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IEEE Std 301-1969

IEEE Std 301-1969 是电气电子工程师学会的技术标准，题为“IEEE Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors (For Ionizing Radiation)”；公开目录标为已被替代（Superseded），著录年份为 1968 年。

Bijgewerkt · rev 1 · Andere namen：301-1969 301-1969 - IEEE Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors (For Ionizing Radiation)

IEEE Std 301-1969（IEEE Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors (For Ionizing Radiation)）是电气电子工程师学会的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 1968 年，主题领域包括 Components, Circuits, Devices and Systems、Fields, Waves and Electromagnetics、Signal Processing and Analysis[1]。参见IEEE 标准。

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  1. IEEE Std 301-1969 — IEEE Xplore 题录 · IEEE

    standard_number=301-1969; status=Superseded; modifier=

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  2. IEEE Xplore All Standards（KBART） · IEEE · 2026-11-01