IEEE Std 581-1978 是电气电子工程师学会的技术标准,题为“IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitride-Oxide Field-Effect Transistors”;公开目录标为非现行(Inactive),已撤回(Withdrawn),著录年份为 1978 年。
This site only uses the cookies needed to keep editors signed in. The voice assistant is provided by this site: it sends what you type or say to Google Gemini and keeps your choice in this browser. Turn the voice assistant on? Privacy policy