knowledge
Italiano

Traduzione non disponibile; viene mostrato il testo cinese.

Opere · work_ieee_c62_59_2019

IEEE Std C62.59-2019

IEEE Std C62.59-2019 是电气电子工程师学会的技术标准，题为“IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes”；公开目录标为现行（Active），已批准（Approved），著录年份为 2019 年。

Aggiornato · rev 1 · Altri nomi：C62.59-2019 C62.59-2019 - IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes

IEEE Std C62.59-2019（IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes）是电气电子工程师学会的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2019 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications、Photonics and Electrooptics[1]。参见IEEE 标准。

Esplora le relazioni

Pagina relazioni →

Mentioned in

  • No body mentions yet.

Fonti

  1. IEEE Std C62.59-2019 — IEEE Xplore 题录 · IEEE

    standard_number=C62.59-2019; status=Active; modifier=Approved

    ↩ ↩
  2. IEEE Xplore All Standards（KBART） · IEEE · 2026-11-01 ↩