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Karya · work_ieee_1671_2_2008

IEEE Std 1671.2-2008

IEEE Std 1671.2-2008 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions”；公开目录标为已被替代（Superseded），著录年份为 2008 年。

Dikemas kini · rev 1 · Nama lain：1671.2-2008 1671.2-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions

IEEE Std 1671.2-2008（IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions）是电气电子工程师学会的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2008 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[1]。参见IEEE 标准。

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  1. IEEE Std 1671.2-2008 — IEEE Xplore 题录 · IEEE

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