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IEEE Std 425-1957

IEEE Std 425-1957 是电气电子工程师学会的技术标准,题为“AIEE Test Code for Transistors - Semiconductor Definitions and Letter Symbols”;公开目录标为非现行(Inactive),已撤回(Withdrawn),著录年份为 1957 年。

Dikemas kini · rev 1 · Nama lain:425-1957 425-1957 - AIEE Test Code for Transistors - Semiconductor Definitions and Letter Symbols

IEEE Std 425-1957(AIEE Test Code for Transistors - Semiconductor Definitions and Letter Symbols)是电气电子工程师学会的技术标准。公开目录将其标为非现行(Inactive),已撤回(Withdrawn),著录年份为 1957 年,主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[1]。参见IEEE 标准。

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  1. IEEE Std 425-1957 — IEEE Xplore 题录 · IEEE

    standard_number=425-1957; status=Inactive; modifier=Withdrawn

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  2. IEEE Xplore All Standards(KBART) · IEEE · 2026-11-01