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작품 · work_ieee_1149_7_2022_9919138

IEEE Std 1149.7-2022

IEEE Std 1149.7-2022 是电气电子工程师学会的技术标准，题为“IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture”；公开目录标为现行（Active），已批准（Approved），著录年份为 2022 年。

업데이트 · rev 2 · 다른 이름：1149.7-2022 1149.7-2022 - IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture

IEEE Std 1149.7-2022（IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture）是电气电子工程师学会的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2022 年，主题领域包括 Computing and Processing、Power, Energy and Industry Applications[1]。参见IEEE 标准。

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  1. IEEE Std 1149.7-2022 — IEEE Xplore 题录 · IEEE

    standard_number=1149.7-2022; status=Active; modifier=Approved

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  2. IEEE Xplore All Standards（KBART） · IEEE · 2026-11-01 ↩ ↩