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IEEE Std P1696 D10 June 2013

IEEE Std P1696 D10 June 2013 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for Terminology and Test Methods for Circuit Probes”；公开目录标为非现行（Inactive），著录年份为 2014 年。

Aggiornato · rev 1 · Altri nomi：P1696 D10 June 2013 P1696 D10 June 2013 - IEEE Approved Draft Standard for Terminology and Test Methods for Circuit Probes

IEEE Std P1696 D10 June 2013（IEEE Approved Draft Standard for Terminology and Test Methods for Circuit Probes）是电气电子工程师学会的草案。公开目录将其标为非现行（Inactive），著录年份为 2014 年，主题领域包括 Power, Energy and Industry Applications、Fields, Waves and Electromagnetics[1]。参见IEEE 标准。

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