knowledge
Italiano

Traduzione non disponibile; viene mostrato il testo cinese.

Opere · work_ieee_1505_1_2008_7386553

IEEE Std 1505.1-2008

IEEE Std 1505.1-2008 是电气电子工程师学会的技术标准，题为“IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505”；公开目录标为已被替代（Superseded），著录年份为 2013 年。

Aggiornato · rev 2 · Altri nomi：1505.1-2008 1505.1-2008 - IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

IEEE Std 1505.1-2008（IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505）是电气电子工程师学会的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2013 年，主题领域包括 Power, Energy and Industry Applications[1]。参见IEEE 标准。

Esplora le relazioni

Pagina relazioni →

Mentioned in

  • No body mentions yet.

Fonti

  1. IEEE Std 1505.1-2008 — IEEE Xplore 题录 · IEEE

    standard_number=1505.1-2008; status=Superseded; modifier=

    ↩ ↩ ↩
  2. IEEE Xplore All Standards（KBART） · IEEE · 2026-11-01