2024</id>
      <type>work</type>
      <title>IEEE Std 3168-2024</title>
      <slug>ieee-std-3168-2024</slug>
      <aliases>
        <alias>3168-2024</alias>
        <alias>3168-2024 - IEEE Standard for Robustness Evaluation Test Methods for a Natural Language Processing Service That Uses Machine Learning</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3168-2024 是电气电子工程师学会的技术标准，题为“IEEE Standard for Robustness Evaluation Test Methods for a Natural Language Processing Service That Uses Machine Learning”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3168-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10631889</url>
          <locator>standard_number=3168-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:14+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:14+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3168-2024**（IEEE Standard for Robustness Evaluation Test Methods for a Natural Language Processing Service That Uses Machine Learning）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3168-2024.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3161_2022</id>
      <type>work</type>
      <title>IEEE Std 3161-2022</title>
      <slug>ieee-std-3161-2022</slug>
      <aliases>
        <alias>3161-2022</alias>
        <alias>3161-2022 - IEEE Standard for Digital Retina Systems</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3161-2022 是电气电子工程师学会的技术标准，题为“IEEE Standard for Digital Retina Systems”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3161-2022 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10051671</url>
          <locator>standard_number=3161-2022; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:13+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:13+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3161-2022**（IEEE Standard for Digital Retina Systems）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Components, Circuits, Devices and Systems、Computing and Processing、Signal Processing and Analysis[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3161-2022.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3158_1_2025</id>
      <type>work</type>
      <title>IEEE Std 3158.1-2025</title>
      <slug>ieee-std-3158-1-2025</slug>
      <aliases>
        <alias>3158.1-2025</alias>
        <alias>3158.1-2025 - IEEE Standard for Testing and Performance of a Trusted Data Matrix System</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3158.1-2025 是电气电子工程师学会的技术标准，题为“IEEE Standard for Testing and Performance of a Trusted Data Matrix System”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3158.1-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11361412</url>
          <locator>standard_number=3158.1-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:12+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3158.1-2025**（IEEE Standard for Testing and Performance of a Trusted Data Matrix System）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3158-1-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_316_2025</id>
      <type>work</type>
      <title>IEEE Std 316-2025</title>
      <slug>ieee-std-316-2025</slug>
      <aliases>
        <alias>316-2025</alias>
        <alias>316-2025 - IEEE Standard for Requirements for Direct Current Instrument Shunts</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 316-2025 是电气电子工程师学会的技术标准，题为“IEEE Standard for Requirements for Direct Current Instrument Shunts”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 316-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11231185</url>
          <locator>standard_number=316-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:12+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:12+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 316-2025**（IEEE Standard for Requirements for Direct Current Instrument Shunts）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-316-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3150_2025</id>
      <type>work</type>
      <title>IEEE Std 3150-2025</title>
      <slug>ieee-std-3150-2025</slug>
      <aliases>
        <alias>3150-2025</alias>
        <alias>3150-2025 - IEEE Guide for Testing the Semi-Conductive Water-Blocking Tape in Cross-Linked Polyethylene Insulated Alternating-Current Power Cables</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3150-2025 是电气电子工程师学会的技术标准，题为“IEEE Guide for Testing the Semi-Conductive Water-Blocking Tape in Cross-Linked Polyethylene Insulated Alternating-Current Power Cables”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3150-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11142627</url>
          <locator>standard_number=3150-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:09+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:09+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3150-2025**（IEEE Guide for Testing the Semi-Conductive Water-Blocking Tape in Cross-Linked Polyethylene Insulated Alternating-Current Power Cables）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Engineered Materials, Dielectrics and Plasmas、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3150-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3152_2024</id>
      <type>work</type>
      <title>IEEE Std 3152-2024</title>
      <slug>ieee-std-3152-2024</slug>
      <aliases>
        <alias>3152-2024</alias>
        <alias>3152-2024 - IEEE Standard for Transparent Human and Machine Agency Identification</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3152-2024 是电气电子工程师学会的技术标准，题为“IEEE Standard for Transparent Human and Machine Agency Identification”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3152-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10998961</url>
          <locator>standard_number=3152-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:09+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:09+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3152-2024**（IEEE Standard for Transparent Human and Machine Agency Identification）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3152-2024.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3154_2024</id>
      <type>work</type>
      <title>IEEE Std 3154-2024</title>
      <slug>ieee-std-3154-2024</slug>
      <aliases>
        <alias>3154-2024</alias>
        <alias>3154-2024 - IEEE Recommended Practice for the Application of Knowledge Graphs for Talent Services</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3154-2024 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for the Application of Knowledge Graphs for Talent Services”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3154-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10586916</url>
          <locator>standard_number=3154-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:09+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:09+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3154-2024**（IEEE Recommended Practice for the Application of Knowledge Graphs for Talent Services）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Computing and Processing、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3154-2024.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3156_2023</id>
      <type>work</type>
      <title>IEEE Std 3156-2023</title>
      <slug>ieee-std-3156-2023</slug>
      <aliases>
        <alias>3156-2023</alias>
        <alias>3156-2023 - IEEE Standard for Requirements of Privacy-Preserving Computation Integrated Platforms</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3156-2023 是电气电子工程师学会的技术标准，题为“IEEE Standard for Requirements of Privacy-Preserving Computation Integrated Platforms”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3156-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10443761</url>
          <locator>standard_number=3156-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:09+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:09+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3156-2023**（IEEE Standard for Requirements of Privacy-Preserving Computation Integrated Platforms）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3156-2023.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3158_2024</id>
      <type>work</type>
      <title>IEEE Std 3158-2024</title>
      <slug>ieee-std-3158-2024</slug>
      <aliases>
        <alias>3158-2024</alias>
        <alias>3158-2024 - IEEE Standard for Trusted Data Matrix System Architecture</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3158-2024 是电气电子工程师学会的技术标准，题为“IEEE Standard for Trusted Data Matrix System Architecture”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3158-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10797715</url>
          <locator>standard_number=3158-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:09+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:09+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3158-2024**（IEEE Standard for Trusted Data Matrix System Architecture）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Communication, Networking and Broadcast Technologies、Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3158-2024.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3141_2026</id>
      <type>work</type>
      <title>IEEE Std 3141-2026</title>
      <slug>ieee-std-3141-2026</slug>
      <aliases>
        <alias>3141-2026</alias>
        <alias>3141-2026 - IEEE Standard for 3D Body Processing</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3141-2026 是电气电子工程师学会的技术标准，题为“IEEE Standard for 3D Body Processing”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3141-2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11631798</url>
          <locator>standard_number=3141-2026; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3141-2026**（IEEE Standard for 3D Body Processing）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Computing and Processing、Signal Processing and Analysis、Components, Circuits, Devices and Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3141-2026.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3144_2025</id>
      <type>work</type>
      <title>IEEE Std 3144-2025</title>
      <slug>ieee-std-3144-2025</slug>
      <aliases>
        <alias>3144-2025</alias>
        <alias>3144-2025 - IEEE Standard for Digital Twin Maturity Model and Assessment Methodology in Industry</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3144-2025 是电气电子工程师学会的技术标准，题为“IEEE Standard for Digital Twin Maturity Model and Assessment Methodology in Industry”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3144-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11150679</url>
          <locator>standard_number=3144-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3144-2025**（IEEE Standard for Digital Twin Maturity Model and Assessment Methodology in Industry）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3144-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3145_2024</id>
      <type>work</type>
      <title>IEEE Std 3145-2024</title>
      <slug>ieee-std-3145-2024</slug>
      <aliases>
        <alias>3145-2024</alias>
        <alias>3145-2024 - IEEE Standard for General Technical Requirements of Auxiliary Warehouse in a Smart Factory</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3145-2024 是电气电子工程师学会的技术标准，题为“IEEE Standard for General Technical Requirements of Auxiliary Warehouse in a Smart Factory”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3145-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10735142</url>
          <locator>standard_number=3145-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3145-2024**（IEEE Standard for General Technical Requirements of Auxiliary Warehouse in a Smart Factory）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Computing and Processing、General Topics for Engineers[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3145-2024.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3147_2024</id>
      <type>work</type>
      <title>IEEE Std 3147-2024</title>
      <slug>ieee-std-3147-2024</slug>
      <aliases>
        <alias>3147-2024</alias>
        <alias>3147-2024 - IEEE Recommended Practice for Variant Design of Electronics Production Line</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3147-2024 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for Variant Design of Electronics Production Line”；公开目录标为现行（Active），已批准（Approved），著录年份为 2024 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3147-2024 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10707149</url>
          <locator>standard_number=3147-2024; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:08+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:08+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3147-2024**（IEEE Recommended Practice for Variant Design of Electronics Production Line）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2024 年，主题领域包括 Computing and Processing、General Topics for Engineers、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3147-2024.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2024</year>
        <precision>year</precision>
        <display>2024年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3133_2023</id>
      <type>work</type>
      <title>IEEE Std 3133-2023</title>
      <slug>ieee-std-3133-2023</slug>
      <aliases>
        <alias>3133-2023</alias>
        <alias>3133-2023 - IEEE Guide for Direct-Current Ice-Melting Technology of Overhead Transmission Lines</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3133-2023 是电气电子工程师学会的技术标准，题为“IEEE Guide for Direct-Current Ice-Melting Technology of Overhead Transmission Lines”；公开目录标为现行（Active），已批准（Approved），著录年份为 2023 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3133-2023 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10352388</url>
          <locator>standard_number=3133-2023; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3133-2023**（IEEE Guide for Direct-Current Ice-Melting Technology of Overhead Transmission Lines）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2023 年，主题领域包括 Power, Energy and Industry Applications、Geoscience、Fields, Waves and Electromagnetics[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3133-2023.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2023</year>
        <precision>year</precision>
        <display>2023年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3134_2025</id>
      <type>work</type>
      <title>IEEE Std 3134-2025</title>
      <slug>ieee-std-3134-2025</slug>
      <aliases>
        <alias>3134-2025</alias>
        <alias>3134-2025 - IEEE Guide for Drawing Regional Icing Maps for Overhead Transmission Lines</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3134-2025 是电气电子工程师学会的技术标准，题为“IEEE Guide for Drawing Regional Icing Maps for Overhead Transmission Lines”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3134-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11220766</url>
          <locator>standard_number=3134-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3134-2025**（IEEE Guide for Drawing Regional Icing Maps for Overhead Transmission Lines）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Geoscience、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3134-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3137_2026</id>
      <type>work</type>
      <title>IEEE Std 3137-2026</title>
      <slug>ieee-std-3137-2026</slug>
      <aliases>
        <alias>3137-2026</alias>
        <alias>3137-2026 - IEEE Standard for Automotive Electronics Product Inspection Equipment</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3137-2026 是电气电子工程师学会的技术标准，题为“IEEE Standard for Automotive Electronics Product Inspection Equipment”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3137-2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11737643</url>
          <locator>standard_number=3137-2026; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3137-2026**（IEEE Standard for Automotive Electronics Product Inspection Equipment）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Components, Circuits, Devices and Systems、Transportation、Signal Processing and Analysis[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3137-2026.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3138_2026</id>
      <type>work</type>
      <title>IEEE Std 3138-2026</title>
      <slug>ieee-std-3138-2026</slug>
      <aliases>
        <alias>3138-2026</alias>
        <alias>3138-2026 - IEEE Standard for General Requirements of Chip Visual Inspection in the Surface Mount Industry</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3138-2026 是电气电子工程师学会的技术标准，题为“IEEE Standard for General Requirements of Chip Visual Inspection in the Surface Mount Industry”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3138-2026 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11619245</url>
          <locator>standard_number=3138-2026; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3138-2026**（IEEE Standard for General Requirements of Chip Visual Inspection in the Surface Mount Industry）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Computing and Processing、Photonics and Electrooptics、Power, Energy and Industry Applications[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3138-2026.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3143_2025</id>
      <type>work</type>
      <title>IEEE Std 3143-2025</title>
      <slug>ieee-std-3143-2025</slug>
      <aliases>
        <alias>3143-2025</alias>
        <alias>3143-2025 - IEEE Standard for Electric Traction System for Short Primary Maglev Vehicles</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3143-2025 是电气电子工程师学会的技术标准，题为“IEEE Standard for Electric Traction System for Short Primary Maglev Vehicles”；公开目录标为现行（Active），已批准（Approved），著录年份为 2026 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3143-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=11418759</url>
          <locator>standard_number=3143-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:07+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:07+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3143-2025**（IEEE Standard for Electric Traction System for Short Primary Maglev Vehicles）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2026 年，主题领域包括 Fields, Waves and Electromagnetics、Transportation、Robotics and Control Systems[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3143-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2026</year>
        <precision>year</precision>
        <display>2026年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_31320_1_2012</id>
      <type>work</type>
      <title>IEEE Std 31320-1-2012</title>
      <slug>ieee-std-31320-1-2012</slug>
      <aliases>
        <alias>31320-1-2012</alias>
        <alias>31320-1-2012 - Information technology -- Modeling Languages--Part 1: Syntax and Semantics for IDEF0</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 31320-1-2012 是电气电子工程师学会的技术标准，题为“Information technology -- Modeling Languages--Part 1: Syntax and Semantics for IDEF0”；公开目录标为现行（Active），已批准（Approved），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 31320-1-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6363474</url>
          <locator>standard_number=31320-1-2012; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:06+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:06+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 31320-1-2012**（Information technology -- Modeling Languages--Part 1: Syntax and Semantics for IDEF0）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2012 年，主题领域包括 Computing and Processing、Components, Circuits, Devices and Systems、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-31320-1-2012.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_31320_2_2012</id>
      <type>work</type>
      <title>IEEE Std 31320-2-2012</title>
      <slug>ieee-std-31320-2-2012</slug>
      <aliases>
        <alias>31320-2-2012</alias>
        <alias>31320-2-2012 - ISO/IEC/IEEE International Standard - Information technology -- Modeling Languages -- Part 2: Syntax and Semantics for IDEF1X97 (IDEFobject)</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 31320-2-2012 是电气电子工程师学会的技术标准，题为“ISO/IEC/IEEE International Standard - Information technology -- Modeling Languages -- Part 2: Syntax and Semantics for IDEF1X97 (IDEFobject)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2012 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 31320-2-2012 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=6357336</url>
          <locator>standard_number=31320-2-2012; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:06+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:06+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 31320-2-2012**（ISO/IEC/IEEE International Standard - Information technology -- Modeling Languages -- Part 2: Syntax and Semantics for IDEF1X97 (IDEFobject)）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2012 年，主题领域包括 Computing and Processing、Communication, Networking and Broadcast Technologies[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-31320-2-2012.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2012</year>
        <precision>year</precision>
        <display>2012年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3127_2025</id>
      <type>work</type>
      <title>IEEE Std 3127-2025</title>
      <slug>ieee-std-3127-2025</slug>
      <aliases>
        <alias>3127-2025</alias>
        <alias>3127-2025 - IEEE Guide for an Architectural Framework for Blockchain‐Based Federated Machine Learning</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3127-2025 是电气电子工程师学会的技术标准，题为“IEEE Guide for an Architectural Framework for Blockchain‐Based Federated Machine Learning”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3127-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10965993</url>
          <locator>standard_number=3127-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3127-2025**（IEEE Guide for an Architectural Framework for Blockchain‐Based Federated Machine Learning）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3127-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
    <entity>
      <perspectives></perspectives>
      <customFields></customFields>
      <rankingTiers></rankingTiers>
      <rankingColumns></rankingColumns>
      <rankingEntries></rankingEntries>
      <id>work_ieee_3128_2025</id>
      <type>work</type>
      <title>IEEE Std 3128-2025</title>
      <slug>ieee-std-3128-2025</slug>
      <aliases>
        <alias>3128-2025</alias>
        <alias>3128-2025 - IEEE Recommended Practice for the Evaluation of Artificial Intelligence (AI) Dialogue System Capabilities</alias>
      </aliases>
      <previousSlugs></previousSlugs>
      <summary>IEEE Std 3128-2025 是电气电子工程师学会的技术标准，题为“IEEE Recommended Practice for the Evaluation of Artificial Intelligence (AI) Dialogue System Capabilities”；公开目录标为现行（Active），已批准（Approved），著录年份为 2025 年。</summary>
      <status>published</status>
      <categories>
        <category>category-science-technology</category>
      </categories>
      <tags>
        <tag>tag-ieee-standard</tag>
      </tags>
      <sources>
        <source>
          <id>s1</id>
          <title>IEEE Std 3128-2025 — IEEE Xplore 题录</title>
          <author>IEEE</author>
          <url>https://ieeexplore.ieee.org/servlet/opac?punumber=10944539</url>
          <locator>standard_number=3128-2025; status=Active; modifier=Approved</locator>
        </source>
        <source>
          <id>s2</id>
          <title>IEEE Xplore All Standards（KBART）</title>
          <author>IEEE</author>
          <date>2026-11-01</date>
          <url>https://ieeexplore.ieee.org/otherfiles/IEEEXplore_Global_All-Standards.txt</url>
        </source>
      </sources>
      <createdAt>2026-11-01T21:17:05+08:00</createdAt>
      <updatedAt>2026-11-01T21:17:05+08:00</updatedAt>
      <updatedBy>user:admin</updatedBy>
      <revision>1</revision>
      <body>**IEEE Std 3128-2025**（IEEE Recommended Practice for the Evaluation of Artificial Intelligence (AI) Dialogue System Capabilities）是[[organization_ieee|电气电子工程师学会]]的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2025 年，主题领域包括 Computing and Processing[^s1]。参见[[concept_ieee_standards|IEEE 标准]]。</body>
      <url>/works/ieee-std-3128-2025.html</url>
      <lang>zh-hant</lang>
      <sourceLang>zh</sourceLang>
      <fallback>true</fallback>
      <availableLangs>
        <lang>zh</lang>
      </availableLangs>
      <occupations></occupations>
      <workKind>standard</workKind>
      <published>
        <year>2025</year>
        <precision>year</precision>
        <display>2025年</display>
      </published>
      <language>英语</language>
      <creators></creators>
      <relatedTerms></relatedTerms>
    </entity>
  </entities>
  <tags></tags>
  <categories></categories>
  <relations></relations>
  <mentions></mentions>
  <toc></toc>
  <askCitations></askCitations>
  <history></history>
  <versions></versions>
  <relationGroups></relationGroups>
  <lang>zh-hant</lang>
  <availableLangs></availableLangs>
  <infoFields></infoFields>
  <pagination>
    <page>192</page>
    <pageSize>50</pageSize>
    <total>11998</total>
    <pageCount>240</pageCount>
    <prevUrl>/zh-hant/works-191.xml?type=work</prevUrl>
    <nextUrl>/zh-hant/works-193.xml?type=work</nextUrl>
  </pagination>
  <relationCounts></relationCounts>
  <rankings></rankings>
  <rankingBadges></rankingBadges>
</page>