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Karya · work_ieee_n42_31_2003

IEEE Std N42.31-2003 · Relasi

IEEE Std N42.31-2003 是电气电子工程师学会的技术标准,题为“American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation”;公开目录标为现行(Active),已批准(Approved),著录年份为 2003 年。

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