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작품 · work_ieee_p3138_d2_3_dec_2025

IEEE Std P3138/D2.3, Dec 2025

IEEE Std P3138/D2.3, Dec 2025 是电气电子工程师学会的草案，题为“IEEE Approved Draft Standard for General Requirements of Chip Visual Inspection in Surface Mount Industry”；公开目录标为非现行（Inactive），著录年份为 2026 年。

업데이트 · rev 1 · 다른 이름：P3138/D2.3, Dec 2025 P3138/D2.3, Dec 2025 - IEEE Approved Draft Standard for General Requirements of Chip Visual Inspection in Surface Mount Industry

IEEE Std P3138/D2.3, Dec 2025（IEEE Approved Draft Standard for General Requirements of Chip Visual Inspection in Surface Mount Industry）是电气电子工程师学会的草案。公开目录将其标为非现行（Inactive），著录年份为 2026 年，主题领域包括 General Topics for Engineers、Power, Energy and Industry Applications[1]。参见IEEE 标准。

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  1. IEEE Std P3138/D2.3, Dec 2025 — IEEE Xplore 题录 · IEEE

    standard_number=P3138/D2.3, Dec 2025; status=Inactive; modifier=Draft

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  2. IEEE Xplore All Standards（KBART） · IEEE · 2026-11-01