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Opere · work_ieee_1505_1_2008_4689502

IEEE Std 1505.1-2008

IEEE Std 1505.1-2008 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505”；公开目录标为现行（Active），已批准（Approved），著录年份为 2008 年。

Aggiornato · rev 2 · Altri nomi：1505.1-2008 1505.1-2008 - IEEE Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

IEEE Std 1505.1-2008（IEEE Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505）是电气电子工程师学会的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2008 年，主题领域包括 Components, Circuits, Devices and Systems[1]。参见IEEE 标准。

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  1. IEEE Std 1505.1-2008 — IEEE Xplore 题录 · IEEE

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