IEEE Std 13210-1994(ISO/IEC/IEEE International standard for Information Technology--Test Methods for Measuring Conformance to POSIX(R))是电气电子工程师学会的技术标准。公开目录将其标为已被替代(Superseded),著录年份为 1994 年,主题领域包括 Components, Circuits, Devices and Systems[1]。参见IEEE 标准。
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IEEE Std 13210-1994
IEEE Std 13210-1994 是电气电子工程师学会的技术标准,题为“ISO/IEC/IEEE International standard for Information Technology--Test Methods for Measuring Conformance to POSIX(R)”;公开目录标为已被替代(Superseded),著录年份为 1994 年。
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- IEEE Std 13210-1994 — IEEE Xplore 题录 · IEEE
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